Texas Instruments | CCD and CMOS Imagers in Space: Signal Processing Challenges and Solutions | Application notes | Texas Instruments CCD and CMOS Imagers in Space: Signal Processing Challenges and Solutions Application notes

Texas Instruments CCD and CMOS Imagers in Space: Signal Processing Challenges and Solutions Application notes
Charged-Coupled Devices (CCD) and CMOS Imagers in
Space: Signal Processing Challenges and Solutions
The analog outputs of CCD and CMOS imaging chips,
used in space applications such as earth observation
or star tracking, require signal conditioning and
digitization for processing by an FPGA or ASIC. In
space, there are special challenges such as power,
weight, temperature range, reliability and radiation
environment. An Analog Front End (AFE), such as the
LM98640QML-SP (5962R1820301VXC), is a solution
to these challenges.
CCD Output Signal and Correlated Double
Sampling (CDS)
A typical CCD output signal is shown in Figure 1
where the y-axis is voltage and the x-axis is time. A
pixel period starts with a reset pulse, followed by a
reference or black level signal, and then the actual
data or video signal level. The amount of light sensed
is the difference between the reference and data
levels. The reference level may not be the same from
pixel to pixel and variations in the reset pulse can
cause additional noise in that level. It may be
necessary to measure the reference level in each pixel
period to produce an accurate output for each pixel.
One solution for processing CCD signals is correlated
double sampling (CDS) where the reference level and
data levels are individually sampled and the difference
is outputted for further processing (Figure 1).
Special Requirements and Challenges for Space
Most space applications require higher reliability
components than normal commercial applications. The
temperatures can range from -55°C to +125°C.
Rugged, hermetic packaging can be required.
Components used in space must survive cosmic
radiation. Also of concern for space applications is
power consumption and weight.
Perhaps the biggest challenge to designing a space
imaging system is that there are relatively few
components available that are qualified for space
systems and can withstand the cosmic radiation. Even
many space grade products are not radiation tolerant
and require extra mitigation for radiation effects. A
product that is not total ionizing dose (TID) tolerant
may require extra shielding. Many CMOS ADCs will
experience single event latch-up (SEL) where a heavy
ion strike from cosmic radiation can cause the part to
go into a latch-up state drawing enough current to
destroy the part. In these cases, over current detection
and reset circuits must be added to the system.
A discrete solution for digitizing an image sensor’s
analog output using available space grade, radiation
tolerant products would require a number of individual
components and compromises. The use of space
grade products in hermetic packaging will add weight
to the system and require significantly more board
space. The additional trace lengths and wiring add
noise to the system and degrade the performance.
To do CDS either two sample-and-hold circuits or two
ADCs are required, or the sampling must be run at
double the pixel rate to do CDS in the digital domain.
Any of these options will result in additional error in the
CDS calculation.
AFE Solution
Figure 1. CCD Output and Correlated Doubling
Since the output of an imaging sensor is not a simple
static signal it is necessary to be able to adjust the
sampling window length and position based on the
output curve. If CDS is used, two adjustable sampling
windows are required as shown in Figure 1.
Post CDS, but prior to digitizing, there may be
additional offsets between sensors that must be
compensated before gaining the signal to match the
dynamic range of the analog-to-digital converter
SNAA322 – November 2018
Submit Documentation Feedback
An Analog Front End (AFE) is a highly integrated ADC
that contains the circuitry for conditioning the imaging
signal prior to digitization. Figure 2 is a block diagram
for the dual channel LM98640QML-SP designed for
space imaging applications. Each channel has a 14b
ADC with an input range of 2 V.
The first section of the AFE is the track and hold,
capable of performing CDS. In the block diagram, only
a single input (OS-) will be active for each channel.
For low input signals, the LM98640 has the option of a
2X gain by doubling of the track and hold capacitor
arrays. The sampling windows are adjustable to 1/64
of the pixel period.
Charged-Coupled Devices (CCD) and CMOS Imagers in Space: Signal
Processing Challenges and Solutions
Copyright © 2018, Texas Instruments Incorporated
The LM98640 can also be programmed to clamp on
the reference level at the beginning of a pixel column.
Any systemic offsets in the CCD sensors can be
corrected by applying the fine and course DACs.
There is also a programmable gain amplifier (PGA) to
amplify the signal to match the dynamic range of the
on chip ADCs.
Finally, the digitized output of the ADCs are serialized
for input to an FPGA or ASIC. The serializer has the
option of running on two or four lanes. In four lane
mode the data rate on each lane is halved to
accommodate slower FPGAs or ASICs.
consistent and does not need to be individually
measured on each pixel. On some CMOS imagers,
some or all of the signal processing has been
integrated on the chip so that less downstream
processing is required.
Typically, CDS is not required for a CMOS imager, but
the video signal does need to be compared to a fixed
reference voltage. The LM98640 has the flexibility to
also support most CMOS imaging sensors. In cases
where CDS is not required, the LM98640 can be
configured in “sample-and-hold” or pseudo differential
mode. In this case both inputs (OS- and OS+) now
become active and one of the inputs is used as a
reference. The reference voltage can be supplied by
the on chip DAC ("VCLP Reference DAC" in Figure 2).
Figure 2. LM98640 Block Diagram
Advantages of the LM98640QML-SP Solution
With an AFE, all components are moved to a single
chip. This reduces the weight and the power
consumption of the system. The total power
consumption of the LM98640QML-SP at 15 MSPS is
only 125 mW per channel.
With all the components integrated, the signal path
has shrunk improving the performance of the system.
CDS is now done in the analog domain, using a single
track and hold circuit resulting in less noise. The total
noise flow of the LM98640QML-SP is -79 dB typical.
A major advantage of using an AFE is that it can be
mounted on the focal plane board, moving the signal
digitization close to the CCD, greatly reducing the
analog signal path, reducing the noise and improving
the system performance. Figure 3 compares an old
solution to one that was replaced by the LM98640.
Solutions for CMOS Imagers
There is a wider variety in the output signals in CMOS
imaging ICs. On some CMOS imaging chips, the
output signal is very similar to that of a CCD. In some
cases, the reference level is lower than the signal
level. In many cases, the reference level is fairly
Figure 3. Discrete Solution vs AFE Solution
The LM98640QML-SP is a fully qualified, space grade,
RHA QMLV AFE with the flexibility to support signal
conditioning and digitization of CCD and CMOS
imager outputs at pixel rates from 5 MHz to 40 MHz. It
comes in a thermally enhanced ceramic quad flatpack
power package and is rated from -55°C to +125°C. It
is qualified to 100 krad(Si) and is single event latch-up
(SEL) and single event functional interrupt (SEFI)
immune. It has an internal delayed lock loop (DLL)
clocking system that self recovers in one clock cycle
from an ion strike. The flight grade LM98640QML-SP
is orderable under the SMD number
Charged-Coupled Devices (CCD) and CMOS Imagers in Space: Signal
Processing Challenges and Solutions
Copyright © 2018, Texas Instruments Incorporated
SNAA322 – November 2018
Submit Documentation Feedback
These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate
TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable
standards, and any other safety, security, or other requirements. These resources are subject to change without notice. TI grants you
permission to use these resources only for development of an application that uses the TI products described in the resource. Other
reproduction and display of these resources is prohibited. No license is granted to any other TI intellectual property right or to any third
party intellectual property right. TI disclaims responsibility for, and you will fully indemnify TI and its representatives against, any claims,
damages, costs, losses, and liabilities arising out of your use of these resources.
TI’s products are provided subject to TI’s Terms of Sale (www.ti.com/legal/termsofsale.html) or other applicable terms available either on
ti.com or provided in conjunction with such TI products. TI’s provision of these resources does not expand or otherwise alter TI’s applicable
warranties or warranty disclaimers for TI products.
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2018, Texas Instruments Incorporated
Was this manual useful for you? yes no
Thank you for your participation!

* Your assessment is very important for improving the work of artificial intelligence, which forms the content of this project

Download PDF