Texas Instruments | LVDS Outputs on the ADS527x | Application notes | Texas Instruments LVDS Outputs on the ADS527x Application notes

Texas Instruments LVDS Outputs on the ADS527x Application notes
Application Report
SBAA118 - June 2004
LVDS Outputs on the ADS527x
Anand Udupa
High-Speed Data Products
The ADS527x are a family of high-performance analog-to-digital converters (ADCs) that
feature serialized low-voltage differential signaling (LVDS) outputs. Data in each channel are
serialized and sent out on a pair of pins in LVDS format. In addition to reducing the pincount
and package size of the multi-channel ADC, serialization also eases the routing of ADC
outputs of the multiple channels to the receiver. The LVDS architecture offers multiple
advantages, such as reduced effects of digital noise coupling to the internal analog circuit of
the device. The serializer that provides data to the LVDS buffer also generates a 1x clock and
a 6x clock, which are used for frame and bit identification, respectively. This application note
describes the implementation of LVDS timings inside the ADS527x. The generation of the
data and clock outputs from an internal 12x clock are detailed. It also discusses a method of
specifying the LVDS timings from the standpoint of the receiver. Unless otherwise noted, this
report refers to the ADS5270, ADS5271, ADS5272 and ADS5273 as the ADS527x.
LVDS Implementation
The ADS5270 uses an integrated internal PLL that generates a 12x sampling clock. The edges
of this 12x clock are used to serialize the ADC data bits. The 12x sampling clock also generates
the LVDS bit clock and the LVDS frame clock, which are output synchronously with the serialized
data. The edges of the 12x clock are used as shown in Figure 1.
12x clock
D11 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 D10 D11
LVDS Bit Clock
(6X clock)
LVDS Frame Clock
(1X clock)
Figure 1. Generation of LVDS Data and Clocks from the Edges of the Internal 12x Sample Clock
All trademarks are the property of their respective owners.
Both the rising and the falling edges of the internal 12x clock are used for generating the LVDS
bit clock (6x clock) and the LVDS frame clock (1x clock). The rising edges of the 12x clock are
used to generate both the rising as well as falling edges of LVDS bit clock (arrows 2 and 3,
respectively). The falling edges of the 12X clock are used to generate the switching instances of
the data (arrow 5), as well as the rising and falling edges of the LVDS frame clock (arrows 1 and
4, respectively). The logic delays used in generating the transitions of all the data and clocks are
closely matched. As a result of the matching design, the transition of the LVDS bit clock edge is
expected to occur very close to the middle of the open eye of the data.
Setup and Hold Times
The setup and hold times are defined with respect to the transitions between the data and the
LVDS bit clock (6x clock). Since the data is to be captured using both edges of the LVDS bit
clock, one setup and hold time period can be defined with respect to the rising edge of the LVDS
bit clock while another period can be defined with respect to the falling edge. There could be
slight differences between the timings related to the two edges because of the slight differences
in the rise and fall times during the generation of the logic for the LVDS bit clock. Such a
difference would be on the order of 50ps. To simplify the timing specification, a single set of
setup and hold times are indicated in the product data sheet, reflecting the lower value of the
setup and hold times for either the rising or falling edge.
Figure 2 illustrates the method of measuring the setup and hold times from the differential
waveforms of the LVDS bit clock and data.
Figure 2. Setup and Hold Times
The rise and fall instances of the LVDS data are referenced to ±100mV, since these are the
typical thresholds required for the receiver to identify them as logic levels. The rising time of the
LVDS data waveform is measured as the time taken to swing from –100mV to +100 mV (and
vice-versa for the falling time).
LVDS Outputs on the ADS527x
A typical eye pattern of the LVDS waveforms is shown in Figure 3. The waveforms in Figure 3
are plotted using a high bandwidth oscilloscope in infinite persistence mode. The time for which
the eye is open is a measure of the available setup and hold times available to the receiver.
Typically, the LCLK rising and falling edges occur in the middle of the eye pattern of the data,
thereby producing roughly equal setup and hold times.
Figure 3. Eye Pattern of the LVDS Clock and Data
The jitter effectively reduces the timing margins available to the receiver and can result in bit
errors. The timing numbers for the setup and hold times as mentioned in the datasheet are
representative of the actual timing margins available to the receiver, and take into account the
effect of jitter. The setup and hold time values can be improved by increasing the LVDS current
setting to 4.5mA or 6mA. This current setting increase produces faster rise and fall times, thus
increasing the open time of the eye pattern.
LVDS Outputs on the ADS527x
ADS5270 Datasheet (SBAS293D)
ADS5271 Datasheet (SBAS313)
ADS5272 Datasheet (SBAS324)
ADS5273 Datasheet (SBAS305B)
To obtain a copy of the referenced documents, visit the Texas Instruments web site at www.ti.com. x indicates the current revision
letter for each document.
LVDS Outputs on the ADS527x
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications,
enhancements, improvements, and other changes to its products and services at any time and to discontinue
any product or service without notice. Customers should obtain the latest relevant information before placing
orders and should verify that such information is current and complete. All products are sold subject to TI’s terms
and conditions of sale supplied at the time of order acknowledgment.
TI warrants performance of its hardware products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are used to the extent TI
deems necessary to support this warranty. Except where mandated by government requirements, testing of all
parameters of each product is not necessarily performed.
TI assumes no liability for applications assistance or customer product design. Customers are responsible for
their products and applications using TI components. To minimize the risks associated with customer products
and applications, customers should provide adequate design and operating safeguards.
TI does not warrant or represent that any license, either express or implied, is granted under any TI patent right,
copyright, mask work right, or other TI intellectual property right relating to any combination, machine, or process
in which TI products or services are used. Information published by TI regarding third-party products or services
does not constitute a license from TI to use such products or services or a warranty or endorsement thereof.
Use of such information may require a license from a third party under the patents or other intellectual property
of the third party, or a license from TI under the patents or other intellectual property of TI.
Reproduction of information in TI data books or data sheets is permissible only if reproduction is without
alteration and is accompanied by all associated warranties, conditions, limitations, and notices. Reproduction
of this information with alteration is an unfair and deceptive business practice. TI is not responsible or liable for
such altered documentation.
Resale of TI products or services with statements different from or beyond the parameters stated by TI for that
product or service voids all express and any implied warranties for the associated TI product or service and
is an unfair and deceptive business practice. TI is not responsible or liable for any such statements.
Following are URLs where you can obtain information on other Texas Instruments products and application
Data Converters
Digital Control
Power Mgmt
Optical Networking
Video & Imaging
Mailing Address:
Texas Instruments
Post Office Box 655303 Dallas, Texas 75265
Copyright  2004, Texas Instruments Incorporated
Was this manual useful for you? yes no
Thank you for your participation!

* Your assessment is very important for improving the work of artificial intelligence, which forms the content of this project

Download PDF