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Texas Instruments AD-02 High Performance ADC's Require Dynamic Testing Application notes
AD-02 High Performance ADC's Require Dynamic Testing
Literature Number: SNAA017
Application Note AD-02
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High-Performance ADCs
Require Dynamic Testing
Joseph D. Giacomini
August 1992
© 1992 National Semiconductor Corporation
Printed in the U.S.A.
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DESIGN APPLICATIONS
TESTING ADCs
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DESIGN APPLICATIONS
TESTING ADCs
3
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DESIGN APPLICATIONS
TESTING ADCs
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DESIGN APPLICATIONS
TESTING ADCs
5
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DESIGN APPLICATIONS
TESTING ADCs
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DESIGN APPLICATIONS
TESTING ADCs
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DESIGN APPLICATIONS
MULTITONE
ADC TESTING
9
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DESIGN APPLICATIONS
MULTITONE
ADC TESTING
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DESIGN APPLICATIONS
MULTITONE
ADC TESTING
11
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DESIGN APPLICATIONS
MULTITONE
ADC TESTING
http://www.national.com
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DESIGN APPLICATIONS
MULTITONE
ADC TESTING
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Lit #350002-001
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