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Texas Instruments DRV3205-Q1 Negative Voltage Stress on Source Pins Application notes
Application Report
SLVA805 – September 2016
DRV3205-Q1 Negative Voltage Stress on Source Pins
................................................................. Motor Drive Business Unit - Advanced Protection Motor Drivers
ABSTRACT
A common problem in motor drive systems when switching an inductive load are negative voltage spikes
on the source nodes of the power stage. These spikes can be large in magnitude, which can cause
damage to connected IC devices.
This application report will look at the result of a bench test which stresses the DRV3205-Q1 with negative
voltage transients on each of the gate and source pins.
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2
3
Contents
DRV3205-Q1 Specification ................................................................................................. 2
Bench Stress Experiment ................................................................................................... 2
Results ........................................................................................................................ 3
List of Figures
1
Stress Test Block Diagram ................................................................................................. 2
2
Conditions at DRV3205-Q1 Pin for –12-V Pulse Train ................................................................. 3
List of Tables
1
Experiment Results .......................................................................................................... 3
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1
DRV3205-Q1 Specification
1
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DRV3205-Q1 Specification
The DRV3205-Q1 device specifies a minimum and maximum for all of the gate and source pins—GHSx,
SHSx, GLSx, and SLSx—of the device, as well as the current-sense pins—IPx and INx. Stresses beyond
those listed under the Absolute Maximum Ratings in the data sheet may cause permanent damage to the
device. These values are stress ratings only, which do not imply functional operation of the device at these
or any other conditions beyond those indicated under the Recommended Operating Conditions. Exposure
to absolute-maximum-rated conditions for extended periods may affect device reliability.
Refer to the Absolute Maximum Ratings section of the DRV3205-Q1 datasheet for details on the ratings of
these pins.
2
Bench Stress Experiment
To run this experiment, several DRV3205-Q1 devices were characterized across all tested parameters
and the results data logged. The data log was used as a base line dataset to compare the performance of
each unit before and after the test, and included a control device.
To adequately generate the voltage on each of the source pins, all connections between the device and
the sense resistor and external FETs were disconnected, and the source pins connected directly to the
spike source. Figure 1 shows the high-level test set up used for this test.
VSH
GHSx
SHSx
DRV3205-Q1
GLSx
SLSx
AC
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Figure 1. Stress Test Block Diagram
The experiment was run using a high power-pulse generator, hooked up directly to the source and gate
pins on the DRV3205-Q1 device. Each device was stressed with 20-kHz pulses to each source and gate
pin at a specific voltage below the absolute minimum rating for the pin. After the first set of pulses, the
devices were again characterized using the same program, and all parameters compared to the pretest
data logs to look for any parametric shifts. The experiment was run once more on the same pins, and the
results compared to the original logs for the final results.
Figure 2 shows a scope capture of the pulse probed at the DRV3205-Q1 pin for the –12-V condition.
2
DRV3205-Q1 Negative Voltage Stress on Source Pins
Copyright © 2016, Texas Instruments Incorporated
SLVA805 – September 2016
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Results
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Figure 2. Conditions at DRV3205-Q1 Pin for –12-V Pulse Train
3
Results
Table 1 lists the results of the stress for each device. A grade of pass was given if each device in the
group showed no damage and had no shifts in the parameters after comparing the pre-test data logs to
the post-test data logs.
Table 1. Experiment Results
Voltage
Frequency
Duration
Test Result
0 V (Control)
N/A
N/A
Pass
–9 V
20 kHz
1 Hr/Pin
Pass
–12 V
20 kHz
1 Hr/Pin
Pass
–15 V
20 kHz
1 Hr/Pin
Pass
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