Service Manual
Agilent Technologies E8285A CDMA
Mobile Station Test Set
Assembly Level Repair
Firmware Version: A.01.29 to A.02.04 (100-1000, 1700-2000 MHz)
Firmware Version: A.04.53 and above (800-1000, 1700-2000 MHz)
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
I/O config
Help
Tests
Config
Previous
Message
Preset
Hold
CDMA SCREENS
USER
Meas
reset
ANALOG SCREENS
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
VOLUME
Max power 60 mW
Agilent Part Number E8285-90033
Revision C
Printed in U.S.A.
June 2000
AUDIO OUT
Max 12V peak
High
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
Notice
Information contained in this document is subject to change without
notice.
All Rights Reserved. Reproduction, adaptation, or translation without
prior written permission is prohibited, except as allowed under the
copyright laws.
This material may be reproduced by or for the U.S. Government
pursuant to the Copyright License under the clause at DFARS
52.227-7013 (APR 1988).
© Copyright 2000 Agilent Technologies
2
S:\agilent\e8285\ALR\Book\chapters\front.fm
Manufacturer’s Declaration
This statement is provided to comply with the requirements of the
German Sound Emission Directive, from 18 January 1991.
This product has a sound pressure emission (at the operator position) <
70 dB(A).
• Sound Pressure Lp < 70 dB(A).
• At Operator Position.
• Normal Operation.
• According to ISO 7779:1988/EN 27779:1991 (Type Test).
Herstellerbescheinigung
Diese Information steht im Zusammenhang mit den Anforderungen der
Maschinenlärminformationsverordnung vom 18 Januar 1991.
• Schalldruckpegel Lp < 70 dB(A).
• Am Arbeitsplatz.
• Normaler Betrieb.
• Nach ISO 7779:1988/EN 27779:1991 (Typprüfung).
3
Safety Considerations
GENERAL
This product and related documentation must be reviewed for
familiarization with safety markings and instructions before operation.
This product has been designed and tested in accordance with IEC
Publication 1010, “Safety Requirements for Electronic Measuring
Apparatus,” and has been supplied in a safe condition. This instruction
documentation contains information and warnings which must be
followed by the user to ensure safe operation and to maintain the
product in a safe condition.
SAFETY EARTH GROUND
A uninterruptible safety earth ground must be provided from the main
power source to the product input wiring terminals, power cord, or
supplied power cord set.
CHASSIS GROUND TERMINAL
To prevent a potential shock hazard, always connect the rear-panel
chassis ground terminal to earth ground when operating this
instrument from a dc power source.
SAFETY SYMBOLS
!
Indicates instrument damage can occur if indicated operating limits are
exceeded. Refer to the instructions in this guide.
Indicates hazardous voltages.
Indicates earth (ground) terminal
WARNING
A WARNING note denotes a hazard. It calls attention to a
procedure, practice, or the like, which, if not correctly
performed or adhered to, could result in personal injury. Do not
proceed beyond a WARNING sign until the indicated conditions
are fully understood and met.
CAUTION
A CAUTION note denotes a hazard. It calls attention to an operation
procedure, practice, or the like, which, if not correctly performed or
adhered to, could result in damage to or destruction of part or all of the
product. Do not proceed beyond an CAUTION note until the indicated
conditions are fully understood and met.
4
S:\agilent\e8285\ALR\Book\chapters\front.fm
Safety Considerations for this Instrument
WARNING
This product is a Safety Class I instrument (provided with a
protective earthing ground incorporated in the power cord). The
mains plug shall only be inserted in a socket outlet provided with a
protective earth contact. Any interruption of the protective conductor
inside or outside of the product is likely to make the product
dangerous. Intentional interruption is prohibited.
Whenever it is likely that the protection has been impaired, the
instrument must be made inoperative and be secured against any
unintended operation.
If this instrument is to be energized via an autotransformer (for
voltage reduction), make sure the common terminal is connected to
the earth terminal of the power source.
If this product is not used as specified, the protection provided by the
equipment could be impaired. This product must be used in a normal
condition (in which all means for protection are intact) only.
No operator serviceable parts in this product. Refer servicing to
qualified personnel. To prevent electrical shock, do not remove
covers.
Servicing instructions are for use by qualified personnel only. To
avoid electrical shock, do not perform any servicing unless you are
qualified to do so.
The opening of covers or removal of parts is likely to expose
dangerous voltages. Disconnect the product from all voltage sources
while it is being opened.
Adjustments described in the manual are performed with power
supplied to the instrument while protective covers are removed.
Energy available at many points may, if contacted, result in personal
injury.
The power cord is connected to internal capacitors that my remain
live for 5 seconds after disconnecting the plug from its power supply.
For Continued protection against fire hazard, replace the line fuse(s)
only with 250 V fuse(s) or the same current rating and type (for
example, normal blow or time delay). Do not use repaired fuses or
short circuited fuseholders.
5
CAUTION
Always use the three-prong ac power cord supplied with this product.
Failure to ensure adequate earth grounding by not using this cord may
cause product damage.
This product is designed for use in Installation Category II and
Pollution Degree 2 per IEC 1010 and IEC 664 respectively. For indoor
use only.
This product has autoranging line voltage input, be sure the supply
voltage is within the specified range.
Ventilation Requirements: When installing the product in a cabinet, the
convection into and out of the product must not be restricted. The
ambient temperature (outside the cabinet) must be less than the
maximum operating temperature of the product by 4° C for every 100
watts dissipated in the cabinet. If the total power dissipated in the
cabinet is greater than 800 watts, then forced convection must be used.
6
S:\agilent\e8285\ALR\Book\chapters\front.fm
Product Markings
CE - the CE mark is a registered trademark of the European
Community. A CE mark accompanied by a year indicated the year the
design was proven.
CSA - the CSA mark is a registered trademark of the Canadian
Standards Association.
7
Agilent Technologies Warranty Statement
for Commercial Products
E8285A CDMA Mobile Station Test Set
Duration of Warranty: One Year
1. Agilent warrants Agilent hardware, accessories and supplies against
defects in materials and workmanship for the period specified above.
If Agilent receives notice of such defects during the warranty period,
Agilent will, at its option, either repair or replace products which
prove to be defective. Replacement products may be either new or
like-new.
2. Agilent warrants that Agilent software will not fail to execute its
programming instructions, for the period specified above, due to
defects in material and workmanship when properly installed and
used. If Agilent receives notice of such defects during the warranty
period, Agilent will replace software media which does not execute
its programming instructions due to such defects.
3. Agilent does not warrant that the operation of Agilent products will
be uninterrupted or error free. If Agilent is unable, within a
reasonable time, to repair or replace any product to a condition as
warranted, customer will be entitled to a refund of the purchase
price upon prompt return of the product.
4. Agilent products may contain remanufactured parts equivalent to
new in performance or may have been subject to incidental use.
5. The warranty period begins on the date of delivery or on the date of
installation if installed by Agilent. If customer schedules or delays
Agilent installation more than 30 days after delivery, warranty
begins on the 31st day from delivery.
6. Warranty does not apply to defects resulting from (a) improper or
inadequate maintenance or calibration, (b) software, interfacing,
parts or supplies not supplied by Agilent, (c) unauthorized
modification or misuse, (d) operation outside of the published
environmental specifications for the product, or (e) improper site
preparation or maintenance.
7. TO THE EXTENT ALLOWED BY LOCAL LAW, THE ABOVE
WARRANTIES ARE EXCLUSIVE AND NO OTHER WARRANTY
OR CONDITION, WHETHER WRITTEN OR ORAL IS
EXPRESSED OR IMPLIED AND AGILENT SPECIFICALLY
DISCLAIMS ANY IMPLIED WARRANTIES OR CONDITIONS OR
MERCHANTABILITY, SATISFACTORY QUALITY, AND FITNESS
FOR A PARTICULAR PURPOSE.
8
S:\agilent\e8285\ALR\Book\chapters\front.fm
8. Agilent will be liable for damage to tangible property per incident up
to the greater of $300,000 or the actual amount paid for the product
that is the subject of the claim, and for damages for bodily injury or
death, to the extent that all such damages are determined by a court
of competent jurisdiction to have been directly caused by a defective
Agilent product.
9. TO THE EXTENT ALLOWED BY LOCAL LAW, THE REMEDIES
IN THIS WARRANTY STATEMENT ARE CUSTOMER’S SOLE
AND EXCLUSIVE REMEDIES. EXCEPT AS INDICATED ABOVE,
IN NO EVENT WILL AGILENT OR ITS SUPPLIERS BE LIABLE
FOR LOSS OF DATA OR FOR DIRECT, SPECIAL, INCIDENTAL,
CONSEQUENTIAL (INCLUDING LOST PROFIT OR DATA), OR
OTHER DAMAGE, WHETHER BASED IN CONTRACT, TORT, OR
OTHERWISE.
FOR CONSUMER TRANSACTIONS IN AUSTRALIA AND NEW
ZEALAND: THE WARRANTY TERMS CONTAINED IN THIS
STATEMENT, EXCEPT TO THE EXTENT LAWFULLY
PERMITTED, DO NOT EXCLUDE RESTRICT OR MODIFY AND
ARE IN ADDITION TO THE MANDATORY STATUTORY RIGHTS
APPLICABLE TO THE SALE OF THIS PRODUCT TO YOU.
9
DECLARATION OF CONFORMITY
according to ISO/IEC Guide 22 and EN 45014
Manufacturer’s Name:
Agilent Technologies
Manufacturer’s Address:
Spokane Division
24001 E. Mission Avenue
Liberty Lake, Washington 99019-9599
USA
declares that the product
Product Name:
CDMA Mobile Station Test Set
Model Number:
Agilent Technologies E8285A
Product Options:
All
conforms to the following Product specifications:
Safety:
IEC 61010-1:1990+A1+A2 / EN 61010-1:1993+A2
EMC:
CISPR 11:1990/EN 55011:1991- Group 1, Class A
IEC 61000-3-2:1995 / EN 61000-3-2: 1995
EN 50082-1:1992
IEC 801-3:1984 3V/m
IEC 801-4:1988 0.5 kV Sig. Lines, 1 kV Power Lines
Supplementary Information:
This product herewith complies with the requirements of
the Low Voltage Directive 73/23/EEC and the EMC
Directive 89/336/EEC and carries the CE-marking
accordingly.
Spokane, Washington USA
November 20, 1998
Vince Roland
Reliability & Regulatory
Engineering Manager
European Contact: Your local Agilent Technologies and Service Office or Agilent Technologies GmbH
Department ZQ/Standards Europe, Herrenberger Strasse 130, D-71034 Böblinger, Germany (FAX+49-7031-14-3143)
10
S:\agilent\e8285\ALR\Book\chapters\front.fm
Table 1
United States of America:
Agilent Technologies
Test and Measurement Call
Center
P.O. Box 4026
Englewood, CO 80155-4026
Canada:
Agilent Technologies
Canada Inc.
5159 Spectrum Way
Mississauga, Ontario
L4W 5G1
(tel) 1 800 452 4844
(tel) 1 877 894 4414
Europe:
Agilent Technologies
European Marketing
Organization
P.O. Box 999
1180 AZ Amstelveen
The Netherlands
(tel) (3120) 547 9999
Japan:
Agilent Technologies Japan Ltd.
Measurement Assistance Center
9-1 Takakura-Cho, Hachioji-Shi,
Tokyo 192-8510, Japan
(tel) (81) 456-56-7832
(fax) (81) 426-56-7840
Latin America:
Agilent Technologies
Latin America Region
Headquarters
5200 blue Lagoon Drive,
Suite #950
Miami, Florida 33126
U.S. A.
(tel) (305) 267 4245
(fax) (305) 267 4286
Australia/New Zealand:
Agilent Technologies
Australia Pty Ltd
347 Burwood Highway
Forest Hill, Victoria 3131
(tel) 1 800 629 485 (Australia)
(fax) (61 3) 9272 0749
(tel) 0 800 738 378 (New
Zealand)
(fax) (64 4) 802 6881
Asia Pacific:
Agilent Technologies
19/F, Cityplaza One,
111 Kings Road,
Taikoo shing, Hong Kong, SAR
(tel) (852) 2599 7899
(fax) (852) 2506 9233
11
Agilent Technologies E8285A Support
Contacts
The documentation supplied with your Test Set is an excellent source of
reference, application, and service information. Please use these
manuals if you are experiencing technical problems:
Table 2
Support Documentation
User’s Guide
Quick Reference Guide
Application Guide
Assembly Level Repair
Reference Guide
CD-ROM
If you have used the manuals and still have application questions,
contact your local Agilent Technologies Sales Representative.
Repair assistance is available for the Agilent E8285A CDMA Mobile
Station Test Set from the factory by phone and e-mail. External and
internal Agilent users can contact the factory via email. Parts
information is also available from Agilent.
When calling or writing for repair assistance, please have the following
information ready:
• Instrument model number (E8285A)
• Instrument Serial Number (tag located on the rear panel).
• Installed options - if any (tag located on the rear panel).
• Instrument firmware revision (displayed at the top of the screen
when the Test Set is powered up, and is also displayed on the
CONFIGURE screen).
Support Telephone Numbers:
1 800 827 3848 (RF Comms Service Assistance, U.S. only)
1 509 921 3848 (RF Comms Service Assistance, International)
1 800 227 8164 (Agilent Direct Parts Ordering, U.S. only)
1 800 403 0801 (Agilent Instrument Support Center, U.S. only)
1 916 783 0804 (Agilent Service Parts Identification, U.S. & Intl.)
12
S:\agilent\e8285\ALR\Book\chapters\front.fm
Power Cables
Table 3
Plug type
Straight/Straight
Straight/90°
Earth
Ground
Line
Plug Descriptions
male/female
Agilent Part #
(cable & plug)
8120-1689
8120-1692
Cable Descriptions
79 inches, mint gray
79 inches, mint gray
Neutral
Used in the following locations:
Bangladesh, Belgium, Benin, Bolivia, Boznia-Herzegovina, Bulgaria, Burkina Faso, Burma,
Burundi,Byelarus
Cameroon, Canary Islands, Central African Republic, Chad, Chile, Comoros, Congo, Croatia,
Czech Republic, Czechoslovakia
Denmark, Djibouti
East Germany, Egypt, Estonia, Ethiopia
Finland, France, French Guiana, French Indian Ocean Areas
Gabon, Gaza Strip, Georgia, Germany, Gozo, Greece
Hungary
Iceland, Indonesia, Iran, Iraq, Israel, Italy, Ivory Coast
Jordan
Kazakhstan, Korea, Kyrgystan
Latvia, Lebanon, Libya, Lithuania, Luxembourg
Macedonia, Madeira Islands, Malagasy Republic, Mali, Malta, Mauritania, Miquelon, Moldova,
Mongolia, Morocco, Mozambique
Nepal, Netherlands, Netherlands Antilles, Niger, Norway
Oman
Pakistan, Paraguay, Poland, Portugal
Rep. South Africa, Romania, Russia, Rwanda
Saudi Arabia (220V), Senegal, Slovak Republic, Slovenia, Somalia, Spain, Spanish Africa, Sri
Lanka, St. Pierce Islands
13
Plug Descriptions
male/female
Plug type
Agilent Part #
(cable & plug)
Cable Descriptions
Sweden, Syria
Tajikistan, Thailand, Togo, Tunisa, Turkey, Turkmenistan
USSR, Ukraine, Uzbekistan
Western Africa, Western Sahara
Yugoslavia
Zaire
Table 4
Plug Descriptions
male/female
Plug Type
Straight/Straight
Straight/90°
Agilent Part #
(cable & plug)
8120-0698
Cable Descriptions
90 inches, black
Earth
Ground
Line
Line
Used in the following locations:
Peru
Table 5
Plug Descriptions
male/female
Plug Type
Straight/Straight
Straight/90°
Line
Agilent Part #
(cable & plug)
8120-2104
8120-2296
Cable Descriptions
79 inches, gray
79 inches, gray
Neutral
Earth
Ground
Used in the following locations:
Switzerland
14
S:\agilent\e8285\ALR\Book\chapters\front.fm
Table 6
Plug Descriptions
male/female
Plug Type
Straight/Straight
Straight/90°
Straight/Straight
125V
Agilent Part #
(cable & plug)
8120-1378
8120-1521
8120-1751
Cable Descriptions
90 inches, jade gray
90 inches, jade gray
90 inches, jade gray
Earth
Ground
Neutral
Line
Used in the following locations:
American Samoa
Bahamas, Barbados, Belize, Bermuda, Brazil
Caicos, Cambodia, Canada, Cayman Islands, Columbia, Costa Rica, Cuba
Dominican Republic
Ecuador, El Salvador
French West Indies
Guam, Guatemala, Guyana
Haiti, Honduras
Jamaica
Korea
Laos, Leeward and Windward Islands, Liberia
Mexico, Midway Islands
Nicaragua
Other Pacific Islands
Panama, Philippines, Puerto Rico
Saudi Arabia (115V, 127V), Suriname
Taiwan, Tobago, Trinidad, Trust Territories of Pacific Islands
Turks Island
United States
Venezuela, Vietnam, Virgin Islands of the U.S.
Wake Island
15
Table 7
Plug Descriptions
male/female
Plug Type
JIS C 8303, 100 V
Straight/Straight
Straight/90°
Agilent Part #
(cable & plug)
8120-4753
8120-4754
Cable Descriptions
90 inches, dark gray
90 inches, dark gray
Earth
Ground
Neutral
Line
Used in the following locations:
Japan
Table 8
Plug Descriptions
male/female
Plug Type
Earth
Ground
Neutral
90°/Straight
90°/90°
Straight/Straight
Agilent Part #
(cable & plug)
8120-2956
8120-2957
8120-3997
Cable Descriptions
79 inches, gray
79 inches, gray
79 inches, gray
Line
Used in the following locations:
Denmark
Greenland
16
S:\agilent\e8285\ALR\Book\chapters\front.fm
Table 9
Plug Descriptions
male/female
Plug Type
Straight/Straight
Straight/90°
Earth
Ground
Line
Agilent Part #
(cable & plug)
8120-4211
8120-4600
Cable Description
79 inches, mint gray
79 inches, mint gray
Neutral
Used in the following locations:
Botswana
India
Lesotho
Malawi
South-West Africa (Namibia), Switzerland
Zambia, Zimbabwe
Table 10
Plug Descriptions
male/female
Plug Type
Straight/Straight
Straight/Straight
Straight/90°
Straight/90°
Earth
Ground
Line
Agilent Part #
(cable & plug)
8120-1860
8120-1575
8120-2191
8120-4379
Cable Descriptions
60 inches, jade gray
30 inches, jade gray
60 inches, jade gray
15.5 inches, jade gray
Neutral
Used in the following locations:
System Cabinets
17
Table 11
Plug Type (Male)
90°/Straight
90°/90°
Earth
Ground
Line
Plug Descriptions
male/female
Agilent Part #
(cable and plug)
8120-1351
8120-1703
Cable Descriptions
90 inches, mint gray
90 inches, mint gray
Neutral
Used in the following locations:
Bahrain, British Indian Ocean Terr., Brunei
Canton, Cyprus
Enderbury Island, Equatorial Guinea
Falkland Islands, French Pacific Islands
Gambia, Ghana, Gibraltar, Guinea
Hong Kong
Ireland
Kenya, Kuwait
Macao, Malaysia, Mauritius
Nigeria
Qatar
Seychelles, Sierra Leone, Singapore, Southern Asia, Southern Pacific Islands, St. Helena, Sudan
Tanzania
Uganda, United Arab Emirates, United Kingdom
Yeman (Aden & Sana)
18
S:\agilent\e8285\ALR\Book\chapters\front.fm
Table 12
Plug Type
Plug Descriptions
male/female
Straight/Straight
Straight/90°
Agilent Part #
(cable & plug)
8120-1369
8120-0696
Cable Descriptions
79 inches, gray
80 inches, gray
Earth
Ground
Line
Neutral
Used in the following locations:
Argentina, Australia
China (People’s Republic)
New Zealand
Papua New Guinea
Urugray
Western Samoa
19
ATTENTION
Static Sensitive
Devices
This instrument was constructed in an ESD (electro-static discharge) protected environment. This is
because most of the semi conductor devices used in this instrument are susceptible to damage by
static discharge.
Depending on the magnitude of the charge, device substrates can be punctured or destroyed by
contact or mere proximity of a static charge. The result can cause degradation of device performance,
early failure, or immediate destruction.
These charges are generated in numerous ways such as simple contact, separation of materials, and
normal motions of persons working with static sensitive devices.
When handling or servicing equipment containing static sensitive devices, adequate precautions must
be taken to prevent device damage or destruction.
Only those who are thoroughly familiar with industry accepted techniques for handling static
sensitive devices should attempt to service circuitry with these devices.
In all instances, measures must be taken to prevent static charge build-up on work surfaces and
persons handling the devices.
20
S:\agilent\e8285\ALR\Book\chapters\front.fm
Contents
1.
Introduction
Test Set Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Product Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Troubleshooting Strategy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Repair Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Calibration and Performance Verification . . . . . . . . . . . . . . . . . . . . . .
System Power Calibration Program . . . . . . . . . . . . . . . . . . . . . . . . . . .
Test Equipment Needed for the System Power Calibration Program
E8285A Support Contacts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Hardware and Firmware Enhancements . . . . . . . . . . . . . . . . . . . . . .
Ordering New Manuals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
26
28
36
37
38
39
40
41
42
43
2. Troubleshooting
How to Troubleshoot the Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Self-Test Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Functional Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF, RF, and CDMA Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Frequently Encountered Diagnostic Messages . . . . . . . . . . . . . . . . . .
Manual Troubleshooting Procedures . . . . . . . . . . . . . . . . . . . . . . . . . .
Service Screen . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
46
48
58
64
68
70
79
3. Disassembly and Replaceable Parts
Before You Start. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
Disassembly Procedures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87
Parts List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105
4. Functional Verification
5. Periodic Adjustments/Calibration
Periodic Adjustments. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storing Calibration Factors. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Running the Periodic IQ, or IQ Demod Path Calibration Programs.
Periodic Calibration Menu Descriptions. . . . . . . . . . . . . . . . . . . . . . .
Setting the Timebase Latches . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
IQ Calibration Program Description . . . . . . . . . . . . . . . . . . . . . . . . .
IQ Demod Path Calibration Program Description. . . . . . . . . . . . . . .
6. Performance Tests
Procedure and Equipment. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator FM Distortion
Performance Test 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator FM Accuracy
Performance Test 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator FM Flatness
Performance Test 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator Residual FM
Performance Test 4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator Level Accuracy
126
129
130
131
135
137
139
142
146
149
152
155
21
Contents
Performance Test 5 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator Harmonics Spectral Purity
Performance Test 6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator Spurious Spectral Purity
Performance Test 7 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Generator AC Level Accuracy
Performance Test 8 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Generator DC Level Accuracy
Performance Test 9 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Generator Residual Distortion
Performance Test 10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Generator Frequency Accuracy
Performance Test 11 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer AC Level Accuracy
Performance Test 12 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Residual Noise
Performance Test 13 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Distortion and SINAD Accuracy
Performance Test 14 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer DC Level Accuracy
Performance Test 15 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Frequency Accuracy to 100 kHz
Performance Test 16 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Frequency Accuracy at 400 kHz
Performance Test 17 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Oscilloscope Amplitude Accuracy
Performance Test 18 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer Level Accuracy
Performance Test 19 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer FM Accuracy
Performance Test 20 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer FM Distortion
Performance Test 21 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer FM Bandwidth
Performance Test 22 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer Residual FM
Performance Test 23 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Spectrum Analyzer Image Rejection
Performance Test 24 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Generator RF IN/OUT Amplitude Level Accuracy
Performance Test 25 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Generator DUPLEX OUT Amplitude Level Accuracy
Performance Test 26 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Generator Modulation Accuracy
Performance Test 27 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Analyzer Average Power Level Accuracy
Performance Test 28 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Analyzer Channel Power Level Accuracy
Performance Test 29 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
22
158
163
165
167
168
169
170
171
172
173
174
175
176
177
179
180
182
184
186
188
190
192
194
196
198
Contents
7. Performance Test Records
RF Generator FM Distortion
Performance Test 1 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator FM Accuracy
Performance Test 2 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator FM Flatness
Performance Test 3 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator Residual FM
Performance Test 4 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator Level Accuracy
Performance Test 5 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator Harmonics Spectral Purity
Performance Test 6 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator Spurious Spectral Purity
Performance Test 7 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Generator AC Level Accuracy
Performance Test 8 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Generator DC Level Accuracy
Performance Test 9 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Generator Residual Distortion
Performance Test 10 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Generator Frequency Accuracy
Performance Test 11 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer AC Level Accuracy
Performance Test 12 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Residual Noise
Performance Test 13 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Distortion and SINAD Accuracy
Performance Test 14 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer DC Level Accuracy
Performance Test 15 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Frequency Accuracy to 100 kHz
Performance Test 16 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AF Analyzer Frequency Accuracy at 400 kHz
Performance Test 17 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Oscilloscope Amplitude Accuracy
Performance Test 18 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer Level Accuracy
Performance Test 19 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer FM Accuracy
Performance Test 20 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer FM Distortion
Performance Test 21 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer FM Bandwidth
Performance Test 22 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer Residual FM
Performance Test 23 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Spectrum Analyzer Image Rejection
Performance Test 24 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
202
204
206
208
210
218
221
223
225
226
228
229
230
231
232
233
234
235
236
238
239
240
241
242
23
Contents
CDMA Generator RF IN/OUT Amplitude Level Accuracy
Performance Test 25 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Generator DUPLEX OUT Amplitude Level Accuracy
Performance Test 26 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Generator Modulation Accuracy
Performance Test 27 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Analyzer Average Power Level Accuracy
Performance Test 28 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Analyzer Channel Power Level Accuracy
Performance Test 29 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
8. Block Diagrams
Signal Flow and Interconnections . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Input/Output Section. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Analyzer Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Spectrum Analyzer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Audio Analyzer Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Analyzer Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CDMA Generator Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Audio Generator Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RF Generator Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Reference/Regulator Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Instrument Control Section. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
GPIB Serial . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
9.
24
243
244
245
246
247
250
253
255
264
266
271
275
277
279
284
287
291
Service Screen
Troubleshooting with the SERVICE Screen . . . . . . . . . . . . . . . . . . . 294
1
Introduction
This manual explains how to repair and calibrate the Agilent
Technologies E8285A CDMA/PCS Mobile Station Test Set; called the
“Test Set” throughout this manual.
Throughout this manual you will see this note:
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
The purpose of this note is to bring attention to RF frequency band
coverage provided by firmware revision A.04.5X and above. Test Sets
with firmware revision A.02.XX and below can operate at RF
frequencies from 100 (usable to 30 MHz) to 1000 and 1700 to 2000 MHz.
25
Introduction
Test Set Description
Test Set Description
Several analog and digital test instruments are integrated into the
E8285A CDMA Mobile Station Test Set to test Code Division Multiple
Access (CDMA) digital cellular, PCS, and several types of analog mobile
phones, such as AMPS, NAMPS, and TACS.
The E8285A CDMA Mobile Station Test Set
O
W
T
C
U
A
T
IO
N
N
O
S
R
E
P
T
IF
L
Figure 1-1
8285iso.eps
Ans
wer
Cal
Cal Pagl/
l/
Pag e
e
US
K1
ER
CA
LL
'
K2
K2
PO
WER
K3
'
K3
K3
RF
DO
wh NOT
en
in apply
sta
nd RF
by
NT
TX
TX ran
ran ge
set DA
ge
TA
FU
Inc rem
rem10 ent
NC
Me
10 ent
ter TIO
Low
NS
Inc
limi
Inc setrem
t
rem ent
set ent
Ave
sig
n
K4
K4
Ref
Inc
Re
Ma
lea
se
K5
K5
x po
we
r 2.5
L
Reg
Reg iste
iste r
r
As
IN/O
UT
RO
Prin
t
Tes
CD
Cel
Tes ts
MA
l con
ts
Cal
fig
SC
Cal conl
RE
l
con trol
EN
Spe
trol
S
ctru
MS
Ge
m
Ge conn
rep
n
ort
RX
con trol
SM
RX
tes
trol
S
tes t
t
MS
Aut
Aut ticahen
FER
hen TX
tica -tion
tes
TX
tion
tes t
t
K1
K1
K2
CO
End
EndRel /
Rel / eas
eas e
e
'
UT
Prin
ter
Con
Con fig
fig
ILI
RX
tes
tes
t
Shi
Shi
ft
AL
SC
TX
tes
tes
t
Me
ssa
EN
p
ssa
ge
ge
S
Pre
lyze
lyze r
r
8
9
En
En ter
ter
6
0
r 60
mW
6
2
0
3
VO
LU
ME
9
5
1
2
A IN
set
Sav
e
Rec
Rec all
all
DA
TA
4
5
1
AN
TE
NN
x po
we
Pre
set
Hol
d
Me
Me resas
as
res et
et
Add
res
Loc s
Loc al
al
Spe
Speana ctru
n
ana ctrulyze
lyzen r
r
7
8
4
IBA
res SIC
et
Can
Can cel
cel
OUT
RE
t
AF
AF ana
ana
ft
DU
PL
Hel
Me
OG
Dup
Dup lex
lex
t
TX
7
Ma
S
I/O
con
Pre fig
Pre viou
viou s
s
RX
rag
e
Inc
Inc x rem
rem ent
x 10 10ent
Hig
h limi
t
W
EX
TIE
AN
Cal
Cal conl
l
con trol
trol
.
Yes
YesOn
On /Of
/Of f
f
3
+/+/No
No Ra
Ra W tio
W tio
%
% dB
dB
AU
DIO
OUT
High
Ma
x 12
Gh
Gh dB z
dB zdBm
dBm
.
V pe
MH
MHV z
z
V %
%
kH
kH mVz
mVzs
s
mW
Hz
Hz µV
µV ms
ms
AU
DI
O
IN
ak
Lo
w
Ma
42 x
V pe
ak
Some of the instrument functions in the Test Set include:
• Synthesized AM, FM, and IQ modulation signal generator
• AM, FM and IQ modulation analyzer
• Duplex offset signal generator
• SSB demodulator
• RF power meter
• Audio and RF frequency counter and RF frequency error meter
• AC and DC voltmeter
• Distortion, SINAD, and signal-to-noise-ratio meters
• Two variable audio sources
• Oscilloscope
• Spectrum analyzer and tracking generator (optional)
• Signaling encoder and decoder
• DC current meter
26 S:\agilent\e8285\ALR\Book\chapters\intro.fm
Introduction
Test Set Description
Some of these functions are directly replaceable assemblies (such as the
spectrum analyzer); some functions are digitally derived from other
assemblies (such as the oscilloscope). Most of the replaceable
assemblies are plug-in components.
Most instrument functions can be controlled by front-panel (local)
controls and by remote commands (using a connected controller). Power
on/off, volume, and squelch controls cannot be accessed remotely.
Controls are grouped together on display screens that are usually
associated with a specific task (such as making a call to a CDMA mobile
phone).
An Instrument BASIC (IBASIC) controller is also built into the Test Set
to allow automated operation without using an external controller. This
computer also has the ability to be a system controller to other test
system instruments. Refer to the Test Set’s user’s guide for information
on using the IBASIC computer (also referred to as the IBASIC
controller).
27
Introduction
Product Description
Product Description
The E8285A CDMA Mobile Test Set is designed to meet the needs of
Cellular Provider Point of Sale Retailers, manufacturing customers,
and other customers who require CDMA Mobile Phone test capability.
The Test Set is very similar to it’s predecessor, the Agilent Technologies
8924C with the addition of newly designed RF I/O module, upconverter
and downconverter assemblies. These assemblies extend the Test Set
frequency range to cover the 1800-1900 MHz PCS Cellular band as well
as providing standard 800 MHz cellular band coverage.
Internal Operating System
A Motorola® 68020 − 33 MHz microprocessor acts as the host processor
of the Test Set. It receives commands from the front-panel controls and
communicates directly with almost every assembly inside the Test Set.
The host is also in constant communication with several other
microprocessors located throughout the Test Set.
Communications to the GPIB, serial, and parallel ports are through the
control interface assembly to the host processor.
This processor is also the core for the internal IBASIC computer. The
IBASIC computer is used to load and run various software packages for
automated radio tests. It is also responsible for executing the internal
diagnostic routines used to troubleshoot a failing instrument.
Instrument Frequency References
The Test Set reference timebase path consists of two assemblies, an
ovenized high stability reference assembly and a CDMA reference
assembly. These two assemblies provide all frequency, phase, and
timing signals used to accurately synthesize all of the Test Set’s source
and analysis signals. A master reference signal can originate from
either an external source at the 10 MHz input on the rear panel, or
from the internal 10 MHz phase locked loop oscillator located on the
high stability reference assembly. The high stability reference assembly
provides timebase references for the analog assemblies and a 10 MHz
reference signal to the CDMA reference assembly. The CDMA reference
assembly uses this signal to generate clock and timing signals for
internal CDMA assemblies, provide the 10 MHz output signal to the
rear panel, and generate the AWGN (Additive White Gaussian Noise) I
& Q noise source signals.
28 S:\agilent\e8285\ALR\Book\chapters\intro.fm
Introduction
Product Description
Figure 1-2
Reference Signal Generation
Rear Panel External
Reference In
1, 2, 5, 10 MHz
OCXO High Stability
Reference Assembly
10 MHz In
Rear Panel External
Reference Out
10 MHz
CDMA Reference
Assembly
To internal analog assemblies.
See block diagrams for more
information.
To internal digital assemblies.
See block diagrams for more
information.
AWGN
To I/Q Modulator Assembly
29
Introduction
Product Description
RF Analysis
RF signals connected to the front panel RF IN/OUT connector or
ANTENNA IN connector go to the RF I/O module. The signal level and
RF frequency are measured, and the level is adjusted using fixed step
and variable attenuators in the separate downconverter module.
Over-Power Damage
CAUTION
The ANTENNA IN connector is only used for very low level signals
(60 mW or less), and cannot be used for Transmitter (TX) Power
measurements. Exceeding this limit may destroy the RF I/O module.
The RF IN/OUT connector is used to measure direct mobile transmitter
power up to 2.5 Watts continuous.
The downconverter mixes the input signal with a local oscillator signal
from the Receiver Synthesizer assembly to produce a 114.3 MHz, 614.3,
or 385.7 MHz IF signal (depending on the frequency of the received
signal). The signal goes through a bandpass filter and then on to the
Receiver assembly.
If the IF is 614.3 or 385.7 MHz, the Receiver assembly mixes the signal
with a 500 MHz local oscillator (LO) signal from the Reference
assembly to obtain the 114.3 MHz IF. If the IF is 114.3 MHz, the signal
bypasses this downconversion. The 114.3 MHz signal divides into two
paths.
Figure 1-3
Received Signal Downconversion
Downconverter
1200-1700 MHz from
Receiver Synthesizer
Assembly
385.7 MHz
RF I/O
Receiver Assembly
RF IN/OUT
114.3 MHz
114.3 MHz
AM, FM, SSB
Demodulation
Power
Detector
ANTENNA
IN
486-1026 MHz from
Receiver Synthesizer
Assembly
614.3 MHz
500 MHz from
Reference Assy
114.3 MHz
To LO/IF Demod Assembly
30 S:\agilent\e8285\ALR\Book\chapters\intro.fm
Introduction
Product Description
AM, FM, or SSB Modulation Analysis
For AM, FM, or SSB signals, the 114.3 MHz signal is downconverted to
10.7 MHz and routed through a user-selected IF bandpass filter
(15 kHz or 230 kHz) that is centered around the 10.7 MHz IF. AM and
SSB signals are demodulated at this point; FM signals are
downconverted to a 700 kHz IF before demodulation. The demodulated
signal is routed to the Audio Analyzer 1 assembly for audio frequency
filtering. This assembly is also connected to the front-panel AUDIO IN
connector for direct audio measurements. Several low pass and high
pass filters can be selected, as well as a C-Message or optional CCITT
bandpass filter. Frequency and voltage measurements are then made
on this signal by the Measurement assembly. The signal is then routed
to the Audio Analyzer 2 assembly.
The Audio Analyzer 2 assembly routes the signal through a
user-selectable detector. A variable frequency notch filter may also be
selected for SINAD and distortion measurements. The detector’s signal
is then sent to several other assemblies:
• The Measurement assembly measures and displays the modulation
level (such as FM deviation) and provide the input to the
oscilloscope.
• The Signaling Source Analyzer assembly for signaling decoding.
• The rear-panel AUD MONITOR OUTPUT connector for external use
of the demodulated signal.
• The front-panel VOLUME control and internal speaker to listen to
the demodulated signal.
Figure 1-4
AM, FM, and SSB Signal Demodulation and Filtering
Receiver Assembly
114.3 MHz
IF
Audio Analyzer 1 Assembly
15 kHz
10.7 MHz
AM Demod
Selectable Selectable
High-Pass Low-Pass
Filters
Filters
SSB Demod
125 MHz
230 kHz
IF Filters
(centered around 10.7 MHz)
FM Demod
AUDIO IN
(front panel)
10 MHz from
Reference Assembly
DC Volts and
Audio Frequency
Measurements
Audio Analyzer 2 Assembly
Selectable Detectors
RMS
Variable Freq.
RMS*SQRT2
Notch Filter
Pk+
Pk.......
VOLUME
RMS
Detector
Signaling Source Analyzer
AUD MONITOR OUTPUT (Rear panel)
Measurement Assembly
31
Introduction
Product Description
CDMA Signal Analysis
The 114.3 MHz IF also goes to the CDMA LO/IF Demodulation
assembly. This assembly provides a through path to the spectrum
analyzer (Option 102) for all RF signals, and also provides down
conversion for CDMA signals, measurements and call processing.
To downconvert the CDMA signal, the 114.3 MHz IF is mixed with a
117.9864 MHz local oscillator (LO) signal to produce a 3.6864 MHz IF.
(The LO signal is from an oscillator that is phase locked to a 10 MHz
signal from the CDMA Reference module.)
The 3.6864 MHz signal is split and goes to the Receiver DSP assembly,
and also through a variable-gain IF amplifier before IQ demodulation.
The demodulated I and Q baseband signals are then routed to the
Digital Cellsite assemblies.
Under control from the Protocol Processor assembly, the Digital Cellsite
assemblies use the demodulated IQ information to set up and maintain
calls to CDMA phones. The Digital Cellsite 1 assembly also supplies
feedback to the CDMA LO/IF Demodulation assembly to control the
level of the variable-gain IF amplifier into the demodulator.
The Receive DSP assembly converts, digitizes, and provides final
analysis on the 3.6864 MHz signal to make measurements, such as rho,
timing accuracy, carrier feedthrough, and phase error.
Figure 1-5
Analyzing CDMA Signals
To Spectrum Analyzer
114.3MHz IF
from Receiver
CDMA LO/IF Demodulation Assembly
3.6864 MHz
Digital Cellsite
1 & 2 Assemblies
IQ
Demodulator
I data
Q data
IQ Decoding and
CDMA Generator
Data Coding
Protocol
Processor
Call Setup and
Control
IF Gain Control
117.9864 MHz
Receive DSP Assembly
CDMA IQ Modulation
Measurements
32 S:\agilent\e8285\ALR\Book\chapters\intro.fm
Introduction
Product Description
RF Signal Generation
The Signal Generator Synthesizer assembly creates a 500 to 1000 MHz
signal. The reference signal for the synthesizer is supplied by the High
Stability Reference assembly. The synthesizer’s frequency is varied
using a divider network in the feedback circuit of the phase locked loop.
Any FM modulation signal (from the Modulation Distribution
assembly), and the frequency sweep signal for the spectrum analyzer
and tracking generator, are integrated into this feedback loop. If a
CDMA signal is not being generated, the 500-1000 MHz signal is
passed through the I/Q Modulator assembly, bypassing the I/Q
modulator.
IQ Modulation
If a CDMA signal is being generated, the signal is I/Q modulated in the
I/Q Modulator assembly, using data from the Analog Cellsite assembly.
The Analog Cellsite assembly gets its data from the two Digital Cellsite
assemblies, which are controlled by the Protocol Processor assembly. Up
to eight code channels of CDMA modulation data and noise may be
summed into the IQ modulator at one time. These channels provide
phone paging, synchronization, voice (traffic) transmission, and other
CDMA system functions.
Final Frequency Conversion and Leveling
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
The RF Output assembly performs three tasks:
• Mixes or divides the 500 to 1000 MHz signal to produce signals
below 500 MHz (down to 30 MHz). A 1 GHz LO from the Reference
assembly is used for mixing.
• Provides AM modulation (when selected).
• Controls the signal level out of the assembly using an Automatic
Level Control (ALC) loop.
The signal from the RF Output assembly is sent to one of two paths in
the Upconverter assembly. RF frequencies from 30 MHz to 1 GHz route
through the bypass path. PCS frequencies are upconverted to supply
frequencies from 1700 to 2000 MHz. The user-selected frequency
contains desired modulation (AM, FM, or CDMA), or a continuous wave
(CW) signal. The level has been adjusted to provide the required level
(after going through RF I/O assembly).
33
Introduction
Product Description
RF and Duplex Outputs
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
The RF I/O assembly receives the signal from the Upconverter
assembly and routes it to the selected output connector: RF IN/OUT or
DUPLEX OUT. The signal first goes to a variable attenuator for level
control.
If the DUPLEX OUT connector is selected, the signal then goes directly
to that connector without additional attenuation. If the RF IN/OUT
connector is used as an output, the signal passes through additional
attenuation before reaching the connector. This is why a greater signal
level can be output through the DUPLEX OUT connector than through
the RF IN/OUT connector.
34 S:\agilent\e8285\ALR\Book\chapters\intro.fm
Introduction
Product Description
Figure 1-6
RF Generation Path Overview
IQ Modulator Assembly
Signal Generator Synthesizer
500-1000 MHz
1 MHz from
Reference
Assembly
I/Q Modulator
div/n
FM Mod. from
Mod. Dist.
Spec. Analyzer
Sweep
AWGN (Noise) from
CDMA Reference
Protocol
Processor
Cell Site
Digital 1
Cell Site
Digital 2
4 channels of
I&Q data
ADC &
Summing
Analog Cell Site
1 channel of
I&Q data
500-1000 MHz
Output Assembly
Upconverter Assembly
500-1000 MHz (main band)
div/2
250-500 MHz
(÷2 band)
Amplitude
Modulator
250 kHz-250 MHz
(downconverted band)
1 GHz from Reference Assembly
RF Amplitude
Adjust from
Host Controller
RF
Amp
Automatic
Level Control
AM from Mod.
Distribution Assembly.
RF I/O Assembly
Variable Step
Attenuator
DUPLEX
OUT
RF IN/OUT
To the Receiver
Assembly
35
Introduction
Troubleshooting Strategy
Troubleshooting Strategy
You can repair the Test Set yourself or send it to your local Agilent
Technologies Instrument Support Center. Before starting a repair, you
should become familiar with basic Test Set operation using the user’s
guide.
Troubleshooting relies on built-in diagnostics. Because some diagnostic
results may be ambiguous, further interpretation and testing may be
required. There are several diagnostic routines built into the Test Set:
• Power-up self-test diagnostics to test controller functioning. These
are automatically run when the instrument is turned on, and can
also be run after the instrument has been on.
• RF (Radio Frequency) assembly diagnostics.
• AF (Audio Frequency) assembly diagnostics.
• Digital assembly diagnostics for CDMA signals.
Troubleshooting hints in this manual include:
• Instructions on how to begin troubleshooting (see chapter 2,
"Troubleshooting").
• Block diagrams and theory of operation (this chapter and chapter 8,
"Block Diagrams").
• Detailed information about the built-in diagnostics (see chapter 2,
"Troubleshooting").
• Error message explanations (see chapter 10, "Error Messages").
36 S:\agilent\e8285\ALR\Book\chapters\intro.fm
Introduction
Repair Process
Repair Process
Repairing the Test Set consists of:
• Identifying the faulty assembly – see chapter 2, "Troubleshooting"
• Ordering a replacement assembly – see chapter 3, "Disassembly and
Replaceable Parts"
• Replacing the faulty assembly – see chapter 3, "Disassembly and
Replaceable Parts"
• Downloading calibration data – see chapter 2, "Troubleshooting" and
regenerating calibration data – see See “System Power Calibration
Program” on page 39.
• Performing periodic calibration – see chapter 5, "Periodic
Adjustments/Calibration"
• Functional Verification – see chapter 4 , "Functional Verification"
37
Introduction
Calibration and Performance Verification
Calibration and Performance Verification
The Test Set periodically requires some maintenance to verify that it
meets its published specifications. See “Periodic Adjustments” on page
126. Periodic Adjustments (calibration) consists of running several
built-in calibration programs. The recommended interval for periodic
adjustments is 12 months. An external frequency counter and dc
voltmeter are required. See Chapter 5, "Periodic
Adjustments/Calibration" on page 5.
NOTE
The recommended Test Set calibration interval is 24 months. This is
accomplished by performing the performance tests (see Chapter 6,
“Performance Tests,” on page 141) or sending the Test Set to an Agilent
Calibration Center or other qualified calibration lab.
The performance tests verify that the Test Set performs as indicated in
the Specifications. These tests should be performed if the Test Set’s
operation is suspect, even though it passes all internal diagnostic
checks. This identifies whether a problem actually exists in the Test
Set, or if an application problem exists outside of the Test Set.
Several assemblies, when replaced, require running specific periodic
calibration procedures to create calibration factors for that assembly. In
other cases, the calibration data will be included with the replacement
assembly on a memory card. Instructions that come with the
replacement assembly explain how to download the calibration data.
(This is not considered part of periodic calibration.)
NOTE
When troubleshooting the Test Set, it is sometimes desirable to swap a
known-good assembly (perhaps from another Test Set) for a
suspected-faulty assembly. If the swapped assembly requires
calibration data, most assemblies will operate well enough with the
original assembly’s calibration data to troubleshoot and run the
diagnostics. However, do not expect the Test Set to meet its
specifications. Also, some assemblies may appear to fail because of the
incorrect calibration data.
38 S:\agilent\e8285\ALR\Book\chapters\intro.fm
Introduction
System Power Calibration Program
System Power Calibration Program
This adjustment program is not found in ROM of the Test Set. This
program resides on a PCMCIA Memory Card, part-number
E6380-61811. It has to be downloaded from the memory card.
This program generates system power calibration factors for the Test
Set. The purpose of this program is to generate calibration factors for
the RF Input/Output Section. This assures that the Test Set will meet
its power measurement accuracy specifications after repair.
An RF signal generator and a power splitter produce two signals with
the same power level. One signal is measured by the power meter, the
other is applied to the input of the Test Set. The program measures
these levels at selected frequencies and then generates calibration
factors so the Test Set readings match the power readings. These
calibration factors are stored in the Test Set.
Communication between the active instrument(s) is through the Test
Set’s GPIB port. An optional printer can be connected to the Test Set’s
GPIB, serial, or parallel port. Typically this is done from the Printer
Setup field of the SOFTWARE menu screen.
To run the System Power Calibration program:
1. Connect GPIB cables from the Test Set to the signal generator and
power meter.
2. Insert the PCMCIA Memory Card, p/n E6380-61811, into the Test
Set’s memory card slot.
3. Press the Tests key to access the TESTS (Main Menu) screen.
4. Select the field under Select Procedure Location:
5. Select Card under the Choices: menu.
6. Select the field under Select Procedure Filename:
7. Select SYSPWR0
8. Select Run Test (K1 key).
9. Follow the instructions on the screen.
39
Introduction
Test Equipment Needed for the System Power Calibration Program
Test Equipment Needed for the System Power
Calibration Program
For the System Power Calibration program you will need the
equipment listed in table 1-1. Because this calibration program is
written specifically for this equipment, no substitutions are possible.
Table 1-1
Equipment List for System Power Calibration Program
Equipment Type
Agilent Technologies
Model Number
Signal Generator
8648B Option 1EA
Power Meter
436A
437B
438A
EPM-441A
EPM-442A
8901B
8902A
Power Sensor
8482A
ECP-E18A
11722A
Power Splitter
11667A
GPIB Cables (2 cables required, 3 if
GPIB printer is used.)
Any GPIB cable
Printer (optional)
Any serial, parallel, or GPIB printer
40 S:\agilent\e8285\ALR\Book\chapters\intro.fm
Introduction
E8285A Support Contacts
E8285A Support Contacts
The documentation supplied with your Test Set is an excellent source of
reference, applications, and service information. Please use these
manuals if you are experiencing technical problems:
• Application information is located in the E8285 Application Guide
(p/n E8285-90019) and the GPIB Condensed Programming
Reference Guide (p/n E8285-90020).
• Operation and reference information are included in the E8285A
CDMA Mobile Station Test Set User’s Guide (p/n E8285-90018).
• Calibration and repair information in this manual.
If you have used the manuals and still have application questions,
contact your local representative.
Repair assistance is available from the factory by phone and email.
Internal Agilent Technologies users can contact the factory through
email. Parts information is also available from Agilent Technologies.
When calling or writing for repair assistance, please have the following
information ready:
• Instrument model number
• Instrument serial number; tag located on the rear panel.
• Installed options - if any; tag located on the rear panel.
• Instrument firmware revision; displayed at the top of the screen
when the Test Set is powered up, and is also displayed on the
CONFIGURE screen.
Support Telephone Numbers and Email Address
•
Call Center ................................................................1-800-922-8920
•
Instrument Support Center......................................1-800-403-0801
• RF Comms Service Assistance,
International ..............................................................1-509-921-3848
U.S. only ......................................................................1-800-827-3848
• Service Parts Identification,
U.S. & International...................................................1-916-783-0804
Direct Parts Ordering,
U.S. only ......................................................................1-800-227-8164
• Email ................................................. [email protected]
41
Introduction
Hardware and Firmware Enhancements
Hardware and Firmware Enhancements
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
The hardware and firmware of the Test Set are enhanced on a
continuous basis. If an assembly is replaced, it is recommended that the
firmware be upgraded at the same time. This is important if an
assembly-level repair is performed because exchange assemblies, which
may be of a later revision than the one being replaced, may require a
later revision of the firmware to function correctly.
42 S:\agilent\e8285\ALR\Book\chapters\intro.fm
Introduction
Ordering New Manuals
Ordering New Manuals
The Test Set is designed to allow future upgrades to hardware and
firmware which may obsolete some of the material in this manual. For
the latest document revisions and information, call the Direct Parts
Ordering office (U.S. only), 1-800-227-8164.
For local and remote operating information, including descriptions of all
controls, connectors, and programming syntax, refer to the E8285
User’s Guide, part number E8285-90018.
For application information refer to the E8285 Application Guide, p/n
E8285-90019. Also, all manuals are available on CD-ROM, p/n
E8285-10003.
43
Introduction
Ordering New Manuals
44 S:\agilent\e8285\ALR\Book\chapters\intro.fm
2
Troubleshooting
This chapter explains how to isolate a problem to the defective assembly.
Troubleshooting uses the Test Set’s built-in diagnostics. If diagnostics can’t
identify the faulty assembly, supplementary information in the form of manual
troubleshooting procedures is provided.
45
Troubleshooting
How to Troubleshoot the Test Set
How to Troubleshoot the Test Set
Document the result of each step in case you need to contact Agilent Technologies
for service assistance. General troubleshooting steps are illustrated in figure 2-2 on
page 47.
Periodic Adjustment Interval
NOTE
The calibration programs Periodic Calibration, IQ Calibration and IQ Demod Path
Calibration should be performed after the replacement of any assembly referred to
in table 5-1, "Assembly Calibration Information" on page 127, or at least every 24
months. See Chapter 5, "Periodic Adjustments/Calibration" on page 125 for
details.
On power-up, the Test Set runs the Self-Test Diagnostic. Most of the Test Set’s
digital control functions are tested. The outcome of the test appears on the display
(if operating) and on four (DIAG) LEDs 0,1,2, 3, and 4 viewable digital controller
unit, see figure 2-1 (you must remove the external and top-internal covers to view
the LEDs).
Figure 2-1
LEDs
Digital Controller Board
DIAG LEDs
0 123
J4
J1
CAL
MODULE
P2
P1
controller5.eps
DS3 DS4
DS2
46
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
DS1
Troubleshooting
How to Troubleshoot the Test Set
Figure 2-2
Agilent E8285A Test Set Troubleshooting Flowchart
BEGIN
Power-up the Test Set to run self diagnostics.
Is display blank?
YES
NO
NO
1. Check for a faulty fan.
2. Check for a faulty power supply.
3. Check for a faulty assembly pulling
down line voltage.
Fan is not running or YES
does Test Set shut off
after a few seconds?
1. Check EL Display or ribbon cable.
2. Check display driver.
NO
Does a self test error
message appear?
YES
Refer to "Reading Front Panel or GPIB Codes" on page 51.
NO
Run the Functional Diagnostics on
the SERVICE MENU. See "AF, RF,
and CDMA Diagnostics" on page 64.
Is error code SRBC
or miscellaneous
hardware related?
Turn off Test Set and remove external
and internal top covers. Power-up Test
Set and read Status LEDs for Self-Test
errors. Refer to "Reading LED Codes"
on page 53.
YES
Problem detected?
YES
NO
NO
If you still suspect a problem, use the
manual troubleshooting procedures.
See "Manual Troubleshooting
Procedures" on page 70.
YES
Problem detected?
NO
Repair Test Set according
to the diagnostic
recommendations.
Repair Test Set according
to findings.
Perform the functional verification tests, refer to Chapter 4 , "Functional Verification" on page 111.
NO
All OK?
YES
END
47
Troubleshooting
Self-Test Diagnostics
Self-Test Diagnostics
On power-up the Test Set runs a diagnostic self-test. Most of the Test Set’s digital
functions are tested. The outcome of the test appears on the display (if operating)
and on four LEDs viewable and the digital controller board (you must remove the
external and top-internal covers to view the LEDs).
The self-test diagnostic can be run three ways:
1. The test runs automatically when the Test Set is turned on. After the Test Set
powers up, a message appears at the top of the display. If one or more tests fail,
the message reports the failure with a hexadecimal code.
During the test, coded failure information is displayed on four LEDs on the top
of the controller board, see figure 2-1 on page 46. The Test Set’s cover must be
removed to view these LEDs. See Chapter 3, “Disassembly and Replaceable
Parts,” on page 83 for disassembly and replacement instructions.
2. The test runs when the Test Set receives the query *TST? over GPIB. The
resultant decimal code can be read over the bus.
3. The test runs when the Self Test menu item of the Functional Diagnostics
menu is selected.
To Start Troubleshooting
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
1. Turn on the Test Set to automatically run the self test diagnostics.
•
If the Test Set does not power up, see "If the Test Set Fails to Power-up" on
page 49.
•
If all self-test diagnostics pass, and the front-panel keys and knob work, you
can assume that the digital control assemblies work.
2. After power-up, the top line of the Test Set’s display should show copyright
information and the firmware revision code. The second line should display
All self tests passed.
•
If the Test Set powers-up with “One or more self-tests
failed. Error code:<hexadecimal error code>:”, see
"Reading Front Panel or GPIB Codes" on page 51.
•
See "Frequently Encountered Diagnostic Messages" on page 68 for other
error messages that might appear on the second line of the display.
3. The CDMA CALL CONTROL screen should be displayed. Two conditions
cause a different screen to be displayed on power-up:
48
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Self-Test Diagnostics
o A SAVE/RECALL register named POWERON was saved to automatically
power-up the Test Set in a different state. Press the Preset key before
proceeding; this will restore the Test Set to the factory power-up condition.
o The Autostart Test Procedure on Power-Up: field (of the
“TESTS [Execution Conditions]” screen) is set to On to automatically run a
loaded program. Press the Shift key, then press the Cancel key to stop the
program. Press the Preset key to restore the Test Set to the factory power-up
condition.
To turn the autostart function off, press the Tests key, then select
Execution Cond (under the SET UP TEST SET: heading). The
autostart function is at the bottom of the screen; turn it Off.
If the Test Set Fails to Power-up
1. Is the Test Set plugged in? Listen for fan operation. If you don’t hear it, check
the line fuse, see figure 2-3.
Figure 2-3
Fuse
S1 SERIAL PORT
CSD2 SERIAL
HP-IB
EXT REF
INPUT
16X CHIP
OUTPUT
10 MHz
OUTPUT
fuse2.eps
Line Fuse
Spare Fuse
2. If there is no image on the display, remove the Test Set’s covers and check the
power supply LEDs: +5V, −12V, +12V (see figure 2-5 on page 51). If one is
out, the power supply or regulator board is faulty. If no LEDs are lit, confirm
that the Test Set is connected to the main power source. (Also, see step 5.)
3. Check the LEDs on the Controller assembly, see figure 2-5 on page 51. The
LEDs should all light up immediately on power-up, and then go off several
seconds after a beep is heard. If the LEDs do not light when the Test Set is
powered-up, either the Controller or the Memory/SBRC assembly is faulty.
49
Troubleshooting
Self-Test Diagnostics
4. If the Test Set does not power-up properly, but the fan operates and the power
supply voltages are correct on the Power Supply Regulator outputs, the
Controller may be failing. Check TP2 on the Controller for +5V. If +5V is
present, the Controller assembly is faulty.
5. If there is no display, but VIDEO OUT port on the rear panel has the signal
shown in figure 2-4, then the Display assembly is faulty. If the signal is not
present, then Display Drive assembly is faulty.
Figure 2-4
VIDEO OUT Signal
500mV/div.
500µs/div.
50
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Self-Test Diagnostics
Figure 2-5
Diagnostic and Power Supply LEDs
Digital Controller Board DIAG LEDs
DIAG LEDs
0 123
J4
J1
CAL
MODULE
P2
P1
controller5.eps
DS3 DS4
DS2
DS1
Power Supply LEDs
DS1: +5D
DS2: +12STBY
DS3: –12V
DS4: +12A
Reading Front Panel or GPIB Codes
Failure codes are listed in the table below. If more than one failure occurs, the
failure code will be the sum of the individual failure codes. The nature of the
failure and the assembly most-likely at fault is also listed.
51
Troubleshooting
Self-Test Diagnostics
Table 2-1
Return Values for Self-Test Diagnostic Failures
Returned Error Code
Detected Failure
Failed Assembly
Hexadecimal
(displayed)
Decimal
(GPIB)
Microprocessor
Digital Controller
0002
2
ROM
Digital Controller
0004
4
RAM
Memory/SBRC
0008
8
RAM
Memory/SBRC
0010
16
Timer
Controller
0020
32
Real-Time Clock
Memory
0040
64
Keyboard (stuck key)
Keypad a
0080
128
RS-232 I/O
Memory/SBRC
0100
256
Serial Bus Communication
Any Non-Optional assembly b
0200
512
Signaling Board Self-Test
Signaling Source/Analyzer
0400
1024
Display Drive Self-Test
Display Drive
0800
2048
Miscellaneous Hardware
Several Possible Assemblies c
1000
4096
a. Could also be the digital controller with a faulty key-down detector.
b. This checks the ability of the digital controller to communicate with any hardware on the bus.
c. This message occurs if expected hardware is absent or not responding to the digital controller.
52
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Self-Test Diagnostics
Reading LED Codes
When the self-test diagnostic reports a failure, more information about the failure
may be available inside the Test Set. This additional information is output to the
four LEDs on the top of the digital controller assembly. The failure codes are sent
out as code sequences. Figure 2-6, "Reading the Self-Test Diagnostic. The Internal
LEDs," on page 54 and the tables following it document some of the more useful
code sequences. You may need to run the Self-Test Diagnostic several times to
decode a particular LED sequence.
NOTE
The LEDs output self-test diagnostic codes only when the Test Set is powering up.
The LEDs remain off when the self-test diagnostic is initiated through
programming or when running the functional diagnostics. To read the LED codes,
the Test Set’s cover must be removed.
If the Test Set has no faults that can be detected by the Self-Test Diagnostic, the
four LEDs on the Controller assembly will light and remain on for about ten
seconds. During that period, a short beep will be heard. Then the LEDs will
extinguish and remain off.
If a fault is detected during the test:
1. The four LEDs will go on for about four seconds.
2. The LEDs will blink a failure code which corresponds to the error listed in
table 2-1, "Return Values for Self-Test Diagnostic Failures" on page 52. Figure
2-7, "First LED Patterns," on page 55 shows the blinking LED codes.
3. Two non-blinking LED codes will follow. The interpretation of these codes
depends on the preceding blinking code. Two sets of the non-blinking codes are
listed: see figure 2-8, "Non-blinking LED Codes For Serial Bus
Communication Failure," on page 56 and figure 2-9, "Non-Blinking LED
Codes for Miscellaneous Hardware Failure," on page 57.
4. If there is more than one failure, the test will loop back to step 2 and repeat
until the last failure is reported.
The pattern generated by the LEDs can be interpreted as a binary-weighting code.
The LED (labeled 0) is the least-significant bit (see figure 2-6 on page 54).
For example if the LEDs blinking pattern is Off, On, On, On (reading left-to-right
or LEDs “3 2 1 0”), the binary number is 0111 or decimal 7. The error codes shown
in table 2-1, "Return Values for Self-Test Diagnostic Failures" on page 52 are
weighted by the binary value. The weighted value for this example is decimal 27 =
128 or hexadecimal 80. (This failure is easy to simulate; simply power-up the Test
Set while holding down a key.)
53
Troubleshooting
Self-Test Diagnostics
Figure 2-6
Reading the Self-Test Diagnostic. The Internal LEDs
1. Remove the Test Set’s external cover.
2. Turn power on.
3. Read the LED sequence on the digital
controller board (see below) and compare with
the patterns below.
LED Legend
= off
= rapid blink
= steady on or slow blink
NOTE
For multiple failures, the failure patterns
described below will repeat for all failures
detected.
LED Sequences
No Failures...
The LEDs will light
for approximately 10
seconds, then all will
turn off.
0
1
2
Failures... three patterns are displayed:
The second and third patterns
The first blinks rapidly
blink slowly and indicate
and indicates the type of
failure details.
failure.
0
3
1
2
3
0
See the following tables.
(This example indicates
a Serial Bus
Communication
problem.)
1
2
3 0
Digital Controller Board
0 123
J4
J1
CAL
MODULE
P1
controller5.eps
54
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
2
(This example indicates a
faulty Audio Analyzer 1
assembly.)
DIAG LEDs
P2
1
3
Troubleshooting
Self-Test Diagnostics
Figure 2-7
First LED Patterns
If the first LED pattern
displayed is...
0
1
2
Then the failure is...
3
ROM Checksum (See note 1.)
LED Legend
= off
= rapid blink
RAM (See note 2.)
= steady on or slow blink
Microprocessor
RAM (See note 3.)
Timer
Real-Time Clock
Keyboard (stuck key or faulty key-down detector)
Control Interface (See note 4.)
Serial Bus Communication (see figure 2-8 on page 56)
Signaling Board Self Test
Display Drive Self Test
Miscellaneous Hardware (see figure 2-9 on page 57)
NOTES
1. Second and third LED failure patterns:
0001 and 0001 for any main ROM failure
0001 and 0002 for boot ROM failure
2. Second and third LED failure patterns:
0001 and 0001 for Memory/SBRC board RAM failure
0001 and 0002 for Controller board RAM failure
3. Second and third LED failure patterns:
0001 and 0001 for Memory/SBRC board RAM failure
0001 and 0010 for Memory/SBRC board RAM failure
4. Second and third LED failure patterns for Control Interface:
0001 and 0001 for Serial Port 9 failure
0001 and 0010 for Serial Port 10 failure
0001 and 0011 for Serial Port 11 failure
0001 and 0100 for Serial Port 14 failure
0001 and 1101 for Parallel Port 15 failure
0001 and 1110 for Parallel Port 16 failure
55
Troubleshooting
Self-Test Diagnostics
Figure 2-8
Non-blinking LED Codes For Serial Bus Communication Failure
If the second and third LED
patterns displayed are....
0 1
2
3
0 1
Then the failure is...
2
3
Modulation Distribution
Output Section
Audio Analyzer 1
Audio Analyzer 2
Reference
RF Input/Output
Downconverter
Receiver
Spectrum Analyzer
Signal Generator Synthesizer
Receiver Synthesizer
Upconverter
LO IF/IQ Modulator
CDMA Generator Reference
Digital Cellsite
LED Legend
= off
= rapid blink
= steady on or slow blink
56
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Self-Test Diagnostics
Figure 2-9
Non-Blinking LED Codes for Miscellaneous Hardware Failure
Then the failure is...
If the second and third LED
patterns displayed are....
0 1
2
3
0 1
2
3
Reference
Audio Filter 1 - C-Message Filter
Audio Filter 2 - 6 kHz BPF
Receive DSP
Digital Cellsite 1 and 2
LED Legend
= off
= rapid blink
= steady on or slow blink
= don’t care
57
Troubleshooting
Functional Diagnostics
Functional Diagnostics
The Diagnostics (of the SERVICE7 MENU, shown in figure 2-13 on page 61)
check whether or not major portions of the Test Set are functioning. They may
pinpoint faults in the circuitry to the faulty assembly, or they may direct the use of
any or all of the AF, RF, CDMA diagnostics to more extensively test the circuitry.
Accessing the Diagnostic Tests
CAUTION
A fifteen minute warm up is required. The measurement limits of the SERVICE7
diagnostic tests are valid only at room temperature; that is, 20º to 25ºC (65º to
75ºF).
1. Press the Preset key.
2. Press the Tests key. The TEST (Main Menu) screen appears, see figure 2-10 on
page 58.
3. Set the Select Procedure Location: field to ROM.
4. Set the Select Procedure Filename: field to SERVICE7.
Figure 2-10
TESTS (Main Menu) Screen
5. To define test conditions, see "Define Test Conditions" on page 59. To
configure the Test Set for a printer, see "Configuring a Printer" on page 60.
6. On the Tests (Main Menu), select the Run Test field (or press K1), and wait for
the SERVICE MENU to appear, see figure 2-13 on page 61.
7. Choose the diagnostic test (Functional, AF, RF, or CDMA) to run by turning
the knob to move the pointer and then pressing the knob to select the test.
8. Follow the instructions on the screen.
58
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Functional Diagnostics
As some of the tests run, you may be offered the options to alter test execution
conditions by selecting:
• Loop to run the test continuously
• Pause to pause the tests
• Stp Fail (stop-failure) to stop on a failure
• Sgl Step (single-step) to pause the test after each measurement
For descriptions of the diagnostic options, refer to:
• "Functional Diagnostics Menu" on page 62.
• "AF Diagnostics" on page 64
• "RF Diagnostics" on page 65
• "CDMA Diagnostics" on page 67
Define Test Conditions
1. On the TESTS (Main Menu) screen (see figure 2-13), select Exec Execution
Cond to access the TESTS (Execution Conditions) screen.
Figure 2-11
TESTS (Execution Conditions)
2. Set up the Output Results To: field. Select:
•
Crt to view measurements only on the display.
•
Select Printer to print the test results as well as display them on the CRT.
3. Set the Output Results For: field to All
4. Set up the If Unit-Under-Test Fails: field.
•
Select Continue to continue to the next test point.
•
Select Stop to pause testing at that point.
59
Troubleshooting
Functional Diagnostics
5. Set up the Test Procedure Run Mode: field.
•
Select Continuous to run the tests continuously.
•
Select Single Step to pause after each measurement.
6. Verify that the Autostart Test Procedure on Power-Up: setting is Off.
Configuring a Printer
Only perform the following steps if you want to print test results to a printer.
1. Press the Tests key.
2. On the TESTS (Main Menu) select Print Printer Setup. The TESTS
(Printer Setup) screen appears.
Figure 2-12
TESTS (Execution Conditions)
3. Under PRINT SETUP:, select Model: and the printer of your choice.
4. Set the Printer Port: for the side-panel connector your printer is connected to
(Parallel 15, Serial 9, or GPIB).
If an GPIB printer is used, you need to enter the printer’s two-digit bus address
when the Printer Adrs field appears (Example; enter 1 or 01 for bus address
701). Also, press the Shift key, then the INST CONFIG key to access the I\O
CONFIGURE screen, and set the Mode field to Control.
5. Under PAGE CONTROL:, set the Lines/Page: and Form Feed (FF at Start:,
and FF at End:) parameters if necessary.
60
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Functional Diagnostics
Figure 2-13
SERVICE7 Program Screens
TESTS (Mani Menu)
RF Diagnostics
SERVICE MENU
Audio Diagnostics
CDMA Diagnostics
RF Diagnostics
61
Troubleshooting
Functional Diagnostics
Functional Diagnostics Menu
To run the Functional Diagnostics, see "Accessing the Diagnostic Tests" on page
58.
NOTE
The diagnostics are intended to help in locating the source of catastrophic failures.
Occasionally, a test will fail with the test results being only slightly out of limits.
Such failures do not necessarily indicate that the Test Set is operating outside of its
published specifications or that it is otherwise faulty. Further testing (such as
running the performance tests) will be required in such cases.
NOTE
Many of the internal diagnostic and calibration procedures use low-level latch
commands to control the instrument settings. Many latch settings persist even
through a preset. They can only be reset by an instrument power down or by
explicitly reseting each latch. This phenomenon is the reason the message
“Direct latch write occurred. Cycle power when done
servicing.” is displayed the first time a latch is written to. Because latch
settings persist, problems can arise in running these programs. For example,
prematurely terminating a test in a diagnostic (using the Pause and Exit keys) and
restarting another test may cause failures in that test because of improper latch
settings. It is best to run tests to completion before starting another one. Also, be
sure to cycle the power off and on when done servicing the Test Set.
Figure 2-14
Functional Diagnostics Screen
Functional Diagnostics
62
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Functional Diagnostics
RF Modules
The Average and TX power meters, Channel Power Meter, RF analyzer, IF
analyzer and spectrum analyzer are used to test the signal generator. Both the
internal and external paths of the RF/IO assembly are used in the tests.
Analog Modulation
The demodulator in the RF analyzer, and the spectrum analyzer are used to check
the accuracy, distortion, and residuals of the FM and AM frequencies. The counter
is used to measure the audio frequency.
CDMA Loopback
CDMA Analyzer is used to measure Test Mode Rho on a signal from the CDMA
Generator. This test is only a rough indicator of CDMA functionality.
Self Test
The power-up Self-Test Diagnostics are run. Refer to "Self-Test Diagnostics" on
page 48.
Power Supplies
The different levels of the power supply are measured with the internal voltmeter.
63
Troubleshooting
AF, RF, and CDMA Diagnostics
AF, RF, and CDMA Diagnostics
NOTE
The diagnostics are intended to help in locating the source of catastrophic failures.
Occasionally, a test will fail with the test results being only slightly out of limits.
Such failures do not necessarily indicate that the Test Set is operating outside of its
published specifications or that it is otherwise faulty. Further testing (such as
running the performance tests) will be required in such cases.
NOTE
Many of the internal diagnostic and calibration procedures use low-level latch
commands to control the instrument settings. Many latch settings persist even
through a preset. They can only be reset by an instrument power down or by
explicitly reseting each latch. This phenomenon is the reason the message
“Direct latch write occurred. Cycle power when done
servicing.” is displayed the first time a latch is written to. Because latch
settings persist, problems can arise in running these programs. For example,
prematurely terminating a test in a diagnostic (using the Pause and Exit keys) and
restarting another test may cause failures in that test because of improper latch
settings. It is best to run tests to completion before starting another one. Also, be
sure to cycle the power off and on when done servicing the Test Set.
AF Diagnostics
This program tests the audio functions of the following assemblies:
•
•
•
•
•
Audio Analyzer 2
Audio Analyzer 1
Modulation Distribution
Signaling Source/Analyzer (AF Generators 1 and 2 only)
Measurement (only a few selected inputs)
After initial cabling, all tests can be run in a loop mode without further
intervention. This makes it easier to catch intermittent failures. To run the AF
diagnostics, see "Accessing the Diagnostic Tests" on page 58.
NOTE
64
A fifteen minute warm up is required. The measurement limits of the SERVICE7
diagnostic tests are valid only at room temperature; that is, 20º to 25ºC (65º to
75ºF).
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
AF, RF, and CDMA Diagnostics
Figure 2-15
AF Diagnostics Screen
Audio Diagnostics
When a test fails, a diagnosis is given in three parts:
• A diagnostic code.
• The name of the assembly or assemblies most likely to have failed.
• A rating of the confidence (high, medium, or low) of the diagnosis.
RF Diagnostics
This program tests the RF functions of the following assemblies:
•
•
•
•
•
•
•
•
•
Downconverter
RF Output
Signal Generator Synthesizer
Reference
Receiver
Receiver Synthesizer
Spectrum Analyzer (optional)
RF I/O
Upconverter
Some tests require cabling before the RF Diagnostics can be run; but all tests can
be run in a loop mode without further intervention. Running in loop mode makes it
easier to catch intermittent failures. To run these diagnostics, see "RF Diagnostics"
on page 65.
65
Troubleshooting
AF, RF, and CDMA Diagnostics
NOTE
A fifteen minute warm up is required. The measurement limits of the SERVICE4
diagnostic tests are valid only at room temperature; that is, 20º to 25ºC (65º to
75ºF).
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
Figure 2-16
RF Diagnostics Screen
RF Diagnostics
When a test fails, a diagnosis is given as:
•
•
•
66
Sometimes a diagnostic code.
The name of the assembly or assemblies most likely to have failed.
Sometimes a rating (high, medium, or low) of the confidence of the diagnosis.
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
AF, RF, and CDMA Diagnostics
CDMA Diagnostics
The Digital Diagnostics test the assemblies required for CDMA-formatted IQ
modulation.
These assemblies include:
•
•
•
•
CDMA Reference
LO/IF Demod
I/Q Modulator
Cell Site Analog
The CDMA Reference, LO/IF Demod, and I/Q Modulator are also used when
generating or analyzing analog signals.
NOTE
Before ordering a replacement assembly...
Before ordering an assembly based on the results of the diagnostics, you should
verify the diagnostics by other means if possible. This could include using manual
troubleshooting procedures and descriptions of the AF, RF, and CDMA diagnostics
in this chapter, and/or block diagrams in Chapter 8, “Block Diagrams,” on page
249. If you still lack confidence in troubleshooting or diagnosing the problem or
faulty assembly, call the Agilent Call Center (1-800-922-8920) for troubleshooting
assistance.
Figure 2-17
CDMA Diagnostics Screen
CDMA Diagnostics
67
Troubleshooting
Frequently Encountered Diagnostic Messages
Frequently Encountered Diagnostic Messages
Warning/Error Messages
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
Error messages that appear on the second line of the Test Set’s display frequently
occur while any of the SERVICE7 program diagnostic tests are running. The most
complete and general list of error messages is in the “Error Messages” chapter of
the Test Set’s Reference Guide. (Some messages relating specifically to
troubleshooting can be found in Chapter 10, "Error Messages" on page 291.) Some
of the messages you can expect to occur while running the SERVICE7 program
diagnostic tests are as follows:
68
•
Direct latch write occurred. Cycle power when done
servicing. The SERVICE7 program commonly generates this message.
This message appears the first time the diagnostic program directly addresses a
latch. The message should be ignored and cleared when you make a normal
(not a diagnostic) measurement with the Test Set. To clear this message the Test
Set should be turned off and back on again.
•
Change Ref Level, Input Port or Attenuator (if using
“Hold”). This message, and similar messages, can be generally ignored.
•
Printer does not respond. This usually indicates that one or more
settings on the TESTS (Printer Setup) screen are set incorrectly for your printer.
Also, check that the printer’s power is on and that it is correctly cabled. For
GPIB printers make sure the printer is correctly addressed. If a serial printer is
used, you may have to change the serial communication settings on the I/O
CONFIGURE screen (press Shift then Inst Config to get to this screen). The
message times out after a few seconds, and the output destination is changed to
CRT by the program.
•
ERROR 173 IN XXXX Active/system controller req’d (where
”XXXX” represents a line number). Indicates that the Test Set’s internal
IBASIC computer must be set as a system controller for some reason. This
usually indicates that the Printer Port field of the TESTS (Printer Setup)
screen was set to Agilent-IB but the Mode field on the I/O CONFIGURE
screen is set to Talk&Lstn instead of Control. Change the mode setting to
Control and run the diagnostic again.
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Frequently Encountered Diagnostic Messages
Time-outs
Certain failures may cause a frequency or voltage reading to time out, that is, the
time required for the measurement will be unreasonably long. If a timeout occurs,
measurement execution will stop and an error message will be displayed.
•
If frequency or voltage readings have been successfully made before the
timeout, the assembly currently being tested or a multiplexer on the
Measurement assembly may be at fault.
•
If most measurements fail, the Reference assembly may be supplying faulty
clock signals to the Measurement assembly.
•
Re-run the test to see if the timeout is intermittent.
69
Troubleshooting
Manual Troubleshooting Procedures
Manual Troubleshooting Procedures
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
NOTE
If you are not sure a problem exists, you should attempt to duplicate the suspected
problem. This is especially important if the Test Set is being used in a new
application where misapplication, or incorrect operation of the Test Set may be
involved.
An Agilent 8924C Mobile Station Test Set combined with an Agilent 83236B
Cellular Adapter can be used to simulate a high performance CDMA base station
and may be useful in attempting to duplicate the problem.
Refer to following table to determine which diagnostic tests, performance tests,
and periodic self calibration adjustments apply to an assembly. Downloading
calibration data is discussed in Chapter 6, "Performance Tests" on page 141.
Table 2-2
Assembly Name
Keypad
Relating Assemblies to Troubleshooting Aids
SERVICE7 Program Diagnostic
Test:
Sub-Test
Performance
Test to Performa
Periodic Calibrationb
Program
Functional Diagnostics: Self Test
No
Display
No
RF I/O
RF Diagnostics:
RF Input/Output
Digital Cellsite 1 & 2
Functional Diagnostics:
CDMA Loopback
Upconverter
RF Diagnostics: Upconverter
RF Generator:
Level Accuracy
PCMCIA Program
System Power
E6380-61811
Yes
SERVICE7:
IQ Modulator
Yes
Yes
RPG Assembly
No
Front Panel
No
Receive DSP
Functional Diagnostics: CDMA
Loopback
PCMCIA
No
No
Signaling Source/Analyzer
AF Diagnostics: Audio
Frequency Generators 1 and 2
No
Controller
Functional Diagnostics: Self Test
No
Memory/SBRC
Functional Diagnostics: Self Test
No
Downconverter
RF Diagnostics: Downconverter
Yes
Power Supply Regulator
Functional Diagnostics: Self Test
No
Fans
70
Cal.-Data
Neededc
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
No
Troubleshooting
Manual Troubleshooting Procedures
Assembly Name
SERVICE7 Program Diagnostic
Test:
Sub-Test
Performance
Test to Performa
Periodic Calibrationb
Program
Cal.-Data
Neededc
Display Drive
Functional Diagnostics: Self Test
No
Power
Supply
Functional Diagnostics: Self Test
No
Signal
Generator
Synthesizer
RF Diagnostics:
Signal Generator Synthesizer
LO-IF/IQ Modulator
CDMA Diagnostics LO_IF/IQ
Mod.
RF Output
RF Diagnostics: Output
Reference
RF Diagnostics: Reference
RF Generator: Residual FM
Yes
Receiver
Synthesizer
RF Diagnostics: Receiver
Synthesizer
RF Analyzer: Residual FM
Yes
CDMA Generator
Reference
CDMA Diagnostics: CDMA Gen.
Ref.
Receiver
RF Diagnostics: Receiver
RF Generator: Harmonic and
Spurious Spectral Purity
Yes
SERVICE7:
IQ Modulator
Yes
Yes
SERVICE7:
IQ Modulator
RF Analyzer:
FM Accuracy
Yes
Yes
Power Supply
No
Spectrum
Analyzer (optional)
RF Diagnostics: Spectrum
Analyzer
Control
Interface
Functional Diagnostics: Self Test
Modulation
Distribution
AF Diagnostics: Mod
Distribution Internal Paths
Audio
Analyzer 1
AF Diagnostics: Audio Analyzer 1
Internal Paths
Audio
Analyzer 2
AF Diagnostics: Audio
Analyzer 2
Measurement e
Functional Diagnostics: Self Test
Spectrum Analyzer
Yesd
No
AF Generator: AC Level
Accuracy
SERVICE7: Periodic
Calibration:
AF Gen Gain,
EXT Mod Path Gain
Yes
SERVICE7: Periodic
Calibration:
Audio Analyzer Offset
Yes
AF Analyzer:
AC Voltage Accuracy
SERVICE7: Periodic
Calibration:
VFN
Yes
Oscilloscope
SERVICE7:
Periodic Calibration:
Voltmeter Reference
Yesf
Motherboard
No
a. See Chapter 6, "Performance Tests" on page 141.
b. See Chapter 5, "Periodic Adjustments/Calibration" on page 125.
c. See table 5-1, "Assembly Calibration Information" on page 127 of Chapter 5, “Periodic
Adjustments/Calibration.”
d. PCMCIA smart card supplied with kit.
e. Measurement checked indirectly by all diagnostics.
f. PCMCIA smart card supplied with kit.
71
Troubleshooting
Manual Troubleshooting Procedures
Verify Test Set’s Reference Path
Out-of-Lock (OOL) LEDs
Out-of-lock (OOL) LEDs light when a phase-locked loop inside an assembly is
failing. The signal generator synthesizer and the receiver synthesizer assemblies
have these LEDs mounted close to the top of the modules. The location of each
LED is labeled on the assembly.
Verify that the CDMA generator reference and the reference are working before
troubleshooting the receiver synthesizer and/or the signal generator synthesizer
assemblies.
Figure 2-18
Out-of-lock LEDs
DS3 DS4
DS2
DS1
SIG GEN SYNTH
Out-of-lock LEDS
RCVR SYNTH
CDMA Generator Reference Assembly Verification
1. Turn the Test Set off and remove the external cover.
2. Remove the bottom cover and verify that the cable is connected between the
EXT REF IN connector and J17 on the CDMA Generator Reference assembly.
3. Turn the Test Set on and verify that a 10 MHz signal is present on J15 of the
CDMA Generator Reference assembly.
If no signal or a poor signal appears at this connector, then the CDMA
Generator Reference assembly is faulty.
4. Remove the Reference assembly.
5. Turn the Test Set on and verify that a 10 MHz signal is present on pin 20 of J63
and pin 19 of J18. This is the reference signal from the CDMA Generator
Reference assembly.
72
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Manual Troubleshooting Procedures
If the 10 MHz signal is not present at all, then the CDMA Generator Reference
assembly is faulty.
If the signal is present on pin 20 but not pin 19, then the Motherboard assembly is
faulty (open or short).
Reference Verification
1. Turn the Test Set off and re-install the Reference assembly.
2. Remove the Receiver Synthesizer assembly.
3. Turn the Test Set on and verify that a 1 MHz signal of approximately −1 dBm is
present on pin 3 of J21. This is the reference signal from the Reference
assembly.
4. If the 1 MHz signal is not present, then the Reference assembly is probably
faulty.
It is also possible that an open or shorted trace on the motherboard assembly exists.
Check the motherboard for continuity between J21 pin 3 under the Receiver
Synthesizer assembly and J18 pin 2 under the Reference assembly, and verify that
the trace is not shorted to ground.
Receiver Synthesizer Unlocked
If the 1 MHz signal is present on pin 3 of J21, then the Receiver Synthesizer
assembly is faulty.
Signal Generator Synthesizer Unlocked
1. Turn the Test Set off and remove the Signal Generator Synthesizer assembly.
2. If the signal is present, then the Signal Generator Synthesizer assembly is
faulty.
3. Turn the Test Set on and verify that a 1 MHz signal of about −20 dBm is
present on pin 3 of J12. This is the reference signal from the Reference
assembly.
If the 1 MHz signal is not present, then the Reference assembly is probably faulty.
It is also possible that an open or shorted trace on the Motherboard assembly
exists. Check the motherboard for continuity between J12 pin 3 (under the Signal
Generator Synthesizer assembly) and J34 pin 1 (under the Reference assembly),
and verify that the trace is not shorted to ground.
73
Troubleshooting
Manual Troubleshooting Procedures
Swapping Known-Good Assemblies
Most swapped assemblies which use calibration data will operate well enough with
the original assembly’s calibration data to troubleshoot and to run the diagnostics;
do not expect the Test Set to meet its specifications. Some assemblies may appear
to fail because of incorrect calibration data. It is also important to keep track of the
original assemblies in the Test Set. If calibration data is lost, the assembly will
have to be sent back to the factory.
Calibration data is generally stored in a daughter board’s socketed EEPROM on
the digital controller assembly. If the controller is replaced or swapped, the original
EEPROM must be put in the new Test Set’s controller. Should the EEPROM lose
its data, the entire instrument will require factory restoration.
The assemblies that require downloaded calibration data from a memory card are:
•
•
Spectrum Analyzer (optional)
Measurement
Swapping these assemblies may cause some performance specification failures if
the swapped in assembly's calibration data cannot be downloaded.
The assemblies that require on-board calibration loaded at the factory are:
•
•
•
•
•
•
•
•
Downconverter
Upconverter
RF I/O
Output Section
Receiver
Signal Generator Synthesizer
Receiver Synthesizer
Reference
Swapping these assemblies should not cause a performance problem, as their
calibration data resides with the assembly.
The assemblies that require a periodic calibration procedure are:
•
•
•
•
•
•
•
CDMA Reference
RF Input/Output
LO IF/IQ Modulator
Audio Analyzer 1
Audio Analyzer 2
Measurement
Modulation Distribution
Generally, these assemblies can be swapped without an immediate need of
recalibration. In some cases though, a recalibration may be necessary to properly
troubleshoot the instrument.
74
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Manual Troubleshooting Procedures
Further Isolating RF Failures
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
NOTE
Isolating failures in the RF assemblies of the Test Set can be difficult. One problem
occurs when the diagnostics use the built-in RF analyzer to test the built-in RF
source, and vice versa. This is necessary to make the diagnostics self-contained,
that is, they run without external equipment.
Some general-purpose, RF test equipment will be needed:
•
•
RF signal generator
RF modulation analyzer or spectrum analyzer.
Isolating the RF Analyzer
The RF Analyzer function uses the following assemblies. Refer to figure 2-19 and
the block diagrams in chapter 8, "Block Diagrams".
•
•
•
•
Figure 2-19
Downconverter
Receiver
Receiver Synthesizer
Spectrum Analyzer (optional)
Isolating the RF Analyzer
ANT
IN
Input
Attenuator
OPP*
Down
Conversion
Receiver
Synthesizer
RF
IN/OUT
Receiver &
IF
LO/IF
Demod
(FM, AM, SSB)
Spectrum
Analyzer
(optional)
Power
Detector
Splitter
RF Analyzer
DUPLEX
OUT
RPP†
Output
Attenuator
FROM RF SOURCE
Reference
RF I/O
*OPP = Over Power Protection
†RPP = Reverse Power Protection
75
Troubleshooting
Manual Troubleshooting Procedures
To isolate an RF analyzer problem:
1. On the Test Set:
a. Press Preset.
b. Press the Config to access the CONFIGURE screen.
•
Set the RF Display field to Freq.
•
Set the RF Offset field to Off.
c. Rotate the knob to the field under analog, press the knob and select RF ANL
(to go to the analog RF ANALYZER screen).
•
Set the Tune Freq to 900 MHz.
•
Set the Input Port to RF IN.
2. On the external RF signal generator:
a. Set the frequency to 900 MHz CW.
b. Set the amplitude to 0 dBm.
c. Connect the output to the Test Set’s RF IN/OUT connector.
3. Set the RF signal generator’s frequency to 900 and then 1800 MHz. For each
frequency reset the Tune Freq to that frequency. The Test Set’s
measurements should read as follows:
a. TX Power should read approximately 0.001 W for each frequency.
b. Frequency should read 900 and 1800 MHz respectively.
c. If the Test Set has the optional spectrum analyzer, press the Spec Anl key to
access the analog spectrum analyzer. Observe the level and frequency of the
signal.
76
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Manual Troubleshooting Procedures
Isolating the RF Source
The RF generator function uses the following assemblies. Refer to figure 2-20 and
the block diagrams in chapter 8, "Block Diagrams".
•
•
•
•
Figure 2-20
ANT
IN
LO IF/IQ Modulator
Signal Generator Synthesizer
Output Section
Upconverter
Isolating the RF Source
Input
Attenuator
OPP
TO RF ANALYZER
Reference
Power
Detector
RF
IN/OUT
Splitter
DUPLEX
OUT
RPP
Output
Attenuator
RF I/O
Up
Converter
Output
Section
IQ
Modulator
Sig Gen
Synthesizer
RF Generator
77
Troubleshooting
Manual Troubleshooting Procedures
To isolate the RF Source:
1. On the Test Set:
a. Press Preset.
b. Press the Config key to access the CONFIGURE screen.
•
Set the RF Display field to Freq.
•
Set the RF Offset field to Off.
c. Press the RF Gen key (to go to the analog RF GENERATOR screen).
d. Set RF Gen Freq to 1800 MHz.
e. Set Amplitude to 0 dBm.
f. Set Output Port to Dupl.
2. On the external RF modulation analyzer or spectrum analyzer:
a. Set the tuning for the signal generated by the Test Set.
b. Connect the analyzer’s input to the Test Set’s DUPLEX OUT connector.
3. Set the Test Set’s RF Gen Freq to 1800 MHz and then 900 MHz. For each
frequency, the external RF analyzer should read as follows:
a. Power should read approximately 0.001 W for each frequency.
b. Frequency should read 1800 and 900 MHz respectively.
78
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Service Screen
Service Screen
A large number of latch and DAC settings used throughout the Test Set can also be
read and/or set to alter standard operation. The SERVICE screen uses the internal
voltmeter and frequency counter functions to monitor specific nodes in most
assemblies. These functions are primarily intended to allow the automated internal
diagnostic routines to verify proper instrument operation, and to allow the internal
periodic adjustment routines to modify Test Set operation.
Use these functions for further troubleshooting when the diagnostics cannot isolate
a failure to a specific assembly. To do this, you must understand how to operate the
Test Set and, especially, understand how the assemblies in the Test Set work
together.
To Access the SERVICE Screen
1. Press the Config key on the Test Set.
2. On the CONFIGURE screen, rotate the Test Set’s selector knob and select
SERVICE, see figure 2-21.
The SERVICE screen appears. For field descriptions, see "Field Names and
Descriptions".
Field Names and Descriptions
Voltmeter Connection
This field selects the desired circuit node for voltage measurements. To change the
voltmeter connection, use the knob to select the Voltmeter Connection
field. A Choices menu will appear. Move the cursor to the desired circuit node in
the list and push the cursor control knob. The reading is displayed in the Voltage
measurement field at the top- left of the display.
Because the nodes being measured must be in the range of 0 to ±5 volts, the
measurement of some points are scaled to that measurement range. For example;
the +12 Volt reference (MEAS_12V_REF) should measure about +5volts. The
−12 Volt reference (MEAS_NEG_12V_REF) should measure about −5 volts.
Many of the voltage measurements are only valid after a number of instrument
settings are changed.
When run, the diagnostic routines make the necessary circuit changes and
measurements automatically, comparing the measurements to known limits for
each node.
Counter Connection
This field selects the desired circuit node to connect to the Test Set’s internal
frequency counter. The reading is displayed in the Frequency measurement
field at the top right of the display.
79
Troubleshooting
Service Screen
To change the counter connection, use the knob to select the Counter
Connection field. A Choices menu will appear. Select the desired circuit
node.
Figure 2-21
Service Screen
Gate Time
This field is used to adjust the Test Set’s internal frequency counter’s gate time. A
shorter gate time may enable you to see frequency fluctuations that might not be
seen using a longer gate time.
To change the gate time, use the knob to select the Gate Time field. When you
select the field a flashing >> cursor is displayed. Rotate the cursor control knob
until the desired gate time (10 to 1000 ms in 10 ms increments) is displayed, then
press the cursor control knob.
80
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
Troubleshooting
Service Screen
Module
This field is used to manually select the module that contains the circuit latches to
be selected.
Latch
This field is used to manually select the circuit latches in the module selected in the
Module field above. The latches control switch, DAC, and gain settings within the
Test Set. The value of the selected latch is displayed and changed in the Value
field. Some settings are read only.
To set a latch:
1. Use the knob to select the Module . A Choices menu will appear.
2. Move the cursor to the desired module name and press the knob to select it.
3. Use the knob to select the latch field. A Choices menu will appear.
4. Move the cursor to the desired latch name and press the knob to select it.
5. Use the knob to select the Value field. A flashing >> cursor is displayed.
6. Rotate the cursor control knob or key in a number on the keypad to modify the
value (hexadecimal).
Value (hex)
This field displays and changes the hexadecimal value for the latch shown in the
Latch field.
RAM Initialize
Selecting this field clears all SAVE registers and test programs, and any initialized
RAM disk(s), that may be in RAM. It also resets all latches to their factory
power-up configuration. If you have saved one or more instrument setups using the
SAVE function, using this function will permanently remove them.
81
Troubleshooting
Service Screen
82
S:\agilent\e8285\ALR\Book\chapters\trouble.fm
3
Disassembly and Replaceable
Parts
This chapter contains information for the removal and replacement of
the assemblies in the Test Set. Illustrations and a parts list are
provided for parts identification.
83
Disassembly and Replaceable Parts
Before You Start
Before You Start
CAUTION
Perform the procedures in this chapter only at a static-safe work
station. The printed circuit assemblies in this instrument are sensitive
to static electricity damage. Wear an anti-static wrist strap that is
connected to earth ground.
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
Recommended Torque
• Screws: Tighten until just snug, use care not to strip threads.
• RF connectors –
• SMA type: 9.0 lb-in. (102 N-cm)
• SMC type: 6.0 lb-in. (68 N-cm)
Tools
One or more of the following tools may be required to access and remove
Test Set’s assemblies.
• TX-10 Torx screwdriver
• TX-15 Torx screwdriver
• Flat-blade screwdriver
• 7-mm socket wrench
• 1/16-inch allen wrench
• 3/16-inch socket wrench
• 1/4 -inch open-end wrench
• 5/16-inch open-end wrench
• 29-mm socket
84
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
Disassembly and Replaceable Parts
Before You Start
Ordering Replacement Parts and Support
Repair assistance is available from the factory by phone and email.
When calling or writing for repair assistance, please have the following
information ready:
• Instrument model number
• Instrument serial number (tag located on the rear panel).
• Installed options - if any (tag located on the rear panel).
• Instrument firmware revision - displayed at the top of the screen
when the Test Set is powered up, and is also displayed on the
CONFIGURE screen.
Telephone Numbers and Email
• 1-800-922-8920 Agilent Technologies Call Center
• 1-800-827-3848 (Spokane Division Service Assistance, U.S. only)
• 1-509-921-3848 (Spokane Division Service Assistance, International)
• 1-800-227-8164 (Agilent Technologies Direct Parts Ordering, U.S.
only)
• 1-916-783-0804 (Agilent Technologies Service Parts Identification,
U.S. & International)
• 1-800-403-0801 (Agilent Technologies Instrument Support Center)
• Email: [email protected]
Downloading Calibration Data
Most assemblies in the Test Set require calibration data. To ensure that
the Test Set remains calibrated after an assembly is replaced, new
calibration data must be downloaded. When required, calibration data
is provided on a PCMCIA memory card that is included with the
replacement assembly. Refer to Table 2-2, “Relating Assemblies to
Troubleshooting Aids,” on page 70 of Chapter 2, “Troubleshooting,”to
see which modules require calibration.
85
Disassembly and Replaceable Parts
Before You Start
Calibration Data Download Procedure
1. Switch the Test Set’s power off.
2. Remove the faulty assembly.
3. Install the replacement assembly.
4. Switch the Test Set’s power on.
5. Insert the memory card.
6. Press the Tests key.
7. Set the Select Procedure Location: field to Card.
8. Set the Select Procedure Filename: field to: DNLDCAL.
9. Press the K1 key to run the test.
10.Follow the instructions on the screen.
86
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
Disassembly and Replaceable Parts
Disassembly Procedures
Disassembly Procedures
This section provides instructions for disassembling the Test Set. The
procedures provided in this chapter are mainly organized in sequential
order of Test Set disassembly. For component and assembly part
numbers refer to the "Parts List" on page 105. The callouts for the parts
used in the following illustrations are the same as their descriptions in
the parts list.
External and Internal Covers
1. Remove the rear bumpers – two screws secure each bumper. See
Figure 3-1.
2. Remove the strap handles (STRAP_HANDLE) from the Test Set.
3. Slide the external cover from the front frame.
4. To access the top-side assemblies remove the screws securing the top
internal covers and remove it. See Figure 3-2 on page 88.
5. To access the bottom-side assemblies remove the screws securing the
bottom internal cover and remove it. See Figure 3-2 on page 88.
Figure 3-1
Cover Removal
BUMPER-REAR
COVER_EXTERNAL
TRIM_STRIP_2
TRIM_STRIP_1
(Qty. 2)
AY,_STRAP_HANDLE
87
Disassembly and Replaceable Parts
Disassembly Procedures
Figure 3-2
Top and Bottom Internal Covers
DIGITAL_CVR
SMM4.0_10SEMPNTX
(Qty. 20)
RF_COVER
SMM4.0_10SEMPNTX
(Qty. 20)
HOLDDOWN_PCB
SMM4.0_10SEMPNTX
FOOT,_BOTTOM (Qty. 5)
COVER_BOTTOM
SMM4.0_10SEMPNTX
88
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
SMM4.0_10SEMPNTX
Disassembly and Replaceable Parts
Disassembly Procedures
Top-Side Assemblies
1. Remove the external and internal covers, see "External and Internal
Covers" on page 87.
2. Using Figure 3-3, identify the module or board assembly you want to
remove and lift the module or board assembly from the mother
board.
Figure 3-3
Top-Side Assemblies
REGULATOR_-KIT
DIG_CELLSITE_-KIT
ANALOG_C-SITE_KIT
DIG_CELLSITE_-KIT
PROTOCOL_PROC_-KIT
DSP_-KIT
SIGNAL_SOURCE_KIT
CONTROLLER_-KIT
MEMORY_(SRBC)_KIT
FAN_-ASSY
GPIB/SERIAL--KIT
DISPLAY_DRIVER_KIT
MOD_DISTRIBUTION_KIT
AUDIO_ANALYZER_#1_KIT
AUDIO_ANALYZER_2_KIT
SIGGEN_SYNTH_KIT
I/Q_MOD_KIT
RF_OUTPUT_KIT
HI_STB_REFERENCE_KT
RCVR_SYNTH_KIT
MEASUREMENT_KIT
CDMA_REF_-KIT
RECEIVER_-KIT
CDMA_LO/IF_
DEMOD_KIT
SPECTRUM_
ANALYZER_KIT
89
Disassembly and Replaceable Parts
Disassembly Procedures
Audio Analyzer and Filter Assemblies
Figure 3-4
Audio Analyzer and Filter Assemblies
AUDIO_ANALYZER_1_KIT
1/4 turn to remove or
secure board.
Opt.
Description
11
CCITT_FLTR
STD
C_MESS_FLTR
6KHZ_BPF_#014
90
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
Disassembly and Replaceable Parts
Disassembly Procedures
Replacing the Controller
NOTE
Restoring Calibration Data in Controller Assembly
Calibration data for the entire Test Set is stored in EEPROM on the
controller (CONTROLLER_-KIT) assembly, see Figure 3-5. When
replacing the controller assembly, you must remove the “CAL
MODULE” daughter-board from the old controller assembly and install
it onto the replacement controller assembly to preserve the calibration
data for the instrument.
“Boot Code” is the firmware that initializes the Test Set on power-up. It
also is used at power-up to see if a firmware revision card has been
inserted in the PCMCIA card port. This code is stored in the “CAL
MODULE” daughter-board on the controller (CONTROLLER_-KIT)
assembly. If a new version of boot code needs to be installed, carefully
remove the old daughter-board and insert the new one, being careful of
the orientation. To replace the controller assembly:
1. Remove the external and internal covers, see "External and Internal
Covers" on page 87
2. Locate the controller board (see Figure 3-3 on page 89), disconnect
the ribbon cables (see Figure 3-5), and pull it out from the Test Set.
3. Carefully remove the CAL MODULE daughter-board from the
original assembly and install it on the replacement.
Figure 3-5
Controller and “CAL MODULE” Assemblies
RBN_34CNDCT_28AWG
J1
CA_AY_RBN
CONTROLLER_-KIT
P2
J4
J1
0
P1
C
MO AL
DU
L
E
J1
1
CAL MODULE
(Not included in part list)
controller3.eps
91
Disassembly and Replaceable Parts
Disassembly Procedures
Batteries (Memory and Regulator Assemblies)
Figure 3-6
MEMORY_(SRBC)_KIT Assembly
MEMORY_(SRBC)_KIT
BTRY_3.0V_1AH
Figure 3-7
REGULATOR_-KIT Assembly
BTRY_3.0V_1.2AH
REGULATOR_-KIT
92
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
Disassembly and Replaceable Parts
Disassembly Procedures
Bottom-Side Assemblies
1. Remove the external and internal cover, see "External and Internal
Covers" on page 87.
2. Use Figure 3-8 through Figure 3-13 to identify and remove the
assembly desired.
Figure 3-8
Bottom-Side Assemblies
RBN-20CNDCT_28AWG-26
SR_3.58_SMA-SMA-25
BRACKET_RFIO
COAXIAL_SPDT_SW
DNCONV_KIT
RF/IO_KIT
CX_F_SMB-SMB-170
SR_3.58_SMA-SMA-22
CX_F_SMB-SMB-530
RBN_20CNDCT_28AWG-26
SR_2.18_SMA-SMA-24
UPCONV_-KIT
RBN_68CNDC30AWG
CX_F_SMB-SMB-530
SR_2.18_SMA-SMA-28
CX_A06A06_120
Front Panel
RBN_20CNDCT_28AWG-40
PCMCIA_CARD_READER_KIT
93
Disassembly and Replaceable Parts
Disassembly Procedures
Figure 3-9
Bottom-side Subassemblies
DNCONV_KIT
RF/IO_KIT
UPCONV_-KIT
COAXIAL_SPDT_SW
PCMCIA_CARD_READER_KIT
CHASSIS_AY_BOX
BRACKET_RELAY
MOTHERBOARD
CHASSIS
NOTE: There is a combined MOTHERBOARD/CHASSIS KIT.
94
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
Disassembly and Replaceable Parts
Disassembly Procedures
Downconverter Assembly
To remove this assembly disconnect the cables, connectors, and 4 screws
shown in Figure 3-10.
Figure 3-10
Downconverter Removal
RBN_20CNDCT_28AWG-26
CX_F_SMB-SMB-170
J4
CX_F_SMB-SMB-530
DNCONV_KIT
SR_3.58_SMA-SMA-25
J3
J2
J1
downcnvrtr_disassembly.eps
Upconverter Assembly
To remove this assembly disconnect the cables, connectors, and 4 screws
shown in Figure 3-11.
Figure 3-11
Upconverter Removal
RBN_20CNDCT_28AWG-40
CX_A06A6_120
SR_2.18_SMA-SMA-28
UPCONV_-KIT
SMM4.0-16SEMPNTX
(Qty. 4)
J3
J1
J4
J2
SR_2.18_SMA-SMA-24
upcnvrtr_disassembly.eps
95
Disassembly and Replaceable Parts
Disassembly Procedures
RF I/O and Coaxial Switch Assemblies
To remove the RF I/O or coaxial switch assembly, or other associated
components, see Figure 3-12.
Figure 3-12
RF I/O and Coaxial Switch Assemblies Removal
CX_F_SMB-SMB-530
SMM4.0_10SEMPNTX
(Qty. 4)
RBN_20CNDCT_28AWG-26
SR_3.58_SMA-SMA-25
BRACKET_RFI/O
J7
SR_3.58_SMA-SMA-17
J1
J5
SR_3.58_SMA-SMA-16
J4
RF/IO_KIT
J6
COAXIAL_SPDT_SW
J3
SMM3.0_18_PN_TX
(Qty. 2)
TERMINATION
J2
SR_2.18_SMA-SMA-24
NOTE 1
SR_3.58_SMA-SMA-22
SMM4.0_10SEMPNTX
(Qty. 4)
BRACKET_RELAY
SR_3.58_SMA-SMA-15
rfio_disassembly.eps
NOTE 1: To remove this cable, it is necessary
to loosen the coaxial switch.
96
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
Disassembly and Replaceable Parts
Disassembly Procedures
PCMCIA Assembly
To remove this assembly, disconnect the ribbon cable and 2 screws
securing the assembly.
Figure 3-13
PCMCIA Assembly Removal
SMM4.0_10SEMPNTX
PCMCIA_CARD_READER_KIT
RBN_68CNDC30AWG
pcmcia2.eps
97
Disassembly and Replaceable Parts
Disassembly Procedures
Motherboard Assembly
1. Remove the external and internal covers, see "External and Internal
Covers" on page 87.
2. Remove all top and bottom side subassemblies from the Test Set (see
previous disassembly procedures).
3. Remove the bracket relay from the chassis, see Figure 3-14.
4. Remove the screws securing the motherboard to the chassis.
Figure 3-14
Motherboard Disassembly
SMM4.0_10SEMPNTX (Qty. 13)
SMM4.0_20MML (Qty. 12)
SMM4.0_10SEMPNTX (Qty. 13)
BRACKET_RELAY
GRD_BRKT_SMB
MOTHERBOARD
98
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
SMM4.0_10SEMPNTX
(Qty. 13)
Disassembly and Replaceable Parts
Disassembly Procedures
Front Panel Assembly
The front-panel assembly must be removed from the Test Set’s chassis
before any of the front panel subassemblies can be removed.
1. Remove the external and internal covers,
see "External and Internal
,
Covers" on page 87.
2. Remove the cables, BNC nuts, and 6 screws securing the front panel
frame to the Test Set’s chassis, see Figure 3-15.
3. See Figure 3-16 on page 100 to identify the desired subassembly for
removal.
Figure 3-15
Front Panel Assembly
CORE_SHIELD_BEAD_AY
SMM4.0_10SEMPNTX (Qty. 6)
NUT-HEX-DBL-CHAM (Qty. 3)
99
Disassembly and Replaceable Parts
Disassembly Procedures
Figure 3-16
Front Panel Subassemblies
DISPLAY_CVR_AY
RBN_10CNDCT28AWG
DISPLAY_-KIT
WINDOW-DISPLY
RBN_50CNDCT28AWG
CA_-ASSY_SPEAKER
CBL_AY_VOL_CONT
CX_F_BNC-SMB
KNOB_ASSY_3/8
KNOB-31_DIA
100
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
Disassembly and Replaceable Parts
Disassembly Procedures
Fan
1. Remove the external and internal-top covers. See "External and
Internal Covers" on page 87.
2. To remove either fan (see Figure 3-17) disconnect its power
connector to the motherboard, and remove the 4 screws securing the
fan to the Test Set chassis.
Figure 3-17
Fan Removal
FAN_-ASSY
SMM4.0_10SEMPNTX (Qty. 6)
REAR_PANEL_ASSY_KIT
CHASSIS_ASSY
101
Disassembly and Replaceable Parts
Disassembly Procedures
Power Supply
1. Remove the external and internal top and bottom cover, see Figure
3-2 on page 88.
2. Remove the 6 screws securing the power supply assembly to the Test
Set’s chassis, see Figure 3-18.
3. Refer to Figure 3-19, “Power Supply Subassemblies,” on page 103
and Figure 3-20, “Power Supply Assembly Rear Panel,” on page 104
to identify the desired subassembly for removal.
Figure 3-18
Power Supply Assembly
SMM4.0_10SEMPNTX (Qty. 6)
102
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
Disassembly and Replaceable Parts
Disassembly Procedures
Figure 3-19
Power Supply Subassemblies
SMM3.0_8SEMPNTX
HEATSINK PLATE
RBN_16CNDCT_28AWG
SMM4.0_10SEMPNTX (Qty. 6)
HRN-20CNDCT_18AWG
POWER_SUPPLY
REAR_PANEL_CONNECTOR_ASSY
E8285-61013
NOTE: When reassembling power supply
assembly to chassis, ensure guide pins
are aligned properly into chassis.
103
Disassembly and Replaceable Parts
Disassembly Procedures
Figure 3-20
Power Supply Assembly Rear Panel
SA TRIG OUT
CELLSITE/TRIGGERS
WSHR_LK_.1941D (Qty2)
STDF_.327l_6-32 (Qty. 2)
CONN_SCREWLOCK_F (Qty. 14)
LINE_MODULE
CA_CX_BNC-DSUB_2
NUT-HEX-DBL-CHAM (Qty. 9)
104
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
Disassembly and Replaceable Parts
Parts List
Parts List
Table 3-1
Replaceable Parts
Description
Part Number
6KHZ_BPF_#014_AY
08920-60268
ANALOG_C-SITE_KIT (FW Rev A.04.54 and below)
08924-61807
ANALOG_C-SITE_KIT (FW Rev A.05.03 and above)
E8285-61845
APPLICATN_GUIDE
E8285-90019
AUDIO_ANALYZER_#1_KIT
08920-61811
AUDIO_ANALYZER_2_KIT
08920-61853
AY, _STRAP_HANDLE
E8285-61012
BTRY_3.0V_1AH [on MEMORY_(SRBC)_KIT]
1420-0394
BTRY_3.0V_1.2AH [on REGULATOR_-KIT]
1420-0338
BRACKET_RELAY
E8285-00044
BRACKET_RELAY
E8285-00044
BUMPER-REAR
E5515-40009
C-MESS_FLTR
08920-61056
CA_AY-RBN
E6380-61052
CA_AY_RBN_26_CND
E8285-61057
CA_CX_BNC-DSUB_2
E8285-61066
CBL_AY_LNE_MDL
E8285-61047
CBL_AY_VOL_CONT
E8285-61043
CCITT_FLTR_#011
08920-61055
CDMA_LO/IF_DEMOD_KIT
08924-61805
CDMA_REF_-KIT
E8285-61804
CHASSIS_AY
E8285-61001
CHASSIS_AY_BOT
E8285-61035
COAXIAL_SWITCH
33314-60015
CONDENSE_REF_GDE
E8285-90020
CONN_SCREWLOCK_F
0380-2079
CONTROLLER_-KIT
E8285-61808
105
Disassembly and Replaceable Parts
Parts List
106
Description
Part Number
CORE_SHIELD_BEAD_AY
E8285-61058
COVER_BOTTOM
E8285-00012
COVER_EXTERNAL
E8285-00070
CX_A06A06_120
8120-5846
CX_F_BNC-SMB
E8285-61018
CX_F_SMB-SMB_170
E8285-61049
CX_F_SMB-SMB_530
E8285-61051
DIG_CELLSITE_-KIT
E8285-61832
DIGITAL_CVR_AY
E8285-61009
DISPLAY_-KIT
E8285-61823
DISPLAY_DRIVER_KIT
E6380-61816
DNCONV_KIT (FW Rev A.02.XX and below)
E6380-61808
DNCONV_KIT (FW Rev A.04.5X and above)
E8285-61861
DSP_-KIT
E8285-61812
FAN_-ASSY
E8285-61014
FOOT,BOTTOM
E5515-40010
FRONT_FRAME_-ASSY
E8285-61822
FUSE_5A_250V
2110-0882
FW_UPGRAD_-KIT
E8285-61815
GRD_BRKT_SMB
E8285-00029
GRND_SPRING_SMA
E8285-00065
GROUND_BRKT_CBL
E8285-00048
HEAT_SINK_PWR_SUP
E8285-00040
HI_STB_REFERENCE_KT
08920-61835
HOLDDOWN_KEYMAT
E8285-00038
HOLDDOWN_PCB
E8285-61052
HOLDDOWN_TYPE_N_AY
E8285-61053
GPIB/SERIAL_-KIT
E8285-61843
HRN-20CNDCT_18AWG
E8285-61033
HRN_PWR_SWITCH
E8285-61042
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
Disassembly and Replaceable Parts
Parts List
Description
Part Number
I/Q_MOD_KIT
08924-61806
KEY_MAT
E8285-40001
KEYBOARD_-ASSY
E8285-60141
KNOB-31_DIA
E5515-21052
KNOB_ASSY_3/8
0370-3409
MANUAL_CD_ROM
E8285-10004
MEASUREMENT_KIT
08920-61836
MEMORY_(SBRC)_KIT
E6380-61801
MOD_DISTRIBUTION_KIT
08920-61809
MOTHER_BD_AY
E8285-60101
MOTHERBOARD/CHASSIS_-KIT
E8285-61801
NUT-HEX-DBL-CHAM
0590-2332
PCMCIA_CARD_READER_KIT
E6380-61803
POWER_SUPPLY
0950-2665
PROTOCOL_PROC_-KIT
E8285-61813
RBN_10CNDCT28AWG
1253-0851
RBN_16CNDCT_28AWG
E8285-61032
RBN_20CNDCT_28AWG-26
E8285-61026
RBN_20CNDCT_28AWG-40
E8285-61040
RBN_34CNDCT_28AWG
E8285-61031
RBN_50CNDCT28AWG
E8285-61021
RBN_68CNDC30AWG
E8285-61019
RCVR_SYNTH_KIT
08921-61820
REAR_PANEL_CONNECTOR_ASSY
E8285-60140
REAR_PANEL_KIT
E8285-61810
RECEIVER_-KIT (FW Rev A.02.XX and below)
E8285-61805
REFERENCE_GUIDE
E8285-90016
REGULATOR_-KIT
E8285-61802
RF/IO_KIT (FW Rev A.02.XX and below)
E8285-61856
RF/IO_KIT (FW Rev A.04.5X and above)
E8285-61860
107
Disassembly and Replaceable Parts
Parts List
108
Description
Part Number
RF_COVER_AY
E8285-61008
RF_OUTPUT_KIT (FW Rev A.02.XX and below)
E6380-61832
RF_OUTPUT_KIT (FW Rev A.04.5X and above)
E8285-61859
SCR-MACH_MS10.8
0515-2694
SHIELD_DISPLAY
E8285-00054
SIGGEN_SYNTH_KIT
08921-61819
SIGNAL_SOURCE_KIT
08920-61850
SMM3.0_12SEMPNTX
0515-0664
SMM3.0_18_PN_TX
0515-0682
SMM3.0_6_FL_TX
0515-1227
SMM3.0_6SEMPNTX
0515-2126
SMM3.0_8_FL_TX
0515-1102
SMM3.0_8SEMPNTX
0515-0372
SMM4.0_10SEMPNTX
0515-0380
SMM4.0_12SEMPNTX
0515-2243
SMM4.0_16SEMPNTX
0515-2245
SMM4.0_20MML
0515-0456
SMM4.0_6_PN_TX
0515-0684
SPEAKER_ASSY
E8285-61044
SPECTRUM_ANALYZER_KIT
08920-61852
SR_2.18_SMA-SMA
E8285-61024
SR_2.18_SMA-SMA
E8285-61028
SR_3.58_SMA-SMA-15
E8285-61015
SR_3.58_SMA-SMA-16
E8285-61016
SR_3.58_SMA-SMA-17
E8285-61017
SR_3.58_SMA-SMA-22
E8285-61022
SR_3.58_SMA-SMA-25
E8285-61025
STDF_.327L_6-32
0380-0644
TERMINATION
0960-0053
TRANSIT_CASE
E8285-90012
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
Disassembly and Replaceable Parts
Parts List
Description
Part Number
TRIM_STRIP_1
5041-9173
TRIM_STRIP_2
5041-9176
UPCONV_-KIT (FW Rev A.02.XX and below)
E8285-61811
UPCONV_-KIT (FW Rev A.04.5X and above)
E8285-61862
USERS_GUIDE
E8285-90018
WINDOW-DISPLY
E6380-21010
WSHR_LK_.1941D
2190-0577
109
Disassembly and Replaceable Parts
Parts List
110
S:\agilent\e8285\ALR\Book\chapters\disassembly.fm
4
Functional Verification
The purpose of this chapter is to provide loopback self-tests and mobile phone
test procedures that quickly verify the functional performance of the Test Set.
111
Functional Verification
Purpose
Purpose
The purpose of this chapter is to provide loopback self-tests and mobile phone
test procedures that quickly verify the functional performance of the Test Set
while racked in a test system or operating stand-alone. If racked in a test
system, removing the Test Set should be avoided if all functional performance
tests pass. Performing and passing all tests will result in a very high level of
confidence that the Test Set is functioning properly. This document is not
intended to provide complete troubleshooting instruction for hardware
failures.
The desired results of the following procedures are:
• To isolate the cause of test system problems quickly if related to the Test
Set
• To minimize unnecessary Test Set swapping
• To identify the root cause of poor test system yields if related to the Test Set
• To improve user test system quality confidence level
• To educate current and new production technicians on Agilent Technologies
products
112
S:\agilent\e8285\ALR\Book\chapters\verif.fm
Functional Verification
Process Efficiency Recommendations
Process Efficiency Recommendations
A. Identify a test-standard “Golden Mobile” phone for each production line.
This phone will be used to verify your test system and Test Set performance
B. Characterize components of each test system:
Generate baseline performance data for each Test Set
Generate baseline performance data for each fixture
Generate baseline normalization data for external path losses
C. Maintain Test System binder to include:
Test Set baseline data
Fixture baseline data
Test system normalization calibration tables
Test system maintenance records. (Performance Verification and PTR
Records, Table 4-1 on page 123)
D. Create troubleshooting kits to include
Golden mobile phone
Cables and adapters
Maintenance record sheets
Firmware cards
E. Use Save/Recall registers to speed-up testing.
Chapter 4
113
Functional Verification
Analog Loopback
Analog Loopback
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF frequencies from
800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value
out of range”, will be displayed if invalid frequencies are set.
Analog loopback configures the Test Set to test all of its major functions. A
problem located in the RF and audio source or RF and audio analyzer paths
will become evident.
In this configuration, the RF and audio generators will be used to simulate a
low level modulated transmitter signal. The RF receiver will be used to
demodulate this signal and pass it on to the audio analyzer to make the
SINAD measurement.
1. Press the green Preset key to configure instrument to default settings.
2. Connect a short RF cable between the DUPLEX OUT port and the
ANTENNA IN port.
3. Configure the instrument for loopback mode.
3a. Press the Config key and set the following fields:
• RF Display: Freq
• RF Offset: On
• (Gen) - (Anl): 0 MHz
3b. Press the AF analyzer key and set the following fields:
• Speaker ALC: ON
• Speaker Vol: POT
3c. Press the Duplex key and set the following fields:
• Tune Freq: 501 MHz (FW rev A.02.XX and below)
TTune Fre q: 900 MHz (FW rev A.04.5X and above)
• Input Port: Ant
• RF Gen Freq: 501 MHz (FW rev A.02.XX and below)
TRRF Gn Freq: 900 MHz (FW rev A.04.5X and above)
• Amplitude: –80 dBm
• Output Port: Dupl
• AFGen1 To: FM / 3.10 kHz
• AF Anl In: FM Demod
• Filter 1 300 HPF
• Filter 2 3 kHz LPF
• De-Emphasis OFF
• Detector RMS*SQRT2
114
S:\agilent\e8285\ALR\Book\chapters\verif.fm
Functional Verification
Analog Loopback
4. Turn up the VOLUME knob to hear the 1 kHz tone.
5. SINAD meter should read >35 dB.
6. Change the Amplitude setting to –100 dBm., the SINAD meter should read
>12 dB.
7. Record results in Table 4-1 on page 123.
SUGGESTION: Store instrument settings as a Save/Recall register (press the
Save key). Name the register SINAD.
Chapter 4
115
Functional Verification
Wideband Sweep
Wideband Sweep
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF frequencies from
800 to 1000 MHz and 1700 to 2000 MHz. A text only error message “Input value
out of range”, will be displayed if invalid frequencies are set.
NOTE
This functional performance test requires the spectrum analyzer option in the
Test Set.
Wideband sweep configures the Test Set to test all of its major functions. A
problem located in the RF source or RF analyzer paths will become evident. In
this configuration, the spectrum analyzer and tracking generator will be used
to test and view the RF level and flatness of the RF source and RF analyzer
over a 1 GHz span.
1. Begin by using the same setup as analog loopback (Recall “SINAD”
register)
2. Connect a short RF cable between the RF IN/OUT port and the ANTENNA
IN port
3. Configure the instrument for wideband sweep mode.
3a. Press the Spectrum analyzer key. On the SPECTRUM ANALYZER
screen set the following fields:
• Set the Ref Level field to 0 dBm
• Set the Span field to 1 GHz (FW rev A.02.XX and below)
Si et the Span field tioi 200 MHz (FW rev A.04.5X and above)
3b. On the SPECTRUM ANALYZER / RF Gen screen, set the following
fields:
• Set the Controls field to RF Gen Track
• Set the Port/Sweep field to RF Out
4. Sweep should be:
• Continuous across the display with no RF level dropouts
• Fairly flat, about 4 to 5 dB difference between end points
5. Record results in the Table 4-1 on page 123.
SUGGESTION: Store instrument settings as a Save/Recall register (press the
Save key). Name the register WB_SWEEP
116
S:\agilent\e8285\ALR\Book\chapters\verif.fm
Functional Verification
Channel Power Loopback Verification Test
Channel Power Loopback Verification Test
Channel power is extremely important in the ability of the Test Set to
maintain a link with and properly control power output levels of the mobile
phone under test. Channel power loopback verification is a quick way to ensure
that both the average and channel power measurements are working properly.
1. Press the green Preset key to configure instrument to default settings.
2. Connect a short RF cable between the RF IN/OUT port and DUPLEX OUT
port
3. Configure the Test Set for channel power loopback mode (this is a
non-standard user mode).
3a. Press the (CDMA SCREENS) Call control key and set the RF Chan Std
field to US PCS.
3b. Press the Config key and set the following fields:
• RF Display: Freq
• RF Offset: On
• (Gen) - (Anl): 0 MHz
• Output Port: Dupl
• Input Port: RF In
3c. Press the (CDMA SCREENS) Call control key. On the CDMA CALL
CONTROL screen, set the following fields:
• RF Gen Freq: 1900 MHz
• Place cursor on the Avg Power field and select Chan Power
• Place cursor on the Power Meas field.
• Press the knob or Enter key to begin calibration routine
• Press the Yes key to continue the calibration routine
4. Perform the Channel Power Loopback Measurement:
• Place cursor on the Sctr A Pwr field
• Step the Sctr A Pwr level from –5 to –60 dBm in 5 dB increments.
• Measured channel power should be within a few dB of the sector power
output level setting
NOTE
The "Ideal Mobile Power" value is not applicable for this test
5. Record results in Table 4-1 on page 123.
Suggestion: Store instrument settings as a Save/Recall register (press the Save
key). Name the register CPWR_LB.
Chapter 4
117
Functional Verification
ROM-Based Diagnostics and Calibration
ROM-Based Diagnostics and Calibration
Comprehensive internal IBASIC diagnostics are provided to aid in
troubleshooting the Test Set. These diagnostic programs use external cabling
and the internal measurement and path setting capabilities of the Test Set to
diagnose itself for RF and audio hardware problems. No external test
equipment is necessary.
As the diagnostic programs execute, detected problems will be reported with a
suggested defective assembly and it’s probability of failure. Refer to the
appropriate Assembly Level Repair section for more information.
1. Press the Preset key to configure instrument to default settings.
2. Press the Tests key to access to TESTS (Main Menu) screen, see Figure 4-1
on page 119.
3. For Select Procedure Location: select ROM
4. For Select Procedure Filename: select SERVICE7
5. Press the K1 key. The SERVICE MENU appears.
6. Load and execute each of the following diagnostic and calibration programs:
• Under Functional Diagnostics; select RF Modules, Analog Modulation,
and CDMA Loopback
• AF Diagnostics
• RF Diagnostics
• CDMA Diagnostics
• IQ Calibration
• IQ Demod Path Calibration
NOTE
Disregard all other diagnostic or calibration programs that appear on the
SERVICE MENU and are not listed in step 6.
7. Load and execute PCB_CAL program:
• Press the Tests key to access the TESTS (Main Menu) screen.
• For Select Procedure Location: select ROM
• For Select Procedure Filename: select PCB_CAL
• Press K1 to execute.
8. Record results in the Table 4-1 on page 123.
118
S:\agilent\e8285\ALR\Book\chapters\verif.fm
Functional Verification
ROM-Based Diagnostics and Calibration
Figure 4-1
SERVICE MENU
Chapter 4
119
Functional Verification
Channel Power Calibration
Channel Power Calibration
To ensure the accuracy of the Test Set power measurement, channel power
calibration should be run before the mobile phone functional test portion of the
performance verification test plan.
1. Press the Preset key to configure instrument to default settings.
2. Connect a short RF cable between the RF IN/OUT port and DUPLEX OUT
port
3. Calibrate the channel power measurement:
• Press the (CDMA SCREENS) Call control key
• Set RF Chan Std field to US PCS
• Set Avg Power field to Chan Power
• Place the cursor on the Power Meas field and select Calibrate
• Press the knob or Enter key to begin calibration routine.
4. Record results in the Table 4-1 on page 123.
Suggestion: Store instrument settings as a Save/Recall register (press the Save
key). Name the register CPWR_CAL.
120
S:\agilent\e8285\ALR\Book\chapters\verif.fm
Functional Verification
CDMA Mobile Phone Functional Test
CDMA Mobile Phone Functional Test
1. Connect the mobile phone to the Test Set.
2. Setup for call processing:
NOTE
Knowledge of the mobile’s System ID, RF Channel, and RF Channel capability
are essential to call processing. Therefore, the mobile phone functional test
may not be successful if this information is not known.
2a. Press (CDMA SCREENS) Cell config key. On the CDMA CELL SITE
CONFIGURATION screen:
• For the System ID field, if known, enter system ID number.
• For the Rgstr SID field, enter system ID number (same as System ID
field).
• Set the Pwr Up Reg field to On.
2b. Press the Config key and set the Date field for one month in advance.
2c. Press the (CDMA SCREENS) Call control key:
• Place cursor on the Avg Power field and select Chan Power
• For the RF Chan Std field enter appropriate RF channel standard
• For the Protocol field select appropriate protocol
• For the RF Channel field enter appropriate RF channel
• For the Traffic Data Mode field select Svc Opt 2
• For the Sctr A Pwr field enter –55 dBm/BW
Suggestion: Store instrument settings as a Save/Recall register (press the
Save key). Name the register CP.
3. Turn mobile phone on:
• Ensure Test Set’s Call Status “Transmitting” annunciator is lit.
• Mobile should obtain service with the Test Set.
• If capable, mobile will do a power-up registration within 20 seconds
indicated by the ESN appearing below the MS Database field.
• Mobile RSSI indicator shows four bars.
• Mobile may display date and time setting of Test Set.
4. Originate Call
• Dial '123' on mobile then press YES or Send
• Test Set’s Connected annunciator should be lit
• Mobile should be in a connected “Svc Opt 2” state.
• Press No or End on mobile to end call.
5. Page mobile phone:
Chapter 4
121
Functional Verification
CDMA Mobile Phone Functional Test
• Press the Call/Page key on the Test.
• Test Set should page the mobile.
• Mobile should automatically connect to Test Set.
6. Mobile phone measurements (record all test results in Table 4-1 on page
123.
6a. Receiver FER Test:
• Press the (CDMA SCREENS) RX test key
• Set the Display Interim Results field to Yes
• Set the FER Spec field to 0.50%
• Set Sctr A Pwr: field to –90 dBm/BW (when no isolation box is used)
• Set Meas Cntl filed to Single
• Begin measurement, highlight the Arm field. Test Set should return a
Passed Status
6b. Transmitter Rho Test:
• Press the (CDMA SREENS) TX test key.
• Set Meas Cntl field to Cont. Measured Traffic Rho should be >0.980
6c. Mobile Channel Power Test:
• Press the (CDMA SCREENS) Call control key.
• Set Chan Power field to Chan Power. Measured channel power should be
about ±1.5 dB of the calculated “Ideal Mobile Power” value.
7. End call - press the End/Release button on the Test Set.
122
S:\agilent\e8285\ALR\Book\chapters\verif.fm
Functional Verification
Functional Verification Test Record
Functional Verification Test Record
Tested By______________Date_________ Test Set Serial #_____________
Cell Phone ESN #________________Cell Phone MIN #_________________
Table 4-1
Functional Verification Test Record
Power Up Self-Test
Pass / Fail
All self tests passed
Channel Power Loopback Verification Test
Pass / Fail
Channel Power Accuracy
Analog Loopback
Pass / Fail
SINAD @ –80 dB > 25 dB
SINAD @ –100 dB > 12 dB
Wideband Sweep
Pass / Fail
Acceptable flatness = (Max level – Min level) = <5 dB
TESTS (Main Menu) Screen ROM Diagnostic Programs
Pass / Fail
SERVICE7 / Functional Diagnostics / RF Modules
SERVICE7 / Functional Diagnostics / Analog Modulation
SERVICE7 / Functional Diagnostics / CDMA Loopback
SERVICE7 / AF Diagnostics (All Tests)
SERVICE7 / RF Diagnostics (All Tests)
SERVICE7 / CDMA Diagnostics (All Tests)
TESTS (Main Menu) Screen Calibration Programs
Pass / Fail
SERVICE7 / IQ Calibration
SERVICE7 / IQ Demod Path Calibration
PCB_CAL
Channel Power Calibration Procedure (see “Channel Power
Calibration” on page 120)
Pass / Fail
Channel Power Cal
Call Setup Procedures (see “CDMA Mobile Phone Functional
Test” on page 121)
Pass / Fail
Register Mobile
Chapter 4
123
Functional Verification
Functional Verification Test Record
Table 4-1
Functional Verification Test Record
Page to Mobile
Origination from Mobile
Functional Tests Procedures (see “CDMA Mobile Phone
Functional Test” on page 121)
Pass / Fail
Receiver FER
Transmitter Rho
Mobile Channel Power
124
S:\agilent\e8285\ALR\Book\chapters\verif.fm
5
Periodic Adjustments/Calibration
This chapter contains the periodic adjustment procedures for the Test Set.
125
Periodic Adjustments/Calibration
Periodic Adjustments
Periodic Adjustments
Some assemblies or combinations of assemblies require periodic adjustments to
compensate for variations in circuit performance due to age or environment.
There are two types of calibration data:
•
Factory-generated digital data either on memory cards, or on-board ROMs
(which are on the assemblies themselves)
•
Data generated internally by running calibration programs (ROM-based or
external “System Power Calibration Program” on page 39)
In either case calibration data is loaded into non-volatile memory on the controller
assembly.
NOTE
Because calibration data resides on the Controller assembly, it is important that
whenever this assembly is replaced that the data be transferred from the original
assembly to the new one. The calibration data resides on a “CAL MODULE”
daughter-board which can be moved with little danger of losing its contents. Insure
that the serial number of the daughter-board matches the serial number of the Test
Set. Refer to the instructions accompanying the replacement assembly for details.
To download calibration data supplied on a memory card, follow the instructions
that come with the replacement assembly. To create and download calibration data
for assemblies requiring a periodic adjustment, follow the steps later in this
chapter. For a summary of assemblies and their calibration requirements, see table
5-1, "Assembly Calibration Information" on page 127.
126
S:\agilent\e8285\ALR\Book\chapters\period_adj.fm
Periodic Adjustments/Calibration
Periodic Adjustments
Table 5-1
Assembly Calibration Information
Calibration Data Location
Assembly
Memory
Card
Calibration Program:
Sub Program
on Assembly
Audio Analyzer 1
Periodic Calibration: Audio Analyzer 1 Offset
Modulation Distribution
Periodic Calibration: External Modulation Path Gain,
and, AF GEN Gain
Upconverter
X
Output Section
X
Signal Generator
Synthesizer
X
Reference
X
Receiver
X
Receiver Synthesizer
X
Spectrum Analyzer
X
Downconverter
Measurement
RF I/O
X
X
Periodic Calibration: Voltmeter References
X
CDMA Reference
Controller
Periodic Calibration: Timebase Reference
See “System Power Calibration Program” on page 39.
IQ Calibration
X
LO IF/IQ Demodulator
IQ Calibration, and IQ Demod Path Calibration
Digital Cellsite 1 or 2
IQ Calibration
IQ Modulation
IQ Calibration
Analog Cellsite
PCB Cal (ROM-based)
Audio Analyzer 2
Periodic Calibration: Variable Frequency Notch Filter
127
Periodic Adjustments/Calibration
Periodic Adjustments
Test Equipment
Test Equipment for the Periodic Adjustments Programs
Figure 5-1
128
•
For the Timebase Reference Using a Counter calibration you will
need to connect a frequency counter to the rear-panel 10 MHz REF OUTPUT
connector. The accuracy of the counter will determine the accuracy of the Test
Set’s internal reference. You will use the counter to set the timebase reference
DACs.
•
For the Timebase Reference Using a Source calibration you will
need to connect a signal generator to the front-panel ANTENNA IN connector.
•
For the Voltmeter References calibration you will need a DC voltmeter
that can measure ±5 V with ±0.015% accuracy.
Periodic Calibration Menu
S:\agilent\e8285\ALR\Book\chapters\period_adj.fm
Periodic Adjustments/Calibration
Storing Calibration Factors
Storing Calibration Factors
You should understand the calibration-factor-storage process before running any of
the following programs: Periodic Calibration, IQ Calibration, IQ Demod Path
Calibration, or System Power Calibration.
As a program runs, calibration factors are computed and applied. When all the
calibration factors have been acquired, the program stops and asks if the user
wants the calibration factors to be stored. At this point, it should be emphasized
that the new calibration factors are now being used by the Test Set. If you do not
store them at this point, they will be used by the Test Set until the power is
switched off even though they have not been stored.
If you do not store the calibration factors but run another calibration program and
then store the calibration factors, the calibration factors from the previous program
will be stored along with the calibration factors just acquired unless the power is
cycled between the tests. Storing calibration factors copies the calibration factors
from volatile to non-volatile memory (that is, memory that is not erased when the
power is turned off).
Also, when storing calibration factors, be sure to wait for the message
Updating Flash Calibration Files... DO NOT Interrupt
Power! to disappear before continuing. Depending on the number of calibration
factors being stored, this may take several minutes.
129
Periodic Adjustments/Calibration
Running the Periodic IQ, or IQ Demod Path Calibration Programs
Running the Periodic IQ, or IQ Demod Path Calibration Programs
1. Press Tests key to access the TESTS (Main Menu) screen, see Figure 5-2.
2. Select the field under Select Procedure Location:.
3. Select ROM under the Choices: menu.
4. Select the field under Select Procedure Filename:.
5. Select SERVICE7 from the Choices: menu.
6. Select Run Test (K1 key).
7. From the SERVICE MENU, select the desired calibration program to perform.
•
Periodic Calibration - for more detailed information, see “Periodic
Calibration Menu Descriptions” on page 131.
•
IQ Calibration - for more detailed information, see “IQ Calibration
Program Description” on page 137
•
IQ Demod Path Calibration - for more detailed information, see
"IQ Demod Path Calibration Program Description" on page 139.
8. Follow the instructions on the screen.
Figure 5-2
130
SERVICE MENU’s Calibration Programs
S:\agilent\e8285\ALR\Book\chapters\period_adj.fm
Periodic Adjustments/Calibration
Periodic Calibration Menu Descriptions
Periodic Calibration Menu Descriptions
This section describes the adjustment programs listed under the Periodic
Calibration menu.
Figure 5-3
Periodic Calibration
Periodic Calibration
Menu Screen
131
Periodic Adjustments/Calibration
Periodic Calibration Menu Descriptions
Timebase Reference Using a Counter
This program is used to manually tune the timebase reference using a frequency
counter as the time standard. This procedure has two basic steps:
1. Coarse and fine manual adjustment of the two timebase tuning DACs.
2. Downloading the DAC settings into the Test Set.
If you have not already adjusted the two timebase tuning DACs, exit the program
if needed (by selecting the Adj user key), and follow the instructions in "Setting
the Timebase Latches" on page 135.
If you have adjusted the timebase DACs, run this program and select the Cal user
key to make the setting permanent.
As an alternate method, you can select the option Timebase Reference
Using a Source (see following section) and adjust the timebase to a time
standard connect to the front-panel ANTENNA IN connector.
Timebase Reference Using a Source
This program automatically tunes the timebase tuning DACs to the signal at the
front-panel ANTENNA IN connector, which is input at the frequency that is keyed
in from the front-panel keypad. If an external 10 MHz reference is being used, it
must be disconnected.
In order for the calibration to be valid, the signal applied to the ANTENNA IN
connector must have the following characteristics.
1. The level should be between −30 and +20 dBm (0.001 and 100 mW).
2. The frequency should be between 800 and 1000 MHz.
3. The frequency must be as accurate as the application of the Test Set requires.
4. The Test Set must be able to tune to within 10 or 100 kHz of the reference
signal with the Test Set’s current timebase reference settings. If this condition is
not met, either the keyed-in frequency is incorrect or the Test Set is faulty.
5. The signal must be a CW signal. Specifically, any FM must be less than 100 Hz
peak as measured by the Test Set.
6. The coarse tune DAC must be between 3 and 250 (decimal); otherwise, the
frequency of the source is out of reach by the tuning DAC.
After the coarse and fine tune DAC settings have been determined, the values are
downloaded into the Test Set’s memory.
132
S:\agilent\e8285\ALR\Book\chapters\period_adj.fm
Periodic Adjustments/Calibration
Periodic Calibration Menu Descriptions
Voltmeter References
When you select the Voltmeter Reference calibration, instructions are displayed
explaining how to measure the negative and positive references with an external
voltmeter. The user is required to key in the readings. If the readings are within
range, the two values are automatically downloaded.
For the Test Set to meet published specifications, the external DC voltmeter must
be ±0.015% accurate when measuring ±5 V. The voltmeter is connected to the test
points on the Measurement board assembly, see figure 5-4.
Figure 5-4
Measurement Assembly Test Points
Measurement Board Assembly
+REF
SGND
-REF
a2a33_1.eps
Audio Frequency Generator Gain
The gain of the following paths is calibrated:
•
The internal paths that run from Audio Frequency Generators 1 and 2
(individually) through the Modulation Distribution assembly, to the monitor
select output, then onto Audio Analyzer 1 to the DVM.
•
The paths that run from Audio Frequency Generators 1 and 2 (individually)
through the Modulation Distribution assembly to the AUDIO OUT connector,
externally to the rear-panel MODULATION IN connector, then again through
the Modulation Distribution assembly to the monitor select output and to the
DVM.
The above-measured levels are used to adjust the output level of the audio
generators so that they produce a calibrated level to the modulation inputs of the
RF generator. These measurements are made at DC. Both positive and negative
levels are measured to produce an optimum calibration factor.
133
Periodic Adjustments/Calibration
Periodic Calibration Menu Descriptions
External Modulation Path Gain
The Audio Frequency Generator Gain program should be performed
before running the External Modulation Path Gain program.
The “path” in this program runs from the external MODULATION IN connector
through the Modulation Distribution assembly, through the Monitor Select Switch,
and then through Audio Analyzer 1 to the Test Set’s internal DVM. The dc source
is Audio Frequency Generator 1 through the AUDIO IN connector and an external
cable.
The goal of this procedure is to set the External Level Amplifier gain DAC (on the
Modulation Distribution assembly) to produce a gain of exactly 4 between the
MODULATION IN connector and output of the Monitor Select Switch. This
requires measuring the input and output levels, calculating the gain, changing the
DAC setting, and then repeating the process until the calculated gain equals 4.
Audio Analyzer 1 Offset
Two DC offsets are measured and downloaded as calibration factors to the Audio
Analyzer 1 assembly. These measurements are determined under the following
conditions:
•
Input-select switch grounded
•
AUDIO INPUT selected with return conductor grounded
Variable Frequency Notch Filter
The calibration factors for tuning the variable-frequency notch filter are
determined as follows:
The input to the filter is set to 10 evenly-spaced frequencies between 300 and
10,000 Hz. The DAC that tunes the notch filter is adjusted for best null of the tune
error voltage. From this data, three coefficients of a parabola which best fit the
tuning data are calculated using a least-squares curve fit. The coefficients are then
automatically downloaded into the Test Set’s non-volatile memory.
134
S:\agilent\e8285\ALR\Book\chapters\period_adj.fm
Periodic Adjustments/Calibration
Setting the Timebase Latches
Setting the Timebase Latches
The refs_DAC_coarse and ref_DAC_fine values adjust the frequency of
the Test Set’s internal 10 MHz reference. They are stored in memory. The
controller reads the values and sends the appropriate adjustment to the Reference
assembly.
The following procedure is to be used when running the program "Timebase
Reference Using a Counter" on page 132.
1. Press Config key to access the CONFIGURE screen, see Figure 5-5.
2. On the CONFIGURE screen, select SERVICE, the SERVICE screen appears.
Figure 5-5
SERVICE Screen
3. Connect a frequency counter to the rear-panel 10 MHz REF OUTPUT
connector.
4. Select the Latch field.
5. Select refs_DAC_coarse under the Choices: menu.
6. Select the Value field.
7. Rotate the knob until the counter reads as close to 10 MHz as possible.
8. Select the Latch field.
9. Select refs_DAC_fine under the Choices: menu.
135
Periodic Adjustments/Calibration
Setting the Timebase Latches
10. Select the Value field.
11. Rotate the knob until the counter reads as close to 10 MHz as possible.
12. Store the new DAC values (timebase calibration data) in non-volatile memory
by selecting and running the Timebase Reference Using a Counter
routine from the Periodic Calibration Menu. See "Timebase Reference Using a
Counter" on page 132.
136
S:\agilent\e8285\ALR\Book\chapters\period_adj.fm
Periodic Adjustments/Calibration
IQ Calibration Program Description
IQ Calibration Program Description
The goal of IQ Calibration (see Figure 5-6 on page 138) is to minimize the carrier
feedthrough while maximizing the Rho of the IQ signal. There are four DACs
involved in this adjustment:
•
•
•
•
buffModN_I_DC_offset_DAC,
buffModN_Q_DC_offset DAC,
buffModN_signal_delta_DAC,
genRef_IQ_quad_DAC
The I and Q dc offset DACs and the signal delta DAC are on the Data Buffer
assembly and the Quad DAC is on the CDMA Generator Reference. These DACs
can be accessed in the list of Latches on the SERVICE screen. All the DACs are
initially set to 127 before starting the calibration adjustment, and the calibration is
carried out at several equally spaced frequencies between 800 and 1000 MHz.
The instrument is set into a CDMA loopback mode and the calibration is carried
out by first adjusting the I and Q dc offset DACs while monitoring the carrier
feedthrough (CFT). Both CFT and rho are measured by the Receive DSP. Once the
CFT is minimized (through an iterative process), the signal delta and the quad
DACs are adjusted while monitoring rho. When rho is maximized (again through
an iterative process), the calibration adjustment is complete. At power down, each
DAC setting at each frequency is downloaded to the calibration ROM on the
Controller assembly.
137
Periodic Adjustments/Calibration
IQ Calibration Program Description
Figure 5-6
138
IQ Calibration
S:\agilent\e8285\ALR\Book\chapters\period_adj.fm
Periodic Adjustments/Calibration
IQ Demod Path Calibration Program Description
IQ Demod Path Calibration Program Description
Figure 5-7
IQ Modulation Path Calibration
139
Periodic Adjustments/Calibration
IQ Demod Path Calibration Program Description
140
S:\agilent\e8285\ALR\Book\chapters\period_adj.fm
6
Performance Tests
This chapter contains the performance test procedures for the Test Set. The tests in
this chapter verify that the Test Set performs to its published specifications.
141
Performance Tests
Procedure and Equipment
Procedure and Equipment
How to Use the Performance Tests
NOTE
The recommended Test Set calibration interval is 24 months. This is accomplished
by performing the performance tests or sending the Test Set to an Agilent
Calibration Center or other qualified calibration lab.
•
Run the Performance Tests in table 6-2, "Performance Tests & Records
Location" on page 144 using the specified Test Equipment from table 6-1,
"Required Test Equipment by Model" on page 143.
•
Compare and record the data for each test onto the applicable Performance Test
Record (PTR). Table 6-2 on page 144 shows the page number of the PTR
associated with each performance test.
Test Set Operation
To perform the following performance test procedures you need to know basic Test
Set operation. You should be familiar with the front panel, the various display
screens, and knob operation (cursor control). You should be able to operate the
Test Set’s RF generator, RF analyzer, AF generators, AF analyzer, spectrum
analyzer (optional), and oscilloscope.
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
NOTE
Press Preset on the Test Set before beginning each test.
Test Equipment and Operation
The test equipment shown in table 6-1, "Required Test Equipment by Model" on
page 143 is needed to do all of the performance tests. Usually, a setup drawing at
the beginning of each test procedure shows the equipment and hook-up needed for
that particular test. Generic names are used for the test equipment shown in the
setup drawings.
To find alternatives to the equipment listed in table 6-1, look up their specifications
in the Agilent Technologies Test and Measurement Catalog and use the
specifications to find equivalent instruments.
The test procedures give critical instrument settings and connections, but they
don’t tell how to operate the instruments. Refer to each instrument’s operating
manual.
142
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
Procedure and Equipment
Table 6-1
Required Test Equipment by Model
Agilent Model Number
Model Name
Test Number
Mini-Circuits ZFL-2000
or equivalenta
Amplifier 1
5
GTC RF Products GRF
5016 or equivalentb
Amplifier 2
27, 28
3458A
Multimeter
8-9, 12, 15, 18
5316A
Counter
11, 16
8562A
Spectrum Analyzer
6-7
8663A
Signal Generator (High Performance)
4, 20-23, 28
8648B Option 1EA
Signal Generator
19
8902A
Measuring Receiver
1-5, 17, 19-22, 25, 27
8903B
Audio Analyzer
4, 10, 12, 16, 18, 20-22
11667A
Power Splitter
19, 27, 28
11722A
Sensor Module
5, 19, 25, 27
11793A
Microwave Converter
1-5
E4420B
Signal Generator
1-5, 24, 27
E6380-61811c
System Power Calibration Program Software Kit
19
89441A with options
AYA, AY9, UFG
Vector Signal Analyzer
26
EPM-438
Power Meter
25, 28
8482A
Power Sensor
25, 28
a. Required amplifier specifications are frequency range 1.7 to 2.0 GHz, gain >18 dB, noise
figure <5 dB. For more information about Mini-Circuits, contact them at (718) 934-4500 or
http://www.minicircuits.com.
b. Required amplifier specifications are frequency range 1.0 to 2.0 GHz, gain of 43 dB, output power of +20 dBm. For more information about GTC, contact them at (310) 673-8422
or [email protected]
c. To order the System Power Calibration Card see “Ordering Replacement Parts and Support” on page 85.
143
Performance Tests
Procedure and Equipment
Table 6-2
Performance Tests & Records Location
Test Record in
Chapter 7,
“Performance
Test Records.”
Performance Tests
(in this chapter)
“RF Generator FM Distortion Performance Test 1” on page 146
page 202
“RF Generator FM Accuracy Performance Test 2” on page 149
page 204
“RF Generator FM Flatness Performance Test 3” on page 152
page 206
“RF Generator Residual FM Performance Test 4” on page 155
page 208
“RF Generator Level Accuracy Performance Test 5” on page 158
page 210
“RF Generator Harmonics Spectral Purity Performance Test 6” on page 163
page 218
“RF Generator Spurious Spectral Purity Performance Test 7” on page 165
page 221
“AF Generator AC Level Accuracy Performance Test 8” on page 167
page 223
“AF Generator DC Level Accuracy Performance Test 9” on page 168
page 225
“AF Generator Residual Distortion Performance Test 10” on page 169
page 226
“AF Generator Frequency Accuracy Performance Test 11” on page 170
page 228
“AF Analyzer AC Level Accuracy Performance Test 12” on page 171
page 229
“AF Analyzer Residual Noise Performance Test 13” on page 172
page 230
“AF Analyzer Distortion and SINAD Accuracy Performance Test 14” on page 173
page 231
“AF Analyzer DC Level Accuracy Performance Test 15” on page 174
page 232
“AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16” on page 175
page 233
“AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17” on page 176
page 234
“Oscilloscope Amplitude Accuracy Performance Test 18” on page 177
page 235
“RF Analyzer FM Accuracy Performance Test 20” on page 180
page 238
“RF Analyzer FM Distortion Performance Test 21” on page 182
page 239
“RF Analyzer FM Bandwidth Performance Test 22” on page 184
page 240
“RF Analyzer Residual FM Performance Test 23” on page 186
page 241
“Spectrum Analyzer Image Rejection Performance Test 24” on page 188
page 242
“CDMA Generator RF IN/OUT Amplitude Level Accuracy Performance Test 25” on page
190
page 243
“CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26” on
page 192
page 244
144
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
Procedure and Equipment
Performance Tests
(in this chapter)
Test Record in
Chapter 7,
“Performance
Test Records.”
“CDMA Generator Modulation Accuracy Performance Test 27” on page 194
page 245
“CDMA Analyzer Average Power Level Accuracy Performance Test 28” on page 196
page 246
“CDMA Analyzer Channel Power Level Accuracy Performance Test 29” on page 198
page 247
145
Performance Tests
RF Generator FM Distortion Performance Test 1
RF Generator FM Distortion
Performance Test 1
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-1, "RF Generator FM Distortion Test 1
Record" on page 202. The FM distortion of the RF generator is measured directly
by the measuring receiver. The Test Set’s internal audio generator provides the
modulation source.
Two setups are shown below. The first setup can measure signals to 1 GHz. Since
the FM generator in the Test Set translates FM in the lower band directly into the
1.7 to 2 GHz range, testing to 1 GHz is adequate when verifying a repair. The
second setup has a microwave converter which covers the full measurement range
of FM signals to 2 GHz.
NOTE
Initial Setup
Figure 6-1
Setup for Measurements to 1 GHz
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Measuring Receiver
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
kHz
mV
s
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
Cancel
DUPLEX OUT
ANTENNA IN
AUDIO OUT
Max power 60 mW
INPUT 50Ω
Figure 6-2
VOLUME
mW
Hz
µV
ms
High
AUDIO IN
Max 12V peak
Low
Max
42V peak
DUPLEX OUT
Setup for Measurements to 2 GHz Using a Microwave Converter
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Measuring Receiver
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
INPUT 50Ω
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
High
Max 12V peak
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
DUPLEX OUT
Microwave Converter
Signal Generator
RF INPUT
IF OUTPUT
LO INPUT
146
RF OUTPUT
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Generator FM Distortion Performance Test 1
Procedure
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
Steps 1, 2, and 3 in the following procedure apply to both of the setups (shown in
figure 6-1 and figure 6-2 on page 146).
1. On the measuring receiver:
a. Reset the instrument.
b. Set the high-pass filter to 300 Hz.
c. Set the low-pass filter to 3 kHz.
d. Set the measurement mode to FM.
e. Set the measurement mode to audio distortion.
f. If the microwave converter is being used, set the frequency offset mode to
exit the mode (27.0 Special).
2. On the Test Set:
a. Press Preset.
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Set the RF Offset to Off.
e. Set the Output Port field to Dupl.
f. Select the RF GENERATOR screen.
g. Set the RF Gen Freq field to the appropriate RF frequency (based on the
firmware revision; see NOTE above) from the Performance Test Record.
h. Set the Amplitude to -10 dBm.
i. Set the AFGen1 To field to FM at 99 kHz deviation.
3. For frequencies up to 1000 MHz measure the FM distortion (audio distortion)
at the RF frequencies and deviations shown in the Performance Test Record
(PTR) and compare the measured distortion to the limits.
The following steps are for measurements to 2 GHz.
4. On the signal generator:
a. Set the frequency to 1500 MHz CW.
b. Set the level to +8 dBm or whatever level is suitable for the microwave
converter’s LO input.
147
Performance Tests
RF Generator FM Distortion Performance Test 1
5. On the measuring receiver:
a. Set the frequency offset mode to enter and enable the LO frequency (27.3
Special).
b. Key in the LO frequency (in MHz) which is 1500.
6. On the Test Set, for frequencies of 1700 and 2000 MHz, measure the FM
distortion at the deviations shown in the PTR and compare the measured
distortion to the limits.
148
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Generator FM Accuracy Performance Test 2
RF Generator FM Accuracy
Performance Test 2
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-2, "RF Generator FM Accuracy Test 2
Record" on page 204. The FM accuracy of the RF generator is measured directly
by the measuring receiver. The Test Set’s internal audio generator provides the
modulation source.
Two setups are shown below. The first setup can measure signals to 1 GHz. Since
the FM generator in the Test Set translates FM in the lower band directly into the
1.7 to 2 GHz range, testing to 1 GHz is adequate when verifying a repair. The
second setup has a microwave converter which covers the full measurement range
of FM signals to 2 GHz.
NOTE
Initial Setup
Figure 6-3
Setup for Measurements to 1 GHz
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Measuring Receiver
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
K1'
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
INPUT 50Ω
Figure 6-4
Cancel
DUPLEX OUT
ANTENNA IN
VOLUME
AUDIO OUT
Max power 60 mW
mW
Hz
µV
ms
High
Max 12V peak
AUDIO IN
Low
Max
42V peak
DUPLEX OUT
Setup for Measurements to 2 GHz Using a Microwave Converter
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Measuring Receiver
K1'
K1
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
Spectrun
analyzer
TX
range
RX test
TX test
AF
analyzer
MS report
MS FER
RX test
TX test
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
INPUT 50Ω
RF IN/OUT
Max power 2.5W
DUPLEX OUT
mW
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
Max 12V peak
High
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
DUPLEX OUT
Microwave Converter
Signal Generator
RF INPUT
IF OUTPUT
LO INPUT
RF OUTPUT
149
Performance Tests
RF Generator FM Accuracy Performance Test 2
Procedure
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
Steps 1, 2, and 3 in the following procedure apply to both of the setups (shown in
figure 6-3 and figure 6-4 on page 149).
1. On the measuring receiver:
a. Reset the instrument.
b. Set the high-pass filter to 300 Hz.
c. Set the low-pass filter to 3 kHz.
d. Set the measurement mode to FM.
e. Set the FM de-emphasis off.
f. If the microwave converter is being used, set the frequency offset mode to
exit the mode (27.0 Special).
2. On the Test Set:
a. Press Preset.
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Set the RF Offset to Off.
e. Set the Output Port field to Dupl.
f. Select the RF GENERATOR screen.
g. Set the RF Gen Freq field to the appropriate RF frequency (based on the
firmware revision; see NOTE above) from the Performance Test Record.
h. Set the Amplitude to -10 dBm.
i. Set the AFGen1 To field to FM at 99 kHz deviation.
3. For frequencies up to 1000 MHz measure the FM deviation at the RF
frequencies and deviations shown in the Performance Test Record (PTR) and
compare the measured deviation to the limits.
The following steps are for measurements to 2 GHz.
4. On the signal generator:
a. Set the frequency to 1500 MHz CW.
b. Set the level to +8 dBm or whatever level is suitable for the microwave
converter’s LO input.
150
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Generator FM Accuracy Performance Test 2
5. On the measuring receiver:
a. Set the frequency offset mode to enter and enable the LO frequency (27.3
Special).
b. Key in the LO frequency (in MHz) which is 1500.
6. On the Test Set, for frequencies of 1700 and 2000 MHz, measure the FM at the
deviations shown in the PTR and compare the measured deviation to the limits.
151
Performance Tests
RF Generator FM Flatness Performance Test 3
RF Generator FM Flatness
Performance Test 3
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-3, "RF Generator FM Flatness Test 3
Record" on page 206. The FM flatness of the RF generator is measured directly by
the measuring receiver. The Test Set’s internal audio generator provides the
modulation source.
Two setups are shown below. The first setup can measure signals to 1 GHz. Since
the FM generator in the Test Set translates FM in the lower band directly into the
1.7 to 2 GHz range, testing to 1 GHz is adequate when verifying a repair. The
second setup has a microwave converter which covers the full measurement range
of FM signals to 2 GHz.
NOTE
Initial Setup
Figure 6-5
Setup for Measurements to 1 GHz
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Measuring Receiver
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
Address
Local
Save
K2'
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
kHz
mV
s
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
AUDIO OUT
Max power 60 mW
INPUT 50Ω
Figure 6-6
VOLUME
mW
Hz
µV
ms
AUDIO IN
High
Low
Max 12V peak
Max
42V peak
DUPLEX OUT
Setup for Measurements to 2 GHz Using a Microwave Converter
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Measuring Receiver
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
INPUT 50Ω
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
High
Max 12V peak
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
DUPLEX OUT
Microwave Converter
Signal Generator
RF INPUT
IF OUTPUT
LO INPUT
152
RF OUTPUT
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Generator FM Flatness Performance Test 3
Procedure
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
Steps 1, 2, and 3 in the following procedure apply to both of the setups (shown
in figure 6-5 and figure 6-6 on page 152).
1. On the measuring receiver:
a. Reset the instrument.
b. Set the measurement mode to FM.
c. If the microwave converter is being used, set the frequency offset mode to
exit the mode (27.0 Special).
2. On the Test Set:
a. Press
Preset.
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Set the RF Offset to Off.
e. Set the Output Port field to Dupl.
f. Select the RF GENERATOR screen.
g. Set the RF Gen Freq field to the appropriate RF frequency (based on the
firmware revision; see NOTE above) from the Performance Test Record.
h. Set the Amplitude to -10 dBm.
i. Set the AFGen1 To field to FM at 50 kHz deviation.
3. For frequencies up to 1000 MHz measure the FM deviation at the RF
frequencies and rates shown in the Performance Test Record (PTR). Convert
the measurement results to dB referenced to the deviation measured at 1 kHz
using the following formula and compare the calculated deviation to the limits
in the PTR.
Deviation
dB = 20 • log  ---------------------------------------------
Deviation at 1 kHz
The following steps are for measurements to 2 GHz.
4. On the signal generator:
a. Set the frequency to 1500 MHz CW.
b. Set the level to +8 dBm or whatever level is suitable for the microwave
converter’s LO input.
153
Performance Tests
RF Generator FM Flatness Performance Test 3
5. On the measuring receiver:
a. Set the frequency offset mode to enter and enable the LO frequency (27.3
Special).
b. Key in the LO frequency (in MHz) which is 1500.
6. On the Test Set, for frequencies of 1700 and 2000 MHz, measure the FM
deviation at the rates shown in the PTR. Convert the measurement results as
was done in step 3 and compare the calculated deviation to the limits.
154
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Generator Residual FM Performance Test 4
RF Generator Residual FM
Performance Test 4
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-4, "RF Generator Residual FM Test 4
Record" on page 208. The residual FM of the RF generator is measured directly by
the measuring receiver. An external LO is used to improve the residual FM of the
measuring receiver. An audio analyzer with a CCITT psophometric filter is
required to measure the demodulated FM.
Two setups are shown, see figure 6-7 and figure 6-8 on page 156. The first setup is
capable of measuring signals to 1 GHz. The second setup has a microwave
converter which covers the full measurement range of FM signals to 2 GHz. The
microwave converter’s LO must be a low residual FM synthesizer.
NOTE
Initial Setup
Figure 6-7
Setup for Measurements to 1 GHz
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Audio Analyzer
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
K1'
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
INPUT
Shift
POWER
DO NOT apply RF
when in standby
Measuring Receiver
EXT LO
INPUT
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
Max 12V peak
High
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
DUPLEX OUT
MODULATION OUTPUT
INPUT 50Ω
Signal Generator
RF OUTPUT
155
Performance Tests
RF Generator Residual FM Performance Test 4
Figure 6-8
Setup for Measurements to 2 GHz Using a Microwave Converter
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Audio Analyzer
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
INPUT
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
VOLUME
AUDIO OUT
High
Max 12V peak
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
DUPLEX OUT
MODULATION OUTPUT
RF
INPUT
Signal Generator
INPUT 50Ω
Signal Generator LO
RF
OUTPUT
ANTENNA IN
Max power 60 mW
Measuring Receiver
EXT LO
INPUT
Cancel
IF OUTPUT
Microwave
Converter
LO
INPUT
RF
OUTPUT
Procedure
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
Steps 1 to 5 in the following procedure apply to both setups (shown in figure 6-7
and figure 6-8 on page 156).
1. On the signal generator (to be used as the measuring receiver’s LO):
a. Set the frequency to 11.5 MHz.
b. Set the level to 0 dBm.
2. On the measuring receiver:
a. Reset the instrument.
b. Set the IF to 1.5 MHz (3.2 Special).
c. Set the high-pass filter to 50 Hz.
d. Set the low-pass filter to 15 kHz.
e. Set the measurement mode to FM.
f. If the instrument has an external LO switch, enable the external LO mode
(23.1 Special).
g. If the microwave converter is being used, set the frequency offset mode to
exit the mode (27.0 Special).
3. On the audio analyzer:
a. Reset the instrument.
156
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Generator Residual FM Performance Test 4
b. Set the measurement mode to AC level.
c. Select the CCITT Weighting filter.
d. Set the low-pass filter to 30 kHz.
4. On the Test Set:
a. Press Preset.
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Set RF Offset to Off.
e. Set RF Output to Dupl.
f. Select the RF GENERATOR screen.
g. Set the RF Gen Freq field to the appropriate RF frequency (based on the
firmware revision; see NOTE above) from the Performance Test Record.
h. Set the Amplitude to -10 dBm.
5. For frequencies up to 1000 MHz and for each line in the Performance Test
Record (PTR) do the following:
a. Set the signal generator (used as an LO for the measuring receiver) to the
LO frequency shown in the PTR.
b. Set the Test Set to the RF frequencies shown in the PTR.
c. Measure the ac level (in mV) on the audio analyzer.
d. Multiply the measured ac levels by 1000 to convert them to FM deviation in
Hz and compare the computed results to the limits shown in the PTR.
The following steps are for measurements to 2 GHz.
6. On the signal generator:
a. Set the frequency to 1500 MHz CW for 1700 MHz, 1800 MHz CW for
2000 MHz.
b. Set the level to +8 dBm or whatever level is suitable for the microwave
converter’s LO input.
7. On the measuring receiver:
a. Set the frequency offset mode to enter and enable the LO frequency (27.3
Special).
b. Key in the LO frequency (in MHz) which is 1500 MHz.
8. On the Test Set, for frequencies of 1700 and 2000 MHz, continue on as in step
5.
157
Performance Tests
RF Generator Level Accuracy Performance Test 5
RF Generator Level Accuracy
Performance Test 5
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-5, "RF Generator Level Accuracy Test
5 Record" on page 210. Using a measuring receiver and sensor module, at several
frequencies up to 1 GHz the Test Set is set to generate levels between −10 and 125
dBm (in 5 dB steps) at it’s DUPLEX OUT connector. The level is measured with
the tuned RF level function of the measuring receiver. At each frequency the
measuring receiver connection is moved to the RF IN/OUT and the level measured
from -40 to −125 dBm. As the test proceeds you may be required to recalibrate the
measuring receiver.
To extend the measurement frequency to 2 GHz the second method uses a
microwave converter and amplifier to extend the measurement range (see figure
6-10 on page 160).
Setup 1
Figure 6-9
Setup 1 for Measurements to 1 GHz
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
Measuring Receiver
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
SENSOR
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
INPUT 50Ω
RF IN/OUT
Max power 2.5W
RF IN/OUT
DUPLEX OUT
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
Max 12V peak
High
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
DUPLEX OUT
Sensor Module
Procedure 1
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
Steps 1 to 5 in the following procedure apply to Setup 1 shown in figure 6-9 on
page 158.
1. Before connecting the Test Set to the measuring receiver:
a. Reset the instrument.
b. Zero and calibrate the sensor module.
158
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Generator Level Accuracy Performance Test 5
NOTE
Make sure the sensor module’s calibration data is entered into the measuring
receiver.
2. Connect the equipment as shown in Setup 1 whether intending to measure
frequencies to 1 GHz or 2 GHz.
3. On the measuring receiver:
a. Set the measurement mode to RF Power.
b. Set the display to log.
4. On the Test Set:
a. Press Preset.
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Set the RF Offset to Off.
e. Set the Output Port field to Dupl.
f. Select the RF GENERNATOR screen.
g. Set the RF Gen Freq field to the appropriate RF frequency (based on the
firmware revision; see NOTE above) from the Performance Test Record.
h. Set the Amplitude to -11 dBm.
5. For each frequency in the Performance Test Record (PTR) do the following:
a. Set the measuring receiver to measure frequency.
b. Set the Test Set level to −15 dBm.
c. After the measuring receiver has acquired the signal, set the measuring
receiver to measure tuned RF level.
d. Measure the RF level at the levels shown in the PTR at the Test Set's
DUPLEX OUT port and compare the measured RF level to the limits. If the
measuring receiver displays the need to recalibrate, press the CALIBRATE
key and wait for calibration to be completed.
e. Move the sensor module to the Test Set's RF IN/OUT port.
f. On the Test Set set the Output Port field to RF Out and repeat the
measurements for the levels shown in the PTR and compare the measured
RF level to the limits.
g. Move the sensor module back to the Test Set's DUPLEX OUT port and set
the Output Port to Dupl.
159
Performance Tests
RF Generator Level Accuracy Performance Test 5
Setup 2
Figure 6-10
Setup 2 for Measurements of 1700 and 2000 MHz
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
Max 12V peak
High
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
DUPLEX OUT
RF IN/OUT
INPUT
AMPLIFIER 1
OUTPUT
Measuring Receiver
Microwave
Converter
RF
INPUT
Signal Generator
INPUT 50Ω
IF OUTPUT
LO
INPUT
RF
OUTPUT
Procedure 2
Steps 1 to 5 in the following procedure apply to Setup 2 shown in figure 6-10
on page 160.
1. Make the connections as shown on Setup 2.
2. On the Test Set:
a. Set the Amplitude to -11 dBm.
b. Set the RF Gen Freq to 1700 MHz.
3. On the measuring receiver:
a. Set the measurement mode to RF power.
b. Key in 1700 MHz.
c. Measure and record the RF power at the DUPLEX OUT port.
4. On the Test Set set the RF Gen Freq to 2000 MHz.
5. On the measuring receiver:
a. Key in 2000 MHz.
b. Measure and record the RF power at the DUPLEX OUT port.
160
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Generator Level Accuracy Performance Test 5
6. On the signal generator set the level to +8 dBm or whatever level is suitable for
the microwave converter’s LO input.
7. For frequencies of 1700 and 2000 MHz perform the following:
a. On the signal generator set the frequency to 1900 MHz CW and 2200 MHz
CW respectively.
b. Reset the measuring receiver.
c. On the measuring receiver set the frequency offset mode to enter and enable
the LO frequency (27.3 Special) then key in the signal generator (LO)
frequency (in MHz) which is 1900 or 2200 MHz respectively.
d. On the measuring receiver set the measurement mode to tuned RF level and
the measurement units to dBm then press SET REF.
e. Measure and record the RF level at the levels down to and including -83
dBm shown in the PTR at the Test Set's DUPLEX OUT port. If the measuring
receiver displays the need to recalibrate, press the CALIBRATE key and
wait for calibration to be completed.
f. After recording the reading at -83 dBm insert an RF amplifier into the
output of the Test Set.
g. Record the new measured level at -83 dBm.
h. Continue measuring the level down to −116 dBm.
i. Move the input to the RF IN/OUT port without the amplifier inserted.
j. Measure and record the RF level at the levels down to and including −83
dBm shown in the PTR at the Test Set's RF IN/OUT port.
k. After recording the reading at −83 dBm insert an RF amplifier into the
output of the Test Set.
l. Record the new measured level at −83 dBm.
m. Continue measuring the level down to −116 dBm.
n. Correct the measured reading for each level measured without the amplifier
as follows: Add the RF power measured in step 3c or 5b to the measured
level. (For example, if the level in step 3c is -10.2 dBm and the level at −55
dBm is −45.1 dB, record a level of −10.2 + (-45.1) = 55.3 dBm.) Compare
the corrected values with the limits in the PTR.
o. Correct the measured reading for each level measured with the amplifier by
summing the following values:
+ RF power measured at −11 dBm in step 3c or 5b
+ RF level measured at −83 dBm in step 7i
– RF level measured at −83 dBm in step 7j
+ RF level measured in step 7k
161
Performance Tests
RF Generator Level Accuracy Performance Test 5
For example, if:
RF power measured at −11 dBm in step 3b or 5b = −10.2 dBm
RF level measured at −83 dBm in step 7i = −70.1 dB
RF level measured at −83 dBm in step 7j = −52.6 dB
RF level measured at −101 dBm in step 7k = −73.2 dB
the corrected level at −101 dBm is −10.2 + (−70.1) − (−52.6) + (−73.2) =
100.9 dBm. Compare the corrected values with the limits in the PTR.
162
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Generator Harmonics Spectral Purity Performance Test 6
RF Generator Harmonics Spectral Purity
Performance Test 6
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-6, "RF Generator Harmonics Spectral
Purity Test 6 Record" on page 218. Harmonic signals with the carrier set to several
frequencies and two different levels (maximum output and minimum level vernier)
are searched for by an RF spectrum analyzer.
Setup
Figure 6-11
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Spectrum Analyzer
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
DUPLEX OUT
Max power 2.5W
Cancel
ANTENNA IN
Max power 60 mW
INPUT 50Ω
VOLUME
AUDIO OUT
Max 12V peak
High
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
DUPLEX OUT
Procedure
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
1. Set up the spectrum analyzer in accordance with its operating manual.
2. On the Test Set:
a. Press Preset.
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Set the RF Offset to Off.
e. Set the Output Port field to Dupl.
f. Select the RF GENERNATOR screen.
g. Set the RF Gen Freq field to the appropriate RF frequency (based on the
firmware revision; see NOTE above) from the Performance Test Record.
h. Set the Amplitude to -10 dBm.
163
Performance Tests
RF Generator Harmonics Spectral Purity Performance Test 6
3. Set the Test Set’s RF generator to the frequencies and levels shown in the
Performance Test Record (PTR) and measure the second and third harmonics.
For each measurement convert the harmonic level to dB below the fundamental
(dBc) and compare the computed levels to the limits.
164
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Generator Spurious Spectral Purity Performance Test 7
RF Generator Spurious Spectral Purity
Performance Test 7
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-7, "RF Generator Spurious Spectral
Purity Test 7 Record" on page 221. Spurious signals with the carrier set to several
frequencies and two different levels (maximum output and minimum level vernier)
are searched for by an RF spectrum analyzer.
Setup
Figure 6-12
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Spectrum Analyzer
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
DUPLEX OUT
Max power 2.5W
Cancel
ANTENNA IN
Max power 60 mW
INPUT 50Ω
VOLUME
AUDIO OUT
Max 12V peak
High
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
DUPLEX OUT
Procedure
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
1. Set up the spectrum analyzer in accordance with its operating manual.
2. On the Test Set:
a. Press Preset.
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Set the RF Offset to Off.
e. Set the Output Port field to Dupl.
f. Select the RF GENERATOR screen.
g. Set the Amplitude to -10 dBm.
h. Set the RF Gen Freq field to the appropriate RF frequency (based on the
firmware revision; see NOTE above) from the Performance Test Record.
165
Performance Tests
RF Generator Spurious Spectral Purity Performance Test 7
3. Set the Test Set’s RF generator to the frequencies shown in the Performance
Test Record (PTR) and measure the level of the spurious signals at the
frequencies shown. For each measurement convert the harmonic level to dB
below the fundamental (dBc) and compare the computed levels to the limits.
166
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
AF Generator AC Level Accuracy Performance Test 8
AF Generator AC Level Accuracy
Performance Test 8
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-8, "AF Generator AC Level Accuracy
Test 8 Record" on page 223. There are two audio generators. AC level accuracy is
measured directly with a digital multimeter.
Setup
Figure 6-13
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Multimeter
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
K1'
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
Low limit
Assign
7
K4
Release
K5
IBASIC
reset
Shift
POWER
RF IN/OUT
DUPLEX OUT
Cancel
ANTENNA IN
VOLUME
AUDIO OUT
INPUT
DO NOT apply RF
when in standby
Max power 2.5W
Max power 60 mW
Max 12V peak
High
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
AUDIO OUT
Procedure
1. Set the multimeter to measure AC volts.
2. On the Test Set:
a. Press Preset.
b. Select the RF GENERATOR screen.
c. Set the AFGen1 To and AFGen2 To fields to Audio Out.
3. On the Test Set for Audio Frequency Generator 1 do the following:
a. Set the AFGen2 To level field to Off.
b. Set the audio frequency and level as shown in the Performance Test Record
(PTR) and measure the AC level. Compare the measured voltage to the
limits.
4. On the Test Set for Audio Frequency Generator 2 do the following:
a. Set the AFGen1 To level field to Off and AFGen2 To level field to On.
b. Set the audio frequency and level as shown in the PTR and measure the AC
level. Compare the measured voltage to the limits.
167
Performance Tests
AF Generator DC Level Accuracy Performance Test 9
AF Generator DC Level Accuracy
Performance Test 9
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-9, "AF Generator DC Level Accuracy
Test 9 Record" on page 225. There are two DC generators. DC level accuracy is
measured directly with a digital multimeter.
Setup
Figure 6-14
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Multimeter
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
K1'
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
INPUT
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
VOLUME
AUDIO OUT
Max power 60 mW
Max 12V peak
High
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
AUDIO OUT
Procedure
1. Set the multimeter to measure DC volts.
2. On the Test Set:
a. Press Preset.
b. Select the RF GENERATOR screen.
c. Set the AFGen1 To and AFGen2 To fields to Audio Out.
d. Set the AFGen1 Freq and AFGen2 Freq fields to 0.0 Hz.
e. Set the Audio Out field to DC.
3. On the Test Set for Audio Frequency Generator 1 do the following:
a. Set the AFGen2 To level field to Off.
b. Set the audio frequency and level as shown in the Performance Test Record
(PTR) and measure the DC level. Compare the measured voltage to the
limits.
4. On the Test Set for Audio Frequency Generator 2 do the following:
a. Set the AFGen1 To level field to Off and AFGen2 To level field to on.
b. Set the audio frequency and level as shown in the PTR and measure the DC
level. Compare the measured voltage to the limits.
168
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
AF Generator Residual Distortion Performance Test 10
AF Generator Residual Distortion
Performance Test 10
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-10, "AF Generator Residual Distortion
Test 10 Record" on page 226. Audio distortion is measured directly with an audio
analyzer.
Setup
Figure 6-15
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Audio Analyzer
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
K1'
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
INPUT
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
VOLUME
Max power 60 mW
AUDIO OUT
Max 12V peak
High
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
AUDIO OUT
Procedure
1. On the audio analyzer:
a. Reset the instrument.
b. Select the 80 kHz low-pass filter.
c. Set the measurement mode to distortion.
2. On the Test Set:
a. Press Preset.
b. Select the RF GENERATOR screen.
c. Set the AFGen1 To and AFGen2 To fields to Audio Out.
3. On the Test Set for Audio Frequency Generator 1 do the following:
a. Set the AFGen2 To level field to Off.
b. Set the audio frequency and level as shown in the Performance Test Record
(PTR) and measure the audio distortion. Compare the measured distortion
to the limits.
4. On the Test Set for Audio Frequency Generator 2 do the following:
a. Set the AFGen1 To level field to Off and AFGen2 To level field to on.
b. Set the audio frequency and level as shown in the PTR and measure the
audio distortion. Compare the measured distortion to the limits.
169
Performance Tests
AF Generator Frequency Accuracy Performance Test 11
AF Generator Frequency Accuracy
Performance Test 11
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-11, "AF Generator Frequency Accuracy
Test 11 Record" on page 228. Frequency accuracy is measured directly with a
frequency counter. The counter must be able to resolve 0.005% at 20 Hz.
Setup
Figure 6-16
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Counter
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
K1'
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
INPUT
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
VOLUME
AUDIO OUT
Max power 60 mW
Max 12V peak
High
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
AUDIO OUT
Procedure
1. Set the counter to measure frequency.
2. On the Test Set:
a. Press Preset.
b. Select the RF GENERATOR screen.
c. Set the AFGen1 To and AFGen2 To fields to Audio Out.
3. On the Test Set for Audio Frequency Generator 1 do the following:
a. Set the AFGen2 To level field to Off.
b. Set the audio frequency and level as shown in the Performance Test Record
(PTR) and measure the audio frequency. Compare the measured frequency
to the limits.
4. On the Test Set for Audio Frequency Generator 2 do the following:
a. Set the AFGen1 To level field to Off and AFGen2 To level field to on.
b. Set the audio frequency and level as shown in the PTR and measure the
audio frequency. Compare the measured frequency to the limits.
170
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
AF Analyzer AC Level Accuracy Performance Test 12
AF Analyzer AC Level Accuracy
Performance Test 12
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-12, "AF Analyzer AC Voltage Accuracy
Test 12 Record" on page 229. To measure AC voltage accuracy, an AC signal is
measured by an external multimeter and compared to the Test Set’s internal AC
voltmeter reading.
Setup
Figure 6-17
CALL CONTROL
UTILITIES
Answer
Call/
Page
Audio Analyzer
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
K1
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
K1'
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
Spectrun
analyzer
TX
range
RX test
TX test
AF
analyzer
MS report
MS FER
RX test
TX test
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
OUTPUT
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
Multimeter
DUPLEX OUT
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
High
Max 12V peak
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
AUDIO IN HI
Procedure
1. Set the digital multimeter to measure AC volts.
2. On the Test Set:
a. Press Preset.
b. Select the AF ANALYZER screen.
c. Set the AF Anl In field to Audio In.
d. Set the Filter 1 field to <20 Hz HPF.
e. Set the Filter 2 field to >99kHz LPF.
f. Set the De-Emphasis field to Off.
g. Set the Detector field to RMS.
h. Set the Settling field to Slow.
3. Set the audio analyzer’s source to the frequencies and levels shown in the
Performance Test Record. (Adjust the level until the digital multimeter reads
the correct level.)
4. Measure the AC level on the Test Set and compare the measured level to the
limits.
171
Performance Tests
AF Analyzer Residual Noise Performance Test 13
AF Analyzer Residual Noise
Performance Test 13
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-13, "AF Analyzer Residual Noise Test
13 Record" on page 230. The AC level of the audio input is measured with no
signal source connected.
Setup
Figure 6-18
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
VOLUME
Max power 60 mW
AUDIO OUT
High
Max 12V peak
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
Procedure
1. On the Test Set:
a. Press Preset.
b. Select the AF ANALYZER screen.
c. Set the AF Anl In field to Audio In.
d. Set the Filter 1 field to <20 Hz HPF.
e. Set the Filter 2 field to 15kHz LPF.
f. Set De-Emphasis field to Off.
g. Set the Detector field to RMS.
h. Set the Audio In Lo field to 600 To Hi.
2. Measure the AC level (residual noise) on the Test Set and compare the
measured level to the limits shown in the Performance Test Record.
3. Set the Filter 2 field to >99kHz LP.
4. Measure the AC level (residual noise) on the Test Set and compare the
measured level to the limits shown in the Performance Test Record.
172
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
AF Analyzer Distortion and SINAD Accuracy Performance Test 14
AF Analyzer Distortion and SINAD Accuracy
Performance Test 14
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-14, "AF Analyzer Distortion and
SINAD Accuracy Test 14 Record" on page 231. A calibrated distortion source is
created by summing the two internal audio generators. Levels are measured
separately by the internal AC voltmeter. One source is set to a harmonic two or
three times the frequency of the other. The measured distortion and SINAD is
compared with the calculated value.
Setup
Figure 6-19
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
VOLUME
Max power 60 mW
AUDIO OUT
Max 12V peak
High
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
AUDIO OUT
AUDIO IN High
Procedure
1. On the Test Set:
a. Press Preset.
b. Select the RF GENERATOR screen.
c. Set the AFGen1 To and AFGen2 To fields to Audio Out.
d. Set the AFGen1 To level field to 1.00 V and AFGen1 Freq field to
1 kHz.
e. Set the AFGen2 To level field to 100 mv and AFGen2 Freq field to
2 kHz.
2. For the frequency (the harmonic) and level settings of Audio Frequency
Generator 2 shown in the Performance Test Record, measure the distortion and
SINAD on the Test Set and compare the measured values to the limits.
173
Performance Tests
AF Analyzer DC Level Accuracy Performance Test 15
AF Analyzer DC Level Accuracy
Performance Test 15
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-15, "AF Analyzer DC Level Accuracy
Test 15 Record" on page 232. To measure DC level accuracy, a DC signal is
measured by an external digital multimeter and compared to the Test Set’s internal
DC voltmeter reading.
Setup
Figure 6-20
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Multimeter
K1'
K1
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
Spectrun
analyzer
TX
range
RX test
TX test
AF
analyzer
MS report
MS FER
RX test
TX test
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
Low limit
Assign
7
K4
Release
K5
IBASIC
reset
Shift
INPUT
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
VOLUME
AUDIO OUT
Max power 60 mW
Max 12V peak
AUDIO OUT
High
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
AUDIO IN High
Procedure
1. Set the multimeter to measure DC volts.
2. On the Test Set:
a. Press Preset.
b. Select the AF ANALYZER screen.
c. Set the AF Anl In field to Audio In.
d. Set the lower-right measurement to DC level.
e. Select the RF GENERATOR screen.
f. Set the AFGen1 To field to Audio Out.
g. Set the AFGen1 Freq field to 0.0 Hz.
h. Set the Audio Out field to DC.
i. Set the level of Audio Frequency Generator 1 as shown in the Performance
Test Record and measure the DC level. Compare the measured voltage to
the limits.
174
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16
AF Analyzer Frequency Accuracy to 100 kHz
Performance Test 16
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-16, "AF Analyzer Frequency Accuracy
to 100 kHz Test 16 Record" on page 233. To measure frequency accuracy up to
100 kHz, an AC signal at the audio input is measured by an external frequency
counter and compared to the Test Set’s internal audio frequency counter.
Setup
Figure 6-21
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Audio Analyzer
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
K1'
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
OUTPUT
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
VOLUME
Max power 60 mW
AUDIO OUT
High
Max 12V peak
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
AUDIO IN High
Counter
INPUT
Procedure
1. Set the frequency counter to measure frequency.
2. On the Test Set:
a. Press Preset.
b. Select the AF ANALYZER screen.
c. Set the AF Anl In field to Audio In.
d. Set the Filter 1 field to <20 Hz HPF.
e. Set the Filter 2 field to >99kHz LPF.
f. Set the lower-right measurement display to AF Freq.
3. Set the audio analyzer’s source to 1 V and set the frequencies as shown in the
Performance Test Record. Measure the frequency on the Test Set and compare
the measured frequency to the limits.
175
Performance Tests
AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17
AF Analyzer Frequency Accuracy at 400 kHz
Performance Test 17
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-17, "AF Analyzer Frequency Accuracy
at 400 kHz Test 17 Record" on page 234. To measure frequency accuracy at 400
kHz, the RF signal from the Test Set’s DUPLEX OUT port is applied to the audio
input and the input to the measuring receiver and the two measured frequencies are
compared.
Setup
Figure 6-22
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Measuring Receiver
K1
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
K1'
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
Spectrun
analyzer
TX
range
RX test
TX test
AF
analyzer
MS report
MS FER
RX test
TX test
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
DUPLEX OUT
Max power 2.5W
INPUT 50Ω
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
High
mW
Hz
µV
ms
AUDIO IN
Max 12V peak
Low
Max
42V peak
AUDIO IN High
Signal Generator
Procedure
1. On the signal generator:
a. Set amplitude to 0 dBm.
b. Set the frequency to 400 kHz.
2. On the measuring receiver:
a. Reset the instrument.
b. Set the measurement mode to frequency.
3. On the Test Set:
a. Press Preset.
b. Select the AF ANALYZER screen.
c. Set the AF Anl In field to Audio In.
d. Set the Filter 2 field to >99kHz LPF.
4. Measure the audio frequency on the measuring receiver and the Test Set and
note the frequency difference. Compare the calculated difference to the limits
shown in the Performance Test Record.
176
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
Oscilloscope Amplitude Accuracy Performance Test 18
Oscilloscope Amplitude Accuracy
Performance Test 18
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-18, "Oscilloscope Amplitude Accuracy
Test 18 Record" on page 235. A 5 V ac signal from the audio analyzer is measured
by both an external multimeter and by the Test Set’s internal oscilloscope. Since
the oscilloscope reads peak volts, the RMS reading of the multimeter is multiplied
by the square root of two.
Setup
Figure 6-23
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Audio Analyzer
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
OUTPUT
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
DUPLEX OUT
Max power 2.5W
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
Max 12V peak
High
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
AUDIO IN High
Multimeter
INPUT
Procedure
1. Set the digital multimeter to measure ac volts.
2. On the Test Set:
a. Press Preset.
b. Select the AF ANALYZER screen.
c. Set the AF Anl In field to Audio In.
d. Set the Filter 2 field to >99kHz LPF.
e. Select the SCOPE screen.
f. Set the Controls field to Marker and move the cursor to the Marker
To Peak+ field.
3. Set the audio analyzer’s source to 1 kHz and 5 V and fine adjust the level until
the voltmeter reads 5 V.
177
Performance Tests
Oscilloscope Amplitude Accuracy Performance Test 18
4. Set the frequency as shown in the Performance Test Record (PTR). For each
setting, perform the following:
a. Adjust the level until the digital multimeter reads 5 V.
b. Set Controls to Main and adjust the Time/Div on the Test Set to
display 2 to 3 cycles of the waveform.
c. Set Controls to Marker and press the knob (with the cursor in the
Marker To Peak+ field) to move the marker to the peak of the
waveform.
d. Read the Lvl and compare the reading to the limits in the PTR.
178
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Analyzer Level Accuracy Performance Test 19
RF Analyzer Level Accuracy
Performance Test 19
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-19, "RF Analyzer Level Accuracy Test
19 Record" on page 236. Level accuracy is measured using a system power
calibration program that resides on a memory card.
Procedure
1. Obtain the memory card (see Table 6-1 on page 143) containing the System
Power Calibration software program.
2. Run the System Power Calibration as follows:
a. Insert the memory card into the memory card slot.
b. Select the SOFTWARE MENU screen.
c. Set the Select Procedure Location: field to Card.
d. Set the Select Procedure Filename field to SYSPWR0.
e. Press the Run Test key.
3. Follow the instructions as they are presented. As the power difference is
displayed, write these numbers in the Performance Test Record and compare
them with the limits. (If two passes are chosen, average the two sets of data.)
After the acquisition of levels is complete, select No when asked if you want
the calibration factors downloaded into the Test Set’s memory.
Figure 6-24
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
K1'
K1
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
Spectrun
analyzer
TX
range
RX test
TX test
AF
analyzer
MS report
MS FER
RX test
TX test
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
Signal Generator
DO NOT apply RF
when in standby
RF IN/OUT
DUPLEX OUT
Max power 2.5W
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
High
Max 12V peak
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
RF IN/OUT
Sensor Module
Measuring Receiver
SENSOR
INPUT 50Ω
179
Performance Tests
RF Analyzer FM Accuracy Performance Test 20
RF Analyzer FM Accuracy
Performance Test 20
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-20, "RF Analyzer FM Accuracy Test 20
Record" on page 238. The signal generator provides the RF signal with FM. An
audio signal from the audio analyzer provides FM for the signal generator. The
signal is measured both by the Test Set’s internal RF analyzer and the measuring
receiver. The FM signal comes from the external audio source in the audio
analyzer. The audio level is varied until the modulation is at the desired FM
deviation as measured by the measuring receiver. Results from this test give an
indication of problems in the audio section of the Test Set.
Setup
Figure 6-25
CALL CONTROL
Audio Analyzer
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
K1
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
K1'
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
Spectrun
analyzer
TX
range
RX test
TX test
AF
analyzer
MS report
MS FER
RX test
TX test
K2'
Address
Local
Save
Recall
K2
OUTPUT
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
Signal Generator
DO NOT apply RF
when in standby
RF IN/OUT
DUPLEX OUT
Max power 2.5W
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
Max 12V peak
High
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
ANTENNA IN
RF OUTPUT
FM INPUT
Measuring Receiver
INPUT 50Ω
Procedure
1. On the measuring receiver:
a. Reset the instrument.
b. Set the measurement mode to FM.
c. Set the detector to PK+.
d. Set the LP Filter to 3 kHz.
2. On the audio analyzer:
a. Reset the instrument.
b. Set the output frequency to 1 kHz.
180
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Analyzer FM Accuracy Performance Test 20
c. Set the amplitude to 1.42 V.
3. On the signal generator:
a. Set the output frequency to 840 MHz.
b. Set the amplitude to 0.0 dBm.
c. Set the function to FM with EXT AC Modulation.
4. On the Test Set:
a. Press Preset.
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Set the (Gen)-(Anl) field to 0 MHz.
e. Select the RF ANALYZER screen.
f. Set the Tune Freq to 840 MHz.
g. Set the IF Filter field to 230 kHz.
h. Select the AF ANALYZER screen.
i. Set the AF Anl In field to FM Demod.
j. Set the Filter 1 field to <20 Hz HPF.
k. Set the Filter 2 field to 3 kHz LP.
l. Set the Detector field to PK+.
5. For each RF output from the signal generator shown in the Performance Test
Record (PTR), do the following:
a. Set the audio analyzer’s frequency (rate) as shown in the PTR.
a. Set the appropriate Filter 2 on the Test Set and LP Filter on the
measuring receiver to match the output frequency of the audio analyzer.
b. Adjust the audio analyzer’s level until the measuring receiver reads the FM
deviation shown in the PTR.
c. Read the FM deviation on the Test Set and compare the results to the limits
shown in the PTR.
181
Performance Tests
RF Analyzer FM Distortion Performance Test 21
RF Analyzer FM Distortion
Performance Test 21
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-21, "RF Analyzer FM Distortion Test
21 Record" on page 239. An audio signal from the audio analyzer provides FM for
the signal generator. The signal generator provides an RF signal (with FM) to the
Test Set’s internal RF analyzer. The measuring receiver is used to monitor FM
deviation as the level of the audio signal from the audio analyzer is varied. The
audio analyzer then measures distortion introduced by the Test Set.
Setup
Figure 6-26
AUD MONITOR OUTPUT
Back
MODULATION
INPUT
COMPOSITE
VIDEO
Audio Analyzer
CDMA CLOCK
MUX OUTPUT
CELLSITE/TRIGGERS
PROTOCOL SERIAL
OUTPUT
EVEN SEC
INPUT
AUD MONITOR
OUTPUT
INPUT
SA TRIG
OUTPUT
PARALLEL PORT
CSD1 SERIAL
S0 SERIAL PORT
CSD2 SERIAL
S1 SERIAL PORT
HP-IB
EXT REF
INPUT
16X CHIP
OUTPUT
10 MHz
OUTPUT
8285bck.eps
Signal Generator
CALL CONTROL
UTILITIES
Answer
Call/
Page
RF OUTPUT
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
FM INPUT
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Measuring Receiver
DATA
K3'
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
Max 12V peak
High
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
ANTENNA IN
INPUT 50Ω
Procedure
1. On the measuring receiver:
a. Reset the instrument.
b. Set the measurement mode to FM.
c. Set the high-pass filter to 300 Hz.
d. Set the low-pass filter to 3 kHz.
2. On the audio analyzer:
182
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Analyzer FM Distortion Performance Test 21
a. Reset the instrument.
b. Set the output frequency to 1 kHz.
c. Set the output amplitude to 1.4 V.
d. Set the measurement mode to distortion.
3. On the signal generator:
a. Set the output frequency to 840 MHz.
b. Set the output amplitude to 0.0 dBm.
c. Set the function to FM with EXT AC Modulation.
d. Set the MOD LEVEL to 5 kHz.
4. On the Test Set:
a. Press Preset.
b. Select the INSTRUMENT CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the RF ANALYZER screen.
e. Set the Tune Freq to 840 MHz.
f. Set the Input Port field to Ant.
g. Set the IF Filter field to 230 kHz.
h. Set Squelch field to Open.
i. Select the AF ANALYZER screen.
j. Set the AF Anl In field to FM Demod.
k. Set the Filter 1 field to 300Hz HPF.
l. Set the Filter 2 field to 3kHz LPF.
m. Set the Detector field to Pk+.
5. For each FM deviation setting shown in the Performance Test Record (PTR) do
the following:
a. Adjust the audio analyzer’s level until the measuring receiver reads the FM
deviation shown in the PTR.
b. Read the distortion on the audio analyzer and compare the results to the
limits shown in the PTR.
183
Performance Tests
RF Analyzer FM Bandwidth Performance Test 22
RF Analyzer FM Bandwidth
Performance Test 22
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-22, "RF Analyzer FM Bandwidth Test
22 Record" on page 240. An audio signal from the audio analyzer provides FM for
the signal generator. The signal generator provides an RF signal (with FM) to the
Test Set’s internal RF analyzer. The measuring receiver is used to monitor FM
deviation as the level of the audio signal from the audio analyzer is varied. The
audio rate is varied in several steps from 20 Hz to 70 kHz. The difference between
the maximum and minimum FM peak deviation is noted.
Setup
Figure 6-27
Audio Analyzer
OUTPUT
CALL CONTROL
UTILITIES
Answer
Signal Generator
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
RF OUTPUT
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
FM INPUT
IBASIC
reset
Shift
Measuring Receiver
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
Max 12V peak
High
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
ANTENNA IN
INPUT 50Ω
Procedure
1. On the measuring receiver:
a. Reset the instrument.
b. Set the measurement mode to FM.
c. Set the all filters off.
184
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Analyzer FM Bandwidth Performance Test 22
2. On the audio analyzer:
a. Reset the instrument.
b. Set the output frequency to 1 kHz.
c. Set the output amplitude to 1.4 V.
3. On the signal generator:
a. Set the output frequency to 840 MHz.
b. Set the output amplitude to 0.0 dBm.
c. Set the function to FM with EXT AC Modulation.
d. Set the MOD LEVEL to 25 kHz.
4. On the Test Set:
a. Press Preset.
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the RF ANALYZER screen.
e. Set the Tune Freq to 840 MHz.
f. Set the Input Port field to Ant.
g. Set the IF Filter field to 230 kHz.
h. Set the Squelch field to Open.
i. Select the AF ANALYZER screen.
j. Set the AF Anl In field to FM Demod.
k. Set the Filter 2 field to >99kHz LP.
l. Set the Detector field to Pk+.
5. Set the audio analyzer to the following frequencies: 20 Hz, 100 Hz, 1 kHz, 10
kHz, 35 kHz, and 70 kHz. For each frequency adjust the audio analyzer’s level
until the measuring receiver reads 25 kHz FM deviation and record the
deviation read on the Test Set.
6. Of the FM deviations measured by the Test Set find the maximum and
minimum deviations and make the following calculation:
Maximum Deviation
dB = 20 • log  --------------------------------------------------
Minimum Deviation
Record the dB difference in the Performance Test Record and compare it with
the limits shown.
185
Performance Tests
RF Analyzer Residual FM Performance Test 23
RF Analyzer Residual FM
Performance Test 23
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-23, "RF Analyzer Residual FM Test 23
Record" on page 241. The signal generator provides a CW signal with minimal
residual FM. The FM is measured by the Test Set’s internal RF analyzer.
Setup
Figure 6-28
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
K1'
K1
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
Spectrun
analyzer
TX
range
RX test
TX test
AF
analyzer
MS report
MS FER
RX test
TX test
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Signal Generator
DATA
K3'
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
Max power 2.5W
RF OUTPUT
DUPLEX OUT
Cancel
ANTENNA IN
Max power 60 mW
VOLUME
AUDIO OUT
High
mW
Hz
µV
ms
AUDIO IN
Max 12V peak
Low
Max
42V peak
ANTENNA IN
Procedure
1. On the signal generator:
a. Set the output frequency to 840 MHz.
b. Set the output amplitude to 0.0 dBm.
c. Set the function to MOD OFF.
2. On the Test Set:
a. Press Preset.
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the RF ANALYZER screen.
e. Set the Tune Freq to 840 MHz.
f. Set the Input Port field to Ant.
g. Set the IF Filter field to 230 kHz.
h. Select the AF ANALYZER screen.
i. Set the AF Anl In field to FM Demod.
j. Set the Filter 1 field to 300Hz HPF.
k. Set the Filter 2 field to 3kHz LPF.
l. Set the Detector field to RMS.
186
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
RF Analyzer Residual FM Performance Test 23
3. Read the FM deviation (residual FM) for each both RF frequencies (840 and
1800 MHz) and record the deviation read on the Test Set in the Performance
Test Record and compare it to the limits.
187
Performance Tests
Spectrum Analyzer Image Rejection Performance Test 24
Spectrum Analyzer Image Rejection
Performance Test 24
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-24, "Spectrum Analyzer Image
Rejection (Image) Test 24 Record" on page 242. The first procedure measures the
spectrum analyzer’s ability to reject image frequencies. The spectrum analyzer is
tuned to a signal frequency while an image signal from the signal generator is
applied to the antenna input port.
Setup
Figure 6-29
Spectrum Analyzer Image Rejection Test 24
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
kHz
mV
s
IBASIC
reset
Shift
POWER
RF IN/OUT
DO NOT apply RF
when in standby
DUPLEX OUT
Max power 2.5W
Cancel
ANTENNA IN
Max power 60 mW
Signal Generator
VOLUME
AUDIO OUT
Max 12V peak
High
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
ANTENNA IN
OUTPUT
Back
10 MHz OUTPUT
MODULATION
INPUT
COMPOSITE
VIDEO
EVEN SEC
INPUT
AUD MONITOR
OUTPUT
CDMA CLOCK
MUX OUTPUT
CELLSITE/TRIGGERS
PROTOCOL SERIAL
SA TRIG
OUTPUT
PARALLEL PORT
CSD1 SERIAL
S0 SERIAL PORT
CSD2 SERIAL
S1 SERIAL PORT
HP-IB
EXT REF
INPUT
EXT REF IN
16X CHIP
OUTPUT
10 MHz
OUTPUT
8285bck.eps
Procedure
1. On the signal generator:
a. Set the level to -20 dBm.
b. Set the frequency to 1229 MHz.
c. Set modulation off.
2. On the Test Set:
a. Press Preset.
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Select the SPEC ANL screen.
188
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
Spectrum Analyzer Image Rejection Performance Test 24
e. Set the RF In/Ant field to Ant.
f. Set the Ref Level field to -25 dBm.
g. Set the Span field to 5 kHz.
h. Set the Controls field to Marker.
i. Set the Marker To field to Center Freq.
j. Set the Controls field back to Main.
3. Set the signal generator’s frequency and the Test Set’s spectrum analyzer center
frequency as shown in the Performance Test Record (PTR) and read the image
response on the spectrum analyzer. The image response is the spectrum
analyzer’s marker level (in dBm) minus the signal generator’s output level
(minus −20 dBm). (In other words, add 20 dB to the marker level.) Compare
the results to the limits.
189
Performance Tests
CDMA Generator RF IN/OUT Amplitude Level Accuracy Performance Test 25
CDMA Generator RF IN/OUT Amplitude Level Accuracy
Performance Test 25
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-25, "CDMA Generator RF In/Out Test
25 Record" on page 243. The amplitude level accuracy of the CDMA generator is
measured directly with a power meter. These measurements are made at the top
and bottom of the CDMA generator’s vernier range.
NOTE
Two setups follow. The first setup can measure signals to 1 GHz. Since the FM
generator in the Test Set translates FM in the lower band directly into the 1.7 to 2
GHz range, testing to 1 GHz is adequate when verifying a repair. The second setup
has a microwave converter which covers the full measurement range of FM signals
to 2 GHz.
Setups
Figure 6-30
Setup 1 for Measurements to 1 GHz
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Power Meter
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
K1'
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
INPUT 50Ω
RF IN/OUT
DUPLEX OUT
Max power 2.5W
Cancel
ANTENNA IN
VOLUME
Max power 60 mW
AUDIO OUT
Max 12V peak
High
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
RF IN/OUT
Sensor Module
Procedure
1. Before connecting the equipment, on the measuring receiver:
a. Reset the instrument.
b. Zero and calibrate the sensor module.
NOTE
Make sure the sensor module’s calibration data is entered into the measuring
receiver.
2. Connect the equipment as shown in Setup 1.
190
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
CDMA Generator RF IN/OUT Amplitude Level Accuracy Performance Test 25
3. On the Test Set:
a. Press Preset.
b. Select the CONFIGURE screen and set RF display to freq.
c. Select the CDMA CALL CONTROL screen.
d. Set the RF Gen Freq field to 836.52 MHz.
e. Select the CDMA GENERATOR CONTROL screen.
f. Set the Sctr A Pwr to –20.5 dBm.
4. On the measuring receiver:
a. Set the measurement mode to RF Power.
b. Set the display to log.
c. Press the Calibrate key.
5. Set the Test Set to the frequencies and levels listed in the PTR and record the
values.
191
Performance Tests
CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26
CDMA Generator DUPLEX OUT Amplitude Level Accuracy
Performance Test 26
The purpose of this test is to verify the amplitude level accuracy of the CDMA
generator at the DUPLEX OUT port by using the CDMA analyzer to verify it
meets the specification limits in PTR (Performance Test Record) table 7-26,
"CDMA Generator DUPLEX OUT Sector B Power Level Accuracy Test 26
Record" on page 244.
Setup
Figure 6-31
CDMA Generator Modulation Accuracy Test 26
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
K1'
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
kHz
mV
s
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
RF IN/OUT
Max power 2.5W
DUPLEX OUT
Cancel
ANTENNA IN
VOLUME
Max power 60 mW
AUDIO OUT
Max 12V peak
High
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
DUPLEX OUT
Procedure
1. Press Preset.
DUPLEX OUT
Sector B Power
2. Select the CONFIGURE screen and set the RF Display field to Freq.
3. Set the (Gen)-(Anl) field to 0 MHz.
4. Set the Output Port field to Dupl.
5. Select the CDMA GENERATOR CONTROL screen.
6. Set the Scrt A Pwr field to Off.
7. Set the RF Gen Freq to 840 MHz.
8. Set the Scrt B Pwr field to the values listed in the PTR for Sector B. See
Appendix Table 7-26, “CDMA Generator DUPLEX OUT Sector B Power
Level Accuracy Test 26 Record,” on page 244.
9. Go to the CDMA CELLULAR MOBILE TRANSMITTER TEST screen.
10. Read the Avg Power (average power) and record it in the PTR.
DUPLEX OUT
AWGN Power
192
11. Select the CDMA GENERATOR CONTROL screen.
12. Set the Sector B Power field to Off.
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test
26
13. Set the AWGN Power field to the values listed in the PTR for AWGN power.
See table 7-27, "CDMA Generator DUPLEX OUT AWGN Power Level
Accuracy Test 26 Record" on page 244.
14. Select the CDMA CALL CONTROL screen.
15. Change the Avg Power measurement field to Chan Power (Channel
Power).
16. Calibrate the channel power by selecting Calibrate in the Power Meas
field.
17. Select the CDMA GENERATOR CONTROL screen.
18. Read the channel power and record it in the PTR.
193
Performance Tests
CDMA Generator Modulation Accuracy Performance Test 27
CDMA Generator Modulation Accuracy
Performance Test 27
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-28, "CDMA Generator Modulation
Accuracy Test 27 Record" on page 245. The modulation accuracy of the CDMA
generator is directly measured with a vector signal analyzer at the DUPLEX OUT
port. Because the vector signal analyzer cannot measure rho directly, the
modulation accuracy is measured in EVM (Error Vector Magnitude) % rms and
rho is calculated from the EVM data.
Setup
Figure 6-32
CDMA Generator Modulation Accuracy Test 26
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
K1'
K1
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Call
control
Gen
control
Authentication
Call
control
Duplex
Spectrun
analyzer
TX
range
RX test
TX test
AF
analyzer
MS report
MS FER
RX test
TX test
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
kHz
mV
s
IBASIC
reset
Shift
Vector Signal Analyzer
POWER
DO NOT apply RF
when in standby
RF IN/OUT
DUPLEX OUT
Max power 2.5W
Cancel
ANTENNA IN
VOLUME
Max power 60 mW
AUDIO OUT
High
mW
Hz
µV
ms
AUDIO IN
Max 12V peak
Low
Max
42V peak
DUPLEX OUT
INPUT
Procedure
1. On the Test Set:
a. Press Preset.
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Set the (Gen)-(Anl) field to 0 MHz.
e. Set the Output Port field to Dupl.
f. Select the CDMA CALL CONTROL screen.
g. Set the RF Gen Freq field to 881.52 MHz.
h. Select the CDMA GENERATOR CONTROL screen.
i. Set the Scrt A Pwr field to –10 dBm.
j. Turn off the Synth, Pager, and Traffic fields.
k. Set the Pilot field to 0 dB.
194
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
CDMA Generator Modulation Accuracy Performance Test 27
2. On the Vector Signal Analyzer:
a. Press the Frequency key.
b. Set center frequency to 881.52 MHz.
c. Set the span to 2.6 MHz.
d. Press the Instrument Mode key
e. Press the Digital Demodulation (F4) key
f. Press the Demodulation Setup (F5) key
g. Press the Demodulation Format (F1) key
h. Press the Standard Setup (F7) key.
i. Press the CDMA Base (F7) key.
j. Press the D key.
k. Read the Rho measurement or:
3. Use the following equation to calculate rho.
1 ρ = -----------------------2
1 + EVM
ρ = rho
EVM = Error Vector Magnitude (% rms)
4. Compare and record the rho error calculated in table 7-28, "CDMA Generator
Modulation Accuracy Test 27 Record" on page 245
5. Set the CDMA GEN frequency on the Test Set and change the center frequency
on the Vector Signal Analyzer to the 1956.25 MHz.
6. Calculate rho (using the above equation), and record the result (rho) in table
7-28, "CDMA Generator Modulation Accuracy Test 27 Record" on page 245.
195
Performance Tests
CDMA Analyzer Average Power Level Accuracy Performance Test 28
CDMA Analyzer Average Power Level Accuracy
Performance Test 28
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-29, "CDMA Analyzer Average Power
Level Accuracy Test 28 Record" on page 246. The CDMA average-power-level
accuracy is verified by comparing the measured power in a CW signal with the
power level measured by a power meter.
Setup
Figure 6-33
CDMA Analyzer Average Power Level Accuracy Test 27
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
Signal Generator
IBASIC
reset
Shift
POWER
DO NOT apply RF
when in standby
RF IN/OUT
DUPLEX OUT
Max power 2.5W
Cancel
ANTENNA IN
VOLUME
Max power 60 mW
AUDIO OUT
Max 12V peak
High
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
RF IN/OUT
OUTPUT
Power Splitter
Sensor Module
Power Meter
INPUT 50Ω
Procedure
1. On the signal generator:
a. Set the frequency to 881.52 MHz.
b. Set the amplitude so the measuring receiver reads 0 dBm.
196
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
CDMA Analyzer Average Power Level Accuracy Performance Test 28
2. On the Test Set:
a. Press Preset
b. Select the CONFIGURE screen.
c. Set the RF Display field to Freq.
d. Set the (Gen)-(Anl) field to 0 MHz.
e. Select CDMA CALL CONTROL.
f. Set Tune Freq to 881.52 MHz.
g. Set the Avg Pwr Units to mW.
3. Record the Avg Pwr reading in the PTR (see table 7-29, "CDMA Analyzer
Average Power Level Accuracy Test 28 Record" on page 246).
4. Repeat steps 2 and 3 for each of the frequencies and levels listed in the PTR.
197
Performance Tests
CDMA Analyzer Channel Power Level Accuracy Performance Test 29
CDMA Analyzer Channel Power Level Accuracy
Performance Test 29
The purpose of this test is to verify that the Test Set meets the specification limits
in PTR (Performance Test Record) table 7-30, "CDMA Analyzer Channel Power
Level Accuracy Test 29 Record" on page 247. The tuned channel power level
accuracy is verified by comparing the measured power in a CW signal with the
power level measured by a measuring receiver.
Setup
Figure 6-34
CDMA Analyzer Channel Power Level Accuracy Test 28
CALL CONTROL
UTILITIES
Answer
Call/
Page
End/
Release
Register
Print
Printer
Tests
Config
I/O config
Help
Previous
Message
Preset
Hold
Meas
reset
ANALOG SCREENS
CDMA SCREENS
USER
Cell config
Spectrum
SMS
Gen
control
Authentication
Call
control
Duplex
K1'
Call
control
Spectrun
analyzer
K1
MS report
MS FER
RX test
TX test
TX
range
RX test
TX test
AF
analyzer
K2'
Address
Local
Save
Recall
K2
DATA FUNCTIONS
DATA
K3'
Ref set
Meter
Average
K3
Increment
10
Increment
set
Increment
x 10
Low limit
Assign
7
8
9
Enter
4
5
6
Ghz
dBm
dB
1
2
3
MHz
V
%
0
.
+/-
Yes
On/Off
No
Ratio
W
%
dB
High limit
K4
Release
K5
IBASIC
reset
Signal Generator
Shift
POWER
Amplifier 2
DO NOT apply RF
when in standby
RF IN/OUT
DUPLEX OUT
Max power 2.5W
Cancel
ANTENNA IN
VOLUME
Max power 60 mW
AUDIO OUT
Max 12V peak
High
kHz
mV
s
mW
Hz
µV
ms
AUDIO IN
Low
Max
42V peak
RF IN/OUT
OUTPUT
Power Splitter
Sensor Module
Measuring Receiver
SENSOR
INPUT 50Ω
Procedure
1. On the measuring receiver
a. Set the display mode to LOG.
b. Set the measurement mode to RF POWER.
c. Calibrate the power sensor.
2. On the signal generator:
a. Set the frequency to 836.52 MHz (45 MHz below RF generator frequency).
b. Set the output level so the measuring receiver reads 11 dBm.
198
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
Performance Tests
CDMA Analyzer Channel Power Level Accuracy Performance Test 29
3. On the Test Set:
a. Press Preset.
b. Change the Avg Pwr field to Chan Pwr.
c. Verify the RF Channel is set at 384.
d. Select Calibrate under Chn Pwr Cal.
4. Record the Chan Pwr measurement in the PTR table 7-30, "CDMA Analyzer
Channel Power Level Accuracy Test 29 Record" on page 247.
5. Repeat steps 2 and 3 for each of the data points listed in the PTR.
6. For PCS frequencies:
a. Set the RF CHAN Std to US PCS.
b. Verify the RF Channel is set at 525.
NOTE
The Chan Pwr Cal is only required when the frequency is changed.
199
Performance Tests
CDMA Analyzer Channel Power Level Accuracy Performance Test 29
200
S:\agilent\e8285\ALR\Book\chapters\perf_test.fm
7
Performance Test Records
Use this chapter to record the results of the performance tests in Chapter 6,
“Performance Tests,” on page 141.
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
201
Performance Test Records
RF Generator FM Distortion Performance Test 1 Record
RF Generator FM Distortion
Performance Test 1 Record
For test procedure, see “RF Generator FM Distortion Performance Test 1” on page
146.
Table 7-1
202
RF Generator FM Distortion Test 1 Record
Applicable
Firmware
Revision
RF
(MHz)
Deviation
(kHz)
Rate
(kHz)
<A.02.XX
30
99
1
0.50
<A.02.XX
30
5
1
0.50
<A.02.XX
312.5
5
1
0.50
<A.02.XX
425
50
1
0.50
<A.02.XX
501
99
1
0.50
<A.02.XX
501
50
1
0.50
<A.02.XX
501
5
1
0.50
<A.02.XX
568.75
50
1
0.50
<A.02.XX
656.25
99
1
0.50
<A.02.XX
656.25
50
1
0.50
<A.02.XX
656.25
5
1
0.50
<A.02.XX
750
99
1
0.50
<A.02.XX
750
50
1
0.50
<A.02.XX
750
5
1
0.50
ALL
856.25
99
1
0.50
ALL
856.25
50
1
0.50
ALL
856.25
5
1
0.50
ALL
956.25
50
1
0.50
ALL
976.002
5
1
0.50
ALL
1000
99
1
0.50
ALL
1000
50
1
0.50
ALL
1000
11
1
0.50
ALL
1000
5
1
0.50
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
FM Distortion Limits (%)
Upper
Actual
Performance Test Records
RF Generator FM Distortion Performance Test 1 Record
FM Distortion Limits (%)
Applicable
Firmware
Revision
RF
(MHz)
Deviation
(kHz)
Rate
(kHz)
ALL
1000
6
1
0.50
ALL
1000
7
1
0.50
ALL
1000
8
1
0.50
ALL
1000
9
1
0.50
ALL
998.401
8
1
0.50
<A.02.XX
768.001
8
1
0.50
<A.02.XX
512.001
8
1
0.50
<A.02.XX
511.601
8
1
0.50
<A.02.XX
511.201
8
1
0.50
Upper
Actual
The following entries are for the 2 GHz setup.
ALL
1700
99
1
1.00
ALL
1700
50
1
1.00
ALL
1700
5
1
1.00
ALL
2000
99
1
1.00
ALL
2000
50
1
1.00
ALL
2000
5
1
1.00
203
Performance Test Records
RF Generator FM Accuracy Performance Test 2 Record
RF Generator FM Accuracy
Performance Test 2 Record
For test procedure, see “RF Generator FM Accuracy Performance Test 2” on page
149.
Table 7-2
204
RF Generator FM Accuracy Test 2 Record
Applicable
Firmware
Revision
RF
(MHz)
Deviation
(kHz)
Rate
(kHz)
<A.02.XX
30
99
<A.02.XX
30
<A.02.XX
FM Deviation Limits (kHz)
Lower
Upper
1
95.035
102.965
3
1
2.845
3.155
312.5
3
1
2.845
3.155
<A.02.XX
425
50
1
47.750
52.25
<A.02.XX
501
99
1
95.035
102.965
<A.02.XX
501
50
1
47.750
52.25
<A.02.XX
501
3
1
2.845
3.155
<A.02.XX
568.75
50
1
47.750
52.25
<A.02.XX
656.25
99
1
95.035
102.965
<A.02.XX
656.25
50
1
47.750
52.25
<A.02.XX
656.25
3
1
2.845
3.155
<A.02.XX
750
99
1
95.035
102.965
<A.02.XX
750
50
1
47.750
52.25
<A.02.XX
750
3
1
2.845
3.155
ALL
856.25
99
1
95.035
102.965
ALL
856.25
50
1
47.750
52.25
ALL
856.25
3
1
2.845
3.155
ALL
956.25
50
1
47.750
52.25
ALL
976.002
3
1
2.845
3.155
ALL
1000
99
1
95.035
102.965
ALL
1000
50
1
47.750
52.25
ALL
1000
11
1
10.115
11.885
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
RF Generator FM Accuracy Performance Test 2 Record
Applicable
Firmware
Revision
RF
(MHz)
Deviation
(kHz)
Rate
(kHz)
ALL
1000
3
1
FM Deviation Limits (kHz)
Lower
Upper
2.845
3.155
Actual
The following entries are for the 2 GHz setup.
ALL
1700
99
1
95.035
102.965
ALL
1700
50
1
47.750
52.25
ALL
1700
3
1
2.845
3.155
ALL
2000
99
1
95.035
102.965
ALL
2000
50
1
47.750
52.25
ALL
2000
3
1
2.845
3.155
205
Performance Test Records
RF Generator FM Flatness Performance Test 3 Record
RF Generator FM Flatness
Performance Test 3 Record
For test procedure, see “RF Generator FM Flatness Performance Test 3” on page
152.
Table 7-3
Applicable
Firmware
Revision
RF Generator FM Flatness Test 3 Record
Level
(dBm)
RF
(MHz)
Deviation
(kHz)
AFGEN1
Freq. Rate
(kHz)
Computed FM
Flatness Limits
(dB)
Lower
Upper
<A.02.XX
−10
521
50
1
<A.02.XX
−10
521
50
0.1
−1
1
<A.02.XX
−10
521
50
0.2
−1
1
<A.02.XX
−10
521
50
2
−1
1
<A.02.XX
−10
521
50
10
−1
1
<A.02.XX
−10
521
50
25
−1
1
ALL
−10
975.5
50
ALL
−10
975.5
50
0.1
−1
1
ALL
−10
975.5
50
0.2
−1
1
ALL
−10
975.5
50
2
−1
1
ALL
−10
975.5
50
10
−1
1
ALL
−10
975.5
50
25
−1
1
Reference
Measured
Reading
(kHz)
Computed
Results
(dB)
Reading
Computed
0 dB
0 dB
Reference
The following entries are for the 2 GHz setup.
206
ALL
−10
1700
50
ALL
−10
1700
50
0.1
−1
1
ALL
−10
1700
50
0.2
−1
1
ALL
−10
1700
50
2
−1
1
ALL
−10
1700
50
10
−1
1
ALL
−10
1700
50
25
−1
1
ALL
−10
2000
50
ALL
−10
2000
50
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Reference
0 dB
Reference
0.1
−1
0 dB
1
Performance Test Records
RF Generator FM Flatness Performance Test 3 Record
Applicable
Firmware
Revision
Level
(dBm)
RF
(MHz)
Deviation
(kHz)
AFGEN1
Freq. Rate
(kHz)
Computed FM
Flatness Limits
(dB)
Lower
Upper
ALL
−10
2000
50
0.2
−1
1
ALL
−10
2000
50
2
−1
1
ALL
−10
2000
50
10
−1
1
ALL
−10
2000
50
25
−1
1
Measured
Reading
(kHz)
Computed
Results
(dB)
Reading
Computed
207
Performance Test Records
RF Generator Residual FM Performance Test 4 Record
RF Generator Residual FM
Performance Test 4 Record
For test procedure, see “RF Generator Residual FM Performance Test 4” on page
155.
Table 7-4
208
RF Generator Residual FM Test 4 Record
Applicable
Firmware
Revision
LO
(MHz)
RF
(MHz)
<A.02.XX
31.5
30
7
<A.02.XX
101.5
100
7
<A.02.XX
249.5
248
7
<A.02.XX
251.5
250
4
<A.02.XX
401.5
400
4
<A.02.XX
501.5
500
4
<A.02.XX
502.5
501
7
<A.02.XX
512.701
511.201
7
<A.02.XX
513.101
511.601
7
<A.02.XX
513.501
512.001
7
<A.02.XX
626.5
625
7
<A.02.XX
736.5
735
7
<A.02.XX
741.5
740
7
<A.02.XX
746.5
745
7
<A.02.XX
751.5
750
7
<A.02.XX
769.501
768.001
7
ALL
846.5
845
7
ALL
851.5
850
7
ALL
856.5
855
7
ALL
866.5
865
7
ALL
901.5
900
7
ALL
999.901
998.401
7
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Residual FM Limits (Hz)
Upper
Actual
Performance Test Records
RF Generator Residual FM Performance Test 4 Record
Applicable
Firmware
Revision
LO
(MHz)
RF
(MHz)
ALL
1001.5
1000
Residual FM Limits (Hz)
Upper
Actual
7
The following entries are for the 2 GHz setup.
ALL
201.5
1700
14
ALL
501.5
2000
14
209
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
RF Generator Level Accuracy
Performance Test 5 Record
For test procedure, see “RF Generator Level Accuracy Performance Test 5” on
page 158.
Table 7-5
RF Generator Level Accuracy Test 5 Record
Applicable
Firmware
Revision
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
The following entries are for Procedure 1.
210
<A.02.XX
DUPLEX OUT
30
−11
−12
−10
<A.02.XX
DUPLEX OUT
30
−16
−17
−15
<A.02.XX
DUPLEX OUT
30
−21
−22
−20
<A.02.XX
DUPLEX OUT
30
−26
−27
−25
<A.02.XX
DUPLEX OUT
30
−31
−32
−30
<A.02.XX
DUPLEX OUT
30
−36
−37
−35
<A.02.XX
DUPLEX OUT
30
−41
−42
−40
<A.02.XX
DUPLEX OUT
30
−46
−47
−45
<A.02.XX
DUPLEX OUT
30
−51
−52
−50
<A.02.XX
DUPLEX OUT
30
−56
−57
−55
<A.02.XX
DUPLEX OUT
30
−61
−62
−60
<A.02.XX
DUPLEX OUT
30
−66
−67
−65
<A.02.XX
DUPLEX OUT
30
−71
−72
−70
<A.02.XX
DUPLEX OUT
30
−76
−77
−75
<A.02.XX
DUPLEX OUT
30
−81
−82
−80
<A.02.XX
DUPLEX OUT
30
−86
−87
−85
<A.02.XX
DUPLEX OUT
30
−91
−92
−90
<A.02.XX
DUPLEX OUT
30
−96
−97
−95
<A.02.XX
DUPLEX OUT
30
−101
−102
−100
<A.02.XX
DUPLEX OUT
30
−106
−107
−105
<A.02.XX
DUPLEX OUT
30
−111
−112
−110
<A.02.XX
DUPLEX OUT
30
−116
−117
−115
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Applicable
Firmware
Revision
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
<A.02.XX
RF IN/OUT
30
−22
−23
−21
<A.02.XX
RF IN/OUT
30
−27
−28
−26
<A.02.XX
RF IN/OUT
30
−32
−33
−31
<A.02.XX
RF IN/OUT
30
−37
−38
−36
<A.02.XX
RF IN/OUT
30
−42
−43
−41
<A.02.XX
RF IN/OUT
30
−47
−48
−46
<A.02.XX
RF IN/OUT
30
−52
−53
−51
<A.02.XX
RF IN/OUT
30
−57
−58
−56
<A.02.XX
RF IN/OUT
30
−62
−63
−61
<A.02.XX
RF IN/OUT
30
−67
−68
−66
<A.02.XX
RF IN/OUT
30
−72
−73
−71
<A.02.XX
RF IN/OUT
30
−77
−78
−76
<A.02.XX
RF IN/OUT
30
−82
−83
−81
<A.02.XX
RF IN/OUT
30
−87
−88
−86
<A.02.XX
RF IN/OUT
30
−92
−93
−91
<A.02.XX
RF IN/OUT
30
−97
−98
−96
<A.02.XX
RF IN/OUT
30
−102
−103
−101
<A.02.XX
RF IN/OUT
30
−107
−108
−106
<A.02.XX
RF IN/OUT
30
−112
−113
−111
<A.02.XX
RF IN/OUT
30
−117
−118
−116
ALL
DUPLEX OUT
800
−11
−12
−10
ALL
DUPLEX OUT
800
−16
−17
−15
ALL
DUPLEX OUT
800
−21
−22
−20
ALL
DUPLEX OUT
800
−26
−27
−25
ALL
DUPLEX OUT
800
−31
−32
−30
ALL
DUPLEX OUT
800
−36
−37
−35
ALL
DUPLEX OUT
800
−41
−42
−40
ALL
DUPLEX OUT
800
−46
−47
−45
ALL
DUPLEX OUT
800
−51
−52
−50
Actual
211
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
212
Applicable
Firmware
Revision
Port
ALL
RF
(MHz)
Level
(dBm)
DUPLEX OUT
800
ALL
DUPLEX OUT
ALL
Level Limits (dBm)
Lower
Upper
−56
−57
−55
800
−61
−62
−60
DUPLEX OUT
800
−66
−67
−65
ALL
DUPLEX OUT
800
−71
−72
−70
ALL
DUPLEX OUT
800
−76
−77
−75
ALL
DUPLEX OUT
800
−81
−82
−80
ALL
DUPLEX OUT
800
−86
−87
−85
ALL
DUPLEX OUT
800
−91
−92
−90
ALL
DUPLEX OUT
800
−96
−97
−95
ALL
DUPLEX OUT
800
−101
−102
−100
ALL
DUPLEX OUT
800
−106
−107
−105
ALL
DUPLEX OUT
800
−111
−112
−110
ALL
DUPLEX OUT
800
−116
−117
−115
ALL
RF IN/OUT
800
−22
−23
−21
ALL
RF IN/OUT
800
−27
−28
−26
ALL
RF IN/OUT
800
−32
−33
−31
ALL
RF IN/OUT
800
−37
−38
−36
ALL
RF IN/OUT
800
−42
−43
−41
ALL
RF IN/OUT
800
−47
−48
−46
ALL
RF IN/OUT
800
−52
−53
−51
ALL
RF IN/OUT
800
−57
−58
−56
ALL
RF IN/OUT
800
−62
−63
−61
ALL
RF IN/OUT
800
−67
−68
−66
ALL
RF IN/OUT
800
−72
−73
−71
ALL
RF IN/OUT
800
−77
−78
−76
ALL
RF IN/OUT
800
−82
−83
−81
ALL
RF IN/OUT
800
−87
−88
−86
ALL
RF IN/OUT
800
−92
−93
−91
ALL
RF IN/OUT
800
−97
−98
−96
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Applicable
Firmware
Revision
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
ALL
RF IN/OUT
800
−102
−103
−101
ALL
RF IN/OUT
800
−107
−108
−106
ALL
RF IN/OUT
800
−112
−113
−111
ALL
RF IN/OUT
800
−117
−118
−116
ALL
DUPLEX OUT
1000
−11
−12
−10
ALL
DUPLEX OUT
1000
−16
−17
−15
ALL
DUPLEX OUT
1000
−21
−22
−20
ALL
DUPLEX OUT
1000
−26
−27
−25
ALL
DUPLEX OUT
1000
−31
−32
−30
ALL
DUPLEX OUT
1000
−36
−37
−35
ALL
DUPLEX OUT
1000
−41
−42
−40
ALL
DUPLEX OUT
1000
−46
−47
−45
ALL
DUPLEX OUT
1000
−51
−52
−50
ALL
DUPLEX OUT
1000
−56
−57
−55
ALL
DUPLEX OUT
1000
−61
−62
−60
ALL
DUPLEX OUT
1000
−66
−67
−65
ALL
DUPLEX OUT
1000
−71
−72
−70
ALL
DUPLEX OUT
1000
−76
−77
−75
ALL
DUPLEX OUT
1000
−81
−82
−80
ALL
DUPLEX OUT
1000
−86
−87
−85
ALL
DUPLEX OUT
1000
−91
−92
−90
ALL
DUPLEX OUT
1000
−96
−97
−95
ALL
DUPLEX OUT
1000
−101
−102
−100
ALL
DUPLEX OUT
1000
−106
−107
−105
ALL
DUPLEX OUT
1000
−111
−112
−110
ALL
DUPLEX OUT
1000
−116
−117
−115
ALL
RF IN/OUT
1000
−22
−23
−21
ALL
RF IN/OUT
1000
−27
−28
−26
ALL
RF IN/OUT
1000
−32
−33
−31
Actual
213
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Applicable
Firmware
Revision
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
ALL
RF IN/OUT
1000
−37
−38
−36
ALL
RF IN/OUT
1000
−42
−43
−41
ALL
RF IN/OUT
1000
−47
−48
−46
ALL
RF IN/OUT
1000
−52
−53
−51
ALL
RF IN/OUT
1000
−57
−58
−56
ALL
RF IN/OUT
1000
−62
−63
−61
ALL
RF IN/OUT
1000
−67
−68
−66
ALL
RF IN/OUT
1000
−72
−73
−71
ALL
RF IN/OUT
1000
−77
−78
−76
ALL
RF IN/OUT
1000
−82
−83
−81
ALL
RF IN/OUT
1000
−87
−88
−86
ALL
RF IN/OUT
1000
−92
−93
−91
ALL
RF IN/OUT
1000
−97
−98
−96
ALL
RF IN/OUT
1000
−102
−103
−101
ALL
RF IN/OUT
1000
−107
−108
−106
ALL
RF IN/OUT
1000
−112
−113
−111
ALL
RF IN/OUT
1000
−117
−118
−116
The following entries are for the 2 GHz setup
214
ALL
DUPLEX OUT
1700
−13
−14
−12
ALL
DUPLEX OUT
1700
−18
−19
−17
ALL
DUPLEX OUT
1700
−23
−24
−22
ALL
DUPLEX OUT
1700
−28
−29
−27
ALL
DUPLEX OUT
1700
−33
−34
−32
ALL
DUPLEX OUT
1700
−38
−39
−37
ALL
DUPLEX OUT
1700
−43
−44
−42
ALL
DUPLEX OUT
1700
−48
−49
−47
ALL
DUPLEX OUT
1700
−53
−54
−52
ALL
DUPLEX OUT
1700
−58
−59
−57
ALL
DUPLEX OUT
1700
−63
−64
−62
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Applicable
Firmware
Revision
Port
ALL
RF
(MHz)
Level
(dBm)
DUPLEX OUT
1700
ALL
DUPLEX OUT
ALL
Level Limits (dBm)
Lower
Upper
−68
−69
−67
1700
−73
−74
−72
DUPLEX OUT
1700
−78
−79
−77
ALL
DUPLEX OUT
1700
−83
−84
−82
ALL
DUPLEX OUT
1700
−88
−89
−87
ALL
DUPLEX OUT
1700
−93
−94
−92
ALL
DUPLEX OUT
1700
−98
−99
−97
ALL
DUPLEX OUT
1700
−103
−104
−102
ALL
DUPLEX OUT
1700
−108
−109
−107
ALL
DUPLEX OUT
1700
−103
−114
−112
ALL
DUPLEX OUT
1700
−118
−119
−117
ALL
RF IN/OUT
1700
−23
−24.25
−21.75
ALL
RF IN/OUT
1700
−28
−29.25
−26.75
ALL
RF IN/OUT
1700
−33
−24.25
−31.75
ALL
RF IN/OUT
1700
−38
−39.25
−36.75
ALL
RF IN/OUT
1700
−43
−44.25
−41.75
ALL
RF IN/OUT
1700
−48
−49.25
−46.75
ALL
RF IN/OUT
1700
−53
−54.25
−51.75
ALL
RF IN/OUT
1700
−58
−59.25
−56.75
ALL
RF IN/OUT
1700
−63
−64.25
−61.75
ALL
RF IN/OUT
1700
−68
−69.25
−66.75
ALL
RF IN/OUT
1700
−73
−74.25
−71.75
ALL
RF IN/OUT
1700
−78
−79.25
−76.75
ALL
RF IN/OUT
1700
−83
−84.25
−81.75
ALL
RF IN/OUT
1700
−88
−89.25
−86.75
ALL
RF IN/OUT
1700
−93
−94.25
−89.75
ALL
RF IN/OUT
1700
−98
−99.25
−96.75
ALL
RF IN/OUT
1700
−103
−104.25
−101.75
ALL
RF IN/OUT
1700
−108
−109.25
−106.75
Actual
215
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Applicable
Firmware
Revision
216
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
ALL
RF IN/OUT
1700
−113
−114.25
−111.75
ALL
RF IN/OUT
1700
−118
−119.25
−116.75
ALL
DUPLEX OUT
2000
−13
−14
−12
ALL
DUPLEX OUT
2000
−18
−19
−17
ALL
DUPLEX OUT
2000
−23
−24
−22
ALL
DUPLEX OUT
2000
−28
−29
−27
ALL
DUPLEX OUT
2000
−33
−34
−32
ALL
DUPLEX OUT
2000
−38
−39
−37
ALL
DUPLEX OUT
2000
−43
−44
−42
ALL
DUPLEX OUT
2000
−48
−49
−47
ALL
DUPLEX OUT
2000
−53
−54
−52
ALL
DUPLEX OUT
2000
−58
−59
−57
ALL
DUPLEX OUT
2000
−63
−64
−62
ALL
DUPLEX OUT
2000
−68
−69
−67
ALL
DUPLEX OUT
2000
−73
−74
−72
ALL
DUPLEX OUT
2000
−78
−79
−77
ALL
DUPLEX OUT
2000
−83
−84
−82
ALL
DUPLEX OUT
2000
−88
−89
−87
ALL
DUPLEX OUT
2000
−93
−94
−92
ALL
DUPLEX OUT
2000
−98
−99
−97
ALL
DUPLEX OUT
2000
−103
−104
−102
ALL
DUPLEX OUT
2000
−108
−109
−107
ALL
DUPLEX OUT
2000
−113
−114
−112
ALL
DUPLEX OUT
2000
−118
−119
−117
ALL
RF IN/OUT
2000
−23
−24.25
−21.75
ALL
RF IN/OUT
2000
−28
−29.25
−26.75
ALL
RF IN/OUT
2000
−33
−34.25
−31.75
ALL
RF IN/OUT
2000
−38
−39.25
−36.75
ALL
RF IN/OUT
2000
−43
−44.25
−41.75
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
RF Generator Level Accuracy Performance Test 5 Record
Applicable
Firmware
Revision
Port
RF
(MHz)
Level
(dBm)
Level Limits (dBm)
Lower
Upper
ALL
RF IN/OUT
2000
−48
−49.25
−46.75
ALL
RF IN/OUT
2000
−53
−54.25
−51.75
ALL
RF IN/OUT
2000
−58
−59.25
−56.75
ALL
RF IN/OUT
2000
−63
−64.25
−61.75
ALL
RF IN/OUT
2000
−68
−69.25
−66.75
ALL
RF IN/OUT
2000
−73
−74.25
−71.75
ALL
RF IN/OUT
2000
−78
−79.25
−76.75
ALL
RF IN/OUT
2000
−83
−84.25
−81.75
ALL
RF IN/OUT
2000
−88
−89.25
−86.75
ALL
RF IN/OUT
2000
−93
−94.25
−91.75
ALL
RF IN/OUT
2000
−98
−99.25
−96.75
ALL
RF IN/OUT
2000
−103
−104.25
−101.75
ALL
RF IN/OUT
2000
−108
−109.25
−106.75
ALL
RF IN/OUT
2000
−113
−114.25
−111.75
ALL
RF IN/OUT
2000
−118
−119.25
−116.75
Actual
217
Performance Test Records
RF Generator Harmonics Spectral Purity Performance Test 6 Record
RF Generator Harmonics Spectral Purity
Performance Test 6 Record
For test procedure, see “RF Generator Harmonics Spectral Purity Performance
Test 6” on page 163.
Table 7-6
218
RF Generator Harmonics Spectral Purity Test 6 Record
Applicable
Firmware
Revision
Level
(dBm)
RF Freq
(MHz)
Harmonic
Number
<A.02.XX
-10
30
2nd
−18.000
<A.02.XX
-10
30
3rd
−18.000
<A.02.XX
-10
50
2nd
−18.000
<A.02.XX
-10
50
3rd
−18.000
<A.02.XX
-10
100
2nd
−18.000
<A.02.XX
-10
100
3rd
−18.000
<A.02.XX
-10
200
2nd
−18.000
<A.02.XX
-10
200
3rd
−18.000
<A.02.XX
-10
300
2nd
−18.000
<A.02.XX
-10
300
3rd
−18.000
<A.02.XX
-10
400
2nd
−18.000
<A.02.XX
-10
400
3rd
−18.000
<A.02.XX
-10
500
2nd
−18.000
<A.02.XX
-10
500
3rd
−18.000
<A.02.XX
-10
600
2nd
−18.000
<A.02.XX
-10
600
3rd
−18.000
<A.02.XX
-10
700
2nd
−18.000
<A.02.XX
-10
700
3rd
−18.000
ALL
-10
800
2nd
−18.000
ALL
-10
800
3rd
−18.000
ALL
-10
900
2nd
−18.000
ALL
-10
900
3rd
−18.000
ALL
-10
1000
2nd
−18.000
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Harmonic Limits (dBc)
Upper
Actual
Performance Test Records
RF Generator Harmonics Spectral Purity Performance Test 6 Record
Applicable
Firmware
Revision
Level
(dBm)
RF Freq
(MHz)
Harmonic
Number
Harmonic Limits (dBc)
ALL
-10
1000
3rd
−18.000
ALL
-10
1700
2nd
−18.000
ALL
-10
1700
3rd
−18.000
ALL
-10
1800
2nd
−18.000
ALL
-10
1800
3rd
−18.000
ALL
-10
1900
2nd
−18.000
ALL
-10
1900
3rd
−18.000
ALL
-10
2000
2nd
−18.000
ALL
-10
2000
3rd
−18.000
ALL
-11
30
2nd
−18.000
ALL
-11
30
3rd
−18.000
ALL
-11
50
2nd
−18.000
ALL
-11
50
3rd
−18.000
ALL
−11
100
2nd
−18.000
ALL
−11
100
3rd
−18.000
ALL
−11
200
2nd
−18.000
ALL
−11
200
3rd
−18.000
ALL
−11
300
2nd
−18.000
ALL
−11
300
3rd
−18.000
ALL
−11
400
2nd
−18.000
ALL
−11
400
3rd
−18.000
ALL
−11
500
2nd
−18.000
ALL
−11
500
3rd
−18.000
ALL
−11
600
2nd
−18.000
ALL
−11
600
3rd
−18.000
ALL
−11
700
2nd
−18.000
ALL
−11
700
3rd
−18.000
ALL
−11
800
2nd
−18.000
ALL
−11
800
3rd
−18.000
Upper
Actual
219
Performance Test Records
RF Generator Harmonics Spectral Purity Performance Test 6 Record
220
Applicable
Firmware
Revision
Level
(dBm)
RF Freq
(MHz)
Harmonic
Number
ALL
−11
900
2nd
−18.000
ALL
−11
900
3rd
−18.000
ALL
−11
1000
2nd
−18.000
ALL
−11
1000
3rd
−18.000
ALL
−12
1700
2nd
−18.000
ALL
−12
1700
3rd
−18.000
ALL
−12
1800
2nd
−18.000
ALL
−12
1800
3rd
−18.000
ALL
−12
1900
2nd
−18.000
ALL
−12
1900
3rd
−18.000
ALL
−12
2000
2nd
−18.000
ALL
−12
2000
3rd
−18.000
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Harmonic Limits (dBc)
Upper
Actual
Performance Test Records
RF Generator Spurious Spectral Purity Performance Test 7 Record
RF Generator Spurious Spectral Purity
Performance Test 7 Record
For test procedure, see “RF Generator Spurious Spectral Purity Performance Test
7” on page 165.
Table 7-7
RF Generator Spurious Spectral Purity Test 7 Record
Spurious Source
RF Freq
(MHz)
Spur Freq
(MHz)
Spurious Signal Limits
(dBc)
Upper
Supply
1000
1080
−60.00
Supply
1000
999.89
−60.00
Supply
1000
1130
−60.00
Supply
1800
1880
−55.00
Supply
1800
1799.89
−55.00
Supply
1800
1930
−55.00
1 Gz Mix
999.9995
1000.0145
−60.00
1 Gz Mix
999.9995
999.9795
−60.00
1 Gz Mix
999.9995
1000.0245
−60.00
MX +1G
1700
2700
−55.00
MX +1G
1799
2799
−55.00
MX +.8G
1850
2650
−55.00
FDTH1X
1799
1000
−55.00
FDTH1X
1850
800
−55.00
DCDMA
1700
1.2288
−55.00
DCDMA
1850
1.2288
−55.00
DREF5
1700
5
−55.00
DREF5
1850
5
−55.00
MX +CDMA
1700
1701.2288
−55.00
MX -CDMA
1700
1698.7712
−55.00
MX +CDMA
1850
1851.2288
−55.00
MX -CDMA
1850
1848.7712
−55.00
MX +REF5
1700
1705
−55.00
Actual
221
Performance Test Records
RF Generator Spurious Spectral Purity Performance Test 7 Record
Spurious Source
RF Freq
(MHz)
Spur Freq
(MHz)
Spurious Signal Limits
(dBc)
Upper
222
MX -REF5
1700
1695
−55.00
MX +REF5
1850
1855
−55.00
MX -REF5
1850
1845
−55.00
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
AF Generator AC Level Accuracy Performance Test 8 Record
AF Generator AC Level Accuracy
Performance Test 8 Record
For test procedure, see “AF Analyzer AC Level Accuracy Performance Test 12”
on page 171.
Table 7-8
AF Generator AC Level Accuracy Test 8 Record
AF Generator
Frequency
(Hz)
Level
(mV)
AC Level Limits (mV)
Lower
Upper
1
25000
4000
3885.000
4115.000
1
25000
700
682.500
717.500
1
25000
75
70.000
80.000
1
10000
4000
3885.000
4115.000
1
10000
700
682.500
717.500
1
10000
75
70.000
80.000
1
1000
4000
3885.000
4115.000
1
1000
700
682.500
717.500
1
1000
75
70.000
80.000
1
100
4000
3885.000
4115.000
1
100
700
682.500
717.500
1
100
75
70.000
80.000
2
25000
4000
3885.000
4115.000
2
25000
700
682.500
717.500
2
25000
75
70.000
80.000
2
10000
4000
3885.000
4115.000
2
10000
700
682.500
717.500
2
10000
75
70.000
80.000
2
1000
4000
3885.000
4115.000
2
1000
700
682.500
717.500
2
1000
75
70.000
80.000
Actual
223
Performance Test Records
AF Generator AC Level Accuracy Performance Test 8 Record
AF Generator
224
Frequency
(Hz)
Level
(mV)
AC Level Limits (mV)
Lower
Upper
2
100
4000
3885.000
4115.000
2
100
700
682.500
717.500
2
100
75
70.000
80.000
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
AF Generator DC Level Accuracy Performance Test 9 Record
AF Generator DC Level Accuracy
Performance Test 9 Record
For test procedure, see “AF Generator DC Level Accuracy Performance Test 9” on
page 168.
Table 7-9
AF Generator DC Level Accuracy Test 9 Record
AF Generator
Level
(mV)
DC Level Limits (mV)
Lower
Upper
1
4000
3870.000
4130.000
1
1000
975.000
1025.000
2
4000
3870.000
4130.000
2
1000
975.000
1025.000
Actual
225
Performance Test Records
AF Generator Residual Distortion Performance Test 10 Record
AF Generator Residual Distortion
Performance Test 10 Record
For test procedure, see “AF Generator Residual Distortion Performance Test 10”
on page 169.
Table 7-10
AF Generator Residual Distortion Test 10 Record
AF Generator
226
Frequency
(Hz)
Level
(mV)
Distortion Limits (%)
Upper
1
25000
4000
0.125
1
25000
2000
0.125
1
25000
200
0.125
1
10000
4000
0.125
1
10000
2000
0.125
1
10000
200
0.125
1
1000
4000
0.125
1
1000
2000
0.125
1
1000
200
0.125
1
100
4000
0.125
1
100
2000
0.125
1
100
200
0.125
2
25000
4000
0.125
2
25000
2000
0.125
2
25000
200
0.125
2
10000
4000
0.125
2
10000
2000
0.125
2
10000
200
0.125
2
1000
4000
0.125
2
1000
2000
0.125
2
1000
200
0.125
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
AF Generator Residual Distortion Performance Test 10 Record
AF Generator
Frequency
(Hz)
Level
(mV)
Distortion Limits (%)
Upper
2
100
4000
0.125
2
100
2000
0.125
2
100
200
0.125
Actual
227
Performance Test Records
AF Generator Frequency Accuracy Performance Test 11 Record
AF Generator Frequency Accuracy
Performance Test 11 Record
For test procedure, see “AF Generator Frequency Accuracy Performance Test 11”
on page 170.
Table 7-11
AF Generator Frequency Accuracy Test 11 Record
AF Generator
228
Frequency
(Hz)
Frequency Limits (Hz)
Lower
Upper
1
25000
24993.750
25006.250
1
10000
9997.500
10002.500
1
5000
4998.750
500.125
1
2000
1999.500
2000.500
1
1000
999.750
1000.250
1
500
499.875
500.125
1
200
199.950
200.050
1
100
99.975
100.025
1
50
49.988
50.012
1
20
19.995
20.005
2
25000
24993.750
25006.250
2
10000
9997.500
10002.500
2
5000
4998.750
500.125
2
2000
1999.500
2000.500
2
1000
999.750
1000.250
2
500
499.875
500.125
2
200
199.950
200.050
2
100
99.975
100.025
2
50
49.988
50.012
2
20
19.995
20.005
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
AF Analyzer AC Level Accuracy Performance Test 12 Record
AF Analyzer AC Level Accuracy
Performance Test 12 Record
For test procedure, see “AF Analyzer AC Level Accuracy Performance Test 12”
on page 171.
Table 7-12
AF Analyzer AC Voltage Accuracy Test 12 Record
Frequency
(Hz)
Level
(mV)
AC Voltage Limits (mV)
Lower
Upper
15000
5000
4850.00
5150.00
2000
5000
4850.00
5150.00
200
5000
4850.00
5150.00
20
5000
4850.00
5150.00
15000
500
485.00
515.00
2000
500
485.00
515.00
200
500
485.00
515.00
20
500
485.00
515.00
15000
50
48.50
51.50
2000
50
48.50
51.50
200
50
48.50
51.50
20
50
48.50
51.50
Actual
229
Performance Test Records
AF Analyzer Residual Noise Performance Test 13 Record
AF Analyzer Residual Noise
Performance Test 13 Record
For test procedure, see “AF Analyzer Residual Noise Performance Test 13” on
page 172.
Table 7-13
AF Analyzer Residual Noise Test 13 Record
Residual Noise Limits (µV)
230
Filter 2
Upper
15 kHz LPF
150
>99 kHz LP
450
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
AF Analyzer Distortion and SINAD Accuracy Performance Test 14 Record
AF Analyzer Distortion and SINAD Accuracy
Performance Test 14 Record
For test procedure, see “AF Analyzer Distortion and SINAD Accuracy
Performance Test 14” on page 173.
Table 7-14
AF Analyzer Distortion and SINAD Accuracy Test 14 Record
AF Generator 2
Frequency
(kHz)
AF Generator 2
Level (mV)
Measurement
Type
Distortion and SINAD Limits
2
100
Distortion
8.856 %
11.144 %
2
100
SINAD
19.043 dB
21.043 dB
3
100
Distortion
8.856 %
11.144 %
3
100
SINAD
19.043 dB
21.043 dB
2
10
Distortion
0.890 %
1.120 %
2
10
SINAD
39.000 dB
41.000 dB
3
10
Distortion
0.890 %
1.120 %
3
10
SINAD
39.000 dB
41.000 dB
2
5
Distortion
0.445 %
0.560 %
2
5
SINAD
45.021 dB
47.021 dB
3
5
Distortion
0.445 %
0.560 %
3
5
SINAD
45.021 dB
47.021 dB
Lower
Upper
Actual
231
Performance Test Records
AF Analyzer DC Level Accuracy Performance Test 15 Record
AF Analyzer DC Level Accuracy
Performance Test 15 Record
For test procedure, see “AF Analyzer DC Level Accuracy Performance Test 15”
on page 174.
Table 7-15
AF Analyzer DC Level Accuracy Test 15 Record
AF Generator
1 Level
(mV)
232
DC Voltage Limits (mV)
Lower
Upper
5000
4905.000
5095.000
500
450.000
550.000
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 Record
AF Analyzer Frequency Accuracy to 100 kHz
Performance Test 16 Record
For test procedure, see “AF Analyzer Frequency Accuracy to 100 kHz
Performance Test 16” on page 175.
Table 7-16
AF Analyzer Frequency Accuracy to 100 kHz Test 16 Record
Frequency
(Hz)
Frequency Limits (Hz)
Lower
Upper
21
20.896
21.104
100
99.880
100.120
1000
999.700
1000.300
10000
9997.90
10002.10
100000
99979.9
100020.1
Actual
233
Performance Test Records
AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 Record
AF Analyzer Frequency Accuracy at 400 kHz
Performance Test 17 Record
For test procedure, see “AF Analyzer Frequency Accuracy at 400 kHz
Performance Test 17” on page 176.
Table 7-17
AF Analyzer Frequency Accuracy at 400 kHz Test 17 Record
Frequency Difference Limits (kHz)
Lower
−0.080
234
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Upper
0.080
Actual
Performance Test Records
Oscilloscope Amplitude Accuracy Performance Test 18 Record
Oscilloscope Amplitude Accuracy
Performance Test 18 Record
For test procedure, see “Oscilloscope Amplitude Accuracy Performance Test 18”
on page 177.
Table 7-18
Oscilloscope Amplitude Accuracy Test 18 Record
Frequency
(kHz)
Amplitude Limits (V)
Lower
Upper
1
6.765
7.377
10
6.765
7.377
50
5.000
10.000
Actual
235
Performance Test Records
RF Analyzer Level Accuracy Performance Test 19 Record
RF Analyzer Level Accuracy
Performance Test 19 Record
For test procedure, see “RF Analyzer Level Accuracy Performance Test 19” on
page 179.
Table 7-19
236
RF Analyzer Level Accuracy Test 19 Record
Applicable
Firmware
Revision
Frequency
(MHz)
<A.02.XX
Level Difference Limits (dB)
Lower
Upper
30
−0.314
0.314
<A.02.XX
50
−0.314
0.314
<A.02.XX
100
−0.314
0.314
<A.02.XX
150
−0.314
0.314
<A.02.XX
200
−0.314
0.314
<A.02.XX
250
−0.314
0.314
<A.02.XX
300
−0.314
0.314
<A.02.XX
350
−0.314
0.314
<A.02.XX
400
−0.314
0.314
<A.02.XX
450
−0.314
0.314
<A.02.XX
500
−0.314
0.314
<A.02.XX
550
−0.314
0.314
<A.02.XX
600
−0.314
0.314
<A.02.XX
650
−0.314
0.314
<A.02.XX
700
−0.314
0.314
<A.02.XX
750
−0.314
0.314
ALL
800
−0.314
0.314
ALL
850
−0.314
0.314
ALL
900
−0.314
0.314
ALL
950
−0.314
0.314
ALL
1000
−0.314
0.314
ALL
1700
−0.334
0.334
ALL
1725
−0.334
0.334
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
RF Analyzer Level Accuracy Performance Test 19 Record
Applicable
Firmware
Revision
Frequency
(MHz)
ALL
Level Difference Limits (dB)
Lower
Upper
1750
−0.334
0.334
ALL
1775
−0.334
0.334
ALL
1800
−0.334
0.334
ALL
1825
−0.334
0.334
ALL
1850
−0.334
0.334
ALL
1875
−0.334
0.334
ALL
1900
−0.334
0.334
ALL
1925
−0.334
0.334
ALL
1950
−0.334
0.334
ALL
1975
−0.334
0.334
ALL
2000
−0.334
0.334
Actual
237
Performance Test Records
RF Analyzer FM Accuracy Performance Test 20 Record
RF Analyzer FM Accuracy
Performance Test 20 Record
For test procedure, see “RF Analyzer FM Accuracy Performance Test 20” on page
180.
Table 7-20
238
RF Analyzer FM Accuracy Test 20 Record
RF
(MHz)
Deviation
(kHz)
Rate
(Hz)
840
1
840
FM Deviation Limits (kHz)
Lower
Upper
1
0.950
1.050
1
10
0.950
1.050
840
10
1
9.500
10.500
840
10
10
9.500
10.500
1000
1
1
0.950
1.050
1000
1
10
0.950
1.050
1000
10
1
9.500
10.500
1000
10
10
9.500
10.500
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
RF Analyzer FM Distortion Performance Test 21 Record
RF Analyzer FM Distortion
Performance Test 21 Record
For test procedure, see “RF Analyzer FM Distortion Performance Test 21” on page
182.
Table 7-21
RF Analyzer FM Distortion Test 21 Record
FM Deviation
(kHz)
FM Distortion Limits (%)
Upper
5
1.000
25
1.000
75
1.000
Actual
239
Performance Test Records
RF Analyzer FM Bandwidth Performance Test 22 Record
RF Analyzer FM Bandwidth
Performance Test 22 Record
For test procedure, see “RF Analyzer FM Bandwidth Performance Test 22” on
page 184.
Table 7-22
RF Analyzer FM Bandwidth Test 22 Record
FM Deviation Difference
Limits (dB)
Upper
3.0
240
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
RF Analyzer Residual FM Performance Test 23 Record
RF Analyzer Residual FM
Performance Test 23 Record
For test procedure, see “RF Analyzer Residual FM Performance Test 23” on page
186.
Table 7-23
RF Analyzer Residual FM Test 23 Record
FM Deviation Limits (Hz)
RF (MHz)
Upper
840
7.0
1800
14.0
Actual
241
Performance Test Records
Spectrum Analyzer Image Rejection Performance Test 24 Record
Spectrum Analyzer Image Rejection
Performance Test 24 Record
For test procedure, see “Spectrum Analyzer Image Rejection Performance Test 24”
on page 188.
Table 7-24
242
Spectrum Analyzer Image Rejection (Image) Test 24 Record
Image Response
Limits (dB)
Applicable
Firmware
Revision
RF Generator
Frequency (MHz)
<A.02.XX
1229
0.4
−47
<A.02.XX
1379.6
151
−47
<A.02.XX
616.6
385
−47
<A.02.XX
873.6
645
−47
<A.02.XX
883.6
655
−47
<A.02.XX
1023.6
795
−47
<A.02.XX
1000
771.4
−47
ALL
928.6
1700
−47
ALL
1078.6
1850
−47
ALL
2078.6
1850
−47
ALL
1227.6
1999
−47
ALL
576.4
805
−47
ALL
771.4
1000
−47
ALL
1228.6
2000
−47
Spectrum Analyzer
Frequency (MHz)
Upper
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
CDMA Generator RF IN/OUT Amplitude Level Accuracy Performance Test 25
Record
CDMA Generator RF IN/OUT Amplitude Level Accuracy
Performance Test 25 Record
For test procedure, see “CDMA Generator RF IN/OUT Amplitude Level Accuracy
Performance Test 25” on page 190.
Table 7-25
CDMA Generator RF In/Out Test 25 Record
Measured Level Limits (dBm)
Sector
RF (MHz)
Level (dBm)
Lower
Upper
A
881.52
−20.50
−21.75
−19.25
A
881.52
−25.49
−26.74
−24.24
B
881.52
−20.50
−21.75
−19.25
B
881.52
−25.49
−26.74
−24.24
A
1956.25
−21.50
−22.85
−20.15
A
1956.25
−26.49
−27.84
−25.14
B
1956.25
−21.50
−22.85
−20.15
B
1956.25
−26.49
−27.84
−25.14
Actual
243
Performance Test Records
CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26
CDMA Generator DUPLEX OUT Amplitude Level Accuracy
Performance Test 26
For test procedure, see “CDMA Generator DUPLEX OUT Amplitude Level
Accuracy Performance Test 26” on page 192.
Table 7-26
Table 7-27
244
CDMA Generator DUPLEX OUT Sector B Power Level Accuracy Test 26 Record
Measured Level Limits (dBm)
RF Freq.
(MHz)
Level (dBm)
840
Lower
Upper
−10.50
−11.75
−9.25
840
−15.49
−16.74
−14.24
1890.52
−11.50
−12.85
−10.15
1890.52
−16.49
−17.84
−15.14
Actual
CDMA Generator DUPLEX OUT AWGN Power Level Accuracy Test 26 Record
Measured Level Limits (dBm)
RF Freq.
(MHz)
Level (dBm)
840
Lower
Upper
−7.50
−9.25
−5.75
840
−9
−10.75
−7.25
1890.52
−7.50
−9.35
−5.65
1890.52
−9
−10.85
−9.15
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
CDMA Generator Modulation Accuracy Performance Test 27 Record
CDMA Generator Modulation Accuracy
Performance Test 27 Record
For test procedure, see “CDMA Generator Modulation Accuracy Performance Test
27” on page 194.
Table 7-28
CDMA Generator Modulation Accuracy Test 27 Record
RF (MHz)
Level (dBm)
Measured
EVM (%rms)
Calculated Rho
Lower Limit
881.52
−10
0.97
1956.25
−10
0.97
Actual
245
Performance Test Records
CDMA Analyzer Average Power Level Accuracy Performance Test 28 Record
CDMA Analyzer Average Power Level Accuracy
Performance Test 28 Record
For test procedure, see “CDMA Analyzer Average Power Level Accuracy
Performance Test 28” on page 196.
Table 7-29
CDMA Analyzer Average Power Level Accuracy Test 28 Record
RF
(MHz)
246
Level
(dBm)
Measured Level Limits (mW)
Lower
Upper
881.52
0
-0.343
0.318
881.52
-10
-10.39
-9.65
1956.25
0
-0.366
0.338
1956.25
-10
-10.41
-9.63
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
Actual
Performance Test Records
CDMA Analyzer Channel Power Level Accuracy Performance Test 29 Record
CDMA Analyzer Channel Power Level Accuracy
Performance Test 29 Record
For test procedure, see “CDMA Analyzer Channel Power Level Accuracy
Performance Test 29” on page 198.
Table 7-30
Sig. Gen. Freq.
Setting (MHz)
CDMA Analyzer Channel Power Level Accuracy Test 29 Record
RF Channel
(MHz)
Measured Level Limits (dBm)
Level
(dBm)
Lower
Upper
836.52
384
11
10.25
11.75
836.52
384
6
5.25
6.75
836.52
384
1
0.25
1.75
836.52
384
−4
−4.75
−3.25
836.52
384
−9
−9.75
−8.25
836.52
384
−14
−14.75
−13.25
836.52
384
−19
−19.75
−18.25
1876.52
525
11
10.25
11.75
1876.52
525
6
5.25
6.75
1876.52
525
1
0.25
1.75
1876.52
525
−4
−4.75
−3.25
1876.52
525
−9
−9.75
−8.25
1876.52
525
−14
−14.75
−13.25
1876.52
525
−19
−19.75
−18.25
Actual
247
Performance Test Records
CDMA Analyzer Channel Power Level Accuracy Performance Test 29 Record
248
S:\agilent\e8285\ALR\Book\chapters\perf_record.fm
8
Block Diagrams
This chapter contains block diagrams and descriptions that focus on
how the Test Set generates signal and performs measurements.
249
Block Diagrams
Signal Flow and Interconnections
Signal Flow and Interconnections
Shown in Figure 8-1, “Signal Flow and Interconnections,” on page 252
is a block-diagram overview of the Test Set. For details on individual
assemblies refer to Table 8-1 on page 251.
This chapter is organized into the following sections which provide a
detailed view of each individual assembly shown in the overview:
• RF Input/Output
• RF Analyzer
• Audio Analyzer
• CDMA Analyzer
• CDMA Generator
• Audio Generator
• RF Generator
• Reference/Regulator
• Instrument Control
Input/output and switch information is included to help you determine
if voltages and signals are getting to the assemblies with the proper
levels, shapes, and frequencies. Line names and connector pin numbers
are given on the block diagrams when applicable.
250
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
Signal Flow and Interconnections
Table 8-1
Block Diagrams
Figure
Figure 8-1, “Signal Flow and Interconnections,” on page 252
Figure 8-2, “RF I/O,” on page 254
Figure 8-3, “Downconverter,” on page 257
Figure 8-4, “Receiver Synthesizer,” on page 258
Figure 8-5, “Receiver,” on page 259
Figure 8-6, “Digital Cellsite 1 & 2,” on page 260
Figure 8-7, “Analog Cell Site (FW Rev A.04.54 and below),” on page 261
Figure 8-8, “Analog Cell Site (FW Rev A.05.03 and above),” on page 262
Figure 8-9, “Protocol Processor,” on page 263
Figure 8-10, “Spectrum Analyzer,” on page 265
Figure 8-11, “Audio Analyzer 1,” on page 267
Figure 8-12, “Audio Analyzer 2,” on page 268
Figure 8-13, “Measurement Board,” on page 269
Figure 8-14, “Signaling and Analyzer Assembly,” on page 270
Figure 8-15, “IQ Modulator,” on page 272
Figure 8-16, “LO/IF/Demodulator,” on page 273
Figure 8-17, “Digital Signal Processor 1 (DSP1),” on page 274
Figure 8-18, “CDMA Reference,” on page 276
Figure 8-19, “Signaling and Analyzer Assembly,” on page 277
Figure 8-20, “Modulation Distribution,” on page 278
Figure 8-21, “Signal Generator Synthesizer,” on page 281
Figure 8-22, “RF Output Section,” on page 282
Figure 8-23, “Upconverter,” on page 283
Figure 8-24, “High Stability Reference,” on page 285
Figure 8-25, “Regulator,” on page 286
Figure 8-26, “Memory SBRC,” on page 288
Figure 8-27, “Controller,” on page 289
Figure 8-28, “Display Driver,” on page 290
Figure 8-29, “GPIB/Serial,” on page 291
251
RF I/O
UP
CONVERTER
AUDIO OUT
DOWN
CONVERTER
RECEIVER
RCVR
SYNTH
CDMA
REF
SIGGEN
SYNTH
8920
OCXO
REF
REF IN
(RP)
SPECTRUM
ANALYZER
LO/IF/DEMOD
10 MHz
OUT (RP)
DCS1
DCS2
ACS
Possible
Future
Enhancements
AUDIO IN
NOISE
VOL
OUTPUT
IQ MOD
PROTOCOL
DSP1
PMF
DSP2
PROTO TRIG1
EXT MEAS TRIG IN
I OUT
Q OUT
DCS1 TRIG0
DCS1 TRIG1
DCS1 TRIG2
PSO2 TRIG OUT
DSP TRIG IN
DB-25
DCS1 SER A, B
DB-9
DCS2 SER A, B
DB-9
AMB LITE
MOD
ON/OFF
AUDIO IN (FP)
FRONT
PANEL
SIGNALING SOURCE &
ANALYZER
MOD
DIST
AUDIO OUT
(FP)
AUDIO 1
AUDIO 2
HOST SER 1
DB-9
HOST SER 2
DB-9
GP
HPIB
GPIB
PARALLEL 1
DB-25
MEAS
10 MHz OUT
MEM/
SBRC
PCMCIA
CDMA CLOCK MUX OUT
DCU
KYBD
DISPLAY
DRIVE
HPIB/
GP
SERIAL
GP
HPIB
PARALLEL 1
HOST SER 1
HOST SER 2
SA TRIG
19.6608 MHz OUT
REF IN
MONITOR OUT
LINE
POWER
SUPPLY
MOD IN
REGULATOR
COMPOSITE VIDEO
EVEN SEC SYNC IN
SA TRIG
DISPLAY
REAR PANEL
Signal Flow and Interconnections
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
DUPLEX
Block Diagrams
Signal Flow and Interconnections
Figure 8-1
252
ANTENNA
RF IN/OUT
Block Diagrams
RF Input/Output Section
RF Input/Output Section
RF Power Measurement
An RF power measurement can only be made by supplying a signal to
the RF IN/OUT port of the Test Set. See Figure 8-2, “RF I/O,” on page
254. A power splitter then splits the signal between an RF analysis
path and a power measurement path. The power detector has a direct
path to the Receive DSP where average power measurements are made.
There’s also a diode peak detector to provide a peak power
measurement through the Measurement assembly.
Accuracy is insured by factory-generated calibration data which is
stored in CAL ROM.
Input Gain Control
Step attenuators in the RF Input/Output Section are switched in and
out, manually or automatically. This keeps the input level within an
optimum range for the mixers, IF amplifiers, and detectors.
253
Block Diagrams
RF Input/Output Section
Figure 8-2
254
RF I/O
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
RF Analyzer Section
RF Analyzer Section
Frequency Conversion
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
The Downconverter, see Figure 8-3 on page 257, produces an IF of
114.3, 385.7 or 614.3 MHz. The LO is provided by the Receiver
Synthesizer, see Figure 8-4 on page 258. The IF frequencies developed
are as follows in Table 8-2.
Table 8-2
Tune
Frequency
(MHz)
Downconverter Signal Paths
RF Filter
IF
Frequency
(MHz)
Conversion
Module
LO Filter
(LO freq
range)
RSYN_500_
1000M Range
(MHz)
.4 to <150
150 MHz LPF
614.3
high-side LO
NA
614.7-764.3
150 to
<380.7
150-386 MHz
BPF
614.3
high-side LO
NA
764.3-995.0
380.7 to
<650
350-650 MHz
TBPF
114.3
high-side LO
NA
945.0-764.3
650 to <800
600-1000 MHz
TBPF
114.3
high-side LO
NA
764.3-914.3
800 to 1000
600-1000 MHz
TBPF
114.3
low-side LO
NA
685.7-885.7
1400 to
<1614.3
1400-2200 MHz
TBPF
385.7
high-side LO
PDC/Unlic_PCS
(1600-2000
MHz)
892.85-1000.0a
1614.3 to
2000
1400-2200 MHz
TBPF
385.7
low-side LO
PCS
(1200-1620
MHz)
614.3-807.15b
>2000 to
2200
1400-2200 MHz
TBPF
385.7
low-side LO
PDC/Unlic_PCS
(1600-2000
MHz)
807.15-907.15c
a. This LO input is doubled to 1785.7-2000 MHz prior to mixing.
b. This LO input is doubled to 1228.6-1614.3 MHz prior to mixing.
c. This LO input is doubled to 1614.3-1814.3 MHz prior to mixing.
255
Block Diagrams
RF Analyzer Section
Filters are automatically switched in to remove image and other
interfering signals. The frequency ranges of the filters are as follows:
•
•
•
•
•
150 MHz low-pass
150 MHz - 386 MHz bandpass
350 MHz - 650 MHz tunable bandpass
650 MHz - 1000 MHz tunable bandpass
1400 MHZ - 2200 MHz tunable bandpass
Modulation Measurement
The Receiver assembly, see Figure 8-5 on page 259, demodulates the IF
into its FM, AM, and SSB components. The demodulated signal is sent
to the Audio Analyzer section for measurement.
256
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
RF Analyzer Section
to RCVR SYNTH
P1-3
Downconverter
to RF I/O
J5
Figure 8-3
257
Block Diagrams
RF Analyzer Section
Receiver Synthesizer
to Downconverter
Figure 8-4
258
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
RF Analyzer Section
to
LO/IF DEMOD
Receiver
RECEIVER
Figure 8-5
259
Block Diagrams
RF Analyzer Section
Figure 8-6
Digital Cellsite 1 & 2
from PROTOCOL
PROCESSOR
FIFO (pin 12)
from LO/IF/DEMOD
to
ANALOG
CELL
from PROTOCOL
PROCESSOR
PROTO RESET (pin 2)
to
ANALOG
CELL
260
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
RF Analyzer Section
Figure 8-7
Analog Cell Site (FW Rev A.04.54 and below)
from
DIGITAL
CELLSITE 1
from
DIGITAL
CELLSITE 2
261
Block Diagrams
RF Analyzer Section
Figure 8-8
Analog Cell Site (FW Rev A.05.03 and above)
ANALOG CELL SITE
/
Chan 0
8
/
Chan 4
/
Chan 5
LPF
CS2M1IQ
/
Chan 6
CS2M4IQ
/
Chan 7
8
8
8
16xChip
Clk
Sync
Cntl
I_OUT_RP
TO REAR
PANEL
14
EEPROM
DAC
Q_OUT_RP
8
HOST
SERIAL
CS2M4IQ
TERM_SW_DRV
N_PP2S
16xChip
/
8
/
8
CS2M3IQ
8
/
CS2M2IQ
THRU_SW_DRV
SW Drive
Control
EEPROM
FROM
DIGITAL
CELLSITE 2
8
/
8
/
/
CS2M1IQ
CS1M4IQ
CS1M3IQ
8
/
CSA_DIAG
Serial
I/O
MUX
Clk
Sync
Cntl
Chan 7
Chan 6
Chan 5
Serial
I/O
Chan 4
Chan 1
/
Chan 2
Chan 3
8
/
FROM
DIGITAL
CELLSITE 1
CS1M2IQ
CS1M1IQ
Q_OUTPUT
/
14
Address
DAC
N_PP2S
IQ_SAS
LPF
LPF
CS2M3IQ
Data
HOST
SERIAL
8
AWGN &
SIN/COS
ROM
ANALOG CELL SITE
FROM
DIGITAL
CELLSITE 2
DAC
14
MUX
CS2M2IQ
/
CSA_DIAG
CS1M4IQ
S/agilent/e8285/alr/book/graphics/analog_cellsite_new.eps
Chan 1
8
TERM_SW_DRV
/
TO IQ_MOD
ASSY
14
Q_OUTPUT
I_OUTPUT
CS1M3IQ
/
THRU_SW_DRV
Chan 2
8
SW Drive
Control
/
Chan 0
FROM
DIGITAL
CELLSITE 1
TO REAR
PANEL
Chan 3
I_OUT_RP
/
8
CS1M2IQ
I_OUTPUT
LPF
DAC
IQ_SAS
TO IQ_MOD
ASSY
CS1M1IQ
Address
AWGN &
SIN/COS
ROM
Q_OUT_RP
Data
S/agilent/e8285/alr/book/graphics/analog_cellsite_new.eps
262
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
RF Analyzer Section
Figure 8-9
Protocol Processor
to
DIGITAL CELLSITE
to
DIGITAL CELLSITE
263
Block Diagrams
Spectrum Analyzer
Spectrum Analyzer
Spectrum Analysis (option 102)
The LO on the Spectrum Analyzer, see figure 8-10 on page 265, is
swept across the span by the Controller. The LO starts sweeping when
the oscilloscope circuits on the Measurement board trigger the display
sweep to start. As the LO sweeps, the spectrum analyzer filters and
then amplifies the IF signal in a logarithmic detector so the signal
voltage will be proportional to the log of power. The signal voltage is
measured by a sampler on the Measurement board and displayed.
Spectrum analyzer resolution bandwidth is determined by switching
bandwidth IF filters on the Spectrum Analyzer. These filters are set by
the Controller as a function of the span selected from the front panel.
264
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
Spectrum Analyzer
Spectrum Analyzer
from
LO/IF/DEMOD
Figure 8-10
265
Block Diagrams
Audio Analyzer Section
Audio Analyzer Section
Input Level Control
Switchable gain amplifiers on the Audio Analyzer 1 and Audio
Analyzer 2 (figure 8-11 on page 267, and figure 8-12 on page 268)
assemblies keep the audio input signal within a range suitable for the
detectors.
AC and DC Level Measurements
Detected voltages from the Peak+, Peak −, and RMS detectors are
measured on the Measurement assembly. The Controller calculates the
displayed value taking into account the detector selected from the front
panel, the gain of the amplifiers, and the source of the input signal
(demodulators, front panel).
Distortion and SINAD Measurements
Distortion and SINAD can be measured on 300 Hz to 10 kHz audio
signals. The Controller calculates distortion and SINAD by comparing
the ratio of the voltage after the variable notch filter to the ratio of the
voltage before the notch filter.
Oscilloscope Functions
The Test Set has no specialized oscilloscope assemblies. The and Audio
Analyzer assemblies, Measurement assembly (figure 8-13 on page 269),
and the Controller (figure 8-27 on page 289) work together to perform
the oscilloscope functions.
The audio or dc signal to be displayed goes from the Audio Analyzer 2
assembly to a sampler on the Measurement assembly (the same
sampler used by the Spectrum Analyzer). The Controller calculates the
display level by taking the value of the measured signal at each point of
the sweep, the gain of the signal path in the Audio Analyzer assemblies,
and the volts-per-division setting.
The oscilloscope’s trigger signals from the side-panel connector, the
Signaling Source and Analyzer assembly (figure 8-19 on page 277), and
the internal trigger signal are used by the Measurement assembly and
the Controller to determine when to start the scope sweep. The
Controller adds the pre-triggering time entered from the front panel.
266
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
Audio Analyzer Section
from MOD.
DISTRIBUTION
to AUDO ANAL. 2
to AUDO ANAL. 2
Audio Analyzer 1
to AUDO ANAL. 2
Figure 8-11
267
Block Diagrams
Audio Analyzer Section
Audio Analyzer 2
268
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
from
AUDIO
ANALOG 2
from MOD.
DISTRIBUTION
from AUDIO ANALOG 2
audio-anal2.eps
Figure 8-12
Block Diagrams
Audio Analyzer Section
Figure 8-13
Measurement Board
269
Block Diagrams
Audio Analyzer Section
Figure 8-14
270
Signaling and Analyzer Assembly
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
CDMA Analyzer Section
CDMA Analyzer Section
IF Conversion
To downconvert the CDMA the signal, the 114.3 MHz IF is mixed with
a 110.6136 MHz LO to produce a 3.6864 MHz IF in the IQ Modulator
assembly, see figure 8-15 on page 272. The oscillator that produces the
LO signal is phase locked to a 10 MHz signal from the CDMA Reference
assembly, see figure 8-18 on page 276.
CDMA Signal Analysis
The 3.6864 MHz signal goes to the DSP assembly. The DSP assembly
analyzes the 3.6864 MHz signal to make IQ modulation measurements,
such as rho, timing accuracy, carrier feedthrough, and phase error.
Power Measurements
The DSP assembly also makes average power measurements through a
direct link from the RF Input/Output assembly (figure 8-2 on page
254).
271
Block Diagrams
CDMA Analyzer Section
IQ Modulator
from
SIG GEN SYNTH
Figure 8-15
272
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
CDMA Analyzer Section
TO SPEC ANAL
LO/IF/Demodulator
from
RECEIVER
Figure 8-16
273
Block Diagrams
CDMA Analyzer Section
Figure 8-17
274
Digital Signal Processor 1 (DSP1)
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
CDMA Generator Section
CDMA Generator Section
Data Generation
The Digital Cellsite assembly, see figure 8-6 on page 260, generates or
buffers external data that emulates a CDMA traffic channel and
outputs this data to the CDMA Reference, see figure 8-18 on page 276.
The CDMA Reference assembly converts the data into I and Q drive
signals and sends it back to the Digital Cellsite assembly to be summed
with calibrated noise sources. The signals are then passed to the
IQ Modulator (figure 8-15 on page 272) for modulation with RF.
CDMA Reference
The CDMA Reference supplies all the CDMA clocks for the Receive DSP
and the Digital Cellsite assemblies. The CDMA Reference also provides
reference switching for an external or the internal reference source.
275
Block Diagrams
CDMA Generator Section
276
CDMA Reference
DIGITAL CS
10 MHz TO (OPT) VOCODER
Figure 8-18
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
Audio Generator Section
Audio Generator Section
Waveform Generation
The Signal Source and Analyzer, see figure 8-19 on page 277, gets
frequency and wave shape information from the Controller. Waveform
values are calculated real-time by a digital waveform synthesis IC. The
LFS1 output is always a sine-wave. The LFS2 output is a sine-wave
unless one of the function generator waveforms is selected, or signaling
is selected from the front panel.
Level Control
Audio level is controlled by the Modulation Distribution assembly, see
figure 8-20 on page 278, by using a DAC and variable attenuators. The
leveled audio signal is passed on to the RF Generator section.
Figure 8-19
Signaling and Analyzer Assembly
277
Block Diagrams
Audio Generator Section
Modulation Distribution
278
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
FROM
SIG SOURCE
FROM
SIG SOURCE
TO AUDIO
ANALYZERS 1 & 2
Figure 8-20
Block Diagrams
RF Generator Section
RF Generator Section
Frequency Generation
NOTE
Test Sets with firmware revision A.04.5X and above operate only at RF
frequencies from 800 to 1000 MHz and 1700 to 2000 MHz. A text only error
message “Input value out of range”, will be displayed if invalid
frequencies are set.
The Signal Generator Synthesizer (figure 8-21 on page 281) develops a
500 MHz to 1000 MHz signal which is phase-locked to the 200 kHz
reference from the Reference Assembly (figure 8-24 on page 285). An
out-of-lock indicator LED lights if the phase-lock-loop is out-of-lock.
When you turn the Test Set’s power on, the LED lights for a few seconds
then goes out. If it stays on or comes on again, the loop is out-of-lock.
The RF Output Section assembly (figure 8-22 on page 282) develops the
RF Generator’s 30 to 2000 MHz frequency range by mixing, dividing, or
passing the 500 MHz to 1000 MHz from the Signal Generator
Synthesizer. The frequencies are derived as shown in table 8-3.
The Upconverter assembly (figure 8-23 on page 283) develops the RF
generator’s 1.7 to 2.0 GHz range by mixing the 800-1000 MHz signal
from the output section with a 1.5-3.0 GHz LO.
Table 8-3
Output Frequency
Derivation
30 MHz - 250 MHz
mix
250 MHz - 500 MHz
divide
500 MHz - 1 GHz
pass
1.7 GHz - 2.0 GHz
mix
Level Control
The RF Output Section assembly (figure 8-22 on page 282) has an
automatic-level-control (ALC) loop that acts as a vernier control of RF
level between −2 and +9 dBm. A step attenuator in the RF I/O assembly
(figure 8-2 on page 254) takes the level down to −127 dBm (−137 dBm
at the RF IN/OUT connector) in 5 dB steps.
Assemblies that affect output level calibration have factory-generated
calibration data stored in the Test Set’s EEPROM. Calibration data is
fed to digital-to-analog-converters which control level-adjustable
devices in the RF path. These assemblies are:
• RF I/O
279
Block Diagrams
RF Generator Section
• RF Output Section
Modulation
Amplitude modulation (AM) is done on the RF Output Section assembly
(figure 8-22 on page 282). The modulating signal from the Modulation
Distribution assembly is applied to the ALC loop’s control voltage.
IQ modulation is done on the IQ Modulator assembly (figure 8-15 on
page 272 Digital Cellsite is modulated onto the RF signal from the
Signal Generator Synthesizer assembly (figure 8-21 on page 281).
280
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
RF Generator Section
Signal Generator Synthesizer
TO IQ MOD.
Figure 8-21
281
Block Diagrams
RF Generator Section
RF Output Section
FROM
IQ MOD.
Figure 8-22
282
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
RF Generator Section
Figure 8-23
Upconverter
283
Block Diagrams
Reference/Regulator Section
Reference/Regulator Section
Reference
All frequencies are derived from a 10 MHz reference which can come
from an external reference or from a 10 MHz crystal oscillator on the
Reference assembly (figure 8-24 on page 285). The High Stability
Reference assembly develops the local oscillator (LO) and reference
signals needed by the assemblies that make up the RF generator, RF
analyzer, spectrum analyzer, and the Measurement assembly.
Power Supply Regulator
Power supply regulators (figure 8-25 on page 286) are distributed to all
of the modules and assemblies by the Power Supply Regulator assembly
through the motherboard.
Power Supply
The Power Supply assembly is a switching type supply. The power
supply generates five different dc supplies. They are:
•
•
•
•
•
+5.5 Vdc
+13.4 Vdc
−13.4 Vdc
+43.5 Vdc
−12 Vdc AUX
Power Supply voltages are distributed to all of the modules and
assemblies through the motherboard.
284
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
Reference/Regulator Section
High Stability Reference
REFERENCE
Figure 8-24
285
Block Diagrams
Reference/Regulator Section
Figure 8-25
286
Regulator
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
Instrument Control Section
Instrument Control Section
Digital Control
The Test Set’s digital control is driven by two assemblies:
• Memory/SBRC
• Controller
The controller receives user control information by either the control
interface or by the front panel. Operating firmware on the
Memory/SBRC (figure 8-26 on page 288) is then used by the Controller
(figure 8-27 on page 289) assembly to generate digital control for the
Test Set. The digital control bus information is passed back to the
Memory/SBRC assembly which controls most of the Test Set’s modules
and assemblies.
Display
The Test Set’s display data is first generated by the Controller and then
passed on to the Display Driver (figure 8-28 on page 290). The Display
Driver converts the digital information into analog vertical and
horizontal drive signals for the display. The Display Driver drive also
provides brightness and contrast signals for the display.
287
Block Diagrams
Instrument Control Section
Memory SBRC
FROM
DCV
FROM
DCV
TO
KEYBOARD
FROM
DCV
Figure 8-26
288
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
Block Diagrams
Instrument Control Section
Figure 8-27
Controller
289
Block Diagrams
Instrument Control Section
290
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
RESET FROM DCV
TO REAR PANEL
CRT MEAS_BUS FROM DCV
Display Driver
INTERRUPTS FROM DCV
Figure 8-28
Block Diagrams
GPIB Serial
GPIB Serial
GPIB/Serial
GPIB/Serial
GPIB/Serial
GPIB
Figure 8-29
291
Block Diagrams
GPIB Serial
292
S:\agilent\e8285\ALR\Book\chapters\blockdiag.fm
9
Service Screen
This chapter describes the SERVICE screen as a diagnostic aid for the
Test Set.
293
Service Screen
Troubleshooting with the SERVICE Screen
Troubleshooting with the SERVICE Screen
The SERVICE screen, see Figure 9-1 on page 295, uses the internal
voltmeter and frequency counter functions to monitor specific nodes in
most assemblies. A large number of latch and DAC settings used
throughout the Test Set can also be read and/or set to alter standard
operation. These functions are primarily intended to allow the
automated internal diagnostic routines to verify proper instrument
operation, and to allow the periodic adjustment routines (PER_CAL3,
CDMA_CAL, and PCB_CAL) to modify Test Set operation.
Access to these functions under manual control is provided to allow
further troubleshooting when the diagnostics cannot isolate a failure to
a specific assembly. To do this, you must understand how to operate the
Test Set and, especially, understand how the assemblies in the Test Set
work together.
Detailed manual Test Set operation is provided in the Agilent
Technologies E8285A User’s Guide. Refer to Chapter 8, “Block
Diagrams,” on page 249 for information on how the overall instrument
and each module work.
How to Access the SERVICE Screen
1. Press Preset key.
2. Press the Config key on the Test Set to access the CONFIGURE
screen, see Figure 9-1 on page 295.
3. Select the SERVICE field in bottom-right corner of the screen.
Field Names and Descriptions
Voltmeter Connection
This field (see Figure 9-1) selects the desired circuit node for voltage
measurements. To change the voltmeter connection, move the cursor in
front of the Voltmeter Connection field and push the cursor control
knob. A Choices menu will appear. Move the cursor to the desired
circuit node in the list and push the cursor control knob. The reading is
displayed in the Voltage measurement field at the top left of the
display.
Because the diagnostic MUX points being measured must be in the
range of 0 to ±5 volts, the measurement of some points are scaled to
that measurement range. For example; the +12 Volt reference
(MEAS_12V_REF should measure about +5volts. The –12 Volt reference
(MEAS_NEG_12V_REF should measure about –5 volts. Many of the
voltage measurements are only valid after a number of instrument
settings are changed.
294 S:\agilent\e8285\ALR\Book\chapters\service_scrn.fm
Service Screen
Troubleshooting with the SERVICE Screen
When run, the diagnostic routines make the necessary circuit changes
and measurements automatically, comparing the measurements to
known limits for each node.
Figure 9-1
CONFIGURE and SERVICE Screens
Counter Connection
This field selects the desired circuit node to connect to the Test Set’s
internal frequency counter. The reading is displayed in the Frequency
measurement field at the top right of the display.
295
Service Screen
Troubleshooting with the SERVICE Screen
To change the counter connection, move the cursor in front of the
Counter Connection field and push the cursor control knob. A
Choices menu will appear, then move the cursor to the desired circuit
node and push the cursor control knob.
Gate Time
This field is used to adjust the Test Set’s internal frequency counter’s
gate time. A shorter gate time may enable you to see frequency
fluctuations that might not be seen using a longer gate time.
To change the gate time, move the cursor in front of the Gate Time
field and push the cursor control knob. Rotate the cursor control knob
until the desired gate time (10 to 1000m in 10m increments) is
displayed, then press the cursor control knob.
Latch
This field is used to manually alter the circuit latches that control
switch, DAC, and gain settings within the Test Set. The value of the
selected latch is displayed and changed in the Value field. Some
settings are read-only.
To set a switch, DAC, or gain setting:
1. Move the cursor in front of the Latch field and push the cursor
control knob. A Choices menu will appear.
2. Move the cursor to the desired latch name and push the cursor
control knob.
3. Move the cursor in front of the Value field and push the cursor
control knob.
4. Rotate the cursor control knob to modify the value (hexadecimal).
NOTE
If any of the switches, DACs, or gain settings are changed with the
Latch field, the Test Set will generate the message ”Direct latch
write occurred. Cycle power when done servicing.”To clear
this message, cycle the Test Set’s power. Upon power-up, the internal
controller will return the Test Set to its default settings and values.
The first part of the names in the Choices menu relates to the
assembly where the switch, DAC, or gain setting is located. Some latch
names are not listed here.
• dstr: Modulation Distribution
• aud1: Audio Analyzer 1
• aud2: Audio Analyzer 2
• refs: Reference
• inpt: Input
296 S:\agilent\e8285\ALR\Book\chapters\service_scrn.fm
Service Screen
Troubleshooting with the SERVICE Screen
• out: Output
• rcvr: Receiver
• gsyn: Signal Generator Synthesizer
• rsyn: Receiver Synthesizer
• spec: Spectrum Analyzer
• meas: Measurement
• metron: Measurement
• afg1: Signaling Source/Analyzer
• afg2: Signaling Source/Analyzer
• sgnl: Displays version number of the Signaling Source/Analyzer
firmware.
• cellSite1: Cell Site 1 Digital board
• cellSite2: Cell Site 2 Digital board
• cdmaRef: CDMA Reference
• iq_mod: I/Q Modulator
• loif: LO/IF Demod
• main_dsp: Main DSP Receiver
• aux_dsp: optional DSP Receiver
• protocol: Protocol Processor
Value (hex)
This field displays and changes the value for the latch shown in the
Latch field.
RAM Initialize
Selecting this field clears all SAVE registers and test programs, and
any initialized RAM disk(s), that may be in RAM. It also resets all
latches to their factory power-up configuration. If you have saved one or
more instrument setups using the SAVE function, using this function
will permanently remove them.
297
Service Screen
Troubleshooting with the SERVICE Screen
298 S:\agilent\e8285\ALR\Book\chapters\service_scrn.fm
Index
A
AC Level Accuracy (AF Analyzer)
performance test, 171
AC Level Accuracy (AF
Generator) performance test,
167
adjustments. See periodic
adjustments
AF Diagnostics. See diagnostics
Amplitude Accuracy
(Oscilloscope) performance
test, 177
Amplitude Level Accuracy
DUPLEX OUT (CDMA
Generator) performance test,
192
Amplitude Level Accuracy RF
IN/OUT (CDMA Generator)
performance test, 190
Analog Cellsite assembly, 33
Analog Cellsite assembly, block
diagram, 261
Analog Loopback verification test,
114
ANTENNA IN connector, 30
assemblies
locating, 89
top-side, 89
AUD MONITOR OUTPUT
connector, 31
Audio Analyzer 1 assembly, 31
Audio Analyzer 1 Offset
adjustment, 134
Audio Frequency Generator Gain
adjustment, 133
AUDIO IN connector, 31
Average Power Level Accuracy
(CDMA Analyzer)
performance test, 196
Index
B
battery replacement, 92
battery, Memory assembly, 92
battery, Regulator assembly, 92
block diagrams, 251
Boot Code, 91
Boot ROM replacement, 91
C
calibration
overview, 38
calibration. See periodic
adjustments
calibration data, 91
downloading, 85
how to recover, 74, 126
loss of, 74, 126
storage locations, 127
troubleshooting, 74, 126
calibration factors, 129
calibration procedures, 118
carrier feedthrough, minimizing,
137
CDMA analysis diagram, 32
CDMA Diagnostics. See
diagnostics
CDMA Mobile Phone Functional
Test, 121
CDMA Signal Analysis, 32
Channel Power Calibration, 120
Channel Power Level Accuracy
(CDMA Analyzer)
performance test, 198
Channel Power Loopback
verification test, 117
clearing RAM, 81, 297
codes. See failure codes
connectors, torque settings, 84
Control Interface assembly, 28
controller, replacing, 91
Counter Connection field,
SERVICE screen, 79
covers, removing external and
internal, 87
299
Index
D
DACs
IQ, 137
settings, 81
timebase reference, 135
DC Level Accuracy (AF Analyzer)
performance test, 174
DC Level Accuracy (AF
Generator) performance test,
168
demodulation diagram, 31
diagnostic error messages, 68
diagnostic self-test LED codes, 53
diagnostics
AF Diagnostics
accessing, 64
All Audio Tests, 64
Audio Analyzer 1 External
Paths, 64
Audio Analyzer 1 Internal
Paths, 64
Audio Analyzer 2, 64
Audio Frequency Generators 1
and 2, 64
Mod Distribution External
Paths, 64
Mod Distribution Internal
Paths, 64
Preliminary Audio Paths, 64
CDMA Diagnostics
accessing, 67
Functional Diagnostics
accessing, 58
Analog Modulation, 63
CDMA Loopback, 63
Power Supplies, 63
RF Modules, 63
Self-Test, 63
RF Diagnostics
accessing, 65
All RF Tests, 65
Down Converter, 65
Output, 65
Receiver, 65
Receiver Synthesizer, 65
Reference, 65
RF Input/Output, 65
Signal Generator Synthesizer,
65
Spectrum Analyzer, 65
Upconverter, 65
diagnostics tests, 118
Digital Cellsite assemblies, 32, 33
Digital Cellsite assembly, block
diagram, 260
disassembly and replacement, 87
300
Distortion and SINAD (AF
Analyzer) performance test,
173
downloading calibration data, 85
E
enhancements
firmware, 42
hardware, 42
error codes. See failure codes
error messages
"Autostart Test Procedure on
Power-Up", 49
"Change Ref Level, Input Port or
Attenuator...", 68
"Direct latch write occurred...",
68
"ERROR 173 IN XXXX
Active/system...", 68
"Printer does not respond", 68
diagnostic, 68
time-outs, 69
External Modulation Path Gain
adjustment, 134
Index
Index
F
failure codes
diagnostic (displayed), 51
diagnostic (returned over
GPIB), 51
See Also LEDs
failures
power up, 48
self-test, 48
firmware enhancements, 42
flowchart, troubleshooting, 47
FM Accuracy (RF Analyzer)
performance test, 180
FM Accuracy (RF Generator)
performance test, 149
FM Bandwidth (RF Analyzer)
performance test, 184
FM Distortion (RF Analyzer)
performance test, 182
FM Distortion (RF Generator)
performance test, 146
FM Flatness (RF Generator)
performance test, 152
Frequency Accuracy (AF
Generator) performance test,
170
Frequency Accuracy at 400 kHz
(AF Analyzer) performance
test, 176
Frequency Accuracy to 100 kHz
(AF Analyzer) performance
test, 175
frequency references, 28
front panel
disassembly, 99
wiring, 99
Functional Diagnostics. See
diagnostics
Functional Verification Test
Record, 123
fuse, 49
Index
G
Gate Time field, SERVICE screen,
80
H
handles, removing, 87
Harmonics Spectral Purity (RF
Generator) performance test,
163
301
Index
I
I/Q Modulator assembly, 33
IBASIC controller, 27
IF frequencies, 255
Image Rejection (Spectrum
Analyzer) performance test,
188
internal covers, top and bottom,
87
IQ Calibration adjustment
description, 137
selecting and running, 130
IQ modulation, 33
302
L
Latch field, SERVICE screen, 81
latches
DAC, 81
gain, 81
switch, 81
timebase, 135
LEDs
diagnostic codes, 53
failure codes, 48
out-of-lock indicators, 72
power supply, 49
Level Accuracy (RF Analyzer)
performance test, 179
Level Accuracy (RF Generator)
performance test, 158
LO/IF Demodulation assembly,
32
locating assemblies, 89
M
Modulation Accuracy (CDMA
Generator) performance test,
194
modulation analysis, 31
Modulation Distribution
assembly, 33
module swap. See troubleshooting,
assembly swap
modules, locating, 89
Index
Index
P
parts list, 105
PC boards, locating, 89
performance test record, 201–247
performance tests
AC Level Accuracy (AF
Analyzer), 171
AC Level Accuracy (AF
Generator), 167
Amplitude Accuracy
(Oscilloscope), 177
Amplitude Level Accuracy
(CDMA Generator), 190
Average Power Level Accuracy
(CDMA Analyzer), 196
Channel Power Level Accuracy
(CDMA Analyzer), 198
DC Level Accuracy (AF
Analyzer), 174
DC Level Accuracy (AF
Generator), 168
Distortion (AF Analyzer), 173
equipment required, 142
FM Accuracy (RF Analyzer),
180
FM Accuracy (RF Generator),
149
FM Bandwidth (RF Analyzer),
184
FM Distortion (RF Analyzer),
182
FM Distortion (RF Generator),
146
FM Flatness (RF Generator),
152
Frequency Accuracy (AF
Generator), 170
Frequency Accuracy to 100 kHz
(AF Analyzer), 175
Frequency Accuracy to 400 kHz
(AF Analyzer), 176
Harmonics Spectral Purity (RF
Generator), 163
how to use, 142
Image Rejection (Spectrum
Analyzer), 188
Level Accuracy (RF Analyzer),
179
Level Accuracy (RF Generator),
158
Modulation Accuracy (CDMA
Generator), 192, 194
recommended interval, 38, 142
Residual Distortion (AF
Generator), 169
Residual FM (RF Analyzer), 186
O
operating system, 28
Output assembly, 33
Index
Residual FM (RF Generator),
155
Residual Noise (AF Analyzer),
172
SINAD Accuracy (AF Analyzer),
173
Spurious Spectral Purity (RF
Generator), 165
performance verification
overview, 38
periodic adjustments
accessing, 128
Audio Analyzer 1 Offset, 134
Audio Frequency Generator
Gain, 133
External Modulation Path Gain,
134
IQ Calibration, 137
location of voltmeter
connections, 133
selecting and running, 130
system power calibration
program (SYSPWR0), 39
Timebase Reference Using a
Counter, 132
Timebase Reference Using a
Source, 132
Variable Frequency Notch
Filter, 134
Voltmeter References, 133
periodic calibration
recommended interval, 38
See Also periodic adjustments
phone (CDMA mobile) test,
functional, 121
power supply
LEDs, 49
removing, 102
test points, 50
power supply regulator See
Regulator assembly
power-up diagnostics, 48
power-up failures, 49
printer setup, 60
process efficiency
recommendations, 113
Protocol Processor assembly, 32
303
Index
R
RAM Initialize field, SERVICE
screen, 81
RAM, clearing, 81
Rcvr Synth assembly
troubleshooting, 73
Receive DSP assembly, 32
Received Signal Downconversion
diagram, 30
Reference assembly, 30, 33
troubleshooting, 73
references, frequency, 28
Regulator assembly, 284
repair process overview, 37
replacing batteries, 92
Residual Distortion (AF
Generator) performance test,
169
Residual FM (RF Analyzer)
performance test, 186
Residual FM (RF Generator)
performance test, 155
Residual Noise (AF Analyzer)
performance test, 172
RF analysis path, 30
RF analyzer, troubleshooting, 75
RF Diagnostics. See diagnostics
RF generation path diagram, 35
RF IN/OUT connector, 30
RF IN/OUT port, 34
RF signal generation, 33
RF source, troubleshooting, 77
ROM, (boot) replacement, 91
304
S
save/recall register, 49
self-test diagnostics, 48
self-test failures, 48
SERVICE screen, 294
accessing, 79
Counter Connection field, 79
field names and descriptions,
294
Gate Time field, 80
Latch field, 81
RAM Initialize field, 81
Value (hex) field, 81
Voltmeter Connection field, 79
Service Screen, 294
accessing, 294
SERVICE7
diagnostics
loading, 58
menu, 61
See Also diagnostics
IQ calibration
accessing, 130
loading, 130
periodic calibration
accessing, 130
loading, 130
Signal Generator Synthesizer
assembly, 33
troubleshooting, 73
Signaling Source Analyzer
assembly, 31
Signaling Source and Analyzer
(A15), 31
SINAD Accuracy (AF Analyzer)
performance test, 173
speaker, internal, 31
Spectrum Analyzer assembly, 32
Spurious Spectral Purity (RF
Generator) performance test,
165
swapping assemblies, 74
SYSPWR0 program
accessing, 39
loading, 39
part number, 39
T
test equipment
for performance tests, 142
overview for adjustments, 128
test points
power supply, 50
voltmeter reference, 133
test record, 201–247
test record, functional
verification, 123
test set description, 26
theory of operation, 28
audio analyzer, 266
audio generator, 277
CDMA analyzer, 271
CDMA generator, 275
digital control, 287
display, 287
oscilloscope, 266
power supply, 284
reference, 284
RF generator, 279
spectrum analyzer, 256
timebase DACs, 135
Timebase Reference Using a
Counter adjustment, 132
Timebase Reference Using a
Source adjustment, 132
time-outs, 69
tools, 84
See Also equipment
top-side assemblies, 89
torque settings
connectors, 84
troubleshooting
assembly swap, 74
calibration data, 74
flow chart, 47
manual procedures, 70
overview, 36
Receiver Synthesizer assembly,
73
Reference assembly, 73
RF analyzer, 75
RF source, 77
Signal Generator Synthesizer
assembly, 73
using the SERVICE screen, 294
Index
Index
V
Value (hex) field, SERVICE
screen, 81
Variable Frequency Notch Filter
adjustment, 134
video output signal, 50
Voltmeter Connection field,
SERVICE screen, 79
Voltmeter References adjustment,
133
VOLUME control, 31
Index
W
Wideband Sweep verification test,
116
305
Was this manual useful for you? yes no
Thank you for your participation!

* Your assessment is very important for improving the work of artificial intelligence, which forms the content of this project

Download PDF

advertisement