Digital Serial Analyzer Sampling Oscilloscope
Digital Serial Analyzer Sampling Oscilloscope
DSA8200 Data Sheet
Jitter, Noise, BER, and Serial Data Link Analysis
Measures and Separates Deterministic Data-dependent Jitter from
Random Jitter
Measures Vertical Noise, Separating Deterministic Data-dependent
Noise from Random Noise
Highly Accurate BER and Eye Contour Estimation, Support for
DDPWS
FFE/DFE Equalization, Transmitter Equalization
Channel Emulation for Channels with >30 dB of Loss
Linear Filter for Fixture De-embedding, Linear Filtering
Features & Benefits
State-of-the-Art Sampling Oscilloscope for Communication Signal
Analysis, TDR / TDT / Serial Data Network Analysis, Acquisition, and
Measurements of Repetitive Ultrafast Signals
Acquisition of Spread Spectrum Clocking (SSC) Signals
Industry’s Only Mainframe to Support up to 8 Input Channels for
Increased Flexibility and Throughput
Four Color-graded, Variable Persistence Waveform Databases
Measurement System with Over 100 Automated Measurements
Complete Suite of Communications Measurements includes Both
Types of OMA, SSC Profile, and Many Others
Automated ITU/ANSI/IEEE Mask Testing
Masks and Measurements for SONET/SDH, FC, Ethernet, and Other
Standards Built-in
Mask Updates can be Loaded from Factory-supplied File
Mask Margin Testing for Guard Banding Production Testing
Acquisition Modules
Fully Integrated Multirate Optical Modules
Optical Modules up to 80 GHz 80C10B
High-accuracy "ER Calibrated" Measurement Available in Some
Modules
Electrical Modules up to 70+ GHz Bandwidth and 5 ps Measured Rise
Time (10-90%)
Flexible Rate Clock Recovery
Clock Recovery with SSC (Spread Spectrum Clocking) Support
Available
TDR (Time Domain Reflectometry)
Up to 50 GHz TDR Bandwidth with 15 ps Reflected Rise Time and
12 ps Incident Rise Time
Lowest Noise for Accurate Repeatable TDR Measurement Results –
600 μVRMS at 50 GHz
Independent Sampler Deskew ensures Easy Fixture and Probe
De-embedding
Industry’s Only Mainframe to Accommodate up to Four
True-differential TDR or Electrical Channel Pairs for Increased
System Versatility
S-parameters Measurements
Up to 50 GHz Differential, Single Ended, Mixed Mode; Insertion,
Return Loss, Frequency Domain Crosstalk
PCI Express, Serial ATA, Infiniband, Gigabit Ethernet Manufacturing,
and Standard Compliance Testing for Gigabit Signal Path and
Interconnects – Including Eye Mask Tests
Intuitive, Easy, and Accurate for Serial Data, Gigabit Digital Design,
and Signal Integrity
Fast and Accurate Automated Multiport S-parameter Measurements
with Command Line Interface
Industry’s Best Standard Time-base Jitter Performance, 800 fsRMS
Industry-leading Time-base Jitter Performance, <200 fsRMS*1 Available
with Phase Reference Mode
Fast Acquisition Rate and High Throughput
True-differential Remote Sampler enabling Placement Near DUT for
Superior Signal Fidelity
FrameScan™ Acquisition Mode with Eye Diagram Averaging:
Isolate Data-dependent Faults
Examine Low-power Signals
MS Windows XP Operating System
Advanced Connectivity to 3rd party Software
Data Sheet
Applications
Design/Verification of Telecom and Datacom Components and Systems
Manufacturing/Testing for ITU/ANSI/IEEE/SONET/SDH Compliance
High-performance True-differential TDR Measurements
Advanced Jitter, Noise, and BER Analysis
Impedance Characterization and Network Analysis for Serial Data
Applications including S-parameters
Channel and Eye Diagram Simulation and Measurement-based SPICE
Modeling
*1 Typical, with the Phase Reference module, some conditions apply. Without the module, the jitter is
<800 fsRMS (typical).
Superior Performance with Extraordinary
Versatility
For developing today’s high-speed serial devices, the DSA8200 Digital
Serial Analyzer sampling oscilloscope is the most versatile tool for
communication, computer and consumer electronics gigabit transmitter and
signal path characterization, and compliance verification. With exceptional
bandwidth, signal fidelity, and the most extensible modular architecture, the
DSA8200 provides the highest performance TDR and interconnect analysis,
most accurate analysis of signal impairments, and BER calculations for
current and emerging serial data technology.
The DSA8200 provides unmatched measurement system fidelity with
ultra-low jitter floor that ensures the most accurate acquisition of high-speed
signals. You get advanced analysis benefits from the 200 fs acquisition
jitter with the Phase Reference module. And in another step forward for a
sampling oscilloscope, with the help of the Phase Reference module the
DSA8200 can acquire and measure SSC (Spread Spectrum Clocking)
signals.
The multiprocessor architecture, with dedicated per-slot digital signal
processors (DSPs), provides fast waveform acquisition rates, reducing
the test times necessary for reliable characterization and compliance
verification.
The DSA8200’s versatile modular architecture supports a large and growing
family of plug-ins enabling you to configure your measurement system with
a wide variety of electrical, optical, and accessory modules that best suit
your application now and in the future. With 6 module slots, the DSA8200
can simultaneously accommodate a Clock Recovery module, a precision
Phase Reference module, and multiple acquisition modules, electrical or
optical, so you can match system performance to your evolving needs.
Featuring industry-leading signal fidelity, the family of electrical modules
includes bandwidth performance from 12 GHz to 70+ GHz. Two
true-differential Time Domain Reflectometer (TDR) modules, with remote
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samplers, offer up to 50 GHz bandwidth and 15 ps reflected rise time
and 12 ps incident rise time. The family of low-noise variable-bandwidth
electrical modules provides the industry’s best noise performance with
remote samplers, featuring 450 μVRMS noise at 60 GHz, and 300 μVRMS at
30 GHz.
DSA8200 optical modules provide complete optical test solutions with
superior system fidelity from 125 Mb/s to 43 Gb/s and beyond. The modules
cover a range of wavelengths for both single- and multi-mode fibres. Each
module can be optionally configured with a number of selectable data rate
filters, optical reference receivers (ORR), and/or a full bandwidth path. The
80C07B, 80C08C, and 80C11 can be configured with a number of available
flexible integrated clock recovery options. The 80C12 Multirate module
clock recovery support is achieved with an electrical output for use with the
80A05 or 80A07 Electrical Clock Recovery modules.
The DSA8200’s popular FrameScan™ acquisition mode can be
used with patterns from DUTs, BERTs, and other sources, to isolate
pattern-dependent effects in transmitters or show the bit sequence
preceding a mask violation. FrameScan automatically sequences the time
base so that each bit of the data stream is acquired in time order. When
used in combination with mask-testing conditional acquisition features of
the DSA8200, such as stop after mask hits, FrameScan can automatically
identify at which bit a pattern-dependent failure occurred.
In addition, specialized modules supporting features such as single-ended
and differential electrical clock recovery, electrostatic protection for the TDR,
and connectivity to the popular TekConnect probing system brings you the
performance of Tektronix state-of-the-art probes for high-impedance and
differential probing. Low-impedance probes for 50 Ω probing and for TDR
probing are also available.
Jitter, Noise, BER, and Serial Data Link
Analysis
High-speed serial data link measurements and analysis are supported with
three software solutions: 80SJARB, 80SJNB Essentials, and 80SJNB
Advanced.
80SJARB is a basic jitter measurement tool capable of measuring jitter on
any waveform – random or repetitive. The simplicity of acquisition limits
the amount of analysis possible so only the simplest decomposition can be
used; repeatability is pattern dependent.
80SJNB Essentials offers complete analysis of jitter, noise, and BER,
with decomposition of components for clear understanding of a signal’s
problems and margins. The acquisition methodology requires a repetitive
pattern. Both accuracy and repeatability are improved relative to 80SJARB
since the tool has access to the complete signal pattern.
80SJNB Advanced adds features to 80SJNB Essentials for Serial Data
Link Analysis – de-embedding of fixture, channel emulation, FFE/DFE
equalization, pre-emphasis/de-emphasis.
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
TDR and electrical modules with fully integrated remote sampler.
TDR (Time Domain Reflectometry)
The DSA8200 is the industry’s highest performance fully integrated
Time Domain Reflectometry (TDR) measurement system. Offering
true-differential TDR measurements up to 50 GHz bandwidth with 15 ps
reflected rise time and 12 ps incident rise time, you are able to keep
pace with today’s most demanding Serial Data Network Analysis (SDNA)
requirements.
The new 80E10 and 80E08 TDR modules feature a fully integrated
independent dual-channel 2-meter remote sampler system to minimize
fixturing and assure optimal system fidelity. Independent sampler deskew
ensures fast and easy fixture and probe de-embedding. The user can
characterize differential crosstalk by using TDR steps from a differential
module to drive one line pair while monitoring a second line pair with a
second differential module.
Small form factor remote sampler enables placement near DUT assuring optimal signal
fidelity.
The DSA8200 is the industry’s most versatile TDR measurement system,
accommodating up to 4 dual-channel true-differential TDR modules for fast
accurate multilane impedance characterization.
The P80318 True-differential TDR probe and P8018 Single-ended Passive
Handheld TDR probe provide high-performance probing solutions for circuit
board impedance and electrical signal characterization. The P80318, an
18 GHz 100 Ω input impedance differential TDR hand probe, enables
high-fidelity impedance measurements of differential transmission lines.
The adjustable probe pitch enables a wide variety of differential line spacing
and impedances. The P8018 is a 20 GHz Single-ended Passive Handheld
TDR probe. Both the P80318 and P8018 can be used as stand-alone
probes but are especially designed to work with the 80A02 for the control of
EOS/ESD protection.
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3
Data Sheet
Gigabit Signal Path Characterization and
Analysis – Serial Data Network Analysis
(SDNA)
As clock speeds and rise times of digital circuits increase, interconnect
signal integrity dramatically affects digital system performance. Accurate
and efficient Serial Data Network Analysis (SDNA) of the signal path and
interconnects in time and frequency domains is critical to predict signal
losses, jitter, crosstalk, terminations and ringing, digital bit errors, and eye
diagram degradation, ensuring reliable system operation.
Tektronix offers several true-differential TDR modules, which in combination
with IConnect® software, allow S-parameters measurements with up to
–70 dB of dynamic range. This performance assures accurate repeatable
measurement in serial data analysis, digital design, signal integrity, and
electrical compliance testing applications.
The table below summarizes the S-parameter measurement bandwidth
performance when IConnect and the true-differential TDR modules are used
in combination.
TDR Module
S-parameter Measurement Bandwidth
Performance
80E10
80E08
80E04
50 GHz
30 GHz
20 GHz
With the long record length acquisitions, IConnect® provides great flexibility
for obtaining the desired frequency range and frequency step when
performing S-parameter measurements. Up to 1,000,000 points can be
acquired*2.
When you employ IConnect® Signal Integrity TDR and S-parameter
software with the DSA8200 you have an efficient, easy-to-use, and
cost-effective solution for measurement-based performance evaluation
of multi-gigabit interconnect links and devices, including signal integrity
analysis, impedance, S-parameter, and eye-diagram tests, and fault
isolation. IConnect can help you complete interconnect analysis tasks in
minutes instead of days, resulting in faster system design time and lower
design costs. IConnect also enables impedance, S-parameters, and
eye-diagram compliance testing as required by many serial data standards,
as well as full channel analysis, Touchstone (SnP) file output, and SPICE
modeling for gigabit interconnects.
*2 Long record lengths are supported only on DSA8200, CSA8200, TDS8200, CSA8000, and TDS8000
platforms.
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Quickly identify the exact location of faults with the 80E10’s sub-millimeter resolution and
IConnect True Impedance Profile.
Failure Analysis – Quickly Identify Fault
Location
The 80E10 provides superior resolution enabling the fastest and most
efficient fault isolation in package, circuit board, and on-chip failure analysis
applications.
Advanced Communication Signal Analysis
Specifically designed for ultra high-performance optical and electrical serial
data applications, the DSA8200 is the ideal tool for design characterization
and validation, as well as manufacturing test of datacom and telecom
components, transceiver subassemblies, and transmission systems. The
DSA8200 generates measurement results, not just raw data, with time
and amplitude histograms, mask testing, and statistical measurements. It
provides a communications-tailored measurement set that includes jitter,
noise, duty cycle, overshoot, undershoot, OMA, extinction ratio, Q-factor,
mean optical power, and amplitude. In addition, you can do mask testing of
SONET/SDH, 100 Gigabit (4×25), 10 Gigabit, Gigabit Ethernet, and other
electrical and optical standards compliance verification. Color grading and
grayscale grading of waveform data adds a third dimension, sample density,
to your signal acquisitions and analysis to provide visual insight. In addition,
the variable persistence database feature enables exact data aging to all of
the functions, and facilitates eye measurements on DUTs under adjustment.
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
OpenChoice Software Enables Familiar Tools
to Extend Your Measurement System
The DSA8200 provides an open Windows environment offering new levels
of data analysis on the instrument using your favorite commercially available
third-party software packages. Additionally, TekVISA™, a standard software
accessory, allows the instrument to be placed under the control of software
applications (such as LabVIEW, LabWindows, Visual Basic, Microsoft
Excel, C, etc.) running on the instrument or on an external PC workstation’s
network connected to the instrument without the need of a GPIB hardware
interface. Plug-and-play drivers for LabVIEW and other programs are also
supplied.
The DSA8200 combines the familiarity of Microsoft’s Windows XP operating
system with world-class waveform acquisition technology. This platform
provides a wide array of standard instrumentation and communications
interfaces, including: GPIB, parallel printer port, RS-232-C, USB serial
ports, and an Ethernet LAN connection. In addition, the platform includes
a DVD-CD/RW combo drive and removable hard drive for storage of
waveforms, setups, and analysis results.
155 Mb/s to 12+ Gb/s Optical Test
Tektronix optical modules for DSA8200 offer highest level of integration in
the industry, with corresponding higher repeatability and transferability of
the result. A particularly method-sensitive measurement, Extinction Ratio
(ER) is now also available as ER Calibrated, with an additional layer of
improvement to the portability of the result (80C08C and 80C11 modules
only).
80C08C 10 GHz Broad Wavelength Multirate 10 Gb/s
Optical Module
The 80C08C is a broad-wavelength (700 to 1650 nm) multirate optical
sampling module providing datacom rate testing for 10GbE applications at
9.95, 10.31, 11.09 Gb/s and 10G Fibre Channel applications at 10.51 Gb/s.
The 80C08C also provides telecom rate testing with several filters between
9.95 and 11.3 Gb/s. With its amplified O/E design, this module provides
excellent signal-to-noise performance and high optical sensitivity, allowing
users to examine low power level optical signals. The 80C08C can be
optionally configured with clock recovery options that can support any
standard or user-defined rate in a continuous range from 9.8 to 12.6 Gb/s.
80C12 Up to 10 GHz Broad Wavelength Multirate 1 Gb/s
to 10 Gb/s Optical Module
The 80C012 is a broad-wavelength (700 to 1650 nm) multirate optical
sampling module providing 1G, 2G, and 4G telecom and datacom testing.
This highly flexible module can be configured to support either lower data
rate applications (1 to 4 Gb/s) or a wide variety of 10 Gb/s applications.
The low data rate applications include: 1, 2, 4, and 8 Fibre Channel and
“by 4” wavelength division multiplex standards such as 10GBASE-X4 and
4-Lane 10 Gb/s Fibre Channel. The supported 10 Gb/s applications include
both datacom and telecom. The supported 10 Gb/s datacom applications
include 10GbE at 9.95, 10.31, 11.09 Gb/s, 8G Fibre Channel, and 10G
Fibre Channel applications at 8.5 Gb/s, 10.51, and 11.3 Gb/s. The 80C12
also provides telecom rate testing at 9.95, 10.66, and 10.70 Gb/s. With
its amplified O/E design, this module provides excellent signal-to-noise
performance and high optical sensitivity, allowing users to examine low
power level optical signals. Clock recovery for the 80C12 is provided
through the 80A05 or 80A07 Clock Recovery modules (sold separately).
80C11 30 GHz Long Wavelength Multirate 10 Gb/s
Optical Module
The 80C11 is optimized for testing of long wavelength signals (1100 to 1650
nm) at a number of rates around 10 Gb/s with a highly flexible multirate
filter. Additionally the high optical bandwidth of 30 GHz (typical) and the
excellent frequency response of its full bandwidth path is well suited for
general purpose high-performance optical component testing. The 80C11
can be configured with clock recovery options that supports any standard or
user-defined rate from 9.8 to 12.6 Gb/s.
80C07B 2.5 GHz Broad Wavelength Multirate 155 Mb/s
to 2.5 Gb/s Optical Module
The 80C07B is a broad-wavelength (700 to 1650 nm) multirate optical
sampling module optimized for testing datacom/telecom signals from 155 to
2500 Mb/s. With its amplified O/E design, this module provides excellent
signal-to-noise performance, allowing users to examine low-power optical
signals. The 80C07B can be optionally configured with multirate clock
recovery that operates from 155 to 2.7 Mb/s.
40 Gb/s and 100 Gb/s Optical Test
80C10B Multirate Datacom and Telecom 40 Gb/s and
100 Gb/s
The 80C10B module provides integrated and selectable reference receiver
filtering, enabling compliance testing at either 1310 nm or 1550 nm for
39.813 Gb/s (OC-768/STM-256, VSR2000 G.693, 40G NRZ G.959.1),
41.25 Gb/s (40GBASE-FR), and 43.018 Gb/s [G.709 FEC, OTU3,
(4x10G LAN PHY)] rates. In addition to the filter rates, the user may
also choose selectable bandwidths of 30 GHz, 65 GHz, and 80 GHz for
80C10B for optimal noise vs. bandwidth performance for accurate signal
characterization. The 80C10B is optionally available with Option F1 which
extends filter selections to include 27.739 Gb/s (100GBASE-LR4 + FEC
and 100GBASE-ER4 + FEC), and 25.781 Gb/s (100GBASE-LR4 and
100GBASE-ER4). When equipped with Option CRTP, an electrical signal
pickoff is provided for clock recovery using an external module (such as
the Tektronix CR286A-HS). The 80C10B is also optionally available in
a bundled ordering configuration which includes a 70+ GHz electrical
sampling channel.
80C25GBE Multirate Datacom 100 Gb/s
80C25GBE module provides 65 GHz full bandwidth with integrated
selectable reference receiver filtering, enabling compliance testing
at either 1310 nm or 1550 nm for 27.739G (100GBASE-LR4 + FEC
and 100GBASE-ER4 + FEC), and 25.781G (100GBASE-LR4 and
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5
Data Sheet
100GBASE-ER4). When equipped with Option CRTP, an electrical signal
pickoff is provided for clock recovery using an external module (such as
the Tektronix CR286A-HS).
Optical Modules: 80C07B
Module
Opt.
80C07B
F1
F2
F3
F4
F5
Bandwidth
2.5
2.5
2.5
2.5
2.5
(GHz)
Wavelength
700-1650
700-1650
700-1650
700-1650
700-1650
Range (nm)
Fibre Input
9 or 50 or
9 or 50 or
9 or 50 or
9 or 50 or
9 or 50 or
(μm)
62.5
62.5
62.5
62.5
62.5
–22
–22
–22
–22
–22
Mask Test
Sensitivity
(dBm)
1
1
1
1
1
Number of
Channels
Rates Supported: ■=Filter, ♦=Optical Clock Recovery, ⊕=Electrical Clock Recovery
■
■
■
■
125 Mb/s*3
■
■
■
■
155 Mb/s
■
■
622 Mb/s
■
■
1063 Mb/s
■
1250 Mb/s
■
2125 Mb/s
■
■
■
■
■
2488 Mb/s
■
■
■
■
■
2500 Mb/s
3.125 Gb/s
3.188 Gb/s
3.32 Gb/s
4.25 Gb/s
9.95 Gb/s
*3 125 Mb/s is supported by selecting 155 Mb/s rate.
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F6
F7
F8
F9
F10
CR1
2.5
2.5
2.5
2.5
2.5
2.5
700-1650
700-1650
700-1650
700-1650
700-1650
700-1650
9 or 50 or
62.5
–22
9 or 50 or
62.5
–22
9 or 50 or
62.5
–22
9 or 50 or
62.5
–22
9 or 50 or
62.5
–22
9 or 50 or
62.5
–22
1
1
1
1
1
1
■
■
■
■
♦
♦
♦
♦
♦
♦
♦
♦
■
■
■
■
■
■
■
■
■
■
■
■
■
■
■
■
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Optical Modules: 80C08C, 80C10B, 80C11, and 80C25GBE
Module
Opt.
80C08C
CR1
CR2
80C11
80C10B*5
CR4
CRTP
F1
CR1
CR2
80C25GBE
CR3
CR4
CRTP
Bandwidth
10
10
10
10
80
65
30
30
30
30
30
65
(GHz)
1290-1330 1100-1650 1100-1650 1100-1650 1100-1650 1100-1650 1290-1330
Wavelength 700-1650 700-1650 700-1650 700-1650 1290-1330
1520-1620
1520-1620
1520-1620
Range
(nm)
Fibre
9 or 50 or 9 or 50 or 9 or 50 or 9 or 50 or
9
9
9
9
9
9
9
9
Input (μm)
62.5
62.5
62.5
62.5
–7
–16
–15
–15
–15
–8
–9
–9
–9
–9
–9
–8
Mask Test
Sensitivity
(dBm)
1
1
1
1
1
1
1
1
1
1
1
1
Number
of
Channels
Rates Supported: ■=Filter, ♦=Optical Clock Recovery, ⊕=Electrical Clock Recovery
■
♦
♦
♦■
♦
♦
♦
♦
9.95 Gb/s
■
■
♦
♦
♦
♦
10.31 Gb/s
■
■
♦
♦
♦
10.52 Gb/s
■
■
♦
♦
♦
10.66 Gb/s
■
■
♦
♦
♦
♦
10.71 Gb/s
■
■
♦
♦
11.1 Gb/s
■
■
♦
♦
11.3 Gb/s
■
■
25.78 Gb/s
♦*6
■
■
27.74 Gb/s
♦*6
■
■
39.81 Gb/s
♦*4
■
■
41.25 Gb/s
♦*4
■
■
43.02 Gb/s
♦*4
♦*6
♦*6
♦*4
♦*4
♦*4
*4 Contact Tektronix for details.
*5 Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).
*6 Clock recovery with CR286A-HS (sold separately).
www.tektronix.com
7
Data Sheet
Optical Modules: 80C12
Module
Opt.
80C12
F1
F2
F3
F4
F5
F6
FC
10G
Bandwidth
4.25
9
9
4.25
9
9
9
10
(GHz)
Wavelength
700-1650
700-1650
700-1650
700-1650
700-1650
700-1650
700-1650
700-1650
Range (nm)
Fibre Input
9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5 9 or 50 or 62.5
(μm)
–19
–19
–19
–19
–19
–19
–19
–14
Mask Test
Sensitivity
(dBm)
1
1
1
1
1
1
1
1
Number of
Channels
Rates Supported: ■=Filter, ♦=Optical Clock Recovery, ⊕=Electrical Clock Recovery
155 Mb/s
622 Mb/s
■
■
1063 Mb/s
1250 Mb/s
■
■
■
■
■
2125 Mb/s
2488 Mb/s
2500 Mb/s
■
■
■
■
3.125 Gb/s
■
■
■
■
3.188 Gb/s
■
3.32 Gb/s
■
■
■
■
4.25 Gb/s
■
■
■
■
■
■
8.5 Gb/s*9
■
9.95 Gb/s
■
10.31 Gb/s*9
■
10.52 Gb/s
■
10.66 Gb/s
■
10.71 Gb/s
■
11.1 Gb/s
■
11.3 Gb/s
CR*7
CR*8
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
♦
80A07
♦
♦
♦
♦
♦
♦
♦
*7 With 80A05 or 80A07.
*8 With 80A05 Option 10G or 80A07.
*9 Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as defined by T11 committee in April 2009, is identical to the 10BASE-R 10.313G filter and is available for
80C12 Option 10G modules only; and is identified as 10BASE-R.
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Digital Serial Analyzer Sampling Oscilloscope — DSA8200
DSA8200 Electrical Modules
TDR Modules: 80E10, 80E08, and 80E04
The 80E10, 80E08, and 80E04 are dual-channel Time Domain
Reflectometry (TDR) sampling modules, providing up to 12 ps incident and
15 ps reflected rise time. Each channel of these modules is capable of
generating a fast impulse for use in TDR mode and the acquisition portion of
the sampling module monitors the incident step and any reflected energy.
The polarity of each channel’s step can be selected independently. This
allows for true-differential or common-mode TDR or S-parameters testing
of two coupled lines, in addition to the independent testing of isolated lines.
The independent step generation for each channel allows true-differential
measurements, which ensures measurement accuracy of nonlinear
differential devices.
80E10 and 80E08 feature a small form factor, fully integrated independent
2-meter remote sampler system, enabling the location of the sampler near
the DUT for the best system fidelity. The modules characterize crosstalk by
using TDR steps to drive one line (or line pair for differential crosstalk) while
monitoring a second line (or line pair) with the other channel (or another
module for differential crosstalk). The "rise time filter" function on the
DSA8200 mainframe can be used with TDR or crosstalk measurements to
characterize expected system performance with slower edge speeds. An
optional 2-meter extender cable for the 80E04 is available, which enables
placement of the module near the DUT for the best system fidelity.
All modules have independent incident step and receiver deskew to
remove the effect of fixtures and probes, enabling faster and easier
deskew. The 80E10 Sampling module provides an acquisition rise time
of 7 ps, with up to 50 GHz user-selectable equivalent bandwidth (with
50 GHz, 40 GHz, and 30 GHz settings). 80E08 sampling bandwidth
is 30 GHz (user-selectable with 30 GHz and 20 GHz settings) and
80E04 sampling bandwidth is 20 GHz. The 20 GHz P8018 single-ended
and the 18 GHz P80318 differential variable pitch TDR handheld probes
provide excellent performance, ensuring easy and accurate backplane and
package measurements.
TDR Module Summary
Module
Typical TDR Rise Time at Full Bandwidth
Incident*10
Reflected*10
80E10
12 ps
15 ps
80E08
18 ps
20 ps
80E04
23 ps
28 ps
Bandwidth
Performance*11
50 GHz, 40 GHz,
and 30 GHz
(user selectable)
30 GHz, 20 GHz (user
selectable)
20 GHz
RMS Noise at
Bandwidth*11
Remote Sampler
50 GHz:
40 GHz:
30 GHz:
30 GHz:
20 GHz:
600
Yes, fully integrated
2-meter cable
600 μV
370 μV
300 μV
300 μV
280 μV
μV
Yes, fully integrated
2-meter cable
No, optional 80N01
– 2-meter extender
cable
*10 Values shown are warranted unless printed in an italic typeface which represents a typical value.
*11 Calculated from .35 bandwidth rise time product.
www.tektronix.com
9
Data Sheet
Electrical Modules: 80E09, 80E07, 80E06, 80E03, and
80E01
The 80E09 and 80E07 are dual-channel modules with remote samplers,
capable of noise as low as 450 μVRMS at 60 GHz bandwidth and
300 μVRMS noise at 30 GHz bandwidth. Each small form factor remote
sampler is attached to a 2-meter cable to minimize the effects of cables,
probes, and fixtures to ensure the best system fidelity. User-selectable
bandwidth settings (60/40/30 on 80E09 and 30/20 on 80E07) offer optimal
noise/bandwidth trade-off.
80E06 and 80E01 are single-channel 70+ and 50 GHz bandwidth sampling
modules respectively. 80E06 provides the widest bandwidth and fastest
rise time with world-class system fidelity. Both 80E06 and 80E01 provide a
superior maximum operating range of ±1.6 V. Both modules can be used
with the optional 2-meter extender cable, ensuring superior system fidelity
and measurement flexibility.
The 80E03 is a dual-channel 20 GHz sampling module. This module
provides an acquisition rise time of 17.5 ps or less. An optional 2-meter
extender cable is available.
When used with Tektronix 80SJNB Jitter, Noise, and BER Analysis
software, these modules enable separation of both jitter and noise into
their constituent components, for insight into the underlying causes of eye
closure and obtain highly accurate calculation of BER and 3-D eye contour.
When used with the 82A04 Phase Reference module, time-base accuracy
can be improved down to 200 fsRMS jitter which, together with the 300 μVRMS
noise floor and 14 bits of resolution, ensures the highest signal fidelity for
your measurements.
Electrical Module Summary
Electrical
Module
Step Response at Full
Bandwidth
(10-90%)*10
Number Of Channels
Bandwidth*10, 12
RMS Noise at
Bandwidth*10
Remote Sampler
80E09
5.8 ps
2
60/40/30 GHz (user
selectable)
Yes, fully integrated
2-meter cable
80E07
11.7 ps
2
80E06
5.0 ps
1
30/20 GHz (user
selectable)
70+ GHz
60 GHz: 450 μV
40 GHz: 330 μV
30 GHz: 300 μV
30 GHz: 300 μV
20 GHz: 280 μV
1.8 mV
80E03
17.5 ps
2
20 GHz
600 μV
80E01
7 ps
1
50 GHz
1.8 mV
*10 Values shown are warranted unless printed in an italic typeface which represents a typical value.
*12 Now obsolete module useful with older versions of the mainframe, but not needed with the 8200 Series mainframes.
10
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Yes, fully integrated
2-meter cable
No, optional 80N01
– 2-meter extender
cable
No, optional 80N01
– 2-meter extender
cable
No, optional 80N01
– 2-meter extender
cable
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
DSA8200 Accessory Modules
82A04 Phase Reference Module
The 82A04 Phase Reference module enhances the DSA8200 sampling
oscilloscope from the industry’s standard time-base jitter performance
of 800 fsRMS, to the extremely low time-base jitter of <200 fsRMS. Typical
application for the Phase Reference module is the acquisition and analysis
of very high-speed optical and electrical signals in communication devices
and systems. The 82A04 supports both the Triggered mode of operation,
which is similar to usual acquisition, and the untriggered Free Run mode
where all timing information comes from the customer-supplied clock alone
(no trigger signal necessary). When the external clock is not available the
module can accept the clock signal from the clock recovery output of the
80Cxx modules, as well as from the 80A05 or 80A07 Clock Recovery
modules. Additionally 82A04 supports SSC (Spread Spectrum Clocking)
operation.
80A05 Electrical Clock Recovery Module
The 80A05 Electrical Clock Recovery module enables clock recovery for
electrical signals, as well as internal triggering on the recovered clock. The
module recovers clocks from serial data streams for all of the most common
electrical standards in the 50 Mb/s to 4.25 Gb/s, around 5 to 6 Gb/s,
and from 9.953 Gb/s to 12.5 Gb/s ranges. The module accepts either
single-ended or differential signals as its input, providing clock recovery for
both. The signal(s) is/are then passed on to the output connectors (at about
50% of the input level) and can be connected to sampling module(s) for
differential or single-ended sampling. Option 10G is required for support of
standard rates from 9.953 Gb/s to 12.6 Gb/s. The 80A05 and 80A07 can
also serve as the Clock Recovery module for the 80C12 Optical Sampling
module.
80A06 PatternSync Module
The 80A06 PatternSync Trigger module, when used in combination
with 80SJNB software, enables characterizing jitter, noise, and BER
performance of high-speed serial designs from 1 Gb/s to 60 Gb/s data
rates. It extends the capability of the DSA8200 sampling oscilloscope by
creating a pattern trigger from any data-related clock – a recovered clock,
user-supplied clock, sub-clock, or super-clock. The PatternSync Trigger
module is programmable to pattern lengths of up to 223 bits and accepts a
user-supplied clock signal from 150 MHz to 12.5 GHz. The 80A06 module is
required with the DSA8200 when using 80SJNB Advanced Jitter, Noise, and
BER Analysis software package. This module can be used in combination
with the 82A04 Phase Reference module for the best time-base accuracy or
for acquisition of signals under SSC (Spread Spectrum Clocking).
80A07 Clock Recovery Module
80A07 recovers clocks from serial data streams for all of the most common
electrical standards in the continuous 100 Mb/s to 12.5 GB/s range.
Auto-locking capability is selectable from the user interface or programmatic
interface, so the design and test engineers can search and lock onto signals
of undefined or unknown data rate. The module accepts either single-ended
or differential signals as its input, providing clock recovery for both. The
signal(s) is/are then passed on to the output connectors and can be
connected to sampling module(s) for differential or single-ended sampling.
80A07 offers complete configurability and state-of-the-art specifications
and is the preferred solution for most serial data standards due to excellent
stability, superior jitter and slew rate tolerance for recovering clocks from
stressed or degraded signals, and unequaled PLL bandwidth and roll-off
shape control for either Golden PLL compliance testing or custom PLL
response. 80A07 also locks on spread-spectrum signals. The 80A07 can
also serve as the Clock Recovery module for the 80C12 Optical Sampling
module.
P80318 Differential Handheld TDR Probe
The P80318 is an 18 GHz 100 Ω input impedance differential TDR hand
probe. This probe enables high-fidelity impedance measurements of
differential transmission lines. The adjustable probe pitch from 0.5 mm to
4.2 mm enables a wide variety of differential line spacing and impedances.
The P80318 probe also includes two precision SMA cables with parallel
control lines that provides the 80A02 module the control for EOS/ESD
protection.
P8018 Single-ended Handheld TDR Probe
The P8018 Handheld TDR Probe is a 20 GHz, 50 Ω input impedance,
single-ended passive probe that provides a high-performance solution for
electrical sampling, TDR circuit board impedance characterization, and
high-speed electrical signal analysis applications. The P8018 probe also
includes a precision SMA cable and parallel control line that provides the
80A02 module the control for EOS/ESD protection.
80A02 EOS/ESD Protection Module
The 80A02 EOS/ESD Protection module protects the sampling bridge of
Tektronix electrical sampling module inputs from damage by electrostatic
charge. The 80A02 is intended for use in applications such as electrical
TDR circuit board testing and cable testing where large static charges can
be stored in the DUT.
When used with the matching P8018 20 GHz single-ended handheld
probe or the P80318 differential handheld probe (both with probe tip
pressure actuating feature) the 80A02 provides a superior technique
and performance capability for electrical module EOS/ESD protection of
acquired electrical signals and TDR measurements (two 80A02 modules
required for differential applications).
www.tektronix.com
11
Data Sheet
80A03 TekConnect Probe Interface Module
The 80A03 provides probe power and control for up to two Tektronix
P7000 Series probes. The 80A03 is powered through the oscilloscope
and requires no user adjustments or external power cords. An Electrical
Sampling module can be plugged directly into the slot on the 80A03 to
provide the optimum system fidelity and a short electrical path. Using the
80A03, designers can benefit from industry-leading Tektronix active and
differential probes to measure signals on SMD pins and other challenging
circuit features.
SlotSaver Small Module Extender Cable
This cable can be used to power and operate one 80A01*12, 80A02, or
80A06 accessory modules, eliminating the need to consume a small form
factor mainframe slot. The SlotSaver extender cable plugs into the ‘Trigger
Power’ connector on the mainframe or (for 80A01 and 80A02) into the
‘Probe Power’ connector on most Electrical Sampling modules.
*12 Now obsolete module useful with older versions of the mainframe, but not needed with the 8200 Series
mainframes.
DSA8200 Application Software
Jitter, Noise, BER, and Serial Data Link Analysis (SDLA)
Software
80SJNB speeds the identification of the underlying causes of both
horizontal and vertical eye closure through separation of jitter and noise.
With its unique insight into the constituent components of both jitter and
noise, 80SJNB provides a highly accurate and complete BER calculation
and eye contour analysis.
Additionally available in the software package is the first-ever set of features
addressing the design issues of modern Serial Data Links: equalization with
either FFE or DFE, channel emulation, support for fixture de-embedding,
as well as full support for SSC – Spread Spectrum Clocking. When you
combine jitter, noise, and BER analysis with the DSA8200 modular flexibility,
uncompromised performance, and unmatched signal fidelity you get the
ideal solution for next-generation high-speed serial data design validation
and compliance testing. 80SJNB requires the 80A06 PatternSync module,
which creates a trigger pulse on each complete pattern. 80SJNB may be
used with the 82A04 Phase Reference module for enhanced accuracy or
for SSC signals, or without it depending on your requirements. SSC max.
amplitude 5000 ppm (6000 ppm) at 30 ±3 kHz. Current version V2.1 of
80SJNB supports save and recall of the complete signal description. Also
added is a new measurement DDPWS (Data Dependent Pulse Width
Shrinkage) and a corresponding graph.
12
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80SJNB Jitter and Noise Analysis Measurements
Jitter Analysis
Measurements
Description
TJ at BER
J2
J9
RJ
RJ(h)
RJ(v)
RJ(d-d)
DJ
DDJ
DDPWS
DCD
DJ(d-d)
PJ
PJ(h)
PJ(v)
EO at BER
Total jitter at specified BER
Total jitter for BER = 2.5e–3
Total jitter for BER = 2.5e–10
Random jitter
Horizontal component of random jitter
Vertical component of random jitter
Random jitter according to the Dual Dirac model
Deterministic jitter
Data-dependent jitter
Data-dependent Pulse Width Shrinkage
Duty cycle distortion
Deterministic jitter computed in the Dual Dirac model
Periodic jitter
Horizontal component of periodic jitter
Vertical component of periodic jitter
Horizontal eye opening at specified BER
80SJNB Noise Analysis
Measurements
Description
RN
RN(v)
RN(h)
DN
DDN1
DDN0
PN
PN(v)
PN(h)
EO at BER
SSC Magnitude
SSC Frequency
Random noise
Vertical component of random noise
Horizontal component of random noise
Deterministic noise
Data-dependent noise on logical level 1
Data-dependent noise on logical level 0
Periodic noise
Vertical component of periodic noise
Horizontal component of periodic noise
Vertical eye opening at specified BER
Magnitude of SSC modulation in ppm
Frequency of SSC modulation in ppm
80SJNB Advanced Supports:
FFE (Feed Forward Equalization) to 100 Taps
DFE (Decision Feedback Equalization) to 40 Taps
Filter for support of linear filters from fixture de-embed to transmitter
equalization. Channel emulation supported for channels with >30 dB
of loss at 1st harmonic frequency
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
IConnect® Signal Integrity TDR and
S-parameter Software
Operating on the DSA8200 TDR platform, IConnect® S-parameters is
the most cost-effective and highest throughput approach for S-parameter
measurements in digital design, signal integrity analysis, and interconnect
compliance testing, providing as much as 50% cost savings compared to
similar bandwidth VNAs, and dramatically speeding up measurements.
You can also take advantage of the IConnect® S-parameters command
line interface, which automates the S-parameter measurements, to the
overall suite of manufacturing tests you perform using your TDR instrument,
significantly reducing test time while increasing measurement repeatability.
The simplicity of S-parameter calibration using a reference (open, short,
or through), and an optional 50 Ω load makes the measurement, fixture
de-embedding, and moving the reference plane a snap. Touchstone
file format output enables easy S-parameter file sharing for further data
analysis and simulations.
Jitter Analysis of Arbitrary Data
The 80SJARB jitter measurement application software for the DSA8200
Series addresses IEEE 802.3ba applications requiring the J2 and J9
jitter measurements. It also enables basic jitter measurements for NRZ
data signals including PRBS31, random traffic, and scrambled data. This
provides an entry-level jitter analysis capability with simple Dual Dirac
model jitter analysis and no hardware module requirements. 80SJARB can
acquire continuously in “free run” mode, delivering acquisitions and updates
beyond the IEEE minimum requirement of 10,000 data points. Plots include
jitter bathtub curves for both measured and extrapolated data, as well as a
histogram of the acquired data.
Measurement Description
J2
J9
Tj
DJdd
RJdd
Total jitter for BER = 2.5e–3
Total jitter for BER = 2.5e–10
Total jitter for BER = 1.0e–12
Deterministic jitter (Dual Dirac model)
Random jitter (Dual Dirac model)
Tektronix offers several true-differential TDR modules, which in combination
with IConnect® offers S-parameter measurements to 50 GHz with up
to –70 dB of dynamic range. This performance exceeds requirements
for serial data analysis, digital design, and signal integrity applications,
resolving down to 1% (–40 dB) accuracy of crosstalk, whereas electrical
compliance testing masks typically call for the measurements in the –10
to –30 dB range.
IConnect® software allows you to quickly and easily generate SPICE
and IBIS models for your PCBs, flex boards, connectors, cables,
packages, sockets, and I/O buffer inputs directly from TDR/T or VNA
S-parameter measurements. IConnect® allows you to display eye diagram
degradation, jitter, loss, crosstalk, reflections, and ringing in your digital
system. IConnect® Linear Simulator allows the designer to link several
interconnect channels together to evaluate the total time, frequency
domain performance, and eye diagram of the overall channel. IConnect®
substantially simplifies the signal integrity analysis of the interconnect
link, equalization and emphasis component design, and analysis of the
interconnect link with transmitter and receiver.
Free Run Mode: For continuous acquisitions and update beyond the
IEEE minimum requirement of 10,000 data points
Plots: Jitter / Eye Opening Bathtub, Histogram of Acquired Data
www.tektronix.com
13
Data Sheet
Characteristics
Signal Acquisition
Acquisition Modes
Mode
Sample (Normal), Envelope, and Average
Number of Sampling Modules
Accommodated
Up to four dual-channel electrical; up to two optical sampling modules. (Both single- and dual-channel modules are appropriate
for the two channels associated with the slot)
Population of the CH1/CH2 large slot with any module other than one requiring power only displaces functionality of the CH1/CH2
small slot; population of the CH3/CH4 large slot with any module other than one requiring power only displaces functionality
of the CH3/CH4 small slot
Eight channels maximum
Number of Simultaneously Acquired Inputs
Acquisition Characteristics
Characteristic
Description
Vertical Systems
Rise Time / Bandwidth
Vertical Resolution
Determined by the sampling modules used
14 bits over the sampling modules’ dynamic range
Horizontal System
Four time-base modes are available:
Triggered Phase Reference*13 Time Base
Mode
Free Run Phase Reference*13 Time Base
Mode
Short-term Optimized Sequential*14 Time
Base Mode
Locked to 10 MHz Reference Sequential
Time Base
Main and Magnification View Time Bases
Maximum Trigger Rate
Typical Acquisition Rate
Timing information extracted from a user-supplied or clock recovery signal significantly improves time-base accuracy and jitter
performance of the triggered acquisition. Horizontal position is referenced to the trigger signal as with a traditional time base
All timing is based on a phase reference signal; accuracy and jitter as above; no trigger is needed, and correspondingly there is
no timing relation to trigger signal
Best short-delay performance for acquisitions without the external phase reference signal
Provides the best long-delay performance for acquisitions without the external phase reference signal. The Lock is selectable
between Lock to Internal 10 MHz and Lock to External 10 MHz for highest frequency accuracy
100 fs/div to 5 ms/div in 1-2-5 sequence or 100 fs increments
200 kHz; in Phase Reference mode: 50 kHz
150 kS/s per channel (standard sequential time base); 50 kS/s (Phase Reference modes)
Time Interval Accuracy (Standard Time Base) and Timing Deviation (Phase Reference Modes)
Phase Reference Time Base: Triggered
Horizontal position after trigger event:
>40 ns
≤40 ns
Phase Reference Time Base: Free Run
Sequential Time Base*14
Time interval accuracy, horizontal scale:
<21 ps/div
≥21 ps/div
Horizontal Deskew Range Available
(Sequential time base only)
DSA8200 Record Length
IConnect®
80SJNB Jitter, Noise, and BER Analysis
software
Waveform Databases
Magnification Views
Maximum timing deviation relative to phase reference signal:
0.2% of phase reference signal period (typical)
0.4% of phase reference signal period (typical)
Note: The performance depends on stable clock supplied to the Phase Reference module. Performance under SSC is lower
and depends on modulation shape
Maximum timing deviation relative to phase reference signal: 0.1% or better of phase reference signal period (typical)
1 ps + 1% of interval
8 ps + 0.1% of interval (short-term optimized mode)
8 ps + 0.01% of interval (locked to 10 MHz mode)
–500 ps to +100 ns on any individual channel in 100 fs increments
20, 50, 100, 250, 500, 1000, 2000, or 4000 samples;
Longer records available as follows:
1,000,000 points
3,200,000 points
4 independently accumulated waveform records of up to 4 G waveform points. Variable waveform database mode with true
first-in/first-out of 2000 waveforms available on each of 4 waveform databases
In addition to the main time base, the DSA8200 supports two magnification views. These magnifications are independently
acquired using separate time-base settings which allow same or faster time/div than that of the main time base
*13 When using the 82A04 Phase Reference module.
*14 Traditional mode – not using the 82A04 Phase Reference module.
14
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Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Trigger System
Trigger Sources
External direct trigger.
External pre-scaled trigger.
Internal clock trigger: Internally connected to direct trigger.
Clock recovery triggers from Optical Sampling modules and from the 80A05
or 80A07 Rlectrical Clock Recovery modules; signal from the 80A05 module
(pre-scaled above 2.7 Gb/s) internally connected.
Phase Reference*13 time base supports acquisitions without a trigger signal in its
Free Run mode.
*13 When using the 82A04 Phase Reference module.
Trigger Sensitivity
External Direct Trigger Output
Trigger Level Range
Trigger Input Range
Trigger Holdoff
External Trigger Gate (Optional)
Pre-scaled Trigger Input
50 mV, DC - 4 GHz (typical)
100 mV, DC - 3 GHz (guaranteed)
±1.0 V
±1.5 V
Adjustable 5 μs to 100 ms in 0.5 ns increments
TTL logic 1 enables gate, a TTL logic 0 disables gate, maximum nondestruct input level ±5 V
200 mVp-p to 800 mVp-p, 2 to 12.5 GHz (guaranteed)
Time-base Jitter
Phase Reference*15 Time Base
System jitter of 200 fsRMS typical on a 10 GHz or faster acquisition module, with f ≥ 8 GHz, 0.6 V ≤ VREF ≤ 1.8 V phase reference
signal
Jitter: System jitter of 280 fsRMS typical on a 10 GHz or faster acquisition module, in DSA8200 mainframe, with 2 GHz ≤ f ≤ 8 GHz,
0.6 V ≤ VREF ≤ 1.8 V phase reference signal
The phase reference time base remains operational to 100 mV (typical) with increased jitter
Short-term Jitter Optimized Sequential Mode 800 fsRMS +5 ppm of position (typical)
1.2 psRMS +10 ppm of position (max.)
Locked to 10 MHz Reference Sequential
1.6 psRMS +0.04 ppm of position (typical)
Mode
2.5 psRMS +0.01 ppm of position (max.)
Internal Clock
Adjustable from 25 to 200 kHz (drives TDR, internal clock output and calibrator)
*15 When using the 82A04 Phase Reference module performance under SSC is lower and depends on modulation shape, clock recovering setting, and cabling lengths.
Display Features
Touch Screen Display
Colors
Video Resolution
Monitor Type
264 mm / 10.4 in. diagonal, color
16,777,216 (24 bits)
640 horizontal by 480 vertical displayed pixels
LCD
www.tektronix.com
15
Data Sheet
Math/Measurement
Characteristic
Description
System
Measurements
The DSA8200 supports up to eight simultaneous
measurements, updated three times per second with optional
display of per-measurement statistics (min, max, mean, and
standard deviation)
Automated measurements include RZ, NRZ, and Pulse
signal types, and the following:
High, Low, Amplitude, Max, Mid, Min, +Width, Eye Height,
Eye Opening Factor, Pulse Symmetry, Peak-to-Peak, OMA,
+Overshoot, –Overshoot, Mean, +Duty Cycle, Cycle Mean,
RMS, Cycle RMS, AC RMS, Gain, Extinction Ratio (Ratio, %,
dB), Suppression Ratio (Ratio, %, dB), Peak-to-Peak Noise,
RMS Noise, Q-Factor, SNR, Average Optical Power (dBm,
watts), OMA
Rise, Fall, Period, Bit Rate, Bit Time, Frequency, Crossing
(%, Level, Time), +Cross, –Cross, Jitter (P-P, RMS), Eye
Width, +Width, –Width, Burst Width, +Duty Cycle, –Duty
Cycle, Duty Cycle Distortion, Delay, Phase
Area, Cycle Area
Measurement Set
Amplitude
measurements
Timing
measurements
Area
measurements
Cursors
Waveform
Processing
Dot, vertical bar, and horizontal bar cursors
Up to eight math waveforms can be defined and displayed
using the following math functions: Add, Subtract, Multiply,
Divide, Average, Differentiate, Exponentiate, Integrate,
Natural Log, Log, Magnitude, Min, Max, Square Root, and
Filter. In addition, measurement values can be utilized as
scalars in math waveform definitions
Characteristic
Description
Mask Testing –
Standard rate (Gb/s)
unless otherwise
noted
Custom masks (a new FW feature) can be used to distribute
new, Tektronix factory created, NRZ, updated masks as a
file loadable by the firmware. User-defined masks allow
the user to create (through UI or PI) user masks. For
most applications mask will be found in the following list of
predefined, built-in masks:
STM-0/OC-1 51 Mb/s
STM-1/OC-3 155 Mb/s
STM-4/OC-12 622 Mb/s
STM-16/OC-48 2.488
STM-64/OC-192 9.953
STM-256/OC-768 39.813
FEC 2.666 2.666
FEC 10.66 10.664
FEC 10.709
FEC 11.100
FEC 27.739 Gb/s (100GBASE-LR4 100GBASE-ER4)
FEC 42.66 42.657
FEC 43 Gb/s G.709 43.018
FC-10 G 10.5188 – optical only
FC-16 17.0 – optical and electrical
FC-133 132.813 Mb/s – optical and electrical
FC-266 265.6 Mb/s – optical and electrical
FC-531 531.2 Mb/s – optical and electrical
FC-1063 1.063 – optical and electrical
FC-2125 2.125 – optical and electrical
FC-4250 4.250 – optical and electrical
FC-8500 8.500 – optical and electrical, optical 10GFC, FEC
11.3*9
10GBASE-X4 3.125
10GBASE-W 9.953
10GBASE-R 10.313, FEC 11.1, 8.5 GFC
40GBASE-LR4 41.25 OTU3+ 44.50 Gb/s 4x10G LAN PHY
100GBASE-LR4 and 100GBASE-ER4 25.781 Gb/s
InfiniBand 2.500 – optical and electrical
Gigabit Ethernet 1.250
Gigabit Ethernet 2.5 Gb/s
XAUI, XFI
PCI-Express 2.5G
PCI-Express 5.0G
SAS XR 3.0G
SAS XR AASJ 3.0G
SATA G1Tx 1.5G
SATA G1Rx 1.5G
SATA G2Tx 3.0G
SATA G2Rx 3.0G
SATA G3Tx 6.0G
SATA G3Rx 6.0G
Rapid I/O 1.25G
Rapid I/O 2.50G
Rapid I/O 3.125
*9 Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC
filter, as defined by T11 committee in April 2009, is identical to the 10BASE-R 10.313G filter and is available
for 80C12 Option 10G modules only; and is identified as 10BASE-R.
16
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Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Optical Sampling Module Characteristics
Refer to Optical Sampling module’s User Manual for more detailed information.
Optical Sampling Module Characteristics
Module
Application Type
Standards and Supported Filtering
Rates*16
Number of Input
Channels
Effective
Wavelength Range
Calibrated
Wavelengths
80C07B
Tributary Datacom/Telecom
1
700 nm to 1650 nm
780 nm, 850 nm,
1310 nm, and
1550 nm (±20 nm)
80C08C
10 Gb/s Datacom/Telecom
1
700 nm to 1650 nm
780 nm, 850 nm,
1310 nm, and
1550 nm (±20 nm)
80C10B
100 Gb/s and 40 Gb/s
Telecom and Datacom
Standard Included: OC-48/STM-16 (2.488 Gb/s),
Infiniband SDR, 2 GbE (2.500 Gb/s);
Optional (choose any two): OC-3/STM-1
(155 Mb/s), OC-12/STM-4 (622 Mb/s),
Fibre Channel (1.063 Gb/s), GbE (1.250 Gb/s),
2G Fibre Channel (2.125 Gb/s)
OC-192/STM-64 (9.953 Gb/s), 10GBASE-W
(9.953 Gb/s), 10GBASE-R, 40GBASE-R4,
100GBASE-SR10 (10.31 Gb/s), 10G Fibre
Channel (10.52 Gb/s), ITU-T G.975 FEC
(10.664 Gb/s), ITU-T G.709 (10.709 Gb/s),
10 GbE FEC (11.1 Gb/s), 10 GFC FEC
(11.3 Gb/s), 10GBASE-LRM, 40GBASE-SR4,
100GBASE-SR10, 40GBASE-LR4
OC-768/STM-256 (39.813 Gb/s), OTU3, VSR-2000
G.693, 40G NRZ G.959.1, FEC (43.018 Gb/s),
OTU3 (44.5 Gb/s), 40GBASE-FR (41.25 Gb/s),
100GBASE-LR4 (25.781 Gb/s, FEC 27.739 Gb/s),
100GBASE-ER4 (25.781 Gb/s, FEC 27.739 Gb/s)
OC-192/STM-64 (9.953 Gb/s), 10GBASE-W
(9.953 Gb/s), 10GBASE-R, 40GBASE-LR4
(10.31 Gb/s), 10G Fibre Channel (10.52 Gb/s),
ITU-T G.975 FEC (10.664 Gb/s), ITU-T G.709
(10.709 Gb/s), 10 GbE FEC (11.1 Gb/s), 10 GFC
FEC (11.3 Gb/s), 40GBASE-LR4
Fibre Channel (1.063 Gb/s), 2G Fibre Channel
(2.125 Gb/s), 4G Fibre Channel (4.250 Gb/s),
10GBASE-X4 (3.125 Gb/s), 8G Fibre Channel
(8.50 Gb/s)*9, 10GFC-X4 (3.1875 Gb/s),
VSR5-3318 (3.318 Gb/s), 1x Infiniband SDR
(2.5 Gb/s), 10GBASE-LRM, 40GBASE-SR4,
100GBASE-SR10, 40GBASE-LR4
OC-192/STM-64 (9.953 Gb/s), 10GBASE-W
(9.953 Gb/s), 10GBASE-R*9, 40GBASE-R4,
100GBASE-SR10 (10.31 Gb/s), 10G Fibre Channel
(10.52 Gb/s), ITU-T G.975 FEC (10.664 Gb/s),
ITU-T G.709 (10.709 Gb/s), 10 GbE FEC
(11.1 Gb/s), 10 GFC FEC (11.3 Gb/s)
100GBASE-LR4 (25.781 Gb/s, FEC 27.739 Gb/s),
100GBASE-ER4 (25.781 Gb/s, FEC 27.739 Gb/s)
80C11
10 Gb/s Datacom/Telecom
80C12
1 to 8.5 Gb/s
Datacom/Telecom
10 Gb/s Datacom/Telecom
80C25GBE
100 Gb/s Datacom
1
1310 nm and 1550 nm 1310 nm and 1550 nm
(±20 nm)
1
1100 nm to 1650 nm
1310 nm and 1550 nm
(±20 nm)
1
700 nm to 1650 nm
850 nm, 1310 nm, and
1550 nm (±20 nm)
1
1310 nm and 1550 nm 1310 nm and 1550 nm
(±20 nm)
*9 Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as defined by T11 committee in April 2009, is identical to the 10BASE-R 10.313G filter and is available for
80C12 Option 10G modules only; and is identified as 10BASE-R.
*16 Bandwidths shown are warranted unless printed in an italic typeface which represents a typical value. 80C08C, 80C12: Bandwidths and optical filters valid for OMA ≤ 500 μW (1550/1310 nm), OMA ≤ 860 μW (850 nm), OMA
≤1020 μW (780 nm).
Note: Refer to Optical Sampling module’s User Manual for more detailed information.
www.tektronix.com
17
Data Sheet
Optical Sampling Module Characteristics (Cont.)
Module
80C07B
80C08C*18
80C10B
80C11
80C12
80C25GBE
Clock Recovery
(Optional)
Clock Recovery Outputs
±Clock, ±Data
Option CR1: 155 Mb/s,
622 Mb/s, 1.063 Gb/s,
1.250 Gb/s, 2.125 Gb/s,
2.488 Gb/s, 2.500 Gb/s,
2.666 Gb/s
Clock, Clock/16
Option CR1: 9.953 Gb/s,
10.31 Gb/s;
Option CR2: 10.31 Gb/s,
10.52 Gb/s;
Option CR4: Continuous from
9.8 Gb/s to 12.6 Gb/s
Provided by CR286A-HS or ELECTRICAL SIGNAL OUT
other compatible external
(to 44.5 Gb/s, 50 Ω, AC
CR units*4
coupled, differential 2.92 mm
female connectors, max.
1 ps diff. skew)*17
CR1: Clock, Clock/16, Data;
Option CR1: 9.953 Gb/s;
CR2, CR3, CR4: Clock,
Option CR2: 9.953 Gb/s,
Clock/16
10.664 Gb/s;
Option CR3: 9.953 Gb/s,
10.709 Gb/s;
Option CR4: Continuous
between 9.8 Gb/s to
12.6 Gb/s
Provided by 80A05 or 80A07 ELECTRICAL SIGNAL OUT
(sold separately)
Provided by CR286A-HS
ELECTRICAL SIGNAL OUT
(to 44.5 Gb/s, 50 Ω, AC
coupled, differential 2.92 mm
female connectors, max.
1 ps diff. skew)*17
Unfiltered Optical
Bandwidth*16
Absolute Maximum
Nondestructive Optical
Input
Internal Fibre Diameter
2.5 GHz
5 mW average; 10 mW
peak power at wavelength of
highest responsivity
62.5/125 μm
Multi Mode
10 GHz
1 mW average; 10 mW
peak power at wavelength of
highest responsivity
62.5/125 μm
Multi Mode
80 GHz
20 mW average; 60 mW
peak power at wavelength of
highest relative responsivity
9/125 μm
Single Mode
28 GHz
5 mW average; 10 mW
peak power at wavelength of
highest responsivity
9/125 μm
Single Mode
9 GHz (for all options
except 10G)
10 GHz (Option 10G)
65 GHz
1 mW average; 10 mW
peak power at wavelength of
highest responsivity
20 mW average; 60 mW
peak power at wavelength of
highest relative responsivity
62.5/125 μm
Multi Mode
9 μm/125 μm
Single Mode
*4 Contact Tektronix for details.
*16 Bandwidths shown are warranted unless printed in an italic typeface which represents a typical value. 80C08C, 80C12: Bandwidths and optical filters valid for OMA ≤ 500 μW (1550/1310 nm), OMA ≤ 860 μW (850 nm), OMA
≤1020 μW (780 nm).
*17 With Option CRTP.
*18 Frequency characteristic and ORR guaranteed for signals up to 500 μWp-p (80C08C, 80C12), respectively 200 μW (80C07B) at 1550 nm; pro-rated (higher power) for other wavelengths.
18
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Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Optical Sampling Module Characteristics (Cont.)
Module
80C07B
80C08C
80C10B*5
80C11
80C12
80C25GBE
Optical Return
Loss
Fibre Input
Accepted
>14 dB (Multi Mode) Single or Multi Mode
>24 dB (Single
Mode)
>14 dB (Multi Mode) Single or Multi Mode
>24 dB (Single
Mode)
>30 dB
Single Mode
>30 dB
Single Mode
>14 dB (Multi Mode) Single or Multi Mode
>24 dB (Single
Mode)
>30 dB
Single Mode
RMS Optical Noise (Typical)
RMS Optical Noise (Maximum)
Independent
Channel Deskew
0.50 μW at 155 Mb/s, 622 Mb/s,
1063 Mb/s, 1250 Mb/s;
0.70 μW at 2.488/2.500 Gb/s
1.7 μW at all filter rates (1550/1310 nm,
no CR)
1.0 μW at 155 Mb/s, 622 Mb/s,
1063 Mb/s, 1250 Mb/s;
1.5 μW at 2.488/2.500 Gb/s
3.0 μW at all filter rates (1550/1310 nm)
Standard
1310 nm
1550 nm
15 μW (25.8,
21 μW (25.8,
27.7 Gb/s)
27.7 Gb/s)
19 μW (30 GHz)
26 μW (30 GHz)
20 μW (39.8 Gb/s
28 μW (39.8 Gb/s
- 43.0 Gb/s)
- 43.0 Gb/s)
33 μW (65 GHz)
44 μW (65 GHz)
55 μW (80 GHz)
72 μW (80 GHz)
5.5 μW at all filter rates;
10.0 μW at 20 GHz
20.0 μW at 30 GHz
1.3 μW (all filters except Option 10G)
2.4 μW (’Full BW’ and Option 10G filters)
1310 nm
1550 nm
28 μW (25.8,
38 μW (25.8,
27.7 Gb/s)
27.7 Gb/s)
35 μW (30 GHz)
45 μW (30 GHz)
38 μW (39.8 Gb/s
50 μW (39.8 Gb/s
- 43.0 Gb/s)
- 43.0 Gb/s)
60 μW (65 GHz)
75 μW (65 GHz)
105 μW (80 GHz)
130 μW (80 GHz)
8.0 μW at all filter rates;
14.0 μW at 20 GHz
30.0 μW at 30 GHz
2.5 μW (all filters except Option 10G)
5.0 μW (’Full BW’ and Option 10G filters)
Standard
1310 nm
21 μW (25.8,
27.7 Gb/s)
44 μW (65 GHz)
1550 nm
15 μW (25.8,
27.7 Gb/s)
33 μW (65 GHz)
1310 nm
38 μW (25.8,
27.7 Gb/s)
75 μW (65 GHz)
1550 nm
28 μW (25.8,
27.7 Gb/s)
60 μW (65 GHz)
Standard
Standard
Standard
Standard
*5 Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).
Optical Sampling Module Characteristics (Cont.)
Module
Offset Capability
Power Meter
Power Meter Range
Power Meter Accuracy
Mask Test Optical
Sensitivity*19
80C07B
Standard
Standard
+4 dBm to –30 dBm
5% of reading
80C08C
80C10B*5,
80C25GBE
Standard
Standard
Standard
Standard
0 dBm to –30 dBm
+13 dBm to –21 dBm
5% of reading
5% of reading
80C11
Standard
Standard
+4 dBm to –30 dBm
5% of reading
80C12
Standard
Standard
0 dBm to –30 dBm
5% of reading
–22 dBm at 155 Mb/s,
622 Mb/s;
–20 dBm at 2488/2500 Mb/s
–16 dBm at all filter rates
25.8 and 27.7 Gb/s:
–8 dBm (1550 nm) and
–7 dBm (1310 nm);
39.813 to 43.018 Gb/s:
–7 dBm (1550 nm) and
–6 dBm (1310 nm)
–10 dBm at all filter rates;
–7 dBm at 20 GHz;
–4 dBm at 30 GHz
–19 dBm (for all options
except Option 10G)
–14 dBm (for Option 10G)
*5 Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).
*19 Smallest power level for mask test. Values represent theoretical typical sensitivity of NRZ eyes for comparison purposes. Assumes instrument peak-peak noise consumes most of the mask margin.
www.tektronix.com
19
Data Sheet
Optical Sampling Module Characteristics (Cont.)
TDR System (80E10, 80E08, 80E04 only)
Module
Characteristic
80E10
80E08
80E04
Channels
Input Impedance
Channel Input
Connector
Bandwidth
TDR Step
Amplitude
2
50 Ω nominal
1.85 mm
2
50 Ω nominal
2.92 mm
2
50 Ω nominal
3.5 mm
50 GHz
250 mV (polarity
of either step may
be inverted)
15 ps
30 GHz
250 mV (polarity
of either step may
be inverted)
20 ps
20 GHz
250 mV (polarity
of either step may
be inverted)
28 ps
12 ps
18 ps
23 ps
±250 ps
±250 ps
±50 ps
±250 ps
±250 ps
200 kHz
200 kHz
+100 ns – 500 ps
(slot deskew only)
200 kHz
Extinction Ratio Calibrated Accuracy (Opt.
01 ER Calibrated)*20
Accuracy
Reference Filter Repeatability
(Typical)
in Range [Gb/s]
(to itself
and to other
80Cxx-Opt. 01)
—
80C07B
80C08C
9.9…11.3
80C10B
80C11
9.9…11.3
—
—
80C25GBE
Option not available
±0.6% (–0.39 dB / ±1.2% (–0.76 dB /
+0.42 dB at 12 dB) +0.92 dB at 12 dB)
Option not available
±0.6% (–0.39 dB / ±1.2% (–0.76 dB /
+0.42 dB at 12 dB) +0.92 dB at 12 dB)
Option not available
TDR System
Reflected Rise
Time
TDR System
Incident Rise Time
TDR Step Deskew
Range
TDR Sampler
Deskew Range
TDR Step
Maximum
Repetition Rate
*20 Low ER signals (ER ≤ 6 dB): signal passes 802.3ae-like mask (scaled horizontally for bit rate); 105 samples
in mask. High ER signals (ER > 6 dB): signal passes OC-192-like mask (scaled horizontally for bit rate);
105 samples in mask.
Physical Characteristics
Module
Dimensions (mm/in.)
80C07B
80C08C
80C10B
80C11
80C12
80C25GBE
Weight (kg/lb.)
Width
Height
Depth
Net
165/6.5
165/6.5
165/6.5
165/6.5
165/6.5
165/6.5
25/1.0
25/1.0
25/1.0
25/1.0
25/1.0
25/1.0
305/12.0
305/12.0
305/12.0
305/12.0
305/12.0
305/12.0
<1.36/<3.0
<1.22/<2.7
<2.61/<5.75
<1.22/<2.7
<2.61/<5.75
<2.61/<5.75
Electrical Sampling Module Characteristics
Application Type
Channels
Input Impedance
Channel Input
Connector
Bandwidth*21
80E10
True-differential TDR, S-parameters
and fault isolation
2
50 ±1.0 Ω
50/40/30 GHz*11, 22
80E09
High-frequency, low-noise signal
acquisition and jitter characterization
2
50 ±1.0 Ω
80E08
80E07
True-differential TDR and S-parameters
Optimal noise/performance trade-off
for jitter characterization
High-speed electrical device
characterization
2
2
50 ±1.0 Ω
50 ±1.0 Ω
1.85 mm female, precision
adapter to 2.92 mm included
with 50 Ω SMA termination
1.85 mm female, precision
adapter to 2.92 mm included
with 50 Ω SMA termination
2.92 mm female
2.92 mm female
1
50 ±0.5 Ω
TDR impedance and crosstalk
characterization
Device characterization
High-frequency, high maximum
operating range signal acquisition
2
50 ±0.5 Ω
2
1
50 ±0.5 Ω
50 ±0.5 Ω
Module
80E06
80E04
80E03
80E01
1.85 mm female, precision
adapter to 2.92 mm included
with 50 Ω SMA termination
3.5 mm female
3.5 mm female
2.4 mm female, precision
adapter to 2.92 mm included
with 50 Ω SMA termination
*11 Calculated from .35 bandwidth rise time product.
*21 Values shown are warranted unless printed in an italic typeface which represents an unwarranted characteristic value that the instrument will typically perform to.
*22 User selectable.
20
www.tektronix.com
60/40/30 GHz*11, 22
30/20 GHz*11, 22
30/20 GHz*11, 22
70+ GHz
20 GHz*11
20 GHz*11
50 GHz
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Electrical Sampling Module Characteristics (Cont.)
Module
80E10
80E09
80E08
80E07
80E06
80E04
80E03
80E01
Rise Time
(10-90%)
Dynamic Range
7 ps*11
5.8 ps*11
11.7 ps*11
11.7 ps*11
5.0 ps*23
≤17.5 ps
≤17.5 ps
11.7 ps*11
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
Vp-p
Vp-p
Vp-p
Vp-p
Vp-p
Vp-p
Vp-p
Vp-p
Offset Range
±1.1
±1.1
±1.1
±1.1
±1.6
±1.6
±1.6
±1.6
V
V
V
V
V
V
V
V
Maximum Operating
Voltage
±1.1
±1.1
±1.1
±1.1
±1.6
±1.6
±1.6
±1.6
V
V
V
V
V
V
V
V
Maximum
Nondestruct
Voltage, DC+ACp-p
2.0
2.0
2.0
2.0
2.0
3.0
3.0
2.0
V
V
V
V
V
V
V
V
Vertical Number of
Digitized Bits
14 bits full scale
14 bits full scale
14 bits full scale
14 bits full scale
14 bits full scale
14 bits full scale
14 bits full scale
14 bits full scale
*11 Calculated from .35 bandwidth rise time product.
*23 Calculated from formula rise time = 0.35/(typical bandwidth).
www.tektronix.com
21
Data Sheet
Electrical Sampling Module Characteristics (Cont.)
Module
Vertical Sensitivity Range
DC Vertical Voltage Accuracy,
Single Point, within ±2 °C of
Compensated Temperature
Typical Step Response Aberrations
RMS Noise*10
80E10
10 mV to 1.0 V full scale
±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
50 GHz: 600 μV, ≤700 μV
40 GHz: 370 μV, ≤480 μV
30 GHz: 300 μV, ≤410 μV
80E09
10 mV to 1.0 V full scale
±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
80E08
10 mV to 1.0 V full scale
±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
80E07
10 mV to 1.0 V full scale
±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
80E06*23
10 mV to 1.0 V full scale
80E04
10 mV to 1.0 V full scale
±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
80E03
10 mV to 1.0 V full scale
±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
80E01
10 mV to 1.0 V full scale
±[2 mV + 0.007 (Offset) +
0.02 (Vertical Value – Offset)]
±1% or less over the zone 10 ns to 20 ps
before step transition; +6%, –10% or less
for the first 400 ps following step transition;
+0%, –4% or less over the zone 400 ps
to 3 ns following step transition; +1%,
–2% or less over the zone 3 ns to 100 ns
following step transition; ±1% after 100 ns
following step transition
±1% or less over the zone 10 ns to 20 ps
before step transition; +6%, –10% or less
for the first 400 ps following step transition;
+0%, –4% or less over the zone 400 ps
to 3 ns following step transition; +1%,
–2% or less over the zone 3 ns to 100 ns
following step transition; ±1% after 100 ns
following step transition
±1% or less over the zone 10 ns to 20 ps
before step transition; +6%, –10% or less
for the first 400 ps following step transition;
+0%, –4% or less over the zone 400 ps
to 3 ns following step transition; +1%,
–2% or less over the zone 3 ns to 100 ns
following step transition; ±1% after 100 ns
following step transition
±1% or less over the zone 10 ns to 20 ps
before step transition; +6%, –10% or less
for the first 400 ps following step transition;
+0%, –4% or less over the zone 400 ps
to 3 ns following step transition; +1%,
–2% or less over the zone 3 ns to 100 ns
following step transition; ±1% after 100 ns
following step transition
±5% or less for first 300 ps following
step transition
±3% or less over the zone 10 ns to 20 ps
before step transition; +10%, –5% or less for
the first 300 ps following step transition; ±3%
or less over the zone 300 ps to 5 ns following
step transition; ±1% or less over the zone
5 ns to 100 ns following step transition; 0.5%
after 100 ns following step transition
±3% or less over the zone 10 ns to 20 ps
before step transition; +10%, –5% or less for
the first 300 ps following step transition; ±3%
or less over the zone 300 ps to 5 ns following
step transition; ±1% or less over the zone
5 ns to 100 ns following step transition;
±0.5% after 100 ns following step transition
±3% or less over the zone 10 ns to 20 ps
before step transition; +12%, –5% or
less for the first 300 ps following step
transition; +5.5%, –3% or less over the
zone 300 ps to 3 ns following step transition;
±1% or less over the zone 3 ns to 100 ns
following step transition; ±0.5% after
100 ns following step transition
*10 Values shown are warranted unless printed in an italic typeface which represents a typical value.
*23 Calculated from formula rise time = 0.35/(typical bandwidth).
22
www.tektronix.com
60 GHz: 450 μV, ≤600 μV
40 GHz: 330 μV, ≤480 μV
30 GHz: 300 μV, ≤410 μV
30 GHz: 300 μV, ≤410 μV
20 GHz: 280 μV, ≤380 μV
30 GHz: 300 μV, ≤410 μV
20 GHz: 280 μV, ≤380 μV
1.8 mV, ≤2.4 mV (maximum)
600 µV, ≤1.2 mV (maximum)
600 µV, ≤1.2 mV (maximum)
1.8 mV, ≤2.3 mV (maximum)
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
S-parameter Performance Characteristics (80E10)
Measurement Conditions
All measurements were performed after proper warm up as specified in
the DSA8200 manual
Standard S-parameter dynamic range measurement practices were
used to determine the dynamic range of the module
Uncertainty results were derived from a wide range of devices, with 250
averages
Better dynamic range can be achieved by selecting lower bandwidth
settings on the 80E10 module due to lower RMS noise floor
Results apply to single-ended or differential measurements
Dynamic Range
Uncertainty
www.tektronix.com
23
Data Sheet
Physical Characteristics for Electrical Sampling Modules
Module
80E10*24
80E09*24
80E08*24
80E07*24
80E06
80E04
80E03
80E01
Width
Height
Depth
Weight
(kg/lb.)
Net
55/2.2
55/2.2
55/2.2
55/2.2
79/3.1
79/3.1
79/3.1
79/3.1
25/1.0
25/1.0
25/1.0
25/1.0
25/1.0
25/1.0
25/1.0
25/1.0
75/3.0
75/3.0
75/3.0
75/3.0
135/5.3
135/5.3
135/5.3
135/5.3
0.175/0.37
0.175/0.37
0.175/0.37
0.175/0.37
0.4/0.87
0.4/0.87
0.4/0.87
0.4/0.87
Dimensions (mm/in.)
*24 Remote module characteristics.
80A05 and 80A07 Electrical Clock Recovery Module
Product Feature
80A05
80A07
Standard
Option 10G
■
■
■
■
■
■
■
■
♦*25
■
■
■
♦*26
■
♦*26
■
■
■
■
■
■
■
♦*26
■
■
♦*26
■
■
■
■
■
♦*25
♦*25
♦*26
■
♦*26
■
♦*25
■
■
♦*25
■
■
■
Supported Specifications
Enumerated Standards
OC3/STM1
155.52 Mb/s
OC12/STM4
622.08 Mb/s
Fibre Channel
1.063 Gb/s
Gigabit
1.25 Gb/s
Ethernet
SAS Gen I
1.50 Gb/s
2 GB Fibre
2.125 Gb/s
Channel
OC48/STM16
2.488 Gb/s
2 GB Ethernet
2.50 Gb/s
PCI Express I
2.50 Gb/s
Infiniband®
2.50 Gb/s
2.5G G.709
2.666 Gb/s
FEC
SAS Gen II
3.0 Gb/s
XAUI,
3.125 Gb/s
10GBASE-X
10GB Fibre
3.188 Gb/s
Channel x4
4 GB Fibre
4.25 Gb/s
Channel
FB-DIMM1
3.2, 4.0,
4.8 Gb/s
PCI Express II
5.0 Gb/s
FB-DIMM2
4.8, 6.4, 8.0,
9.6 Gb/s
OIF CEI
6+ Gb/s
2x XAUI
6.25 Gb/s
8 GB Fibre
8.50 Gb/s
Channel*9
OC192/STM64 9.953 Gb/s
9.95-11.2
XFP/XFI
24
www.tektronix.com
■
♦*25, 26
■
♦*25, 26
♦*25, 26
■
■
♦*25
■
■
■
♦*25
♦*25
■
■
■
Product Feature
80A05
Standard
10GBASE-W
10GBASE-R*9
10GB Fibre
Channel
G.975 FEC
G.709 FEC
OIF CEI
10 GbE w/
FEC
Super FEC
80A07
Option 10G
9.953 Gb/s
10.31 Gb/s
10.51 Gb/s
■
■
■
♦*25
■
10.66 Gb/s
10.71 Gb/s
11+ Gb/s
11.10 Gb/s
■
■
♦*25
■
♦*25
♦*25
■
♦*25
12.50 Gb/s
■
♦*25
♦*25
Additional enumerated standard
rates are supported with
8000 Series Firmware Releases
higher than 2.4.x
100 Mb/s to
50 Mb/s to
50 Mb/s to
Clock Recovery Ranges for
12.5 Gb/s
3.188 Gb/s
3.188 Gb/s
Custom (User specified) Rates
continuous
3.267 to
4.25 Gb/s
(in addition to enumerated lists
4.25 Gb/s
above)
4.900 to
6.375 Gb/s
9.800 to
12.60 Gb/s
Sensitivity (Clock recovery will lock, differential data is given for each input)
Lowest Supported Rate to
Differential ≤8 mVp-p
Differential
2.70 Gb/s
15 mV (typ)
Single Ended 10 mVp-p
Single Ended
2.70 to 11.19 Gb/s
Differential
30 mV (typ)
≤12 mVp-p
Single Ended
15 mVp-p
11.19 to 12.60 Gb/s
Differential
≤15 mVp-p
Single Ended
20 mVp-p
*9 Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC
filter, as defined by T11 committee in April 2009, is identical to the 10BASE-R 10.313G filter and is available
for 80C12 Option 10G modules only; and is identified as 10BASE-R.
*25 The standard is not enumerated but is supported as a custom rate.
*26 No spread spectrum clocking support.
DSA8200 Mainframe Physical Characteristics
Dimensions (mm/in.)
Weight (kg/lb.)
Width
Height
Depth
Net
457/18.0
343/13.5
419/16.5
21/46
Computer System and Peripherals
Characteristic
Description
Operating System
CPU
PC System Memory
Hard Disk Drive
DVD-ROM/CD-RW
Drive
Windows XP
Intel Celeron 2.93 GHz processor
512 MB
Rear-panel, removable hard disk drive, 40 GB capacity
Front-panel DVD-ReadOnly/CD-ReadWrite drive with
CD-creation software application
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Input/Output Ports
Characteristic
Description
Front Panel
USB 2.0 Port
Anti-static
Connection
Trigger Direct Input
Trigger Pre-scale
Input
Internal Clock
Output
External 10 MHz
Reference Input
DC Calibration
Output
One USB 2.0 connector
Banana-jack connector, 1 MΩ
See Trigger System specification
See Trigger System specification
See Trigger System specification
Ordering Information
DSA8200 Digital Serial Analyzer Sampling Oscilloscope
Includes: User manual, quick reference card, MS Windows XP compatible keyboard
and mouse, touch screen stylus, online help, programmer online guide, power cord.
With OpenChoice™ software, Tektronix provides enhanced test and measurement
analysis with the capability of full integration of third-party software on the open
Windows oscilloscopes. By working with the industry leaders, National Instruments
and The MathWorks, examples of software programs from these companies are
featured on all Tektronix open Windows oscilloscopes.
Options
±5 V maximum
Option
Description
±1.25 V maximum
Opt. GT
Opt. JARB
Gated Trigger
Jitter Analysis of Arbitrary Data (included with purchase
of Opt. JNB or Opt. JNB01). See 80SJARB for more
information
Essential and Advanced Jitter, Noise, and BER Analysis
Software. See 80SJNB Essentials and 80SJNB Advanced
for more information
Rear Panel
USB Ports
Parallel Port
LAN Port
Serial Port
GPIB
VGA Video Port
4 USB 2.0 connectors
IEEE 1284, DB-25 connector
RJ-45 connector, supports 10BASE-T, 100BASE-T
DB-9 COM1 port
IEEE488.2 connector
DB-15 female connector; connect a second monitor to use
dual-monitor display mode
Oscilloscope VGA DB-15 female connector, connect to show the oscilloscope
Video Port
display, including live waveforms on an external monitor or
projector
Gated Trigger Input (Option GT only); See Trigger System specification
Operating Requirements
Characteristic
Description
Power Requirements
Line voltage and 100 to 240 V AC ±10% 50/60 Hz
frequency
115 V AC ±10% 400 Hz
Environmental Characteristics
Temperature
Operating
+10 °C to +40 °C
Nonoperating –22 °C to +60 °C
Relative Humidity
20% to 80% at or below 40 °C (upper limit de-rates to 45%
Operating
relative humidity at 40 °C)
(Floppy disk
and CD-ROM
not installed)
Nonoperating 5% to 90% at or below 60 °C (upper limit de-rates to 20%
relative humidity at +60 °C)
Altitude
Operating
3,048 m (10,000 ft.)
Nonoperating 12,190 m (40,000 ft.)
Electromagnetic
89/336/EEC
Compatibility
Safety
UL3111-1, CSA1010.1, EN61010-1, IEC61010-1
Opt. JNB
Opt. JNB01
Service Options
Option
Description
Opt.
Opt.
Opt.
Opt.
Opt.
Opt.
Opt.
Calibration Service 3 Years
Calibration Service 5 Years
Calibration Data Report
Calibration Data Report 3 Years (with Opt. C3)
Calibration Data Report 5 Years (with Opt. C5)
Repair Service 3 Years
Repair Service 5 Years
C3
C5
D1
D3
D5
R3
R5
International Power Plug Options
Option
Description
Opt.
Opt.
Opt.
Opt.
Opt.
Opt.
Opt.
Opt.
North America
Universal EURO
United Kingdom
Australia
240 V, North America
Switzerland
China
No power cord
A0
A1
A2
A3
A4
A5
A10
A99
www.tektronix.com
25
Data Sheet
Other Accessories
Accessory
Description
Sampling Module Extender Cable (2 meter)
SlotSaver Adapter Extender Cable
Order 80N01 (not compatible with 80E10, 80E09, 80E08, or 80E07 modules)
Brings power and control to the 80A06 when operated externally from the mainframe, saving slot space (compatible with 80A06
and 80A02). Order 174-5230-xx
Filter kit for non-sinusoidal phase reference clock signal with frequency between 2 GHz and 4 GHz. Order 020-2566-xx
Filter kit for non-sinusoidal phase reference clock signal with frequency between 4 GHz and 6 GHz. Order 020-2567-xx
Filter kit for non-sinusoidal phase reference clock signal with frequency between 6 GHz and 8 GHz. Order 020-2568-xx
DC to 18 GHz. Order 015-1001-xx
DC to 18 GHz. Order 015-1002-xx
(2.4 mm or 1.85 mm male to 2.92 mm female) DC to 40 GHz. Order 011-0157-xx
50 Ω, impedance matching power divider, SMA male to two SMA females. Order 015-0705-xx
Order 016-1791-xx
Order 006-3415-04
13 GHz and 16 GHz TriMode™ Differential probes. Requires 80A03 Interface module
6 GHz Active FET Probe. Requires 80A03 Interface module
5 GHz Active FET Probe. Requires 80A03 Interface module
5 GHz 50 Ω Differential to Single-ended Active Probe. Requires 80A03 Interface module. Note that the P7380 probes are
recommended over the P7350 probes for sampling purposes due to their higher bandwidth and signal fidelity
8 GHz 50 Ω Differential to Single-ended Active Probe. Requires 80A03 Interface module
9 GHz Passive Probe; the probe consists of a very high-quality 20 GHz probe tips, plus an extremely flexible SMA cable. For
higher frequency performance the 015-0560-xx, or some of the accessory cables listed can be used
20 GHz Single-ended TDR Probe. 80A02 module recommended for static protection of the sampling or TDR module
18 GHz 100 Ω Differential Impedance TDR Hand Probe
Pre-scaled Trigger Amplifier. Not required on the DSA8200, CSA8200, or TDS8200 mainframes with their increased sensitivity
pre-scaler. The amplifier enhances pre-scaler sensitivity on the older TDS8000B and CSA8000B mainframes
DSA8200 EOS/ESD Protection module (1 channel). P8018 TDR probe recommended
Enables the use of two Tektronix P7000 Series TekConnect™ probes on the DSA8200 or 8000 Series sampling oscilloscopes
Phase Reference module for low-jitter acquisition (with or without trigger). Accepts signals from 2 GHz to 25 GHz (external filter
might be required below 8 GHz), or to 60 GHz with Option 60G
Electrical Clock Recovery module. Applicable to electrical signals and for the 80C12
50 Mb/s - 2.700 Gb/s
2.700 Gb/s - 3.188 Gb/s
Rate of 4 Gigabit Fibre Channel 4.250 Gb/s
3.267 Gb/s - 4.250 Gb/s
4.900 Gb/s - 6.375 Gb/s
9.800 Gb/s - 12.60 Gb/s
PatternSync module for 80SJNB jitter analysis package. Programmable divider for creating a trigger pulse from patterns up to
223 in length
Electrical Clock Recovery module. 80A07 recovers clocks from serial data streams for all of the most common electrical
standards in the continuous 100 Mb/s to 12.5 GB/s range. Applicable to electrical signals and for 80C12
80SJARB Jitter Analysis of Arbitrary Data software. Provides a basic jitter measurement tool capable of measuring jitter on
any waveform – random or repetitive. Also see Opt. JARB
80SJNB Essentials with Jitter, Noise, and BER Analysis software. Provides separation of jitter and noise into their constituent
components and provides highly accurate eye-opening and BER calculations. Also see Opt. JNB/JNB01
80SJNB Advanced adds equalization, channel emulation, fixture de-embedding. Also see Opt. JNB/JNB01
82A04 Filter 2 GHz
82A04 Filter 4 GHz
82A04 Filter 6 GHz
2X Attenuator (SMA male-to-female)
5X Attenuator (SMA male-to-female)
Connector Adapter
Power Divider
Rackmount Kit
Wrist Strap (Anti-static)
P7513/P7516
P7260
P7350
P7350SMA
P7380SMA
P6150
P8018
P80318
80A01
80A02
80A03
82A04
80A05
The standard version of 80A05 supports
signals in the following ranges:
The Option 10G adds the ranges of:
80A06
80A07
80SJARB
80SJNB Essentials
80SJNB Advanced
26
www.tektronix.com
Digital Serial Analyzer Sampling Oscilloscope — DSA8200
Interconnect Cables (3rd Party)
Tektronix recommends using quality high-performance interconnect cables with
these high-bandwidth products in order to minimize measurement degradation
and variations. The W.L. Gore and Associates’ cable assemblies listed below are
compatible with the 2.92 mm, 2.4 mm, and 1.85 mm connector interface of the
80Exx modules. Assemblies can be ordered by contacting Gore by phone at (800)
356-4622, or on the Web at www.gore.com/tektronix
Calibration Kits and Accessories (3rd Party)
To facilitate S-parameter measurements with the new 80E10, 80E08, and 80E04
electrical TDR modules and IConnect® software, we recommend precision
calibration kits, adapter kits, connector savers, airlines, torque wrenches, and
connector gauges from Maury Microwave. These components, accessible at
www.maurymw.com/tektronix.htm, are compatible with the 2.92 mm, 2.4 mm, and
1.85 mm connector interface of the 80Exx modules. Cal kits and other components
can be ordered by contacting Maury Microwave.
Interconnect Cables
015-0560-xx (450 mm / 18 in.; 1 dB loss at 20 GHz) cable is a high-quality cable
recommended for work up to 20 GHz.
Cable
Frequency
Connectors
Length
2.92 mm male
2.4 mm male
1.85 mm male
18.0 inches
18.0 inches
18.0 inches
Bench Top Test Cable Assemblies
TEK40PF18PP
TEK50PF18PP
TEK65PF18PP
40 GHz
50 GHz
65 GHz
High-frequency Interconnect Cables for
Electrical Sampling Modules
TEK40HF06PP
TEK40HF06PS
40 GHz
40 GHz
TEK50HF06PP
TEK50HF06PS
50 GHz
50 GHz
TEK65HF06PP
TEK65HF06PS
65 GHz
65 GHz
2.92 mm male
2.92 mm male;
2.92 mm female
2.4 mm male
2.4 mm male;
2.4 mm female
1.85 mm male
1.85 mm male,
1.85 mm female
6.0 inches
6.0 inches
6.0 inches
6.0 inches
6.0 inches
6.0 inches
Product(s) are manufactured in ISO registered facilities.
www.tektronix.com
27
Data Sheet
Contact Tektronix:
ASEAN / Australasia (65) 6356 3900
Austria 00800 2255 4835*
Balkans, Israel, South Africa and other ISE Countries +41 52 675 3777
Belgium 00800 2255 4835*
Brazil +55 (11) 3759 7600
Canada 1 800 833 9200
Central East Europe, Ukraine, and the Baltics +41 52 675 3777
Central Europe & Greece +41 52 675 3777
Denmark +45 80 88 1401
Finland +41 52 675 3777
France 00800 2255 4835*
Germany 00800 2255 4835*
Hong Kong 400 820 5835
India 000 800 650 1835
Italy 00800 2255 4835*
Japan 81 (3) 6714 3010
Luxembourg +41 52 675 3777
Mexico, Central/South America & Caribbean (52) 56 04 50 90
Middle East, Asia, and North Africa +41 52 675 3777
The Netherlands 00800 2255 4835*
Norway 800 16098
People’s Republic of China 400 820 5835
Poland +41 52 675 3777
Portugal 80 08 12370
Republic of Korea 001 800 8255 2835
Russia & CIS +7 (495) 7484900
South Africa +41 52 675 3777
Spain 00800 2255 4835*
Sweden 00800 2255 4835*
Switzerland 00800 2255 4835*
Taiwan 886 (2) 2722 9622
United Kingdom & Ireland 00800 2255 4835*
USA 1 800 833 9200
* European toll-free number. If not accessible, call: +41 52 675 3777
Updated 25 May 2010
For Further Information. Tektronix maintains a comprehensive, constantly expanding
collection of application notes, technical briefs and other resources to help engineers working
on the cutting edge of technology. Please visit www.tektronix.com
Copyright © Tektronix, Inc. All rights reserved. Tektronix products are covered by U.S. and foreign patents,
issued and pending. Information in this publication supersedes that in all previously published material.
Specification and price change privileges reserved. TEKTRONIX and TEK are registered trademarks of
Tektronix, Inc. All other trade names referenced are the service marks, trademarks, or registered trademarks
of their respective companies.
21 Jun 2010
www.tektronix.com
85W-17654-17
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