Series 2600
®
• Combines a precision power
supply, true current source,
DMM, arbitrary waveform
generator, V or I pulse generator
with measurement, electronic
load, and trigger controller—all
in one instrument
• >10,000 readings/s and >5,000
source-measure points/s to
memory provide faster test
times
• The embedded Test Script
Processor (TSP™) offers
unparalleled system automation
and two to four times the test
throughput of competitive
products in I-V functional test
applications
• TSP-Link™ master/slave
connection seamlessly integrates multiple Series 2600
SourceMeter channels into a
system that can be programmed
and controlled as a single
instrument
• Free Test Script Builder software
simplifies creating powerful test
scripts for programming custom
test functions
• Free LabTracer™ 2.0 software
available for curve tracing and
fast, easy startup
• Each 40W, 3A channel is
electrically isolated for high
integrity measurements and
wiring flexibility
• Industry’s highest SMU rack
density for automated test
applications
Series 2600 System SourceMeter instruments
offer electronic component and semiconductor
device manufacturers a scalable, high throughput, highly cost-effective solution for precision
DC, pulse, and low frequency AC sourcemeasure testing. Building on the tightly integrated source-measure technology originally developed for Keithley’s popular Series 2400
SourceMeter line, Series 2600 instruments provide from two to four times the test speed of
competitive solutions in I-V functional test applications. They also offer higher source-measure
channel density and a significantly lower cost of
ownership than competing products. Patented
analog-to-digital converters provide simultaneous I and V measurements in less than 100µs
(10,000 rdgs/s) and source-measure sweep
speeds of less than 200µs per point (5,000
points/s). This high speed source-measure capability, plus advanced automation features and
time-saving software tools make Series 2600
SourceMeter instruments an ideal solution for
I-V testing of a wide range of devices.
System scalability without a
mainframe
Series 2600 instruments incorporate an innovative technology that makes it possible to create
multi-channel I-V test systems economically, but
without sacrificing test throughput. TSP-Link™ is
a high speed system expansion interface, which
test system builders can use to connect multiple
1.888.KEITHLEY
2 Channel System
SMU A
SMU B
2602
GPIB
TSP-Link In
TSP-Link Out
3 Channel System
SMU A
Master
SMU B
2602
SMU C
Slave
2601
GPIB
TSP-Link In
TSP-Link Out
A
G R E A T E R
To PC
GPIB
TSP-Link In
TSP-Link Out
16+ Channel System
SMU A
Master
SMU B
2602
SMU C
Slave
SMU D
2602
SMU E
Slave
2601
GPIB
TSP-Link In
TSP-Link Out
To PC
GPIB
TSP-Link In
TSP-Link Out
GPIB
TSP-Link In
TSP-Link Out
•
•
•
TSP-Link makes it easy to scale the system's
channel count to match the application.
(U.S. only)
www.keithley.com
To PC
Scalable, Integrated Source and Measure Solutions
System SourceMeter
Multi-Channel I-V Test Solutions
M E A S U R E
O F
SOURCE AND MEASURE
Series 2600
C O N F I D E N C E
1
Series 2600
Ordering Information
Scalable, Integrated Source and Measure Solutions
2601
2602
Single-channel System
SourceMeter Instrument
Dual-channel System
SourceMeter Instrument
ACCESORIES SUPPLIED
Test Script Builder software
IVI/VISA drivers for Visual Basic,
VC/C++, LabVIEW, TestPoint, and
LabWindows™/CVI
Mating screw terminal connectors with strain relief and covers
TSP-Link cable (CA-180-3A)
Factory and custom
TSP test scripts
The Test Script Processor is programmed
with a simple BASIC-style programming
language that runs in real time on the
instrument. Keithley provides built-in test
scripts for:
• Sweeping.
• Pulsing.
• Waveform generation.
• Common component tests like binary
search, VF , VTH , LIV (light intensity/
current/voltage).
SOURCE AND MEASURE
A number of test scripts are included in
the instrument, while others can be downloaded at no charge from www.keithley.
com. These pre-written factory test scripts
can be used as provided or easily customized for a given application, so production
users can get their systems up and running faster than ever before.
Users can also create custom test scripts
in several different ways, including a programming tool called Test Script Builder.
Custom scripts can be downloaded from
the PC to the master SourceMeter unit
and saved in non-volatile memory. Both
models provide 16 megabytes of
non-volatile memory for storing up to
50,000 lines of TSP code and more than
100,000 readings.
1.888.KEITHLEY
Series 2600 instruments in a master/slave configuration. Once connected, all the Series 2600 instruments in a system can be programmed and operated under the control of the master unit, just as if
they were housed in the same chassis. By eliminating the need for a chassis/mainframe, the TSP-Link
provides virtually unlimited flexibility to scale a test system’s channel count up or down as the application requires, while ensuring seamless integration.
New capabilities for increasing test speed and lowering test cost
The Test Script Processor (TSP™)
Any Series 2600-based system can run high speed, embedded test scripts on the master unit’s Test
Script Processor (TSP), the other major new technology on which the Series 2600 is based. The test
sequence is processed and run on the embedded computer in the instrument, rather than from an
external PC controller, so delays due to GPIB traffic congestion are eliminated. TSP test scripts allow
throughput gains of up to 10× over equivalent PC-based programs controlling the same instruments
via GPIB. TSP test scripts can be loaded and run from the front panel or over the system’s GPIB interface. A single TSP test script, running on the master unit, can control all the SourceMeter channels in
the system and acquire data from any Series 2600 instrument connected to the TSP-Link, which supports connections for up to 64 Series 2600 instruments.
TSP for advanced automation
A Series 2600-based system can stand alone as a complete measurement and automation solution for
semiconductor device or component testing, with the master unit controlling sourcing, measuring,
pass/fail decisions, test sequence flow control, binning, and the component handler or prober. In
contrast with existing embedded test sequencers for instrumentation, the TSP test scripts offer far
greater programming flexibility, including support for:
• Instrument command queuing.
• Modular subroutines with passable parameters.
• Pass/fail and limit testing.
• A wide range of math operations.
• Flexible branching and looping capability.
• Flexible external triggering.
• Intelligent digital I/O read and write capability.
• RS-232 communication.
ACCESSORIES AVAILABLE
CABLES AND CONNECTORS
2600-BAN
Banana Test Leads/Adapter Cable. For a single
Series 2600 SourceMeter channel (two needed
for use with Model 2602)
8606
High Performance Modular Probe Kit. For use
with 2600-BAN
2600-KIT
Extra screw terminal connector, strain relief and
cover for a single SourceMeter channel (two
needed for use with Model 2602)
2600-TRIAX
Triax Adapter. For a single Series 2600
SourceMeter channel (two needed for use with
Model 2602)
7078-TRX-*
3-Slot, Low Noise Triax Cable. For use with
2600-TRIAX adapter
SC-200
Shielded Twisted Pair Cable. Recommended for
general-purpose use with Series 2600 System
SourceMeter instruments.
DIGITAL I/O, TRIGGER LINK AND TPS-LINK
2600-TLINK
Digital I/O to TLINK Adapter Cable, 1m
CA-126-1
Digital I/O and Trigger Cable, 1.5m
CA-180-3A
CAT5 Crossover Cable for TSP-Link
GPIB INTERFACES AND CABLES
7007-1
Double Shielded GPIB Cable, 1m (3.3 ft.)
7007-2
Double Shielded GPIB Cable, 2m (6.6 ft.)
KPCI-488
GPIB/IEEE-488 Interface Board for the PCI Bus
KPC-488.2AT GPIB/IEEE-488 Interface Board for the ISA Bus/XT
KUSB-488
GPIB/IEEE-488 Interface Module for the USB Bus
SWITCHING
7002-HD
High Density Switch Mainframe
7002-HD-MTX1 Differential 6×32 Matrix Card
7002-HD-MUX1 Differential Quad 1×40 Multiplexer Card
RACK MOUNT KITS
4299-1
Single Rack Mount Kit with front and rear support
4299-2
Dual Rack Mount Kit with front and rear support
SOFTWARE
LabTracer™ 2.0 Curve Tracing Software (downloadable)
EXTENDED WARRANTIES
2601-EW
1 Year Extended Warranty for Model 2601
2602-EW
1 Year Extended Warranty for Model 2602
(U.S. only)
www.keithley.com
2
®
System SourceMeter
Multi-Channel I-V Test Solutions
A
G R E A T E R
M E A S U R E
O F
C O N F I D E N C E
®
Each Series 2600 SourceMeter channel offers a highly flexible, fourquadrant source coupled with precision voltage and current meters/
limiters. Each channel can be configured as a:
• Precision power supply (6V @ 3A, 40V @ 1A output with 1pA readback
resolution).
• True current source (3A @ 6V, 1A @ 40V).
• DMM (DCV, DCI, ohms, power, with 51⁄2-digit resolution).
• Power V or I pulse generator (Pulse width: 150µs and longer—source
only; 250µs and longer—source and measure).
• Power V or I waveform generator (20-point sine wave up to 400Hz in a
TSP test script).
• Electronic load (with sink mode capability).
Source
Source
Feedback
Series vs. parallel ranging topologies
+3A
+1A
–40V
–6V +6V
High speed and precision A/Ds with simultaneous source-readback
All Series 2600 instruments provide four-quadrant operation and can be
connected in series or in parallel to extend their dynamic range. In the
first and third quadrants, they operate as a source, delivering power to a
load. In the second and fourth quadrants, they operate as a sink, dissipating power internally. They measure voltage and current simultaneously
with up to 51⁄2-digit resolution and display voltage, current, resistance or
power readings.
Two analog-to-digital converters per channel (one for I, one for V) can run
simultaneously, providing precise source-readback without sacrificing test
throughput. These A/D converters offer the flexibility of programmable
integration rates, allowing the user to optimize for either high speed
(>10,000 rdgs/s at 0.001 NPLC setting) or for high resolution (up to 24
bits at 10 NPLC setting) to make high accuracy measurements.
Digital I/O Interface
A back panel port on every Series 2600 instrument provides 14 bits of universal digital I/O to link the instrument to a variety of popular handlers for
sorting and binning components after testing. These I/O lines are also
backward-compatible with Keithley’s earlier Trigger Link instrument triggering technology. These lines simplify integrating Series 2600 instruments
into systems that employ other external instrumentation, including Series
2400 SourceMeter instruments, Series 7000 switch mainframes, and Series
2700 Integra data acquisition/multimeter systems.
Dramatic throughput improvements for production test
Series 2600 instruments help component manufacturers improve their test
throughput dramatically, as well as provide test solutions that can handle
today’s devices, which often have higher pin counts and more analog circuitry than earlier designs. In the past, manufacturers have been forced by
the lack of optimized test solutions for multi-channel source-measure
applications to choose between bulky, expensive mainframe-based systems,
slow instrument-based systems employing PC control, or fast instrument-
1.888.KEITHLEY
Feedback
+40V
–1A
–3A
Models 2601 and 2602 I-V capability
Prober or
component
handler
GPIB
SMU A
SMU B
DUT
Needed only
to preload
test scripts
TSP-Link
SMU C
SMU D
Digital I/O or RS-232 for
binning, handshake
Digital I/O to
trigger external
instruments
and read
pass/fail status
Other
Instruments
Automated testing. With all the capability available in a TSP test script, a
Series 2600-based system can run high throughput I-V functional test
routines, completely independent of PC operating system and
communications delays.
(U.S. only)
www.keithley.com
A
G R E A T E R
M E A S U R E
O F
SOURCE AND MEASURE
Third-generation SMU design ensures faster test times
The Series 2600's new SMU design enhances test speed in several ways.
For example, while earlier designs used a parallel current ranging topology, the Series 2600 uses a series ranging topology (patent pending), which
provides faster and smoother range changes and outputs that settle more
quickly. It also allows the current output limit to be programmed independently of the measurement current range for fast charging of capacitive
loads and more intuitive operation during bench use.
Scalable, Integrated Source and Measure Solutions
System SourceMeter
Multi-Channel I-V Test Solutions
Series 2600
C O N F I D E N C E
3
®
System SourceMeter
Multi-Channel I-V Test Solutions
Scalable, Integrated Source and Measure Solutions
Series 2600
based systems that require complex development. The Model 2601 and
2602 offer:
TYPICAL APPLICATIONS
• The highest density available in any SMU-based system to address
growing pin counts.
• I-V functional test and characterization of a wide range of
devices, including:
• The industry’s fastest throughput, which helps reduce the cost of test.
The speed of the on-board processor and TSP test scripts, combined
with the tight triggering synchronization offered by the TSP-Link bus,
makes high speed parallel testing practical.
• A lower capital investment. By eliminating the need for a mainframe/
chassis, they allow test engineers to configure a readily scalable system
at a significantly lower cost per channel than other solutions.
Test Script Builder software
Test Script Builder is a free software tool that is provided with all Series
2600 SourceMeter instruments to help users create, modify, debug, and
store TSP test scripts. It provides a project/file manager window to store
and organize test scripts, a text-sensitive program editor (like Visual Basic)
to create and modify test TSP code, and an immediate instrument control
window to send GPIB commands and receive data from the instrument.
The immediate window allows viewing the output of a given test script and
simplifies debugging.
- Discrete and passive components.
- Two-leaded – Resistors, disk drive heads, metal oxide
varistors (MOVs), diodes, zener diodes, sensors,
capacitors, thermistors.
- Three-leaded – Small signal bipolar junction transistors
(BJTs), field-effect transistors (FETs), and more.
- Parallel test – Two- and three-leaded component arrays.
- Simple ICs – Optos, drivers, switches, sensors.
• Integrated devices – Small Scale Integrated (SSI) and
Large Scale Integrated (LSI).
- Analog ICs.
- Radio frequency integrated circuits (RFICs).
- Application specific integrated circuits (ASICs).
- System on a chip (SOC) devices.
• Optoelectronic devices such as light-emitting diodes (LEDs),
laser diodes, high brightness LEDs (HBLEDs), vertical cavity
surface-emitting lasers (VCSELs), displays.
• R&D and device characterization of these types
of devices.
Store and
organize
test scripts
in the file
manager
window.
Create and modify test
TSP code in the context
sensitive editor window.
SOURCE AND MEASURE
The immediate window
displays test script output
and assists in debugging.
High power and simplicity for R&D applications
In R&D and device characterization environments, Series 2600 instruments
offer high testing versatility for both interactive and automated testing. The
free downloadable LabTracer 2.0 software allows users to configure and
control up to eight Series 2600 or 2400 SourceMeter channels quickly and
easily for curve tracing or device characterization. It provides a simple
graphical user interface for setup, control, data acquisition, and graphing
of DUT data from SourceMeter instruments. When used together,
LabTracer and SourceMeter instruments offer lab users a powerful,
easy-to-use, and economical alternative to chassis-based solutions.
1.888.KEITHLEY
(U.S. only)
www.keithley.com
4
Graphical instrument setup. LabTracer 2.0 supports up to eight Series
2600 SourceMeter channels. Model 2400 and Model 2410 SourceMeter
instruments are also supported for extended voltage capability. Dropdown menus in LabTracer 2.0’s instrument setup window allow configuring any channel of a SourceMeter instrument for fixed point or
sweeping operation. Once the instrument is configured, a single key
press is all it takes to execute a test. Once a test is complete, data is
displayed in the spreadsheet panel and graphing panel. Measurement
data can be manipulated in the spreadsheet by applying a formula to
the results. For more detailed analysis, data can also be exported to
Microsoft® Excel with a simple cut and paste.
A
G R E A T E R
M E A S U R E
O F
C O N F I D E N C E
®
System SourceMeter
Multi-Channel I-V Test Solutions
SPECIFICATION CONDITIONS
ADDITIONAL SOURCE SPECIFICATIONS
This document contains specifications and supplemental information for the Models 2601 and 2602.
Specifications are the standards against which the Models 2601 and 2602 are tested. Upon leaving the
factory the 2601 & 2602 meet these specifications. Supplemental and typical values are nonwarranted, apply at 23°C, and are provided solely as useful information.
The source and measurement accuracies are specified at the SourceMeter CHANNEL A (2601 and
2602) or SourceMeter CHANNEL B (2602) terminals under the following conditions:
1. 23°C ± 5°C, <70% relative humidity.
2. After 2 hour warm-up.
3. Speed normal (1 NPLC).
4. A/D auto-zero enabled.
5. Remote sense operation or properly zeroed local operation.
6. Calibration period = 1 year.
SOURCE SPECIFICATIONS
VOLTAGE PROGRAMMING ACCURACY 1
RANGE
100.000 mV
1.00000 V
6.00000 V
40.0000 V
PROGRAMMING
RESOLUTION
1 µV
10 µV
10 µV
100 µV
ACCURACY (1 Year)
23°C ±5°C
±(% rdg. + volts)
0.02% + 250 µV
0.02% + 400 µV
0.02% + 1.8 mV
0.02% + 12 mV
NOISE
(peak-peak)
0.1Hz–10Hz
20 µV
50 µV
100 µV
500 µV
TEMPERATURE COEFFICIENT (0°–18°C & 28°–50°C): ±(0.15 × accuracy specification)/°C.
MAXMUM OUTPUT POWER AND SOURCE/SINK LIMITS 2: 40.4W per channel maximum. ±40.4V
@ ±1.0A, ±6.06V @ ±3.0A, four quadrant source or sink operation.
VOLTAGE REGULATION: Line: 0.01% of range. Load: 0.01% of range + 100µV.
NOISE 10Hz–20MHz (peak-peak): 25mV typical into a resistive load.
CURRENT LIMIT/COMPLIANCE 3: Bipolar current limit (compliance) set with single value. Minimum
value is 10nA. Accuracy same as current source.
OVERSHOOT: <0.1% + 10mV typical (step size = 10% to 90% of range, resistive load, maximum
current limit/compliance).
GUARD OFFSET VOLTAGE: <10mV typical (Iout ≤ 100mA).
CURRENT PROGRAMMING ACCURACY
RANGE
100.000 nA
1.00000 µA
10.0000 µA
100.000 µA
1.00000 mA
10.0000 mA
100.000 mA
1.00000 A
3.00000 A2
PROGRAMMING
RESOLUTION
1 pA
10 pA
100 pA
1 nA
10 nA
100 nA
1 µA
10 µA
10 µA
ACCURACY (1 Year)
23°C ±5°C
±(% rdg. + amps)
0.06% + 100 pA
0.03% + 600 pA
0.03% + 2 nA
0.03% + 30 nA
0.03% + 200 nA
0.03% + 3 µA
0.03% + 20 µA
0.05% + 900 µA
0.06% + 1.5 mA
NOISE
(peak-peak)
0.1Hz–10Hz
5 pA
15 pA
50 pA
2 nA
5 nA
200 nA
500 nA
50 µA
150 µA
TRANSIENT RESPONSE TIME: <70µs for the output to recover to 0.1% for a 10% to 90% step
change in load.
VOLTAGE SOURCE OUTPUT SETTLING TIME: Time required to reach 0.1% of final value after
source level command is processed on a fixed range.
100mV, 1V Ranges: <50µs typical.
6V Range: <100µs typical.
40V Range: <150µs typical.
CURRENT SOURCE OUTPUT SETTLING TIME: Time required to reach 0.1% of final value after source
level command is processed on a fixed range. Values below for Iout · Rload = 2V unless noted.
3A–10mA Ranges: <80µs typical (current less than 2.5A, Rload >1.5Ω).
1mA Range: <100µs typical.
100µA Range: <150µs typical..
10µA Range: <500µs typical.
1µA Range: <2ms typical.
100nA Range: <20ms typical.
DC FLOATING VOLTAGE: Output can be floated up to ±250VDC from chassis ground.
REMOTE SENSE OPERATING RANGE1:
Maximum voltage between HI and SENSE HI = 3V.
Maximum voltage between LO and SENSE LO = 3V.
VOLTAGE OUTPUT HEADROOM:
40V Range: Max. output voltage = 42V – total voltage drop across source leads (maximum 1Ω per
source lead).
6V Range: Max. output voltage = 8V – total voltage drop across source leads.
OVER TEMPERATURE PROTECTION: Internally sensed temperature overload puts unit in
standby mode.
VOLTAGE SOURCE RANGE CHANGE OVERSHOOT: Overshoot into a 100kΩ load, 20MHz BW,
300mV typical.
CURRENT SOURCE RANGE CHANGE OVERSHOOT: <5% + 300mV/Rload of larger range typical.
(See CURRENT SOURCE OUTPUT SETTLING TIME for additional test conditions.)
NOTES
1. Add 50µV to source accuracy specifications per volt of HI lead drop.
2. Full power source operation regardless of load to 30°C ambient. Above 30°C and/or power sink operation, refer to
Section 8 – Operating Boundaries in the Series 2600 Reference Manual for additional power derating information.
3. For sink mode operation (quadrants II and IV), add 12% of limit range and ±0.02% of limit setting to corresponding
current limit accuracy specifications. For 1A range add an additional 40mA of uncertainty.
4. For sink mode operation (quadrants II and IV), add 10% of compliance range and ±0.02% of limit setting to corresponding voltage source specification. For 100mV range add an additional 60mV of uncertainty.
SOURCE AND MEASURE
TEMPERATURE COEFFICIENT (0°–18°C & 28°–50°C): ±(0.15 × accuracy specification)/°C.
MAXIMUM OUTPUT POWER AND SOURCE/SINK LIMITS 2: 40.4W per channel maximum. ±1.01A
@ ±40.0V, ±3.03A @ ±6.0V, four quadrant source or sink operation.
CURRENT REGULATION: Line: 0.01% of range. Load: 0.01% of range + 100pA.
VOLTAGE LIMIT/COMPLIANCE 4: Bipolar voltage limit (compliance) set with a single value.
Minimum value is 10mV. Accuracy same as voltage source.
OVERSHOOT: <0.1% typical (step size = 10% to 90% of range, resistive load; see CURRENT SOURCE
OUTPUT SETTLING TIME for additional test conditions).
1.888.KEITHLEY
(U.S. only)
www.keithley.com
A
Series 2600 Specifications
Series 2600
G R E A T E R
M E A S U R E
O F
C O N F I D E N C E
5
®
System SourceMeter
Multi-Channel I-V Test Solutions
Series 2600
METER SPECIFICATIONS
GENERAL
VOLTAGE MEASUREMENT ACCURACY 1
RANGE
100.000 mV
1.00000 V
6.00000 V
40.0000 V
DISPLAY
RESOLUTION3
1 µV
10 µV
10 µV
100 µV
INPUT
RESISTANCE
>10 GΩ
>10 GΩ
>10 GΩ
>10 GΩ
ACCURACY (1 Year)
23°C ±5°C
±(% rdg. + volts)
0.015% + 150 µV
0.015% + 200 µV
0.015% + 1 mV
0.015% + 8 mV
Series 2600 Specifications
TEMPERATURE COEFFICIENT (0°–18°C & 28°–50°C): ±(0.15 × accuracy specification)/°C.
CURRENT MEASUREMENT ACCURACY
RANGE
100.000 nA
1.00000 µA
10.0000 µA
100.000 µA
1.00000 mA
10.0000 mA
100.000 mA
1.00000 A
3.00000 A
DISPLAY
RESOLUTION3
1 pA
10 pA
100 pA
1 nA
10 nA
100 nA
1 µA
10 µA
10 µA
VOLTAGE
BURDEN 2
<1 mV
<1 mV
<1 mV
<1 mV
<1 mV
<1 mV
<1 mV
<1 mV
<1 mV
ACCURACY (1 Year)
23°C ±5°C
±(% rdg. + amps)
0.05 % + 100 pA
0.025% + 300 pA
0.025% + 600 pA
0.02 % + 12 nA
0.02 % + 60 nA
0.02 % + 1.2 µA
0.02 % + 6 µA
0.03 % + 700 µA
0.05 % + 1 mA
TEMPERATURE COEFFICIENT (0°–18°C & 28°–50°C): ±(0.15 × accuracy specification)/°C.
ADDITIONAL METER SPECIFICATIONS
LOAD IMPEDANCE: Stable into 10,000pF typical.
COMMON MODE VOLTAGE: 250VDC.
COMMON MODE ISOLATION: >1GΩ, <4500pF.
OVERRANGE: 101% of source range, 102% of measure range.
MAXIMUM SENSE LEAD RESISTANCE: 1kΩ for rated accuracy.
SENSE INPUT IMPEDANCE: >10GΩ.
NOTES
SOURCE AND MEASURE
1. Add 50µV to source accuracy specifications per volt of HI lead drop.
2. Four-wire remote sense only.
3. Applies when in single channel display mode.
1.888.KEITHLEY
SourceMeter
+5V
10kΩ
440Ω
Read
IN/OUT
CAUTION
An external device pulls an I/O
line low (0) by shorting it to
ground. Therefore, the external
device must be capable of
sinking a minimum of 480µA
(5V/10440Ω) per I/O line.
Write 1 turns FET off – In/Out pulled high (5V)
Write 0 turns FET on – In/Out pulled low (0V)
Write
1 = MOSFET off
0 = MOSFET on
GND
Output Enable Pin: Active high input. When the output enable input has been activated,
each SourceMeter output will be disabled when Output Enable is <1.5V.
5V Power Supply Pin: Limited to 600mA, solid state fuse protected.
POWER SUPPLY: 100V to 240VAC, 50–60Hz (manual setting), 240VA max.
COOLING: Forced air. Side intake and rear exhaust. One side must be unobstructed when rack
mounted.
WARRANTY: 1 year.
EMC: Conforms to European Union Directive 89/336/EEC, EN 61326-1.
SAFETY: Conforms to European Union Directive 73/23/EEC, EN 61010-1, and UL 61010-1.
DIMENSIONS: 89mm high × 213mm wide × 460mm deep (31⁄2 in × 83⁄8 in × 171⁄2 in). Bench
Configuration (with handle & feet): 104mm high × 238mm wide × 460mm deep (41⁄8 in ×
93⁄8 in × 171⁄2 in).
WEIGHT: 2601: 4.75kg (10.4 lbs). 2602: 5.50kg (12.0 lbs).
ENVIRONMENT: For indoor use only.
Altitude: Maximum 2000 meters above sea level.
Operating: 0°–50°C, 70% R.H. up to 35°C. Derate 3% R.H./°C, 35°–50°C.
Storage: –25°C to 65°C.
ACCESSORIES SUPPLIED:
Cables & Connectors: SourceMeter DUT interface connector kit for each SourceMeter
channel. Kit includes one hooded screw terminal connector that mates with the
SourceMeter measurement terminals. TSP-Link cable, power cable.
Printed Documentation: User’s Manual.
Electronic Media: CD-ROMs containing
- User’s and Reference manual .PDF files
- Test Script Builder script development software
- LabTracer™ 2.0 Characterization Software (downloadable)
- IVI/VISA drivers for VB, VC/C++, LabVIEW, and LabWindows/CVI.
(U.S. only)
www.keithley.com
6
HOST INTERFACES: Computer control interfaces.
IEEE-488: IEEE-488.1 compliant. Supports IEEE-488.2 common commands and status model
topology.
RS-232: Baud rates from 300 bps to 115200 bps. Programmable number of data bits, parity
type, and flow control (RTS/CTS hardware or none). When not programmed as the active
host interface, the SourceMeter can use the RS-232 interface to control other
instrumentation.
EXPANSION INTERFACE: The TSP-Link expansion interface allows TSP enabled instruments to
trigger and communicate with each other.
Cable Type: Category 5e or higher LAN crossover cable.
Length: 3 meters maximum between each TSP enabled instrument.
DIGITAL I/O INTERFACE:
Connector: 25-pin female D
Input/Output Bits: 14 I/O bits. See figure below.
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®
System SourceMeter
Multi-Channel I-V Test Solutions
Series 2600
SPEED SPECIFICATIONS 1
A/D CONVERTER
SPEED
0.001 NPLC
0.001 NPLC
0.01 NPLC
0.01 NPLC
0.1 NPLC
0.1 NPLC
1.0 NPLC
1.0 NPLC
MEASURE
TO MEMORY
10000 (10000)
2700 (2650)
4000 (3500)
1900 (1775)
565 (475)
490 (420)
59
(49)
58
(48)
TRIGGER ORIGIN
Internal
Digital I/O
Internal
Digital I/O
Internal
Digital I/O
Internal
Digital I/O
MEASURE
TO GPIB
8000 (8000)
2100 (2100)
3600 (3200)
1600 (1500)
555 (470)
470 (405)
59 (49)
58 (48)
SOURCE MEASURE
TO MEMORY
5500 (5500)
2300 (2300)
2750 (2700)
1700 (1600)
540 (450)
470 (410)
58 (49)
58 (48)
SOURCE MEASURE
TO GPIB
3600 (3600)
1900 (1875)
2300 (2100)
1450 (1400)
510 (440)
450 (390)
58 (48)
57 (48)
SOURCE MEASURE
PASS/FAIL
TO MEMORY
4900 (4900)
2200 (2150)
2800 (2500)
1600 (1500)
535 (455)
470 (400)
58 (49)
57 (48)
SOURCE MEASURE
PASS/FAIL
TO GPIB
3100 (3100)
1800 (1775)
2100 (1975)
1400 (1325)
505 (430)
450 (390)
58 (48)
57 (48)
MAXIMUM SINGLE MEASUREMENT RATES (operations per second) FOR 60Hz (50Hz):
A/D CONVERTER
SPEED
0.001 NPLC
0.01 NPLC
0.1 NPLC
1.0 NPLC
MEASURE
TO GPIB
1110 (1000)
950 (900)
390 (345)
57 (48)
TRIGGER ORIGIN
Internal
Internal
Internal
Internal
SOURCE MEASURE
TO GPIB
880 (880)
780 (760)
355 (320)
56 (47)
SOURCE MEASURE
PASS/FAIL
TO GPIB
840 (840)
730 (710)
340 (305)
56 (47)
MAXIMUM RANGE CHANGE RATE: >4500/second typical.
MAXIMUM SOURCE RANGE CHANGE RATE: >1000/second typical.
MAXIMUM SOURCE FUNCTION CHANGE RATE: >500/second typical.
EXTERNAL TRIGGER INPUT: The Digital I/O interface signals can be configured to behave as trigger
inputs.
Input Latency (time from trigger input to start of measurement or source change):
<150µs, typical.
Input Jitter: <100µs, typical.
COMMAND PROCESSING TIME: Maximum time required for the output to begin to change following the receipt of the smux.source.levelv or smux.source.leveli command. <1ms typical.
Series 2600 Specifications
MAXIMUM SWEEP OPERATION RATES (operations per second) FOR 60Hz (50Hz):
NOTES
1. See the Speed Specifications Test Conditions Appendix in the Series 2600 Reference Manual for more information
regarding test conditions.
Model 2601 Rear Panel
Rev. A
SOURCE AND MEASURE
Specifications are subject to change without notice.
Model 2602 Rear Panel
1.888.KEITHLEY
(U.S. only)
www.keithley.com
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®
System SourceMeter
Multi-Channel I-V Test Solutions
Series 2600
Series 2600 Specifications
SUPPLEMENTAL INFORMATION
FRONT PANEL INTERFACE: 2-line vacuum fluorescent display (VFD) with keypad and rotary knob.
Display:
• Show error messages and user defined messages.
• Display source and limit settings.
• Show current and voltage measurements.
• View measurements stored in non-volatile reading buffers.
Keypad Operations:
• Change host interface settings.
• Save and restore instrument setups.
• Load and run factory and user defined test scripts (i.e. sequences) that prompt for input and
send results to the display.
• Store measurements into non-volatile reading buffers.
PROGRAMMING: Embedded Test Script Processor (TSP) accessible from any host interface. Responds
to individual instrument control commands. Responds to high-speed test scripts comprised of
instrument control commands and Test Script Language (TSL) statements (e.g. branching, looping,
math, etc.). Able to execute high-speed test scripts stored in memory without host intervention.
Minimum Memory Available: 3 Mbytes (approximately 50,000 lines of TSL code).
Test Script Builder: Integrated Development Environment for building, running, and managing
TSP scripts. Includes an Instrument Console for communicating with any TSP enabled instrument in an interactive manner. Requires:
• VISA (NI-VISA included on CD).
• Microsoft .NET Framework (included on CD).
• Keithley I/O Layer (included on CD).
• Pentium III 800MHz or faster personal computer.
• Microsoft Windows 98, NT, 2000, or XP.
Drivers: IVI/VISA drivers for VB, VC/C++, LabVIEW, TestPoint, and LabWindows/CVI.
READING BUFFERS: Non-volatile storage area(s) reserved for measurement data. Reading buffers are
arrays of measurement elements. Each element can hold the following items:
• Measurement
• Measurement status
• Timestamp
• Source setting (at the time the measurement was taken)
• Range information
Two reading buffers are reserved for each SourceMeter channel. Reading buffers can be filled using
the front panel STORE key and retrieved using the RECALL key or host interface.
Buffer Size, with timestamp and source setting: >50,000 samples.
Buffer Size, without timestamp and source setting: >100,000 samples.
Battery Backup: Lithium-ion battery backup. 30 days of non-volatile storage @ 23°C, and
>4 hours of charge time. 3 year battery life @ 23°C. 1.5 year battery life @ 50°C.
FACTORY TSP SCRIPTS: See www.keithley.com for Keithley-supported application-specific scripts.
SYSTEM EXPANSION: The TSP-Link expansion interface allows TSP enabled instruments to trigger
and communicate with each other. See figure below:
Each SourceMeter has two TSP-Link connectors to facilitate chaining instruments together.
• Once SourceMeters are interconnected via TSP-Link, a computer can access all of the resources
of each SourceMeter via the host interface of any SourceMeter.
• A maximum of 64 TSP-Link nodes can be interconnected. Each SourceMeter consumes one
TSP-Link node.
TIMER: Free running 47 bit counter with 1MHz clock input. Reset each time instrument powers up.
Rolls over every 4 years.
Timestamp: TIMER value automatically saved when each measurement is triggered.
Resolution: 1µs.
Accuracy: 50ppm.
SOURCE AND MEASURE
Specifications are subject to change without notice. Refer to www.keithley.com for the latest product information.
All Keithley trademarks and trade names are the property of Keithley Instruments, Inc.
All other trademarks and trade names are the property of their respective companies
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Keithley Instruments, Inc.
Corporate Headquarters • 28775 Aurora Road • Cleveland, Ohio 44139 • 440-248-0400 • Fax: 440-248-6168 • 1-888-KEITHLEY (534-8453) • www.keithley.com
Belgium: Sint-Pieters-Leeuw • 02-363 00 40 • Fax: 02-363 00 64 • www.keithley.nl
Italy: Milano • 02-48 39 16 01 • Fax: 02-48 30 22 74 • www.keithley.it
China: Beijing • 8610-82251886 • Fax: 8610-82251892 • www.keithley.com.cn
Japan: Tokyo • 81-3-5733-7555 • Fax: 81-3-5733-7556 • www.keithley.jp
Finland: Helsinki • 09-5306-6560 • Fax: 09-5306-6565 • www.keithley.com
Korea: Seoul • 82-2-574-7778 • Fax: 82-2-574-7838 • www.keithley.com
France: Saint-Aubin • 01-64 53 20 20 • Fax: 01-60 11 77 26 • www.keithley.fr
Netherlands: Gorinchem • 0183-635333 • Fax: 0183-630821 • www.keithley.nl
Germany: Germering • 089/84 93 07-40 • Fax: 089/84 93 07-34 • www.keithley.de
Singapore: Singapore • 65-6747-9077 • Fax: 65-6747-2991 • www.keithley.com
Great Britain: Theale • 0118 929 7500 • Fax: 0118 929 7519 • www.keithley.co.uk
Sweden: Solna • 08-509 04 600 • Fax: 08-655 26 10 • www.keithley.com
India: Bangalore • 080 2212 8027 • Fax : 080 2212 8005 • www.keithley.com
Taiwan: Hsinchu • 886-3-572-9077 • Fax: 886-3-572-9031 • www.keithley.com.tw
© Copyright 2005 Keithley Instruments, Inc.
Printed in U.S.A
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