CERTIFICATE
Issued Date: Sep. 15, 2008
Report No.: 088213R–ITCEP07V04
This is to certify that the following designated product
Product
: Notebook
Trade Name
: MSI
Model Number : MS-1674, EX620
Company Name : MICRO-STAR INT’L Co., LTD.
This product, which has been issued the test report listed as above in QuieTek
Laboratory, is based on a single evaluation of one sample and confirmed to
comply with the requirements of the following EMC standard.
EN 55022: 2006
EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2:2006
IEC 61000-4-2 Edition 1.2: 2001-04
EN 61000-3-3:1995+A1: 2001+A2: 2005
IEC 61000-4-3 Edition 3.0: 2006
IEC 61000-4-4: 2004
IEC 61000-4-5 Edition 2.0: 2005
IEC 61000-4-6 Edition 2.2: 2006
IEC 61000-4-8 Edition 1.1: 2001-03
IEC 61000-4-11 Second Edition: 2004-03
TEST LABORATORY
Vincent Lin / Manager
No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C.
TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:service@quietek.com http://www.quietek.com
Test Report
Product Name : Notebook
Model No.
: MS-1674, EX620
Applicant : MICRO-STAR INT’L Co., LTD.
Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.
Date of Receipt : 2008/08/12
Issued Date
: 2008/09/15
Report No.
: 088213R-ITCEP07V04
Version
: V1.0
The test results relate only to the samples tested.
The test results shown in the test report are traceable to the national/international standard through the calibration
of the equipment and evaluated measurement uncertainty herein.
This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government.
The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Declaration of Conformity
The followin g product is herewith confirmed to comply with the requirement s set out in the
Council Directive on the Approxi
mation of t he laws of the Me
mber S tates relating to
Electromagnetic Comp atibility Directive (2004/108/EC). The listed st andards as below were
applied:
The following Equipment:
Product :
Notebook
Model Number
: MS-1674, EX620
Trade Name
: MSI
This product is herewit h confirmed to comply with the requirement
Council Dir ective on the Approximation of the laws of the Me
s set out in t he
mber S tates relatin g to
Electromagnetic Comp atibility Dire ctive (2004/108/EC). For the evaluation regar
ding
EMC, the following standards were applied:
RFI Emission:
EN 55022: 2006 Class B
: Product family standard
EN 61000-3-2:2006 Class D
: Limits for harmonic current emission
EN 61000-3-3:1995+A1: 2001+A2: 2005
: Limitation of voltage fluctuation and flicker
in low-voltage supply system
Immunity:
EN 55024:1998+A1: 2001+A2: 2003
: Product family standard
The following importer/manufacturer is responsible for this declaration:
Company Name
:
Company Address :
Telephone
:
Facsimile :
Person is responsible for marking this declaration:
Name (Full Name)
Date
Position/ Title
Legal Signature
QTK No.: 088213R-ITCEP07V04
Statement of Conformity
This certifies that the following designated product:
Product :
Notebook
Model Number
: MS-1674, EX620
Trade Name
: MSI
Company Name : MICRO-STAR INT’L Co., LTD.
This product is herewit h confirmed to comply with the requirement
Council Dir ective on the Approximation of the laws of the Me
s set out in t he
mber S tates relatin g to
Electromagnetic Comp atibility Dire ctive (2004/108/EC). For the evaluation regar
ding
EMC, the following standards were applied:
RFI Emission:
EN 55022: 2006 Class B
: Product family standard
EN 61000-3-2:2006 Class D
: Limits for harmonic current emission
EN 61000-3-3:1995+A1: 2001+A2: 2005
: Limitation of voltage fluctuation and flicker
in low-voltage supply system
Immunity:
EN 55024:1998+A1: 2001+A2: 2003
: Product family standard
TEST LABORATORY
Vincent Lin / Manager
The verification is based on a single evaluation of one sample of above-mentioned products. It does
not imply an assessment of the whole production and does not permit the use of the test lab. Logo.
QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C.
Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: service@quietek.com
Report No: 088213R-ITCEP07V04
Tes t R e p o r t C e r t i f i c a t i o n
Issued Date
Report No.
: 2008/08/27
: 088213R-ITCEP07V04
Product Name
:
Notebook
Applicant
:
MICRO-STAR INT’L Co., LTD.
Address
:
No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.
Manufacturer
:
MICRO-STAR INT’L Co., LTD.
Model No.
:
MS-1674, EX620
Rated Voltage
:
AC 230 V / 50 Hz
EUT Voltage
:
AC 100-240V, 50/60Hz
Trade Name
:
MSI
Applicable Standard
:
EN 55022: 2006 Class B
EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2:2006
EN 61000-3-3:1995+A1: 2001+A2: 2005
Test Result
:
Complied
Performed Location
:
Quietek Corporation (Linkou Laboratory)
No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang,
Taipei, 244 Taiwan, R.O.C.
TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789
Documented By
:
( Adm. Specialist / Joanne Lin )
Reviewed By
:
(Engineer/ Leo Lin )
Approved By
:
(Manager / Vincent Lin )
Page: 2 of 131
Report No: 088213R-ITCEP07V04
Laboratory Information
We , QuieTek Corporation, are an independent EMC and safety consultancy that was
established the whole facility in our laboratories. The test facility has been accredited/accepted
(audited or listed) by the following related bodies in compliance with ISO 17025, EN 45001 and
specified testing scopes:
Taiwan R.O.C.
:
BSMI, NCC, TAF
Germany
:
TUV Rheinland
Norway
:
Nemko, DNV
USA
:
FCC, NVLAP
Japan
:
VCCI
The related certificate for our laboratories about the test site and management system can be downloaded
from QuieTek Corporation’s Web Site :http://tw.quietek.com/modules/enterprise/services.php?item=100
The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site :
http://www.quietek.com/
If you have any comments, Please don’t hesitate to contact us. Our contact information is as below:
HsinChu Testing Laboratory :
No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307,
Taiwan, R.O.C.
TEL:+886-3-592-8858 / FAX:+886-3-592-8859
E-Mail : service@quietek.com
LinKou Testing Laboratory :
No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C.
TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789
E-Mail : service@quietek.com
Suzhou (China) Testing Laboratory :
No. 99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., Suzhou,China.
TEL : +86-512-6251-5088 / FAX : +86-512-6251-5098
E-Mail : service@quietek.com
Page: 3 of 131
Report No: 088213R-ITCEP07V04
TABLE OF CONTENTS
Description
Page
1. General Information .................................................................................................... 7
1.1. EUT Description ...................................................................................................... 7
1.2. Mode of Operation .................................................................................................. 9
1.3. Tested System Details........................................................................................... 15
1.4. Configuration of Tested System ............................................................................ 16
1.5. EUT Exercise Software ......................................................................................... 17
2. Technical Test ........................................................................................................... 18
2.1. Summary of Test Result ........................................................................................ 18
2.2. List of Test Equipment ........................................................................................... 19
2.3. Measurement Uncertainty ..................................................................................... 22
2.4. Test Environment .................................................................................................. 24
3. Conducted Emission (Main Terminals)...................................................................... 25
3.1. Test Specification .................................................................................................. 25
3.2. Test Setup ............................................................................................................. 25
3.3. Limit....................................................................................................................... 25
3.4. Test Procedure ...................................................................................................... 26
3.5. Deviation from Test Standard ................................................................................ 26
3.6. Test Result ............................................................................................................ 27
3.7. Test Photograph .................................................................................................... 39
4. Conducted Emissions (Telecommunication Ports).................................................... 41
4.1. Test Specification .................................................................................................. 41
4.2. Test Setup ............................................................................................................. 41
4.3. Limit....................................................................................................................... 41
4.4. Test Procedure ...................................................................................................... 42
4.5. Deviation from Test Standard ................................................................................ 42
4.6. Test Result ............................................................................................................ 43
4.7. Test Photograph .................................................................................................... 67
5. Radiated Emission.................................................................................................... 69
5.1. Test Specification .................................................................................................. 69
5.2. Test Setup ............................................................................................................. 69
5.3. Limit....................................................................................................................... 69
5.4. Test Procedure ...................................................................................................... 70
5.5. Deviation from Test Standard ................................................................................ 70
5.6. Test Result ............................................................................................................ 71
5.7. Test Photograph .................................................................................................... 75
6. Harmonic Current Emission ...................................................................................... 77
Page: 4 of 131
Report No: 088213R-ITCEP07V04
6.1. Test Specification .................................................................................................. 77
6.2. Test Setup ............................................................................................................. 77
6.3. Limit....................................................................................................................... 77
6.4. Test Procedure ...................................................................................................... 79
6.5. Deviation from Test Standard ................................................................................ 79
6.6. Test Result ............................................................................................................ 80
6.7. Test Photograph .................................................................................................... 84
7. Voltage Fluctuation and Flicker ................................................................................. 85
7.1. Test Specification .................................................................................................. 85
7.2. Test Setup ............................................................................................................. 85
7.3. Limit....................................................................................................................... 85
7.4. Test Procedure ...................................................................................................... 86
7.5. Deviation from Test Standard ................................................................................ 86
7.6. Test Result ............................................................................................................ 87
7.7. Test Photograph .................................................................................................... 88
8. Electrostatic Discharge ............................................................................................. 90
8.1. Test Specification .................................................................................................. 90
8.2. Test Setup ............................................................................................................. 90
8.3. Limit....................................................................................................................... 90
8.4. Test Procedure ...................................................................................................... 91
8.5. Deviation from Test Standard ................................................................................ 91
8.6. Test Result ............................................................................................................ 92
8.7. Test Photograph .................................................................................................... 93
9. Radiated Susceptibility ............................................................................................. 95
9.1. Test Specification .................................................................................................. 95
9.2. Test Setup ............................................................................................................. 95
9.3. Limit....................................................................................................................... 95
9.4. Test Procedure ...................................................................................................... 96
9.5. Deviation from Test Standard ................................................................................ 96
9.6. Test Result ............................................................................................................ 97
9.7. Test Photograph .................................................................................................... 99
10.
Electrical Fast Transient/Burst............................................................................. 100
10.1.
Test Specification ............................................................................................. 100
10.2.
Test Setup........................................................................................................ 100
10.3.
Limit ................................................................................................................. 100
10.4.
Test Procedure ................................................................................................ 101
10.5.
Deviation from Test Standard........................................................................... 101
10.6.
Test Result....................................................................................................... 102
Page: 5 of 131
Report No: 088213R-ITCEP07V04
10.7.
Test Photograph .............................................................................................. 104
11.
Surge................................................................................................................... 106
11.1.
Test Specification ............................................................................................. 106
11.2.
Test Setup........................................................................................................ 106
11.3.
Limit ................................................................................................................. 106
11.4.
Test Procedure ................................................................................................ 107
11.5.
Deviation from Test Standard........................................................................... 107
11.6.
Test Result....................................................................................................... 108
11.7.
Test Photograph .............................................................................................. 110
12.
Conducted Susceptibility ......................................................................................111
12.1.
Test Specification ..............................................................................................111
12.2.
Test Setup.........................................................................................................111
12.3.
Limit ................................................................................................................. 112
12.4.
Test Procedure ................................................................................................ 112
12.5.
Deviation from Test Standard........................................................................... 112
12.6.
Test Result....................................................................................................... 113
12.7.
Test Photograph .............................................................................................. 115
13.
Power Frequency Magnetic Field ........................................................................ 117
13.1.
Test Specification ............................................................................................. 117
13.2.
Test Setup........................................................................................................ 117
13.3.
Limit ................................................................................................................. 117
13.4.
Test Procedure ................................................................................................ 117
13.5.
Deviation from Test Standard........................................................................... 117
13.6.
Test Result....................................................................................................... 118
13.7.
Test Photograph .............................................................................................. 120
14.
Voltage Dips and Interruption .............................................................................. 121
14.1.
Test Specification ............................................................................................. 121
14.2.
Test Setup........................................................................................................ 121
14.3.
Limit ................................................................................................................. 121
14.4.
Test Procedure ................................................................................................ 122
14.5.
Deviation from Test Standard........................................................................... 122
14.6.
Test Result....................................................................................................... 123
14.7.
Test Photograph .............................................................................................. 125
15.
Attachment .......................................................................................................... 126
EUT Photograph.................................................................................................. 126
Page: 6 of 131
Report No: 088213R-ITCEP07V04
1. General Information
1.1. EUT Description
Product Name
Trade Name
Model No.
Component
Power Cord
Power Adapter (1)
Power Adapter (2)
Notebook
MSI
MS-1674, EX620
Non-Shielded, 1.8m
MFR: LI SHIN, M/N: LSE0202C1990
Input: AC 100-240V, 50/60Hz 1.5A
Output: DC 19V, 4.74A
Cable out: Non-Shielded, 1.8m, with one ferrite core bonded.
MFR: DELTA, M/N: ADP-90SB BB
Input: AC 100-240V, 50-60Hz 1.5A
Output: DC 19V, 4.74A
Cable out: Non-Shielded, 1.8m, with one ferrite core bonded.
Page: 7 of 131
Report No: 088213R-ITCEP07V04
Keyparts List
ITEM
CPU
LCD
Vendor
INTEL
CMO
Samsung
Fujitsu
HDD
Toshiba
Hitachi
WD
SONY
ODD
RAM
MODEM
WLAN
BT
Webcam
TV-tuner
HLDS
PLDS
TSST
Transcend
Transcend
Kingston
Transcend
Transcend
UNIFOSA
A-DATA
Transcend
Kingston
Transcend
Transcend
UNIFOSA
Transcend
SAMSUNG
Transcend
Transcend
LSI
INTEL
MSI
Atheros
MSI
CHICONY
Kworld
M/N
P8400/2.26G
QZNM/2.4G
T9400/2.53
N156B3-L02 (15.6")
N156B3-L01 (15.6")
LTN160AT01-A01 (16")
MHY2160BH
MHY2200BH
MHY2250BH
MHZ2320BH
MK1646GSX
MK2546GSX
MK3252GSX
HTS541616J9SA00
WD1200BEVS
WD1600BEVS
WD2500BEVS
WD3200BEVT
BC-5500S-01
AD-7560S
GSA-T50N
GCC-T20N
DS-8A2S
TS-L633A
TS128MSQ64V6J
TS128MSQ64V6J
KVR667D2S5
TS128MSQ64V6J
JM488Q643A-6
GU331G0AJEPN6E20
ADOPE1A16332
TS256MSQ64V6U
KVR667D2S5
TS256MSQ64V6N
TS256MSQ64V6U
GU332G0ALEPR8H2F
TS256MSQ64V8U
M470T5663QZ3-CF7
TS256MSQ64V8U
JM800QSU-2G
D40
512AN_HMW
533AN_HMW
MS-6890
AR5B91
MS-6837D
CNF7231
MC-810
Page: 8 of 131
Report No: 088213R-ITCEP07V04
Adapter
Inverter
Battery
Keyboard
MXM
LI SHIN
DELTA
Sumida
SAMPO
Celxpert
SMP
Chicony
ATI
LSE0202C1990
ADP-90SB BB
IN1408/T-LF
YIVNMS0018D11-B
CBPIL72
SQU-718
MP-03233U4-359A
M82ME-XT O2
Note:
The EUT is including two models, The MS-1674 for MSI and the EX620 PRO for different
marketing requirement.
Page: 9 of 131
Report No: 088213R-ITCEP07V04
1.2. Mode of Operation
QuieTek has verified the construction and function in typical operation. All the test modes were
carried out with the EUT in normal operation, which was shown in this test report and defined as:
Pre-Test Mode
Mode 1
Mode 2
Mode 3
Mode 4
Mode 5
Mode 6
Mode 7
Mode 8
Mode 9
Mode 10
Mode 11
Mode 12
Mode 13
Mode 14
Mode 15
Mode 16
Final Test Mode
Emission
Immunity
Mode 1
Mode 2
Mode 1
Mode 2
Page: 10 of 131
Report No: 088213R-ITCEP07V04
ITEM
CPU
Display/Resolution
Panel
H.D.D
O.D.D.
Wireless LAN Card
Modem Module
Memory
Web Camera
AC Adapter
Inverter
Battery
Bluetooth
TV-tuner
ITEM
CPU
Display/Resolution
Panel
H.D.D
O.D.D.
Wireless LAN Card
Modem Module
Memory
Web Camera
AC Adapter
Inverter
Battery
Bluetooth
TV-tuner
MODE1
INTEL T9400 / 2.53GHz
LCD+CRT/1366*768/60Hz
CMO / N156B3-L02
Fujitsu / MHY2160BH
SONY / BC-5500S-01
INTEL / 512AN_HMW
LSI / D40
Transcend (Samsung E-die)
TS128MSQ64V6J
CHICONY / CNF7231
LI SHIN/LSE0202C1990
SUMIDA / IN1408/T-LF
CELXPERT / CBPIL72
MSI / MS-6837D
KWORLD / MC810
MODE2
INTEL QZNM / 2.4GHz
LCD+HDMI/1366*768/60Hz
CMO / N156B3-L01
Fujitsu / MHY2200BH
SONY / AD-7560S
MODE3
INTEL P8400/2.26GHz
LCD+CRT/1366*768/60Hz
SAMSUNG/LTN160AT01-A01
Fujitsu MHY2250BH
HLDS GSA-T50N
Atheros / AR5B91
LSI/D40
Kingston (Hynix)
KVR667D2S5
CHICONY/CNF7231
LI SHIN/LSE0202C1990
SUMIDA/IN1408/T-LF
CELXPERT/CBPIL72
MSI/MS-6837D
KWORLD/MC810
MODE4
INTEL T9400/2.53GHz
LCD+HDMI/1366*768/60Hz
CHI MEI/N156B3-L02
Fujitsu MHZ2320BH
HLDS GCC-T20N
MSI/MS-6890
LSI/D40
Transcend (ElpidawBGA)
TS128MSQ64V6J
CHICONY/CNF7231
DELTA/ADP-90SB BB
SAMPO/YIVNMS0018D11-B
SMP/SQU-718
MSI/MS-6837D
KWORLD/MC810
Page: 11 of 131
INTEL/ 533AN_HMW
LSI / D40
Transcend (Hynix)
TS128MSQ64V6J
CHICONY/CNF7231
DELTA / ADP-90SB BB
SAMPO / YIVNMS0018D11-B
SMP / SQU-718
MSI / MS-6837D
KWORLD / MC810
Report No: 088213R-ITCEP07V04
ITEM
CPU
Display/Resolution
Panel
H.D.D
O.D.D.
Wireless LAN Card
Modem Module
Memory
Web Camera
AC Adapter
Inverter
Battery
Bluetooth
TV-tuner
ITEM
CPU
Display/Resolution
Panel
H.D.D
O.D.D.
Wireless LAN Card
Modem Module
Memory
Web Camera
AC Adapter
Inverter
Battery
Bluetooth
TV-tuner
MODE5
INTEL QZNM/2.4GHz
LCD+CRT/1366*768/60Hz
CHI MEI/N156B3-L01
Toshiba MK1646GSX
PLDS DS-8A2S
Atheros / AR5B91
LSI/D40
Transcend (ETT)
JM488Q643A-6
CHICONY/CNF7231
LI SHIN/LSE0202C1990
SUMIDA/IN1408/T-LF
CELXPERT/CBPIL72
MSI/MS-6837D
KWORLD/MC810
MODE6
INTEL P8400/2.26GHz
LCD+HDMI/1366*768/60Hz
SAMSUNG/LTN160AT01-A01
Toshiba MK2546GSX
TSST TS-L633A
INTEL/512AN_HMW
LSI/D40
UNIFOSA(Elpida)
GU331G0AJEPN6E20
CHICONY/CNF7231
DELTA/ADP-90SB BB
SAMPO/YIVNMS0018D11-B
SMP/SQU-718
MSI/MS-6837D
KWORLD/MC810
MODE7
INTEL T9400/2.53GHz
LCD+CRT/1366*768/60Hz
CHI MEI/N156B3-L02
Toshiba MK3252GSX
SONY BC-5500S-01
INTEL/533AN_HMW
LSI/D40
A-DATA (ETT)
ADOPE1A16332
CHICONY/CNF7231
LI SHIN/LSE0202C1990
SUMIDA/IN1408/T-LF
CELXPERT/CBPIL72
MSI/MS-6837D
KWORLD/MC810
MODE8
INTEL QZNM/2.4GHz
LCD+HDMI/1366*768/60Hz
CHI MEI/N156B3-L01
Hitachi HTS541616J9SA00
SONY AD-7560S
MSI / MS-6890
LSI/D40
Transcend (Micron)
TS256MSQ64V6U
CHICONY/CNF7231
DELTA/ADP-90SB BB
SAMPO/YIVNMS0018D11-B
SMP/SQU-718
MSI/MS-6837D
KWORLD/MC810
Page: 12 of 131
Report No: 088213R-ITCEP07V04
ITEM
CPU
Display/Resolution
Panel
H.D.D
O.D.D.
Wireless LAN Card
Modem Module
Memory
Web Camera
AC Adapter
Inverter
Battery
Bluetooth
TV-tuner
ITEM
CPU
Display/Resolution
Panel
H.D.D
O.D.D.
Wireless LAN Card
Modem Module
Memory
Web Camera
AC Adapter
Inverter
Battery
Bluetooth
TV-tuner
MODE9
INTEL P8400/2.26GHz
LCD+CRT/1366*768/60Hz
SAMSUNG / LTN160AT01-A01
WD 1200BEVS
HLDS / GSA-T50N
MSI / MS-6890
LSI/D40
Kingston (Micron)
KVR667D2S5
CHICONY/CNF7231
LI SHIN/LSE0202C1990
SUMIDA/IN1408/T-LF
CELXPERT/CBPIL72
MSI/MS-6837D
KWORLD/MC810
MODE10
INTEL T9400/2.53GHz
LCD+HDMI/1366*768/60Hz
CHI MEI/N156B3-L02
WD 1600BEVS
HLDS / GCC-T20N
Atheros / AR5B91
LSI/D40
Transcend (Samsung)
TS256MSQ64V6N
CHICONY/CNF7231
DELTA/ADP-90SB BB
SAMPO/YIVNMS0018D11-B
SMP/SQU-718
MSI/MS-6837D
KWORLD/MC810
MODE11
INTEL QZNM/2.4GHz
LCD+CRT/1366*768/60Hz
CHI MEI/N156B3-L01
WD 2500BEVS
PLDS / DS-8A2S
INTEL / 512AN_HMW
LSI/D40
TRANSCEND
TS256MSQ64V6U
CHICONY / CNF7231
LI SHIN / LSE0202C1990
SUMIDA / TWS-400-9652
CELXPERT / CBPIL72
MSI / MS-6837D
KWORLD / MC810
MODE12
INTEL P8400/2.26GHz
LCD+HDMI/1366*768/60Hz
SAMSUNG / LTN160AT01-A01
WD WD3200BEVT
TSST / TS-L633A
INTEL / 533AN_HMW
LSI/D40
UNIFOSA
GU332G0ALEPR8H2F
CHICONY / CNF7231
DELTA / ADP-90SB BB
SAMPO/YIVNMS0018D11-B
SMP / SQU-718
MSI / MS-6837D
KWORLD / MC810
Page: 13 of 131
Report No: 088213R-ITCEP07V04
ITEM
CPU
Display/Resolution
Panel
H.D.D
O.D.D.
Wireless LAN Card
Modem Module
Memory
Web Camera
AC Adapter
Inverter
Battery
Bluetooth
TV-tuner
ITEM
CPU
Display/Resolution
Panel
H.D.D
O.D.D.
Wireless LAN Card
Modem Module
Memory
Web Camera
AC Adapter
Inverter
Battery
Bluetooth
TV-tuner
MODE13
INTEL T9400/2.53GHz
LCD+CRT/1366*768/60Hz
CMO / N156B3-L02
Fujitsu / MHY2160BH
SONY BC-5500S-01
Atheros / AR5B91
LSI/D40
TRANSCEND
TS256MSQ64V8U
CHICONY / CNF7231
LI SHIN / LSE0202C1990
SUMIDA / TWS-400-9652
CELXPERT / CBPIL72
MSI / MS-6837D
KWORLD / MC810
MODE14
INTEL QZNM/2.4GHz
LCD+HDMI/1366*768/60Hz
CMO / N156B3-L01
Fujitsu / MHY2200BH
SONY AD-7560S
MSI / MS-6890
LSI/D40
SAMSUNG
M470T5663QZ3- CF7
CHICONY / CNF7231
DELTA / ADP-90SB BB
SAMPO / YIVNMS0018D11-B
SMP / SQU-718
MSI / MS-6837D
KWORLD / MC810
MODE15
INTEL P8400/2.26GHz
LCD+CRT/1366*768/60Hz
SAMSUNG / LTN160AT01-A01
Fujitsu / MHY2250BH
HLDS / GSA-T50N
Atheros / AR5B91
LSI/D40
TRANSCEND
TS256MSQ64V8U
CHICONY / CNF7231
LI SHIN / LSE0202C1990
SUMIDA / TWS-400-9652
CELXPERT / CBPIL72
MSI / MS-6837D
KWORLD / MC810
MODE16
INTEL T9400/2.53GHz
LCD+HDMI/1366*768/60Hz
CMO / N156B3-L02
Fujitsu / MHZ2320BH
HLDS / GCC-T20N
INTEL / 512AN_HMW
LSI/D40
TRANSCEND
JM800QSU-2G
CHICONY / CNF7231
DELTA / ADP-90SB BB
SAMPO / YIVNMS0018D11-B
SMP / SQU-718
MSI / MS-6837D
KWORLD / MC810
Page: 14 of 131
Report No: 088213R-ITCEP07V04
1.3. Tested System Details
The types for all equipments, plus descriptions of all cables used in the tested system (including
inserted cards) are:
Product
1
Monitor
Manufacturer
Model No.
Serial No.
Power Cord
Dell
2407WFPb
CN-0FC255-46633- Non-Shielded, 1.8m
638-1MDS
2
Microphone &
PCHOME
N/A
N/A
N/A
PCHOME
N/A
N/A
N/A
Earphone
3
Microphone &
Earphone
4
USB Mouse
Logitech
M-BE58
HCA30103100
N/A
5
IPod nano
Apple
A1236
YM823SUQY0P
N/A
6
IPod nano
Apple
A1236
YM823SWVY0P
N/A
7
Exchange
Sun Moon Star
PX-4
95170087
Non-Shielded, 1.8m
Network
8
Notebook PC
DELL
PP04X
2D2ZM1S
Non-Shielded, 1.8m
9
Printer
EPSON
StyLus C63
FAPY094331
Non-Shielded, 1.8m
Dell
2408WFPb
CN-0NN792-74261- Non-Shielded, 1.8m
10 LCD Monitor
82S-0Y8S
11 Pattern
PROMAX
GV-798AEU06
010703640001
Generator
Page: 15 of 131
Non-Shielded, 1.8m
Report No: 088213R-ITCEP07V04
1.4. Configuration of Tested System
Connection Diagram
Signal Cable Type
Signal cable Description
A
Coaxial Cable
Shielded, 3m
B
D-SUB Cable
Shielded, 1.8m, with two ferrite cores bonded
C
Microphone & Earphone Cable
Non-Shielded, 1.8m, two PCS.
D
USB Mouse Cable
Shielded, 1.8m
E
IPOD Cable
Shielded, 1.2m, two PCS.
F
HDMI Cable
Shielded, 1.8m
G
USB Cable
Shielded, 1.5m
H
Telecom Cable
Non-Shielded, 3m, two PCS.
I
LAN Cable
Non-Shielded, 3m
Page: 16 of 131
Report No: 088213R-ITCEP07V04
1.5. EUT Exercise Software
1 Setup the EUT and simulators as shown on 1.4.
2 Turn on the power of all equipment.
3 Personal Computer reads data from disk.
4 Personal Computer sends “H” pattern to printer, the printer will print “H” pattern on paper.
5 Personal Computer reads and writes data into and from modem.
6 Repeat the above procedure (4) to (5).
Page: 17 of 131
Report No: 088213R-ITCEP07V04
2. Technical Test
2.1. Summary of Test Result
No deviations from the test standards
Deviations from the test standards as below description:
Emission
Test
Performed Item
Normative References
Conducted Emission
EN 55022:2006 Class B
Yes
No
Impedance Stabilization
EN 55022:2006 Class B
Yes
No
Radiated Emission
EN 55022:2006 Class B
Yes
No
Power Harmonics
EN 61000-3-2:2006
Yes
No
Voltage Fluctuation and
EN 61000-3-3:1995+A1: 2001+A2: 2005
Yes
No
Performed
Deviation
Network
Flicker
Immunity
Test
Performed Item
Normative References
Electrostatic Discharge
IEC 61000-4-2 Edition 1.2: 2001-04
Yes
No
Radiated susceptibility
IEC 61000-4-3 Edition 3.0: 2006
Yes
No
Electrical fast transient/burst IEC 61000-4-4:2004
Yes
No
Surge
IEC 61000-4-5 Edition 2.0: 2005
Yes
No
Conducted susceptibility
IEC 61000-4-6 Edition 2.2: 2006
Yes
No
Power frequency magnetic
IEC 61000-4-8 Edition 1.1: 2001-03
Yes
No
Yes
No
Performed
Deviation
field
Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03
Page: 18 of 131
Report No: 088213R-ITCEP07V04
2.2. List of Test Equipment
Conducted Emission / SR1
Instrument
EMI Test Receiver
LISN
LISN
Pulse Limiter
Manufacturer
R&S
R&S
R&S
R&S
Serial No
100366
833209/007
100085
357.88.10.52
Cal. Date
2007/10/18
2008/08/12
2008/02/14
2008/09/04
Type No.
CVP2200A
ESCS 30
ENV216
ENV4200
Serial No
18331
100366
100085
833209/007
Cal. Date
2007/11/10
2007/10/18
2008/02/14
2008/07/13
ISN T400
19099
2008/07/15
ESH3-Z2
F-65 10KHz~1GHz
FCC-TLISN-T2-02
FCC-TLISN-T4-02
FCC-TLISN-T8-02
357.88.10.52
198
20316
20317
20319
2008/09/04
2007/11/10
2007/11/24
2007/11/24
2007/11/24
Type No.
CBL6112B
BBHA9170
ESCS 30
BBHA9120D
N/A
R3162
ESI 26
QMF-4D-18040
0-45-6P
Serial No
2704
208
838251/001
305
N/A
101102468
838786/004
Cal. Date
2008/09/15
2008/07/25
2008/03/22
2008/08/10
2008/01/03
2007/10/24
2008/05/25
925974
2008/01/03
Manufacturer
Type No.
Serial No
Cal. Date
Schaffner
NSG 1007
HK54148
2008/06/23
Schaffner
CCN 1000-1
X7 1887
2008/06/23
Type No.
Serial No
Cal. Date
NSG 1007
HK54148
2008/06/23
CCN 1000-1
X7 1887
2008/06/23
Impedance Stabilization Network / SR1
Instrument
Manufacturer
Capacitive Voltage Probe
Schaffner
EMI Test Receiver
R&S
LISN
R&S
LISN
R&S
lmpedance Stabilization
Schaffner
Network
Pulse Limiter
R&S
RF Current Probe
FCC
BALANCED TELECOM ISN FCC
BALANCED TELECOM ISN FCC
BALANCED TELECOM ISN FCC
Radiated Emission / Site3
Instrument
Bilog Antenna
Broadband Horn Antenna
EMI Test Receiver
Horn Antenna
Pre-Amplifier
Spectrum Analyzer
EMI Test Receiver
Manufacturer
Schaffner Chase
Schwarzbeck
R&S
Schwarzbeck
QTK
Advantest
R&S
Pre-Amplifier
MITEQ
Power Harmonics / SR3
Instrument
AC Power
Source(Harmonic)
IEC1000-4-X
Analyzer(Flicker)
Voltage Fluctuation and Flicker / SR3
Instrument
Manufacturer
AC Power
Schaffner
Source(Harmonic)
IEC1000-4-X
Schaffner
Analyzer(Flicker)
Type No.
ESCS 30
ENV4200
ENV216
ESH3-Z2
Page: 19 of 131
Report No: 088213R-ITCEP07V04
Electrostatic Discharge / SR3
Instrument
Manufacturer
ESD simulator system
TESEQ
Horizontal Coupling
QuieTek
Plane(HCP)
Vertical Coupling
QuieTek
Plane(VCP)
Radiated susceptibility / CB5
Instrument
Manufacturer
Type No.
NSG 438
Serial No
695
Cal. Date
2008/01/17
HCP AL50
N/A
N/A
VCP AL50
N/A
N/A
Serial No
Cal. Date
100007
N/A
100137
2450
1085
00071675
2008/04/23
2008/01/03
2008/08/02
2008/05/29
AF-BOX
R&S
Audio Analyzer
Bilog Antenna
Broad-Band Antenna
Biconilog Antenna
CMU200
UNIV.RADIOCOMM
Directional Coupler
Dual Microphone Supply
Mouth Simulator
Power Amplifier
Power Amplifier
Power Amplifier
Power Amplifier
Power Meter
Pre-Amplifier
Probe Microphone
R&S
Schaffner Chase
Schwarzbeck
EMCO
Type No.
AF-BOX
ACCUST
UPL 16
CBL6112B
VULB 9166
3149
R&S
CMU200
104846
2008/04/23
A&R
B&K
B&K
A&R
A&R
SCHAFFNER
AR
R&S
A&R
B&K
22735
2426784
2439692
309453
A285000010
4020
0325371
100219
23067
2278070
N/A
2008/08/04
2008/08/04
N/A
N/A
N/A
N/A
2008/04/22
N/A
2008/08/04
Signal Generator
R&S
DC 6180
5935
4227
30S1G3
100W10000M7
CBA9413B
75A250A
NRVD(P.M)
150A220
4182
SMY02(9K-208
0)
825454/028
2007/09/22
Electrical fast transient/burst / SR6
Instrument
Manufacturer
EMC immunity system
Thermo
Type No.
N/A
Serial No
411225
Cal. Date
2007/12/01
Surge / SR6
Instrument
EMC immunity system
Type No.
Serial No
EMCPRO PLUS 0411225
Cal. Date
2007/12/01
Type No.
Cal. Date
Manufacturer
Thermo
Conducted susceptibility / SR6
Instrument
Manufacturer
Schaffner NSG 2070
Schaffner
RF-Generator
Power frequency magnetic field / SR3
Instrument
Manufacturer
Induction Coil Interface
Schaffner
Magnetic Loop Coil
Schaffner
Triaxial ELF Magnetic Field
F.B.BELL
Meter
N/A
Serial No
N/A
2008/04/21
Type No.
INA 2141
INA 702
Serial No
6002
160
Cal. Date
N/A
N/A
4090
9852
2008/05/30
Page: 20 of 131
Report No: 088213R-ITCEP07V04
Voltage dips and interruption / SR6
Instrument
Manufacturer
EMC immunity system
Thermo
Schaffner NSG 2050 System Mainframe
Instrument
Manufacturer
Burst 4.8KV/16A
Schaffner
Generator with CDN
Damped osc. Wave
Schaffner
100kHz and 1MHz
Double AC Source Variator Schaffner
Hybrid surge pulse
Schaffner
1.2/50uS
PQT Generator
Schaffner
Pulse COUPLING
Schaffner
NETWORK
Schaffner NSG 2070 RF-Generator
Instrument
Manufacturer
CDN
Schaffner
CDN
Schaffner
CDN M016S
Schaffner
CDN M016S
Schaffner
CDN T002
Schaffner
CDN T002
Schaffner
CDN T400
Schaffner
CDN T400
Schaffner
Coupling Decoupling
Schaffner
Network
Coupling Decoupling
Schaffner
Network
Coupling Decoupling
Schaffner
Network
Coupling Decoupling
Schaffner
Network
EM-CLAMP
Schaffner
Type No.
Serial No
EMCPRO PLUS 0411225
Cal. Date
2007/12/01
Type No.
Serial No
Cal. Date
PNW2225
200123-098SC 2007/12/28
PNW2056
200124-058SC 2007/12/28
NSG 642A
30910014938
2007/12/28
PNW 2050
20532-514LU
2007/12/28
PNW2003
200138-007SC 2008/01/02
CDN131
200124-007SC 2007/12/28
Type No.
CAL U100A
TRA U150
CAL U100A
TRA U150
CAL U100
TRA U150
CAL U100
TRA U150
Serial No
20405
20454
20410
21167
20491
21169
17735
21166
Cal. Date
2008/04/21
2008/04/21
2008/04/21
2008/04/21
2008/04/21
2008/04/21
2008/04/21
2008/04/21
CDN M016S
20822
2008/02/23
CDN M016S
20823
2008/04/21
CDN T002
19018
2008/04/21
CDN T400
21226
2008/04/21
KEMZ 801
21024
2008/04/21
Page: 21 of 131
Report No: 088213R-ITCEP07V04
2.3. Measurement Uncertainty
Conducted Emission
The measurement uncertainty is evaluated as ± 2.26 dB.
Impedance Stabilization Network
The measurement uncertainty is evaluated as ± 2.26 dB.
Radiated Emission
The measurement uncertainty is evaluated as ± 3.19 dB.
Electrostatic Discharge
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant ESD standards.
The immunity test signal from the ESD system meet the required specifications in IEC
61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of
voltage and timing as being 1.63 % and 2.76%.
Radiated susceptibility
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in RS testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant RS standards.
The immunity test signal from the RS system meet the required specifications in IEC
61000-4-3 through the calibration for the uniform field strength and monitoring for the test
level with the uncertainty evaluation report for the electrical filed strength as being 2.72 dB.
Electrical fast transient/burst
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to
have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst
standards. The immunity test signal from the EFT/Burst system meet the required
specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty
for the waveform of voltage, frequency and timing as being 1.63 %, 2.8 10-10 and
2.76%.
Surge
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in Surge testing are deemed to
have been satisfied, and the testing is reported in accordance with the relevant Surge
standards. The immunity test signal from the Surge system meet the required specifications
in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the
waveform of voltage and timing as being 1.63 % and 2.76%.
Page: 22 of 131
Report No: 088213R-ITCEP07V04
Conducted susceptibility
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in CS testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant CS standards.
The immunity test signal from the CS system meet the required specifications in IEC
61000-4-6 through the calibration for unmodulated signal and monitoring for the test level
with the uncertainty evaluation report for the injected modulated signal level through CDN
and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.
Power frequency magnetic field
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant PFM standards.
The immunity test signal from the PFM system meet the required specifications in IEC
61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter
to verify the output level of magnetic field strength as being 2 %.
Voltage dips and interruption
As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:
1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have
been satisfied, and the testing is reported in accordance with the relevant DIP standards.
The immunity test signal from the DIP system meet the required specifications in IEC
61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of
voltage and timing as being 1.63 % and 2.76%.
Page: 23 of 131
Report No: 088213R-ITCEP07V04
2.4. Test Environment
Performed Item
Conducted Emission
Impedance Stabilization
Network
Radiated Emission
Electrostatic Discharge
Radiated susceptibility
Electrical fast
transient/burst
Surge
Items
Required
Actual
Temperature (C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
25
Humidity (%RH)
25-75
50
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
21
Humidity (%RH)
30-60
52
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
22
Humidity (%RH)
25-75
52
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
22
Humidity (%RH)
25-75
53
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
22
Humidity (%RH)
10-75
53
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
22
25-75
52
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
22
Humidity (%RH)
25-75
53
Barometric pressure (mbar)
860-1060
950-1000
Temperature (C)
15-35
22
Humidity (%RH)
25-75
53
Barometric pressure (mbar)
860-1060
950-1000
Conducted susceptibility Humidity (%RH)
Power frequency
magnetic field
Voltage dips and
interruption
Page: 24 of 131
Report No: 088213R-ITCEP07V04
3. Conducted Emission (Main Terminals)
3.1. Test Specification
According to EMC Standard : EN 55022
3.2. Test Setup
3.3. Limit
Limits
Frequency
(MHz)
QP
(dBuV)
AV
(dBuV)
0.15 - 0.50
66 - 56
56 – 46
0.50-5.0
56
46
5.0 - 30
60
50
Remarks: In the above table, the tighter limit applies at the band edges.
Page: 25 of 131
Report No: 088213R-ITCEP07V04
3.4. Test Procedure
The EUT and simulators are connected to the main power through a line impedance
stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the
measuring equipment. The peripheral devices are also connected to the main power through
a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination.
(Please refers to the block diagram of the test setup and photographs.)
Both sides of A.C. line are checked for maximum conducted interference. In order to find the
maximum emission, the relative positions of equipment and all of the interface cables must
be changed on conducted measurement.
Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using
a receiver bandwidth of 9kHz.
3.5. Deviation from Test Standard
No deviation.
Page: 26 of 131
Report No: 088213R-ITCEP07V04
3.6. Test Result
Site : SR-1
Time : 2008/08/18 - 10:01
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ENV-216-L1 - Line1
Power : AC 230V/50Hz
Note : Mode 1
Page: 27 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:04
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ENV-216-L1 - Line1
Power : AC 230V/50Hz
Note : Mode 1
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.192
9.821
39.710
49.531
-15.269
64.800
QUASIPEAK
2
0.514
9.820
26.800
36.620
-19.380
56.000
QUASIPEAK
3
1.033
9.830
24.940
34.770
-21.230
56.000
QUASIPEAK
4
2.130
9.850
25.730
35.580
-20.420
56.000
QUASIPEAK
5
7.485
9.893
20.810
30.703
-29.297
60.000
QUASIPEAK
6
18.244
10.200
25.010
35.210
-24.790
60.000
QUASIPEAK
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 28 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:04
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ENV-216-L1 - Line1
Power : AC 230V/50Hz
Note : Mode 1
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.192
9.821
37.570
47.391
-7.409
54.800
AVERAGE
2
0.514
9.820
25.460
35.280
-10.720
46.000
AVERAGE
3
1.033
9.830
23.220
33.050
-12.950
46.000
AVERAGE
4
2.130
9.850
23.980
33.830
-12.170
46.000
AVERAGE
5
7.485
9.893
16.090
25.983
-24.017
50.000
AVERAGE
6
18.244
10.200
23.020
33.220
-16.780
50.000
AVERAGE
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 29 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:05
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ENV-216-N - Line2
Power : AC 230V/50Hz
Note : Mode 1
Page: 30 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:07
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ENV-216-N - Line2
Power : AC 230V/50Hz
Note : Mode 1
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.196
9.860
38.100
47.960
-16.726
64.686
QUASIPEAK
0.321
9.850
35.180
45.030
-16.084
61.114
QUASIPEAK
3
0.578
9.830
28.180
38.010
-17.990
56.000
QUASIPEAK
4
0.966
9.830
25.920
35.750
-20.250
56.000
QUASIPEAK
5
2.837
9.860
26.340
36.200
-19.800
56.000
QUASIPEAK
6
18.244
10.220
25.090
35.310
-24.690
60.000
QUASIPEAK
2
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 31 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:07
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ENV-216-N - Line2
Power : AC 230V/50Hz
Note : Mode 1
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.196
9.860
35.480
45.340
-9.346
54.686
AVERAGE
2
0.321
9.850
23.920
33.770
-17.344
51.114
AVERAGE
3
0.578
9.830
25.080
34.910
-11.090
46.000
AVERAGE
4
0.966
9.830
24.900
34.730
-11.270
46.000
AVERAGE
5
2.837
9.860
24.270
34.130
-11.870
46.000
AVERAGE
6
18.244
10.220
23.020
33.240
-16.760
50.000
AVERAGE
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 32 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:34
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ENV-216-L1 - Line1
Power : AC 230V/50Hz
Note : Mode 2
Page: 33 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:35
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ENV-216-L1 - Line1
Power : AC 230V/50Hz
Note : Mode 2
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.295
9.830
31.060
40.890
-20.967
61.857
QUASIPEAK
0.670
9.830
32.440
42.270
-13.730
56.000
QUASIPEAK
3
1.146
9.830
31.710
41.540
-14.460
56.000
QUASIPEAK
4
2.455
9.850
27.960
37.810
-18.190
56.000
QUASIPEAK
5
7.920
9.900
35.630
45.530
-14.470
60.000
QUASIPEAK
6
20.423
10.210
33.870
44.080
-15.920
60.000
QUASIPEAK
2
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 34 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:35
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ENV-216-L1 - Line1
Power : AC 230V/50Hz
Note : Mode 2
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.295
9.830
9.460
19.290
-32.567
51.857
AVERAGE
2
0.670
9.830
19.000
28.830
-17.170
46.000
AVERAGE
3
1.146
9.830
17.840
27.670
-18.330
46.000
AVERAGE
4
2.455
9.850
14.250
24.100
-21.900
46.000
AVERAGE
7.920
9.900
25.980
35.880
-14.120
50.000
AVERAGE
20.423
10.210
25.070
35.280
-14.720
50.000
AVERAGE
5
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 35 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:36
Limit : CISPR_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ENV-216-N - Line2
Power : AC 230V/50Hz
Note : Mode 2
Page: 36 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:37
Limit : CISPR_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ENV-216-N - Line2
Power : AC 230V/50Hz
Note : Mode 2
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.154
9.875
42.830
52.705
-13.181
65.886
QUASIPEAK
2
0.685
9.830
30.280
40.110
-15.890
56.000
QUASIPEAK
3
1.107
9.830
28.150
37.980
-18.020
56.000
QUASIPEAK
4
4.263
9.869
30.560
40.429
-15.571
56.000
QUASIPEAK
5
8.927
9.920
33.380
43.300
-16.700
60.000
QUASIPEAK
6
20.904
10.140
29.670
39.810
-20.190
60.000
QUASIPEAK
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 37 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:37
Limit : CISPR_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ENV-216-N - Line2
Power : AC 230V/50Hz
Note : Mode 2
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.154
9.875
15.880
25.755
-30.131
55.886
AVERAGE
2
0.685
9.830
17.770
27.600
-18.400
46.000
AVERAGE
3
1.107
9.830
10.380
20.210
-25.790
46.000
AVERAGE
4
4.263
9.869
18.810
28.679
-17.321
46.000
AVERAGE
8.927
9.920
22.870
32.790
-17.210
50.000
AVERAGE
20.904
10.140
21.420
31.560
-18.440
50.000
AVERAGE
5
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 38 of 131
Report No: 088213R-ITCEP07V04
3.7. Test Photograph
Test Mode : Mode 1
Description : Front View of Conducted Test
Test Mode : Mode 1
Description : Back View of Conducted Test
Page: 39 of 131
Report No: 088213R-ITCEP07V04
Test Mode : Mode 2
Description : Front View of Conducted Test
Test Mode : Mode 2
Description : Back View of Conducted Test
Page: 40 of 131
Report No: 088213R-ITCEP07V04
4. Conducted Emissions (Telecommunication Ports)
4.1. Test Specification
According to EMC Standard : EN 55022
4.2. Test Setup
4.3. Limit
Limits
Frequency
(MHz)
QP
(dBuV)
AV
(dBuV)
0.15 - 0.50
84 – 74
74 – 64
0.50 - 30
74
64
Remarks:
The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50
MHz.
Page: 41 of 131
Report No: 088213R-ITCEP07V04
4.4. Test Procedure
Telecommunication Port:
The mains voltage shall be supplied to the EUT via the LISN when the measurement of
telecommunication port is performed. The common mode disturbances at the
telecommunication port shall be connected to the ISN, which is 150 ohm impedance.
Both alternative cables are tested related to the LCL requested. The measurement range is
from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz.
The 75dB LCL ISN is used for cat. 6 cable, the 65dB LCL ISN is used for cat. 5 cable, 55dB
LCL ISN is used for cat. 3.
4.5. Deviation from Test Standard
No deviation.
Page: 42 of 131
Report No: 088213R-ITCEP07V04
4.6. Test Result
Site : SR-1
Time : 2008/08/18 - 10:24
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN-T2 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN Telecom
Page: 43 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:25
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN-T2 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN Telecom
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.427
9.967
42.790
52.757
-23.329
76.086
QUASIPEAK
2
0.857
9.940
40.930
50.870
-23.130
74.000
QUASIPEAK
3
2.048
9.920
38.690
48.610
-25.390
74.000
QUASIPEAK
4
4.095
9.910
37.080
46.990
-27.010
74.000
QUASIPEAK
5
12.252
9.970
35.800
45.770
-28.230
74.000
QUASIPEAK
24.002
10.040
47.960
58.000
-16.000
74.000
QUASIPEAK
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 44 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:25
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN-T2 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN Telecom
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.427
9.967
42.780
52.747
-13.339
66.086
AVERAGE
2
0.857
9.940
40.920
50.860
-13.140
64.000
AVERAGE
3
2.048
9.920
38.380
48.300
-15.700
64.000
AVERAGE
4
4.095
9.910
36.210
46.120
-17.880
64.000
AVERAGE
5
12.252
9.970
32.870
42.840
-21.160
64.000
AVERAGE
24.002
10.040
47.950
57.990
-6.010
64.000
AVERAGE
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 45 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:11
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN-T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 10Mbps
Page: 46 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:13
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN-T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 10Mbps
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.427
9.910
35.100
45.010
-31.076
76.086
QUASIPEAK
2
0.838
9.900
31.280
41.180
-32.820
74.000
QUASIPEAK
3
1.353
9.900
33.810
43.710
-30.290
74.000
QUASIPEAK
4
3.750
9.890
39.070
48.960
-25.040
74.000
QUASIPEAK
8.752
9.860
47.970
57.830
-16.170
74.000
QUASIPEAK
16.252
10.000
36.280
46.280
-27.720
74.000
QUASIPEAK
5
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 47 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:13
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN-T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 10Mbps
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.427
9.910
34.930
44.840
-21.246
66.086
AVERAGE
2
0.838
9.900
29.660
39.560
-24.440
64.000
AVERAGE
3
1.353
9.900
31.660
41.560
-22.440
64.000
AVERAGE
4
3.750
9.890
28.370
38.260
-25.740
64.000
AVERAGE
8.752
9.860
34.480
44.340
-19.660
64.000
AVERAGE
16.252
10.000
25.670
35.670
-28.330
64.000
AVERAGE
5
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 48 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:15
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN-T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 100Mbps
Page: 49 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:16
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN-T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 100Mbps
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.318
9.930
33.160
43.090
-36.110
79.200
QUASIPEAK
2
1.353
9.900
33.590
43.490
-30.510
74.000
QUASIPEAK
3
5.236
9.880
41.200
51.080
-22.920
74.000
QUASIPEAK
4
7.923
9.860
44.390
54.250
-19.750
74.000
QUASIPEAK
5
13.357
10.020
47.080
57.100
-16.900
74.000
QUASIPEAK
18.244
9.990
49.270
59.260
-14.740
74.000
QUASIPEAK
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 50 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:16
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN-T4 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 100Mbps
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.318
9.930
28.080
38.010
-31.190
69.200
AVERAGE
2
1.353
9.900
31.510
41.410
-22.590
64.000
AVERAGE
3
5.236
9.880
38.810
48.690
-15.310
64.000
AVERAGE
4
7.923
9.860
42.490
52.350
-11.650
64.000
AVERAGE
5
13.357
10.020
44.620
54.640
-9.360
64.000
AVERAGE
18.244
9.990
47.360
57.350
-6.650
64.000
AVERAGE
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 51 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:18
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN-T8 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 1G
Page: 52 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:20
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN-T8 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 1G
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.193
10.186
31.490
41.676
-41.095
82.771
QUASIPEAK
2
0.427
10.117
36.410
46.527
-29.559
76.086
QUASIPEAK
3
1.357
10.040
33.650
43.690
-30.310
74.000
QUASIPEAK
4
2.767
10.000
32.890
42.890
-31.110
74.000
QUASIPEAK
12.248
10.090
38.810
48.900
-25.100
74.000
QUASIPEAK
26.466
10.070
35.740
45.810
-28.190
74.000
QUASIPEAK
5
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 53 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 10:20
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN-T8 - Line1
Power : AC 230V/50Hz
Note : Mode 1, ISN 1G
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.193
10.186
26.500
36.686
-36.085
72.771
AVERAGE
2
0.427
10.117
34.830
44.947
-21.139
66.086
AVERAGE
3
1.357
10.040
30.000
40.040
-23.960
64.000
AVERAGE
4
2.767
10.000
28.750
38.750
-25.250
64.000
AVERAGE
12.248
10.090
36.370
46.460
-17.540
64.000
AVERAGE
26.466
10.070
30.480
40.550
-23.450
64.000
AVERAGE
5
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 54 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:48
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN-T2 - Line1
Power : AC 230V/50Hz
Note : Mode 2, ISN Telecom
Page: 55 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:49
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN-T2 - Line1
Power : AC 230V/50Hz
Note : Mode 2, ISN Telecom
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.466
9.954
49.540
59.494
-15.477
74.971
QUASIPEAK
2
1.087
9.930
55.190
65.120
-8.880
74.000
QUASIPEAK
3
1.755
9.920
56.760
66.680
-7.320
74.000
QUASIPEAK
3.146
9.910
57.690
67.600
-6.400
74.000
QUASIPEAK
5
6.166
9.900
46.390
56.290
-17.710
74.000
QUASIPEAK
6
11.197
9.884
46.090
55.974
-18.026
74.000
QUASIPEAK
4
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 56 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:49
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN-T2 - Line1
Power : AC 230V/50Hz
Note : Mode 2, ISN Telecom
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.466
9.954
39.700
49.654
-15.317
64.971
AVERAGE
1.087
9.930
45.760
55.690
-8.310
64.000
AVERAGE
3
1.755
9.920
43.420
53.340
-10.660
64.000
AVERAGE
4
3.146
9.910
43.360
53.270
-10.730
64.000
AVERAGE
5
6.166
9.900
33.410
43.310
-20.690
64.000
AVERAGE
6
11.197
9.884
36.340
46.224
-17.776
64.000
AVERAGE
2
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 57 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:46
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN-T4 - Line1
Power : AC 230V/50Hz
Note : Mode 2, ISN 10Mbps
Page: 58 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:47
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN-T4 - Line1
Power : AC 230V/50Hz
Note : Mode 2, ISN 10Mbps
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.431
9.910
52.470
62.380
-13.591
75.971
QUASIPEAK
2
0.752
9.900
55.160
65.060
-8.940
74.000
QUASIPEAK
1.185
9.900
56.220
66.120
-7.880
74.000
QUASIPEAK
4
2.732
9.900
55.010
64.910
-9.090
74.000
QUASIPEAK
5
5.408
9.880
47.250
57.130
-16.870
74.000
QUASIPEAK
6
12.502
9.953
48.210
58.163
-15.837
74.000
QUASIPEAK
3
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 59 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:47
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN-T4 - Line1
Power : AC 230V/50Hz
Note : Mode 2, ISN 10Mbps
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.431
9.910
34.980
44.890
-21.081
65.971
AVERAGE
2
0.752
9.900
36.900
46.800
-17.200
64.000
AVERAGE
1.185
9.900
41.040
50.940
-13.060
64.000
AVERAGE
4
2.732
9.900
40.710
50.610
-13.390
64.000
AVERAGE
5
5.408
9.880
36.090
45.970
-18.030
64.000
AVERAGE
6
12.502
9.953
37.750
47.703
-16.297
64.000
AVERAGE
3
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 60 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:44
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN-T4 - Line1
Power : AC 230V/50Hz
Note : Mode 2, ISN 100Mbps
Page: 61 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:45
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN-T4 - Line1
Power : AC 230V/50Hz
Note : Mode 2, ISN 100Mbps
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
0.443
9.910
52.500
62.410
-13.219
75.629
QUASIPEAK
1.052
9.900
55.030
64.930
-9.070
74.000
QUASIPEAK
3
2.959
9.900
54.150
64.050
-9.950
74.000
QUASIPEAK
4
5.498
9.880
47.740
57.620
-16.380
74.000
QUASIPEAK
5
11.892
9.898
46.810
56.708
-17.292
74.000
QUASIPEAK
6
23.127
9.970
49.210
59.180
-14.820
74.000
QUASIPEAK
2
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 62 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:45
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN-T4 - Line1
Power : AC 230V/50Hz
Note : Mode 2, ISN 100Mbps
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.443
9.910
39.480
49.390
-16.239
65.629
AVERAGE
2
1.052
9.900
39.360
49.260
-14.740
64.000
AVERAGE
3
2.959
9.900
40.800
50.700
-13.300
64.000
AVERAGE
4
5.498
9.880
36.070
45.950
-18.050
64.000
AVERAGE
5
11.892
9.898
43.430
53.328
-10.672
64.000
AVERAGE
23.127
9.970
48.460
58.430
-5.570
64.000
AVERAGE
6
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 63 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:42
Limit : ISN_Voltage_B_00M_QP
Margin : 10
EUT : Notebook
Probe : ISN-T8 - Line1
Power : AC 230V/50Hz
Note : Mode 2, ISN 1G
Page: 64 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:43
Limit : ISN_Voltage_B_00M_QP
Margin : 0
EUT : Notebook
Probe : ISN-T8 - Line1
Power : AC 230V/50Hz
Note : Mode 2, ISN 1G
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.291
10.153
48.650
58.803
-21.168
79.971
QUASIPEAK
2
0.521
10.100
49.680
59.780
-14.220
74.000
QUASIPEAK
3
1.259
10.050
56.820
66.870
-7.130
74.000
QUASIPEAK
2.357
10.010
57.480
67.490
-6.510
74.000
QUASIPEAK
5
5.412
9.980
47.930
57.910
-16.090
74.000
QUASIPEAK
6
12.517
10.104
36.160
46.264
-27.736
74.000
QUASIPEAK
4
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 65 of 131
Report No: 088213R-ITCEP07V04
Site : SR-1
Time : 2008/08/18 - 11:43
Limit : ISN_Voltage_B_00M_AV
Margin : 0
EUT : Notebook
Probe : ISN-T8 - Line1
Power : AC 230V/50Hz
Note : Mode 2, ISN 1G
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV)
(dB)
(dBuV)
Detector Type
1
0.291
10.153
34.300
44.453
-25.518
69.971
AVERAGE
2
0.521
10.100
28.730
38.830
-25.170
64.000
AVERAGE
3
1.259
10.050
40.070
50.120
-13.880
64.000
AVERAGE
2.357
10.010
44.130
54.140
-9.860
64.000
AVERAGE
5
5.412
9.980
36.870
46.850
-17.150
64.000
AVERAGE
6
12.517
10.104
28.650
38.754
-25.246
64.000
AVERAGE
4
*
Note:
1. All Reading Levels are Quasi-Peak and average value.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 66 of 131
Report No: 088213R-ITCEP07V04
4.7. Test Photograph
Test Mode : Mode 1
Description : Front View of ISN Test
Test Mode : Mode 1
Description : Back View of ISN Test
Page: 67 of 131
Report No: 088213R-ITCEP07V04
Test Mode : Mode 2
Description : Front View of ISN Test
Test Mode : Mode 2
Description : Back View of ISN Test
Page: 68 of 131
Report No: 088213R-ITCEP07V04
5. Radiated Emission
5.1. Test Specification
According to EMC Standard : EN 55022
5.2. Test Setup
5.3. Limit
Limits
Frequency
(MHz)
Distance (m)
dBuV/m
30 – 230
10
30
230 – 1000
10
37
Remark:
1. The tighter limit shall apply at the edge between two frequency bands.
2. Distance refers to the distance in meters between the measuring instrument antenna
and the closed point of any part of the device or system.
Page: 69 of 131
Report No: 088213R-ITCEP07V04
5.4. Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The
turn table can rotate 360 degrees to determine the position of the maximum emission level.
The EUT was positioned such that the distance from antenna to the EUT was 10 meters.
The antenna can move up and down between 1 meter and 4 meters to find out the maximum
emission level.
Both horizontal and vertical polarization of the antenna are set on measurement. In order to
find the maximum emission, all of the interface cables must be manipulated on radiated
measurement.
Radiated emissions were invested over the frequency range from 30MHz to1GHz using a
receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10
meters.
5.5. Deviation from Test Standard
No deviation.
Page: 70 of 131
Report No: 088213R-ITCEP07V04
5.6. Test Result
Site : OATS-3
Time : 2008/08/20 - 05:25
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Notebook
Probe : 2007_Site3(2921)_10M - HORIZONTAL
Power : AC 230V/50Hz
Note : Mode 1
1
*
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
120.000
15.188
7.540
22.728
-7.272
30.000
QUASIPEAK
2
168.000
12.890
8.420
21.309
-8.691
30.000
QUASIPEAK
3
250.014
16.299
6.020
22.319
-14.681
37.000
QUASIPEAK
4
319.454
17.922
3.670
21.592
-15.408
37.000
QUASIPEAK
5
458.172
21.238
1.700
22.938
-14.062
37.000
QUASIPEAK
6
912.030
27.826
0.800
28.626
-8.374
37.000
QUASIPEAK
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 71 of 131
Report No: 088213R-ITCEP07V04
Site : OATS-3
Time : 2008/08/20 - 05:18
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Notebook
Probe : 2007_Site3(2921)_10M - VERTICAL
Power : AC 230V/50Hz
Note : Mode 1
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
69.480
8.714
11.270
19.984
-10.016
30.000
QUASIPEAK
120.000
15.188
7.980
23.168
-6.832
30.000
QUASIPEAK
3
168.008
12.889
6.640
19.529
-10.471
30.000
QUASIPEAK
4
240.009
15.590
6.020
21.610
-15.390
37.000
QUASIPEAK
5
317.710
17.872
4.200
22.072
-14.928
37.000
QUASIPEAK
6
458.172
21.238
1.380
22.618
-14.382
37.000
QUASIPEAK
2
*
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 72 of 131
Report No: 088213R-ITCEP07V04
Site : OATS-3
Time : 2008/08/20 - 05:59
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Notebook
Probe : 2007_Site3(2921)_10M - HORIZONTAL
Power : AC 230V/50Hz
Note : Mode 2
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
119.946
15.187
7.740
22.927
-7.073
30.000
QUASIPEAK
153.650
13.592
9.580
23.172
-6.828
30.000
QUASIPEAK
3
276.201
16.884
7.080
23.964
-13.036
37.000
QUASIPEAK
4
371.242
19.304
6.440
25.744
-11.256
37.000
QUASIPEAK
5
519.740
22.408
6.140
28.548
-8.452
37.000
QUASIPEAK
6
742.489
25.490
2.320
27.810
-9.190
37.000
QUASIPEAK
7
890.990
27.542
0.860
28.402
-8.598
37.000
QUASIPEAK
2
*
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 73 of 131
Report No: 088213R-ITCEP07V04
Site : OATS-3
Time : 2008/08/20 - 05:52
Limit : CISPR_B_10M_QP
Margin : 6
EUT : Notebook
Probe : 2007_Site3(2921)_10M - VERTICAL
Power : AC 230V/50Hz
Note : Mode 2
1
Frequency
Correct Factor
Reading Level
Measure Level
Margin
Limit
(MHz)
(dB)
(dBuV)
(dBuV/m)
(dB)
(dBuV/m)
Detector Type
58.020
8.245
11.200
19.445
-10.555
30.000
QUASIPEAK
116.736
15.102
11.230
26.333
-3.667
30.000
QUASIPEAK
3
179.841
12.425
11.350
23.775
-6.225
30.000
QUASIPEAK
4
226.800
14.642
11.350
25.992
-4.008
30.000
QUASIPEAK
5
371.240
19.304
5.100
24.404
-12.596
37.000
QUASIPEAK
6
458.175
21.238
5.180
26.418
-10.582
37.000
QUASIPEAK
7
742.490
25.490
6.160
31.651
-5.349
37.000
QUASIPEAK
8
912.023
27.826
3.100
30.926
-6.074
37.000
QUASIPEAK
2
*
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or
average measurements as necessary.
2. " * ", means this data is the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
Page: 74 of 131
Report No: 088213R-ITCEP07V04
5.7. Test Photograph
Test Mode : Mode 1
Description : Front View of Radiated Test
Test Mode : Mode 1
Description : Back View of Radiated Test
Page: 75 of 131
Report No: 088213R-ITCEP07V04
Test Mode : Mode 2
Description : Front View of Radiated Test
Test Mode : Mode 2
Description : Back View of Radiated Test
Page: 76 of 131
Report No: 088213R-ITCEP07V04
6. Harmonic Current Emission
6.1. Test Specification
According to EMC Standard : EN 61000-3-2
6.2. Test Setup
6.3. Limit
(a) Limits of Class A Harmonics Currents
Harmonics
Maximum Permissible
Harmonics
Maximum Permissible
Order
harmonic current
Order
harmonic current
n
A
n
A
Odd harmonics
Even harmonics
3
2.30
2
1.08
5
1.14
4
0.43
7
0.77
6
0.30
9
0.40
8  n  40
0.23 * 8/n
11
0.33
13
0.21
15  n  39
0.15 * 15/n
Page: 77 of 131
Report No: 088213R-ITCEP07V04
(b) Limits of Class B Harmonics Currents
For Class B equipment, the harmonic of the input current shall not exceed the maximum
permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.
(c) Limits of Class C Harmonics Currents
Harmonics Order
Maximum Permissible harmonic current
Expressed as a percentage of the input
current at the fundamental frequency
n
%
2
2
3
30.λ
5
10
7
7
9
5
11  n  39
*
3
(odd harmonics only)
*λ is the circuit power factor
(d) Limits of Class D Harmonics Currents
Harmonics Order
Maximum Permissible
Maximum Permissible
harmonic current per watt
harmonic current
n
mA/W
A
3
3.4
2.30
5
1.9
1.14
7
1.0
0.77
9
0.5
0.40
11
0.35
0.33
3.85/n
See limit of Class A
11  n  39
(odd harmonics only)
Page: 78 of 131
Report No: 088213R-ITCEP07V04
6.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
6.5. Deviation from Test Standard
No deviation.
Page: 79 of 131
Report No: 088213R-ITCEP07V04
6.6. Test Result
Product
Notebook
Test Item
Power Harmonics
Test Mode
Mode 1
Date of Test
2008/08/27
Test Result: Pass
Test Site
No.3 Shielded Room
Source qualification: Normal
0.6
300
0.4
200
0.2
100
0.0
0
-0.2
-100
-0.4
-200
-0.6
-300
Harmonics and Class D limit line
European Limits
Current RMS(Amps)
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
Worst harmonic was #0 with 0.00% of the limit.
Page: 80 of 131
32
36
40
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
Report No: 088213R-ITCEP07V04
Test Result: Pass
Source qualification: Normal
THC(A): 0.00
I-THD(%): 0.00
POHC(A): 0.000
Highest parameter values during test:
V_RMS (Volts): 229.74
Frequency(Hz):
I_Peak (Amps): 0.528
I_RMS (Amps):
I_Fund (Amps): 0.255
Crest Factor:
Power (Watts):
57.7
Power Factor:
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.000
0.051
0.000
0.013
0.000
0.009
0.000
0.006
0.000
0.003
0.000
0.002
0.000
0.003
0.000
0.003
0.000
0.002
0.000
0.002
0.000
0.002
0.000
0.002
0.000
0.002
0.000
0.002
0.000
0.001
0.000
0.001
0.000
0.001
0.000
0.001
0.000
0.001
0.001
POHC Limit(A): 0.000
50.00
0.271
2.001
0.927
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.196
0.0
0.055
0.294
0.00
Pass
0.110
0.0
0.014
0.164
0.00
Pass
0.058
0.0
0.010
0.087
0.00
Pass
0.029
0.0
0.007
0.043
0.00
Pass
0.020
0.0
0.005
0.030
0.00
Pass
0.017
0.0
0.003
0.026
0.00
Pass
0.015
0.0
0.003
0.022
0.00
Pass
0.013
0.0
0.003
0.020
0.00
Pass
0.012
0.0
0.003
0.018
0.00
Pass
0.011
0.0
0.002
0.016
0.00
Pass
0.010
0.0
0.003
0.014
0.00
Pass
0.009
0.0
0.003
0.013
0.00
Pass
0.008
0.0
0.002
0.012
0.00
Pass
0.008
0.0
0.002
0.011
0.00
Pass
0.007
0.0
0.001
0.011
0.00
Pass
0.007
0.0
0.001
0.010
0.00
Pass
0.006
0.0
0.001
0.010
0.00
Pass
0.006
0.0
0.001
0.009
0.00
Pass
0.006
0.0
0.001
0.009
0.00
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the
same window as the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power
>75W. Others the result should be pass.
Page: 81 of 131
Report No: 088213R-ITCEP07V04
Product
Notebook
Test Item
Power Harmonics
Test Mode
Mode 2
Date of Test
2008/08/27
Test Result: Pass
Test Site
No.3 Shielded Room
Source qualification: Normal
0.9
300
0.6
200
0.3
100
0.0
0
-0.3
-100
-0.6
-200
-0.9
-300
Current RMS(Amps)
Harmonics and Class D limit line
European Limits
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
4
Test result: Pass
8
12
16 20 24
Harmonic #
28
Worst harmonic was #3 with 41.05% of the limit.
Page: 82 of 131
32
36
40
Voltage (Volts)
Current (Amps)
Current & voltage waveforms
Report No: 088213R-ITCEP07V04
Test Result: Pass
Source qualification: Normal
THC(A): 0.13
I-THD(%): 47.88
POHC(A): 0.002
Highest parameter values during test:
V_RMS (Volts): 229.74
Frequency(Hz):
I_Peak (Amps): 0.918
I_RMS (Amps):
I_Fund (Amps): 0.330
Crest Factor:
Power (Watts):
75.8
Power Factor:
Harm#
Harms(avg)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
0.009
0.127
0.004
0.015
0.002
0.008
0.001
0.003
0.001
0.001
0.001
0.002
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
0.001
POHC Limit(A): 0.033
50.00
0.387
3.126
0.853
100%Limit
%of Limit
Harms(max)
150%Limit
%of Limit
Status
0.258
0.0
0.160
0.387
0.00
Pass
0.144
0.0
0.021
0.216
0.00
Pass
0.076
0.0
0.010
0.114
0.00
Pass
0.038
0.0
0.004
0.053
0.00
Pass
0.027
0.0
0.002
0.040
0.00
Pass
0.023
0.0
0.004
0.034
0.00
Pass
0.020
0.0
0.001
0.027
0.00
Pass
0.017
0.0
0.002
0.022
0.00
Pass
0.015
0.0
0.002
0.023
0.00
Pass
0.014
0.0
0.001
0.021
0.00
Pass
0.013
0.0
0.002
0.018
0.00
Pass
0.012
0.0
0.001
0.018
6.68
Pass
0.011
0.0
0.001
0.016
0.00
Pass
0.010
0.0
0.001
0.015
0.00
Pass
0.009
0.0
0.001
0.014
0.00
Pass
0.009
0.0
0.001
0.013
6.57
Pass
0.008
0.0
0.001
0.013
0.00
Pass
0.008
0.0
0.001
0.012
0.00
Pass
0.008
0.0
0.002
0.010
0.00
Pass
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the
same window as the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power
>75W. Others the result should be pass.
Page: 83 of 131
Report No: 088213R-ITCEP07V04
6.7. Test Photograph
Test Mode : Mode 1
Description : Power Harmonics Test Setup
Test Mode : Mode 2
Description : Power Harmonics Test Setup
Page: 84 of 131
Report No: 088213R-ITCEP07V04
7. Voltage Fluctuation and Flicker
7.1. Test Specification
According to EMC Standard : EN 61000-3-3
7.2. Test Setup
7.3. Limit
The following limits apply:
- the value of Pst shall not be greater than 1.0;
- the value of Plt shall not be greater than 0.65;
- the value of d(t) during a voltage change shall not exceed 3.3 % for more than 500
ms;
- the relative steady-state voltage change, dc, shall not exceed 3.3 %;
- the maximum relative voltage change, dmax, shall not exceed;
a) 4 % without additional conditions;
b)
6 % for equipment which is:
- switched manually, or
- switched automatically more frequently than twice per day, and also has either a
delayed restart (the delay being not less than a few tens of seconds), or manual restart,
after a power supply interruption.
NOTE The cycling frequency will be further limited by the Pst and P1t limit.
For example: a dmax of 6%producing a rectangular voltage change characteristic twice per
hour will give a P1t of about 0.65.
Page: 85 of 131
Report No: 088213R-ITCEP07V04
c)
7 % for equipment which is:
- attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment
such as mixers, garden equipment such as lawn mowers, portable tools such as
electric drills), or
- switched on automatically, or is intended to be switched on manually, no more than
twice per day, and also has either a delayed restart (the delay being not less than a
few tens of seconds) or manual restart, after a power supply interruption.
Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.
7.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same
normal voltage and frequency as the rated supply voltage and the equipment under test.
And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be
performed.
7.5. Deviation from Test Standard
No deviation.
Page: 86 of 131
Report No: 088213R-ITCEP07V04
7.6. Test Result
Product
Notebook
Test Item
Voltage Fluctuation and Flicker
Test Mode
Mode 1
Date of Test
2008/08/27
Test Result: Pass
Psti and limit line
Test Site
No.3 Shielded Room
Status: Test Completed
European Limits
1.00
Pst
0.75
0.50
0.25
1:29:38
Plt and limit line
Plt
0.50
0.25
1:29:38
Parameter values recorded during the test:
Vrms at the end of test (Volt):
229.63
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Highest Pst (10 min. period):
0.160
Highest Plt (2 hr. period):
0.070
Test limit (%):
Test limit (mS):
Test limit (%):
Test limit (%):
Test limit:
Test limit:
Page: 87 of 131
3.30
500.0
3.30
4.00
1.000
0.650
Pass
Pass
Pass
Pass
Pass
Pass
Report No: 088213R-ITCEP07V04
Product
Notebook
Test Item
Voltage Fluctuation and Flicker
Test Mode
Mode 2
Date of Test
2008/08/27
Test Result: Pass
Psti and limit line
Test Site
No.3 Shielded Room
Status: Test Completed
European Limits
1.00
Pst
0.75
0.50
0.25
2:00:12
Plt and limit line
Plt
0.50
0.25
2:00:12
Parameter values recorded during the test:
Vrms at the end of test (Volt):
229.69
Highest dt (%):
0.00
Time(mS) > dt:
0.0
Highest dc (%):
0.00
Highest dmax (%):
0.00
Highest Pst (10 min. period):
0.160
Highest Plt (2 hr. period):
0.070
Test limit (%):
Test limit (mS):
Test limit (%):
Test limit (%):
Test limit:
Test limit:
Page: 88 of 131
3.30
500.0
3.30
4.00
1.000
0.650
Pass
Pass
Pass
Pass
Pass
Pass
Report No: 088213R-ITCEP07V04
7.7. Test Photograph
Test Mode
Description
Test Mode
Description
: Mode 1
: Flicker Test Setup
: Mode 2
: Flicker Test Setup
Page: 89 of 131
Report No: 088213R-ITCEP07V04
8. Electrostatic Discharge
8.1. Test Specification
According to Standard : IEC 61000-4-2
8.2. Test Setup
8.3. Limit
Item Environmental
Units
Test Specification
Phenomena
Performance
Criteria
Enclosure Port
Electrostatic Discharge kV(Charge Voltage)
±8 Air Discharge
±4 Contact Discharge
Page: 90 of 131
B
Report No: 088213R-ITCEP07V04
8.4. Test Procedure
Direct application of discharges to the EUT:
Contact discharge was applied only to conductive surfaces of the EUT.
Air discharges were applied only to non-conductive surfaces of the EUT.
During the test, it was performed with single discharges. For the single discharge
time between successive single discharges will be keep longer 1 second. It was at
least ten single discharges with positive and negative at the same selected point.
The selected point, which was performed with electrostatic discharge, was marked
on the red label of the EUT.
Indirect application of discharges to the EUT:
Vertical Coupling Plane (VCP):
The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned
at a distance 0.1m from, the EUT, with the Discharge Electrode touching the
coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
least ten single discharges with positive and negative at the same selected point.
Horizontal Coupling Plane (HCP):
The coupling plane is placed under to the EUT. The generator shall be positioned
vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching
the coupling plane.
The four faces of the EUT will be performed with electrostatic discharge. It was at
least ten single discharges with positive and negative at the same selected point.
8.5. Deviation from Test Standard
No deviation.
Page: 91 of 131
Report No: 088213R-ITCEP07V04
8.6. Test Result
Product
Notebook
Test Item
Electrostatic Discharge
Test Mode
Mode 1
Date of Test
2008/08/27
Test Site
No.3 Shielded Room
Voltage
Required
Criteria
Complied To
Criteria
(A,B,C)
Results
10
+8kV
B
B
Pass
10
-8kV
B
B
Pass
25
+4kV
B
B
Pass
25
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(HCP)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Front)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Left)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Back)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Right)
50
-4kV
B
A
Pass
Item
Air Discharge
Contact Discharge
Amount of
Discharge
Note:
The testing performed is from lowest level up to the highest level as required by standard,
but only highest level is shown on the report.
NR: No Requirement
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV.
No false alarms or other malfunctions were observed during or after the test.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four
test points.
Page: 92 of 131
Report No: 088213R-ITCEP07V04
Product
Notebook
Test Item
Electrostatic Discharge
Test Mode
Mode 2
Date of Test
2008/08/27
Test Site
No.3 Shielded Room
Voltage
Required
Criteria
Complied To
Criteria
(A,B,C)
Results
10
+8kV
B
B
Pass
10
-8kV
B
B
Pass
25
+4kV
B
B
Pass
25
-4kV
B
B
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(HCP)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Front)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Left)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Back)
50
-4kV
B
A
Pass
Indirect Discharge
50
+4kV
B
A
Pass
(VCP Right)
50
-4kV
B
A
Pass
Item
Air Discharge
Contact Discharge
Amount of
Discharge
Note:
The testing performed is from lowest level up to the highest level as required by standard,
but only highest level is shown on the report.
NR: No Requirement
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
kV.
No false alarms or other malfunctions were observed during or after the test.
Remark:
The Contact discharges were applied at least total 200 discharges at a minimum of four
test points.
Page: 93 of 131
Report No: 088213R-ITCEP07V04
8.7. Test Photograph
Test Mode
Description
Test Mode
Description
: Mode 1
: ESD Test Setup
: Mode 2
: ESD Test Setup
Page: 94 of 131
Report No: 088213R-ITCEP07V04
9. Radiated Susceptibility
9.1. Test Specification
According to Standard : IEC 61000-4-3
9.2. Test Setup
9.3. Limit
Item Environmental
Units
Phenomena
Test
Performance
Specification
Criteria
Enclosure Port
80-1000
Radio-Frequency
MHz
Electromagnetic Field
V/m(Un-modulated, rms) 3
Amplitude Modulated
% AM (1kHz)
Page: 95 of 131
80
A
Report No: 088213R-ITCEP07V04
9.4. Test Procedure
The EUT and load, which are placed on a table that is 0.8 meter above ground, are
placed with one coincident with the calibration plane such that the distance from
antenna to the EUT was 3 meters.
Both horizontal and vertical polarization of the antenna and four sides of the EUT are set
on measurement.
In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.
All the scanning conditions are as follows:
Condition of Test
Remarks
1.
Field Strength
3 V/m Level 2
2.
Radiated Signal
AM 80% Modulated with 1kHz
3.
Scanning Frequency
80MHz - 1000MHz
4
Dwell Time
3 Seconds
5.
Frequency step size
6.
The rate of Swept of Frequency
 f :
1%
1.5 x 10-3 decades/s
9.5. Deviation from Test Standard
No deviation.
Page: 96 of 131
Report No: 088213R-ITCEP07V04
9.6. Test Result
Product
Notebook
Test Item
Radiated susceptibility
Test Mode
Mode 1
Date of Test
2008/08/27
Test Site
Chamber5
Frequency
(MHz)
Position
(Angle)
Polarity
(H or V)
Field
Strength
(V/m)
Required
Criteria
Complied
To Criteria
(A,B,C)
Results
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Note:
The testing performed is from lowest level up to the highest level as required by
standard, but only highest level is shown on the report.
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
There was no observable degradation in performance.
EUT stopped operation and could / could not be reset by operator at
MHz.
at frequency
No false alarms or other malfunctions were observed during or after the test.
Page: 97 of 131
V/m
Report No: 088213R-ITCEP07V04
Product
Notebook
Test Item
Radiated susceptibility
Test Mode
Mode 2
Date of Test
2008/08/27
Test Site
Chamber5
Frequency
(MHz)
Position
(Angle)
Polarity
(H or V)
Field
Strength
(V/m)
Required
Criteria
Complied
To Criteria
(A,B,C)
Results
80-1000
FRONT
H
3
A
A
PASS
80-1000
FRONT
V
3
A
A
PASS
80-1000
BACK
H
3
A
A
PASS
80-1000
BACK
V
3
A
A
PASS
80-1000
RIGHT
H
3
A
A
PASS
80-1000
RIGHT
V
3
A
A
PASS
80-1000
LEFT
H
3
A
A
PASS
80-1000
LEFT
V
3
A
A
PASS
80-1000
UP
H
3
A
A
PASS
80-1000
UP
V
3
A
A
PASS
80-1000
DOWN
H
3
A
A
PASS
80-1000
DOWN
V
3
A
A
PASS
Note:
The testing performed is from lowest level up to the highest level as required by
standard, but only highest level is shown on the report.
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
There was no observable degradation in performance.
EUT stopped operation and could / could not be reset by operator at
at frequency
MHz.
No false alarms or other malfunctions were observed during or after the test.
Page: 98 of 131
V/m
Report No: 088213R-ITCEP07V04
9.7. Test Photograph
Test Mode : Mode 1
Description : Radiated Susceptibility Test Setup
Test Mode : Mode 2
Description : Radiated Susceptibility Test Setup
Page: 99 of 131
Report No: 088213R-ITCEP07V04
10. Electrical Fast Transient/Burst
10.1. Test Specification
According to Standard : IEC 61000-4-4
10.2. Test Setup
10.3. Limit
Item Environmental
Units
Phenomena
I/O and communication ports
Fast Transients Common kV (Peak)
Mode
Tr/Th ns
Rep. Frequency kHz
Input DC Power Ports
Fast Transients Common kV (Peak)
Mode
Tr/Th ns
Rep. Frequency kHz
Input AC Power Ports
Fast Transients Common kV (Peak)
Mode
Tr/Th ns
Rep. Frequency kHz
Page: 100 of 131
Test Specification Performance
Criteria
+0.5
5/50
5
B
+0.5
5/50
5
B
+1
5/50
5
B
Report No: 088213R-ITCEP07V04
10.4. Test Procedure
The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on
the table, and uses a 0.1m insulation between the EUT and ground reference plane.
The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and
projected beyond the EUT by at least 0.1m on all sides.
Test on I/O and communication ports:
The EFT interference signal is through a coupling clamp device couples to the signal and
control lines of the EUT with burst noise for 1minute.
Test on power supply ports:
The EUT is connected to the power mains through a coupling device that directly couples the
EFT/B interference signal.
Each of the Line and Neutral conductors is impressed with burst noise for 1 minute.
The length of the signal and power lines between the coupling device and the EUT is 0.5m.
10.5. Deviation from Test Standard
No deviation.
Page: 101 of 131
Report No: 088213R-ITCEP07V04
10.6. Test Result
Product
Notebook
Test Item
Electrical fast transient/burst
Test Mode
Mode 1
Date of Test
2008/08/27
Voltage
Test Site
No.6 Shielded Room
Inject
Method
Required
Criteria
Complied
to
Criteria
Result
kV
Inject
Time
(Second)
±
1kV
60
Direct
B
B
PASS
LAN
±
0.5kV
60
Clamp
B
A
PASS
Telecom
±
0.5kV
60
Clamp
B
B
PASS
Inject
Line
Polarity
L-N-PE
Note:
The testing performed is from lowest level up to the highest level as required by
standard, but only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
.
Line
No false alarms or other malfunctions were observed during or after the test.
Page: 102 of 131
kV of
Report No: 088213R-ITCEP07V04
Product
Notebook
Test Item
Electrical fast transient/burst
Test Mode
Mode 2
Date of Test
2008/08/27
Voltage
Test Site
No.6 Shielded Room
Inject
Method
Required
Criteria
Complied
to
Criteria
Result
kV
Inject
Time
(Second)
±
1kV
60
Direct
B
B
PASS
LAN
±
0.5kV
60
Clamp
B
A
PASS
Telecom
±
0.5kV
60
Clamp
B
B
PASS
Inject
Line
Polarity
L-N-PE
Note:
The testing performed is from lowest level up to the highest level as required by
standard, but only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
Line
.
No false alarms or other malfunctions were observed during or after the test.
Page: 103 of 131
kV of
Report No: 088213R-ITCEP07V04
10.7. Test Photograph
Test Mode : Mode 1
Description : EFT/B Test Setup
Test Mode : Mode 1
Description : EFT/B Test Setup-Clamp
Page: 104 of 131
Report No: 088213R-ITCEP07V04
Test Mode : Mode 2
Description : EFT/B Test Setup
Test Mode : Mode 2
Description : EFT/B Test Setup-Clamp
Page: 105 of 131
Report No: 088213R-ITCEP07V04
11. Surge
11.1. Test Specification
According to Standard : IEC 61000-4-5
11.2. Test Setup
11.3. Limit
Item Environmental Phenomena Units
Test Specification Performance
Criteria
Signal Ports and Telecommunication Ports(See 1) and 2) )
Surges
Tr/Th us
1.2/50 (8/20)
B
Line to Ground
kV
1
Input DC Power Ports
Surges
Tr/Th us
1.2/50 (8/20)
B
Line to Ground
kV
 0.5
AC Input and AC Output Power Ports
1.2/50 (8/20)
Tr/Th us
Surges
kV
Line to Line
1
B
kV
Line to Ground
2
Notes:
1) Applicable only to ports which according to the manufacturer’s may directly to outdoor
cables.
2) Where normal functioning cannot be achieved because of the impact of the CDN on the
EUT, no immunity test shall be required.
Page: 106 of 131
Report No: 088213R-ITCEP07V04
11.4. Test Procedure
The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane
measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides. The length of power cord between the coupling device and the EUT shall
be 2m or less.
For Input and Output AC Power or DC Input and DC Output Power Ports:
The EUT is connected to the power mains through a coupling device that directly couples the
Surge interference signal.
The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and
the peak value of the a.c. voltage wave. (Positive and negative)
Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with
interval of 1 min.
11.5. Deviation from Test Standard
No deviation.
Page: 107 of 131
Report No: 088213R-ITCEP07V04
11.6. Test Result
Product
Notebook
Test Item
Surge
Test Mode
Mode 1
Date of Test
2008/08/27
Test Site
Voltage
No.6 Shielded Room
Time
Complied
Inject Required
Interval
to
Method Criteria
(Second)
Criteria
Inject
Line
Polarity
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Angle
kV
Result
Note:
The testing performed is from lowest level up to the highest level as required by
standard, but only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
.
Line
kV of
No false alarms or other malfunctions were observed during or after the test.
Page: 108 of 131
Report No: 088213R-ITCEP07V04
Product
Notebook
Test Item
Surge
Test Mode
Mode 2
Date of Test
2008/08/27
Test Site
Voltage
No.6 Shielded Room
Time
Complied
Inject Required
Interval
to
Method Criteria
(Second)
Criteria
Inject
Line
Polarity
L-N
±
0
1kV
60
Direct
B
A
PASS
L-N
±
90
1kV
60
Direct
B
A
PASS
L-N
±
180
1kV
60
Direct
B
A
PASS
L-N
±
270
1kV
60
Direct
B
A
PASS
L-PE
±
0
2kV
60
Direct
B
A
PASS
L-PE
±
90
2kV
60
Direct
B
A
PASS
L-PE
±
180
2kV
60
Direct
B
A
PASS
L-PE
±
270
2kV
60
Direct
B
A
PASS
N-PE
±
0
2kV
60
Direct
B
A
PASS
N-PE
±
90
2kV
60
Direct
B
A
PASS
N-PE
±
180
2kV
60
Direct
B
A
PASS
N-PE
±
270
2kV
60
Direct
B
A
PASS
Angle
kV
Result
Note:
The testing performed is from lowest level up to the highest level as required by
standard, but only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
Line
.
kV of
No false alarms or other malfunctions were observed during or after the test.
Page: 109 of 131
Report No: 088213R-ITCEP07V04
11.7. Test Photograph
Test Mode : Mode 1
Description : SURGE Test Setup
Test Mode : Mode 2
Description : SURGE Test Setup
Page: 110 of 131
Report No: 088213R-ITCEP07V04
12. Conducted Susceptibility
12.1. Test Specification
According to Standard : IEC 61000-4-6
12.2. Test Setup
CDN Test Mode
EM Clamp Test Mode
Page: 111 of 131
Report No: 088213R-ITCEP07V04
12.3. Limit
Item Environmental Phenomena Units
Test
Specification
Signal Ports and Telecommunication Ports
Radio-Frequency
MHz
Continuous Conducted
V (rms,
Un-modulated)
% AM (1kHz)
Input DC Power Ports
Radio-Frequency
MHz
Continuous Conducted
V (rms,
Un-modulated)
% AM (1kHz)
Input AC Power Ports
Radio-Frequency
MHz
Continuous Conducted
V (rms,
Un-modulated)
% AM (1kHz)
0.15-80
3
80
0.15-80
3
80
0.15-80
3
80
Performance
Criteria
A
A
A
12.4. Test Procedure
The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the
table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground
reference plane.
For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp
device couples to the signal and Telecommunication lines of the EUT.
For Input DC and AC Power Ports
The EUT is connected to the power mains through a coupling and decoupling networks for
power supply lines. And directly couples the disturbances signal into EUT.
Used CDN-M2 for two wires or CDN-M3 for three wires.
All the scanning conditions are as follows:
Condition of Test
1. Field Strength
2. Radiated Signal
3. Scanning Frequency
4 Dwell Time
5. Frequency step size
 f :
6. The rate of Swept of Frequency
Remarks
130dBuV(3V) Level 2
AM 80% Modulated with 1kHz
0.15MHz – 80MHz
3 Seconds
1%
1.5 x 10-3 decades/s
12.5. Deviation from Test Standard
No deviation.
Page: 112 of 131
Report No: 088213R-ITCEP07V04
12.6. Test Result
Product
Notebook
Test Item
Conducted susceptibility
Test Mode
Mode 1
Date of Test
2008/08/27
Frequency
Range
Test Site
No.6 Shielded Room
Inject
Method
Tested Port
of
EUT
Required
Criteria
Performance
Criteria
Complied To
Result
(MHz)
Voltage
Applied
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
CDN
LAN
A
A
PASS
0.15~80
130 (3V)
CDN
GIGA
A
A
PASS
0.15~80
130 (3V)
CDN
Telecom
A
A
PASS
Note:
The testing performed is from lowest level up to the highest level as required by
standard, but only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
dBuV(V) at
frequency
MHz.
No false alarms or other malfunctions were observed during or after the test. The
acceptance criteria were met, and the EUT passed the test.
Page: 113 of 131
Report No: 088213R-ITCEP07V04
Product
Notebook
Test Item
Conducted susceptibility
Test Mode
Mode 2
Date of Test
2008/08/27
Frequency
Range
Test Site
No.6 Shielded Room
Inject
Method
Tested Port
of
EUT
Required
Criteria
Performance
Criteria
Complied To
Result
(MHz)
Voltage
Applied
dBuV(V)
0.15~80
130 (3V)
CDN
AC IN
A
A
PASS
0.15~80
130 (3V)
CDN
LAN
A
A
PASS
0.15~80
130 (3V)
CDN
GIGA
A
A
PASS
0.15~80
130 (3V)
CDN
Telecom
A
A
PASS
Note:
The testing performed is from lowest level up to the highest level as required by
standard, but only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test
Meet criteria B : Operate as intended after the test
Meet criteria C : Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
dBuV(V) at
frequency
MHz.
No false alarms or other malfunctions were observed during or after the test. The
acceptance criteria were met, and the EUT passed the test.
Page: 114 of 131
Report No: 088213R-ITCEP07V04
12.7. Test Photograph
Test Mode : Mode 1
Description : Conducted Susceptibility Test Setup
Test Mode : Mode 1
Description : Conducted Susceptibility Test Setup –CDN
Page: 115 of 131
Report No: 088213R-ITCEP07V04
Test Mode : Mode 2
Description : Conducted Susceptibility Test Setup
Test Mode : Mode 2
Description : Conducted Susceptibility Test Setup –CDN
Page: 116 of 131
Report No: 088213R-ITCEP07V04
13. Power Frequency Magnetic Field
13.1. Test Specification
According to Standard : IEC 61000-4-8
13.2. Test Setup
13.3. Limit
Item
Environmental
Phenomena
Enclosure Port
Power-Frequency
Magnetic Field
Units
Test Specification Performance
Criteria
Hz
A/m (r.m.s.)
50
1
A
13.4. Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground
plane measured at least 1m*1m min. The test magnetic field shall be placed at central
of the induction coil.
The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.
And the induction coil shall be rotated by 90 in order to expose the EUT to the test field
with different orientation (X, Y, Z Orientations).
13.5. Deviation from Test Standard
No deviation.
Page: 117 of 131
Report No: 088213R-ITCEP07V04
13.6. Test Result
Product
Notebook
Test Item
Power frequency magnetic field
Test Mode
Mode 1
Date of Test
2008/08/26
Polarization
Frequency
(Hz)
Test Site
Magnetic
Strength
(A/m)
No.3 Shielded Room
Required
Performance
Performance
Criteria
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
of Line
.
No false alarms or other malfunctions were observed during or after the test. The
acceptance criteria were met, and the EUT passed the test.
Page: 118 of 131
kV
Report No: 088213R-ITCEP07V04
Product
Notebook
Test Item
Power frequency magnetic field
Test Mode
Mode 2
Date of Test
2008/08/26
Polarization
Frequency
(Hz)
Test Site
Magnetic
Strength
(A/m)
No.3 Shielded Room
Required
Performance
Performance
Criteria
Criteria
Complied To
Test Result
X Orientation
50
1
A
A
PASS
Y Orientation
50
1
A
A
PASS
Z Orientation
50
1
A
A
PASS
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
EUT stopped operation and could / could not be reset by operator at
of Line
.
No false alarms or other malfunctions were observed during or after the test. The
acceptance criteria were met, and the EUT passed the test.
Page: 119 of 131
kV
Report No: 088213R-ITCEP07V04
13.7. Test Photograph
Test Mode : Mode 1
Description : Power Frequency Magnetic Field Test Setup
Test Mode : Mode 2
Description : Power Frequency Magnetic Field Test Setup
Page: 120 of 131
Report No: 088213R-ITCEP07V04
14. Voltage Dips and Interruption
14.1. Test Specification
According to Standard : IEC 61000-4-11
14.2. Test Setup
14.3. Limit
Item Environmental
Units
Test Specification Performance
Phenomena
Input AC Power Ports
Voltage Dips
Criteria
% Reduction
30
Period
25
% Reduction
Period
Voltage Interruptions
>95
0.5
% Reduction
> 95
Period
250
Page: 121 of 131
C
B
C
Report No: 088213R-ITCEP07V04
14.4. Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane
measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least
0.1m on all sides. The power cord shall be used the shortest power cord as specified by the
manufacturer.
For Voltage Dips/ Interruptions test:
The selection of test voltage is based on the rated power range. If the operation range is
large than 20% of lower power range, both end of specified voltage shall be tested.
Otherwise, the typical voltage specification is selected as test voltage.
The EUT is connected to the power mains through a coupling device that directly couples to
the Voltage Dips and Interruption Generator.
The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods,
for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three
voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied
voltage and duration 250 Periods with a sequence of three voltage interruptions with
intervals of 10 seconds.
Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of the
voltage.
14.5. Deviation from Test Standard
No deviation.
Page: 122 of 131
Report No: 088213R-ITCEP07V04
14.6. Test Result
Product
Notebook
Test Item
Voltage dips and interruption
Test Mode
Mode 1
Date of Test
2008/08/27
Voltage Dips and
Interruption
Reduction(%)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
Angle
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
Test Site
Test
Duration
(Periods)
25
25
25
25
25
25
25
25
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
250
250
250
250
250
250
250
250
No.6 Shielded Room
Required Performance Test Result
Performance
Criteria
Criteria
Complied To
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
C
B
PASS
C
B
PASS
C
B
PASS
C
B
PASS
C
B
PASS
C
B
PASS
C
B
PASS
C
B
PASS
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
The nominal voltage of EUT is 230V.
EUT stopped operation and could / could not be reset by operator at
of Line
.
No false alarms or other malfunctions were observed during or after the test. The
acceptance criteria were met, and the EUT passed the test.
Page: 123 of 131
kV
Report No: 088213R-ITCEP07V04
Product
Notebook
Test Item
Voltage dips and interruption
Test Mode
Mode 2
Date of Test
2008/08/27
Voltage Dips and
Interruption
Reduction(%)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
30(161V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
>95(0V)
Angle
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
0
45
90
135
180
225
270
315
Test Site
Test
Duration
(Periods)
25
25
25
25
25
25
25
25
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
250
250
250
250
250
250
250
250
No.6 Shielded Room
Required Performance Test Result
Performance
Criteria
Criteria
Complied To
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
C
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
B
A
PASS
C
B
PASS
C
B
PASS
C
B
PASS
C
B
PASS
C
B
PASS
C
B
PASS
C
B
PASS
C
B
PASS
Meet criteria A: Operate as intended during and after the test
Meet criteria B: Operate as intended after the test
Meet criteria C: Loss/Error of function
Additional Information
The nominal voltage of EUT is 230V.
EUT stopped operation and could / could not be reset by operator at
of Line
.
No false alarms or other malfunctions were observed during or after the test. The
acceptance criteria were met, and the EUT passed the test.
Page: 124 of 131
kV
Report No: 088213R-ITCEP07V04
14.7. Test Photograph
Test Mode : Mode 1
Description : Voltage Dips Test Setup
Test Mode : Mode 2
Description : Voltage Dips Test Setup
Page: 125 of 131
Report No: 088213R-ITCEP07V04
15. Attachment
 EUT Photograph
(1) EUT Photo
(2) EUT Photo
Page: 126 of 131
Report No: 088213R-ITCEP07V04
(3) EUT Photo
(4) EUT Photo
Page: 127 of 131
Report No: 088213R-ITCEP07V04
(5) EUT Photo
(6) EUT Photo
Page: 128 of 131
Report No: 088213R-ITCEP07V04
(7) EUT Photo
(8) EUT Photo
Page: 129 of 131
Report No: 088213R-ITCEP07V04
(9) EUT Photo
(10) EUT Photo
Page: 130 of 131
Report No: 088213R-ITCEP07V04
(11) EUT Photo
(12) EUT Photo
Page: 131 of 131