Документация lvr005ns_eng_tds

Документация lvr005ns_eng_tds
PolySwitch®
PTC Devices
PRODUCT: LVR005NS
DOCUMENT: SCD27240
REV LETTER: F
REV DATE: MAY 11, 2011
PAGE NO.: 1 OF 2
Overcurrent Protection Device
308 Constitution Drive
Menlo Park, CA 94025-1164
Phone: 800-227-4856
www.circuitprotection.com
Specification Status: Released
Rated Operating Voltage at 20 °C (AC/DC):
240 V
Maximum Interrupt Voltage / Current at 20 °C (AC/DC):
265 V, 1.0 A
135 V, 20 A
Insulating Material:
Cured, Flame Retardant Epoxy Polymer
Lead Material:
24 AWG Sn-Plated Copper (0.52mm/0.020” nominal diameter)
Marking:
TABLE I. DIMENSIONS:
A
B
MIN
MAX
MIN
MAX
mm:
-6.9
-9.9
in:*
-(0.27)
-(0.39)
*Rounded off approximation
C
MIN
4.3
(0.17)
D
MAX
5.8
(0.23)
MIN
7.6
(0.30)
E
MAX
---
MIN
---
MAX
4.6
(0.18)
TABLE II. PERFORMANCE RATINGS @ 20 °C (as measured in Loranger P/N 02901-032-6218A):
HOLD
CURRENT
(A)
TRIP
CURRENT
(A)
RESISTANCE
(Ω)
R MIN
R MAX
0.05
0.12
18.5
31.0
*Post Trip Resistance measured after one hour.
Agency Recognitions:
Reference Documents:
Precedence:
Effectivity:
Warning:
TIME TO TRIP(SEC)
@ 0.25 A
MAX
10.0
POST-TRIP
RESISTANCE
(Ω)
MAX
65.0
UL (File #E74889), CSA (File #78165), TUV
Raychem PS300
This specification takes precedence over documents referenced herein
Reference documents shall be the issue in effect on the date of invitation for bid
Refer to Page 2 of this document for application limitations
Materials Information
ROHS Compliant
TRIPPED-STATE
POWER DISSIPATION
@ 265 V (W)
NOM
MAX
0.9
1.1
ELV Compliant
Pb-Free
© 2007, 2011 Tyco Electronics Corporation, a TE Connectivity Ltd. Company. All rights reserved.
PolySwitch®
PTC Devices
308 Constitution Drive
Menlo Park, CA 94025-1164
Phone: 800-227-4856
www.circuitprotection.com
Overcurrent Protection Device
PRODUCT: LVR005NS
DOCUMENT: SCD27240
REV LETTER: F
REV DATE: MAY 11, 2011
PAGE NO.: 2 OF 2
Warning: Application Limitations for the LVR Product Line
1. Users should independently evaluate the suitability of and test each product selected for their
own application.
2. This product should not be used in an application where the maximum interrupt voltage or
maximum interrupt current can be exceeded in a fault condition. Operation beyond the
maximum ratings or improper use may result in device damage and possible electrical arcing
and flame.
3. A PTC device is not a fuse - it is a nonlinear thermistor that limits current. Because under a
fault condition all PTC devices go into a high resistance state but not open circuit, hazardous
voltage may be present at PTC locations.
4. The devices are intended for protection against occasional overcurrent or overtemperature
fault conditions and should not be used when repeated fault conditions or prolonged trip events
are anticipated.
5. In most applications, power must be removed and the fault condition cleared in order to reset a
PTC device. However, under certain unusual conditions, a PTC device may automatically
reset (see Raychem Circuit Protection Databook). Accordingly, PTC devices should not be
used in an application where an automatic reset could create a safety hazard, such as garbage
disposals and blenders.
6. It is the responsibility of the user to determine the need for back up or fail safe protection to
prevent damage that may occur in the event of abnormal function or failure of the PTC device.
7. Operation in circuits with a large inductance can generate a circuit voltage (Ldi/dt) above the
rated voltage of a PTC device.
8. Devices are not recommended for reflow soldering.
9. Device performance can be impacted negatively if devices are handled in a manner
inconsistent with recommended electronic, thermal, or mechanical procedures for electronic
components.
10. PTC devices are not recommended to be installed in applications where the device is
constrained such that its PTC properties are inhibited, for example in rigid potting materials or
in rigid housings which lack adequate clearance to accommodate device expansion.
11. Contamination of the PTC material with certain silicone-based oils or some aggressive
solvents can adversely impact the performance of the devices.
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