Memory Test. Toshiba SATELLITE A60, a65

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3.6 Memory Test 3 Diagnostic Programs

3.6 Memory Test

This test module is to check whether the memory chip works normally.

Subtest 01 BIOS ROM

This test item is to check the validity of BIOS ROM that includes two sub- items --

ROM Read and ROM Write Protection. ROM Read is to check whether BIOS

ROM could be correctly read out, ROM Write Protect is to check whether BIOS

ROM is write-protected.

Subtest 02 Patterns

This test item is to check whether the system memory includes base memory and extended memory that could be accessed correctly through writing and reading with a series of designed pattern data. Below is the parameter setting dialog window.

Test Option: Choose the Memory part to take the test– Base Memory or

Extended Memory.

Extended Memory Test Range: Specify the test coverage range of

Extended Momory. If user chooses Total Size, it means that the whole

Extended Momory will be tested. Although user can input the parameter into other select box, but the selected result is invalid. If user chooses

Special Size, the test of Extended Momory will be taken according to the coverage range that user chooses or time.

Extended Memory Start Address (MB) & Extended Memory End

Address (MB): Set the range of extended memory that is to be tested, the

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3 Diagnostic Programs 3.6 Memory Test

test coverage would be based on the setting and the value in ‘Percent (%) mentioned at below.

Pattern Size: Choose the pattern size – BYTE, WORD, DWORD or ALL.

Percent (%): Choose the percentage of the defined range of the memory to be tested.

Time Limit(h): Choose or Input the time (hour) of the defined range of the memory to be tested.

Time Limit(m): Choose or Input the time (minute) of the defined range of the memory to be tested.

1. Bit Stuck High Test

Data pattern: Every bit is ‘1’ (Each bit is high)

2. Bit Stuck Low Test

Data pattern: Every bit is ‘0'(Each bit is low);

3. Checker Board Test

Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010

(0xA);

4. CAS Line Test

Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and

1111(0xF);

5. Incremental Test

Data pattern: A series of increasing data from 0 by adding 1 each time;

6. Decrement Test

Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by subtracting 1 each time;

7. Incremental / Decrement Test

Data Pattern is a series of data whose low byte is increasing data from 0x00 and high byte is decreasing data from 0xFF.

Subtest 03 Extended Pattern

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3.6 Memory Test 3 Diagnostic Programs

In addition to the above pattern test of the memory, there is Read/Write Cycle test and Read Cycle Test for the extended memory.

Below is the parameter dialog window of the extended pattern test.

Test Range: Specify the test coverage range of Extended Momory. If user chooses Total Size, it means that the whole Extended Momory will be tested. Although user can input the parameter into other select box, but the selected result is invalid. If user chooses Special Size, the test of Extended Momory will be taken according to the coverage range that user chooses or time.

Extended Memory Start Address and Extended Memory End

Address (MB): Set the range of extended memory that is to be tested.

The test coverage will be according to the value setting in ‘Percent

(%)’ mentioned at below.

Percent (%): Choose the percentage of the defined range of the memory to be tested.

Time Limit(h): Choose or Input the time (hour) of the defined range of the memory to be tested;

Time Limit(m): Choose or Input the time (minute) of the defined range of the memory to be tested.

1. Write/Read Cycle Test

Test by using both read and write instructions.

2. Read Cycle Test

Test by using read instructions.

Subtest 04 Walking 1’s Test

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3 Diagnostic Programs 3.6 Memory Test

The test item is to ensure that there is no short circuitry issue in memory chip. The parameter dialog window is the same as that in ‘Subtest 02 Pattern’.

Subtest 05 Walking 0’s Test

The test item is to ensure that there is no open circuitry issue in memory chip. The parameter dialog window is the same as that in ‘Subtest 02 Pattern’.

Subtest 06 Memory Address

This test item is to check short and open issue on memory address lines.

Subtest 07 Refresh Test

This test item is to check whether the memory refresh works normally. The parameter dialog window is as follows:

Subtest 08 Cache Memory

The test item is to check whether the CPU internal cache memory could be accessed correctly.

Subtest 09 Random Memory

Random Memory test includes the following two test items: Ra ndomize Test and

Random Incremental Read/Write Test. The parameter dialog window is the same as that in ‘Subtest 03 Extended Pattern’.

1. Randomize Test

This test item is to check whether the memory could be correctly accessed with randomized data and randomized memory address.

2. Random Increment Read/Write

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3.6 Memory Test 3 Diagnostic Programs

This test item is to check whether the memory could be correctly accessed with randomized memory address and a series of incremental data.

Subtest 10 Data Bus Test

This test item is to check whether the data bus works normally.

Subtest 11 Memory Speed Test

This test item is to check the data-transferring rate for the cache memory and the system memory.

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