Figure 5-44 MULTI FREQ – Run. Wayne Kerr 3260B

Advanced Operation 5–41 values will be displayed. If either Abs or % was selected in MULTI FREQ – Set mode, the analyzer will report PASS, FAIL, HI or LO according to the table below. Figure 5-44 shows the results of running the multi-frequency test set up in section 5.14.1.1.

PASS

Major and minor terms are within the limits set.

FAIL

Major and minor terms are outside of the limits set.

HI (X), e.g. HI D, HI C

The parameter indicated is above the upper limit.

LO (X), e.g. LO L, LO Q The parameter indicated is below the lower limit.

Figure 5-44 MULTI FREQ – Run

When the bin handler option is fitted, the bin handler Pass/Fail output corresponds to the

, , and results. The Pass/Fail output goes low only when a measurement has passed all set limits, see section 4.1.11.5 for the bin handler interface pin assignment.

5.15 GRAPH MODE

GRAPH MODE allows both major and minor term component or circuit characteristics to be viewed in graphical form (linear or logarithmic) across a user-defined frequency range. Only one term can be viewed at a time but it is possible to rapidly toggle between the major and minor term views. The major term graph may be in absolute units, or as a percentage from a nominal value. The vertical axes for both the major and minor term may be pre-defined by the user. After plotting the graph, the FIT function may be used to autoscale either vertical axis for the best available resolution. Other functions within GRAPH MODE can be used to find resonance and to identify the highest peak and lowest trough across the frequency range. A marker is displayed with the graph and can move along the graph outline and give x and y coordinate readouts. Results can be printed to an Epson-compatible printer if required, after entering Code 30 from the MAIN MENU.

When first entering GRAPH MODE from the MAIN MENU, the GRAPH MODE – Set screen is displayed (Figure 5-45) which defines the parameters necessary to plot the graph.