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1 GENERAL OVERVIEW
1.1 Description
The Analyzer is designed for use in the process of development, adjustment and testing of various electronic devices in industrial and laboratory facilities, including operation as a component of an automated measurement system. The
Analyzer is designed for operation with an external PC, which is not supplied with the Analyzer.
1.2 Specifications
The specifications of each Analyzer model can be found in its corresponding datasheet.
1.3 Measurement Capabilities
Measured parameters S
11,
S
21,
S
12,
S
22
Number of measurement channels
Absolute power of the reference and received signals at the port.
Up to 16 logical channels. Each logical channel is represented on the screen as an individual channel window. A logical channel is defined by such stimulus signal settings as frequency range, number of test points, power level, etc.
Data traces
Memory traces
Up to 16 data traces can be displayed in each channel window. A data trace represents one of the following parameters of the DUT: Sparameters, response in the time domain, or input power response.
Each of the 16 data traces can be saved into memory for further comparison with the current values.
Data display formats Logarithmic magnitude, linear magnitude, phase, expanded phase, group delay, SWR, real part, imaginary part, Smith chart format and polar format.
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1 GENERAL OVERVIEW
Sweep setup features
Sweep type Linear frequency sweep, logarithmic frequency sweep, and segment frequency sweep, when the stimulus power is a fixed value; and linear power sweep when frequency is a fixed value.
Measured points per sweep
From 2 to the instrument maximum.
Segment sweep
Power settings
Sweep trigger
A frequency sweep within several user-defined segments. Frequency range, number of sweep points, source power, and IF bandwidth can be set for each segment.
Source power from instrument minimum to instrument maximum with resolution of 0.05 dB.
In frequency sweep mode the power slope can be set to up to 2 dB/GHz to compensate high frequency attenuation in cables.
Trigger modes: continuous, single, hold. Trigger sources: internal, manual, external, bus.
Trace display functions
Trace display Data trace, memory trace, or simultaneous data and memory traces.
Trace math Data trace modification by math operations: addition, subtraction, multiplication or division of measured complex values and memory data.
Autoscaling
Electrical delay
Phase offset
Automatic selection of scale division and reference level value to have the trace most effectively displayed.
Calibration plane compensation for delay in the test setup, or for electrical delay in a DUT during measurements of deviation from linear phase.
Phase offset in degrees.
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1 GENERAL OVERVIEW
Accuracy enhancement
Calibration Calibration of a test setup (which includes the
Analyzer, cables, and adapters) significantly increases the accuracy of measurements.
Calibration allows for correction of errors caused by imperfections in the measurement system: system directivity, source and load match, tracking, and isolation.
Calibration methods The following calibration methods of various sophistication and accuracy enhancement are available:
reflection and transmission normalization;
full one-port calibration;
one-path two-port calibration
full two-port calibration;
TRL calibration (except Planar 304/1).
Reflection and transmission normalization
The simplest calibration method. It provides limited accuracy.
Full one-port calibration
One-path two-port calibration
Method of calibration performed for one-port reflection measurements. It ensures high accuracy.
Method of calibration performed for reflection and one-way transmission measurements, for example for measuring S
11
and S
21
only. It ensures high accuracy for reflection measurements, and reasonable measurements. accuracy for transmission
Full two-port calibration
Method of calibration performed for full
S-parameter matrix measurement of a two-port
DUT. It ensures high accuracy.
TRL calibration
(except Planar 304/1)
Method of calibration performed for full
S-parameter matrix measurement of a two-port
DUT. LRL and LRM types of this calibration are also supported. In ensures higher accuracy than a two-port calibration.
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1 GENERAL OVERVIEW
Mechanical calibration kits
The user can select one of the predefined calibration kits of various manufacturers or define additional calibration kits.
Electronic calibration modules
Copper Mountain Technologies’ automatic calibration modules make the Analyzer calibration faster and easier than traditional mechanical calibration.
Sliding load calibration standard
The use of sliding load calibration standard allows significant increase in calibration accuracy at high frequencies compared to a fixed load calibration standard.
Unknown thru calibration standard
(except Planar 304/1)
The use of an arbitrary reciprocal two-port device instead of a zero-length thru during a full twoport calibration allows for calibration of the test setup for measurements of non-insertable devices.
Defining of calibration standards
Different methods of calibration standard definition are available:
standard definition by polynomial model
standard definition by data (S-parameters).
Error correction interpolation
When the user changes such settings as start/stop frequencies and number of sweep points, compared to the settings of calibration, interpolation or extrapolation of the calibration coefficients will be applied.
Supplemental calibration methods
Power calibration Method of calibration which allows for maintaining more stable power levels at the DUT input. An external power meter should be connected to the USB port directly or via
USB/GPIB adapter.
Receiver calibration Method of calibration which calibrates the receiver gain at absolute signal power measurement.
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1 GENERAL OVERVIEW
Marker functions
Data markers
Reference marker
Marker search
Up to 16 markers for each trace. A marker indicates the stimulus value and measurement result at a given point of the trace.
Enables indication of any maker value as relative to the reference marker.
Search for max, min, peak, or target values on a trace.
Marker search additional features
User-definable search range. Available as either a tracking marker, or as a one-time search.
Setting parameters by markers
Setting of start, stop and center frequencies from the marker frequency, and setting of reference level by the measurement result of the marker.
Marker math functions Statistics, bandwidth, flatness, RF filter.
Statistics Calculation and display of mean, standard deviation and peak-to-peak in a frequency range limited by two markers on a trace.
Bandwidth
Flatness
Determines bandwidth between cutoff frequency points for an active marker or absolute maximum.
The bandwidth value, center frequency, lower frequency, higher frequency, Q value, and insertion loss are displayed.
Displays gain, slope, and flatness between two markers on a trace.
RF filter Displays insertion loss and peak-to-peak ripple of the passband, and the maximum signal magnitude in the stopband. The passband and stopband are defined by two pairs of markers.
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1 GENERAL OVERVIEW
Data analysis
Port impedance conversion
De-embedding
Embedding
S-parameter conversion
The function converts S-parameters measured at the analyzer’s nominal port impedance into values which would be found if measured at a test port with arbitrary impedance.
The function allows mathematical exclusion of the effects of the fixture circuit connected between the calibration plane and the DUT. This circuit should be described by an S-parameter matrix in a
Touchstone file.
The function allows mathematical simulation of the DUT parameters after virtual integration of a fixture circuit between the calibration plane and the DUT. This circuit should be described by an Sparameter matrix in a Touchstone file.
The function allows conversion of the measured Sparameters to the following parameters: reflection impedance and admittance, transmission impedance and admittance, and inverse Sparameters.
Time domain transformation
The function performs data transformation from frequency domain into response of the DUT to various stimulus types in time domain. Modeled stimulus types: bandpass, lowpass impulse, and lowpass step. Time domain span is set by the user arbitrarily from zero to maximum, which is determined by the frequency step. Various window shapes allow optimizing the tradeoff between resolution and level of spurious sidelobes.
Time domain gating The function mathematically removes unwanted responses in time domain, allowing for obtaining frequency response without the influence of the fixture elements. The function applies a reverse transformation back to the frequency domain from the user-defined span in the time domain. Gating filter types: bandpass or notch. For better tradeoff between gate resolution and level of spurious sidelobes the following filter shapes are available: maximum, wide, normal and minimum.
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1 GENERAL OVERVIEW
Mixer / converter measurements
Scalar mixer / converter measurements
The scalar method allows measurement of scalar transmission S-parameters of mixers and other devices having different input and output frequencies. No external mixers or other devices are required. The scalar method employs port frequency offset when there is a difference between receiver frequency and source frequency.
Vector mixer / converter measurements
The vector method allows measuring of the mixer transmission S-parameter magnitude and phase.
The method requires an external mixer and an LO common to both the external mixer and the mixer under test.
Scalar mixer / converter calibration
The most accurate method of calibration applied for measurements of mixers in frequency offset mode. The OPEN, SHORT, and LOAD calibration standards are used. An external power meter should be connected to the USB port directly or via USB/GPIB adapter.
Vector mixer
/converter calibration
Method of calibration applied for vector mixer measurements. The OPEN, SHORT and LOAD calibration standards are used.
Automatic adjustment of frequency offset
The function performs automatic frequency offset adjustment when scalar mixer / converter measurements are performed to compensate for
LO frequency inaccuracies internal to the DUT.
Other features
Familiar graphical user interface
Analyzer control
Printout/saving of traces
Graphical user interface based on the Windows operating system ensures fast and easy Analyzer operation by the user.
Using a personal computer.
The traces and data printout function has a preview feature. Previewing, saving and printing can be performed using MS Word, Image Viewer for Windows, or the Analyzer Print Wizard.
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1 GENERAL OVERVIEW
Remote control
COM/DCOM
SCPI
Remote control via COM/DCOM. COM automation runs the user program on an Analyzer PC. DCOM automation runs the user program on a LANnetworked PC. Automation of the instrument can be achieved in any COM/DCOM-compatible language or environment, including Python, C++,
C#, VB.NET, LabVIEW, MATLAB, Ocatve, VEE, Visual
Basic (Excel) and others.
Remote control using textual commands SCPI
(Standard Commands for Programmable
Instruments). The text messages are delivered over computer networks using HiSLIP or TCP/IP
Socket network protocols. The VISA library supports both protocols. The VISA library is a widely used software input-output interface in the field of testing and measurement for controlling devices from a personal computer. It is a library of functions for C/C ++, C #, Visual Basic, MATLAB,
LabVIEW and others.
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1 GENERAL OVERVIEW
1.4 Principle of Operation
The block diagram of the Analyzer is represented in Figure 1.
The Analyzer Unit consists of a source oscillator, local oscillator, source power attenuator, and a switch connecting the source signal to two directional couplers, which are connected to the Port 1 and Port 2 connectors. The incident and reflected waves from the directional couplers are passed into the mixers, where they are converted to first IF (10.7 MHz for Planar models; 0.4 MHz for S models;
7.6 MHz for Cobalt models) and are passed further to the 4-Channel receiver. The
4-Channel receiver, after filtering, digitally encodes the signal and supplies it for further processing (filtration, phase difference estimation, magnitude measurement) by the signal processor. The IF measurement filters are digital and have bandwidths of between the instrument minimum (1 Hz for Planar and Cobalt models; 10 Hz for S models) to instrument maximum (30 kHz for Planar and S models; 1MHz for Cobalt models). Either port of the Analyzer can be a source of the tested signal as well as a receiver of the signal transferred thought the DUT. If
Port 1 is a source, Port 2 will be a receiver. The definition “incident and reflected” wave is correct for the port when it is a source of the test signal. The combination of the assemblies of directional couplers, mixers and 4-Channel receiver forms four similar signal receivers.
An external PC controls the operation of the components of the Analyzer. To perform S-parameter measurements, the Analyzer supplies the source signal of the assigned frequency from one of the ports to the DUT, then measures magnitude and phase of the signals transmitted through and reflected by the DUT, and finally compares these results to the magnitude and phase of the source signal.
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1 GENERAL OVERVIEW
Planar 814/1 has adjustable ports configurations with direct access to the receivers. This adjustable port configuration with direct access to the receivers of the VNA provides for a variety of test applications requiring wider dynamic and power range. Direct receiver access enables testing of high power devices.
Additional amplifiers, attenuators, various filters and matching pads for each of the ports can be introduced in reference oscillator and receiver path to ensure the optimal operation mode of the receivers and the DUT, close to the real.
Figure 2 Adjustable port configuration with direct access to the receivers
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