STMicroelectronics STGAP1BS Datasheet
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STGAP1BS
Product label
STGAP1BS
Datasheet
Automotive galvanically isolated advanced single gate driver
Features
• AEC-Q100 qualified
• High voltage rail up to 1500 V
• Driver current capability: 5 A sink/source current at 25 °C
• dV/dt transient immunity ±50 V/ns in full temperature range
• Overall input/output propagation delay: 100 ns
• Separate sink and source for easy gate driving configuration
• Negative gate drive ability
• Active Miller clamp
• Desaturation detection
• SENSE input
• V
CE
active clamping
• Output 2-level turn-off
• Diagnostic status output
• UVLO and OVLO functions
• Programmable input deglitch filter
• Asynchronous stop command
• Programmable deadtime, with violation error
• SPI interface for parameters programming
• Temperature warning and shutdown protection
• Self-diagnostic routines for protection features
• Full effective fault protection
Applications
• 600/1200 V inverters
• Inverters for EV/HEV
• EV charging stations
• Industrial drives
• UPS equipment
• DC/DC converters
• Solar inverters
Description
The STGAP1BS is a galvanically isolated single gate driver for N-channel MOSFETs and IGBTs with advanced protection, configuration and diagnostic features. The architecture of the STGAP1BS isolates the channel from the control and the low voltage interface circuitry through true galvanic isolation.
The gate driver is characterized by 5 A capability, making the device also suitable for high power inverter applications such as motor drivers in hybrid and electric vehicles and in industrial drives. The output driver section provides a rail-to-rail output with the possibility to use a negative gate driver supply.
DS11974 - Rev 4 - October 2021
For further information contact your local STMicroelectronics sales office.
www.st.com
STGAP1BS
The input to output propagation delay remains below 100 ns, providing high PWM control accuracy.
Protection functions such as the Miller clamp, desaturation detection, dedicated sense pin for overcurrent detection, output 2-level turn-off, V
CE
overvoltage protection, UVLO and OVLO are included to easily design high reliability systems.
Open drain diagnostic outputs are included and detailed device conditions can be monitored through the SPI.
Each function parameter can be programmed via the SPI, making the device very flexible and allowing it to fit in a wide range of applications.
Separate sink and source outputs provide high flexibility and bill of material reduction for external components.
DS11974 - Rev 4 page 2/59
1
Block diagram
Figure 1. Block diagram
STGAP1BS
Block diagram
DS11974 - Rev 4 page 3/59
2
STGAP1BS
Pin connection
Pin connection
Figure 2. Pin connection (top view)
GND
SDO
SDI
CS
CK
VREG
VDD
IN-/DIAG2
IN+
DIAG1
SD
GND
5
6
7
8
1
2
3
4
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
ASC
VL
CLAMP
GOFF
GON
VCECLAMP
DESAT
VH
SENSE
VREGISO
VL
GNDISO
Table 1. Pin description
22
14, 23
13
16
24
19
18
15
17
20
21
5
3
2
10
1, 12
4
7
6
11
9
8
Pin no.
Pin name Type Function
VCECLAMP
DESAT
VREGISO
VH
GON
GOFF
CLAMP
VL
GNDISO
SENSE
ASC
VDD
VREG
SD
Power supply
Power supply
Logic input
Power supply for low voltage section and internal 3.3 V regulator
Internal 3.3 V regulator output and supply pin
Shutdown input (active low)
IN+ Logic input Gate command input
IN-/DIAG2 Logic input/open drain output Gate command input /open drain diagnostic output
DIAG1
GND
CS
CK
SDI
SDO
Open drain output
Ground
Logic input
Logic input
Logic input
Logic output
Open drain diagnostic output
Low voltage section ground
SPI chip select (active low)
SPI clock
SPI serial data input
Analog input
Analog input/output
Power supply
Power supply
Analog output
Analog output
Analog output
Power supply
Ground
Analog input
Analog input
SPI serial data output
V
CE
active clamping protection
Desaturation protection
Internal regulator output pin for decoupling
Positive power supply for high voltage section
Gate source output
Gate sink output
Miller clamp
Negative power supply or ground for high voltage section
High voltage section (isolated) ground
Sense input for overcurrent protection
Asynchronous stop command
DS11974 - Rev 4 page 4/59
STGAP1BS
Electrical data
3
Electrical data
3.1
3.2
Absolute maximum ratings
Table 2. Absolute maximum ratings
Symbol Parameter Test condition Min.
dV
ISO
/dt Common mode transient immunity
VDD Low voltage section power supply voltage vs. GND -
V
CM
= 1500 V
VREG
Low voltage section internal regulator voltage vs.
GND
-
-
-0.30
-0.30
VREGISO
High voltage section internal regulator voltage vs.
GNDISO
V
LOGIC
Logic pins voltage vs. GND
VHL
VH
VL
Differential supply voltage (VH vs. VL)
Positive supply voltage (VH vs. GNDISO)
V
OUT
Negative supply voltage (VL vs. GNDISO)
Voltage on gate driver outputs (GON, GOFF, CLAMP vs. VL)
-
-
-
-
-
-
V
DESAT
V
SENSE
Voltage on DESAT pin vs. GNDISO
Voltage on SENSE pin vs. GNDISO
V
CECLAMP
Voltage on VCECLAMP pin vs. VL
V
ASC
I
DIAGx
Voltage on ASC pin vs. GNDISO
Open drain DC output current
V
DIAGx
T
J
T
S
T
A
P
Din
Open drain output voltage
Junction temperature
Storage temperature
Ambient temperature
Power dissipation input chip
-
-
-
-
-
-
-
-
-
V
DIAGx
< 0.8 V
-0.30
-0.30
-0.30
-0.30
-15
VL - 0.30
-0.30
-2
VL - 0.30
-0.30
-
-
-0.30
-40
-50
-40
P
Dout dH/dt
ESD
Power dissipation output chip
Magnetic field immunity
Human body model
-
-
-
-
-
Max.
50
6.50
3.60
3.60
VDD + 0.30
40
40
0.30
VH + 0.30
VH + 0.30
(VH + 0.30, 20)
VH + 0.30
VH + 0.30
20
6.50
150
150 min
125
65
(T
J,max
- T
A
P
Din
)/R th(JA)
-
100
2
V
V
V
W
A/(m·s) kV
V
V
V
V
Unit
V/ns
V
V
°C
°C
°C mW
V
V
V
V mA
Thermal data
Table 3. Thermal data
Symbol
R th(JA)
Parameter
Thermal resistance junction to ambient (1)
1. The STGAP1BS mounted on the EVALSTGAP1BS rev 2.0 board (two-layer FR4 PCB).
Value
65
Unit
°C/W
DS11974 - Rev 4 page 5/59
3.3
STGAP1BS
Recommended operating conditions
Recommended operating conditions
Table 4. Recommended operating conditions
Symbol
VH
VL
VHL
VREG
V
VDD
LOGIC
Pin
17
Parameter
Positive supply voltage (VH vs. GNDISO)
14, 23 Negative supply voltage (VL vs. GNDISO)
-
7
6
Differential supply voltage (VH vs. VL)
Low voltage section power supply voltage vs.
GND
Low voltage section internal regulator voltage vs. GND
2, 3, 4, 5, 8, 9,
11
Logic pins voltage vs. GND
ASC
V
DESATth f
SW
24
18
-
ASC pin voltage
Desaturation protection threshold
Maximum switching frequency (4)
1. When UVLO is enabled, this value is VH on,max
2. When UVLO is enabled, this value is VL on,min
3. When VDD is connected to the VREG pin (refer to
4. Actual limit depends on power dissipation constraints.
Test condition
-
-
-
Min.
Max.
36
36
Unit
V
V
V
-
-
-
DESAT enabled
-
4.50
GNDISO
-
-
-
3.3 ±5%
5.50
(VDD, 5) min
(VH, 15) min
VH - 1.50
150
V
V
V
V
V kHz
DS11974 - Rev 4 page 6/59
STGAP1BS
Electrical characteristics
4
Electrical characteristics
4.1
AC operation
Table 5. AC operation electrical characteristics
(T j
= -40 to 125 °C, VDD = 5 V; VH = 15 V, VL = GNDISO)
Symbol Pin Parameter Test condition t deglitch t
INmin
8, 9, 11
Input deglitch time
INfilter = '11'
INfilter = '01'
INfilter = '10'
INfilter = '00' and (2LTO_EN = '1' or
2LTOtime = 0x0) t
Don t
Doff
8, 9, 11, 20
8, 9, 11, 21
Minimum propagated input pulse
Input to output propagation delay ON
Input to output propagation delay OFF
Deglitch filter and 2LTO disabled
Deglitch filter and 2LTO disabled t r t f
PWD 8, 9, 11, 20, 21
Pulse width distortion |t
Don
t
Doff
|
DT
20
21
GON rise time
GOFF rise time
8, 9, 20, 21 Deadtime
VL = 0 V;
C
L
= 2 nF, 10% ÷ 90%
VL = 0V
C
L
= 2 nF, 90% ÷ 10% t
IN
> 100 ns
Deglitch filter and 2LTO disabled
DTset = '01'
DTset = '10'
DTset = '11' t release
11 Minimum flag release time SD = '0', SD_FLAG = '1'
4.2
DC operation
Table 6. DC operation electrical characteristics
(T j
= -40 to 125 °C, VDD = 5 V; VH = 15 V, VL = GNDISO)
Symbol Pin Parameter Test condition
V ol
V oh
I
INh
I
INl
I
SDh
I
SDl
R in_pd
R in_pu
2
8, 9
11
SDO logic “0” output voltage
SDO logic “1” output voltage
INx logic “1” input bias current
INx logic “0” input bias current
SD logic “1” input bias current
SD logic “0” input bias current
8, 9, 11 Input pull-down resistors
4 CS input pull-up resistor
Logic inputs/output
I = 4 mA
I = 4 mA
V
IN
= 5 V
(pin 8 used as IN-)
V
IN
= 0 V
(pin 8 used as IN-)
V
SD
= 5 V
V
SD
= 0 V
V
IN
= 5 V
(pin 8 used as IN-)
CS = GND
Min.
-
4.85
55
-
55
-
35
35
Typ.
85
-
85
-
60
55
-
-
Min. Typ. Max. Unit
50 70 90 ns
100 160 220 ns
420 500 580 ns
20 ns
90 100 130 ns
90 100 130 ns
25 ns
25 ns
4 10 ns
205 250 295
650 800 945
985 1200 1415
ns
105 μs
Max.
Unit
0.15
-
145
0.10
145
0.10
85
80
μA
μA
μA
μA kΩ kΩ
V
V
DS11974 - Rev 4 page 7/59
I
REG
VDD on
VDD off
VDD hys
OV
VDDon
OV
VDDoff
OV
VDDhys
Symbol
V
V
I
I
I
V il
V ih
GON
GOFF
GOFFL
GONH
SafeClp
QDD
VH
VH
VH
VL
VL on off hyst on off
Pin
3, 4, 5, 8,
9, 11
20
21
21
20
Parameter
Low logic level voltage
High logic level voltage
20, 21, 22 GOFF active clamp
6
7
7
17
14, 23
Source short-circuit current
Sink short-circuit current
GOFF output low level voltage
GON output high level voltage
VREG short-circuit current
)
VDD UVLO turn-on threshold
VDD UVLO turn-off threshold
VDD UVLO hysteresis
VDD OVLO turn-on threshold
VDD OVLO turn-off threshold
VDD OVLO hysteresis
VDD quiescent supply current
VH UVLO turn-on threshold
VH UVLO turn-off threshold
VH UVLO hysteresis
VL UVLO turn-on threshold
VL UVLO turn-off threshold
-
-
-
-
VDD = 5 V;
SD = 5 V; INx = GND; f = 0 Hz
VDD = 5 V;
SD = 5 V; f
SW
= f
SW,max
VHONth = '01'
VHONth = '10'
VHONth = '11'
VHONth = '01'
VHONth = '10'
VHONth = '11'
-
VLONth = '01'
VLONth = '10'
VLONth = '11'
VLONth = '01'
VLONth = '10'
Test condition
-
-
Driver buffer section
T pulse
< 5 µs, DC = 1%
T j
= 25 °C
T j
= -40 - +125 °C
T pulse
< 5 µs, DC = 1%
T j
= 25 °C
T j
= -40 - +125 °C
I
GOFF
= 0.1 A
I
GOFF
= 1 A
I
GON
= 0.1 A
I
GON
= 1 A
I
GOFF
= 0.2 A;
VH floating;
GON = GOFF = CLAMP
Supply voltage
0.1 V < VREG < 3.0 V
VREG < 0.1 V
-
-
STGAP1BS
DC operation
Min.
Typ.
Max.
Unit
0.29 · VDD 0.33 · VDD 0.37 · VDD V
0.62 · VDD 0.66 · VDD 0.79 · VDD V
5 A
7
5
VL + 0.03
VL + 0.50
VH - 0.18
VH - 2.10
VL + 0.09
VL + 1
VH - 0.10
VH - 1.30
6
VL + 0.15
VL + 1.80
VH - 0.05
VH - 0.50
A
V
V
3 V
-
-
3.95
3.65
0.15
5.30
5.40
100
5.20
60
15
4.10
3.80
-
5.50
5.70
200
6.50
120
35
4.30
4
-
5.90
6.10
300
7.50
mA
V
V
V
V
V mV mA
6.00
0.70
-3.15
-5.25
-7.35
-2.15
-4.25
9.40
11.30
13.15
8.45
10.35
12.25
8.50
-5
-7
1
-3
-2
-4
10
12
14
9
11
13
9.50
1.30
-2.80
-4.70
-6.55
-1.90
-3.80
10.50
12.60
14.70
9.45
11.55
13.65
mA
V
V
V
V
V
DS11974 - Rev 4 page 8/59
STGAP1BS
DC operation
Symbol
VL off
VL hys
OV
VHoff
OV
VHon
OV
VHhys
OV
VLoff
OV
VLon
OV
VLhyst
I
QH
V t
I t
I
I
QL
DESATth
DESfilter
DESAT
DESoff t
BLK
DESAT
V
SENSEth
Pin
14, 23
17
14, 23
17
14, 23
18
18
16
Parameter
VL UVLO turn-off threshold
VL UVLO hysteresis
VH OVLO turn-off threshold
VH OVLO turn-on threshold
VH OVLO hysteresis
Test condition
-
VLONth = '11'
OVLO_EN = '1'
OVLO_EN = '1'
OVLO_EN = '1'
VL OVLO turn-off threshold
VL OVLO turn-on threshold
OVLO_EN = '1'
OVLO_EN = '1'
VL OVLO hysteresis
VH quiescent supply current
VL quiescent supply current
OVLO_EN = '1'
SD = 5 V;
IN+ = 5 V; IN- = GND
VL = -5 V;
SD = 5 V;
IN+ = IN- = GND
Desaturation protection
DESATth = '000';
DESATth = '001'
DESATth = '010'
DESATth = '011'
Desaturation threshold
SENSE protection threshold
DESATth = '100'
DESATth = '101'
DESATth = '110'
DESATth = '111'
DESAT pin deglitch filter
DESAT blanking charge current
DESATth = '100'
DESATcur = '00';
V
DESAT
= 0 V
DESATcur = '01';
V
DESAT
= 0 V
DESATcur = '10';
V
DESAT
= 0 V
DESATcur = '11';
V
DESAT
= 0 V
DESAT blanking discharge current
DESAT protection fixed blanking time
V
DESAT
= 8 V
-
DESAT protection intervention time
V
DESAT
= V
DESAth
to GOFF 90%
C
LOAD
= 10 nF
2LTO disabled
SENSE overcurrent function
SENSEth = '000'
SENSEth = '001'
SENSEth = '010'
SENSEth = '011'
6.50
7.40
8.30
9.30
10
2.60
3.60
4.60
5.50
Min.
-6.35
0.70
17.80
16.90
0.60
-10.50
-9.45
0.70
5
300
Typ.
-6
1
19
18
1
-10
-9
1
6.70
420
Max.
-5.70
1.20
20
18.90
1.30
-9.40
-8.55
1.30
7.50
Unit
V
V
V
V
V
V
V
V mA
550 µA
220
440
660
885
50
160
80
88
110
135
158
3.10
4.20
5.30
6.30
7.40
8.40
9.40
10.50
30
265
V ns
525
800
μA
1050
90
340 mA ns
220 ns
9
10
7
8
20
3
4
5
6
250
500
750
1000
70
250
150
100
125
150
175
112
140
165
192 mV
DS11974 - Rev 4 page 9/59
STGAP1BS
DC operation
V
SENSEth t
Symbol t
V
SENSE
2LTOth
2LTOtime
Pin
16
21
21
Parameter
SENSE protection threshold
SENSE protection intervention time
2LTO threshold
2LTO time
Test condition
SENSEth = '100'
SENSEth = '101'
SENSEth = '110'
SENSEth = '111'
SENSEth = '111'
0→1 V step on V
SENSE
to GOFF
90%;
C
LOAD
= 10 nF
2LTO disabled
2-level turn-off function
2LTOth = '0000'
2LTOth = '0001'
2LTOth = '0010'
2LTOth = '0011'
2LTOth = '0100'
2LTOth = '0101'
2LTOth = '0110'
2LTOth = '0111'
2LTOth = '1000'
2LTOth = '1001'
2LTOth = '1010'
2LTOth = '1011'
2LTOth = '1100'
2LTOth = '1101'
2LTOth = '1110'
2LTOth = '1111'
2LTOtime = '0001'
2LTOtime = '0010'
2LTOtime = '0011'
2LTOtime = '0100'
2LTOtime = '0101'
2LTOtime = '0110'
2LTOtime = '0111'
2LTOtime = '1000'
2LTOtime = '1001'
2LTOtime = '1010'
2LTOtime = '1011'
2LTOtime = '1100'
2LTOtime = '1101'
2LTOtime = '1110'
2LTOtime = '1111'
Min.
185
235
285
380
-
Typ.
200
250
300
400
95
Max.
215
268
315
420
120
Unit mV ns
0.75
1.00
1.50
2.00
2.50
12.50
13.00
13.50
14.00
14.50
7.00
7.50
8.00
8.50
9.00
9.50
10.00
10.50
11.00
11.50
12.00
4.50
4.75
5.00
5.25
5.50
3.00
3.50
3.75
4.00
4.25
0.64
0.89
1.36
1.83
2.30
11.87
12.35
12.82
13.30
13.77
6.65
7.12
7.60
8.07
8.55
9.02
9.50
9.97
10.45
10.92
11.40
4.18
4.42
4.66
4.90
5.12
2.77
3.25
3.47
3.71
3.94
0.89
1.15
1.65
2.18
2.70
13.13
13.65
14.18
14.70
15.23
7.35
7.88
8.40
8.93
9.45
9.98
10.50
11.03
11.55
12.08
12.60
4.82
5.08
5.34
5.63
5.95
3.23
3.75
4.03
4.29
4.56
V
μs
DS11974 - Rev 4 page 10/59
V
VCECLth
V
VCECLhy st t
VCECLoff t
VCECL
V
ASCl
V
ASCh
I
ASCh
I
ASCl
R
ASC t
ASC t
Gchk
V
Gchk t
Rchk
I
GOFFchk
I
SENSERc hk t
SENSEchk t
DESATchk
Symbol
V t
R
I
I
I
DIAG1,2
DIAG1
DIAG2
DIAG1,2
CLAMPth
CLAMP
V
CLAMP_L
T
T
T
WN
SD hys
-
-
-
Pin
8, 10
22
19
19
24
20, 21
20
16
21
16
18
Parameter Test condition
Diagnostic outputs
Fault event to DIAGx Low delay Fault event to DIAGx 90%
DIAG1 low level sink current
DIAG2 low level sink current
DIAGx pull-down resistor
V
DIAG1
= 0.4 V
V
DIAG2
= 0.4 V
-
Clamp Miller function
CLAMP voltage threshold CLAMP vs. GNDISO
Clamp short-circuit current
T pulse
< 5 µs, DC = 1%
T j
= 25 °C
T j
= -40 ÷ +125 °C
Clamp low level output voltage I
CLAMP
= 1 A
VCE active clamping protection
V
CE
clamping threshold -
V
CE
clamping threshold hysteresis
V
CE
clamping time-out
V
CE
clamping intervention time
-
-
-
ASC function
Low logic level voltage -
High logic level voltage
ASC logic “1” input bias current
ASC logic “0” input bias current
ASC pull-down resistors
ASC intervention time
-
V
ASC
= 5 V
V
ASC
= 0 V
V
ASC
= 5 V
V
ASC
= 5 V
Functionality checks
Gate path check time (GON/
Gate path check voltage (GON)
-
SENSE resistor check time
GOFF path check current -
-
-
SENSE resistor check current V
SENSE
< 1 V
SENSE comparator check time -
DESAT comparator check time -
Overtemperature protection
Warning temperature
-
-
STGAP1BS
DC operation
Min.
-
10
10
300
Typ.
5
18
18
550
Max.
-
30
30
800
Unit
1.70
2 2.30
V
VL + 0.50
5
VL + 1
A
6
VL + 1.80
V
μs mA mA kΩ
VL + 1.20
VL + 1.60
0.30
2
-
0.50
2.30
20
VL + 2
0.60
2.60
-
V
V
μs ns
0.80
1.80
55
-
35
100
1.10
2.20
100
-
50
-
1.40
2.40
145
0.10
70
250
V
V
μA
μA kΩ ns
30 μs
0.7 x VH 0.76 x VH 0.84 x VH V
15 μs
-420 -350 -280 μA
8 10 12 μA
-
-
-
15
15
μs
μs
125
155
-
-
-
20
-
-
-
°C
°C
°C
DS11974 - Rev 4 page 11/59
STGAP1BS
DC operation
I
Symbol
STBY_VD t t rCK
t fCK t hCK
t lCK t
D t sleep t awake
CKmax t setCS t holCS desCS
Pin
7
-
-
5
4
Parameter
VDD standby current
Test condition
Standby
VDD = 5 V
Standby time
SD = '0', measured from CS rise
SD = '1'
SPI (characterization data, not tested in production)
Maximum SPI clock frequency -
SPI clock rise and fall time
SPI clock high and low time
CS setup time
CS hold time
CL = 30 pF
-
-
-
Local register read
Remote register read
Start configuration
Stop configuration
Min.
0.40
500
5
5
-
75
350
10
800
30
22
5
Reset status register 50 t setSDI t holSDI t enSDO t disSDO t vSDO t holSDO t
SDLCSL t
CSHSDH
3
2
4, 11
4, 11
SDI setup time
SDI hold time
SDO enable time
SDO disable time
SDO valid time
SDO hold time
SD falling to CS falling
CS rising to SD rising
1. Guaranteed by correlation.
2. Characterization data, not tested in production.
3. The actual waiting time depends on the gate charge size.
4. See
.
Any other command
-
-
-
-
-
-
-
-
700
25
20
-
37
350
350
-
-
Typ.
0.80
700
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
Max.
Unit
1
900
mA ns
μs
-
57
-
-
-
-
38
47
25
-
-
-
-
-
-
-
-
-
-
-
MH z ns ns ns ns ns
μs ns ns ns ns ns ns ns ns ns
DS11974 - Rev 4 page 12/59
5
STGAP1BS
Isolation
Isolation
Table 7. Isolation and safety-related specifications
Parameter
Clearance
(minimum external air gap)
Creepage
(minimum external tracking)
Comparative tracking index (tracking resistance)
Isolation group
Symbol Value Unit
CLR
CPG
CTI
-
8
8
≥ 400
II mm mm
-
-
Measured from input terminals to output terminals, shortest distance through air
Measured from input terminals to output terminals, shortest distance path along body
Conditions
DIN IEC 112/VDE 0303 Part 1
Material group (DIN VDE 0110, 1/89, Table 1)
Table 8. IEC 60747-5-2 isolation characteristics
Parameter
Installation classification (EN 60664-1, Table 1
)
For rated mains voltage ≤ 150 V rms
For rated mains voltage ≤ 300 V rms
For rated mains voltage ≤ 600 V rms
Pollution degree (EN 60664-1)
Maximum working isolation voltage
Symbol
-
-
V
IORM
Test conditions
-
-
-
Input to output test voltage as per IEC 60747-5-2 V
PR
Method a, type test
V
PR
= V
IORM
× 1.6, t m
= 10 s
Partial discharge < 5 pC
Method b1, 100 % production test
V
PR
= V
IORM
× 1.875, t m
= 1 s
Partial discharge < 5 pC
Transient overvoltage as per IEC 60747-5-2 (highest allowable overvoltage)
V
IOTM t ini
= 60 s; type test
Maximum surge isolation voltage
Isolation resistance
V
IOSM
R
IO
Type test
V
IO
= 500 V at T
S
; type test
1. For three-phase systems the values in the table refer to the line-to-neutral voltage.
Characteristic Unit
I - IV
I - III
I - II
2
1500
2400
2815
4000
4000
>10 9
V
V
V
V
V
-
-
PEAK
PEAK
PEAK
PEAK
PEAK
Ω
Table 9. UL 1577 isolation voltage ratings
Description
Isolation withstand voltage, 1 min. (type test)
Isolation withstand test, 1 sec. (100% production)
Symbol
V
ISO
V
ISOtest
Characteristic
2500\3536
3000\4245
Unit
V rms
\V
PEAK
V rms
\V
PEAK
DS11974 - Rev 4 page 13/59
STGAP1BS
Logic supply management
6
Logic supply management
6.1
Low voltage section voltage regulator
The device integrates in the low voltage section a linear voltage regulator that can be used to obtain the 3.3 V logic core supply voltage from an external 5 V supply voltage. If an external 3.3 V supply voltage is available,
for details).
4.7 µF
Figure 3. Low voltage section 3.3 V voltage regulator
VDD from +5 V power supply VDD from +3.3 V power supply
+5V +3.3V
VDD
VDD
100 nF
LDO
Reg
LDO
Reg
VREG VREG
100 nF 4.7 µF 100 nF
Undervoltage protection is available on the VDD supply pin (disabled by default).
When the VDD voltage goes below the VDD off
threshold the device and its outputs goes in “safe state” (see
latched and the device remains in “safe state” until the UVLOD flag is not released. See
for indication on how the failure flags can be released.
This protection can be enabled writing the UVLOD_EN bit of the CFG1 register (disabled by default).
Overvoltage protection is available on the VDD supply pin.
When the VDD voltage goes over the OV
VDDoff
threshold, the device and its outputs go in “safe state” and the OVLOD status flag is set. The device remains in “safe state” and the OVLOD flag is latched, see
for indication on how the failure flags can be released.
DS11974 - Rev 4 page 14/59
6.2
6.3
6.4
STGAP1BS
High voltage section voltage regulator
High voltage section voltage regulator
The device integrates in the high voltage section a linear voltage regulator that generates the 3.3 V logic core supply voltage from an external supply voltage connected to the VH pin.
Figure 4. High voltage section 3.3 V voltage regulator
VH
VH
100 nF
LDO
Reg
VREGISO
4.7 µF 100 nF
If the voltage at the VREGISO pin goes below the minimum operating threshold which causes the logic reset, the
REGERRR bit in the STATUS2 register is set high.
•
•
•
•
Power-up, power-down and “safe state”
The following conditions define the device's “safe state”:
GOFF = ON state
GON = high impedance
CLAMP = ON state (if CLAMP < 'GNDISO + V
CLAMPth
')
DESAT = GNDISO (internal switch on and current generator off)
Such conditions are guaranteed at power-up of the isolated side (also for VH < VH on
and VL > VL on
) and during the whole device power-down phase (also for VH < VH off
and VL > VL off
), whatever the value of the input pins.
The device integrates a structure which clamps the driver output to a voltage smaller than SafeClp when the VH voltage is not high enough to actively turn the GOFF N-channel MOSFET on.
If the VH positive supply pin is floating the GOFF pin is clamped to a voltage smaller than SafeClp.
After power-up of the isolated side the REGERRR status flag is latched and the device is forced in “safe state”.
See
Section 7.11 for indication on how the failure flags can be released.
After power-up of the low voltage side the REGERRL and UVLOD status flags are latched and the device is
forced in “safe state”. See Section 7.11
for indication on how the failure flags can be released.
The UVLOH flag is also forced high at the power-up of the low voltage side, but its value is set to zero as soon as the isolated side power-up is completed.
Standby function
The device can be put in standby mode to reduce the power consumption on VDD via the SPI command “ Sleep ”
(refer to
The proper sequence is:
1.
Pull-down the SD pin: the driver section will be put in “safe state”
2.
Send a Sleep command
3.
After a t sleep
time, the device can be considered in sleep mode.
To exit from the sleep mode, it is necessary to set the SD high for at least t awake
while keeping IN+ low.
After a t awake
time the device can accept new commands and the REGERRR bit is set to indicate that the device needs to be reprogrammed.
If the SD pin is raised while t sleep
is still not expired, the device returns to the operation mode within a t awake
time.
DS11974 - Rev 4 page 15/59
STGAP1BS
Functional description
7
Functional description
7.1
7.2
Inputs and outputs
•
•
The device is controlled through following logic inputs:
• SD: active low shutdown input
•
IN+: driver input
CS: active low chip select (SPI)
SDI: serial data input (SPI)
• CK: serial clock (SPI)
And following logic outputs:
• SDO: serial logic output (SPI)
• DIAG1: diagnostic signal (open drain)
And following IO pin:
• IN-/DIAG2: driver input or diagnostic open drain output.
Logic input thresholds and output ranges vary according to VDD voltage. In particular, the device is designed to work with VDD supply voltages of 5 V or 3.3 V.
The operation of the driver IOs can be programmed through DIAG_EN bits as described in Table 10
.
Table 10. Inputs true table (device NOT in “safe state”)
Bit in CFG1 register
DIAG_EN
X
0
0
1
0
0
1
SD
0
1
1
1
1
1
1
Input pins
IN+
X
0
1
0
0
1
1
0
1
X
X
IN-
X
0
1
1. The IN-/DIAG2 pin is used as the open drain output for diagnostic signaling (refer to
OFF
ON
OFF
OFF
GON
Output pins
GOFF
OFF
OFF
ON
ON
ON
OFF
ON
ON
ON OFF
A deglitch filter is applied to device inputs (SD, IN+, IN-). Each input pulse, positive and negative, shorter than the programmed t deglitch
value is neglected by internal logic. Deglitch time can be programmed as listed in
When the deglitch filter is disabled (INfilter = '00') and the 2-level turn-off function is disabled (2LTOtime = 0x0) or enabled only after a fault event (2LTO_EN = '1'), a minimum input pulse t
INmin
is required to change the device output status. The minimum input pulse timing filters out both positive and negative pulses at the IN+, IN- and SD pins.
Deadtime and interlocking
When single gate drivers are used in half-bridge configuration, they usually do not allow preventing cross conduction in case of wrong input signals coming from the controller device. This limitation is due to the fact that each driver does not have the possibility to know the status of the input signal of the other companion driver in the same leg. Thanks to the availability of two input pins with opposite polarity the STGAP1BS allows implementing hardware interlocking that prevents cross conduction even in case of wrong input signals generated by the control unit. This functionality can be achieved by implementing the connection shown in
and by configuring the IN-/DIAG2 pin as input (which is its default configuration).
DS11974 - Rev 4 page 16/59
STGAP1BS
Deadtime and interlocking
Figure 5. HW cross conduction prevention in half-bridge configuration with two single gate drivers
IN+
IN-
STGAP1BS HS
μC
HIN
LIN
IN+
IN-
STGAP1BS LS
When such configuration is used, it is also possible to enable the STGAP1BS programmable deadtime feature, which guarantees that at least a DT time passes between the turn-off of one driver's output and the turn-on of the other driver. The deadtime value DT can be programmed through the SPI interface as shown in
If the deadtime feature is enabled, a counter is started when the input status changes from < IN- = '1' and IN+ =
'0' > to a different combination, which means that the other driver in the same leg is at the beginning of a turn-off
(refer to
).
Once the counter is started it keeps counting regardless of any input variation until a DT time has passed, and during this time the driver prevents the turn-on of its output even if the controller tries to force the turn-on (inputs set to < IN- = '0' and IN+ = '1' >).
Once the programmed DT counter is expired, the driver immediately turns the output on as soon as a turn-on command is present at the input pins, and no extra delay is added.
Figure 6. Transitions causing the DT generation
IN- = 1
IN+ = 0
paired
Driver ON
DS11974 - Rev 4
ALL OFF
IN- = 0
IN+ = 0
IN- = 0
IN+ = 1
this
Driver ON
IN- = 1
IN+ = 1
ALL OFF
Transitions causing the DT generation
Some examples of the device behavior when the deadtime feature is enabled are shown from
to
page 17/59
7.3
7.4
STGAP1BS
Hardware RESET
Figure 7. Synchronous control signal edges
IN-
SYNCHRONOUS
CONTROL SIGNALS EDGES;
DEAD TIME
IN+
GON-GOFF
DT
Figure 8. Control edges signal overlapped, example 1
IN-
CONTROL SIGNALS EDGES
OVERLAPPED;
DEAD TIME
IN+
GON-G OFF
DT DT
Figure 9. Control edges signal overlapped, example 2
CONTROL SIGNALS EDGES
NOT OVERLAPPED,
BUT INSIDE THE DEAD TIME:
DEAD TIME
IN-
IN+
GON-GOFF
DT
DT
DT
DT
Figure 10. Control edges signal not overlapped and outside DT (direct control)
CONTROL SIGNALS EDGES
NOT OVERLAPPED,
OUTSIDE THE DEAD TIME:
DIRECT DRIVING
IN-
IN+
GON-GOFF
DT DT
When the deadtime function is enabled, the STGAP1BS returns a “deadtime violation” fault when the control unit tries to turn on any of the drivers in one leg during the counting of the programmed DT time. If such event occurs the DT_ERR flag is set high and latched.
Hardware RESET
The device can be reset by forcing the VREG pin to ground through an external switch. The internal regulator is designed to stand this condition.
The maximum current required to force the VREG pin to ground is indicated by the parameter I
REG
.
Power supply UVLO and OVLO
Undervoltage protection is available on both VH and VL supply pins.
The turn-on threshold can be programmed through the SPI writing the CFG4 register. A fixed 1 V hysteresis will set the respective turn-off threshold.
Both UVLO protections can be independently disabled by setting the proper value in the CFG4 register.
DS11974 - Rev 4 page 18/59
7.5
7.6
STGAP1BS
Thermal warning and shutdown protection
When VH voltage goes below the VH off
threshold, the output buffer goes in “safe state” and the UVLOH status flag is forced high. If the UVLOlatch bit in the CFG4 register is set low (default), the UVLOH status flag is released when VH voltage reaches the VH on
threshold and the device returns to normal operation.
Otherwise, the UVLOH flag is latched and the device remains in “safe state” until the VH voltage reaches the
VH on
threshold and the flag is released. See Section 7.11 for indication on how the failure flags can be
released.
When VL voltage goes over the VL off
threshold, the output buffer goes in “safe state” and the UVLOL status flag is forced high. If the UVLOlatch bit in the CFG4 register is set low (default), the UVLOL status flag is released when
VL voltage goes below the VLon threshold and the device returns to normal operation.
Otherwise. the UVLOL flag is latched and the device remains in “safe state” until the VL voltage goes below the
VL on
Overvoltage protection is available on both VH and VL supply pins. Both OVLO protections can be disabled by setting the proper value in the CFG4 register.
When the VH voltage goes over the OV
VHoff
threshold, the output buffer goes in “safe state” and the OVLOH status flag is forced high. The OVLOH flag is latched and the device remains in “safe state” until VH voltage goes
below the overvoltage threshold and the flag is released. See Section 7.11
for indication on how the failure flags can be released.
When VL voltage goes over the OV
VLoff
threshold, the output buffer goes in “safe state” and the OVLOL status flag is forced high. The OVLOL flag is latched and the device remains in “safe state” until VH voltage goes below the overvoltage threshold and the flag is released. See
for indication on how the failure flags can be released.
Thermal warning and shutdown protection
The device provides a thermal warning and a thermal shutdown protection.
When junction temperature reaches the T
WN
temperature threshold the TWN flag in the STATUS1 register is forced high. The TWN flag is released as soon as the junction temperature is lower than T
WN
- T hys
.
When junction temperature reaches the T
SD
temperature threshold, the device is forced in “safe state” and the
TSD flag in the STATUS1 register is forced high. The device operation is restored and the TSD flag is released as soon as the junction temperature is lower than T
SD
- Thys.
Desaturation protection
This feature allows implementing an overload protection for the IGBT. The DESAT pin monitors the V
CE
voltage of the IGBT while it is on, and if the protection threshold is reached, the IGBT is turned off.
DS11974 - Rev 4 page 19/59
DS11974 - Rev 4
A
T
I
O
L
I
S
O
N
STGAP1BS
Desaturation protection
Figure 11. Example of desaturation protection connection
LOGIC
+
DESATcurr
(programmable)
DESATth
(programmable)
Discharge switch
VH
DESAT
Cblank
Rg_on
GON
GOFF
I
C
VL
GNDISO
When the IGBT is off (GOFF output is activated) the DESAT pin is kept low internally and the external blanking capacitor connected to the DESAT pin is discharged (the internal current generator is fully switched off and the switch between DESAT and GNDISO pins is turned on).
When the GON output is activated the switch between DESAT and GNDISO pins is turned off and an internal programmable current generator (I
DESAT
) starts charging the external blanking capacitor after a fixed blanking time t
BLK
.
If a desaturation event occurs the V
CE
voltage increases and the voltage at the DESAT pin reaches the desaturation threshold V
DESATth
: the DESAT comparator output is set, the device is forced in “safe state” and the DESAT flag is forced high and latched.
).
Both the V
DESATth
threshold and the I
DESAT
blanking current are programmable through the SPI.
page 20/59
7.7
STGAP1BS
VCE active clamping protection
Figure 12. DESAT protection timing diagram
IN+
Comparator Disabled Comparator Enabled Comparator Disabled
t
DESAT
VH level
GON-GOFF
V
DESATth
DESAT
VL level
Blanking time
t
BLK t
DIAGx
DiagX
A deglitch filter is applied to the DESAT pin. Each pulse exceeding the V
DESATth
for a time shorter than t value shall not trigger the protection.
DESfilter
V
CE
active clamping protection
This protection is used to actively clamp the drain/collector overvoltage spikes during the MOSFET/IGBT turn-off.
This feature allows using low turn-off resistor values leading lower turn-off losses, thus increasing efficiency, while limiting the maximum turn-off spike on the collector (or drain) within safe limits.
The direct feedback of the collector voltage to the device can for example be made via an element with avalanche characteristics such as a TVS. If the V
CE
voltage exceeds the breakdown voltage of the TVS, the V
VCECLth threshold voltage on the VCECLAMP is reached and the IC actively slows down the power switch turn-off to keep a safe condition.
The active limiting of the driver's turn-off current strongly reduces the current flowing through the TVS, thus preventing it from operating in overstressing conditions.
DS11974 - Rev 4 page 21/59
STGAP1BS
SENSE overcurrent protection
Figure 13. Example of V
CE
active clamping protection connection
VCECLAMP
7.8
Floating
Section
Control
Logic
Level
Shifter
VH
GON
GOFF
CLAMP
VL
VLVLVL
GNDISO
+
CLAMPth
When the VCECLAMP is activated during the turn-off phase a watchdog timer starts inside the driver. This timer allows the VCECLAMP pin to act on the driver's output status for a t
VCECLoff
time maximum. After that time has expired, the driver continues the normal turn- off ignoring the VCECLAMP pin status. This assures that the protection is only acting to clamp inductive V
CE
spikes during the turn-off.
The timer is reset and the VCECLAMP protection is enabled again at the beginning of the following turn-off sequence.
Figure 14. VCECLAMP timing diagram
GON\GOFF
VCECLAMP
VCEcounter
stopped ready counting t
VCECLof stopped ready
The VCECLAMP pin is masked and has no effect on the driver's outputs status when the external MOSFET/IGBT is on.
The V
CE
active clamping protection can be disabled connecting the VCECLAMP pin to VL.
SENSE overcurrent protection
This function is suitable in applications in which it is possible to measure the load current through the use of a shunt resistor, or in applications that use IGBTs with the current sense pin available. The load current (or a fraction of it in case SenseFETs are used) is converted to voltage by an external shunt resistor and is fed to the
SENSE pin (comparator input).
DS11974 - Rev 4 page 22/59
STGAP1BS
Miller clamp function
When an overcurrent event occurs the sense voltage reaches the V
SENSEth
threshold, the device is forced in “safe state” and the SENSE status flag is forced high and latched.
The V
SENSEth
threshold is programmable through the SPI (refer to Section 9.2.2
).
Figure 15. Example of SENSE overcurrent protection connection
I
C
VH
Rg_on
GON
GOFF
A
T
I
O
N
I
S
O
L
LOGIC
VL
SENSE
Vref
(programmable)
GNDISO
Rsense
7.9
7.10
Miller clamp function
The Miller clamp function allows the control of the Miller current during the power stage switching in half-bridge configurations. When the external power transistor is in the OFF state, the driver operates to avoid the induced turn-on phenomenon that may occur when the other switch in the same leg is being turned on, due to the C gc capacitance.
During the turn-off period the gate of the external switch is monitored through the CLAMP pin.
The CLAMP switch is activated when gate voltage goes below the voltage threshold V
CLAMPth
, thus creating a low impedance path between the switch gate and the VL pin.
This function can be disabled setting low the CLAMP_EN bit in the CFG5 register (high by default).
2-level turn-off function
If an overcurrent event happens, a large voltage overshoot exceeding V
CE
absolute ratings may occur across the power switch during the turn-off, due to the parasitic stray inductances.
The 2-level turn-off function (2LTO) allows the reduction of the stressing overvoltage experienced by the power component in overcurrent condition by switching off the external power in two phases.
In the first phase, the GOFF voltage is actively forced to a programmable value V
2LTOth
; after a programmable delay t
2LTOtime
the GOFF is forced to VL to complete the gate turn-off.
This allows to slow down the critical part of the turn-off transient, that may induce the overvoltage spikes.
The voltage level V
2LTOth
and duration t
2LTOtime
of the intermediate off-level are programmable through the SPI.
It is possible to program when this feature takes place, refer to the following paragraphs.
DS11974 - Rev 4 page 23/59
STGAP1BS
2-level turn-off function
7.10.1
2-level turn-off function - Always
The 2LTO is performed at each turn-off transition (2LTO_EN = '0').
When 2LTO is used, at each transition the minimum on or off pulse width is determined by 2LTO time. Some sample waveforms are given in
Figure 16 and Figure 17 , where IN
AND
represents the condition: < IN+ = 'H' and
IN- = 'L' >.
If a turn-on pulse is shorter than t
2LTOtime
it shall be ignored; turn-on pulses longer than t
2LTOtime
will determine a delay in the turn-on equal to t
2LTOtime
(see
Figure 16. Example of short turn-on pulses when 2LTO occurs at each cycle
ON
time
ON
time
IN
AND
GON-GOFF
t
2LTOtime
ON-time < t
2LTOtime t
2LTOtime t
2LTOtime t
Doff
ON
time t
Don t
2LTOtime
ON-time < t
2LTOtime
ON-time > t
2LTOtime t
2LTOtime t
Don
ON-time > t
2LTOtime t
Doff
ON
time t
2LTOtime
When a turn-off pulse is detected the turn-off procedure starts immediately by forcing the V
2LTOth
voltage on the
GOFF pin. If the duration of the turn-off pulse is shorter than t
2LTOtime
GOFF in high impedance and turning GON on again (see
the turn-off sequence is aborted by setting
Figure 17. Example of short turn-off pulse when 2LTO occurs at each cycle
IN
AND t
Dof t
Dof t
Don t
Dof
7.10.2
GON-GOFF
t
2LTOtime t
2LTOtime t
2LTOtime
OFF-time > t
2LTOtime
OFF-time < t
2LTOtime
OFF-time > t
2LTOtime
When the 2LTO is used at each cycle, any event that forces the device to enter in “safe state” generates a driver switch off performing a 2LTO sequence.
2-level turn-off function - Fault
The 2LTO is performed only after a desaturation or overcurrent event (2LTO_EN = '1'). In such cases the device
be released.
This configuration overrides some drawbacks of using the 2LTO at each turn-off, such as the minimum pulse width equal to t
2LTOtime
and the turn-on delay needed to avoid duty cycle distortion.
With this configuration the turn-off is only slowed down in case of desaturation or overcurrent events.
DS11974 - Rev 4 page 24/59
STGAP1BS
Failure management
7.10.3
7.11
Figure 18. Example of operation with 2LTO in “Fault” mode
IN
AND
V
DESATth
DESAT
GON-GOFF
t
Dof t
Don t
Dof t
Don t
DESAT t
2LTOtime
2-level turn-off function - Never
The 2LTO function is disabled (2LTOtime = 0x0). In this case a standard turn-off sequence is used (directly lowering the gate voltage from VH to VL) also in case of desaturation or sense overcurrent events.
•
•
Failure management
The device provides advanced diagnostic through open drain outputs (DIAG1/DIAG2) and internal status
pin is enabled through the DIAG_EN bit as described in
.
Status registers (STATUS1, STATUS2 and STATUS3) provide failures and status information as listed in respective paragraphs.
DIAG1 and DIAG2 pins can be programmed through the dedicated registers (DIAG1CFG and DIAG2CFG) to signal one or more failure conditions. The output value is the result of the NOR of the selected status bits: if one of the selected bits is high, the output is forced low.
Some of the failure conditions reported by the status registers are latched, i.e.: the flag is kept high even if the triggering condition is expired.
Different methods can be used to clear the failure flags contained in the status registers:
• Using the ResetStatus command
The SD must be set low before giving this command and must remain low until the end of the command’s execution time.
This is the recommended method, because guarantees that status registers are only cleared by direct intervention of the MCU.
All flags in the StatusRegisters are released after a t desCS
time following the rise of the SPI CS.
Forcing low the SD pin for at least t release
All the flags are released at the rising edge of the SD. This mode is enabled at device’s power-on, but it can be disabled by setting the SD_FLAG configuration bit low during the configuration phase, and by doing this any possibility to clear a FLAG without direct intervention of the MCU is prevented. Even if the
SD_FLAG is set high, status registers are not cleared after the rising edge of the SD if a configuration sequence is executed ( StartConfig , StopConfig ). This is done to avoid clearing errors that may have been generated during the configuration procedure.
Using HW reset
)
In this case the device behaves as after power-up sequence.
In any of the above cases, if the failure condition is still present, the respective flag is not released.
Selected failures force the device in “safe state”; the device remains in this state until the relative status flags are released. Refer to
Table 51 and Table 53 for details.
The possibility to clear status registers by setting the SD low allows operating the device also without using the SPI interface. In order to avoid an unintended clear of fault conditions it is recommended to disable this functionality by setting the SD_FLAG = '0'.
DS11974 - Rev 4 page 25/59
STGAP1BS
Asynchronous stop command
7.12
7.13
7.14
7.14.1
Asynchronous stop command
The ASC pin allows to turn-on the GON output acting directly on the isolated driver logic and regardless of the status of the input pins IN+, IN- and SD. This pin is active high.
The status of this pin is mirrored in the ASC bit present in the STATUS2 register.
The power supply of the isolated section must be present (VH > VH on
).
In case UVLO on VH is not enabled, ASC function works for VH values within the recommended operating values.
This function works even if the VDD voltage is not available or is in UVLO condition.
The priority of such command is lower than that of DESAT and SENSE pins, so the ASC command is ignored in case of a desaturation or overcurrent fault. After such events the gate can be turned on again with a low-to-high
transition of the ASC pin, or by clearing the fault condition (see Section 7.11 ).
Watchdog and echo
The isolated side provides a watchdog function in order to identify when it is no more able to communicate with the LV side. In this case the driver is automatically forced in “safe state” and the REGERRR flag is set.
When the LV side is in the standby mode, turned off or in hardware reset condition, the isolated side watchdog is still operative and the REGERRR flag is set.
The low voltage side provides a watchdog function in order to identify when it is no more able to communicate with the isolated side. In this case the REGERRL flag is set and the device is forced in “safe state”.
An echo function is implemented in order to check that input commands toward the gate are correctly propagated to the driver's output. In case something should prevent the correct propagation of the command, the driver is able to detect this condition and will start a new communication (echo) in order to set the desired output state.
This process has typical duration of 4 μs.
•
Security check functions
•
•
•
•
•
The device allows verifying the gate and sense resistor connections and the functionality of SENSE and DESAT.
This can be achieved through the following security checks:
Logic inputs to isolated driver path
GON to gate path
GOFF to gate path
SENSE comparator
SENSE resistor
DESAT comparator
The check modes are enabled through a dedicated configuration register TEST1 (refer to
thus require entering in configuration mode.
Only one check mode at a time must be enabled. At the end of security check procedure, the TEST1 register must be set to 0x00 before running the device in normal mode.
It is recommended to clear the status register with the ResetStatus command before and after each check.
To prevent the SD from clearing the STATUS flags, set the SD_FLAG = '0' as described in Section 7.11
.
Logic inputs to isolated driver path
The purpose of this security check is to verify the path integrity including the input buffer.
The check uses bit #[0] of the STATUS2 register, which contains information about the gate status request that the gate driver stage received from the logic inputs and reported. Please note that this value may differ from the actual GON and GOFF status, for example if some condition is forcing the device in “safe state”.
To perform this test, the following procedure has to be followed:
• Set SD = high, IN- = low and IN+ = low
• Set IN+ = high
• Wait at least t
Gchk
DS11974 - Rev 4 page 26/59
STGAP1BS
Security check functions
7.14.2
7.14.3
• Read GATE bit in the STATUS2 register
– GATE = '1' → OK
– GATE = '0' → FAIL
Set IN+ = low •
During all the duration of the check the logic inputs have to follow the levels indicated by the procedure and must not be otherwise modified.
Please note that when IN+ is set high during the check, the gate may be forced high (GON turned on). The user test routine has to take into account this behavior.
•
•
GON to gate path check
•
•
The purpose of this security check is to verify the path integrity including the driver's GON output, the GON
(turn-on) gate resistor, the power switch gate and the CLAMP pin (see
To perform this test, the following procedure has to be followed:
• Set SD = low
• Send StartConfig
Set GONCHK = '1'
command
Send StopConfig command
Wait at least t
Gchk
Read TSD flag
– TSD = '0' → OK (V
CLAMP
> V
Gchk
)
– TSD = '1' → FAIL (V
CLAMP
< V
Gchk
)
Please note that during all the time the check is enabled the gate will be forced high (GON turned on) regardless the SD pin level. The user test routine has to take into account this behavior.
In any case, when GONCHK = '1', the protections SENSE and DESAT, if enabled, will continue to operate protecting the power switch regardless the SD pin.
•
•
•
•
•
•
GOFF to gate path check
The purpose of this security check is to verify the path integrity, including the driver's GOFF output, the GOFF
(turn-off) gate resistor, the power switch gate, and the CLAMP pin (see Figure 19
).
To perform this test, the following procedure has to be followed:
Set SD = low
Send StartConfig command
Set GOFFCHK = '1'
Send StopConfig command
Wait at least t
Gchk
+ t
GATE_GOFFchk
Read DESAT flag
– DESAT = '0' → OK (V
CLAMP
< V
CLAMPth
)
– DESAT = '1' → FAIL (V
CLAMP
> V
CLAMPth
)
During the check, a small current I
GOFFchk
will be sourced from the CLAMP pin while GOFF is on, keeping the gate low through the turn-off gate resistor.
To ensure the check result, some applicative conditions have to be verified:
• The bleeding resistor, sometimes present between the gate and source in the power switch, shall be higher than 8.2 kΩ.
• During the test, the power switch gate shall have the time to be charged up to V
CLAMPth
by I
GOFFchk
. In case no bleeding resistor is present, this time can be roughly computed as: t
GATE_GOFFchk
≈ C
GATE
* (V
CLAMPth
- VL) / I
GOFFchk
If a bleeding resistor is present or an additional push-pull circuit has been added, the time has to be computed with the adequate corrective factors.
If the check fails due to the lack of the GOFF resistor, the power switch gate will gradually rise up to VH with no protections of SENSE nor DESAT. The user test routine shall consider this behavior.
DS11974 - Rev 4 page 27/59
STGAP1BS
Security check functions
Figure 19. Gate paths check circuitry
SD
CS
CK
SDI
SDO
Control
Logic
SPI
T
I
O
N
I
S
O
L
A
Floating
Section
Control
Logic
Level
Shifter
+
V CLAMPth
I
GOFFchk
VH test control
Floating ground
VH
GON
GOFF
CLAMP
VL
GNDISO
7.14.4
SENSE comparator check
The purpose of this security check is to verify the functionality of the sense comparator.
To enable this check, it is necessary to set SNSCHK = '1' and SENSE_EN = '1'.
When this check is enabled the switch in series to the SENSE pin is open (see
fault (STATUS1 register) should be reported within t
SENSEchk
, otherwise the SENSE comparator operation is compromised.
•
•
V
SENSEcomp
> V
SENSEth
→ comparator OK → SENSE = '1'
V
SENSEcomp
< V
SENSEth
→ comparator FAIL → SENSE = '0'
The SENSE fault generated by this test is latched and shall be cleared accordingly.
DS11974 - Rev 4 page 28/59
STGAP1BS
Security check functions
SD
CS
CK
SDI
SDO
Control
Logic
A
T
I
O
I
S
O
L
N
Figure 20. SENSE comparator and resistor check circuitry
Floating
Section
Control
Logic
Level
Shifter
VH
GON
GOFF
CLAMP
VL
I
SENSERchk
VH
+
SENSEcomp
V SENSEth test control test control
SENSE
R test SPI
Floating ground GNDISO
R
SENSE
7.14.5
7.14.6
•
•
•
•
SENSE resistor check
The purpose of this security check is to verify the connection between the device and the sense shunt resistor and to verify the optional sense resistor filter network is not open.
To perform this test, the following procedure has to be followed:
• Set SD = low
•
•
Send StartConfig
Set SENSE_EN = '1'
command
Set RCHK= '1'
Send StopConfig command
Wait t
Rchk
+ t
SENSERchk
Read SENSE flag
– SENSE = '0' → OK (V
SENSE
< V
SENSEth
)
– SENSE = '1' → FAIL (V
SENSE
> V
SENSEth
)
During the check a small current I
SENSERchk
is sourced from the SENSE pin (see
Figure 20 ). If the sense resistor
is not present or floating, SENSE pin voltage will rise and once V
SENSEth
is exceeded, a SENSE fault will be reported in the STATUS1 register within t
Rchk
.
To ensure the check result, the following condition has to be verified:
• The SENSE flag read has to be delayed of t to reach V
SENSEth
by the I
SENSERchk
current.
SENSERchk
, which is the time the customer filtering network takes
DESAT comparator check
•
•
The purpose of this security check is to verify the functionality of the desaturation comparator.
To perform this test, the following procedure has to be followed:
Set SD = low
Send StartConfig command
DS11974 - Rev 4 page 29/59
STGAP1BS
Register corruption protection
•
•
•
•
•
•
•
Set DESAT_EN = '1'
Set DESCHK = '1'
Send StopConfig command
Set SD = high
Wait 3 μs
Apply at the inputs a gate turn on pulse longer than 500 ns
Read DESAT flag
– DESAT = '1' → OK (V
DESATcomp
> V
DESATth
)
– DESAT = '0' → FAIL (V
DESATcomp
< V
DESATth
)
During this test GON is first turned on and then turned off as soon the test succeeds. In case the test should fail, the output remains on as long as the input signal remains high.
At the end of the check the DESAT fault remains set (it is latched), and it has to be cleared.
Figure 21. DESAT comparator check circuitry
CS
CK
SDI
SDO
SD
IN+
INControl
Logic
O
N
T
I
I
S
O
L
A
Floating
Section
Control
Logic
SPI
+
I
DESAT
VH test control test control
V
DESATth
DESAT
C blank
Level
Shifter
Floating ground
VH
GON
GOFF
CLAMP
VL
GNDISO
1k
7.15
Register corruption protection
All the configuration registers are protected against content corruption.
If the value of a local register is changed without a proper command is received ( WriteReg or GlobalReset ), the REGERRL flag is set high and the device is forced in “safe state”.
If the value of a remote register is changed without a proper command is received ( WriteReg or GlobalReset ), the REGERRR flag is set high and the device is forced in “safe state”.
DS11974 - Rev 4 page 30/59
8
STGAP1BS
SPI interface
SPI interface
•
•
The IC communicates with an external MCU through a 16-bit SPI. This interface is used to set the device parameters and for advanced diagnostic.
SPI commands are executed after the rising edge of the CS, and adequate wait time must be respected before a new command is started by setting the CS low again. Refer to the t desCS
parameter in
for required wait time after each command.
The SPI I/O pins are:
• CS: chip select (active low)
• CK: serial clock
SDI: serial data input (MOSI)
SDO: serial data output (MISO).
The interface is compliant with the SPI standard CPHA = 1 and CPOL = 0 (serial data is sampled on CK falling edge and it is updated on CK rising edge, at the CS falling edge the CK signal must be low) as shown in
Figure 22. SPI timings
SD
(Not required for
NOP and read operations) t
SDLCSL
CS t setCS t fCK t lCK t rCK t hCK t
CSHSDH t desCS
CK
SDI
SDO
HiZ t enSDO t setSDI t holSDI
MSB t holSDO
MSB
N-1 t vSDO
N-2
N-1 N-2 t holCS
LSB
LSB t disSDO
MSB
The SPI interface can work up to 5 Mbps and provides the daisy chain feature.
In order to guarantee a safe operation and robustness to electrical noise, the number of rising edges within a CS negative pulse must be multiple of 16, otherwise the communication cycle is ignored and a communication failure is indicated forcing high the SPI_ERR flag.
Any number of the STGAP1BS can be connected in daisy chain, and only 4 lines for the SPI and one for the
SD are required in order to guarantee access to status and configuration registers of each device. An example of daisy chain configuration is shown in
In case that several STGAP1BS devices are connected in the SPI link, each of them can be configured in a different way by simply writing the desired data in each configuration and diagnostic register. This allows for example differentiating the configuration for high-side and low-side drivers.
DS11974 - Rev 4 page 31/59
STGAP1BS
CRC protection
Figure 23. SPI daisy chain connection example
Device 1 Device 2 Device N
SD
CS
CK
SDI
SDO
I
S
O
L
A
T
I
O
N
SD
CS
CK
SDI
SDO
O
L
A
T
I
O
I
S
N
SD
CS
CK
SDI
SDO
O
L
A
T
I
O
I
S
N
μC
SD
MOSI
CS
CK
MISO
In case a bootstrap capacitor and a diode are used to generate the VH supply voltage for the high-side drivers, it is recommended to have one dedicated SD line for all of the high- side drivers and another dedicated SD line for all of the low-side drivers. An example of such topology is shown in
Figure 24. SPI daisy chain connection example when bootstrap technique is used for high-side drivers
VH
_HS1
VH
VH
_HS2
VH
SD SD
CS
CK
SDI
SDO
L
A
T
I
S
O
I
O
N
C boot _HS1
VL
GNDISO
CS
CK
SDI
SDO
T
I
O
N
O
L
I
S
A C boot
_HS2
VL
GNDISO
VH
_LS
VH
VH
_LS
VH
μC
SD_HS
MOSI
CS
CK
MISO
SD_LS
SD
CS
CK
SDI
SDO
A
T
I
O
N
I
S
O
L
VL
GNDISO
GNDisoGNDiso
SD
CS
CK
SDI
SDO
O
N
T
I
L
A
I
S
O
VL
GNDISO
8.1
CRC protection
All the command and data bytes have to be followed by a CRC code. If the CRC_SPI bit is set high, this code is used to check the data byte is correct, otherwise the CRC byte is ignored. In this case the CRC byte must be transmitted by the host, but its value is unimportant.
A failure on the CRC check causes the respective data byte is ignored and the SPI_ERR flag is set high.
The polynomial generator of the CRC code is X 8 + X 2
+ X + 1 corresponding to the block diagram in Figure 25
.
DS11974 - Rev 4 page 32/59
DS11974 - Rev 4
STGAP1BS
CRC protection
Figure 25. Block diagram of the CRC generator
Message
(from MSb to LSb)
X 7 X 6 X 5 X 4 X 3 X 2 X 1 X 0
The host must transmit to the device the inverted CRC code computed using the following procedure:
•
•
•
Initialize CRC to all 1
Start the calculation from the most significant bit of the message
Invert the CRC result
In case of a WriteReg command, the CRC of the data byte (i.e.: the new register value) must be calculated initializing the computation system to the CRC of the command byte (i.e., the CRC is calculated on a 16-bit message composed by the command + data byte). This way a data byte cannot be accepted as a command byte
and vice-versa. Some examples are listed in Table 11
.
The device always transmits a response byte followed by a CRC computed using the same polynomial generator
(X 8 + X 2 + X + 1). The CRC byte transmitted by the device is not inverted.
If no response is required, the word returned by the device has no meaning and it should be discarded. Some
examples are listed in Table 12
.
Command
StopConfig
WriteReg(CFG1, 0x20)
WriteReg(CFG5, 0x06)
ResetStatus
ReadReg(CFG3)
Table 11. CRC byte examples (from host to device)
Command byte
0x3A
0x8C
0x99
0xD0
0xBE
Command CRC
0xAA
0xA1
0xCA
0x32
0x3F
Data byte
N.A.
0x20
0x06
N.A.
N.A.
Data CRC
N.A.
0x82
0x66
N.A.
N.A.
Table 12. CRC byte examples (from device to host)
Data byte
0x00
0xEA
0xF5
0x2A
Data CRC
0xF3
0x6B
0x36
0x25 page 33/59
STGAP1BS
Programming manual
9
Programming manual
9.1
9.1.1
SPI commands
Table 13. SPI commands
Command mnemonic
StartConfig
Command value Action
0 0 1 0 1 0 1 0 Device configuration start
StopConfig
NOP
WriteReg
0 0 1 1 1 0 1 0 Device configuration/check completed
0 0 0 0 0 0 0 0 No operation
1 0 0 A A A A A Write AAAAA register
-
Notes
Enter CFG mode SD low only
Leave CFG mode SD low only
CFG mode only
ReadReg
ResetStatus
GlobalReset
Sleep
1 0 1 A A A A A Read AAAAA register
1 1 0 1 0 0 0 0 Reset all the status registers
1 1 1 0 1 0 1 0 Global reset
1 1 1 1 0 1 0 1 Device enters in standby mode
-
SD low only
CFG mode only
SD low only
StartConfig and StopConfig commands
Table 14. StartConfig command synopsis
Byte
To device
1
0010 1010
1. The CRC byte of the command, if the CRC check is disabled this byte is ignored.
2
1101 1010
Table 15. StopConfig command synopsis
Byte
To device
1
0011 1010
1. The CRC byte of the command, if the CRC check is disabled this byte is ignored.
2
1010 1010
Device parameters are configured by writing configuration values in configuration registers (CFGx and
DIAGxCFG), which is only possible by entering in configuration mode.
To switch the device to the configuration mode the StartConfig command must be sent. This command is accepted when the SD line is low only. If the command has been correctly received and interpreted, the IC registers writing is enabled.
The SD pin must be kept low during the whole configuration procedure, which is terminated by the StopConfig command. If the SD pin is raised during the configuration procedure the device immediately quits the configuration mode causing a fault error indicated by the REGERRL and REGERRR bits. In this case all the changes operated on device configuration are undone and the previous configuration is restored.
At the end of the device setup, the StopConfig command has to be sent in order to quit the configuration mode and make all changes effective.
Configuration sequence must be repeated every time the power supply on either side (VDD or VH) is removed and then restored.
•
•
VDD falling below critical value will result in the REGERRL flag being set in status registers after that the proper VDD level is restored.
VH falling below critical value will result in the REGERRR flag being set in status registers.
DS11974 - Rev 4 page 34/59
STGAP1BS
SPI commands
After that all supply voltages are supplied and stable, the configuration process can be executed. The flow chart shown in
configuration has been correctly stored in the device at the end of the configuration sequence.
Figure 26. STGAP1BS recommended configuration flow
Power ON
VDD, VH, (VL) stabilization
Set SD low
Reset status
Clear STATUS registers through
“Reset Status” SPI command
9.1.2
SD must be low with no glitch/bounces during this phase
Read CFG1-2-3-4-5. DIAG1-2 through appropriate read masks
N
Y
Read status
Read STATUS1-2-3 registers through appropriate read masks
Status OK
Y
N
CONFIGURATION
Set SD high
End of inizialization
WriteReg command
Table 16. WriteReg command synopsis
Byte
To device
1
2
3
DDDD DDDD
1. The command byte where AAAAA is the address of the target register.
2. The CRC byte of the command, if the CRC check is disabled this byte is ignored.
3. Data to be written into the target register.
4. The CRC byte of the command and data, if the CRC check is disabled this byte is ignored.
4
The device register can be written through the WriteReg command when the device is set in the configuration mode only (refer to
Section 9.1.1 ), otherwise the write command is ignored and the SPI_ERR flag is forced low.
DS11974 - Rev 4 page 35/59
9.1.3
9.1.4
STGAP1BS
SPI commands
The WriteReg command is followed by the data to be written into the target register. The CRC code following the data is based on both command and data bytes. In this way, in case of communication error, a data byte cannot be decoded as a command and vice-versa (refer to
ReadReg command
Table 17. ReadReg command synopsis
Byte
To device
From device
1
0000 0000
2
CCCC CCCC
0000 0000
1. Proper time have to be waited in order to allow the device to prepare the data.
2. The command byte where AAAAA is the address of the target register.
3. The CRC byte of the command, if the CRC check is disabled this byte is ignored.
4. The CRC byte of the NOP command.
5. Data read from the target register.
6. The CRC byte of the data.
3
0000 0000
DDDD DDDD
4
KKKK KKKK
All the registers of the device can be read anytime, and this requires two accesses (CS must be asserted LOW and HIGH twice). In the first access the SPI host issues the ReadReg command (including the register address) and the CRC of the first byte, which will be ignored if SPI CRC is not enabled. After the command is received and decoded by the device, the register value and the respective CRC code is prepared for the transmission. The
CRC polynomial used by the device during the transmission is different from the one used by the host, but the
CRC code is not inverted before transmission (refer to Section 8.1
).
The time required to obtain the reading result changes according to the side where the register is located. The reading of a local register (low voltage side) is available in 800 ns. The reading of a remote register (isolated side), if no communication error occurs between the two sides of the device, is available in 30 μs.
After the read result is ready it is stored in the SPI output buffer, and the host MCU will receive it as soon as it will send a new SPI command. Any command can be used for this purpose, including a NOP or the ReadReg command for the next register to be read.
Some status and configuration registers contain a reserved bit whose content is not predictable. In order to clearly identify the content of relevant information, the value read from each register should be masked with the
appropriate masking code (see “Mask code” in Table 23
).
ResetStatus and GlobalReset commands
Table 18. ResetStatus command synopsis
Byte
To device
1
1101 0000
1. The CRC byte of the command, if the CRC check is disabled this byte is ignored.
2
The ResetStatus command is a specific reset command which acts on all status registers releasing all the latched flags. The command is executed only when the SD input is low, otherwise the SPI_ERR flag is forced low.
Table 19. GlobalReset command synopsis
Byte
To device
1
1110 1010
1. The CRC byte of the command, if the CRC check is disabled this byte is ignored.
2
1001 0100
DS11974 - Rev 4 page 36/59
9.1.5
9.1.6
9.2
STGAP1BS
Register and flag descriptions
The GlobalReset command reset all the registers to the default and releases all the failure flag (if latched).
It can be sent when the device is in the configuration mode only, otherwise the command is ignored and the
SPI_ERR flag is forced low.
Sleep command
Table 20. Sleep command synopsis
Byte
To device
1
1111 0101
1. The CRC byte of the command, if the CRC check is disabled this byte is ignored.
2
1100 1001
The CRC byte of the command, if the CRC check is disabled this byte is ignored.
The command forces the device to switch in standby mode within a t sleep
period. The command is executed only when the SD pin in low, if the SD pin is high the command is ignored and the SPI_ERR flag is forced low.
Refer to
for the description of the standby mode.
NOP command
Table 21. NOP command synopsis
Byte
To device
1
0000 0000
1. The CRC byte of the command, if the CRC check is disabled this byte is ignored.
The command does not modify the device status and does not generate any answer.
2
0000 1100
Register and flag descriptions
All device features can be configured through a set of 8-bit long registers. There are three different types of registers:
1.
Local registers are located on the low voltage side
2.
Remote registers are located on the isolated side
3.
Shared registers are located both on the low voltage and isolated side and the value of the two copies is kept synchronized.
Name
-
CFG1
CFG2
CFG3
CFG4
CFG5
STATUS1
STATUS2
STATUS3
TEST1
Table 22. Register map
L
L
L
R
R
R
-
L
R
R
Structure
[7] [6] [5] [4]
CRC_SPI UVLOD_EN SD_FLAG DIAG_EN
SENSEth
2LTOth
DESATcur
[3]
-
-
OVLOH
-
-
-
-
-
OVLOL
-
-
-
OVLO_EN UVLOlatch
-
DESAT
-
-
-
-
SENSE
-
UVLOH
-
DTset
VLONth
[2] [1]
DESATth
2LTOtime
INfilter
[0]
2LTO_EN CLAMP_EN DESAT_EN SENSE_EN
GOFFCHK GONCHK
UVLOL
REGERRR
DT_ERR SPI_ERR REGERRL
DESCHK
VHONth
TSD
ASC
OVLOD
SNSCHK
TWN
GATE
UVLOD
RCHK
DS11974 - Rev 4 page 37/59
9.2.1
STGAP1BS
Register and flag descriptions
Name
DIAG1CFG
DIAG2CFG
L
L
1. R: remote (isolated side), L: local (low voltage side).
Structure
DIAG1_7 DIAG1_6 DIAG1_5 DIAG1_4 DIAG1_3 DIAG1_2
DIAG2_7 DIAG2_6 DIAG2_5 DIAG2_4 DIAG2_3 DIAG2_2
DIAG1_1
DIAG2_1
DIAG1_0
DIAG2_0
Name
CFG1
CFG2
CFG3
CFG4
CFG5
STATUS1
STATUS2
STATUS3
TEST1
DIAG1CFG
DIAG2CFG
CFG1 register (low voltage side)
The CFG1 register has the structure of
Table 23. Registers access
0x02
0x01
0x0A
0x11
0x05
0x06
Address
0x0C
0x1D
0x1E
0x1F
0x19
Mask code
0xFF
0xFF
0xFF
0x3F
0x0F
0xFF
0x07
0x1F
0x1F
0xFF
0xFF
-
-
Default/reset
Bit 7
CRC_SPI
0
Table 24. CFG1 register
Bit 6
UVLOD_EN
0
Bit 5
SD_FLAG
1
Bit 4
DIAG_EN
0
The CRC_SPI bit enables the CRC check on the SPI communication protocol.
Bit 3 Bit 2
DTset
00
Bit 1 Bit 0
INfilter
00
CRC_SPI
0
1
Table 25. CRC enable
SPI communication protocol CRC enable
Disabled
Enabled
The UVLOD_EN bit enables the UVLO protection on VDD supply voltage.
UVLOD_EN
0
1
Table 26. VDD supply voltage UVLO enable
Supply voltage UVLOD enable
Disabled
Enabled
DS11974 - Rev 4 page 38/59
9.2.2
STGAP1BS
Register and flag descriptions
The SD_FLAG bit sets the SD pin functionality according to
Table 27 . When the reset of the failure flags through
the SD pin is enabled, keeping low the SD pin for at least t release
causes all the latched flags of the status registers to be released at the next SD rising edge.
SD_FLAG
0
1
Table 27. SD pin FAULT management
SD pin functionality
SD pin do not reset STATUS registers
SD pin reset STATUS registers
The DIAG_EN bit sets if the IN-/DIAG2 pin works as the input or open drain output according to
DIAG_EN
0
1
The DTset bits set the deadtime value.
Table 28. IN-/DIAG2 pin functionality
IN-/DIAG2 pin functionality
The IN-/DIAG2 pin work as input
The IN-/DIAG2 pin work as open drain output
DTset [1 ... 0]
0
0
1
1
Table 29. Deadtime
Deadtime value [ns]
0
1
0
1
The INfilter bits set the input deglitch time t deglitch
for the SD, IN- and IN+ pins.
-
Disabled
250
800
1200
1
1
0
0
INfilter [1 ... 0]
0
1
0
1
Table 30. Input deglitch time
Input deglitch time value [ns]
Disabled
160
500
70
CFG2 register (isolated side)
The CFG2 register has the structure of
-
-
Default/reset
Bit 7
Table 31. CFG2 register
Bit 6
SENSEth
000
Bit 5 Bit 4 Bit 3
DESATcur
00
Bit 2 Bit 1
DESATth
100
Bit 0
The SENSEth bits set the SENSE comparator threshold according to
DS11974 - Rev 4 page 39/59
9.2.3
STGAP1BS
Register and flag descriptions
0
0
1
1
0
0
1
1
SENSEth [2 ... 0]
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
Table 32. SENSE threshold
SENSE threshold value [mV]
100
125
150
175
200
250
300
400
The DESATcurr parameter sets the current sourced by the DESAT pin according to
DESATcur [1 ... 0]
0
0
1
1
Table 33. DESAT current
0
1
0
1
DESAT current value [μA]
250
500
750
1000
0
0
1
0
0
1
1
1
DESATth [2 ... 0]
0
0
1
1
0
0
1
1
0
1
0
0
1
1
0
1
CFG3 register (isolated side)
The CFG3 register has the structure of
Table 34. DESAT threshold
DESAT threshold value [V]
3
4
5
6
7
8
9
10
-
-
Default/reset
Bit 7
Table 35. CFG3 register
Bit 6
2LTOth
0000
Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
2LTOtime
0000
Bit 0
The 2LTOth parameter sets the voltage value which is actively forced during the 2-level turn- off sequence (refer to
for details).
DS11974 - Rev 4 page 40/59
9.2.4
STGAP1BS
Register and flag descriptions
1
1
1
0
0
1
1
1
1
1
0
0
0
0
0
0
0
0
0
0
1
1
1
1
0
1
1
1
1
2LTOth [3 ... 0]
0 0
0
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
1
0
0
1
1
0
1
0
1
0
1
0
1
0
1
Table 36. 2LTOth
2LTO threshold value [V]
7.00
7.50
8.00
8.50
9.00
9.50
10.00
10.50
11.00
11.50
12.00
12.50
13.00
13.50
14.00
14.50
The 2LTOtime parameter sets the duration of the 2-level turn-off sequence (refer to Section 7.10
for details). If the 2LTOtime is set to zero, the 2-level turn-off feature is disabled.
1
1
1
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
0
1
1
0
0
0
0
1
1
1
1
2LTOtime [3 ... 0]
0 0
0
0
0
1
1
0
0
1
1
0
1
1
0
1
0
0
1
CFG4 register (isolated side)
The CFG4 register has the structure of
0
1
0
0
1
0
1
0
1
0
1
1
0
1
0
1
Table 37. 2-level turn-off time value
2-level turn-off time value [μs]
Disabled
0.75
1.00
1.50
2.00
2.50
3.00
3.50
3.75
4.00
4.25
4.50
4.75
5.00
5.25
5.50
DS11974 - Rev 4 page 41/59
9.2.5
STGAP1BS
Register and flag descriptions
-
-
Default/reset
Bit 7
-
-
Bit 6
-
-
Table 38. CFG4 register
Bit 5
OVLO_EN
0
Bit 4
UVLOlatch
0
Bit 3 Bit 2
VLONth
00
Bit 1 Bit 0
VHONth
00
The OVLO_EN bit enables the OVLO protection on the VH and VL power supply according to Table 39
.
OVLO_EN
0
1
Table 39. VH and VL supply voltages OVLO enable
OVLO supply voltage enable
Disabled
Enabled
The UVLOlatch bit sets if the UVLO is latched or not (refer to
UVLOlatch
0
1
Table 40. UVLO protection management
UVLO protection management
UVLO protection is not latched
UVLO protection is latched
The VLONth bits set the UVLO threshold on the negative power supply according to Table 41
.
Setting the parameter to zero disables the UVLO protection of the VL supply.
1
1
0
0
VLONth [1 ... 0]
0
1
0
1
Table 41. VL negative supply voltage UVLO threshold
Negative supply voltage UVLO threshold [V]
Disabled
-3
-5
-7
The VHONth bits set the UVLO threshold on the positive power supply according to Table 42
.
Setting the parameter to zero disables the UVLO protection of the VH supply.
0
1
1
0
VHONth [1 ... 0]
0
1
0
1
Table 42. VH positive supply voltage UVLO threshold
Positive supply voltage UVLO threshold [V]
Disabled
10
12
14
CFG5 register (isolated side)
The CFG5 register has the structure of
DS11974 - Rev 4 page 42/59
9.2.6
STGAP1BS
Register and flag descriptions
-
-
Default/reset
Bit 7 Bit 6
-
-
Table 43. CFG5 register
Bit 5 Bit 4
-
-
Bit 3
2LTO_EN
0
Bit 2
CLAMP_EN
1
Bit 1
DESAT_EN
1
Bit 0
SENSE_EN
0
The 2LTO_EN bit sets when the feature takes place according to
for details.
2LTO_EN
0
1
Table 44. 2LTO mode
2LTO mode
2LTO always active
2LTO active only after a fault event
The 2LTOth bit sets the 2-level turn-off threshold according to
Table 36 and the 2-level turn-off time according to
The SENSE_EN bit sets if the sense overcurrent function is enabled or not (refer to
for details).
SENSE_EN
0
1
Table 45. SENSE comparator enabling
SENSE comparator status
SENSE comparator disabled
SENSE comparator enabled
for details).
DESAT_EN
0
1
Table 46. DESAT comparator enabling
DESAT comparator status
DESAT comparator disabled
DESAT comparator enabled
Set the CLAMP_EN bit to enable the Miller clamp feature (refer to Section 7.9
for details).
CLAMP_EN
0
1
Table 47. Miller clamp feature enabling
Miller clamp feature status
Miller clamp feature disabled
Miller clamp feature enabled
STATUS1 register (low voltage side)
The STATUS1 is a read only register that reports some device failure flags.
All flags are active high (the high value indicates a failure condition). The STATUS1 register has the structure of
DS11974 - Rev 4 page 43/59
9.2.7
STGAP1BS
Register and flag descriptions
Table 48. STATUS1 register
-
-
Reset
Bit 7
OVLOH
0
0
Bit 6
OVLOL
0
0
Bit 5
DESAT
0
0
Bit 4
SENSE
0
0
Bit 3
UVLOH
1
0
Bit 2
UVLOL
0
0
Bit 1
TSD
0
0
Bit 0
TWN
0
0
1. Default value of the local copy of the register. The value will be updated according to the actual information from the isolated side. The default is forced at the device power-up, when the registers are reset all the flags are forced low (no failures).
A description of the STATUS1 register bits is provided in Table 49 .
Table 49. STATUS1 register description
Name Bit Fault
OVLOH 7
OVLOL 6
DESAT 5
SENSE 4
VH overvoltage flag.
It is forced high when VH is over OV
VHoff
threshold.
VL overvoltage flag.
It is forced high when VL is over OV
VLoff
threshold.
Desaturation flag.
It is forced high when DESAT pin voltage reaches
V
DESATth
threshold.
Sense flag.
It is forced high when SENSE pin voltage reaches
V
SENSEth
threshold.
UVLOH 3
VH undervoltage flag.
It is forced high when VH is below VHoff threshold.
Latched
Always
Always
Always
Always
When UVLOlatch is high only
Force
“safe state”
Yes
Yes
Yes
Yes
UVLOL 2
VL undervoltage flag.
It is forced high when VL is over VLoff threshold.
TSD 1
TWN 0
Thermal shutdown protection flag.
It is forced high when overtemperature shutdown threshold is reached.
Thermal warning flag.
It is forced high when overtemperature shutdown threshold is reached.
When
UVLOlatchis high only
No (hysteresis)
No (hysteresis)
Yes
No
Note
-
-
-
-
-
-
Yes
Yes
If not latched
(UVLOlatch low)
UVLOH returns low when VH is over VH on threshold.
If not latched
(UVLOlatch low)
UVLOL returns low when VL is below VL on threshold.
STATUS2 register (low voltage side)
The STATUS2 is a read only register. The STATUS2 register has the structure of
-
-
Bit 7
x
Bit 6
x
Table 50. STATUS2 register
Bit 5
x
Bit 4
x
Bit 3
x
Bit 2
REGERRR
1
Bit 1
ASC
0
Bit 0
GATE
0
DS11974 - Rev 4 page 44/59
9.2.8
STGAP1BS
Register and flag descriptions
-
Reset
Bit 7 x
Bit 6 x
Bit 5 x
Bit 4 x
Bit 3 x
Bit 2
0
Bit 1
0
Bit 0
0
1. Default value of the local copy of the register. The value will be updated according to the actual information from the isolated side. The default is forced at the device power-up, when the registers are reset all the flags are forced low (no failures).
A description of the STATUS2 register bits is provided in Table 51 .
Table 51. STATUS2 register description
Name Bit Fault Latched
Force
“safe state”
REGERRR 2
ASC 1
•
•
•
Register or communication error on isolated side. It is forced high when:
Programming procedure is not correctly performed.
Isolated interface communication fails.
An unexpected register value change occurs in one of the remote registers.
It is also latched at power-up/reset and from Sleep state.
ASC pin status.
When ASC pin is high, the flag reports '1', otherwise it is '0'.
GATE 0
Gate command flag.
Flag is '1' when the requested output status from logic inputs is “ON” and '0' when requested output status is “OFF”.
Always
No
No
Yes
No
No
Note
-
See details in
This bit is not indicated for real-time feedback of external gate status
(
STATUS3 register (low voltage side)
The STATUS3 is a read only register. The STATUS3 register has the structure of
Table 52. STATUS3 register
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
-
Reset
x x
x x
x x
DT_ERR
0
0
SPI_ERR
0
0
REGERRL
1
0
OVLOD
0
0
1. The default is forced at the device power-up, when the registers are reset all the flags are forced low (no failures).
UVLOD
1
0
A description of the STATUS3 register bits is provided in Table 53 .
Name Bit
Table 53. STATUS3 register description
Fault
DT_ERR 4
Deadtime error flag.
This bit is forced high when a violation of internal DT is detected.
SPI_ERR 3 SPI communication error flag.
Latched
Force
“safe state”
Always
Always
No
No
Note
See details in
-
DS11974 - Rev 4 page 45/59
STGAP1BS
Register and flag descriptions
9.2.9
9.2.10
Name Bit Fault
REGERRL 2
OVLOD 1
UVLOD 0
•
•
•
•
It is forced high when the SPI communication fails cause:
Wrong CRC check.
Wrong number of CK rising edges.
Attempt to execute a not-allowed command.
Attempt to read, write or reset at a not- available address.
Register or communication error on low voltage side.
•
•
•
It is forced high when:
Programming procedure is not correctly performed.
Isolated interface communication fails.
An unexpected register value change occurs in one of the remote registers.
It is latched at power-up/reset also.
VDD overvoltage flag.
It is forced high when VDD is over OVVDDoff threshold.
VDD undervoltage flag.
It is forced high when VDD is below VDDon threshold.
It is latched at power-up/reset as well.
TEST1 register (isolated side)
The TEST1 register has the structure of
Latched
Force
“safe state”
Always Yes
Always Yes
Always Yes
-
-
Default/reset
Bit 7
x
Bit 6
x
Bit 5
x
Table 54. TEST1 register
Bit 4
GOFFCHK
0
Bit 3
GONCHK
0
Setting an one check bit of the register enables the respective check mode.
Bit 2
DESCHK
0
Note
-
-
-
Bit 1
SNSCHK
0
Bit 0
RCHK
0
Bit
RCHK
SNSCHK
DESCHK
GONCHK
GOFFCHK
Table 55. Check mode
Check mode
SENSE resistor
SENSE comparator
DESAT comparator
GON to gate path
GOFF to gate path
DIAG1CFG and DIAG2CFG registers (low voltage side)
The DIAG1CFG register has the structure of
-
Bit 7
DIAG1_7
Bit 6
DIAG1_6
Table 56. DIAG1CFG register
Bit 5
DIAG1_5
Bit 4
DIAG1_4
Bit 3
DIAG1_3
Bit 2
DIAG1_2
Bit 1
DIAG1_1
Bit 0
DIAG1_0
DS11974 - Rev 4 page 46/59
DS11974 - Rev 4
STGAP1BS
Register and flag descriptions
-
Default/reset
Bit 7
1
Bit 6
1
Bit 5
0
The DIAG2CFG register has the structure of
Bit 4
1
Bit 3
1
Bit 2
0
Bit 1
1
Bit 0
0
-
-
Default/reset
Bit 7
DIAG2_7
0
Bit 6
DIAG2_6
0
Table 57. DIAG2CFG register
Bit 5
DIAG2_5
0
Bit 4
DIAG2_4
0
Bit 3
DIAG2_3
0
Bit 2
DIAG2_2
0
Bit 1
DIAG2_1
0
Bit 0
DIAG2_0
0
If a bit in the DIAG1CFG register is high, the corresponding fault events turn on the open drain connected to the
DIAG1 pin forcing the output low.
If a bit in the DIAG2CFG register is high and the DIAG_EN bit is high, the corresponding fault events turn on the open drain connected to the DIAG2 pin forcing the output low.
The relationship between the DIAG1CFG and DIAG2CFG register bits and failure events is described in
DIAGxCFG bit
0
1
2
3
6
7
4
5
Table 58. Relation between DIAGxCFG bits and failure conditions
Failure
Thermal warning
Thermal shutdown
ASC feedback
Desaturation and sense detection
Overvoltage failure
Undervoltage failure
VDD power supply failure
SPI communication error or register failure
Status registers bit
TWN
TSD
ASC, DT_ERR
DESAT, SENSE
OVLOH, OVLOL
UVLOH, UVLOL
UVLOD, OVLOD
SPI_ERR, REGERRL, REGERRR page 47/59
10
STGAP1BS
Typical application diagram
Typical application diagram
Figure 27. Typical application diagram in half-bridge configuration
DS11974 - Rev 4
Refer to
for the connection of the VCECLAMP pin.
page 48/59
11
11.1
STGAP1BS
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages, depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product status are available at: www.st.com
. ECOPACK is an ST trademark.
SO24W package information
Figure 28. SO24W package outline
D hx45°
B
24 13
SEATING
PLANE
1 12 L e
Table 59. SO24W package mechanical data
Symbol
Dimensions (mm)
-
-
-
1.27
Typ.
-
-
-
-
-
-
-
-
Max.
2.65
0.30
0.51
0.32
15.60
7.60
-
10.65
0.75
1.27
8
0.10
Notes e
H
D
E h
L
K ddd
A
A1
B
C
Min.
2.35
0.10
0.33
0.23
15.20
7.40
0.25
0.40
0
-
-
10.00
-
-
-
-
-
Degrees
-
-
-
-
-
1. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusions or gate burrs shall not exceed
0.15 mm per side.
DS11974 - Rev 4 page 49/59
Figure 29. SO24W suggested land pattern
STGAP1BS
SO24W package information
DS11974 - Rev 4 page 50/59
STGAP1BS
Ordering information
12
Ordering information
Order code
STGAP1BS
STGAP1BSTR
Table 60. Device summary
Package
SO24W
SO24W
Packing
Tube
Tape and reel
DS11974 - Rev 4 page 51/59
Revision history
Date
06-Oct-2021
Table 61. Document revision history
Version
4
Changes
Cover package updated
STGAP1BS
DS11974 - Rev 4 page 52/59
STGAP1BS
Contents
Contents
DS11974 - Rev 4 page 53/59
STGAP1BS
Contents
DS11974 - Rev 4 page 54/59
STGAP1BS
Contents
DS11974 - Rev 4 page 55/59
STGAP1BS
List of figures
List of figures
DS11974 - Rev 4 page 56/59
STGAP1BS
List of tables
List of tables
DS11974 - Rev 4 page 57/59
STGAP1BS
List of tables
DS11974 - Rev 4 page 58/59
STGAP1BS
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DS11974 - Rev 4 page 59/59
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