NXP i.MX516 Applications Processors - Multimedia, High Performance, Low Power, Connectivity, Arm® Cortex®-A8 Core Data Sheet
Reklama
Reklama
Freescale Semiconductor
Data Sheet: Technical Data
Document Number: IMX51AEC
Rev. 6,
10/2012
IMX51A i.MX51A Automotive and
Infotainment Applications
Processors
Package Information
Plastic Package
Case 2017 19 x 19 mm, 0.8 mm pitch
Ordering Information
for ordering information.
1 Introduction
The MCIMX51A (i.MX51A) Automotive Infotainment
Processor represents Freescale Semiconductor’s latest addition to a growing family of multimedia focused products offering high performance processing with a high degree of functional integration, aimed at the growing automotive infotainment market. This device includes two graphics processors, 720p video processing, dual display, and many I/Os.
The i.MX51A processor features Freescale’s advanced implementation of the ARM Cortex A8™ core, targeting speeds up to 600 MHz with 200 MHz I/O bus clock
DDR2 and mobile DDR. This device is well-suited for graphics rendering for HMI and navigation, high performance speech processing with large databases, video processing and display, audio playback and ripping, and many other applications.
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 2
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Special Signal Considerations . . . . . . . . . . . . . . . 11
IOMUX Configuration for Boot Media . . . . . . . . . . . . . . . 13
NAND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
SD/MMC IOMUX Pin Configuration . . . . . . . . . . . 14
C IOMUX Pin Configuration . . . . . . . . . . . . . . . . 14
eCSPI/CSPI IOMUX Pin Configuration . . . . . . . . 15
Wireless External Interface Module (WEIM) . . . . 15
UART IOMUX Pin Configuration . . . . . . . . . . . . . 15
USB-OTG IOMUX Pin Configuration . . . . . . . . . . 15
Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 16
Chip-Level Conditions . . . . . . . . . . . . . . . . . . . . . 16
Supply Power-Up/Power-Down Requirements and
Restrictions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
I/O DC Parameters . . . . . . . . . . . . . . . . . . . . . . . . 22
Output Buffer Impedance Characteristics . . . . . . 29
I/O AC Parameters . . . . . . . . . . . . . . . . . . . . . . . . 33
Module Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
External Peripheral Interfaces . . . . . . . . . . . . . . . 72
Package Information and Contact Assignments . . . . . 151
19 x 19 mm Package Information . . . . . . . . . . . . 151
19 x 19 mm, 0.8 Pitch Ball Map . . . . . . . . . . . . . 169
Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 173
© 2012 Freescale Semiconductor, Inc. All rights reserved.
Introduction
Features of the i.MX51A processor include the following:
• Smart Speed Technology—The i.MX51A device has power management throughout the IC that enables the rich suite of multimedia feature and peripherals to achieve minimum power consumption in both active and various low power modes. Smart Speed Technology enables the designer to deliver a feature-rich product that requires levels of power that are far less than industry expectations.
• Multimedia—The multimedia performance of the ARM Cortex A8 is enhanced with a multi-level cache system, a Multi-standard Hardware Video CODECs, autonomous image processing unit, multi-standard audio CODECs, Neon (an advanced SIMD, 32 bit single-precision floating point support and vector floating point co-processor), and a programmable smart DMA controller.
• Powerful Graphics Acceleration—The i.MX51A processor has an integrated Graphics Processing
Unit which includes an OpenGl 2.0 GPU that provides 27Mtri/sec, 166Mpix/s, and 664Mpix/s z-plane performance. Silicon version 2.0 of the i.MX51A device includes an independent OpenVG
GPU operating at166Mpix/s.
• Interface Flexibility—The i.MX51A processor supports connections to all popular types of external memories: mobile DDR, DDR2, PSRAM, NOR Flash, NAND Flash (MLC and SLC), and
OneNAND (managed NAND). The i.MX51A processor also includes a rich multimedia suite of interfaces: LCD controller for two displays, CMOS sensor interface, High-Speed USB On-The-Go plus three High-Speed USB hosts, high-speed MMC/SDIO, Fast Ethernet controller, UART, I2C,
I2S (SSI), and others.
1.1
Ordering Information
provides the ordering information.
Table 1. Ordering Information
Part Number
MCIMX514AJM6C
MCIMX516AJM6C
Mask Set Features
M77X No hardware video codecs
M77X Full specification
Junction
Temperature
Range (
°
C)
Package
1
–40 to 125 19 x 19 mm, 0.8 mm pitch BGA
Case 2017
–40 to 125 19 x 19 mm, 0.8 mm pitch BGA
Case 2017
1
Case 2017 and Case 2058 are RoHS compliant, lead-free, MSL = 3.
2 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
1.2
Block Diagram
shows the functional modules of the processor.
Digital
Audio
DDR
Memory
NOR/Nand
Flash
Battery Ctrl
Device
USB
Dev/Host
Camera 1
Camera 2
LCD Display 1
LCD Display 2
ATA HDD
External
Memory I/F
Smart DMA
(SDMA)
SPBA
SDMA Peripherals eSDHC (4)
UART
SPDIF Tx
FEC
SSI eCSPI (1 of 2)
SIM
P-ATA
Fuse Box
USB PHY
USB OTG +
3 HS Ports
Internal
RAM
(128 Kbytes)
Boot
ROM
Security
SAHARA
Lite
RTIC
SCC
SRTC
CSU
TZIC
Application Processor Domain (AP)
TV Encoder
Image Processing
Subsystem
ARM Cortex A8
Platform
ARM Cortex A8
Neon and VFP
L1 I/D cache
L2 cache
ETM, CTI0,1
Video
Proc. Unit
(VPU)
AP Peripherals eCSPI (2 )
CSPI
UART (3)
AUDMUX
I
2
C(2),HSI
2
C
1-WIRE
PWM (2)
IIM
IOMUXC
KPP
GPIOx32 (4)
SJC
SSI (3)
FIRI
3D Graphics
Proc Unit
(GPU)
Debug
DAP
TPIU
CTI (2)
Timers
WDOG (2)
GPT
EPIT (2)
Graphics
Memory
(128 Kbytes)
2D Graphics
Proc Unit
(GPU2D)
Clock and Reset
PLL (3)
CCM
GPC
SRC
XTALOSC
CAMP (2)
JTAG
IrDA
XVR
Bluetooth
WLAN
USB-OTG
XVR
MMC/SDIO Keypad
Access.
Conn.
Figure 1. Functional Block Diagram
Introduction
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
3
4
Features
2 Features
The i.MX51A processor contains a large number of digital and analog modules that are described in
Table 2. i.MX51A Digital and Analog Modules
Block
Mnemonic
Block Name Subsystem Brief Description
1-WIRE
Audio
Subsystem
AUDMUX
CCM
GPC
SRC
CSPI-1, eCSPI-2 eCSPI-3
CSU
Debug
System
1-Wire
Interface
ARM
Cortex™-A8
ARM
Cortex™-A8
Platform
Audio
Subsystem
Digital Audio
Mux
Connectivity
Peripherals
ARM
Multimedia
Peripherals
Multimedia
Peripherals
1-Wire support provided for interfacing with an on-board EEPROM, and smart battery interfaces, for example: Dallas DS2502.
The ARM Cortex™-A8 Core Platform consists of the ARM Cortex™-A8 processor version r2p5 (with TrustZone) and its essential sub-blocks. It contains the Level 2 Cache Controller, 32 Kbyte L1 instruction cache, 32 Kbyte L1 data cache, and a 256 Kbyte L2 cache. The platform also contains an Event Monitor and Debug modules. It also has a NEON co-processor with SIMD media processing architecture, register file with 32
× 64-bit general-purpose registers, an Integer execute pipeline (ALU, Shift, MAC), dual, single-precision floating point execute pipeline (FADD, FMUL), load/store and permute pipeline and a
Non-Pipelined Vector Floating Point (VFP) co-processor (VFPv3).
The elements of the audio subsystem are three Synchronous Serial Interfaces
(SSI1-3), a Digital Audio Mux (AUDMUX), and Digital Audio Out (SPDIF TX).
See the specific interface listings in this table.
The AUDMUX is a programmable interconnect for voice, audio, and synchronous data routing between host serial interfaces (for example, SSI1,
SSI2, and SSI3) and peripheral serial interfaces (audio and voice codecs). The
AUDMUX has seven ports (three internal and four external) with identical functionality and programming models. A desired connectivity is achieved by configuring two or more AUDMUX ports.
Clock Control
Module
Global Power
Controller
System Reset
Controller
Clocks,
Resets, and
Power Control
These modules are responsible for clock and reset distribution in the system, and also for system power management. The modules include three PLLs and a Frequency Pre-Multiplier (FPM).
Configurable
SPI,
Enhanced
CSPI
Connectivity
Peripherals
Full-duplex enhanced Synchronous Serial Interface, with data rate up to
66.5 Mbit/s (for eCSPI, master mode). It is configurable to support Master/Slave modes, four chip selects to support multiple peripherals.
Central
Security Unit
Debug
System
Security
System
Control
The Central Security Unit (CSU) is responsible for setting comprehensive security policy within the i.MX51 platform, and for sharing security information between the various security modules. The Security Control Registers (SCR) of the CSU are set during boot time by the High Assurance Boot (HAB) code and are locked to prevent further writing.
The Debug System provides real-time trace debug capability of both instructions and data. It supports a trace protocol that is an integral part of the ARM Real
Time Debug solution (RealView). Real-time tracing is controlled by specifying a set of triggering and filtering resources, which include address and data comparators, cross-system triggers, counters, and sequencers. i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Features
Table 2. i.MX51A Digital and Analog Modules (continued)
Block
Mnemonic
EMI
EPIT-1
EPIT-2 eSDHC-1 eSDHC-2 eSDHC-3
Block Name Subsystem Brief Description
External
Memory
Interface
Enhanced
Periodic
Interrupt
Timer
Connectivity
Peripherals
Timer
Peripherals
Enhanced
Multi-Media
Card/
Secure Digital
Host
Controller
Connectivity
Peripherals
The EMI is an external and internal memory interface. It performs arbitration between multi-AXI masters to multi-memory controllers, divided into four major channels: fast memories (Mobile DDR, DDR2) channel, slow memories
(NOR-FLASH/PSRAM/NAND-FLASH and so on) channel, internal memory
(RAM, ROM) channel and graphical memory (GMEM) Channel.
In order to increase the bandwidth performance, the EMI separates the buffering and the arbitration between different channels so parallel accesses can occur.
By separating the channels, slow accesses do not interfere with fast accesses.
EMI features:
• 64-bit and 32-bit AXI ports
• Enhanced arbitration scheme for fast channel, including dynamic master priority, and taking into account which pages are open or closed and what type (Read or Write) was the last access
• Flexible bank interleaving
• Supports 16/32-bit Mobile DDR up to 200 MHz SDCLK (mDDR400)
• Supports 16/32-bit (Non-Mobile) DDR2 up to 200 MHz SDCLK (DDR2-400)
• Supports up to 2 Gbit Mobile DDR memories
• Supports 16-bit (in muxed mode only) PSRAM memories (sync and async operating modes), at slow frequency, for debugging purposes
• Supports 32-bit NOR-Flash memories (only in muxed mode), at slow frequencies for debugging purposes
• Supports 4/8-ECC, page sizes of 512 Bytes, 2 Kbytes and 4 Kbytes
• NAND-Flash (including MLC)
• Multiple chip selects
• Enhanced Mobile DDR memory controller, supporting access latency hiding
• Supports watermarking for security (Internal and external memories)
• Supports Samsung OneNAND ™ (only in muxed I/O mode)
Each EPIT is a 32-bit “set and forget” timer that starts counting after the EPIT is enabled by software. It is capable of providing precise interrupts at regular intervals with minimal processor intervention. It has a 12-bit prescaler for division of input clock frequency to get the required time setting for the interrupts to occur, and counter values can be programmed on the fly.
The features of the eSDHC module, when serving as host, include the following:
• Conforms to SD Host Controller Standard Specification version 2.0
• Compatible with the MMC System Specification version 4.2
• Compatible with the SD Memory Card Specification version 2.0
• Compatible with the SDIO Card Specification version 1.2
• Designed to work with SD Memory, miniSD Memory, SDIO, miniSDIO, SD
Combo, MMC and MMC RS cards
• Configurable to work in one of the following modes:
—SD/SDIO 1-bit, 4-bit
—MMC 1-bit, 4-bit, 8-bit
• Full-/high-speed mode
• Host clock frequency variable between 32 kHz to 52 MHz
• Up to 200 Mbps data transfer for SD/SDIO cards using four parallel data lines
• Up to 416 Mbps data transfer for MMC cards using eight parallel data lines
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
5
Features
Table 2. i.MX51A Digital and Analog Modules (continued)
Block
Mnemonic
Block Name Subsystem Brief Description eSDHC-4
(muxed with
P-ATA)
Enhanced
Multi-Media
Card/
Secure Digital
Host
Controller
Connectivity
Peripherals
FEC Fast Ethernet
Controller
Connectivity
Peripherals
FIRI
Can be configured as eSDHC (see above) and is muxed with the P-ATA interface.
Connectivity
Peripherals
The Ethernet Media Access Controller (MAC) is designed to support both
10 Mbps and 100 Mbps ethernet/IEEE Std 802.3™ networks. An external transceiver interface and transceiver function are required to complete the interface to the media.
Fast Infra-Red Interface
GPIO-1
GPIO-2
GPIO-3
GPIO-4
GPT
Fast
Infra-Red
Interface
General
Purpose I/O
Modules
General
Purpose
Timer
System
Control
Peripherals
Timer
Peripherals
These modules are used for general purpose input/output to external ICs. Each
GPIO module supports up to 32 bits of I/O.
GPU2D
I
I
GPU
2
2
C-1
C-2
HS-I
2
C
I
Graphics
Processing
Unit
Graphics
Processing
Unit-2D Ver. 1
2
C Interface
Multimedia
Peripherals
Multimedia
Peripherals
Connectivity
Peripherals
Each GPT is a 32-bit “free-running” or “set and forget” mode timer with a programmable prescaler and compare and capture register. A timer counter value can be captured using an external event, and can be configured to trigger a capture event on either the leading or trailing edges of an input pulse. When the timer is configured to operate in “set and forget” mode, it is capable of providing precise interrupts at regular intervals with minimal processor intervention. The counter has output compare logic to provide the status and interrupt at comparison. This timer can be configured to run either on an external clock or on an internal clock.
The GPU provides hardware acceleration for 2D and 3D graphics algorithms with sufficient processor power to run desk-top quality interactive graphics applications on displays up to HD720 resolution. It supports color representation up to 32 bits per pixel.
The GPU with its 128 KByte memory enables high performance mobile 3D and
2D vector graphics at rates up to 27 Mtriangles/sec, 166 Mpixels/sec,
664 Mpixels/sec (Z).
The GPU2D provides hardware acceleration for 2D graphic algorithms with sufficient processor power to run desk-top quality interactive graphics applications on displays up to HD720 resolution.
I
2
C provides serial interface for controlling peripheral devices. Data rates of up to 400 Kbps are supported by two of the I
(I
2
2
C ports. Data rates of up to 3.4 Mbps
C Specification v2.1) are supported by the HS-I
2
C.
Note: See the errata for the HS-I
2
C in the i.MX51 Chip Errata. The two standard
I
2
C modules have no errata.
6 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Features
Table 2. i.MX51A Digital and Analog Modules (continued)
Block
Mnemonic
IIM
Block Name Subsystem
IC
Identification
Module
Security
IOMUXC
IPU
IOMUX
Control
Image
Processing
Unit
System
Control
Peripherals
Multimedia
Peripherals
Brief Description
The IC Identification Module (IIM) provides an interface for reading, programming, and/or overriding identification and control information stored in on-chip fuse elements. The module supports electrically programmable poly fuses (e-Fuses). The IIM also provides a set of volatile software-accessible signals that can be used for software control of hardware elements not requiring non-volatility. The IIM provides the primary user-visible mechanism for interfacing with on-chip fuse elements. Among the uses for the fuses are unique chip identifiers, mask revision numbers, cryptographic keys, JTAG secure mode, boot characteristics, and various control signals requiring permanent non-volatility. The IIM also provides up to 28 volatile control signals. The IIM consists of a master controller, a software fuse value shadow cache, and a set of registers to hold the values of signals visible outside the module.
This module enables flexible I/O multiplexing. Each I/O pad has default as well as several alternate functions. The alternate functions are software configurable.
IPU enables connectivity to displays and image sensors, relevant processing and synchronization. It supports two display ports and two camera ports, through the following interfaces.
• Legacy Interfaces
• Analog TV interfaces (through a TV encoder bridge)
KPP
P-ATA (Muxed with eSDHC-4
Parallel ATA Connectivity
Peripherals
PWM-1
PWM-2
Keypad Port Connectivity
Peripherals
Pulse Width
Modulation
Connectivity
Peripherals
The processing includes:
• Support for camera control
• Image enhancement: color adjustment and gamut mapping, gamma correction and contrast enhancement, sharpening and noise reduction
• Video/graphics combining
• Support for display backlight reduction
• Image conversion—resizing, rotation, inversion and color space conversion
• Synchronization and control capabilities, allowing autonomous operation.
• Hardware de-interlacing support
The KPP supports an 8
× 8 external keypad matrix. The KPP features are as follows:
• Open drain design
• Glitch suppression circuit design
• Multiple keys detection
• Standby key press detection
The P-ATA block is an AT attachment host interface. Its main use is to interface with hard disc drives and optical disc drives. It interfaces with the ATA-5
(UDMA-4) compliant device over a number of ATA signals. It is possible to connect a bus buffer between the host side and the device side. This is muxed with eSDHC-4 interfaces.
The pulse-width modulator (PWM) has a 16-bit counter and is optimized to generate sound from stored sample audio images. It can also generate tones.
The PWM uses 16-bit resolution and a 4 x 16 data FIFO to generate sound.
Unified RAM, can be split between Secure RAM and Non-Secure RAM RAM
128 Kbytes
ROM
36 Kbytes
Internal RAM Internal
Memory
Boot ROM Internal
Memory
Supports secure and regular Boot Modes
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
7
Features
Table 2. i.MX51A Digital and Analog Modules (continued)
Block
Mnemonic
Block Name Subsystem Brief Description
RTIC
SAHARA Lite SAHARA
SCC
SDMA
SIM
Real Time
Integrity
Checker security accelerator
Lite
Security
Controller
Smart Direct
Memory
Access
Subscriber
Identity
Module
Interface
Security
Security
Security
System
Control
Peripherals
Connectivity
Peripherals
Protecting read-only data from modification is one of the basic elements in trusted platforms. The Run-Time Integrity Checker v3 (RTICv3) module, is a data monitoring device responsible for ensuring that memory content is not corrupted during program execution. The RTICv3 mechanism periodically checks the integrity of code or data sections during normal OS run-time execution without interfering with normal operation. The RTICv3’s purpose is to ensure the integrity of the peripheral memory contents, protect against unauthorized external memory elements replacement, and assist with boot authentication.
SAHARA (Symmetric/Asymmetric Hashing and Random Accelerator) is a security co-processor. It implements symmetric encryption algorithms, (AES,
DES, 3DES, and RC4), public key algorithms, hashing algorithms (MD5, SHA-1,
SHA-224, and SHA-256), and a hardware random number generator. It has a slave IP bus interface for the host to write configuration and command information, and to read status information. It also has a DMA controller, with an
AHB bus interface, to reduce the burden on the host to move the required data to and from memory.
The Security Controller is a security assurance hardware module designed to safely hold sensitive data such as encryption keys, digital right management
(DRM) keys, passwords, and biometrics reference data. The SCC monitors the system’s alert signal to determine if the data paths to and from it are secure—that is, cannot be accessed from outside of the defined security perimeter. If not, it erases all sensitive data on its internal RAM. The SCC also features a Key Encryption Module (KEM) that allows non-volatile (external memory) storage of any sensitive data that is temporarily not in use. The KEM utilizes a device-specific hidden secret key and a symmetric cryptographic algorithm to transform the sensitive data into encrypted data.
The SDMA is multi-channel flexible DMA engine. It helps in maximizing system performance by off loading various cores in dynamic data routing.
The SDMA features list is as follows:
• Powered by a 16-bit instruction-set micro-RISC engine
• Multi-channel DMA supports up to 32 time-division multiplexed DMA channels
• 48 events with total flexibility to trigger any combination of channels
• Memory accesses including linear, FIFO, and 2D addressing
• Shared peripherals between ARM Cortex™-A8 and SDMA
• Very fast context-switching with two-level priority-based preemptive multi-tasking
• DMA units with auto-flush and prefetch capability
• Flexible address management for DMA transfers (increment, decrement, and no address changes on source and destination address)
• DMA ports can handle unit-directional and bi-directional flows (copy mode)
• Up to 8-word buffer for configurable burst transfers for EMI
• Support of byte-swapping and CRC calculations
• A library of scripts and API are available
The SIM is an asynchronous interface with additional features for allowing communication with Smart Cards conforming to the ISO 7816 specification. The
SIM is designed to facilitate communication to SIM cards or pre-paid phone cards.
8 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Features
Table 2. i.MX51A Digital and Analog Modules (continued)
Block
Mnemonic
SJC
Block Name Subsystem
Secure JTAG
Interface
System
Control
Peripherals
Brief Description
JTAG manipulation is a known hacker’s method of executing unauthorized program code, getting control over secure applications, and running code in privileged modes. The JTAG port provides a debug access to several hardware blocks including the ARM processor and the system bus.
SPBA
SPDIF
SRTC
SSI-1
SSI-2
SSI-3
TVE
The JTAG port must be accessible during platform initial laboratory bring-up, manufacturing tests and troubleshooting, as well as for software debugging by authorized entities. However, in order to properly secure the system, unauthorized JTAG usage should be strictly forbidden.
In order to prevent JTAG manipulation while allowing access for manufacturing tests and software debugging, the i.MX51A processor incorporates a mechanism for regulating JTAG access. The i.MX51A Secure JTAG Controller provides four different JTAG security modes that can be selected via e-fuse configuration.
SPBA (Shared Peripheral Bus Arbiter) is a two-to-one IP bus interface (IP bus) arbiter.
Shared
Peripheral
Bus Arbiter
Sony Philips
Digital
Interface
System
Control
Peripherals
Multimedia
Peripherals
Secure Real
Time Clock
Security
A standard digital audio transmission protocol developed jointly by the Sony and
Philips corporations. Only the transmitter functionality is supported.
I2S/SSI/AC97
Interface
Connectivity
Peripherals
TV Encoder Multimedia
The SRTC incorporates a special System State Retention Register (SSRR) that stores system parameters during system shutdown modes. This register and all
SRTC counters are powered by dedicated supply rail NVCC_SRTC_POW. The
NVCC_SRTC_POW can be energized even if all other supply rails are shut down. The power for this block comes from NVCC_SRTC_POW supply. When this supply is driven by the MC13892 power management controller, this block can be power backed up via the coin-cell feature of the MC13892.This register is helpful for storing warm boot parameters. The SSRR also stores the system security state. In case of a security violation, the SSRR mark the event (security violation indication).
The SSI is a full-duplex synchronous interface used on the i.MX51A processor to provide connectivity with off-chip audio peripherals. The SSI interfaces connect internally to the AUDMUX which interfaces to the i.MX51 system memory. The SSI supports a wide variety of protocols (SSI normal, SSI network,
I2S, and AC-97), bit depths (up to 24 bits per word), and clock/frame sync options.
Each SSI has two pairs of 8x24 FIFOs and hardware support for an external
DMA controller in order to minimize its impact on system performance. The second pair of FIFOs provides hardware interleaving of a second audio stream, which reduces CPU overhead in use cases where two timeslots are being used simultaneously.
The TVE is implemented in conjunction with the Image Processing Unit (IPU) allowing handheld devices to display captured still images and video directly on a TV or LCD projector. It supports the following analog video outputs: composite, S-video, and component video up to HD720p/1080i.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
9
Features
Table 2. i.MX51A Digital and Analog Modules (continued)
Block
Mnemonic
Block Name Subsystem Brief Description
TZIC
UART-1
UART-2
UART-3
USB
VPU
WDOG-1
TrustZone
Aware
Interrupt
Controller
UART
Interface
USB 2.0
High-Speed
OTG and 3x
Hosts
Video
Processing
Unit
ARM/Control The TrustZone Interrupt Controller (TZIC) collects interrupt requests from all i.MX51 sources and routes them to the ARM core. Each interrupt can be configured as a normal or a secure interrupt. Software Force Registers and software Priority Masking are also supported.
Connectivity
Peripherals
Each of the UART modules supports the following serial data transmit/receive protocols and configurations:
• 7 or 8 bit data words, 1 or 2 stop bits, programmable parity (even, odd, or none)
• Programmable baud rates up to 4 MHz. This is a higher max baud rate relative to the 1.875 MHz, which is stated by the TIA/EIA-232-F standard and previous Freescale UART modules.
• 32-byte FIFO on Tx and 32 half-word FIFO on Rx supporting auto-baud
• IrDA 1.0 support (up to SIR speed of 115200 bps)
• Option to operate as 8-pins full UART, DCE, or DTE
Connectivity
Peripherals
Multimedia
Peripherals
USB-OTG contains one high-speed OTG module, which is internally connected to the on-chip HS USB PHY. There are an additional three high-speed host modules that require external USB PHYs.
Watch Dog Timer
Peripherals
A high-performing video processing unit (VPU), which covers many SD-level video decoders and SD-level encoders as a multi-standard video codec engine as well as several important video processing such as rotation and mirroring.
VPU Features:
• MPEG-4 decode: 720p, 30 fps, simple profile and advanced simple profile
• MPEG-4 encode: D1, 25/30 fps, simple profile
• H.263 decode: 720p, 30 fps, profile 3
• H.263 encode: D1, 25/30 fps, profile 3
• H.264 decode: 720p, 30 fps, baseline, main, and high profile
• H.264 encode: D1, 25/30 fps, baseline profile
• MPEG-2 decode: 720p, 30 fps, MP-ML
• MPEG-2 encode: D1, 25/30 fps, MP-ML (in software with partial acceleration in hardware)
• VC-1 decode: 720p, 30 fps, simple, main, and advanced profile
• DivX decode: 720p, 30 fps versions 3, 4, and 5
• RV10 decode: 720p, 30 fps
• MJPEG decode: 32 Mpix/s
• MJPEG encode: 64 Mpix/s
The Watch Dog Timer supports two comparison points during each counting period. Each of the comparison points is configurable to evoke an interrupt to the
ARM core, and a second point evokes an external event on the WDOG line.
10 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Features
Table 2. i.MX51A Digital and Analog Modules (continued)
Block
Mnemonic
WDOG-2
(TZ)
Block Name
Watch Dog
(TrustZone)
Subsystem
Timer
Peripherals
XTALOSC Crystal
Oscillator I/F
Clocking
Brief Description
The TrustZone Watchdog (TZ WDOG) timer module protects against TrustZone starvation by providing a method of escaping normal mode and forcing a switch to the TZ mode. TZ starvation is a situation where the normal OS prevents switching to the TZ mode. This situation should be avoided, as it can compromise the system’s security. Once the TZ WDOG module is activated, it must be serviced by TZ software on a periodic basis. If servicing does not take place, the timer times out. Upon a time-out, the TZ WDOG asserts a TZ mapped interrupt that forces switching to the TZ mode. If it is still not served, the TZ
WDOG asserts a security violation signal to the CSU. The TZ WDOG module cannot be programmed or deactivated by a normal mode SW.
The XTALOSC module allows connectivity to an external crystal.
2.1
Special Signal Considerations
The package contact assignments are found in
Section 5, “Package Information and Contact
Signal descriptions are defined in the i.MX51 Multimedia Applications Processor
Reference Manual (MCIMX51RM).
Table 3. Special Signal Considerations
Signal Name
CKIH1, CKIH2
CLK_SS
COMP
FASTR_ANA and
FASTR_DIG
GPANAIO
Remarks
Inputs feeding CAMPs (Clock Amplifiers) that have on-chip ac coupling precluding the need for external coupling capacitors. The CAMPs are enabled by default, but the main clocks feeding the on-chip clock tree are sourced from XTAL/EXTAL by default. Optionally, the use of a low jitter external oscillators to feed CKIH1 or CKIH2 (while not required) can be an advantage if low jitter or special frequency clock sources are required by modules driven by CKIH1 or CKIH2. See CCM chapter in the i.MX51 Multimedia Applications Processor Reference Manual (MCIMX51RM) for details on the respective clock trees.
After initialization, the CAMPs could be disabled (if not used) by CCM registers (CCR CAMPx_EN field). If disabled, the on-chip CAMP output is low; the input is irrelevant. If unused, the user should tie CKIH1/CKIH2 to GND for best practice.
Clock Source Select is the input that selects the default reference clock source providing input to the DPLLs. To use a reference in the megahertz range per Table 8, tie CLK_SS to GND to select
EXTAL/XTAL. To use a reference in the kilohertz range per Table 59, tie CLK_SS to NVCC_PER3 to select CKIL. After initialization, the reference clock source can be changed (initial setting is overwritten).
Note: Because this input has a keeper circuit, Freescale recommends tying this input to directly to GND or NVCC_PER3. If a series resistor is used its value must be
≤
4.7 k
Ω.
The user should bypass this reference with an external 0.1 µ F capacitor tied to GND. If TV OUT is not used, float the COMP contact and ensure the DACs are powered down.
Note: Previous engineering samples required this reference to be bypassed to a positive supply.
These signals are reserved for Freescale manufacturing use only. User must tie both connections to GND.
This signal is reserved for Freescale manufacturing use only. Users should float this output.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
11
Features
Table 3. Special Signal Considerations (continued)
Signal Name
GPIO_NAND
IOB, IOG, IOR,
IOB_BACK, IOG_BACK, and IOR_BACK
JTAG_ nnnn
NC
PMIC_INT_REQ
POR_B
RESET_IN_B
RREFEXT
SGND, SVCC, and
SVDDGP
STR
TEST_MODE
Remarks
This is a general-purpose input/output (GPIO3_12) on the NVCC_NANDF_A power rail.
These signals are analog TV outputs that should be tied to GND when not being used.
The JTAG interface is summarized in
Table 4 . Use of external resistors is unnecessary. However,
if external resistors are used, the user must ensure that the on-chip pull-up/down configuration is followed. For example, do not use an external pull down on an input that has on-chip pull-up.
JTAG_TDO is configured with a keeper circuit such that the floating condition is eliminated if an external pull resistor is not present. An external pull resistor on JTAG_TDO is detrimental and should be avoided.
JTAG_MOD is referenced as SJC_MOD in the i.MX51 Multimedia Applications Processor
Reference Manual (MCIMX51RM). Both names refer to the same signal. JTAG_MOD must be externally connected to GND for normal operation. Termination to GND through an external pull-down resistor (such as 1 k
Ω) is allowed.
These signals are No Connect (NC) and should be floated by the user.
When using the MC13892 power management IC, the PMIC_INT_REQ high-priority interrupt input on i.MX51 should be either floated or tied to NVCC_SRTC_POW with a 4.7 k
Ω to 68 kΩ resistor.
This avoids a continuous current drain on the real-time clock backup battery due to a 100 k
Ω on-chip pull-up resistor.
PMIC_INT_REQ is not used by the Freescale BSP (board support package) software. The BSP requires that the general-purpose INT output from the MC13892 be connected to the i.MX51 GPIO input GPIO1_8 configured to cause an interrupt that is not high-priority.
The original intent was for PMIC_INT_REQ to be connected to a circuit that detects when the battery is almost depleted. In this case, the I/O must be configured as alternate mode 0 (ALT0 = power fail).
This cold reset negative logic input resets all modules and logic in the IC.
Note: The POR_B input must be immediately asserted at power-up and remain asserted until after the last power rail is at its working voltage.
This warm reset negative logic input resets all modules and logic except for the following:
• Test logic (JTAG, IOMUXC, DAP)
• SRTC
• Memory repair – Configuration of memory repair per fuse settings
• Cold reset logic of WDOG – Some WDOG logic is only reset by POR_B. See WDOG chapter in i.MX51 Multimedia Applications Processor Reference Manual (MCIMX51RM) for details.
Determines the reference current for the USB PHY bandgap reference. An external 6.04 k
Ω 1% resistor to GND is required.
These sense lines provide the ability to sense actual on-chip voltage levels on their respective supplies. SGND monitors differentials of the on-chip ground versus an external power source.
SVCC monitors on-chip VCC, and SVDDGP monitors VDDGP. Freescale recommends connection of the SVCC and SVDDGP signals to the feedback inputs of switching power-supplies or to test points.
This signal is reserved for Freescale manufacturing use. The user should float this signal.
TEST_MODE is for Freescale factory use only. This signal is internally connected to an on-chip pull-down device. Users must either float this signal or tie it to GND.
12 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
VREF
Signal Name
VREFOUT
VREG
XTAL/EXTAL
JTAG
JTAG_TCK
JTAG_TMS
JTAG_TDI
JTAG_TDO
JTAG_TRSTB
JTAG_DE_B
JTAG_MOD
IOMUX Configuration for Boot Media
Table 3. Special Signal Considerations (continued)
Remarks
When using VREF with DDR-2 I/O, the nominal 0.9 V reference voltage must be half of the
NVCC_EMI_DRAM supply. The user must tie VREF to a precision external resistor divider. Use a
1 k
Ω 0.5% resistor to GND and a 1 kΩ 0.5% resistor to NVCC_EMI_DRAM. Shunt each resistor with a closely-mounted 0.1 µF capacitor.
To reduce supply current, a pair of 1.5 k
Ω 0.1% resistors can be used. Using resistors with recommended tolerances ensures the ± 2% VREF tolerance (per the DDR-2 specification) is maintained when four DDR-2 ICs plus the i.MX51 are drawing current on the resistor divider.
Note: When VREF is used with mDDR this signal must be tied to GND.
This signal determines the Triple Video DAC (TVDAC) reference voltage. The user must tie
VREFOUT to an external 1.05 k
Ω 1% resistor to GND.
This regulator is no longer used and should be floated by the user.
The user should tie a fundamental-mode crystal across XTAL and EXTAL. The crystal must be rated for a maximum drive level of 100
μ
W or higher. An ESR (equivalent series resistance) of
80
Ω or less is recommended. Freescale BSP (Board Support Package) software requires 24 MHz on EXTAL.
The crystal can be eliminated if an external 24 MHz oscillator is available. In this case, EXTAL must be directly driven by the external oscillator and XTAL is floated. The EXTAL signal level must swing from NVCC_OSC to GND. If the clock is used for USB, then there are strict jitter requirements: < 50 ps peak-to-peak below 1.2 MHz and < 100 ps peak-to-peak above 1.2 MHz for the USB PHY. The
COSC_EN bit in the CCM (Clock Control Module) must be cleared to put the on-chip oscillator circuit in bypass mode which allows EXTAL to be externally driven. COSC_EN is bit 12 in the CCR register of the CCM.
Table 4. JTAG Controller Interface Summary
I/O Type
Input
Input
Input
3-state output
Input
Input/open-drain output
Input
On-Chip Termination
100 k
Ω pull-down
47 k
Ω pull-up
47 k
Ω pull-up
Keeper
47 k
Ω pull-up
47 k
Ω pull-up
100 k
Ω pull-up
3 IOMUX Configuration for Boot Media
The information provided in this section describes the contacts assigned for each type of bootable media.
It also includes data about the clocks used during boot flow and their frequencies. Signals that can be multiplexed appear in tables throughout this section. See the IOMUXC chapter in the i.MX51 Multimedia
Applications Processor Reference Manual (MCIMX51RM) for details about how to program the IOMUX controller.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
13
IOMUX Configuration for Boot Media
3.1
NAND
The NAND Flash Controller (NFC) signals are not configured in the IOMUX. The NFC interface uses dedicated contacts on the IC.
3.2
SD/MMC IOMUX Pin Configuration
shows the SD/MMC IOMUX pin configuration.
Table 5. SD/MMC IOMUX Pin Configuration
Signal eSDHC1
SD1_CLK.alt0
eSDHC2
SD2_CLK.alt0
CLK
CMD
SD1_CMD.alt0
SD2_CMD.alt0
DAT0
SD1_DATA0.alt0
N/A
1
SD2_DATA0.alt0
DAT1
N/A
DAT2
N/A N/A
CD/DAT3
SD1_DATA3.alt0
SD2_DATA3.alt0
DAT4
N/A N/A
DAT5
N/A N/A
DAT6
N/A N/A
DAT7
N/A
1
N/A in the ROM code indicates the pins are not available.
N/A eSDHC3 eSDHC4
NANDF_RDY_INT.alt5
NANDF_CS2.alt5
NANDF_CS7.alt5
NANDF_WE_B.alt2
N/A
N/A
NANDF_RB0.alt5
N/A
N/A
N/A
N/A
NANDF_RB1.alt5
NANDF_CS3.alt5
N/A
N/A
NANDF_CS6.alt5
N/A
N/A
N/A
N/A
Only DAT0 is available when the SD/MMC is used for boot. The remaining lines (DAT1–DAT7) are not available.
3.3
I
2
C IOMUX Pin Configuration
The contacts assigned to the signals used by the three I
2
C modules is shown in
Table 6. I
2
C IOMUX Pin Configuration
Signal
SDA
SCL
HSI
2
C
I2C1_DAT.alt0
I2C1_CLK.alt0
I
2
C1
I2C1_DAT.alt0
I2C1_CLK.alt0
I
2
C2
GPIO1_3.alt2
GPIO1_2.alt2
14 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
IOMUX Configuration for Boot Media
3.4
eCSPI/CSPI IOMUX Pin Configuration
The contacts assigned to the signals used by the three SPI modules is shown in
Table 7. SPI IOMUX Pin Configuration
Signal eCSPI1 eCSPI2
MISO
MOSI
CSPI1_MISO.alt0
CSPI1_MOSI.alt0
RDY
SCLK
SS0
SS1
SS2
CSPI1_RDY.alt0
CSPI1_SCLK.alt0
N/A
N/A
N/A
1
SS3 N/A
1
N/A in the ROM code indicates the pins are not available.
NANDF_RB3.alt2
NANDF_D15.alt2
NANDF_RB1.alt2
NANDF_RB2.alt2
N/A
N/A
N/A
N/A
CSPI
USBH1_NXT.alt1
USBH1_DIR.alt1
USBH1_STP.alt1
USBH1_CLK.alt1
N/A
USBH1_DATA5.alt1
N/A
N/A
3.5
Wireless External Interface Module (WEIM)
The WEIM interface signals are not configured in the IOMUX. The WEIM interface uses dedicated contacts on the IC.
3.6
UART IOMUX Pin Configuration
The contacts assigned to the signals used by the three UART modules are shown in
.
Table 8. UART IOMUX Pin Configuration
Signal
TXD
RXD
CTS
RTS
UART1
UART1_TXD.alt0
UART1_RXD.alt0
UART1_CTS.alt0
UART1_RTS.alt0
UART2
UART2_TXD.alt0
UART2_RXD.alt0
USBH1_DATA0.alt1
USBH1_DATA3.alt1
UART3
UART3_TXD.alt1
UART3_RXD.alt1
KEY_COL5.alt2
KEY_COL4.alt2
3.7
USB-OTG IOMUX Pin Configuration
The interface signals of the UTMI PHY are not configured in the IOMUX. The UTMI PHY interface uses dedicated contacts on the IC.
Table 9. ULPI PHY IOMUX Pin Configuration
Signal
USB_PWR
USB_OC
ULPI PHY
GPIO1_8.alt1
GPIO1_9.alt1
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
15
Electrical Characteristics
Table 9. ULPI PHY IOMUX Pin Configuration (continued)
Signal
USBOTG_CLK
USBOTG_NXT
USBOTG_STP
USBOTG_DAT0
USBOTG_DAT1
USBOTG_DAT2
USBOTG_DAT3
USBOTG_DAT4
USBOTG_DAT5
USBOTG_DAT6
USBOTG_DAT7
ULPI PHY
EIM_CS4.alt2
EIM_CS3.alt2
EIM_CS2.alt2
EIM_D24.alt2
EIM_D25.alt2
EIM_D26.alt2
EIM_D27.alt2
EIM_D28.alt2
EIM_D29.alt2
EIM_D30.alt2
EIM_D31.alt2
NOTE
USB OTG ULPI port is not supported and it is not functional. On-chip PHY is always used for the OTG port.
4 Electrical Characteristics
This section provides the device and module-level electrical characteristics for the i.MX51A processor.
4.1
Chip-Level Conditions
reference to the individual tables and sections.
Table 10. i.MX51A Chip-Level Conditions
For these characteristics, …
Table 11, “Absolute Maximum Ratings”
, “
, “
”
, “
”
Topic appears …
CAUTION
Stresses beyond those listed under
may cause permanent damage to the device. These are stress ratings only. Functional operation of the device at these or any other conditions beyond those indicated under
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
16 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 11. Absolute Maximum Ratings
Parameter Description Symbol Min Max Unit
Peripheral Core Supply Voltage
ARM Core Supply Voltage
Supply Voltage (UHVIO, I
2
C)
Supply Voltage (except UHVIO, I
2
C)
VCC
VDDGP
Supplies denoted as I/O Supply
Supplies denoted as I/O Supply
–0.3
–0.3
–0.5
–0.5
1.35
1.15
3.6
3.3
V
V
V
V
USB VBUS
Input/Output Voltage Range
ESD Damage Immunity:
VBUS
V in
/V out
V esd
—
–0.5
5.25
OVDD + 0.3
1
V
V
V
Human Body Model (HBM)
Charge Device Model (CDM)
—
—
2000
500
Storage Temperature Range T
STORAGE
–40 125 o
C
Junction Temperature T
J
— 125
2
1
2
The term OVDD in this section refers to the associated supply rail of an input or output. The association is described in
. The maximum range can be superseded by the DC tables.
During the life of the device, T
J must be limited to a cumulative of 2% of the time over 105 o
C.
o
C
Table 12 provides the thermal resistance data.
Table 12. Thermal Resistance Data
Rating Board Symbol Value Unit
1
Junction to Case
1
, 19 x 19 mm package — R
θJC
6 °C/W
Rjc-x per JEDEC 51-12: The junction-to-case thermal resistance. The “x” indicates the case surface where T case
is measured and through which 100% of the junction power is forced to flow due to the cold plate heat sink fixture placed either at the top (T) or bottom (B) of the package, with no board attached to the package.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
17
Electrical Characteristics
shows the i.MX51 operating ranges.
Table 13. i.MX51A Operating Ranges
Symbol Parameter Minimum
1
Nominal
2
Maximum
1
VDDGP
MCIMX51xA products
VCC
MCIMX51xA products
VDDA
ARM core supply voltage
0
< f
ARM
≤
600 MHz
ARM core supply voltage
Stop mode
Peripheral supply voltage High Performance
Mode (HPM) The clock frequencies are derived from AXI and AHB buses using 133 or 166 MHz
(as needed). The DDR clock rate is 200 MHz.
Note: For detailed information about the use of
133 or 166 MHz clocks, see i.MX51 Multimedia
Applications Processor Reference Manual
(MCIMX51RM).
Peripheral supply voltage—Stop mode
Memory arrays voltage—Run Mode
Memory arrays voltage—Stop Mode
PLL Digital supplies
0.95
0.9
1.0
0.95
1.175 1.225
0.9
1.15
0.9
1.15
0.95
1.20
0.95
1.2
1.1
1.05
1.275
1.275
1.275
1.275
1.35
VDD_DIG_PLL_A
VDD_DIG_PLL_B
VDD_ANA_PLL_A
VDD_ANA_PLL_B
NVCC_EMI
NVCC_PER5
NVCC_PER10
NVCC_PER11
NVCC_PER12
NVCC_PER13
NVCC_PER14
NVCC_IPUx
3
NVCC_PER3
NVCC_PER8
NVCC_PER9
NVCC_EMI_DRAM
VDD_FUSE
4
NVCC_NANDF_x
5
NVCC_PER15
NVCC_PER17
NVCC_USBPHY
NVCC_OSC
TVDAC_DHVDD,
NVCC_TV_BACK,
AHVDDRGB
PLL Analog supplies
GPIO EMI Supply and additional digital power supplies.
GPIO IPU Supply and additional digital power supplies.
DDR and Fuse Read Supply
Fusebox Program Supply (Write Only)
Ultra High voltage I/O (UHVIO) supplies
UHVIO_L
UHVIO_H
UHVIO_UH
USB_PHY analog supply, oscillator analog supply
6
TVE-to-DAC level shifter supply, cable detector supply, analog power supply to RGB channel
1.75
1.65
1.65
1.65
3.0
1.65
2.5
3.0
2.25
2.69
1.8
1.875 or
2.775
1.875 or
2.775
1.8
—
—
1.875
2.775
3.3
2.5
2.75
1.95
3.1
3.1
1.95
3.3
1.95
3.1
3.6
2.75
2.91
Unit
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
18 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 13. i.MX51A Operating Ranges (continued)
Parameter Minimum
1
Nominal
2
Maximum
1
Symbol Unit
NVCC_HS4_1
NVCC_HS4_2
NVCC_HS6
NVCC_HS10
NVCC_I2C
HS-GPIO additional digital power supplies 1.65
— 3.1
V
I
2
C and HS-I
2
C I/O Supply
7
1.65
2.7
1.875
3.0
1.95
3.3
V
NVCC_SRTC_
POW
VDDA33
SRTC Core and I/O Supply (LVIO) 1.1
1.2
1.3
V
USB PHY I/O analog supply 3.0
3.3
3.6
V
VBUS
Table 126 for details. This is
not a power supply.
— — — —
1
2
3
4
5
6
7
Voltage at the package power supply contact must be maintained between the minimum and maximum voltages. The design must allow for supply tolerances and system voltage drops.
The nominal values for the supplies indicate the target setpoint for a tolerance no tighter than ± 50 mV. Use of supplies with a tighter tolerance allows reduction of the setpoint with commensurate power savings.
The NVCC_IPUx rails are isolated from one another. This allows the connection of different supply voltages for each one. For example, NVCC_IPU2 can operate at 1.8 V while NVCC_IPU4 operates at 3.0 V.
In Read mode, Freescale recommends VDD_FUSE be floated or grounded. Tying VDD_FUSE to a positive supply
(3.0 V–3.3 V) increases the possibility of inadvertently blowing fuses and is not recommended.
The NAND Flash supplies are composed of three groups: A, B, and C. Each group can be powered with a different supply voltage. For example, NVCC_NANDF_A = 1.8 V, NVCC_NANDF_B = 3.0 V, NVCC_NANDF_C = 2.7 V.
The analog supplies should be isolated in the application design. Use of series inductors is recommended.
Operation of the HS-I
2
C and I
2
C is not guaranteed when operated between the supply voltages of 1.95 to 2.7 V.
Parameter Description
JTAG: TCK Operating Frequency
CKIL: Operating Frequency
CKIH: Operating Frequency
XTAL Oscillator
Table 14. Interface Frequency
Symbol f tck f ckil f ckih f xtal
Min Max
See Table 99, "JTAG Timing," on page 130
See Table 74, "FPM Specifications," on page 80
See Table 47, "CAMP Electrical Parameters (CKIH1,
22 27
Unit
MHz kHz
MHz
MHz
4.1.1
Supply Current
Table 15 shows the fuse supply current.
Table 15. Fuse Supply Current
1
Description eFuse Program Current.
2
Current required to program one eFuse bit: The associated
.
Symbol
I program
Min
—
Typ
60
Max
120
Unit mA
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
19
Electrical Characteristics
1
2
The read current of approximately 5 mA is derived from the DDR supply (NVCC_EMI_DRAM).
The current I program
is only required during program time.
Table 16 shows the current core consumption (not including I/O) of the i.MX51.
Table 16. i.MX51 Stop Mode Current and Power Consumption
Mode
Stop Mode
• External reference clocks gated
• Power gating for ARM and processing units
• Stop mode voltage
Stop Mode
• External reference clocks gated
• Power gating for ARM and processing units
• HPM voltage
Stop Mode
• External reference clocks enabled
• Power gating for ARM and processing units
• HPM voltage
Condition
VDDGP = 0.95 V, VCC = 0.95 V, VDDA = 0.95 V
ARM CORE in SRPG mode
L1 and L2 caches power gated
IPU in S&RPG mode
VPU and GPU in PG mode
All PLLs off, all CCM-generated clocks off
CKIL input on with 32 kHz signal present
All modules disabled
USBPHY PLL off
External (MHz) crystal and on-chip oscillator powered down (SBYOS bit asserted)
No external resistive loads that cause current flow
Standby voltage allowed (VSTBY bit is asserted)
T A = 25
°C
VDDGP = 1.0 V, VCC = 1.225 V, VDDA = 1.2 V
ARM CORE in SRPG mode
L1 and L2 caches power gated
IPU in S&RPG mode
VPU and GPU in PG mode
All PLLs off, all CCM-generated clocks off
CKIL input on with 32 kHz signal present
All modules disabled.
USBPHY PLL off
External (MHz) crystal and on-chip oscillator powered down (SBYOS bit asserted)
No external resistive loads that cause current flow
T A = 25
°C
VDDGP = 1.0 V, VCC = 1.225 V, VDDA = 1.20 V
ARM CORE in SRPG mode
L1 and L2 caches power gated
IPU in S&RPG mode
VPU and GPU in PG mode
All PLLs off, all CCM-generated clocks off
CKIL input on with 32 kHz signal present
All modules disabled
USBPHY PLL off
External (MHz) crystal and on-chip oscillator powered and generating reference clock
No external resistive loads that cause current flow
T A = 25
°C
Supply
VDDGP
VCC
VDDA
NVCC_OSC
Total
VDDGP
VCC
VDDA
NVCC_OSC
Total
VDDGP
VCC
VDDA
NVCC_OSC
Total
Nominal Unit mA 0.18
0.35
0.15
0.012
0.66
mW
0.24
0.45
0.2
1.5
4.8
0.24
0.45
0.2
0.012
1.09
mA mW mA mW
20 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 16. i.MX51 Stop Mode Current and Power Consumption (continued)
Mode Condition
Stop Mode
• External reference clocks enabled
• No power gating for ARM and processing units
• HPM voltage
VDDGP = 1.0 V, VCC = 1.225 V, VDDA = 1.2 V
All PLLs off, all CCM-generated clocks off
CKIL input on with 32 kHz signal present
All modules disabled
USBPHY PLL off
External (MHz) crystal and on-chip oscillator powered and generating reference clock
No external resistive loads that cause current flow
T A = 25
°C
Supply
VDDGP
VCC
VDDA
NVCC_OSC
Total
Nominal Unit mA 50
2
1.15
1.5
63 mW
4.1.2
USB PHY Current Consumption
shows the USB PHY current consumption.
Table 17. USB PHY Current Consumption
Parameter Conditions
Analog Supply
VDDA33 (3.3 V)
Analog Supply
NVCC_USBPHY (2.5 V)
Digital Supply
VCC (1.2 V)
VDDA33 + NVCC_USBPHY + VCC
Full Speed
High Speed
Full Speed
High Speed
Full Speed
High Speed
Suspend
RX
TX
RX
TX
RX
TX
RX
TX
RX
TX
RX
TX
Typical @ 25 °C
6.5
6.5
12
21
5.5
7
5
5
6
6
6
6
50
Max
7
7
13
22
6
8
6
6
7
7
7
7
100
Unit mA mA
mA
μA
4.2
Supply Power-Up/Power-Down Requirements and Restrictions
The system design must comply with the power-up and power-down sequence guidelines as described in this section to guarantee reliable operation of the device. Any deviation from these sequences may result in the following situations:
• Excessive current during power-up phase
• Prevention of the device from booting
• Irreversible damage to the i.MX51A processor (worst-case scenario)
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
21
Electrical Characteristics
4.2.1
Power-Up Sequence
shows the power-up sequence.
NVCC_SRTC_POW
VCC
VDDGP
4
NVCC_EMI_DRAM
NVCC_NANDF_x
NVCC_PER15
NVCC_PER17
VDDA
NVCC_HS4_1
NVCC_HS4_2
NVCC_HS6
NVCC_HS10
NVCC_PERx
2
NVCC_EMI
NVCC_IPU
NVCC_I2C
AHVDDRGB
NVCC_TV_BACK
TVDAC_DHVDD
VDD_DIG_PLL_A/B
VDD_ANA_PLL_A/B
NVCC_OSC
NVCC_USBPHY
VDDA33
VDD_FUSE
1
1. VDD_FUSE should only be powered when writing.
2. NVCC_PERx refers to NVCC_PER 3, 5, 8, 9, 10, 11, 12, 13, 14.
3. No power-up sequence dependencies exist between the supplies shown in the block diagram shaded in gray.
4. There is no requirement for VDDGP to be preceded by any other power supply other than NVCC_SRTC_POW.
5. If all of the UHVIO supplies (NVCC_NANDFx, NVCC_PER15 and NVCC_PER17) are less than 2.75 V then there is no requirement on the power up sequence order between NVCC_EMI_DRAM and the UHVIO supplies. However, if the voltage is 2.75 V and above, then NVCC_EMI_DRAM needs to power up before the UHVIO supplies as shown here.
Figure 2. Power-Up Sequence
NOTE
The POR_B input must be immediately asserted at power-up and remain asserted until after the last power rail is at its working voltage.
For more information on power up, see i.MX51 Power-Up Sequence
(AN4053).
4.3
I/O DC Parameters
This section includes the DC parameters of the following I/O types:
• General Purpose I/O and High-Speed General Purpose I/O (GPIO/HSGPIO)
• Double Data Rate 2 (DDR2)
• Low Voltage I/O (LVIO)
• Ultra High Voltage I/O (UHVIO)
• High-Speed I
2
C and I
2
C
• Enhanced Secure Digital Host Controller (eSDHC)
22 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
NOTE
The term OVDD in this section refers to the associated supply rail of an input or output. The association is shown in
4.3.1
GPIO/HSGPIO DC Parameters
The parameters in Table 18 are guaranteed per the operating ranges in
, unless otherwise noted.
Table 18. GPIO/HSGPIO DC Electrical Characteristics
Parameter Symbol Test Conditions Min Typ Max Unit
High-level output voltage Voh Iout = -1 mA OVDD –0.15
— OVDD + 0.3
V
Low-level output voltage
High-level output current
Low-level output current
High-Level DC input voltage
1
Low-Level DC input voltage 1
Vol
Ioh
Iol
VIH
VIL
Iout = 1mA
Vout = 0.8
×
OVDD
Low drive
Medium drive
High drive
Max drive
Vout = 0.2
×
OVDD
Low drive
Medium drive
High drive
Max drive
—
—
—
–1.9
–3.7
–5.2
–6.6
—
1.9
3.7
5.2
6.6
0.7
×
OVDD —
0
—
—
—
0.15
—
—
OVDD
0.3
×
OVDD
—
V mA mA
V
V
Input Hysteresis VHYS OVDD = 1.875
OVDD = 2.775
0.25
0.34
0.45
V
Schmitt trigger VT+ 1,
2
Schmitt trigger VT1, 2
VT+
VT-
—
—
0.5OVDD
—
—
—
—
0.5
×
OVDD
See Note
3
V
V
Input current (no pull-up/down) Iin Vin = OVDD or 0 — — —
Input current (22 k
Input current (47 k
Ω Pull-up)
Ω Pull-up)
Input current (100 k
Input current (100 k
Ω Pull-up)
Ω Pull-down)
Iin
Iin
Iin
Iin
Vin = 0
Vin = 0
Vin = 0
Vin = OVDD
—
—
—
—
—
—
—
—
161
76
36
36
Keeper Circuit Resistance — OVDD = 1.875V
OVDD = 2.775V
—
—
22
17
—
—
2
3
1
To maintain a valid level, the transition edge of the input must sustain a constant slew rate (monotonic) from the current DC level through to the target DC level, VIL or VIH. Monotonic input transition time is from 0.1 ns to 1 s.
Hysteresis of 250 mV is guaranteed over all operating conditions when hysteresis is enabled.
I/O leakage currents are listed in
μA
μA
μA
μA k
Ω
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
23
Electrical Characteristics
4.3.2
DDR2 I/O DC Parameters
The parameters in Table 19 are guaranteed per the operating ranges in
, unless otherwise noted.
Table 19. DDR2 I/O DC Electrical Parameters
Parameters
High-level output voltage
Low-level output voltage
Output minimum Source Current
Output min Sink Current
DC input Logic High
DC input Logic Low
VIH
VIL
Input voltage range of each differential input Vin
Differential input voltage required for switching Vid
Termination Voltage
Input current (no pull-up/down)
Vtt
Iin
Symbol
Voh
Vol
Ioh
Iol
Test Conditions Min Max Unit
—
—
OVDD = 1.7 V
Vout = 1.42 V
OVDD = 1.7 V
Vout = 0.28 V
OVDD – 0.28
—
–13.4
13.4
—
0.28
—
—
V
V mA mA
—
—
—
—
OVDD/2 + 0.125
–0.3
–0.3
0.25
OVDD + 0.3
OVDD/2 – 0.125
OVDD + 0.3
OVDD + 0.6
Vtt tracking OVDD/2 OVDD/2 – 0.04
OVDD/2 + 0.04
VI = 0
VI = OVDD
—
—
See Note
1
V
V
V
V
V
—
1
I/O leakage currents are listed in
4.3.3
Low Voltage I/O (LVIO) DC Parameters
The parameters in Table 20 are guaranteed per the operating ranges in
, unless otherwise noted.
Table 20. LVIO DC Electrical Characteristics
DC Electrical Characteristics
High-level output voltage
Low-level output voltage
High-level output current
Low-level output current
Symbol
Voh
Vol
I
Ioh
I
Iol
High-Level DC input voltage
1
VIH
Low-Level DC input voltage
1
VIL
Input Hysteresis VHYS
Test Conditions
Iout = –1 mA
Iout = 1 mA
Vout = 0.8
× OVDD
Low Drive
Medium Drive
High Drive
Max Drive
Vout = 0.2
× OVDD
Low Drive
Medium Drive
High Drive
Max Drive
—
—
OVDD = 1.875
OVDD = 2.775
Min
OVDD – 0.15
—
–2.1
–4.2
–6.3
–8.4
2.1
4.2
6.3
8.4
0.7
× OVDD
0
0.35
—
—
—
0.62
1.27
Typ
—
—
—
Max
—
0.15
—
—
OVDD
0.3
× OVDD
—
V
V
V
Unit
V
V mA mA
24 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 20. LVIO DC Electrical Characteristics (continued)
DC Electrical Characteristics Symbol Test Conditions Min Typ Max Unit
Schmitt trigger VT+
Schmitt trigger VT–
1, 2
1, 2
VT+
VT–
—
—
0.5
× OVDD
—
—
—
—
0.5
× OVDD
See Note
3
V
V
Input current (no pull-up/down) Iin VI = 0 or OVDD — — —
Input current (22 k
Input current (47 k
Ω Pull-up)
Ω Pull-up)
Input current (100 k
Input current (100 k
Ω Pull-up)
Ω Pull-down)
Iin
Iin
Iin
Iin
VI = 0
VI = 0
VI = 0
VI = OVDD
—
—
—
—
—
—
—
—
161
76
36
36
Keeper Circuit Resistance — OVDD = 1.875 V
OVDD = 2.775 V
—
—
22
17
—
—
1
2
3
To maintain a valid level, the transition edge of the input must sustain a constant slew rate (monotonic) from the current DC level through to the target DC level, VIL or VIH. Monotonic input transition time is from 0.1 ns to 1 s.
Hysteresis of 250 mV is guaranteed over all operating conditions when hysteresis is enabled.
I/O leakage currents are listed in
.
μA
μA
μA
μA k
Ω
4.3.4
Ultra-High Voltage I/O (UHVIO) DC Parameters
The parameters in Table 21 are guaranteed per the operating ranges in
, unless otherwise noted.
Table 21. UHVIO DC Electrical Characteristics
DC Electrical Characteristics
High-level output voltage
Low-level output voltage
High-level output current, low voltage mode
High-level output current, high voltage mode
Low-level output current, low voltage mode
Low-level output current, high voltage mode
Symbol
Voh
Vol
Ioh_lv
Ioh_hv
Iol_lv
Iol_hv
High-Level DC input voltage
1
,
2
VIH
Low-Level DC input voltage
2,3
VIL
Test Conditions
Iout = –1mA
Iout = 1mA
Vout = 0.8
× OVDD
Low Drive
Medium Drive
High Drive
Vout = 0.8
× OVDD
Low Drive
Medium Drive
High Drive
Vout = 0.2
× OVDD
Low Drive
Medium Drive
High Drive
Vout = 0.2
× OVDD
Low Drive
Medium Drive
High Drive
—
—
Min Typ Max
OVDD–0.15
—
— —
—
–2.2
–4.4
–6.6
—
0.15
—
— —
–5.1
–10.2
–15.3
— —
2.2
4.4
6.6
— —
5.1
10.2
15.3
0.7
× OVDD
—
0
OVDD
— 0.3
× OVDD
Unit
V
V mA mA mA mA
V
V
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
25
Electrical Characteristics
Table 21. UHVIO DC Electrical Characteristics (continued)
DC Electrical Characteristics Symbol Test Conditions Min Typ Max Unit
Input Hysteresis VHYS Low voltage mode
High voltage mode
0.38
0.95
— 0.43
1.33
V
Schmitt trigger VT+
Schmitt trigger VT–
2,3
2,4
VT+
VT–
—
—
0.5OVDD
—
— —
— 0.5
× OVDD
— See Note
4
V
V
Input current (no pull-up/down) Iin Vin = 0
Vin = OVDD
— —
Input current (22 k
Ω Pull-up)
Input current (75 k
Ω Pull-up)
Input current (100 k
Ω Pull-up)
Input current (360 k
Ω Pull-down)
Iin
Iin
Iin
Iin
Vin = 0
Vin = 0
Vin = 0
Vin = OVDD
—
—
—
—
—
—
—
—
202
61
47
5.7
μA
μA
μA
μA
Keeper Circuit Resistance — NA — 17 — k
Ω
3
4
1
2
To maintain a valid level, the transitioning edge of the input must sustain a constant slew rate (monotonic) from the current DC level through to the target DC level, VIL or VIH. Monotonic input transition time is from 0.1 ns to 1 s.
Overshoot and undershoot conditions (transitions above OVDD and below OVSS) on switching pads must be held below 0.6 V, and the duration of the overshoot/undershoot must not exceed 10% of the system clock cycle. Overshoot/undershoot must be controlled through printed circuit board layout, transmission line impedance matching, signal line termination, or other methods.
Non-compliance to this specification may affect device reliability or cause permanent damage to the device.
Hysteresis of 250 mV is guaranteed over all operating conditions when hysteresis is enabled.
I/O leakage currents are listed in Table 25 .
The UHVIO type of I/O cells have to be configured properly according to their supply voltage level, in order to prevent permanent damage to them and in order to not degrade their timing performance.
The HVE control bit of the I/O cell (in IOMUX control registers) should be set to 1 for Low voltage operation and to 0 for High voltage operation.
The HVE bit should be set as follows:
• HVE = 0: High output voltage mode (3.0V to 3.6V)
• HVE = 1: Low output voltage mode (1.65V to 3.1V)
This is related to power domains, such as NVCC_NANDF, NVCC_PER15, and NVCC_PER17.
If HVE bit is not set properly when high voltage level is applied for long durations, it may cause permanent damage over a period of time, causing reduced timing performance of the pad. Similarly, not setting HVE bit properly for low voltage will degrade pad timing performance.
The below discussion clarifies concerns about boot-up period.
The HVE bit is set, by default, to 1 for low voltage operation. As a result, there might be a short period conflict between the HVE bit value and the applied voltage. This conflict is acceptable under the following conditions:
26 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
• The UHVIO pads receive supply voltage up to 3.3V (3.6V max); however, the pads do not toggle during the boot-up sequence (using another interface as a boot code source), for boot-up period of about 22 msec.
• The UHVIO pads receive up to 3.15V (3.3V max) and are used for accessing the boot code, for boot-up period of about 11 msec.
In any case, it is recommended to try to minimize the duration of this period and reduce the amount of toggling on the pads as much as possible. For this, it is recommended to add proper HVE bit programming to the DCD boot-up tables. DCD is a table located in the start of the image that can hold up to 60 address/values. ROM code reads addresses and writes values to it. This space should be sufficient to reprogram the NAND Flash pads for HVE bits.
4.3.5
I
2
C I/O DC Parameters
NOTE
See the errata for HS-I2C in i.MX51 Chip Errata document. The two standard I
2
C modules have no errata.
The DC Electrical Characteristics listed in Table 22
are guaranteed using operating ranges per Table 13 ,
unless otherwise noted.
Table 22. I
2
C Standard/Fast/High-Speed Mode Electrical Parameters for Low/Medium Drive Strength
Parameter Symbol Test Conditions Min Typ Max Unit
Low-level output voltage
High-Level DC input voltage
Low-Level DC input voltage
1
1
Vol
VIH
VIL
Iol = 3 mA
—
—
0.7
—
× OVDD
0
—
—
—
0.4
OVDD
0.3
× OVDD
V
V
V
Input Hysteresis VHYS — 0.25
— — V
Schmitt trigger VT+
1,2
VT+ — 0.5
× OVDD
— — V
Schmitt trigger VT–
1,2
VT– — — — 0.5
× OVDD
See Note
3
V
I/O leakage current (no pull-up) Iin VI = OVDD or 0 — — —
1
2
3
To maintain a valid level, the transitioning edge of the input must sustain a constant slew rate (monotonic) from the current
DC level through to the target DC level, VIL or VIH. Monotonic input transition time is from 0.1 ns to 1 s.
Hysteresis of 250 mV is guaranteed over all operating conditions when hysteresis is enabled.
I/O leakage currents are listed in
.
4.3.6
USBOTG Electrical DC Parameters
This section describes the electrical DC parameters of USBOTG.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
27
Electrical Characteristics
4.3.7
USB Port Electrical DC Characteristics
Table 23 and Table 24 list the electrical DC characteristics.
Table 23. USBOTG Interface Electrical Specification
Parameter
Input High Voltage
Input low Voltage
Output High Voltage
Output Low Voltage
Symbol
VIH
VIL
VOH
VOL
Signals
USB_VPOUT
USB_VMOUT
USB_XRXD,
USB_VPIN,
USB_VMIN
USB_VPOUT
USB_VMOUT
USB_XRXD,
USB_VPIN,
USB_VMIN
USB_VPOUT
USB_VMOUT
USB_TXENB
USB_VPOUT
USB_VMOUT
USB_TXENB
Min
VDD x 0.7
0
VDD – 0.43
—
Max
VDD
VDD
× 0.3
—
0.43
Unit
V
V
V
V
Parameter
Input High Voltage
Input Low Voltage
Output High Voltage
Output Low Voltage
Test Conditions
—
—
7 mA Drv at IOH = 5 mA
7 mA Drv at IOH = 5 mA
Table 24. USB Interface Electrical Specification
Max Symbol
VIH
VIL
VOH
VOL
Signals
USB_DAT_VP
USB_SE0_VM
USB_RCV,
USB_VP1,
USB_VM1
USB_DAT_VP
USB_SE0_VM
USB_RCV,
USB_VP1,
USB_VM1
USB_DAT_VP
USB_SE0_VM
USB_TXOE_B
USB_DAT_VP
USB_SE0_VM
USB_TXOE_B
Min
VDD x 0.7
0
VDD –0.43
—
VDD
VDD x 0.3
0.43
—
V
Unit
V
V
V
Test Conditions
—
—
7 mA Drv at Iout = 5 mA
7 mA Drv at Iout = 5 mA
28 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
shows the I/O leakage currents that are based on the operating ranges in Table 13
and the operating temperatures in
.
Table 25. I/O Leakage Current
NANDF
Contact Group
EIM
DRAM
CSI1, CSI2, DISP1_Data[5:0] NVCC_HSx
I
2
C1
DI1_DAT[23:6],
DISPB_SER_x, DI_GPx
CKIL, PMIC_x
EXTAL, XTAL
ID, GPANAIO
Supply Rail
NVCC_NANDF
NVCC_EMI
NVCC_DRAM
NVCC_I2C
NVCC_IPU
NVCC_SRTC_POW
NVCC_OSC
NVCC_USBPHY
DISP2_DAT[0:15] NVCC_IPU,
NVCC_HS
SD1, SD2 NVCC_PER15,
NVCC_PER17
Peripherals except SD1, SD2 NVCC_PERx
Test Condition
V[I/O] = GND or Positive
Supply Rail, I/O = High Z
V[I/O] = GND or Positive
Supply Rail, I/O = High Z
V[I/O] = GND or Positive
Supply Rail, I/O = High Z
V[I/O] = GND or Positive
Supply Rail, I/O = High Z
V[I/O] = GND or Positive
Supply Rail, I/O = High Z
V[I/O] = GND or Positive
Supply Rail, I/O = High Z
V[I/O] = GND or Positive
Supply Rail, I/O = High Z
V[I/O] = GND or Positive
Supply Rail, I/O = High Z
V[I/O] = GND or Positive
Supply Rail, I/O = High Z
V[I/O] = GND or Positive
Supply Rail, I/O = High Z
V[I/O] = GND or Positive
Supply Rail, I/O = High Z
V[I/O] = GND or Positive
Supply Rail, I/O = High Z
Min
—
—
—
—
—
—
—
—
—
—
—
—
Typ
—
—
—
—
—
—
—
—
—
—
—
—
Max
±1
±1
±2.5
±1.5
±1
±2
±1
±170
±170
±2
±10
±2
Unit
μA
μA
μA
μA
μA
μA
μA
μA
μA
μA
μA
μA
4.4
Output Buffer Impedance Characteristics
This section defines the I/O Impedance parameters of the i.MX51A processor.
4.4.1
LVIO I/O Output Buffer Impedance
Table 26 shows the LVIO I/O output buffer impedance.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
29
Electrical Characteristics
Parameter Symbol
Output Driver
Impedance
Output Driver
Impedance
Table 26. LVIO I/O Output Buffer Impedance
Typical
Conditions Min
Rpu Low Drive Strength, Ztl = 150
Ω
Medium Drive Strength, Ztl = 75
Ω
High Drive Strength, Ztl = 50
Ω
Max Drive Strength, Ztl = 37.5
Ω
Rpd Low Drive Strength, Ztl = 150
Ω
Medium Drive Strength, Ztl = 75
Ω
High Drive Strength, Ztl = 50
Ω
Max Drive Strength, Ztl = 37.5
Ω
64
32
21
16
80
40
27
20
OVDD 2.775 V OVDD 1.875 V
104
52
35
26
88
44
30
22
150
75
51
38
134
66
44
34
Max
250
125
83
62
243
122
81
61
Unit
Ω
Ω
4.4.2
DDR2 Output Buffer Impedance
Table 27 shows the DDR2 output buffer impedance.
Table 27. DDR2 I/O Output Buffer Impedance HVE = 0
Parameter Symbol
Output Driver
Impedance
Output Driver
Impedance
Test Conditions
Rpu Low Drive Strength, Ztl = 150
Ω
Medium Drive Strength, Ztl = 75
Ω
High Drive Strength, Ztl = 50
Ω
Max Drive Strength
Rpd Low Drive Strength, Ztl = 150
Ω
Medium Drive Strength, Ztl = 75
Ω
High Drive Strength, Ztl = 50
Ω
Max Drive Strength
Best Case
T j
= –40 °C
OVDD = 1.95 V
VCC = 1.3 V
Typical
T j
= 25 °C
OVDD = 1.8 V
VCC = 1.2 V
Worst Case
T j
= 105 °C
OVDD = 1.6 V
VCC = 1.1 V Unit s0–s5
000000
185
92.5
61.7
26.5
190.3
95.1
63.4
27.6
s0–s5
101010
140
70
47
19.5
145.4
72.7
48.5
19.9
s0–s5
111111
111.4
55.7
37.2
15.4
120.6
60.3
40.2
16.9
Ω
Ω
30 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.4.3
UHVIO Output Buffer Impedance
Table 28 shows the UHVIO output buffer impedance.
Table 28. UHVIO Output Buffer Impedance
Parameter Symbol
Output Driver
Impedance
Output Driver
Impedance
Test Conditions
Rpu Low Drive Strength, Ztl = 150
Ω
Medium Drive Strength, Ztl = 75
Ω
High Drive Strength, Ztl = 50
Ω
Rpd Low Drive Strength, Ztl =1 50
Ω
Medium Drive Strength, Ztl = 75
Ω
High Drive Strength, Ztl = 50
Ω
OVDD
1.95 V
OVDD
3.0 V
OVDD
1.875 V
OVDD
3.3 V
98
49
32
97
49
32
Min
114
57
38
118
59
40
124
62
41
126
63
42
Typ
135
67
45
154
77
51
Max
OVDD
1.65 V
OVDD
3.6 V
Unit
Ω
198
99
66
179
89
60
206
103
69
217
109
72
Ω
NOTE
Output driver impedance is measured with long transmission line of impedance Ztl attached to I/O pad and incident wave launched into transmission lime. Rpu/Rpd and Ztl form a voltage divider that defines specific voltage of incident wave relative to OVDD. Output driver
impedance is calculated from this voltage divider (see Figure 3 ).
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
31
Electrical Characteristics ipp_do predriver
U,(V)
VDD
OVDD
PMOS (Rpu) pad
Ztl
Ω, L = 20 inches
NMOS (Rpd)
OVSS
Vin (do)
Cload = 1p
U,(V)
OVDD
0
Vref
Vref1
Vref2 t,(ns)
Vout (pad)
0
Rpu =
Vovdd – Vref1
Vref1
× Ztl
Rpd =
Vref2
Vovdd – Vref2
× Ztl
Figure 3. Impedance Matching Load for Measurement t,(ns)
32 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.5
I/O AC Parameters
characteristics for slow and fast I/O are presented in the
, respectively.
From Output
Under Test
Test Point
CL
CL includes package, probe and fixture capacitance
Figure 4. Load Circuit for Output
Output (at I/O)
80% tr
20% tf
Figure 5. Output Transition Time Waveform
80%
NVCC
20%
0V
4.5.1
Slow I/O AC Parameters
Table 29 shows the slow I/O AC parameters.
Table 29. Slow I/O AC Parameters
Parameter
Output Pad Transition Times (Max Drive)
Output Pad Transition Times (High Drive)
Output Pad Transition Times (Medium Drive)
Output Pad Transition Times (Low Drive)
Output Pad Slew Rate (Max Drive)
Output Pad Slew Rate (High Drive)
Output Pad Slew Rate (Medium Drive)
Output Pad Slew Rate (Low Drive)
Output Pad di/dt (Max Drive)
Output Pad di/dt (High Drive)
Output Pad di/dt (Medium drive)
Symbol Test Condition Min Rise/Fall Typ Max Rise/Fall tr, tf — — tr, tf tr, tf tr, tf tps tps tps tps tdit tdit tdit
15 pF
35 pF
15 pF
35 pF
15 pF
35 pF
15 pF
35 pF
15 pF
35 pF
15 pF
35 pF
15 pF
35 pF
15 pF
35 pF
—
—
—
—
—
—
0.5/0.65
0.32/0.37
0.43/0.54
0.26/0.41
0.34/0.41
0.18/0.2
0.20/0.22
0.09/0.1
—
—
—
—
—
—
—
—
—
—
—
—
—
1.98/1.52
3.08/2.69
2.31/1.838
3.8/2.4
2.92/2.43
5.37/4.99
4.93/4.53
10.55/9.79
—
—
—
—
30
23
15
Unit ns ns ns ns
V/ns
V/ns
V/ns
V/ns mA/ns mA/ns mA/ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
33
Electrical Characteristics
Table 29. Slow I/O AC Parameters (continued)
Parameter Symbol Test Condition Min Rise/Fall Typ Max Rise/Fall
Output Pad di/dt (Low drive)
Input Transition Times
1 tdit trm
—
—
—
—
1
Hysteresis mode is recommended for inputs with transition times greater than 25 ns.
—
—
7
25
Unit mA/ns ns
4.5.2
Fast I/O AC Parameters
shows the fast I/O AC parameters.
Table 30. Fast I/O AC Parameters
Parameter Symbol
Test
Condition
Min Rise/Fall
Output Pad Transition Times (Max Drive)
Output Pad Transition Times (High
Drive)
Output Pad Transition Times (Medium
Drive)
Output Pad Transition Times (Low Drive)
Output Pad Slew Rate (Max Drive)
Output Pad Slew Rate (High Drive)
Output Pad Slew Rate (Medium Drive) tr, tf tr, tf tr, tf tr, tf tps tps tps
15 pF
35 pF
15 pF
35 pF
15 pF
35 pF
15 pF
35 pF
15 pF
35 pF
15 pF
35 pF
15 pF
35 pF
—
—
—
—
0.69/0.78
0.36/0.39
0.55/0.62
0.28/0.30
0.39/0.44
0.19/0.20
Output Pad Slew Rate (Low Drive)
Output Pad di/dt (Max Drive)
Output Pad di/dt (High Drive) tps tdit tdit
15 pF
35 pF
—
—
0.21/0.22
0.09/0.1
—
—
Output Pad di/dt (Medium drive) tdit — —
Output Pad di/dt (Low drive)
Input Transition Times
1 tdit trm
—
—
—
—
1
Hysteresis mode is recommended for inputs with transition time greater than 25 ns.
Typ
—
—
—
—
—
—
—
—
—
—
—
—
—
Max Rise/Fall
1.429/1.275
2.770/2.526
1.793/1.607
3.565/3.29
2.542/2.257
5.252/4.918
4.641/4.456
10.699/10.0
—
—
—
—
70
53
35
18
25
4.5.3
I
2
C AC Parameters
NOTE
See the errata for HS-I
2
C in the i.MX51 Chip Errata document. The two standard I
2
C modules have no errata
Unit ns ns ns ns
V/ns
V/ns
V/ns
V/ns mA/ns mA/ns mA/ns mA/ns ns
34 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
pad transition time definition.
Figure 8 depicts load circuit with external pull-up current source for
HS-mode.
depicts HS-mode timing definition.
From Output
Under Test
Test Point
CL
CL includes package, probe and fixture capacitance
Figure 6. Load Circuit for Standard and Fast-Mode
Output
OVDD
70%
30%
0V tf
Figure 7. Definition of Timing for Standard and Fast-Mode
OVDD
From Output
Under Test
3 mA
1
Test Point
CL
2
Notes:
1
Load current when output is between 0.3
×
OVDD and 0.7
2
CL includes package, probe, and fixture capacitance.
×
OVDD
Figure 8. Load Circuit for HS-Mode with External Pull-Up Current Source
70%
Output (at pad)
30% t
TLH t
THL
PA3Max = max of t
TLH
and t
THL
PA4Max = max t
THL
Figure 9. Definition of Timing for HS-Mode
70%
30%
OVDD
0V
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
35
Electrical Characteristics
The electrical characteristics for I
2
to
Table 34 . Characteristics are guaranteed
using operating ranges per Table 13 , unless otherwise noted.
Table 31. I
2
C Standard- and Fast-Mode Electrical Parameters for Low/Medium Drive Strength and OVDD = 2.7 V–3.3 V
Parameter
Output fall time,
(low driver strength)
Output fall time,
(medium driver strength)
Symbol tf
Test Conditions from V
IHmin
to V
ILmax
with C
L
from 10 pF to 400 pF tf from V
IHmin
to V
ILmax
with C
L
from 10 pF to 400 pF
Min
—
—
Typ Max Unit
— 52 ns
— 28 ns
Parameter
Output fall time,
(low driver strength)
Output fall time,
(medium driver strength)
Table 32. I
2
C Standard- and Fast-Mode Electrical Parameters for Low/Medium Drive Strength and OVDD = 1.65 V–1.95 V
Symbol t of
Test Conditions from V
IHmin
to V
ILmax
with C
L
from 10 pF to 400 pF
Min
— t of from V
IHmin
to V
ILmax
with C
L
from 10 pF to 400 pF —
Typ Max Unit
— 70 ns
— 35 ns
Table 33. I
2
C High-Speed Mode Electrical Parameters for Low/Medium Drive Strength and OVDD = 2.7 V–3.3 V
Parameter
Output rise time (current-source enabled) and fall time at SCLH
(low driver strength)
Output rise time (current-source enabled) and fall time at SCLH
(medium driver strength)
Output fall time at SDAH
(low driver strength)
Output fall time at SDAH
(medium driver strength)
Output fall time at SDAH
(low driver strength)
Output fall time at SDAH
(medium driver strength)
Symbol t rCL
, t fCL t rCL
, t fCL t fDA t fDA t fDA t fDA
Test Conditions with a 3mA external pull-up current source and C
L
= 100 pF with a 3mA external pull-up current source and C
L
= 100 pF with C
L
from 10 pF to
100 pF with C
L
from 10 pF to
100 pF
C
L
= 400 pF
Min Typ
— —
—
—
—
—
—
—
—
—
C
L
= 400 pF — —
Max
18/21
9/9
14
8
52
27
Unit ns ns ns ns ns ns
36 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Parameter
Output rise time (current-source enabled) and fall time at SCLH
(low driver strength)
Output rise time (current-source enabled) and fall time at SCLH
(medium driver strength)
Output fall time at SDAH
(low driver strength)
Output fall time at SDAH
(medium driver strength)
Output fall time at SDAH
(low driver strength)
Output fall time at SDAH
(medium driver strength)
Table 34. I
2
C High-Speed Mode Electrical Parameters for Low/Medium Drive Strength and OVDD = 1.65 V–1.95 V
Symbol t rCL
, t fCL
Test Conditions with a 3 mA external pull-up current source and C
L
= 100 pF
Min
— t rCL
, t fCL t fDA t fDA t fDA t fDA with a 3 mA external pull-up current source and C
L
= 100 pF with C
L
from 10 pF to 100 pF with C
L
from 10 pF to 100 pF
C
L
= 400 pF
C
L
= 400 pF
—
0
0
30
15
Electrical Characteristics
Typ Max
— 10/74
Unit ns
—
—
—
—
—
7/14
17
9
67
34 ns ns ns ns ns
Table 35. Low Voltage I
2
C I/O Parameters
Parameter Symbol Test Condition Min Rise/Fall
Output Pad di/dt (Medium drive) tdit — —
Output Pad di/dt (Low drive) tdit — —
Input Transition Times
1 trm — —
1
Hysteresis mode is recommended for inputs with transition time greater than 25 ns
Table 36. High Voltage I
2
C I/O Parameters
Parameter Symbol Test Condition Min Rise/Fall Typ
— — Output Pad Transition Times (Medium Drive)
Output Pad Transition Times (Low Drive)
Output Pad Slew Rate (Medium Drive) tr, tf tr, tf tps
15 pF
35 pF
15 pF
35 pF
15 pF
35 pF
Output Pad Slew Rate (Low Drive) tps 15 pF
35 pF
— Output Pad di/dt (Medium drive) tdit
Output Pad di/dt (Low drive) tdit —
Input Transition Times
1 trm —
1
Hysteresis mode is recommended for inputs with transition time > 25 ns
—
0/0
0/0
0/0
0/0
—
—
—
—
—
—
—
—
—
Typ
—
—
—
Max Rise/Fall
22
11
25
Unit mA/ns mA/ns ns
Max Rise/Fall
3/3
6/5
5/5
9/9
—
—
36
16
25
Unit ns ns
V/ns
V/ns mA/ns mA/ns ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
37
Electrical Characteristics
4.5.4
AC Electrical Characteristics for DDR2
The load circuit for output pads, the output pad transition time waveform and the output pad propagation and transition time waveform are below.
shows the output pad transition time waveform.
Figure 10. Output Pad Transition Time Waveform
shows the output pad propagation and transition time waveform.
Figure 11. Output Pad Propagation and Transition Time Waveform
AC electrical characteristics in DDR2 mode for fast mode and for ovdd = 1.65 – 1.95 V, ipp_hve = 0 are
.
Table 37. AC Electrical Characteristics of DDR2 IO Pads for Fast mode and for ovdd=1.65–1.95 V (ipp_hve=0)
Parameter
Output Pad Transition Times
1
Output Pad Propagation Delay, 50%-50%
1
Output Pad Slew Rate
1
Symbol
Test
Condition
Min rise/fall tpr tpo tps
15pF
35pF
15pF
35pF
15pF
35pF
0.57/0.57
1.29/1.29
0.98/0.96
1.47/1.50
2.05/2.05
0.91/0.91
Typ
0.45/0.44
0.97/0.94
1.27/1.19
1.63/1.57
2.40/2.45
1.11/1.15
Max rise/fall
0.45/0.45
0.82/0.85
1.89/1.72
2.20/2.07
2.20/2.20
1.21/1.16
Units ns ns
V/ns
38 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 37. AC Electrical Characteristics of DDR2 IO Pads for Fast mode and for ovdd=1.65–1.95 V (ipp_hve=0) (continued)
Parameter Symbol
Test
Condition
Min rise/fall
Typ
Max rise/fall
Units
Output Pad di/dt
1
Input Pad Transition Times
2
Input Pad Propagation Delay without Hysteresis
(CMOS input), 50%-50%
2
Input Pad Propagation Delay with Hysteresis
(CMOS input), 50%-50%
2 di/dt trfi tpi tpi
—
1.2 pF
1.2 pF
1.2 pF
390
0.09/0.09
0.45/0.93
0.55/0.55
201
0.132/0.128
0.6/0.58
0.71/0.7
99
0.212/0.213
0.9/0.88
1.03/0.98
mA/ns ns ns ns
Input Pad Propagation Delay (DDR input),
50%-50%
2
Maximum Input Transition Times
3 tpi 1.2 pF 0.38/0.38
0.58/0.61
1.014/1.07
ns trm — — — 5 ns
1
2
3
Max condition for tpr, tpo, tps and didt: wcs model, 1.1 V, IO 1.65 V, 105 °C and s0-s5=111111. Typ condition for tpr, tpo, tps and didt: typ model, 1.2 V, IO 1.8 V, 25 °C and s0-s5 = 101010. Min condition for tpr, tpo, tps and didt: bcs model, 1.3 V,
IO 1.95 V, –40 °C and s0-s5=000000.
Max condition for trfi and tpi: wcs model, 1.1 V, IO 1.65 V and 105 °C. Typ condition for trfi and tpi: typ model, 1.2 V, IO
1.8 V and 25 °C. Min condition for trfi and tpi: bcs model, 1.3 V, IO 1.95 V and –40 °C.
Hysteresis mode is recommended for input with transition time greater than 25 ns.
AC electrical characteristics in DDR2 mode for Slow mode and for ovdd=1.65 – 1.95 V, ipp_hve = 0 are
:
Table 38. AC Electrical Characteristics of DDR2 IO Pads for Slow Mode and for ovdd=1.65–1.95 V (ipp_hve=0)
Parameter
Output Pad Transition Times
1
Output Pad Propagation Delay, 50%-50%
1
Output Pad Slew Rate
1
Output Pad di/dt
1
Input Pad Transition Times
2
Input Pad Propagation Delay without Hysteresis
(CMOS input), 50%-50%
2
Input Pad Propagation Delay with Hysteresis
(CMOS input), 50%-50%
2
Input Pad Propagation Delay (DDR input),
50%-50%
2
Maximum Input Transition Times
3
Symbol tpr tpo tps di/dt trfi tpi
Test
Condition
Min rise/fall
Typ
Max rise/fall
Units
15pF
35pF
15pF
35pF
0.75/0.76
1.39/1.40
1.50/1.55
2.05/2.16
0.70/0.74
1.18/1.21
1.90/1.95
2.36/2.48
1.06/1.00
1.49/1.47
3.23/3.10
3.82/3.75
ns ns
15pF
35pF
1.56/1.54
0.84/0.84
1.54/1.46
0.92/0.89
0.93/0.99
0.66/0.67
V/ns
— 82 40 19 mA/ns
1.2 pF 0.09/0.09
0.132/0.128
0.212/0.213
ns
1.2 pF 0.45/0.93
0.6/0.58
0.9/0.88
ns tpi tpi trm
1.2 pF 0.55/0.55
0.71/0.7
1.2 pF 0.38/0.38
0.58/0.61
— — —
1.03/0.98
1.014/1.07
5 ns ns ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
39
Electrical Characteristics
1
2
3
Max condition for tpr, tpo, tps and didt: wcs model, 1.1 V, IO 1.65 V, 105 °C and s0-s5=111111. Typ condition for tpr, tpo, tps and didt: typ model, 1.2 V, IO 1.8 V, 25 °C and s0-s5 = 101010. Min condition for tpr, tpo, tps and didt: bcs model, 1.3 V,
IO 1.95 V, –40 °C and s0-s5 = 000000.
Max condition for trfi and tpi: wcs model, 1.1 V, IO 1.65 V and 105 °C. Typ condition for trfi and tpi: typ model, 1.2 V, IO
1.8 V and 25 °C. Min condition for trfi and tpi: bcs model, 1.3 V, IO 1.95 V and –40 °C.
Hysteresis mode is recommended for input with transition time greater than 25 ns.
AC electrical characteristics in DDR mobile for Fast mode and ovdd=1.65 – 1.95 V, ipp_hve=0 are placed
Table 39. AC Electrical Characteristics of DDR mobile IO Pads for Fast Mode and ovdd=1.65–1.95 V (ipp_hve=0)
Parameter
Output Pad Transition Times (High Drive)
1
Output Pad Transition Times (Medium Drive)
1
Output Pad Transition Times (Low Drive)
1
Output Pad Propagation Delay (High Drive)
1
Output Pad Propagation Delay (Medium Drive)
1
Output Pad Propagation Delay (Low Drive)
1
Output Pad Slew Rate (High Drive)
1
Output Pad Slew Rate (Medium Drive)
1
Output Pad Slew Rate (Low Drive)
1
Output Pad di/dt (High Drive)
1
Output Pad di/dt (Medium drive)
1
Output Pad di/dt (Low drive)
1
Input Pad Transition Times
2
Input Pad Propagation Delay without Hysteresis
(CMOS input), 50%-50%
2
Input Pad Propagation Delay with Hysteresis
(CMOS input), 50%-50%
2
Input Pad Propagation Delay (DDR input),
50%-50%
2
Maximum Input Transition Times
3
Symbol tpr tpr tpr tpo tpo tpo tps tps tps di/dt di/dt di/dt trfi tpi
Test
Condition
Min rise/fall
Typ
Max rise/fall
Units
15pF
35pF
15pF
35pF
15pF
35pF
15pF
35pF
15pF
35pF
15pF
35pF
1.35/1.31
2.99/2.94
2.00/1.99
4.55/4.44
4.08/3.92
8.93/8.95
1.54/1.52
2.69/2.75
2.00/2.02
3.75/3.86
3.43/3.52
6.92/7.20
1.02/1.03
2.28/2.29
1.56/1.53
3.38/3.45
3.11/3.06
6.84/6.81
1.73/1.62
2.59/2.55
2.08/2.00
3.38/3.39
3.13/3.13
5.72/5.94
0.89/0.89
1.85/1.94
1.28/1.32
2.79/2.85
2.50/2.61
5.56/5.76
2.36/2.09
3.04/2.86
2.64/2.40
3.65/3.56
3.47/3.34
5.49/5.65
ns ns ns ns ns ns
15pF
35pF
15pF
35pF
15pF
35pF
0.87/0.89
0.39/0.40
0.58/0.59
0.26/0.26
0.29/0.30
0.13/0.13
1.06/1.05
0.47/0.47
0.69/0.71
0.32/0.31
0.35/0.35
0.16/0.16
1.11/1.11
0.54/0.51
0.77/0.75
0.35/0.35
0.40/0.38
0.18/0.17
V/ns
V/ns
V/ns
—
—
185
124
91
61
46
31 mA/ns mA/ns
— 62 30 16 mA/ns
1.2 pF 0.09/0.09
0.132/0.128
0.212/0.213
ns
1.2 pF 0.45/0.93
0.6/0.58
0.9/0.88
ns tpi tpi trm
1.2 pF 0.55/0.55
0.71/0.7
1.2 pF 0.38/0.38
0.58/0.61
— — —
1.03/0.98
1.014/1.07
5 ns
— ns
40 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
1
2
3
Max condition for tpr, tpo, tps and didt: wcs model, 1.1 V, IO 1.65 V, 105 °C and s0-s5=111111. Typ condition for tpr, tpo, tps and didt: typ model, 1.2 V, IO 1.8 V, 25 °C and s0-s5 = 101010. Min condition for tpr, tpo, tps and didt: bcs model, 1.3 V,
IO 1.95 V, –40 °C and s0-s5 = 000000.
Max condition for trfi and tpi: wcs model, 1.1 V, IO 1.65 V and 105 °C. Typ condition for trfi and tpi: typ model, 1.2 V, IO
1.8 V and 25 °C. Min condition for trfi and tpi: bcs model, 1.3 V, IO 1.95 V and –40 °C.
Hysteresis mode is recommended for input with transition time greater than 25 ns.
AC electrical characteristics in DDR mobile for Slow mode and ovdd=1.65-1.95V, ipp_hve=0 are placed
Table 40. AC Electrical Characteristics of DDR mobile IO Pads for Slow Mode ovdd=1.65–1.95 V (ipp_hve=0)
Parameter
Output Pad Transition Times (High Drive)
1
Output Pad Transition Times (Medium Drive)
1
Output Pad Transition Times (Low Drive)
1
Output Pad Propagation Delay (High Drive)
1
Output Pad Propagation Delay (Medium Drive)
1
Output Pad Propagation Delay (Low Drive)
1
Output Pad Slew Rate (High Drive)
1
Output Pad Slew Rate (Medium Drive)
1
Output Pad Slew Rate (Low Drive)
1
Output Pad di/dt (High Drive)
1
Output Pad di/dt (Medium drive)
1
Output Pad di/dt (Low drive)
1
Input Pad Transition Times
2
Input Pad Propagation Delay without Hysteresis
(CMOS input), 50%-50%
2
Input Pad Propagation Delay with Hysteresis
(CMOS input), 50%-50%
2
Input Pad Propagation Delay (DDR input),
50%-50%
2
Maximum Input Transition Times
3
Symbol tpr tpr tpr tpo tpo tpo tps tps tps di/dt di/dt di/dt trfi tpi
Test
Condition
Min rise/fall
Typ
Max rise/fall
Units
15pF
35pF
15pF
35pF
15pF
35pF
15pF
35pF
15pF
35pF
15pF
35pF
1.42/1.43
3.03/2.92
2.04/2.04
4.51/4.49
4.08/3.93
9.06/8.93
2.00/2.17
3.15/3.42
2.47/2.68
4.2/4.53
3.87/4.18
7.32/7.86
1.20/1.27
2.39/2.38
1.68/1.74
3.47/3.50
3.16/3.19
6.92/6.93
2.33/2.50
3.24/3.52
2.72/2.92
4.01/4.37
3.78/4.10
6.35/6.90
1.43/1.49
2.35/2.46
1.82/1.91
3.16/3.30
2.90/3.01
5.74/5.96
3.70/3.70
4.63/4.75
4.10/4.16
5.33/5.55
5.13/5.30
7.25/7.73
ns ns ns ns ns ns
15pF
35pF
15pF
35pF
15pF
35pF
0.82/0.82
0.39/0.40
0.57/0.57
0.26/0.26
0.29/0.30
0.13/0.13
0.90/0.85
0.45/0.49
0.70/0.62
0.31/0.31
0.34/0.34
0.16/0.16
0.69/0.66
0.42/0.40
0.54/0.52
0.31/0.30
0.34/0.33
0.17/0.17
V/ns
V/ns
V/ns
—
—
47
27
12
14
9
5
9
6
3 mA/ns mA/ns mA/ns
1.2 pF 0.09/0.09
0.132/0.128
0.212/0.213
ns
1.2 pF 0.45/0.93
0.6/0.58
0.9/0.88
ns tpi tpi trm
1.2 pF 0.55/0.55
0.71/0.7
1.2 pF 0.38/0.38
0.58/0.61
— — —
1.03/0.98
1.014/1.07
5 ns
— ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
41
Electrical Characteristics
1
2
3
Max condition for tpr, tpo, tps and didt: wcs model, 1.1 V, IO 1.65 V, 105 °C and s0-s5=111111. Typ condition for tpr, tpo, tps and didt: typ model, 1.2 V, IO 1.8 V, 25 °C and s0-s5=101010. Min condition for tpr, tpo, tps and didt: bcs model, 1.3 V,
IO 1.95 V, –40 °C and s0-s5=000000.
Max condition for trfi and tpi: wcs model, 1.1 V, IO 1.65 V and 105 °C. Typ condition for trfi and tpi: typ model, 1.2 V, IO
1.8 V and 25 °C. Min condition for trfi and tpi: bcs model, 1.3 V, IO 1.95 V and –40 °C.
Hysteresis mode is recommended for input with transition time greater than 25 ns.
AC electrical characteristics in DDR2 mode for Fast mode and for ovdd=1.65–1.95V, ipp_hve=0 are
.
Table 41. AC Electrical Characteristics of DDR2_clk IO Pads for Fast mode and for ovdd=1.65–1.95 V
Parameter Symbol
Test
Condition
Min rise/fall
Typ
Max rise/fall
Units
Output Pad Transition Times
1 tpr 15pF
35pF
0.58/0.57
1.29/1.28
0.45/0.44
0.97/0.93
0.45/0.45
0.82/0.85
ns
Output Pad Propagation Delay, 50%-50%
Output Pad Slew Rate
1
1 tpo tps
15pF
35pF
15pF
35pF
1.05/1.03
1.54/1.56
2.02/2.05
0.91/0.91
1.40/1.31
1.75/1.69
2.40/2.45
1.11/1.16
2.12/1.96
2.43/2.31
2.20/2.20
1.21/1.16
ns
V/ns
Output Pad di/dt
1
Input Pad Transition Times
2 di/dt trfi
—
1.2 pF
390
0.09/0.09
201
0.132/0.128
99
0.212/0.213
mA/ns ns
Input Pad Propagation Delay (DDR input),
50%-50%
2
Maximum Input Transition Times
3 tpi 1.2 pF 0.3/0.36
0.5/0.52
0.82/0.94
ns trm — — — 5 ns
1
2
3
Max condition for tpr, tpo, tps and didt: wcs model, 1.1 V, IO 1.65 V, 105 °C and s0-s5=111111. Typ condition for tpr, tpo, tps and didt: typ model, 1.2 V, IO 1.8 V, 25 °C and s0-s5=101010. Min condition for tpr, tpo, tps and didt: bcs model, 1.3 V,
IO 1.95 V, -40 °C and s0-s5=000000.
Max condition for trfi and tpi: wcs model, 1.1 V, IO 1.65 V and 105 °C. Typ condition for trfi and tpi: typ model, 1.2 V, IO 1.8
V and 25 °C. Min condition for trfi and tpi: bcs model, 1.3 V, IO 1.95 V and -40 °C.
Hysteresis mode is recommended for input with transition time greater than 25 ns.
AC electrical characteristics in DDR2 mode for Slow mode and for ovdd=1.65-1.95V, ipp_hve=0 are
.
Table 42. AC Electrical Characteristics of DDR2_clk IO Pads for Slow mode and for ovdd=1.65 – 1.95 V (ipp_hve=0)
Parameter
Output Pad Transition Times
1
Output Pad Propagation Delay, 50%-50%
1
Output Pad Slew Rate
1
Symbol
Test
Condition
Min rise/fall tpr tpo tps
15pF
35pF
15pF
35pF
15pF
35pF
0.74/0.76
1.40/1.39
1.56/1.61
2.12/2.22
1.58/1.54
0.84/0.84
Typ
0.69/0.72
1.18/1.20
2.02/2.08
2.49/2.61
1.57/1.50
0.92/0.90
Max rise/fall
1.04/1.01
1.48/1.47
3.45/3.33
4.05/3.98
0.95/0.98
0.67/0.67
Units ns ns
V/ns
42 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 42. AC Electrical Characteristics of DDR2_clk IO Pads for Slow mode and for ovdd=1.65 – 1.95 V (ipp_hve=0) (continued)
Parameter Symbol
Test
Condition
Min rise/fall
Typ
Max rise/fall
Units
Output Pad di/dt
1
Input Pad Transition Times
2 di/dt trfi
—
1.2 pF
82
0.09/0.09
40
0.132/0.128
19
0.212/0.213
mA/ns ns
Input Pad Propagation Delay (DDR input),
50%-50%
2 tpi 1.2 pF 0.3/0.36
0.5/0.52
0.82/0.94
ns
Maximum Input Transition Times
3 trm — — — 5 ns
1
2
3
Max condition for tpr, tpo, tps and didt: wcs model, 1.1 V, IO 1.65 V, 105 °C and s0-s5=111111. Typ condition for tpr, tpo, tps and didt: typ model, 1.2 V, IO 1.8 V, 25 °C and s0-s5=101010. Min condition for tpr, tpo, tps and didt: bcs model, 1.3 V,
IO 1.95 V, -40 °C and s0-s5=000000.
Max condition for trfi and tpi: wcs model, 1.1 V, IO 1.65 V and 105 °C. Typ condition for trfi and tpi: typ model, 1.2 V, IO 1.8
V and 25 °C. Min condition for trfi and tpi: bcs model, 1.3 V, IO 1.95 V and -40 °C.
Hysteresis mode is recommended for input with transition time greater than 25 ns.
AC electrical characteristics in DDR mobile for Fast mode and ovdd=1.65-1.95V, ipp_hve=0 are placed in
Table 43. AC Electrical Characteristics of DDR_clk mobile IO Pads for Fast mode and ovdd=1.65 – 1.95 V (ipp_hve=0)
Parameter
Output Pad Transition Times (High Drive)
1
Output Pad Transition Times (Medium Drive)
1
Output Pad Transition Times (Low Drive)
1
Output Pad Propagation Delay (High Drive)
1
Output Pad Propagation Delay (Medium Drive)
1
Output Pad Propagation Delay (Low Drive)
1
Output Pad Slew Rate (High Drive)
1
Output Pad Slew Rate (Medium Drive)
1
Output Pad Slew Rate (Low Drive)
1
Output Pad di/dt (High Drive)
1
Output Pad di/dt (Medium drive)
1
Symbol
Test
Condition
Min rise/fall tpr tpr tpr tpo tpo tpo tps tps tps di/dt di/dt
15pF
35pF
15pF
35pF
15pF
35pF
15pF
35pF
—
—
15pF
35pF
15pF
35pF
15pF
35pF
15pF
35pF
15pF
35pF
3.47/3.57
6.94/7.26
0.87/0.89
0.39/0.40
0.59/0.59
0.26/0.27
0.29/0.30
0.13/0.13
185
124
1.35/1.32
3.01/2.96
1.98/1.98
4.52/4.38
3.99/3.94
8.93/8.86
1.60/1.58
2.74/2.81
2.07/2.08
3.79/3.92
Typ
3.23/3.25
5.84/6.06
1.05/1.05
0.47/0.47
0.70/0.70
0.31/0.31
0.35/0.36
0.16/0.16
91
61
1.03/1.03
2.29/2.30
1.55/1.54
3.46/3.45
3.10/3.04
6.77/6.85
1.85/1.74
2.71/2.67
2.19/2.12
3.46/3.51
Max rise/fall
3.69/3.55
5.73/5.87
1.11/1.11
0.54/0.52
0.77/0.76
0.35/0.34
0.40/0.39
0.18/0.17
46
31
0.89/0.89
1.84/1.92
1.29/1.30
2.80/2.88
2.50/2.57
5.40/5.68
2.58/2.31
3.26/3.08
2.86/2.62
3.87/3.77
Units ns ns ns ns ns ns
V/ns
V/ns
V/ns mA/ns mA/ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
43
Electrical Characteristics
Table 43. AC Electrical Characteristics of DDR_clk mobile IO Pads for Fast mode and ovdd=1.65 – 1.95 V (ipp_hve=0) (continued)
Parameter Symbol
Test
Condition
Min rise/fall
Typ
Max rise/fall
Units
Output Pad di/dt (Low drive)
1
Input Pad Transition Times
2 di/dt trfi
—
1.2 pF
62
0.09/0.09
30
0.132/0.128
16
0.212/0.213
mA/ns ns
Input Pad Propagation Delay (DDR input),
50%-50%
2 tpi 1.2 pF 0.3/0.36
0.5/0.52
0.82/0.94
—
Maximum Input Transition Times
3 trm — — — 5 ns
1
2
3
Max condition for tpr, tpo, tps and didt: wcs model, 1.1 V, IO 1.65 V, 105 °C and s0-s5=111111. Typ condition for tpr, tpo, tps and didt: typ model, 1.2 V, IO 1.8 V, 25 °C and s0-s5=101010. Min condition for tpr, tpo, tps and didt: bcs model, 1.3 V,
IO 1.95 V, –40 °C and s0-s5=000000.
Max condition for trfi and tpi: wcs model, 1.1 V, IO 1.65 V and 105 °C. Typ condition for trfi and tpi: typ model, 1.2 V, IO
1.8 V and 25 °C. Min condition for trfi and tpi: bcs model, 1.3 V, IO 1.95 V and –40 °C.
Hysteresis mode is recommended for input with transition time greater than 25 ns.
AC electrical characteristics in DDR mobile for Slow mode and ovdd=1.65-1.95V, ipp_hve=0 are placed
Table 44. AC Electrical Characteristics of DDR mobile IO Pads for Slow Mode and ovdd=1.65 – 1.95 V (ipp_hve=0)
Parameter
Output Pad Transition Times (High Drive)
1
Output Pad Transition Times (Medium Drive)
1
Output Pad Transition Times (Low Drive)
1
Output Pad Propagation Delay (High Drive)
1
Output Pad Propagation Delay (Medium Drive)
1
Output Pad Propagation Delay (Low Drive)
1
Output Pad Slew Rate (High Drive)
1
Output Pad Slew Rate (Medium Drive)
1
Output Pad Slew Rate (Low Drive)
1
Output Pad di/dt (High Drive)
1
Output Pad di/dt (Medium drive)
1
Symbol
Test
Condition
Min rise/fall tpr tpr tpr tpo tpo tpo tps tps tps di/dt di/dt
15pF
35pF
15pF
35pF
15pF
35pF
15pF
35pF
—
—
15pF
35pF
15pF
35pF
15pF
35pF
15pF
35pF
15pF
35pF
3.93/4.23
7.38/7.91
0.82/0.82
0.39/0.40
0.57/0.57
0.26/0.26
0.29/0.29
0.13/0.13
47
27
1.42/1.42
3.01/2.96
2.05/2.04
4.50/4.42
4.06/3.98
8.94/8.86
2.07/2.23
3.21/3.48
2.53/2.74
4.26/4.58
Typ
3.89/4.21
6.43/7.01
0.90/0.85
0.45/0.45
0.65/0.63
0.31/0.31
0.34/0.34
0.16/0.16
14
9
1.20/1.27
2.38/2.40
1.67/1.71
3.48/3.52
3.15/3.17
6.92/6.93
2.46/2.62
3.35/3.63
2.83/3.04
4.12/4.49
Max rise/fall
Units
5.37/5.51
7.45/7.94
0.69/0.66
0.42/0.41
0.54/0.53
0.31/0.30
0.34/0.33
0.17/0.17
9
6
1.43/1.49
2.37/2.44
1.82/1.87
3.16/3.28
2.92/ 3.02
5.69/5.96
3.92/3.93
4.84/4.97
4.32/4.35
5.55/5.76
ns ns ns ns ns ns
V/ns
V/ns
V/ns mA/ns mA/ns
44 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 44. AC Electrical Characteristics of DDR mobile IO Pads for Slow Mode and ovdd=1.65 – 1.95 V (ipp_hve=0) (continued)
Parameter Symbol
Test
Condition
Min rise/fall
Typ
Max rise/fall
Units
Output Pad di/dt (Low drive)
1
Input Pad Transition Times
2 di/dt trfi
—
1.2 pF
12
0.09/0.09
5
0.132/0.128
3
0.212/0.213
mA/ns ns
Input Pad Propagation Delay (DDR input),
50%-50%
2 tpi 1.2 pF 0.3/0.36
0.5/0.52
0.82/0.94
—
Maximum Input Transition Times
3 trm — — — 5 ns
1
2
3
Max condition for tpr, tpo, tps and didt: wcs model, 1.1 V, IO 1.65 V, 105 °C and s0-s5=111111. Typ condition for tpr, tpo, tps and didt: typ model, 1.2 V, IO 1.8 V, 25 °C and s0-s5=101010. Min condition for tpr, tpo, tps and didt: bcs model, 1.3 V,
IO 1.95 V, –40 °C and s0-s5=000000.
Max condition for trfi and tpi: wcs model, 1.1 V, IO 1.65 V and 105 °C. Typ condition for trfi and tpi: typ model, 1.2 V, IO
1.8 V and 25 °C. Min condition for trfi and tpi: bcs model, 1.3 V, IO 1.95 V and –40 °C.
Hysteresis mode is recommended for input with transition time greater than 25 ns.
4.6
Module Timing
This section contains the timing and electrical parameters for the modules in the i.MX51 processor.
4.6.1
Reset Timings Parameters
shows the reset timing and
Table 45 lists the timing parameters.
RESET_IN
(Input)
CC1
Figure 12. Reset Timing Diagram
Table 45. Reset Timing Parameters
ID Parameter
CC1 Duration of RESET_IN to be qualified as valid (input slope = 5 ns)
Min
50
Max
—
Unit ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
45
Electrical Characteristics
4.6.2
WDOG Reset Timing Parameters
Figure 13 shows the WDOG reset timing and Table 46
lists the timing parameters.
WATCHDOG_RST
(Input)
CC5
Figure 13. WATCHDOG_RST Timing Diagram
Table 46. WATCHDOG_RST Timing Parameters
ID Parameter
CC5 Duration of WATCHDOG_RESET Assertion
Min
1
Max
—
NOTE
CKIL is approximately 32 kHz. T
CKIL
is one period or approximately 30
μs.
Unit
T
CKIL
4.6.3
AUDMUX Timing Parameters
The AUDMUX provides a programmable interconnect logic for voice, audio and data routing between internal serial interfaces (SSIs) and external serial interfaces (audio and voice codecs). The AC timing of
AUDMUX external pins is hence governed by the SSI module.
4.6.4
Clock Amplifier Parameters (CKIH1, CKIH2)
The input to Clock Amplifier (CAMP) is internally ac-coupled allowing direct interface to a square wave
or sinusoidal frequency source. No external series capacitors are required. Table 47 shows the CAMP
electrical parameters.
Table 47. CAMP Electrical Parameters (CKIH1, CKIH2)
Parameter
Input frequency
VIL (for square wave input)
VIH (for square wave input)
Sinusoidal input amplitude
Output duty cycle
Min
8.0
0
NVCC_PER3 - 0.25
0.4
45
Typ
—
—
—
—
50
Max
40.0
0.3
NVCC_PER3
VDD
55
Unit
MHz
V
V
Vp-p
%
46 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.6.5
DPLL Electrical Parameters
shows the DPLL electrical parameters.
Table 48. DPLL Electrical Parameters
Parameter
Reference clock frequency range
1
Test Conditions/Remarks
Reference clock frequency range after pre-divider
Output clock frequency range (dpdck_2)
Pre-division factor
2
Multiplication factor integer part
Multiplication factor numerator
3
Multiplication factor denominator
2
—
—
—
—
—
Should be less than denominator
—
Min
10
10
Typ
—
—
300
1
—
—
5 —
–67108862 —
1 —
Max
100
40
1025
16
15
67108862
67108863
Unit
MHz
MHz
MHz
—
—
—
—
Output Duty Cycle
Frequency lock time
4
(FOL mode or non-integer MF)
—
—
48.5
—
50
—
51.5
398
%
T d pdref
Phase lock time — — — 100 µ s
Frequency jitter
5
(peak value)
Phase jitter (peak value)
Power dissipation f f
—
FPL mode, integer and fractional MF dck dck
= 300 MHz @ avdd = 1.8 V, dvdd = 1.2 V
= 650 MHz @ avdd = 1.8 V, dvdd = 1.2 V
—
—
—
0.02
2.0
0.04
3.5
— 0.65 (avdd)
0.92 (dvdd)
1.98 (avdd)
1.8 (dvdd)
T dck ns mW
1
2
3
4
5
Device input range cannot exceed the electrical specifications of the CAMP, see
.
The values specified here are internal to DPLL. Inside the DPLL, a “1” is added to the value specified by the user.Therefore, the user has to enter a value “1” less than the desired value at the inputs of DPLL for PDF and MFD.
The maximum total multiplication factor (MFI + MFN/MFD) allowed is 15.Therefore, if the MFI value is 15, MFN value must be zero.
T dpdref
is the time period of the reference clock after predivider.According to the specification, the maximum lock time in FOL mode is 398 cycles of divided reference clock when DPLL starts after full reset.
Tdck is the time period of the output clock, dpdck_2.
4.6.6
NAND Flash Controller (NFC) Parameters
This section provides the relative timing requirements among different signals of NFC at the module level in the different operational modes.
Timing parameters in Figure 14 , Figure 15 , Figure 16
show the default
NFC mode (asymmetric mode) using two Flash clock cycles per one access of RE_B and WE_B. Timing parameters in
Figure 14 , Figure 15 , Figure 16
, and
mode using one Flash clock cycle per one access of RE_B and WE_B.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
47
Electrical Characteristics
With reference to the timing diagrams, a high is defined as 80% of signal value and low is defined as 20% of signal value. All parameters are given in nanoseconds. The BGA contact load used in calculations is 20 pF (except for NF16 - 40 pF) and there is max drive strength on all contacts.
All timing parameters are a function of T, which is the period of the flash_clk clock (“enfc_clk” at system level). This clock frequency can be controlled by the user, configuring CCM (SoC clock controller). The clock is derived from emi_slow_clk after single divider.
Table 49 demonstrates few examples for clock
frequency settings.
Table 49. NFC Clock Settings Examples emi_slow_clk (MHz) nfc_podf (Division Factor) enfc_clk (MHz) T—Clock Period (ns)
1
133 (max value)
133
133
1
Rounded up to whole nanoseconds.
5 (reset value)
4
3
26.6
33.25
44.33
38
31
23
NOTE
A potential limitation for minimum clock frequency may exist for some devices. When the clock frequency is too low the actual data bus capturing might occur after the specified trhoh (RE_B high to output hold) period.
Setting the clock frequency above 25.6 MHz (T = 39 ns) guarantees proper operation for devices having trhoh > 15 ns. It is also recommended to set the
NFC_FREQ_SEL Fuse accordingly to initiate the boot with 33.33 MHz clock.
Lower frequency operation can be supported for most available devices in the market, relying on data lines Bus-Keeper logic. This depends on device behavior on the data bus in the time interval between data output valid to data output high-Z state. In NAND device parameters this period is marked between trhoh and trhz (RE_B high to output high-Z). In most devices, the data transition from valid value to high-Z occurs without going through other states. Setting the data bus pads to Bus-Keeper mode in the IOMUX registers, keeps the data bus valid internally after the specified hold time, allowing proper capturing with slower clock.
48 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
NFCLE
NFCE_B
NF1
NF3
NF2
NF4
NFWE_B
NFIO[7:0]
NFCE_B
NFWE_B
NFALE
NFIO[7:0]
NFCE_B
NFWE_B
NFIO[15:0]
NF5
NF8 command
NF9
Figure 14. Command Latch Cycle Timing
NF3 NF4
NF5
NF10
NF11
NF7 NF6
NF8
NF9
Address
Figure 15. Address Latch Cycle Timing
NF3
NF5
NF10
NF11
NF8
NF9
Data to NF
Figure 16. Write Data Latch Timing
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
49
Electrical Characteristics
NFCE_B
NF14
NF13
NF15
NFRE_B
NF16 NF17
NFRB_B
NF12
NFIO[15:0] Data from NF
Figure 17. Read Data Latch Timing—Asymmetric Mode
NFCE_B
NF13
NF14
NF15
NFRE_B
NF16
NF18
NFRB_B
NF12
NFIO[15:0] Data from NF
Figure 18. Read Data Latch Timing—Symmetric Mode
50 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
NF19
NFCLE
NFCE_B
NFWE_B
NF20
NF22
NF21
NFRE_B
ID
NF9
NF10
NF11
NF12
NF13
NF14
NF15
NF16
1
NF17
3
NF18
4
NF19
NF20
NF5
NF6
NF7
NF8
NF1
NF2
NF3
NF4
NFRB_B
Figure 19. Other Timing Parameters
Table 50. NFC—Timing Characteristics
Parameter
NFCLE setup Time
NFCLE Hold Time
NFCE_B Setup Time
NFCE_B Hold Time
NFWE_B Pulse Width
NFALE Setup Time
NFALE Hold Time
Data Setup Time
Data Hold Time
Write Cycle Time
NFWE_B Hold Time
Ready to NFRE_B Low
NFRE_B Pulse Width
READ Cycle Time
NFRE_B High Hold Time
Data Setup on READ
Data Hold on READ
Data Hold on READ
CLE to RE delay
CE to RE delay
Symbol tDH tWC tWH tRR tRP tRC tREH tDSR tCLS tCLH tCS tCH tWP tALS tALH tDS tDHR tDHR tCLR tCRE
Asymmetric
Mode Min
2T-1
T-4.45
2T-1
2T-5.55
T-2.5
2T-2.7
T-4.45
T-2.25
T-6.55
2T
T-1.25
9T
1.5T-2.7
2T
0.5T-1.5
11.2+0.5T-Tdl
2
0
—
13T
T-3.45
Symmetric
Mode Min
0.5T-5.55
T
0.5T-1.25
9T
0.5T
T
0.5T-1.5
11.2-Tdl
2
—
Tdl
2
13T
1.5T-3.45
2T-1
T-4.45
T-1
0.5T-5.55
0.5T-1.5
2T-2.7
T-4.45
0.5T-2.25
Max
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
2T aclk +T
2T aclk +T
—
—
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
51
Electrical Characteristics
Table 50. NFC—Timing Characteristics (continued)
ID Parameter Symbol
Asymmetric
Mode Min
Symmetric
Mode Min
Max
NF21 WE high to RE low tWHR 14T-5.45
14T-5.45
—
NF22 WE high to busy tWB — — 6T
1
2
3
4 t
DSR
is calculated by the following formula:
Asymmetric mode: t DSR = t REpd + t Dpd +
1
/
2
T – Tdl
2
Symmetric mode: t DSR = t REpd + t Dpd – Tdl
2 t REpd + t Dpd = 11.2 ns (including clock skew) where t REpd is RE propogation delay in the chip including IO pad delay, and t Dpd is Data propogation delay from IO pad to EMI including IO pad delay. t DSR can be used to determine t REA max parameter with the following formula: t REA = 1.5T – t DSR .
Tdl is composed of 4 delay-line units each generates an equal delay with min 1.25 ns and max 1 aclk period (T aclk ). Default is 1/4 aclk period for each delay-line unit, so all 4 delay lines together generates a total of 1 aclk period. T aclk is “emi_slow_clk” of the system, which default value is 7.5 ns (133 MHz).
NF17 is defined only in asymmetric operation mode.
NF17 max value is equivalent to max t RHZ value that can be used with NFC.
T aclk is “emi_slow_clk” of the system.
NF18 is defined only in Symmetric operation mode. t
DHR
(MIN) is calculated by the following formula: Tdl
2
–
(t
REpd
+ t
Dpd
) where t REpd is RE propogation delay in the chip including IO pad delay, and t Dpd is Data propogation delay from IO pad to EMI including IO pad delay.
NF18 max value is equivalent to max t RHZ value that can be used with NFC.
T aclk is “emi_slow_clk” of the system.
4.6.7
External Interface Module (WEIM)
The following sections provide information on the WEIM.
4.6.7.1
WEIM Signal Cross Reference
is a guide to help the user identify signals in the WEIM Chapter of the i.MX51 Multimedia
Applications Processor Reference Manual (MCIMX51RM) that are the same as those mentioned in this data sheet.
Table 51. WEIM Signal Cross Reference
Reference Manual
WEIM Chapter Nomenclature
BCLK
CSx
WE_B
OE_B
BEy_B
ADV
Data Sheet Nomenclature,
Reference Manual External Signals and Pin Multiplexing Chapter, and IOMUX Controller Chapter Nomenclature
EIM_BCLK
EIM_CSx
EIM_RW
EIM_OE
EIM_EBx
EIM_LBA
52 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
ADDR
ADDR/M_DATA
DATA
WAIT_B
Table 51. WEIM Signal Cross Reference (continued)
Reference Manual
WEIM Chapter Nomenclature
Data Sheet Nomenclature,
Reference Manual External Signals and Pin Multiplexing Chapter, and IOMUX Controller Chapter Nomenclature
EIM_A[27:16], EIM_DA[15:0]
EIM_DAx (Addr/Data muxed mode)
EIM_NFC_D (Data bus shared with NAND Flash)
EIM_Dx (dedicated data bus)
EIM_WAIT
4.6.7.2
WEIM Internal Module Multiplexing
Table 52 provides WEIM internal muxing information.
38 4
Table 52. WEIM Interface Pinout in Various Configurations
A[15:0]
A[27:16]
Non Multiplexed Address/Data Mode
(MUM=0)
Multiplexed
Address/Data Mode
(MUM=1)
8-Bit
(DSZ=100)
8-Bit
(DSZ=101)
8-Bit
1
(DSZ=110
)
8-Bit
(DSZ=111
)
16-Bit
(DSZ=001)
16-Bit
(DSZ=010)
32-Bit
(DSZ=011
)
16-Bit
(DSZ=001)
32-Bit
(DSZ=011)
EIM_DA
[15:0]
EIM_A
[27:16]
EIM_DA
[15:0]
EIM_A
[27:16]
EIM_DA
[15:0]
EIM_A
[27:16]
EIM_DA
[15:0]
EIM_A
[27:16]
EIM_DA
[15:0]
EIM_A
[27:16]
EIM_DA
[15:0]
EIM_A
[27:16]
EIM_DA
[15:0]
EIM_A
[27:16]
EIM_DA
[15:0]
EIM_A
[27:16]
EIM_DA
[15:0]
NANDF_D
[11:0]
D[7:0],
EIM_EB0
NANDF_D
[7:0]
— — —
D[15:8],
EIM_EB1
D[23:16],
EIM_EB2
— NANDF_D
[15:8]
—
— —
— EIM_D
[23:16]
—
D[31:24],
EIM_EB3
— — — EIM_D
[31:24]
1
This mode is not supported due to erratum ENGcm11244.
NANDF_D
[7:0]
NANDF_D
[15:8]
—
—
—
—
EIM_D
[23:16]
EIM_D
[31:24]
NANDF_D
[7:0]
NANDF_D
[15:8]
EIM_D
[23:16]
EIM_D
[31:24]
EIM_DA
[7:0]
EIM_DA
[15:8]
—
—
EIM_DA
[7:0]
EIM_DA
[15:8]
NANDF_D
[7:0]
NANDF_D
[15:8]
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
53
Electrical Characteristics
4.6.7.3
General WEIM Timing-Synchronous Mode
Figure 20 , Figure 21 , and Table 53 specify the timings related to the WEIM module. All WEIM output
control signals may be asserted and deasserted by an internal clock synchronized to the BCLK rising edge according to corresponding assertion/negation control fields.
,
WE2
...
WE3
BCLK
WE4
WE1
WE5
Address
CSx_B
WE6
WE7
WE8 WE9
WE_B
WE10
WE11
OE_B
WE12
WE13
BEy_B
WE14 WE15
ADV_B
WE16
WE17
Output Data
Figure 20. WEIM Outputs Timing Diagram
ID Parameter
WE1 BCLK Cycle time
2
WE2 BCLK Low Level
Width
BCLK
WE18
Input Data
WE19
WE20
WAIT_B
WE21
Figure 21. WEIM Inputs Timing Diagram
Table 53. WEIM Bus Timing Parameters
1
BCD = 0 BCD = 1 BCD = 2
Min t
0.4 x t
Max Min
2 x t
0.8 x t
Max Min
3 x t
1.2 x t
Max Min
4 x t
1.6 x t
BCD = 3
Max
54 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 53. WEIM Bus Timing Parameters (continued)
1
BCD = 0 BCD = 1 BCD = 2
ID Parameter
Min Max Min Max Min Max
WE3 BCLK High Level
Width
WE4 Clock rise to address valid
3
WE5 Clock rise to address invalid
WE6 Clock rise to CSx_B valid
WE7 Clock rise to CSx_B invalid
WE8 Clock rise to WE_B
Valid
WE9 Clock rise to WE_B
Invalid
WE10 Clock rise to OE_B
Valid
WE11 Clock rise to OE_B
Invalid
WE12 Clock rise to BEy_B
Valid
WE13 Clock rise to BEy_B
Invalid
WE14 Clock rise to ADV_B
Valid
WE15 Clock rise to ADV_B
Invalid
WE16 Clock rise to Output
Data Valid
WE17 Clock rise to Output
Data Invalid
WE18 Input Data setup time to Clock rise
WE19 Input Data hold time from Clock rise
WE20 WAIT_B setup time to
Clock rise
WE21 WAIT_B hold time from Clock rise
0.4 x t 0.8 x t 1.2 x t
-0.5 x t -
1.25
0.5 x t -
1.25
-0.5 x t +
1.75
-t - 1.25
-t + 1.75
-1.5 x t -
1.25
0.5 x t + 1.75
t - 1.25
t + 1.75
1.5 x t -
1.25
-0.5 x t -
1.25
0.5 x t -
1.25
-0.5 x t +
1.75
-t - 1.25
-t + 1.75
-1.5 x t -
1.25
0.5 x t + 1.75
t - 1.25
t + 1.75
1.5 x t -
1.25
-0.5 x t -
1.25
0.5 x t -
1.25
-0.5 x t +
1.75
-t - 1.25
-t + 1.75
-1.5 x t -
1.25
0.5 x t + 1.75
t - 1.25
t + 1.75
1.5 x t -
1.25
-0.5 x t -
1.25
0.5 x t -
1.25
-0.5 x t +
1.75
-t - 1.25
-t + 1.75
-1.5 x t -
1.25
0.5 x t + 1.75
t - 1.25
t + 1.75
1.5 x t -
1.25
-0.5 x t -
1.25
0.5 x t -
1.25
-0.5 x t +
1.75
-t - 1.25
-t + 1.75
-1.5 x t -
1.25
0.5 x t + 1.75
t - 1.25
t + 1.75
1.5 x t -
1.25
-0.5 x t -
1.25
0.5 x t -
1.25
-0.5 x t +
1.75
-t - 1.25
-t + 1.75
-1.5 x t -
1.25
0.5 x t + 1.75
t - 1.25
t + 1.75
1.5 x t -
1.25
-0.5 x t -
1.25
-0.5 x t +
1.75
-t - 1.25
-t + 1.75
-1.5 x t -
1.25
0.5 x t -
1.25
2 ns
0.5 x t + 1.75
t - 1.25
t + 1.75
1.5 x t -
1.25
— 4 ns — —
-1.5 x t
+1.75
1.5 x t +
1.75
-1.5 x t +
1.75
1.5 x t +
1.75
-1.5 x t +
1.75
1.5 x t +
1.75
-1.5 x t +
1.75
1.5 x t +
1.75
-1.5 x t +
1.75
1.5 x t +
1.75
-1.5 x t +
1.75
1.5 x t +
1.75
-1.5 x t +
1.75
1.5 x t +
1.75
—
2 ns
2 ns
2 ns
—
—
—
2 ns
4 ns
2 ns
—
—
—
—
—
—
—
—
—
Min
BCD = 3
1.6 x t
Max
-2 x t -
1.25
2 x t -
1.25
-2 x t +
1.75
2 x t + 1.75
-2 x t -
1.25
2 x t -
1.25
-2 x t +
1.75
2 x t + 1.75
-2 x t -
1.25
2 x t -
1.25
-2 x t +
1.75
2 x t + 1.75
-2 x t -
1.25
2 x t -
1.25
-2 x t +
1.75
2 x t + 1.75
-2 x t -
1.25
2 x t -
1.25
-2 x t +
1.75
2 x t + 1.75
-2 x t -
1.25
2 x t -
1.25
-2 x t +
1.75
2 x t + 1.75
-2 x t -
1.25
-2 x t +
1.75
2 x t + 1.75
2 x t -
1.25
— —
—
—
—
—
—
—
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
55
Electrical Characteristics
1
2
3 t is the maximal WEIM logic (axi_clk) cycle time. The maximum allowed axi_clk frequency is 133 MHz, whereas the maximum allowed BCLK frequency is 104 MHz. As a result, if BCD = 0, axi_clk must be
≤
104 MHz. If BCD = 1, then 133 MHz is allowed for axi_clk, resulting in a BCLK of 66.5 MHz. When the clock branch to WEIM is decreased to 104 MHz, other busses are impacted which are clocked from this source. See the CCM chapter of the i.MX51 Reference Manual for a detailed clock tree description.
BCLK parameters are being measured from the 50% point, that is, high is defined as 50% of signal value and low is defined as 50% as signal value.
For signal measurements “High” is defined as 80% of signal value and “Low” is defined as 20% of signal value.
4.6.7.4
Examples of WEIM Synchronous Accesses
to
Figure 25 provide few examples of basic WEIM accesses to external memory devices with
the timing parameters mentioned previously for specific control parameters settings.
BCLK
ADDR
CSx_B
WE_B
ADV_B
OE_B
BEy_B
DATA
Last Valid Address
WE4
WE6
WE14
WE10
WE12
Address v1
WE15
WE18
D(v1)
WE5
WE7
WE11
WE13
WE19
Figure 22. Synchronous Memory Read Access, WSC=1
56 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
BCLK
ADDR
CSx_B
WE_B
ADV_B
OE_B
BEy_B
DATA
Last Valid Address
WE4
WE6
WE8
WE14
WE12
WE16
WE5
Address V1
WE7
WE9
WE15
WE13
WE17
D(V1)
Figure 23. Synchronous Memory, Write Access, WSC=1, WBEA=0, and WADVN=0
BCLK
ADDR/
M_DATA
CSx_B
WE4
WE6
WE5
Address V1
WE16 WE17
Write Data
WE7
WE8
WE9
WE_B
ADV_B
OE_B
WE14 WE15
WE10
WE11
BEy_B
Figure 24. Muxed Address/Data (A/D) Mode, Synchronous Write Access, WSC=6, ADVA=0, ADVN=1, and
ADH=1
NOTE
In 32-bit muxed address/data (A/D) mode the 16 MSBs are driven on the data bus.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
57
Electrical Characteristics
BCLK
ADDR/
M_DATA
CSx_B
WE4
Last Valid Addr
WE6
Address V1
WE5 WE19
Data
WE18
WE7
WE_B
ADV_B
OE_B
WE14 WE15
WE10
WE11
WE12
WE13
BEy_B
Figure 25. 16-Bit Muxed A/D Mode, Synchronous Read Access, WSC=7, RADVN=1, ADH=1, and OEA=0
4.6.7.5
General WEIM Timing-Asynchronous Mode
through
, and
Table 54 help to determine timing parameters relative to the chip select
(CS) state for asynchronous and DTACK WEIM accesses with corresponding WEIM bit fields and the timing parameters mentioned above.
Asynchronous read and write access length in cycles may vary from what is shown in
through
as RWSC, OEN, and CSN is configured differently. See i.MX51 reference manual for the
WEIM programming model.
58 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics start of access end of access
INT_CLK
MAXCSO
CSx_B
ADDR/
M_DATA
WE_B
ADV_B
WE31
Last Valid Address
OE_B
BEy_B
DATA[7:0]
Address V1
WE32
WE39
WE35
WE37
WE40
WE36
WE38
WE44
MAXCO
WE43
D(V1)
MAXDI
Figure 26. Asynchronous Memory Read Access (RWSC = 5)
Next Address start of access end of access
INT_CLK
CSx_B
ADDR/
M_DATA
WE_B
ADV_B
OE_B
BEy_B
MAXCSO
WE31
WE39
WE35A
WE37
Addr. V1
WE32A
WE40A
MAXDI
D(V1)
WE36
WE38
WE44
MAXCO
Figure 27. Asynchronous A/D Muxed Read Access (RWSC = 5)
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
59
Electrical Characteristics
CSx_B
ADDR/
M_DATA
WE_B
ADV_B
OE_B
BEy_B
CSx_B
ADDR
WE_B
ADV_B
OE_B
BEy_B
DATA
WE31
Last Valid Address
WE33
WE39
WE45
Address V1
WE32
WE34
WE40
WE46
WE42
D(V1)
WE41
Figure 28. Asynchronous Memory Write Access
Next Address
WE31
WE41A
Addr. V1
WE32A
WE33
WE39
WE40A
D(V1)
WE34
WE42
WE45 WE46
WE42
Figure 29. Asynchronous A/D Muxed Write Access
60 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
CSx_B
ADDR
WE_B
ADV_B
OE_B
BEy_B
DATA
DTACK
CSx_B
ADDR
WE_B
ADV_B
OE_B
BEy_B
DATA[7:0]
WE31
Last Valid Address
WE39
WE35
WE37
DTACK
Address V1
WE32
WE40
WE36
WE38
WE43
D(V1)
WE47
Figure 30. DTACK Read Access (DAP=0)
WE31
Last Valid Address
WE33
WE39
Address V1
WE32
WE34
WE40
Next Address
WE44
WE48
Next Address
WE45 WE46
WE42
D(V1)
WE41
WE47
Figure 31. DTACK Write Access (DAP=0)
WE48
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
61
Electrical Characteristics
Table 54. WEIM Asynchronous Timing Parameters Table Relative Chip Select
Ref No.
Parameter
Determination by
Synchronous measured parameters
12
WE31 CSx_B valid to Address Valid WE4 - WE6 - CSA
3
WE7 - WE5 - CSN
4
WE32 Address Invalid to CSx_B invalid
WE32A( muxed
A/D
CSx_B valid to Address Invalid t
5
+ WE4 - WE7 + (ADVN +
ADVA + 1 - CSA
WE33 CSx_B Valid to WE_B Valid WE8 - WE6 + (WEA - CSA)
WE34 WE_B Invalid to CSx_B Invalid WE7 - WE9 + (WEN - CSN)
Min
—
—
-3 + (ADVN +
ADVA + 1 - CSA)
Max
(If 133 MHz is supported by SOC)
3 - CSA
3 - CSN
—
Unit ns ns ns
—
—
3 + (WEA - CSA)
3 - (WEN_CSN) ns ns
WE35
WE35A
(muxed
A/D)
WE36
WE37
CSx_B Valid to OE_B Valid
OE_B Invalid to CSx_B Invalid
CSx_B Valid to BEy_B Valid
(Read access)
WE10 - WE6 + (OEA - CSA)
WE7 - WE11 + (OEN - CSN)
WE12 - WE6 + (RBEA - CSA)
—
—
—
3 + (OEA - CSA)
CSx_B Valid to OE_B Valid WE10 - WE6 + (OEA + RADVN
+ RADVA + ADH + 1 - CSA)
-3 + (OEA +
RADVN+RADVA+
ADH+1-CSA)
3 + (OEA +
RADVN+RADVA+AD
H+1-CSA) ns ns
3 - (OEN - CSN) ns
3 + (RBEA
6
- CSA) ns
WE38 BEy_B Invalid to CSx_B Invalid
(Read access)
WE7 - WE13 + (RBEN - CSN) — 3 - (RBEN
7
- CSN) ns
WE39
WE40
CSx_B Valid to ADV_B Valid WE14 - WE6 + (ADVA - CSA)
ADV_B Invalid to CSx_B
Invalid (ADVL is asserted)
WE7 - WE15 - CSN
—
—
3 + (ADVA - CSA)
3 - CSN ns ns ns WE40A
(muxed
A/D)
CSx_B Valid to ADV_B Invalid WE14 - WE6 + (ADVN + ADVA
+ 1 - CSA)
-3 + (ADVN +
ADVA + 1 - CSA)
3 + (ADVN + ADVA +
1 - CSA)
WE41 WE16 - WE6 - WCSA — 3 - WCSA
WE41A
(muxed
A/D)
CSx_B Valid to Output Data
Valid
CSx_B Valid to Output Data
Valid
WE16 - WE6 + (WADVN +
WADVA + ADH + 1 - WCSA)
WE17 - WE7 - CSN
—
—
3 + (WADVN +
WADVA + ADH + 1 -
WCSA)
3 - CSN WE42 Output Data Invalid to CSx_B
Invalid
MAXCO Output max. delay from internal driving ADDR/control FFs to chip outputs.
10 — —
MAXCS
O
Output max. delay from CSx internal driving FFs to CSx out.
MAXDI DATA MAXIMUM delay from chip input data to its internal FF
10
5
—
—
—
— ns ns ns ns
62 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 54. WEIM Asynchronous Timing Parameters Table Relative Chip Select
Ref No.
Parameter
Determination by
Synchronous measured parameters
12
Min
Max
(If 133 MHz is supported by SOC)
Unit
WE43 Input Data Valid to CSx_B
Invalid
MAXCO - MAXCSO + MAXDI MAXCO
-
MAXCSO +
MAXDI
0
— ns
WE44 CSx_B Invalid to Input Data invalid
0
WE45 CSx_B Valid to BEy_B Valid
(Write access)
WE12 - WE6 + (WBEA - CSA)
WE46 BEy_B Invalid to CSx_B Invalid
(Write access)
WE7 - WE13 + (WBEN - CSN)
—
—
—
3 + (WBEA - CSA)
-3 + (WBEN - CSN)
MAXDTI DTACK MAXIMUM delay from chip dtack input to its internal
FF + 2 cycles for synchronization
WE47 Dtack Active to CSx_B Invalid MAXCO - MAXCSO + MAXDTI
— —
MAXCO -
MAXCSO +
MAXDTI
—
WE48 CSx_B Invalid to Dtack invalid 0 0 —
1
2
3
4
5
6
7
Parameters WE4... WE21 value see column BCD = 0 in
All config. parameters (CSA,CSN,WBEA,WBEN,ADVA,ADVN,OEN,OEA,RBEA & RBEN) are in cycle units.
CS Assertion. This bit field determines when CS signal is asserted during read/write cycles.
CS Negation. This bit field determines when CS signal is negated during read/write cycles.
t is axi_clk cycle time.
BE Assertion. This bit field determines when BE signal is asserted during read cycles.
BE Negation. This bit field determines when BE signal is negated during read cycles.
ns ns ns
— ns ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
63
Electrical Characteristics
4.6.8
SDRAM Controller Timing Parameters
4.6.8.1
Mobile DDR SDRAM Timing Parameters
shows the basic timing parameters for mobile DDR (mDDR) SDRAM. The timing parameters for this diagram is shown in
.
DD1
SDCLK
SDCLK
DD4 DD3
DD2
CS
DD5
RAS
DD5
DD4
CAS
DD4
DD5
DD5
WE
DD6
ADDR
ROW/BA
DD7
COL/BA
Figure 32. mDDR SDRAM Basic Timing Parameters
Table 55. mDDR SDRAM Timing Parameter Table
200 MHz 166 MHz 133 MHz
ID Parameter Symbol Unit
Min Max Min Max Min Max
DD1
DD2
SDRAM clock high-level width
SDRAM clock low-level width t t
CH
CL
0.45
0.45
0.55
0.55
0.45
0.45
0.55
0.55
0.45
0.45
0.55
0.55
t t CK
CK
DD3
DD4
DD5
SDRAM clock cycle time
CS, RAS, CAS, CKE, WE setup time
CS, RAS, CAS, CKE, WE hold time t CK t IS
1 t IH
1 t IS
1
5
0.9
0.9
—
—
—
6
1.1
1.1
—
—
—
7.5
1.3
1.3
—
—
— ns ns ns
DD6 Address output setup time 0.9
— 1.1
— 1.3
— ns
DD7 Address output hold time t IH
1
0.9
— 1.1
— 1.3
— ns
1
This parameter is affected by pad timing. if the slew rate is < 1 V/ns, 0.2 ns should be added to the value. For cmos65 pads this is true for medium and low drive strengths.
64 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
shows the timing diagram for mDDR SDRAM write cycle. The timing parameters for this
.
SDCLK
SDCLK_B
DQS (output)
DD21
DD17
Data
DD18
Data
DD19
DD22
DD23
DD17
Data Data
DD18
Data Data
DD20
Data Data DQ (output)
DQM (output)
DD17
DM
DM
DD18
DM
DD17
DM DM
DD18
DM DM DM
Figure 33. mDDR SDRAM Write cycle Timing Diagram
Table 56. mDDR SDRAM Write Cycle Parameter Table
1
200 MHz
2
166 MHz 133 MHz
ID Parameter Symbol Unit
Min Max Min Max Min Max
DD17 DQ and DQM setup time to DQS
DD18 DQ and DQM hold time to DQS
DD19 Write cycle DQS falling edge to
SDCLK output setup time
DD20 Write cycle DQS falling edge to
SDCLK output hold time t t t DS t DH
3
1
DSS
DSH
0.48
0.48
0.2
0.2
—
—
—
—
0.6
0.6
0.2
0.2
—
—
—
—
0.8
0.8
0.2
0.2
—
—
—
— ns ns tCK tCK
DD21 Write command to first DQS latching transition
DD22 DQS high level width t
DQSS
0.75
1.25
0.75
1.25
0.75
1.25
tCK t DQSH 0.4
0.6
0.4
0.6
0.4
0.6
tCK
DD23 DQS low level width t DQSL 0.4
0.6
0.4
0.6
0.4
0.6
tCK
1
2
3
Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strengths is medium for SDCLK and high for address and controls.
SDRAM CLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal value and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK and SDCLK (inverted clock).
This parameter is affected by pad timing. If the slew rate is < 1 V/ns, 0.1 ns should be increased to this value.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
65
Electrical Characteristics
shows the timing diagram for mDDR SDRAM DQ versus DQS and SDCLK read cycle. The timing parameters for this diagram is shown in
.
SDCLK
SDCLK_B
DQS (input)
DD26
DD24
Data
DD25
Data Data Data Data Data Data Data
DQ (input)
Figure 34. mDDR SDRAM DQ vs. DQS and SDCLK READ Cycle Timing Diagram
Table 57. mDDR SDRAM Read Cycle Parameter Table
1
ID PARAMETER Symbol
200 MHz
2
166 MHz 133 MHz
Min Max Min Max Min Max
Unit
DD24 DQS - DQ Skew (defines the Data valid window in read cycles related to DQS)
DD25 DQS DQ in HOLD time from DQS t
DQSQ
— 0.4
— 0.75
— 0.85
ns t QH 1.75
— 2.05
— 2.6
— ns
DD26 DQS output access time from SDCLK posedge t DQSCK 2 5 2 5.5
2 6.5
ns
1
2
Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strengths is medium for SDCLK and high for address and controls
SDRAM CLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal value and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK and SDCLK (inverted clock)
66 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.6.9
DDR2 SDRAM Specific Parameters
shows the timing parameters for DDR2. The timing parameters for this diagram appear in
DDR1
SDCLK
SDCLK
DDR4
CS
DDR5
RAS
DDR5
DDR4
CAS
DDR4
DDR5
DDR5
WE
ODT/CKE
DDR6
ADDR
ROW/BA
DDR7
COL/BA
DDR4
DDR3
DDR2
Figure 35. DDR2 SDRAM Basic Timing Parameters
ID
Table 58. DDR2 SDRAM Timing Parameter Table
SDCLK = 200 MHz
Parameter Symbol
DDR1 SDRAM clock high-level width
DDR2 SDRAM clock low-level width
DDR3 SDRAM clock cycle time
DDR4 CS, RAS, CAS, CKE, WE, ODT setup time
DDR5 CS, RAS, CAS, CKE, WE, ODT hold time t CH t CL t CK t IS
1 t
Min
0.45
0.45
5
1.5
1.7
Max
0.55
0.55
—
—
—
Unit t CK t CK ns ns ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
67
Electrical Characteristics
Table 58. DDR2 SDRAM Timing Parameter Table (continued)
SDCLK = 200 MHz
ID Parameter Symbol Unit
Min Max
DDR6 Address output setup time t
1.7
— ns
DDR7 Address output hold time t
1.5
— ns
1
These values are for command/address slew rates of 1 V/ns and SDCLK / SDCLK_B differential slew rate of 2 V/ns. For different values use the settings shown in
.
0.4
0.3
0.25
0.2
0.8
0.7
0.6
0.5
0.15
0.1
2.0
1.5
1.0
0.9
4.0
3.5
3.0
2.5
Command /
Address
Slew Rate
(V/ns)
NOTE
Measurements are taken from Vref to Vref (cross-point to cross-point), but
JEDEC timings for single-ended signals are defined from Vref to Vil(ac) max or to Vih(ac) min.
Table 59. Derating Values for DDR2-400 (SDCLK = 200 MHz)
SDCLK Differential Slew Rates
1,2
Δ tlS
+187
–43
–67
–110
–175
–285
–350
–525
–800
–1450
+83
+0
–11
–25
+179
+167
+150
+125
2.0 V/ns
Δ tlH
+94
–54
–83
–125
–188
–292
–375
–500
–708
–1125
+21
+0
–14
–31
+89
+83
+75
+45
Δ tlS
+217
–13
–37
–80
–145
–255
–320
–495
–770
–1420
+209
+197
+180
+155
+113
+30
+19
+5
1.5 V/ns
Δ tlH
+124
–24
–53
–95
–158
–262
–345
–470
–678
–1095
+51
+30
+16
–1
+119
+113
+105
+75
1.0 V/ns
Δ tlH
+154
+6
–23
–65
–128
–232
–315
–440
–648
–1065
+81
+60
+46
+29
+149
+143
+135
+105
Δ tlS
+247
+17
–7
–50
–115
–225
–290
–465
–740
–1390
+239
+227
+210
+185
+143
+60
+49
+35
Unit ps ps ps ps ps ps ps ps ps ps ps ps ps ps ps ps ps ps
68 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
1
2
Test conditions are: Capacitance 15 pF for DDR contacts. Recommended drive strengths: Medium for SDCLK and High for address and controls.
SDCLK and DQS related parameters are measured from the 50% point. For example, a high is defined as 50% of the signal value and a low is defined as 50% of the signal value. DDR SDRAM CLK parameters are measured at the crossing point of
SDCLK and SDCLK_B.
shows the timing diagram for DDR2 SDRM write cycle. The timing parameters for this diagram appear in
SDCLK
SDCLK_B
DQS (output)
DQ (output)
DQM (output)
DDR20
DDR21 DDR22
DDR23
DDR17
Data
DDR18
Data
DDR17
Data Data
DDR18
Data Data
DDR19
Data Data
DDR17
DM
DM
DDR18
DM
DDR17
DM DM
DDR18
DM DM DM
Figure 36. DDR2 SDRAM Write Cycle Timing Diagram
Table 60. DDR2 SDRAM Write Cycle Parameter Table
SDCLK = 200 MHz
ID Parameter Symbol Unit
DDR17 DQ & DQM setup time to DQS
DDR18 DQ & DQM hold time to DQS
DDR19 DQS falling edge to SDCLK output setup time
DDR20 DQS falling edge SDCLK output hold time t DS t DH t DSS t DSH
Min
0.8
1
0.8
2
1.6
2.4
Max
—
—
—
—
DDR21 DQS latching rising transitions to associated clock edges
DDR22 DQS high level width t t DQSS
DQSH
-0.7
0.35
0.3
— ns tCK
DDR23 DQS low level width t DQSL 0.35
— tCK
1
2
- In order to meet these setup/hold values, write calibration should be performed to place the DQS in the middle of DQ window. The minimum window width is 1.6ns (DDR17+DDR18).
- From DDR controller perspective, the timing is the same for both differential and single ended mode.
- In order to meet these setup/hold values, write calibration should be performed to place the DQS in the middle of DQ window. The minimum window width is 1.6ns (DDR17+DDR18).
- From DDR controller perspective, the timing is the same for both differential and single ended mode.
ns ns ns ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
69
Electrical Characteristics
NOTE
Measurements are taken from Vref to Vref (cross-point to cross-point), but
JEDEC timings for single-ended signals are defined from Vref to Vil(ac) max or to Vih(ac) min.
Table 61. Derating values for DDR2 Differential DQS
1
,
2
Table 62. Derating values for DDR2 Single Ended DQS
3
,
4
1. Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strengths is medium for SDCLK and high for address and controls.
2. SDRAM CLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal value and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK and SDCLK (inverted clock).
3. Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strengths is medium for SDCLK and high for address and controls.
4. SDRAM CLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal value and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK and SDCLK (inverted clock).
70 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
shows the timing diagram for DDR2 SDRM read cycle. The timing parameters for this diagram appear in
SDCLK
SDCLK_B
DQS (input)
DDR24
DDR25
DQ (input)
DATA DATA DATA DATA DATA DATA DATA DATA
Figure 37. DDR2 SDRAM DQ versus DQS and SDCLK Read Cycle Timing Diagram
Table 63. DDR2 SDRAM Read Cycle Parameter Table
SDCLK = 200 MHz
ID Parameter Symbol Unit
Min Max
DDR24
1
DQS—DQ Skew (defines the Data valid window during read cycles related to DQS).
t DQSQ — 0.5
DDR25
2
DQ HOLD time from DQS t QH 1.8
—
1
2
The actual timing may vary depending on read calibration settings. What is actually important for the controller is
DDR25-DDR24 which results in the minimum required DQ valid window width: 1.8ns-0.5ns = 1.3ns of minimum width.
The actual timing may vary depending on read calibration settings. What is actually important for the controller is
DDR25-DDR24 which results in the minimum required DQ valid window width: 1.8ns-0.5ns = 1.3ns of minimum width.
ns ns
NOTE
It is recommended to perform read calibration process in order to achieve the best performance.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
71
Electrical Characteristics
4.7
External Peripheral Interfaces
The following sections provide information on external peripheral interfaces.
4.7.1
CSPI Timing Parameters
This section describes the timing parameters of the CSPI. The CSPI has separate timing parameters for master and slave modes. The nomenclature used with the CSPI modules and the respective routing of these signals is shown in
Table 64. CSPI Nomenclature and Routing
Module I/O Access
CSPI1
1
, USBH1, and DI1 via IOMUX eCSPI1 eCSPI2 NANDF and USBH1 via IOMUX
CSPI NANDF, USBH1, SD1, SD2, and GPIO via IOMUX
1
This set of BGA contacts is labeled CSPI, but is actually an eCSPI channel
4.7.1.1
CSPI Master Mode Timing
depicts the timing of CSPI in Master mode and
lists the CSPI Master Mode timing characteristics.
RDY
SSx
SCLK
MOSI
MISO
CS10
CS8
CS1
CS7
CS3
CS3
CS9
CS2
CS2 CS6
CS4
CS5
72
ID
CS1
CS2
CS3
CS4
Figure 38. CSPI Master Mode Timing Diagram
Table 65. CSPI Master Mode Timing Parameters
Parameter
SCLK Cycle Time
SCLK High or Low Time
SCLK Rise or Fall
1
SSx pulse width
Symbol t clk t
SW t
RISE/FALL t
CSLH
Min
60
26
—
26
Max
—
—
—
—
Unit ns ns ns ns i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 65. CSPI Master Mode Timing Parameters (continued)
ID Parameter Symbol Min
CS5 SSx Lead Time (Slave Select setup time) t
SCS
26
CS6
CS7
SSx Lag Time (SS hold time)
MOSI Propagation Delay
(C
LOAD
= 20 pF)
MISO Setup Time t t
HCS
PDmosi
26
–1
CS8 t
Smiso
5
CS9 MISO Hold Time t
Hmiso
5
CS10 RDY to SSx Time
2 t
SDRY
5
1
2
See specific I/O AC parameters
Section 4.5, “I/O AC Parameters
”
SPI_RDY is sampled internally by ipg_clk and is asynchronous to all other CSPI signals.
Max
—
—
21
—
—
—
Unit ns ns ns ns ns ns
4.7.1.2
CSPI Slave Mode Timing
depicts the timing of CSPI in Slave mode.
Table 66 lists the CSPI Slave Mode timing
characteristics.
SSx
SCLK
MISO
CS1
CS9
CS2
CS2 CS6
CS4
CS5
CS7
CS8
MOSI
ID
CS1
CS2
CS4
CS5
CS6
CS7
Figure 39. CSPI Slave Mode Timing Diagram
Table 66. CSPI Slave Mode Timing Parameters
Parameter
SCLK Cycle Time
SCLK High or Low Time
SSx pulse width
SSx Lead Time (SS setup time)
SSx Lag Time (SS hold time)
MOSI Setup Time
Symbol t clk t
SW t
CSLH t
SCS t
HCS t
Smosi
Min
60
26
26
26
26
5
Max
—
—
—
—
—
—
Unit ns ns ns ns ns ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
73
Electrical Characteristics
ID
CS8
CS9
Table 66. CSPI Slave Mode Timing Parameters (continued)
Parameter
MOSI Hold Time
MISO Propagation Delay (C
LOAD
= 20 pF)
Symbol t
Hmosi t
PDmiso
Min
5
0
Max
—
35
Unit ns ns
4.7.2
eCSPI Timing Parameters
This section describes the timing parameters of the eCSPI. The eCSPI has separate timing parameters for master and slave modes. The nomenclature used with the CSPI modules and the respective routing of these
.
4.7.2.1
eCSPI Master Mode Timing
Figure 40 depicts the timing of eCSPI in Master mode and Table 67
lists the eCSPI Master Mode timing characteristics.
eCSPIx_DRYN1
CS11 eCSPIx_CS_x eCSPIx_CLK
CS7 CS8
CS1
CS3 eCSPIx_DO
CS3
CS9 CS10 eCSPIx_DI
CS2
CS2 CS6
CS4
CS5
74
ID
CS1
CS2
CS3
CS4
CS5
CS6
CS7
Figure 40. eCSPI Master Mode Timing Diagram
Table 67. eCSPI Master Mode Timing Parameters
Parameter eCSPIx_CLK Cycle Time–Read eCSPIx_CLK Cycle Time–Write eCSPIx_CLK High or Low Time eCSPIx_CLK Rise or Fall eCSPIx_CS_x pulse width eCSPIx_CS_x Lead Time (CS setup time) eCSPIx_CS_x Lag Time (CS hold time) eCSPIx_DO Setup Time
Symbol t clk t
SW t
RISE/FALL t
CSLH t
SCS t
HCS t
Smosi
Min
5
5
15
5
60
15
6
—
Max
—
—
—
—
—
—
— i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Unit ns ns ns ns ns ns ns
ID
CS8
CS9
CS10
CS11
Table 67. eCSPI Master Mode Timing Parameters (continued)
Parameter eCSPIx_DO Hold Time eCSPIx_DI Setup Time eCSPIx_DI Hold Time eCSPIx_DRYN Setup Time
Symbol t
Hmosi t
Smiso t
Hmiso t
SDRY
Min
5
5
5
5
Electrical Characteristics
Max
—
—
—
—
Unit ns ns ns ns
4.7.2.2
eCSPI Slave Mode Timing
Figure 41 depicts the timing of eCSPI in Slave mode and Table 68 lists the eCSPI Slave Mode timing
characteristics.
eCSPIx_CS_x eCSPIx_CLK eCSPIx_DI
CS1
CS9CS10
CS3
CS3
CS7 CS8 eCSPIx_DO
CS2
CS2 CS6
CS4
CS5
ID
CS1
CS2
CS3
CS4
CS5
CS6
CS7
CS8
CS9
CS10
Figure 41. eCSPI Slave Mode Timing Diagram
Table 68. eCSPI Slave Mode Timing Parameters
Parameter eCSPIx_CLK Cycle Time–Read eCSPIx_CLK Cycle Time–Write eCSPIx_CLK High or Low Time eCSPIx_CLK Rise or Fall eCSPIx_CS_x pulse width eCSPIx_CS_x Lead Time (CS setup time) eCSPIx_CS_x Lag Time (CS hold time) eCSPIx_DO Setup Time eCSPIx_DO Hold Time eCSPIx_DI Setup Time eCSPIx_DI Hold Time
Symbol t clk t
SW t
RISE/FALL t
CSLH t
SCS t
HCS t
Smosi t
Hmosi t
Smiso t
Hmiso
Min
5
5
15
5
60
15
6
—
5
5
5
Max
—
—
—
—
—
—
—
—
—
—
Unit ns ns ns ns ns ns ns ns ns ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
75
Electrical Characteristics
4.7.3
eSDHCv2 Timing Parameters
This section describes the electrical information of the eSDHCv2.
Figure 42 depicts the timing of eSDHCv2, and Table 69
lists the eSDHCv2 timing characteristics.
SD2
SD5
SD4
SD1
MMCx_CLK
SD3
MMCx_CMD
MMCx_DAT_0
MMCx_DAT_1 output from eSDHCv2 to card
MMCx_DAT_7
SD6
SD7 SD8
MMCx_CMD
MMCx_DAT_0
......
MMCx_DAT_3
Figure 42. eSDHCv2 Timing
Table 69. eSDHCv2 Interface Timing Specification
Parameter Symbols Min ID
Card Input Clock
SD1
SD2
SD3
SD4
SD5
Clock Frequency (Low Speed)
Clock Frequency (SD/SDIO Full Speed/High Speed)
Clock Frequency (MMC Full Speed/High Speed)
Clock Frequency (Identification Mode)
Clock Low Time
Clock High Time
Clock Rise Time
Clock Fall Time f
PP
1 f
PP
2 f
PP
3 f
OD t
WL t
WH t
TLH t
THL eSDHC Output/Card Inputs CMD, DAT (Reference to CLK)
0
0
0
100
7
7
—
—
SD6
4 eSDHC Output Delay eSDHC Input / Card Outputs CMD, DAT (Reference to CLK) t
OD
–3
Max
3
3
—
—
400
25/50
20/52
400
3
Unit ns ns ns ns ns kHz
MHz
MHz kHz
76 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 69. eSDHCv2 Interface Timing Specification (continued)
ID Parameter Symbols Min Max Unit
SD7 eSDHC Input Setup Time
SD8 eSDHC Input Hold Time t
ISU t
IH
5
2.5
2.5
—
— ns ns
1
2
3
4
5
In low speed mode, card clock must be lower than 400 kHz, voltage ranges from 2.7 to 3.6 V.
In normal speed mode for SD/SDIO card, clock frequency can be any value between 0
–
25 MHz. In high-speed mode, clock frequency can be any value between 0
–
50 MHz.
In normal speed mode for MMC card, clock frequency can be any value between 0
–
20 MHz. In high-speed mode, clock frequency can be any value between 0
–
52 MHz.
Measurement taken with CLoad = 20 pF
To satisfy hold timing, the delay difference between clock input and cmd/data input must not exceed 2 ns.
4.7.4
FEC AC Timing Parameters
This section describes the electrical information of the Fast Ethernet Controller (FEC) module. The FEC is designed to support both 10 and 100 Mbps Ethernet/IEEE 802.3 networks. An external transceiver interface and transceiver function are required to complete the interface to the media. The FEC supports the 10/100 Mbps MII (18 pins in total) and the 10 Mbps-only 7-wire interface, which uses 7 of the MII pins, for connection to an external Ethernet transceiver. For the pin list of MII and 7-wire, see i.MX51
Multimedia Applications Processor Reference Manual (MCIMX51RM).
This section describes the AC timing specifications of the FEC.
4.7.4.1
MII Receive Signal Timing
The MII receive signal timing involves the FEC_RXD[3:0], FEC_RX_DV, FEC_RX_ER, and
FEC_RX_CLK signals. The receiver functions correctly up to a FEC_RX_CLK maximum frequency of
25 MHz + 1%. There is no minimum frequency requirement but the processor clock frequency must
exceed twice the FEC_RX_CLK frequency. Table 70 lists the MII receive channel signal timing
parameters and
shows MII receive signal timings.
.
Table 70. MII Receive Signal Timing
Num Characteristic
1
Min Max Unit
M1
M2
FEC_RXD[3:0], FEC_RX_DV, FEC_RX_ER to FEC_RX_CLK setup
FEC_RX_CLK to FEC_RXD[3:0], FEC_RX_DV, FEC_RX_ER hold
5
5
—
— ns ns
M3 FEC_RX_CLK pulse width high 35% 65% FEC_RX_CLK period
M4 FEC_RX_CLK pulse width low 35% 65%
1
FEC_RX_DV, FEC_RX_CLK, and FEC_RXD0 have same timing in 10 Mbps 7-wire interface mode.
FEC_RX_CLK period
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
77
Electrical Characteristics
M3
FEC_RX_CLK (input)
M4
FEC_RXD[3:0] (inputs)
FEC_RX_DV
FEC_RX_ER
M1 M2
Figure 43. MII Receive Signal Timing Diagram
4.7.4.2
MII Transmit Signal Timing
The MII transmit signal timing affects the FEC_TXD[3:0], FEC_TX_EN, FEC_TX_ER, and
FEC_TX_CLK signals. The transmitter functions correctly up to a FEC_TX_CLK maximum frequency of 25 MHz + 1%. There is no minimum frequency requirement. In addition, the processor clock frequency must exceed twice the FEC_TX_CLK frequency.
lists MII transmit channel timing parameters and
Figure 44 shows MII transmit signal timing diagram for the values listed in Table 71 .
Table 71. MII Transmit Signal Timing
Num Characteristic
1
Min Max Unit
M5
M6
FEC_TX_CLK to FEC_TXD[3:0], FEC_TX_EN, FEC_TX_ER invalid
FEC_TX_CLK to FEC_TXD[3:0], FEC_TX_EN, FEC_TX_ER valid
5
—
—
20 ns ns
M7 FEC_TX_CLK pulse width high 35% 65% FEC_TX_CLK period
M8 FEC_TX_CLK pulse width low 35% 65% FEC_TX_CLK period
1
FEC_TX_EN, FEC_TX_CLK, and FEC_TXD0 have the same timing in 10 Mbps 7-wire interface mode.
.
M7
FEC_TX_CLK (input)
M5
M8
FEC_TXD[3:0] (outputs)
FEC_TX_EN
FEC_TX_ER
M6
Figure 44. MII Transmit Signal Timing Diagram
78 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.7.4.3
MII Async Inputs Signal Timing (FEC_CRS and FEC_COL)
lists MII asynchronous inputs signal timing information.
shows MII asynchronous input timings listed in
.
Table 72. MII Async Inputs Signal Timing
Num Characteristic
M9
1
FEC_CRS to FEC_COL minimum pulse width
1
FEC_COL has the same timing in 10 Mbit 7-wire interface mode.
Min
1.5
Max
—
Unit
FEC_TX_CLK period
.
FEC_CRS, FEC_COL
M9
Figure 45. MII Async Inputs Timing Diagram
4.7.4.4
MII Serial Management Channel Timing (FEC_MDIO and FEC_MDC)
Table 73 lists MII serial management channel timings.
shows MII serial management channel timings listed in
Table 73 . The MDC frequency should be equal to or less than 2.5 MHz to be compliant
with the IEEE 802.3 MII specification. However the FEC can function correctly with a maximum MDC frequency of 15 MHz.
Table 73. MII Transmit Signal Timing
ID Characteristic
M10 FEC_MDC falling edge to FEC_MDIO output invalid (minimum propagation delay)
M11 FEC_MDC falling edge to FEC_MDIO output valid (max propagation delay)
M12 FEC_MDIO (input) to FEC_MDC rising edge setup
M13 FEC_MDIO (input) to FEC_MDC rising edge hold
M14 FEC_MDC pulse width high
M15 FEC_MDC pulse width low
Min Max Unit
0
—
—
5
18 —
0 — ns ns ns ns
40% 60% FEC_MDC period
40% 60% FEC_MDC period
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
79
Electrical Characteristics
M14
M15
FEC_MDC (output)
M10
FEC_MDIO (output)
80
M11
FEC_MDIO (input)
M12 M13
Figure 46. MII Serial Management Channel Timing Diagram
4.7.5
Frequency Pre-Multiplier (FPM) Electrical Parameters (CKIL)
The FPM is a DPLL that converts a signal operating in the kilohertz region into a clock signal operating in the megahertz region. The output of the FPM provides the reference frequency for the on-chip DPLLs.
Parameters of the FPM are listed in Table 74 .
Table 74. FPM Specifications
Parameter Min Typ Max Unit
Reference clock frequency range—CKIL
FPM output clock frequency range
32
8
32.768
—
256
33 kHz
MHz
FPM multiplication factor (test condition is changed by a factor of 2)
Lock-in time
1
128
—
—
—
1024
312.5
—
µ s
Cycle-to-cycle frequency jitter (peak to peak) — 8 20 ns
1 plrf = 1 cycle assumed missed + x cycles for reset deassert + y cycles for calibration and lock x[ts] = {2,3,5,9}; y[ts] = {7,8,10,14}; where ts is the chosen time scale of the reference clock. In this case reference clock = 32 kHz which makes ts = 0, therefore total time required for achieving lock is 10(1+2+7) cycles or 312.5 µ s.
4.7.6
High-Speed I
2
C (HS-I
2
C) Timing Parameters
This section describes the timing parameters of the HS-I
2
C module. This module can operate in the following modes: Standard, Fast and High speed.
NOTE
See the errata for the HS-I
2
C module in the i.MX51 Chip Errata. There are two standard I
2
C modules that have no errata.
i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.7.6.1
Standard and Fast Mode Timing Parameters
depicts the standard and fast mode timings of HS-I
2
C module, and
lists the timing characteristics.
IC10
IC11
IC9
SDAH
SCLH
IC2
IC8
IC4 IC7 IC3
START IC10
IC6
IC1
IC5
IC11 START STOP
Figure 47. HS-I
2
C Standard and Fast Mode Bus Timing
Table 75. HS-I
2
C Timing Parameters—Standard and Fast Mode
START
Standard Mode Fast Mode
ID Parameter Unit
Min Max Min Max
IC1 SCLH cycle time
IC2 Hold time (repeated) START condition
IC3 Set-up time for STOP condition
IC4 Data hold time
IC5 HIGH Period of SCLH Clock
IC6 LOW Period of the SCLH Clock
10
4.0
4.0
0
1
4.0
4.7
—
—
—
3.45
2
—
—
2.5
0.6
0.6
0.6
1.3
—
—
—
—
—
IC7 Set-up time for a repeated START condition
IC8 Data set-up time
4.7
250
—
—
0.6
100
3
—
— ns
IC9
IC10
IC11
Bus free time between a STOP and START condition
Rise time of both SDAH and SCLH signals
Fall time of both SDAH and SCLH signals
4.7
—
—
—
1000
300
1.3
20+0.1C
b
4
20+0.1C
b
—
300
300
µ s ns ns
IC12 Capacitive load for each bus line (C b
) — 100 — 100 pF
1
2
3
A device must internally provide a hold time of at least 300 ns for SDAH signal in order to bridge the undefined region of the falling edge of SCLH.
The maximum hold time has only to be met if the device does not stretch the LOW period (ID no IC6) of the SCLH signal
A Fast-mode I
2
C-bus device can be used in a Standard-mode I
2
C-bus system, but the requirement of Set-up time (ID No IC8) of 250 ns must then be met. This automatically is the case if the device does not stretch the LOW period of the SCLH signal.
If such a device does stretch the LOW period of the SCLH signal, it must output the next data bit to the SDAH line max_rise_time
(ID No IC10) + data_setup_time (ID No IC8) = 1000 + 250 = 1250 ns (according to the Standard-mode I
2
C-bus specification) before the SCLH line is released.
4
C b
= total capacitance of one bus line in pF.
µ s
µ s
µ s
µ s
µ s
µ s
µ s
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
81
Electrical Characteristics
4.7.6.2
High-Speed Mode Timing Parameters
depicts the high-speed mode timings of HS-I
2
lists the timing characteristics.
IC11
IC12
SDAH
IC3
IC6
IC7 IC2
SCLH IC13
START IC9
IC4
IC10 START
IC1
IC5 IC8
Figure 48. High-Speed Mode Timing
Table 76. HS-I
2
C High-Speed Mode Timing Parameters
STOP START
ID Parameter
High-Speed Mode
Unit
Min Max
IC1 SCLH cycle time
IC2 Setup time (repeated) START condition
IC3 Hold time (repeated) START condition
IC4 LOW Period of the SCLH Clock
10
160
160
160
3.4
—
—
—
MHz ns ns ns
IC5 HIGH Period of SCLH Clock
IC6
IC8
IC10
IC12
Data set-up time
IC7 Data hold time
Rise time of SCLH
IC9 Rise time of SCLH signal after a repeated START condition and after an acknowledge bit
Fall time of SCLH signal
IC11 Rise time of SDAH signal
Fall time of SDAH signal
IC13 Set-up time for STOP condition
60
10
0
1
10
10
10
10
10
160
—
—
70
40
80
40
80
80
— ns ns ns ns ns ns ns ns ns
IC14 Capacitive load for each bus line (C b
) — 100 pF
1
A device must internally provide a hold time of at least 300 ns for SDAH signal in order to bridge the undefined region of the falling edge of SCLH.
82 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.7.7
I
2
C Module Timing Parameters
This section describes the timing parameters of the I
2
C Module. Figure 49 depicts the timing of I
2 module, and
2
C Module timing characteristics.
C
IC8
IC10
IC4
IC11
IC7
IC3
IC9
I2DAT
I2CLK
IC2
START IC10
IC6
IC11 START
IC1
IC5
Figure 49. I
2
C Bus Timing
Table 77. I
2
C Module Timing Parameters
Parameter
STOP START
Standard Mode
Supply Voltage =
1.65 V–1.95 V, 2.7 V–3.3 V
Fast Mode
Supply Voltage =
2.7 V–3.3 V Unit ID
Min Max Min Max
IC1
IC2
IC3
IC4
IC5
IC6
I2CLK cycle time
Hold time (repeated) START condition
Set-up time for STOP condition
Data hold time
HIGH Period of I2CLK Clock
LOW Period of the I2CLK Clock
10
4.0
4.0
0
1
4.0
4.7
—
—
—
3.45
2
—
—
2.5
0.6
0.6
0.6
1.3
—
—
—
—
—
IC7
IC8
Set-up time for a repeated START condition
Data set-up time
4.7
250
—
—
0.6
100
3
—
— ns
IC9
IC10
IC11
Bus free time between a STOP and START condition
Rise time of both I2DAT and I2CLK signals
Fall time of both I2DAT and I2CLK signals
4.7
—
—
—
1000
300
1.3
20 + 0.1C
b
4
20 + 0.1C
b
—
300
300
µ s ns ns
IC12 Capacitive load for each bus line (C b
) — 400 — 400 pF
2
3
1
4
A device must internally provide a hold time of at least 300 ns for I2DAT signal in order to bridge the undefined region of the falling edge of I2CLK.
The maximum hold time has only to be met if the device does not stretch the LOW period (ID no IC5) of the I2CLK signal
A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system, but the requirement of Set-up time (ID No IC7) of 250 ns must be met. This automatically is the case if the device does not stretch the LOW period of the I2CLK signal.
If such a device does stretch the LOW period of the I2CLK signal, it must output the next data bit to the I2DAT line max_rise_time (IC9) + data_setup_time (IC7) = 1000 + 250 = 1250 ns (according to the Standard-mode I2C-bus specification) before the I2CLK line is released.
C b
= total capacitance of one bus line in pF.
µ s
µ s
µ s
µ s
µ s
µ s
µ s
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
83
Electrical Characteristics
4.7.8
Image Processing Unit (IPU) Module Parameters
The purpose of the IPU is to provide comprehensive support for the flow of data from an image sensor and/or to a display device. This support covers all aspects of these activities:
• Connectivity to relevant devices
— cameras, displays, graphics accelerators, and TV encoders.
• Related image processing and manipulation: display processing, image conversions, and other related functions.
• Synchronization and control capabilities such as avoidance of tearing artifacts.
4.7.8.1
Sensor Interface Timings
There are three camera timing modes supported by the IPU.
4.7.8.1.1
BT.656 and BT.1120 Video Mode
Smart camera sensors, which include imaging processing, usually support video mode transfer. They use an embedded timing syntax to replace the SENSB_VSYNC and SENSB_HSYNC signals. The timing syntax is defined by the BT.656/BT.1120 standards.
This operation mode follows the recommendations of ITU BT.656/ ITU BT.1120 specifications. The only control signal used is SENSB_PIX_CLK. Start-of-frame and active-line signals are embedded in the data stream. An active line starts with a SAV code and ends with a EAV code. In some cases, digital blanking is inserted in between EAV and SAV code. The CSI decodes and filters out the timing-coding from the data stream, thus recovering SENSB_VSYNC and SENSB_HSYNC signals for internal use. On BT.656 one component per cycle is received over the SENSB_DATA bus. On BT.1120 two components per cycle are received over the SENSB_DATA bus.
4.7.8.1.2
Gated Clock Mode
The SENSB_VSYNC, SENSB_HSYNC, and SENSB_PIX_CLK signals are used in this mode. See
.
Active Line
Start of Frame nth frame n+1th frame
SENSB_VSYNC
SENSB_HSYNC
SENSB_PIX_CLK
SENSB_DATA[19:0] invalid invalid
1st byte 1st byte
Figure 50. Gated Clock Mode Timing Diagram
84 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
A frame starts with a rising edge on SENSB_VSYNC (all the timings correspond to straight polarity of the corresponding signals). Then SENSB_HSYNC goes to high and hold for the entire line. Pixel clock is valid as long as SENSB_HSYNC is high. Data is latched at the rising edge of the valid pixel clocks.
SENSB_HSYNC goes to low at the end of line. Pixel clocks then become invalid and the CSI stops receiving data from the stream. For next line the SENSB_HSYNC timing repeats. For next frame the
SENSB_VSYNC timing repeats.
4.7.8.1.3
Non-Gated Clock Mode
The timing is the same as the gated-clock mode (described in Section 4.7.8.1.2, “Gated Clock Mode”
),
except for the SENSB_HSYNC signal, which is not used. See Figure 51 . All incoming pixel clocks are
valid and cause data to be latched into the input FIFO. The SENSB_PIX_CLK signal is inactive (states low) until valid data is going to be transmitted over the bus.
Start of Frame nth frame n+1th frame
SENSB_VSYNC
SENSB_PIX_CLK
SENSB_DATA[19:0] invalid invalid
1st byte 1st byte
Figure 51. Non-Gated Clock Mode Timing Diagram
The timing described in
Figure 51 is that of a typical sensor. Some other sensors may have a slightly
different timing. The CSI can be programmed to support rising/falling-edge triggered SENSB_VSYNC; active-high/low SENSB_HSYNC; and rising/falling-edge triggered SENSB_PIX_CLK.
4.7.8.2
Electrical Characteristics
shows the sensor interface timing diagram. SENSB_PIX_CLK signal described here is not
generated by the IPU. Table 78
shows the timing characteristics for the diagram shown in Figure 52 .
SENSB_PIX_CLK
(Sensor Output)
SENSB_DATA,
SENSB_VSYNC,
SENSB_HSYNC
IP3 IP2 1/IP1
Figure 52. Sensor Interface Timing Diagram
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
85
Electrical Characteristics
ID
IP1
IP2
IP3
Table 78. Sensor Interface Timing Characteristics
Parameter
Sensor output (pixel) clock frequency
Data and control setup time
Data and control holdup time
Symbol
Fpck
Tsu
Thd
Min
0.01
3
2
Max
120
—
—
Unit
MHz ns ns
4.7.8.3
IPU Display Interface Signal Mapping
The IPU supports a number of display output video formats. Table 79
defines the mapping of the Display
Interface Pins used during various supported video interface formats.
86 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 79. Video Signal Cross-Reference i.MX51A
LCD
Port Name
(x=1,2)
RGB,
Signal
Name
(General)
RGB/TV Signal Allocation (Example)
16-bit
RGB
18-bit
RGB
24-bit
RGB
8-bit
YCrCb
2
16-bit
YCrCb
20-bit
YCrCb
Smart
Signal
Name
DISPx_DAT0
DISPx_DAT1
DISPx_DAT2
DISPx_DAT3
DISPx_DAT4
DISPx_DAT5
DISPx_DAT6
DAT[0]
DAT[1]
DAT[2]
DAT[3]
DAT[4]
DAT[5]
DAT[6]
B[0] B[0] B[0] Y/C[0] C[0]
B[1] B[1] B[1] Y/C[1] C[1]
B[2] B[2] B[2] Y/C[2] C[2]
B[3] B[3] B[3] Y/C[3] C[3]
B[4] B[4] B[4] Y/C[4] C[4]
G[0] B[5] B[5] Y/C[5] C[5]
G[1] G[0] B[6] Y/C[6] C[6]
DISPx_DAT7
DISPx_DAT8
DAT[7]
DAT[8]
G[2]
G[3]
G[1]
G[2]
B[7]
G[0]
DISPx_DAT9 DAT[9] G[4] G[3] G[1]
DISPx_DAT10 DAT[10] G[5] G[4] G[2]
Y/C[7]
—
—
—
C[7]
Y[0]
Y[1]
Y[2]
DISPx_DAT11 DAT[11] R[0] G[5] G[3]
DISPx_DAT12 DAT[12] R[1] R[0] G[4]
DISPx_DAT13 DAT[13] R[2] R[1] G[5]
DISPx_DAT14 DAT[14] R[3] R[2] G[6]
DISPx_DAT15 DAT[15] R[4] R[3] G[7]
—
—
—
—
—
Y[3]
Y[4]
Y[5]
Y[6]
Y[7]
DISPx_DAT16 DAT[16]
DISPx_DAT17 DAT[17]
DISPx_DAT18 DAT[18]
DISPx_DAT19 DAT[19]
DISPx_DAT20 DAT[20]
DISPx_DAT21 DAT[21]
—
—
—
—
—
—
R[4] R[0]
R[5] R[1]
—
—
R[2]
R[3]
—
—
R[4]
R[5]
—
—
—
—
—
—
—
—
—
—
—
—
Y[1]
Y[2]
Y[3]
Y[4]
Y[5]
C[7]
C[8]
C[9]
Y[0]
C[0]
C[1]
C[2]
C[3]
C[4]
C[5]
C[6]
Y[6]
Y[7]
Y[8]
Y[9]
—
—
Comment
1
—
—
—
—
—
—
DAT[0] The restrictions are as follows: a) There are maximal three
DAT[1]
DAT[2] continuous groups of bits that could be independently mapped to the external bus.
DAT[3] Groups should not be overlapped.
DAT[4]
DAT[5] b) The bit order is expressed in each of the bit groups, for example
B[0] = least significant blue pixel bit
DAT[6]
DAT[7]
DAT[8]
DAT[9]
DAT[10]
DAT[11]
DAT[12]
DAT[13]
DAT[14]
DAT[15]
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
87
Electrical Characteristics
Table 79. Video Signal Cross-Reference (continued) i.MX51A
LCD
Port Name
(x=1,2)
RGB,
Signal
Name
(General)
RGB/TV Signal Allocation (Example)
16-bit
RGB
18-bit
RGB
24-bit
RGB
8-bit
YCrCb
2
16-bit
YCrCb
20-bit
YCrCb
Smart
Signal
Name
DISPx_DAT22
DISPx_DAT23
DIx_DISP_CLK
DIx_PIN1
DAT[22]
DAT[23]
—
—
—
—
R[6]
R[7]
PixCLK
—
—
—
—
—
—
—
—
—
—
—
Comment
1
— —
VSYNC_IN May be required for anti-tearing
DIx_PIN2
DIx_PIN3
DIx_PIN4
DIx_PIN5
DIx_PIN6
DIx_PIN7
DIx_PIN8
DIx_D0_CS
DIx_D1_CS
HSYNC
VSYNC
—
—
—
—
—
—
—
—
—
—
CS0
CS1
—
—
—
—
—
VSYNC out
Additional frame/row synchronous signals with programmable timing
—
Alternate mode of PWM output for contrast or brightness control
DIx_PIN11
DIx_PIN12
DIx_PIN13
DIx_PIN14
—
—
—
—
WR
RD
RS1
RS2
—
—
Register select signal
Optional RS2
DIx_PIN15 DRDY/DV DRDY Data validation/blank, data enable
DIx_PIN16
DIx_PIN17
—
Q
—
—
Additional data synchronous signals with programmable features/timing
1
2
Signal mapping (both data and control/synchronization) is flexible. The table provides examples.
This mode works in compliance with recommendation ITU-R BT.656. The timing reference signals (frame start, frame end, line start, and line end) are embedded in the 8-bit data bus. Only video data is supported, transmission of non-video related data during blanking intervals is not supported.
88 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.7.8.4
IPU Display Interface Timing
The IPU Display Interface supports two kinds of display’s accesses: synchronous and asynchronous. There are two groups of external interface pins to provide synchronous and asynchronous controls accordantly.
4.7.8.4.1
Synchronous Controls
The synchronous control is a signal that changes its value as a function either of a system or of an external clock. This control has a permanent period and a permanent wave form.
There are special physical outputs to provide synchronous controls:
• The ipp_disp_clk is a dedicated base synchronous signal that is used to generate a base display
(component, pixel) clock for a display.
• The ipp_pin_1– ipp_pin_7 are general purpose synchronous pins, that can be used to provide
HSYNC, VSYNC, DRDY or any else independent signal to a display.
The IPU has a system of internal binding counters for internal events (like HSYNC/VSYCN and so on) calculation. The internal event (local start point) is synchronized with internal DI_CLK. A suitable control starts from the local start point with predefined UP and DOWN values to calculate control’s changing points with half DI_CLK resolution. A full description of the counters system is in the IPU chapter of the
i.MX51 Multimedia Applications Processor Reference Manual (MCIMX51RM).
4.7.8.4.2
Asynchronous Controls
The asynchronous control is a data oriented signal that changes its a value with an output data according to an additional internal flags coming with the data.
There are special physical outputs to provide asynchronous controls, as follows:
• The ipp_d0_cs and ipp_d1_cspins are dedicated to provide chip select signals to two displays
• The ipp_pin_11– ipp_pin_17 are general purpose asynchronous pins, that can be used to provide
WR. RD, RS or any else data oriented signal to display.
NOTE
The IPU has independent signal generators for asynchronous signals toggling. When a DI decides to put a new asynchronous data in the bus, a new internal start (local start point) is generated. The signals generators calculate predefined UP and DOWN values to change pins states with half
DI_CLK resolution.
4.7.8.5
Synchronous Interfaces to Standard Active Matrix TFT LCD Panels
4.7.8.5.1
IPU Display Operating Signals
The IPU uses four control signals and data to operate a standard synchronous interface:
• IPP_DISP_CLK—Clock to display
• HSYNC—Horizontal synchronization
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
89
Electrical Characteristics
• VSYNC—Vertical synchronization
• DRDY—Active data
All synchronous display controls are generated on base of an internal generated “local start point”. The synchronous display controls can be placed on time axis with DI’s offset, up and down parameters. The display access can be whole number of DI clock (Tdiclk) only. The IPP_DATA can not be moved relative to the local start point.
4.7.8.5.2
LCD Interface Functional Description
depicts the LCD interface timing for a generic active matrix color TFT panel. In this figure signals are shown with negative polarity. The sequence of events for active matrix interface timing is:
• DI_CLK internal DI clock, used for calculation of other controls.
• IPP_DISP_CLK latches data into the panel on its negative edge (when positive polarity is selected).
In active mode, IPP_DISP_CLK runs continuously.
• HSYNC causes the panel to start a new line. (Usually IPP_PIN_2 is used as HSYNC)
• VSYNC causes the panel to start a new frame. It always encompasses at least one HSYNC pulse.
(Usually IPP_PIN_3 is used as VSYNC)
• DRDY acts like an output enable signal to the CRT display. This output enables the data to be shifted onto the display. When disabled, the data is invalid and the trace is off.
(For DRDY can be used either synchronous or asynchronous generic purpose pin as well.)
VSYNC
HSYNC
LINE 1 LINE 2 LINE 3 LINE 4 LINE n-1 LINE n
HSYNC
DRDY
IPP_DISP_CLK
IPP_DATA
1 2 3 m-1 m
Figure 53. Interface Timing Diagram for TFT (Active Matrix) Panels
4.7.8.5.3
TFT Panel Sync Pulse Timing Diagrams
depicts the horizontal timing (timing of one line), including both the horizontal sync pulse and the data. All shown on the figure parameters are programmable. All controls are started by corresponding
90 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics internal events—local start points. The timing diagrams correspond to inverse polarity of the
IPP_DISP_CLK signal and active-low polarity of the HSYNC, VSYNC and DRDY signals.
IP13o
IP5o IP8o IP8
IP7
IP5
DI clock
IPP_DISP_CLK
VSYNC
HSYNC
DRDY
IPP_DATA
D0 D1 Dn
IP9 IP9o IP10
IP6
Figure 54. TFT Panels Timing Diagram—Horizontal Sync Pulse
depicts the vertical timing (timing of one frame). All parameters shown in the figure are programmable.
IP13
Start of frame
End of frame
VSYNC
HSYNC
DRDY
IP11
IP14
IP12
Figure 55. TFT Panels Timing Diagram—Vertical Sync Pulse
IP15
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
91
Electrical Characteristics
shows timing characteristics of signals presented in Figure 54 and Figure 55 .
Table 80. Synchronous Display Interface Timing Characteristics (Pixel Level)
ID
IP5
IP6
IP7
IP8
IP9
Parameter Symbol Value Description
Display interface clock period Tdicp
Display pixel clock period Tdpcp
(
1
)
DISP_CLK_PER_PIXEL
×
Tdicp
Display interface clock. IPP_DISP_CLK
Time of translation of one pixel to display,
DISP_CLK_PER_PIXEL—number of pixel components in one pixel (1.n). The
DISP_CLK_PER_PIXEL is virtual parameter to define Display pixel clock period.
The DISP_CLK_PER_PIXEL is received by
DC/DI one access division to n components.
Screen width time Tsw (SCREEN_WIDTH)
×
Tdicp
HSYNC width time
Horizontal blank interval 1
IP10 Horizontal blank interval 2
IP12 Screen height
IP13 VSYNC width
IP14 Vertical blank interval 1
IP15 Vertical blank interval 2
Thsw
Thbi1
Thbi2
Tsh
Tvsw
Tvbi1
Tvbi2
(HSYNC_WIDTH)
BGXP
×
Tdicp
(SCREEN_WIDTH -
BGXP - FW)
×
Tsw
BGYP
×
Tdicp
(SCREEN_HEIGHT)
VSYNC_WIDTH
×
Tsw
(SCREEN_HEIGHT -
BGYP - FH)
×
Tsw
SCREEN_WIDTH—screen width in, interface clocks. horizontal blanking included.
The SCREEN_WIDTH should be built by suitable DI’s counter
2
.
HSYNC_WIDTH—Hsync width in DI_CLK with 0.5 DI_CLK resolution. Defined by DI’s counter.
BGXP—Width of a horizontal blanking before a first active data in a line. (in interface clocks). The BGXP should be built by suitable DI’s counter.
Width a horizontal blanking after a last active data in a line. (in interface clocks)
FW—with of active line in interface clocks.
The FW should be built by suitable DI’s counter.
SCREEN_HEIGHT— screen height in lines with blanking
The SCREEN_HEIGHT is a distance between 2 VSYNCs.
The SCREEN_HEIGHT should be built by suitable DI’s counter.
VSYNC_WIDTH—Vsync width in DI_CLK with 0.5 DI_CLK resolution. Defined by DI’s counter
BGYP—width of first Vertical blanking interval in line.The BGYP should be built by suitable DI’s counter.
width of second Vertical blanking interval in line.The FH should be built by suitable DI’s counter.
Unit ns ns ns ns ns ns ns ns ns ns
92 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 80. Synchronous Display Interface Timing Characteristics (Pixel Level) (continued)
ID Parameter
IP5o Offset of IPP_DISP_CLK
IP13o Offset of VSYNC
IP8o Offset of HSYNC
IP9o Offset of DRDY
Symbol
Todicp
Tovs
Tohs
Todrdy
Value
DISP_CLK_OFFSET
×
Tdiclk
VSYNC_OFFSET
×
Tdiclk
HSYNC_OFFSET
×
Tdiclk
DRDY_OFFSET
×
Tdiclk
Description Unit
DISP_CLK_OFFSET— offset of
IPP_DISP_CLK edges from local start point, in DI_CLK
×
2
(0.5 DI_CLK Resolution)
Defined by DISP_CLK counter
VSYNC_OFFSET—offset of Vsync edges from a local start point, when a Vsync should be active, in DI_CLK
×
2
(0.5 DI_CLK Resolution).The
VSYNC_OFFSET should be built by suitable DI’s counter.
HSYNC_OFFSET—offset of Hsync edges from a local start point, when a Hsync should be active, in DI_CLK
×
2
(0.5 DI_CLK Resolution).The
HSYNC_OFFSET should be built by suitable DI’s counter.
DRDY_OFFSET— offset of DRDY edges from a suitable local start point, when a corresponding data has been set on the bus, in DI_CLK
×
2
(0.5 DI_CLK Resolution)
The DRDY_OFFSET should be built by suitable DI’s counter.
ns ns ns ns
1
Display interface clock period immediate value.
Tdicp =
⎧
⎪
⎪
⎨
⎪
⎪
⎩
T diclk
T diclk
× floor
DI_CLK_PERIOD
,
DISP_CLK_PERIOD
DI_CLK_PERIOD
for integer
+ 0.5
±
0.5
, for fractional
DI_CLK_PERIOD
DI_CLK_PERIOD
DISP_CLK_PERIOD—number of DI_CLK per one Tdicp. Resolution 1/16 of DI_CLK
DI_CLK_PERIOD—relation of between programing clock frequency and current system clock frequency
Display interface clock period average value.
Tdicp = T diclk
×
DI_CLK_PERIOD
2
DI’s counter can define offset, period and UP/DOWN characteristic of output signal according to programed parameters of the counter. Same of parameters in the table are not defined by DI’s registers directly (by name), but can be generated by corresponding DI’s counter. The SCREEN_WIDTH is an input value for DI’s HSYNC generation counter. The distance between HSYNCs is a SCREEN_WIDTH.
The maximal accuracy of UP/DOWN edge of controls is
Accuracy =
(
0.5
×
T diclk
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
93
Electrical Characteristics
The maximal accuracy of UP/DOWN edge of IPP_DATA is
Accuracy = T diclk
±
0.75ns
The DISP_CLK_PERIOD, DI_CLK_PERIOD parameters are programmed via registers.
shows the synchronous display interface timing diagram for access level. The
DISP_CLK_DOWN and DISP_CLK_UP parameters are set by using the register.
timing characteristics for the diagram shown in
.
IP20o IP20
VSYNC
HSYNC
DRDY other controls
IPP_DISP_CLK
Tdicu Tdicd
IPP_DATA
IP16 IP17 IP19 IP18 local start point
Figure 56. Synchronous Display Interface Timing Diagram—Access Level
Table 81. Synchronous Display Interface Timing Characteristics (Access Level)
ID Parameter Symbol Min Typ
1
Tdicd
2
–Tdicu
3
Max Unit
IP16
IP17
IP18
IP19
Display interface clock low time
Display interface clock high time
Data setup time
Data holdup time
Tckl
Tckh
Tdsu
Tdhd
Tdicd-Tdicu–1.5
Tdicp–Tdicd+Tdicu–1.5
Tdicd–1.5
Tdicp–Tdicd–1.5
Tdicp–Tdicd+Tdicu
Tdicu
Tdicp–Tdicu
Tdicd–Tdicu+1.5
Tdicp–Tdicd+Tdicu+1.5
—
— ns ns ns ns
IP20o Control signals offset times (defines for each pin)
Tocsu Tocsu–1.5
Tocsu Tocsu+1.5
—
IP20 Control signals setup time to display interface clock (defines for each pin)
Tcsu Tdicd–1.5–Tocsu%Tdicp Tdicu — ns
1
The exact conditions have not been finalized, but will likely match the current customer requirement for their specific display.
These conditions may be chip specific.
94 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
2
Display interface clock down time
Tdicd =
2 diclk
× ceil
2
×
DISP_CLK_DOWN
DI_CLK_PERIOD
3
Display interface clock up time
Tdicu = --- T
2
⎛
⎝ diclk
× ceil
2
×
DISP_CLK_UP
DI_CLK_PERIOD
⎞
⎠ where CEIL(X) rounds the elements of X to the nearest integers towards infinity.
4.7.8.6
Interface to a TV Encoder
The interface has an 8-bit data bus, transferring a single 8-bit value (Y/U/V) in each cycle. The timing of the interface is described in
.
NOTE
• The frequency of the clock DISP_CLK is 27 MHz (within 10%)
• The HSYNC, VSYNC signals are active low.
• The DRDY signal is shown as active high.
• The transition to the next row is marked by the negative edge of the
HSYNC signal. It remains low for a single clock cycle
• The transition to the next field/frame is marked by the negative edge of the VSYNC signal. It remains low for at least one clock cycles
—
At a transition to an odd field (of the next frame), the negative edges of VSYNC and HSYNC coincide.
—
At a transition is to an even field (of the same frame), they do not coincide.
• The active intervals—during which data is transferred—are marked by the HSYNC signal being high.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
95
Electrical Characteristics
DISP_CLK
HSYNC
VSYNC
DRDY
IPP_DATA
Cb Y Cr Y
523 524 525
Pixel Data Timing
1 2 3
HSYNC
DRDY
VSYNC
4
Cb
5
Y
6
261
Even Field
262 263 264 265 266 267
Odd Field
268 269
HSYNC
DRDY
VSYNC
Cr
10
273
Even Field Odd Field
621 622 623
Line and Field Timing - NTSC
624 625 1 2 3 4 23
HSYNC
DRDY
VSYNC
Even Field Odd Field
308 309 310 311 312 313 314 315 316 336
HSYNC
DRDY
VSYNC
Odd Field Even Field
Line and Field Timing - PAL
Figure 57. TV Encoder Interface Timing Diagram
96 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
4.7.8.6.1
TV Encoder Performance Specifications
All the parameters in the table are defined under the following conditions:
Rset = 1.05 k
Ω ±1%, resistor on VREFOUT pin to Ground
Rload = 37.5
Ω ±1%, output load to Ground
The TV encoder output specifications are shown in
Table 82. TV Encoder Video Performance Specifications
Electrical Characteristics
DAC STATIC PERFORMANCE
Resolution
1
Integral Nonlinearity (INL)
2
Differential Nonlinearity (DNL)
Channel-to-channel gain matching
—
—
—
—
Rset = 1.05 k
Ω ±1%
Rload = 37.5
Ω±1%
DAC DYNAMIC PERFORMANCE
Spurious Free Dynamic Range (SFDR) F out
= 3.38 MHz
F samp
= 216 MHz
Spurious Free Dynamic Range (SFDR) F out
= 9.28 MHz
F samp
= 297 MHz
3
Short Term Jitter (Line to Line)
Long Term Jitter (Field to Field)
Frequency Response
Luminance Nonlinearity
Differential Gain
Differential Phase
Signal-to-Noise Ratio (SNR)
Hue Accuracy
Color Saturation Accuracy
Chroma AM Noise
Chroma PM Noise
Chroma Nonlinear Phase
Chroma Nonlinear Gain
Chroma/Luma Intermodulation
—
—
0-4.0 MHz
5.75 MHz
—
—
—
Flat field full bandwidth
—
—
—
—
—
—
—
—
—
—
—
—
—
—
1.24
—
—
—
—
–0.1
–0.7
—
—
—
—
—
—
—
—
10
1
0.6
2
1.35
59
54
0.8
1.5
–70
–47
0.5
2.5
0.1
0.5
0.35
0.6
75
2.5
3.5
—
—
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
—
2
1
—
1.45
Bits
LSBs
LSBs
%
V
—
— dBc dBc
—
—
—
—
—
—
—
—
—
—
—
—
—
0.1
0
±ns
±ns dB dB
±%
%
Degrees dB
±Degrees
±% dB dB
±Degrees
±%
±%
97
Electrical Characteristics
Table 82. TV Encoder Video Performance Specifications (continued)
Chroma/Luma Gain Inequality
Chroma/Luma Delay Inequality
—
—
—
Luma Frequency Response
Chroma Frequency Response
Luma Nonlinearity
Chroma Nonlinearity
0-30 MHz
0-15 MHz,
YCbCr 422 mode
—
—
Luma Signal-to-Noise Ratio 0-30 MHz
Chroma Signal-to-Noise Ratio 0-15 MHz
2
3
1
Guaranteed by design
Guaranteed by characterization
R set
= VREFOUT's external resistor to ground = 1.05 k
Ω
–0.2
–0.2
—
—
—
—
—
—
—
3.2
3.4
62
72
1.0
1.0
—
—
—
—
—
—
0.2
0.2
—
—
—
—
%
% dB dB
±%
±ns
— dB dB
4.7.8.7
Asynchronous Interfaces
4.7.8.7.1
Standard Parallel Interfaces
The IPU has four signal generator machines for asynchronous signal. Each machine generates IPU’s internal control levels (0 or 1) by UP and DOWN are defined in Registers. Each asynchronous pin has a dynamic connection with one of the signal generators. This connection is redefined again with a new display access (pixel/component) The IPU can generate control signals according to system 80/68 requirements. The burst length is received as a result from predefined behavior of the internal signal generator machines.
The access to a display is realized by the following:
• CS (IPP_CS) chip select
• WR (IPP_PIN_11) write strobe
• RD (IPP_PIN_12) read strobe
• RS (IPP_PIN_13) Register select (A0)
Both system 80 and system 68k interfaces are supported for all described modes as depicted in
,
, and Figure 61 . The timing images correspond to active-low IPP_CS, WR and RD
signals.
Each asynchronous access is defined by an access size parameter. This parameter can be different between different kinds of accesses. This parameter defines a length of windows, when suitable controls of the current access are valid. A pause between two different display accesses can be guaranteed by programing of suitable access sizes. There are no minimal/maximal hold/setup time hard defined by DI. Each control signal can be switched at any time during access size.
98 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
IPP_CS
RS
WR
RD
IPP_DATA
Burst access mode with sampling by CS signal
IPP_CS
RS
WR
RD
IPP_DATA
Single access mode (all control signals are not active for one display interface clock after each display access)
Figure 58. Asynchronous Parallel System 80 Interface (Type 1) Timing Diagram
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
99
Electrical Characteristics
IPP_CS
RS
WR
RD
IPP_DATA
Burst access mode with sampling by WR/RD signals
IPP_CS
RS
WR
RD
IPP_DATA
Single access mode (all control signals are not active for one display interface clock after each display access)
Figure 59. Asynchronous Parallel System 80 Interface (Type 2) Timing Diagram
100 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
IPP_CS
RS
WR
(READ/WRITE)
RD
(ENABLE)
IPP_DATA
Burst access mode with sampling by CS signal
IPP_CS
RS
WR
(READ/WRITE)
RD
(ENABLE)
IPP_DATA
Single access mode (all control signals are not active for one display interface clock after each display access)
Figure 60. Asynchronous Parallel System 68k Interface (Type 1) Timing Diagram
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
101
Electrical Characteristics
IPP_CS
RS
WR
(READ/WRITE)
RD
(ENABLE)
IPP_DATA
Burst access mode with sampling by ENABLE signal
IPP_CS
RS
WR
(READ/WRITE)
RD
(ENABLE)
IPP_DATA
Single access mode (all control signals are not active for one display interface clock after each display access)
Figure 61. Asynchronous Parallel System 68k Interface (Type 2) TIming Diagram
Display operation can be performed with IPP_WAIT signal. The DI reacts to the incoming IPP_WAIT signal with 2 DI_CLK delay. The DI finishes a current access and a next access is postponed until
IPP_WAIT release.
102 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
shows timing of the parallel interface with IPP_WAIT control.
DI clock
IPP_CS
IPP_DATA
WR
RD
IPP_WAIT
IPP_DATA_IN
IP39 waiting
Figure 62. Parallel Interface Timing Diagram—Read Wait States waiting
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
103
Electrical Characteristics
4.7.8.7.2
Asynchronous Parallel Interface Timing Parameters
depicts timing of asynchronous parallel interfaces based on the system 80 and system 68k interfaces.
shows the timing characteristics at display access level. Table 83
shows the timing characteristics at the logical level—from configuration perspective. All timing diagrams are based on active low control signals (signals polarity is controlled through the DI_DISP_SIG_POL register).
IP29 IP32
IP35
IP33
IP36
IP34
IP47 IP30 IP31
DI clock
IPP_CS
RS
WR
RD
IPP_DATA
PP_DATA_IN
A0 D0 D1
IP28a IP28d IP27
D2 D3
IP37 IP38
Figure 63. Asynchronous Parallel Interface Timing Diagram
Table 83. Asynchronous Display Interface Timing Parameters (Pixel Level)
ID Parameter Symbol
IP27 Read system cycle time Tcycr
IP28a Address Write system cycle time Tcycwa
IP28d Data Write system cycle time
IP29 RS start
Tcycwd
Tdcsrr
IP30 CS start Tdcsc
Value
ACCESS_SIZE_#
ACCESS_SIZE_#
ACCESS_SIZE_#
UP#
UP#
Description Unit predefined value in DI REGISTER ns predefined value in DI REGISTER ns predefined value in DI REGISTER ns
RS strobe switch, predefined value in DI REGISTER ns
CS strobe switch, predefined value in DI REGISTER ns
104 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 83. Asynchronous Display Interface Timing Parameters (Pixel Level) (continued)
ID Parameter Symbol Value Description
IP31
IP32
IP33
IP34
IP35
CS hold
RS hold
Read start
Read hold
Write start
Tdchc
Tdchrr
Tdcsr
Tdchr
Tdcsw
DOWN#
DOWN#
UP#
DOWN#
UP#
CS strobe release, predefined value in DI REGISTER
RS strobe release, predefined value in DI REGISTER read strobe switch, predefined value in DI REGISTER read strobe release signal, predefined value in DI REGISTER write strobe switch, predefined value in DI REGISTER
IP36 Controls hold time for write Tdchw DOWN# write strobe release, predefined value in DI REGISTER
IP37 Slave device data delay
1
Tracc Delay of incoming data Physical delay of display’s data, defined from Read access local start point
IP38
IP47
Slave device data hold time
Read time point
Troh
Tdrp
Hold time of data on the buss Time that display read data is valid in input bus
Data sampling point Point of input data sampling by DI, predefined in DC Microcode
1
This parameter is a requirement to the display connected to the IPU.
Unit
—
— ns ns ns ns ns ns
—
Table 84. Asynchronous Parallel Interface Timing Parameters (Access Level)
ID
IP27 Read system cycle time
IP28 Write system cycle time
IP29 RS start
IP30 CS start
Parameter Symbol
Tcycr
Tcycw
Min
Tdicpr–1.5
Tdicpw–1.5
Tdicpr
2
Tdicpw
3
Tdicurs
Typ
1
Tdicpr+1.5
Tdicpw+1.5
Max
Tdcsrr Tdicurs–1.5
Tdicurs+1.5
Tdcsc Tdicucs–1.5
Tdicur
Tdchc TdicdcsTdicucs–1.5
Tdicdcs
4
–Tdicucs
5
Tdchrr Tdicdrs–Tdicurs–1.5
Tdicdrs
6
–Tdicurs
7
Tdicucs+1.5
Tdicdcs–Tdicucs+1.5
Tdicdrs–Tdicurs+1.5
Unit
IP31 CS hold
IP32 RS hold ns ns
IP33 Controls setup time for read
IP34 Controls hold time for read
Tdcsr
Tdchr
Tdicur–1.5
Tdicdr–Tdicur–1.5
Tdicur
Tdicdr
8
–Tdicur
9
Tdicur+1.5
Tdicdr–Tdicur+1.5
ns ns
IP35 Controls setup time for write Tdcsw Tdicuw–1.5
IP36 Controls hold time for write Tdchw Tdicdw–Tdicuw–1.5
Tdicpw
10
–Tdicuw
11
IP37 Slave device data delay
12
Tracc 0 —
Tdicdw–Tdicuw+1.5
ns
Tdrp
13
–Tlbd
14
–Tdicur–1.5
ns
IP38 Slave device data hold time
8
Troh Tdrp–Tlbd–Tdicdr+1.5
Tdicuw
—
Tdicuw+1.5
Tdicpr–Tdicdr–1.5
ns ns ns ns ns ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
105
Electrical Characteristics
Table 84. Asynchronous Parallel Interface Timing Parameters (Access Level) (continued)
Parameter Symbol Min Typ
1
Max ID Unit
IP39 Setup time for wait signal
IP47 Read time point
Tswait
Tdrp Tdrp–1.5
—
Tdrp
—
Tdrp+1.5
— — ns
1
The exact conditions have not been finalized, but will likely match the current customer requirement for their specific display.
These conditions may be chip specific.
2
Display period value for read
Tdicpr = T
DI_CLK
× c eil
DI_CLK_PERIOD
ACCESS_SIZE is predefined in REGISTER
3
Display period value for write
Tdicpw = T
DI_CLK
× ceil DI_CLK_PERIOD
ACCESS_SIZE is predefined in REGISTER
4
Display control down for CS
Tdicdcs =
2
DI_CLK
× ceil
2
×
DISP_DOWN_#
DI_CLK_PERIOD
DISP_DOWN is predefined in REGISTER
5
Display control up for CS
Tdicucs =
1
--- T
2
⎛
⎝
DI_CLK
× ceil
2
×
DISP_UP_#
DI_CLK_PERIOD
⎞
⎠
DISP_UP is predefined in REGISTER
6
Display control down for RS
Tdicdrs =
2
DI_CLK
× ceil
2
×
DISP_DOWN_#
DI_CLK_PERIOD
DISP_DOWN is predefined in REGISTER
7
Display control up for RS
Tdicurs =
2
DI_CLK
× ceil
2
×
DISP_UP_#
DI_CLK_PERIOD
DISP_UP is predefined in REGISTER
8
Display control down for read
Tdicdr =
1
--- T
2
⎛
⎝
DI_CLK
× ceil
2
×
DISP_DOWN_#
DI_CLK_PERIOD
⎞
⎠
DISP_DOWN is predefined in REGISTER
106 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
9
Display control up for read
Tdicur =
2 DI_CLK
× ceil
2
×
DISP_UP_#
DI_CLK_PERIOD
DISP_UP is predefined in REGISTER
10
Display control down for read
Tdicdrw = --- T
2
⎛
⎝
DI_CLK
× ceil
2
×
DISP_DOWN_#
DI_CLK_PERIOD
⎞
⎠
DISP_DOWN is predefined in REGISTER
11
Display control up for write
Tdicuw = --- T
2
DI_CLK
× ceil
2
×
DISP_UP_#
DI_CLK_PERIOD
DISP_UP is predefined in REGISTER
12
This parameter is a requirement to the display connected to the IPU
13
Data read point
Tdrp = T
DI_CLK
× ce il
DI_CLK_PERIOD
Note: DISP#_READ_EN—operand of DC’s MICROCDE READ command to sample incoming data
14
Loop back delay Tlbd is the cumulative propagation delay of read controls and read data. It includes an IPU output delay, a chip-level output delay, board delays, a chip-level input delay, an IPU input delay. This value is chip specific.
4.7.8.8
Standard Serial Interfaces
The IPU supports the following types of asynchronous serial interfaces:
1. 3-wire (with bidirectional data line).
2. 4-wire (with separate data input and output lines).
3. 5-wire type 1 (with sampling RS by the serial clock).
4. 5-wire type 2 (with sampling RS by the chip select signal).
The IPU has four independent outputs and one input. The port can be configured to provide 3, 4, or 5-wire interfaces.
depicts the timing diagram of the 3-wire serial interface. The timing diagrams correspond to active-low IPP#_CS signal and the straight polarity of the IPP_CLK signal.
For this interface, a bidirectional data line is used outside the chip. The IPU still uses separate input and output data lines (IPP_IND_DISPB_SD_D and IPP_DO_DISPB_SD_D). The I/O mux should provide
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
107
Electrical Characteristics joining the internal data lines to the bidirectional external line according to the IPP_OBE_DISPB_SD_D signal provided by the IPU.
DISPB_D#_CS programed delay programed delay
DISPB_SD_D_CLK
DISPB_SD_D RW RS D7 D6 D5 D4 D3 D2 D1 D0
Preamble
Input or output data
Figure 64. 3-Wire Serial Interface Timing Diagram
depicts timing diagram of the 4-wire serial interface. For this interface, there are separate input and output data lines both inside and outside the chip.
Write
DISPB_D#_CS programed delay programed delay
DISPB_SD_D_CLK
DISPB_SD_D
(Output)
Preamble
RW RS D7 D6 D5 D4 D3 D2 D1 D0
Output data
DISPB_SD_D
(Input)
Read programed delay programed delay
DISPB_D#_CS
DISPB_SD_D_CLK
DISPB_SD_D
(Output)
DISPB_SD_D
(Input)
RW RS
Preamble
D7 D6 D5 D4 D3 D2 D1 D0
Input data
Figure 65. 4-Wire Serial Interface Timing Diagram
108 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
depicts timing of the 5-wire serial interface. For this interface, a separate RS line is added.
Write
DISPB_D#_CS programed delay programed delay
DISPB_SD_D_CLK
DISPB_SD_D
(Output)
Preamble
RW D7 D6 D5 D4 D3 D2 D1 D0
Output data
DISPB_SD_D
(Input)
DISPB_SER_RS programed delay
Read
DISPB_D#_CS programed delay programed delay
DISPB_SD_D_CLK
DISPB_SD_D
(Output)
DISPB_SD_D
(Input)
DISPB_SER_RS
RW
Preamble
D7 D6 D5 D4 D3 D2 D1 D0 programed delay
Input data
Figure 66. 5-Wire Serial Interface Timing Diagram
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
109
Electrical Characteristics
4.7.8.8.1
Asynchronous Serial Interface Timing Parameters
level.
IP73
IP72
DI clock
IPP_DISPB_DO_SD_D
IPP_DO_DISPB_SER_CS
IP71
IP70
IPP_DO_DISPB_SER_RS
IP68
IP58
IPP_IND_DISPB_SD_D
IP69
IP59
IP50, IP52
IP55, IP57,
IP61
IP60,
IP64, IP66
IP54, IP56,
IP65, IP67
IPP_DO_DISPB_SD_D_CLK
IP51,53
IP48, IP49, IP62, IP63
Figure 67. Asynchronous Serial Interface Timing Diagram
Table 85. Asynchronous Serial Interface Timing Characteristics (Access Level)
ID Parameter
IP48 Read system cycle time
IP49 Write system cycle time
IP50 Read clock low pulse width
IP51 Read clock high pulse width
Symbol
Tcycr
Tcycw
Trl
Trh
Tdicpr–1.5
Tdicpw–1.5
Min Typ
1
Tdicpr
2
Tdicpw
3
Tdicdr
4
–Tdicur
5
Tdicdr–Tdicur–1.5
Tdicpr–Tdicdr+Tdicur–1.5 Tdicpr–Tdicdr+
Tdicur
Max
Tdicpr+1.5
Tdicpw+1.5
Tdicdr–Tdicur+1.5
Tdicpr–Tdicdr+Tdicur+
1.5
Unit ns ns ns ns
110 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 85. Asynchronous Serial Interface Timing Characteristics (Access Level) (continued)
ID Parameter
IP52 Write clock low pulse width
IP53 Write clock high pulse width
IP54 Controls setup time for read
IP55 Controls hold time for read
Symbol
Twl
Twh
Tdcsr
Tdchr
Tdicur–1.5
Min
Tdicdw–Tdicuw–1.5
Tdicpw–Tdicdw+
Tdicuw–1.5
Tdicpr–Tdicdr–1.5
Typ
1
Max
Tdicdw
6
–Tdicuw
7
Tdicdw–Tdicuw+1.5
Tdicpw–Tdicdw+
Tdicuw
Tdicur
Tdicpr–Tdicdr
Tdicpw–Tdicdw+
Tdicuw+1.5
—
—
Unit ns ns ns ns
IP56 Controls setup time for write Tdcsw Tdicuw–1.5
IP57 Controls hold time for write Tdchw Tdicpw–Tdicdw–1.5
IP58 Slave device data delay
8
Tracc 0
IP59 Slave device data hold time
8
Troh Tdrp-Tlbd-Tdicdr+1.5
IP60 Write data setup time Tds Tdicdw-1.5
Tdicuw
Tdicpw–Tdicdw
— ns
— ns
Tdrp
9
–Tlbd
10
-Tdicur-1.5
ns
Tdicdw
—
— Tdicpr-Tdicdr-1.5
— ns ns
IP61 Write data hold time
IP62 Read period
IP63 Write period
IP64 Read down time
IP65 Read up time
IP66 Write down time
Tdh
Tdicpr
Tdicpw
Tdicdr
Tdicur
Tdicpw-Tdicdw-1.5
Tdicpr-1.5
Tdicpw-1.5
Tdicdr-1.5
Tdicur-1.5
Tdicpw-Tdicdw
Tdicpr
Tdicpw
Tdicdr
Tdicur
Tdicpr+1.5
Tdicpw+1.5
Tdicdr+1.5
Tdicur+1.5
— ns ns ns ns ns
Tdicdw Tdicdw-1.5
Tdicdw Tdicdw+1.5
ns
IP67 Write up time
IP68 Read time point
Tdicuw Tdicuw-1.5
Tdicuw Tdicuw+1.5
ns
Tdrp Tdrp-1.5
Tdrp Tdrp+1.5
ns
IP69 Clock offset
11
IP70 RS up time
12
IP71 RS down time
13
Toclk
Tdicurs
Toclk-1.5
Tdicurs–1.5
Toclk
Tdicurs
Toclk+1.5
Tdicurs+1.5
ns ns
Tdicdrs Tdicdrs -1.5
Tdicdrs Tdicdrs+1.5
ns
IP72 CS up time
14
Tdicucs Tdicucs –1.5
Tdicucs Tdicucs+1.5
ns
IP73 CS down time
15
Tdicdcs Tdicdcs –1.5
Tdicdcs Tdicdcs+1.5
ns
1
The exact conditions have not been finalized, but will likely match the current customer requirement for their specific display.
These conditions may be chip specific.
2
Display interface clock period value for read
Tdicpr = T
DI_CLK
× ceil
DISP#_IF_CLK_PER_RD
--------------------------------------------------------------------
DI_CLK_PERIOD
3
Display interface clock period value for write
Tdicpw = T
DI_CLK
× ce il
DI_CLK_PERIOD
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
111
Electrical Characteristics
4
Display interface clock down time for read
Tdicdr =
2 DI_CLK
× ceil
2
×
DISP_DOWN_#
DI_CLK_PERIOD
5
Display interface clock up time for read
Tdicur =
2
⎛
⎝
DI_CLK
× ceil
2
×
DISP_UP_#
DI_CLK_PERIOD
⎞
⎠
6
Display interface clock down time for write
Tdicdw =
1
--- T
2
⎛
⎝
DI_CLK
× ceil
2
×
DISP_DOWN_#
DI_CLK_PERIOD
⎞
⎠
7
Display interface clock up time for write
Tdicuw = --- T
2
DI_CLK
× ceil
2
×
DISP_UP_#
DI_CLK_PERIOD
8
This parameter is a requirement to the display connected to the IPU
9
Data read point
Tdrp = T
DI_CLK
× ce il
DI_CLK_PERIOD
DISP_RD_EN is predefined in REGISTER
10
Loop back delay Tlbd is the cumulative propagation delay of read controls and read data. It includes an IPU output delay, a chip-level output delay, board delays, a chip-level input delay, an IPU input delay. This value is chip specific.
11
Display interface clock offset value
To clk = T
DI_CLK
× ce il
DISP_CLK_OFFSET
--------------------------------------------------------
DI_CLK_PERIOD
CLK_OFFSET is predefined in REGISTER
12
Display RS up time
Tdicurs = T
DI_CLK
× ceil
DI_CLK_PERIOD
DISP_RS_UP is predefined in REGISTER
13
Display RS down time
Tdicdrs = T
DI_CLK
× ce il
DI_CLK_PERIOD
DISP_RS_DOWN is predefined in REGISTER
14
Display RS up time
Tdicucs = T
DI_CLK
× ce il
DISP_CS_UP_#
-----------------------------------------------
DI_CLK_PERIOD
DISP_CS_UP is predefined in REGISTER
112 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
15
Display RS down time
Tdicdcs =
(
T
DI_CLK
× ce il
)
DI_CLK_PERIOD
DISP_CS_DOWN is predefined in REGISTER.
4.7.9
1-Wire Timing Parameters
depicts the RPP timing and
Table 86 lists the RPP timing parameters.
One-Wire bus
(BATT_LINE)
1-WIRE Tx
“Reset Pulse”
DS2502 Tx
“Presence Pulse”
OW2
Electrical Characteristics
OW1
OW2
OW3
OW4
ID
OW1 OW3
OW4
Figure 68. Reset and Presence Pulses (RPP) Timing Diagram
Table 86. RPP Sequence Delay Comparisons Timing Parameters
Parameters
Reset Time Low
Presence Detect High
Presence Detect Low
Reset Time High
Symbol t
RSTL t
PDH t
PDL t
RSTH
Min
480
15
60
480
Typ
511
—
—
512
Max
—
60
240
—
Figure 69 depicts Write 0 Sequence timing, and Table 87 lists the timing parameters.
OW6
One-Wire bus
(BATT_LINE)
Unit
µs
µs
µs
µs
ID
OW5
OW6
OW5
Figure 69. Write 0 Sequence Timing Diagram
Table 87. WR0 Sequence Timing Parameters
Parameter
Write 0 Low Time
Transmission Time Slot
Symbol t
WR0_low t
SLOT
Min
60
OW5
Typ
100
117
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Max
120
120
Unit
µs
µs
113
Electrical Characteristics
depicts Write 1 Sequence timing,
Figure 71 depicts the Read Sequence timing, and Table 88
lists the timing parameters.
OW8
One-Wire bus
(BATT_LINE)
OW7
Figure 70. Write 1 Sequence Timing Diagram
OW8
One-Wire bus
(BATT_LINE)
ID
OW7
OW8
OW9
OW7
OW9
Figure 71. Read Sequence Timing Diagram
Table 88. WR1 /RD Timing Parameters
Parameter
Write /Read Low Time
Transmission Time Slot
Release Time
Symbol t
LOW1 t
SLOT t
RELEASE
Min
1
60
15
Typ
5
117
—
Max
15
120
45
Unit
µs
µs
µs
4.7.10
Pulse Width Modulator (PWM) Timing Parameters
This section describes the electrical information of the PWM.The PWM can be programmed to select one of three clock signals as its source frequency. The selected clock signal is passed through a prescaler before being input to the counter. The output is available at the pulse-width modulator output (PWMO) external pin.
114 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Figure 72 depicts the timing of the PWM, and Table 89 lists the PWM timing parameters.
1
2a
System Clock
2b
3a
4a
PWM Output
Figure 72. PWM Timing
Table 89. PWM Output Timing Parameter
Ref. No.
Parameter
System CLK frequency
1
1
2a
2b
3a
3b
4a
Clock high time
Clock low time
Clock fall time
Clock rise time
Output delay time
4b Output setup time
1
CL of PWMO = 30 pF
Min
0
12.29
9.91
—
—
—
8.71
3b
4b
Max ipg_clk
—
—
0.5
0.5
9.37
—
Unit
MHz ns ns ns ns ns ns
4.7.11
P-ATA Timing Parameters
This section describes the timing parameters of the Parallel ATA module which are compliant with
ATA/ATAPI-5 specification.
Parallel ATA module can work on PIO/Multi-Word DMA/Ultra DMA transfer modes. Each transfer mode has different data transfer rate, Ultra DMA mode 4 data transfer rate is up to 66 Mbyte/s. Parallel ATA module interface consist of a total of 29 pins, Some pins act on different function in different transfer mode. There are different requirements of timing relationships among the function pins conform with
ATA/ATAPI-5 specification and these requirements are configurable by the ATA module registers.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
115
Electrical Characteristics
Table 90 and Figure 73 define the AC characteristics of all the P-ATA interface signals on all data
transfer modes.
ATA Interface Signals
SI2 SI1
Figure 73. P-ATA Interface Signals Timing Diagram
Table 90. AC Characteristics of All Interface Signals
ID Parameter Symbol Min Max Unit
SI1 Rising edge slew rate for any signal on ATA interface.
1
SI2 Falling edge slew rate for any signal on ATA interface (see note)
S rise
S fall
—
—
1.25
1.25
V/ns
V/ns
SI3 Host interface signal capacitance at the host connector C host
— 20 pF
1
SRISE and SFALL shall meet this requirement when measured at the sender’s connector from 10–90% of full signal amplitude with all capacitive loads from 15
–
40 pF where all signals have the same capacitive load value.
The user needs to use level shifters for 5.0 V compatibility on the ATA interface. The i.MX51 P-ATA interface is 3.3 V compatible.
The use of bus buffers introduces delay on the bus and introduces skew between signal lines. These factors make it difficult to operate the bus at the highest speed (UDMA-4) when bus buffers are used. If fast
UDMA mode operation is needed, this may not be compatible with bus buffers.
Another area of attention is the slew rate limit imposed by the ATA specification on the ATA bus.
According to this limit, any signal driven on the bus should have a slew rate between 0.4 and 1.2 V/ns with a 40 pF load. Not many vendors of bus buffers specify slew rate of the outgoing signals.
When bus buffers are used, the ata_data bus buffer is special. This is a bidirectional bus buffer, so a direction control signal is needed. This direction control signal is ata_buffer_en. When its high, the bus should drive from host to device. When its low, the bus should drive from device to host. Steering of the signal is such that contention on the host and device tri-state busses is always avoided.
In the timing equations, some timing parameters are used. These parameters depend on the implementation of the i.MX51 P-ATA interface on silicon, the bus buffer used, the cable delay and cable skew.
116 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
shows ATA timing parameters.
Table 91. P-ATA Timing Parameters
Name Description
Value/
Contributing Factor
1
T ti_ds ti_dh tco
Bus clock period (ipg_clk_ata)
Set-up time ata_data to ata_iordy edge (UDMA-in only)
UDMA0
UDMA1
UDMA2, UDMA3
UDMA4
Hold time ata_iordy edge to ata_data (UDMA-in only)
UDMA0, UDMA1, UDMA2, UDMA3, UDMA4
Peripheral clock frequency
15 ns
10 ns
7 ns
5 ns
5.0 ns
12.0 ns Propagation delay bus clock L-to-H to ata_cs0, ata_cs1, ata_da2, ata_da1, ata_da0, ata_dior, ata_diow, ata_dmack, ata_data, ata_buffer_en tsu tsui
Set-up time ata_data to bus clock L-to-H
Set-up time ata_iordy to bus clock H-to-L thi Hold time ata_iordy to bus clock H to L tskew1 Max difference in propagation delay bus clock L-to-H to any of following signals ata_cs0, ata_cs1, ata_da2, ata_da1, ata_da0, ata_dior, ata_diow, ata_dmack, ata_data (write), ata_buffer_en tskew2 Max difference in buffer propagation delay for any of following signals ata_cs0, ata_cs1, ata_da2, ata_da1, ata_da0, ata_dior, ata_diow, ata_dmack, ata_data (write), ata_buffer_en tskew3 Max difference in buffer propagation delay for any of following signals ata_iordy, ata_data (read)
8.5 ns
8.5 ns
2.5 ns
7 ns
Transceiver
Transceiver tbuf tcable1 tcable2
Max buffer propagation delay
Cable propagation delay for ata_data
Cable propagation delay for control signals ata_dior, ata_diow, ata_iordy, ata_dmack tskew4 Max difference in cable propagation delay between ata_iordy and ata_data (read) tskew5 Max difference in cable propagation delay between (ata_dior, ata_diow, ata_dmack) and ata_cs0, ata_cs1, ata_da2, ata_da1, ata_da0, ata_data(write) tskew6 Max difference in cable propagation delay without accounting for ground bounce
1
Values provided where applicable.
Transceiver
Cable
Cable
Cable
Cable
Cable
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
117
Electrical Characteristics
4.7.11.1
PIO Mode Read Timing
shows timing for PIO read and
lists the timing parameters for PIO read.
Figure 74. PIO Read Timing Diagram
Table 92. PIO Read Timing Parameters
ATA
Parameter
Parameter
t6 tA trd t9 t5 t1 t2 t0 t6 tA trd1 t1 t2r t9 t5
—
Value
Controlling
Variable t1 (min) = time_1
×
T – (tskew1 + tskew2 + tskew5) t2 min) = time_2r
×
T – (tskew1 + tskew2 + tskew5) t9 (min) = time_9
×
T – (tskew1 + tskew2 + tskew6) t5 (min) = tco + tsu + tbuf + tbuf + tcable1 + tcable2
time_1 time_2r time_3
If not met, increase time_2
0 tA (min) = (1.5 + time_ax)
×
T – (tco + tsui + tcable2 + tcable2 + 2
× tbuf) trd1 (max) = (–trd) + (tskew3 + tskew4) trd1 (min) = (time_pio_rdx – 0.5)
(time_pio_rdx – 0.5)
×
T – (tsu + thi)
×
T > tsu + thi + tskew3 + tskew4 t0 (min) = (time_1 + time_2 + time_9)
×
T
— time_ax time_pio_rdx time_1, time_2r, time_9
118 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
shows timing for PIO write and
lists the timing parameters for PIO write.
Figure 75. Multi-word DMA (MDMA) Timing
Table 93. PIO Write Timing Parameters
ATA
Parameter
Parameter from
t4 tA t0 t9 t3 t1 t2
—
— t4 tA
— t1 t2w t9
—
—
—
Value
Controlling
Variable t1 (min) = time_1 t9 (min) = time_9 t4 (min) = time_4
×
T – (tskew1 + tskew2 + tskew5) t2 (min) = time_2w
×
T – (tskew1 + tskew2 + tskew5)
×
T – (tskew1 + tskew2 + tskew6) t3 (min) = (time_2w – time_on)
×
T – tskew1 tA = (1.5 + time_ax)
×
T – (tskew1 + tskew2 +tskew5)
×
T – (tco + tsui + tcable2 + tcable2 + 2
× tbuf) t0(min) = (time_1 + time_2 + time_9)
×
T
Avoid bus contention when switching buffer on by making ton long enough
Avoid bus contention when switching buffer off by making toff long enough
time_1 time_2w time_9
If not met, increase time_2w time_4 time_ax time_1, time_2r, time_9
—
—
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
119
Electrical Characteristics
shows timing for MDMA read,
Figure 77 shows timing for MDMA write, and Table 94 lists
the timing parameters for MDMA read and write.
Figure 76. MDMA Read Timing Diagram
Figure 77. MDMA Write Timing Diagram
ATA
Parameter tm, ti td tk t0 tg(read) tf(read) tg(write) tf(write) tL
Table 94. MDMA Read and Write Timing Parameters
Parameter from
tm td, td1 tk
— tgr tfr
—
—
—
Value tm (min) = ti (min) = time_m
×
T – (tskew1 + tskew2 + tskew5) td1.(min) = td (min) = time_d
×
T – (tskew1 + tskew2 + tskew6) tk.(min) = time_k
×
T – (tskew1 + tskew2 + tskew6) t0 (min) = (time_d + time_k)
×
T tgr (min-read) = tco + tsu + tbuf + tbuf + tcable1 + tcable2 tgr.(min-drive) = td – te(drive) tfr (min-drive) = 0 tg (min-write) = time_d
×
T – (tskew1 + tskew2 + tskew5) tf (min-write) = time_k
×
T – (tskew1 + tskew2 + tskew6) tL (max) = (time_d + time_k–2)
×
T – (tsu + tco + 2
× tbuf + 2
× tcable2)
120
Controlling
Variable time_m time_d time_k time_d, time_k time_d
— time_d time_k time_d, time_k i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
ATA
Parameter tn, tj
—
Table 94. MDMA Read and Write Timing Parameters (continued)
Parameter from
Figure 76 ,
Figure 77 tkjn ton toff
Value tn= tj= tkjn = (max(time_k,. time_jn)
×
T – (tskew1 + tskew2 + tskew6) ton = time_on toff = time_off
×
T – tskew1
×
T – tskew1
Controlling
Variable time_jn
—
4.7.11.2
Ultra DMA (UDMA) Input Timing
shows timing when the UDMA in transfer starts,
shows timing when the UDMA in
host terminates transfer, Figure 80 shows timing when the UDMA in device terminates transfer, and
Table 95 lists the timing parameters for UDMA in burst.
Figure 78. UDMA In Transfer Starts Timing Diagram
Figure 79. UDMA In Host Terminates Transfer Timing Diagram
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
121
Electrical Characteristics
Figure 80. UDMA In Device Terminates Transfer Timing Diagram
Table 95. UDMA In Burst Timing Parameters
ATA
Parameter
Parameter from
,
,
Description Controlling Variable tack tenv tack tenv tack (min) = (time_ack
×
T) – (tskew1 + tskew2) tenv (min) = (time_env tenv (max) = (time_env
×
T) – (tskew1 + tskew2)
×
T) + (tskew1 + tskew2) tds – (tskew3) – ti_ds > 0 time_ack time_env tds tdh tds1 tdh1 tskew3, ti_ds, ti_dh should be low enough tdh – (tskew3) – ti_dh > 0 tcyc trp
— tmli tzah tdzfs tcvh
— tc1 trp tx1
1 tmli1 tzah tdzfs tcvh ton toff
2
(tcyc – tskew) > T trp (min) = time_rp
×
T – (tskew1 + tskew2 + tskew6)
(time_rp
×
T) – (tco + tsu + 3T + 2
× tbuf + 2
× tcable2) > trfs (drive) tmli1 (min) = (time_mlix + 0.4)
×
T tzah (min) = (time_zah + 0.4)
×
T tdzfs = (time_dzfs
×
T) – (tskew1 + tskew2) tcvh = (time_cvh
×
T) – (tskew1 + tskew2) ton = time_on
×
T – tskew1 toff = time_off
×
T – tskew1
T big enough time_rp time_rp time_mlix time_zah time_dzfs time_cvh
—
1
2
There is a special timing requirement in the ATA host that requires the internal DIOW to go only high 3 clocks after the last active edge on the DSTROBE signal. The equation given on this line tries to capture this constraint.
Make ton and toff big enough to avoid bus contention.
122 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.7.11.3
UDMA Output Timing
shows timing when the UDMA out transfer starts,
Figure 82 shows timing when the UDMA out
host terminates transfer, Figure 83 shows timing when the UDMA out device terminates transfer, and
Table 96 lists the timing parameters for UDMA out burst.
Figure 81. UDMA Out Transfer Starts Timing Diagram
Figure 82. UDMA Out Host Terminates Transfer Timing Diagram
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
123
Electrical Characteristics tack tenv tdvs tdvh tcyc t2cyc trfs1
— tss tmli tli tli tli tcvh
—
ATA
Parameter
Figure 83. UDMA Out Device Terminates Transfer Timing Diagram
Table 96. UDMA Out Burst Timing Parameters tdvs tdvh tcyc
— trfs tdzfs tss tdzfs_mli tli1 tli2 tli3 tcvh ton toff
Parameter from
,
,
tack tenv
Value tack (min) = (time_ack
×
T) – (tskew1 + tskew2) tenv (min) = (time_env tenv (max) = (time_env
×
T) – (tskew1 + tskew2)
×
T) + (tskew1 + tskew2) tdvs = (time_dvs
×
T) – (tskew1 + tskew2) tdvs = (time_dvh
×
T) – (tskew1 + tskew2) tcyc = time_cyc
×
T – (tskew1 + tskew2) t2cyc = time_cyc
×
2
×
T trfs = 1.6
×
T + tsui + tco + tbuf + tbuf tdzfs = time_dzfs
×
T – (tskew1) tss = time_ss
×
T – (tskew1 + tskew2) tdzfs_mli =max (time_dzfs, time_mli)
×
T – (tskew1 + tskew2) tli1 > 0 tli2 > 0 tli3 > 0 tcvh = (time_cvh
×
T) – (tskew1 + tskew2) ton = time_on
×
T – tskew1 toff = time_off
×
T – tskew1
Controlling
Variable time_ack time_env time_dvs time_dvh time_cyc time_cyc
— time_dzfs time_ss
—
—
—
— time_cvh
—
124 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.7.12
SIM (Subscriber Identification Module) Timing
This section describes the electrical parameters of the SIM module. Each SIM module interface consists of 12 signals (two separate ports each containing six signals). Typically a a port uses five signals.
The interface is designed to be used with synchronous SIM cards meaning the SIM module provides the clock used by the SIM card. The clock frequency is typically 372 times the Tx/Rxdata rate, however the
SIM module can work with CLK frequencies of 16 times the Tx/Rx data rate.
There is no timing relationship between the clock and the data. The clock that the SIM module provides to the SIM card is used by the SIM card to recover the clock from the data in the same manner as standard
UART data exchanges. All six signals (5 for bi-directional Tx/Rx) of the SIM module are asynchronous to each other.
There are no required timing relationships between signals in normal mode. The SIM card is initiated by the interface device; the SIM card responds with Answer to Reset. Although the SIM interface has no defined requirements, the ISO-7816 defines reset and power-down sequences. (For detailed information, see ISO-7816.)
Table 97 defines the general timing requirements for the SIM interface.
Table 97. SIM Timing Parameters, High Drive Strength
ID Parameter
SI1
SI2
SIM Clock Frequency (SIMx_CLKy)
1
,
SIM Clock Rise Time (SIMx_CLKy)
2
SIM Clock Fall Time (SIMx_CLKy)
3
SI3
SI4 SIM Input Transition Time
(SIMx_DATAy_RX_TX, SIMx_SIMPDy)
SI5 SIM I/O Rise Time / Fall
Time(SIMx_DATAy_RX_TX)
4
SI6 SIM RST Rise Time / Fall Time(SIMx_RSTy)
5
2
3
4
5
1
50% duty cycle clock
With C = 50 pF
With C = 50 pF
With Cin = 30 pF, Cout = 30 pF
With Cin = 30 pF
Symbol
S freq
S rise
S fall
S trans
Tr/Tf
Tr/Tf
Min
0.01
—
—
10
—
—
Max
25
0.09
×
(1/S freq
)
0.09
×
(1/S freq
)
25
1
1
Unit
MHz ns ns ns
µ s
µ s
1/SI1
SIMx_CLKy
SI3 SI2
Figure 84. SIM Clock Timing Diagram
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
125
Electrical Characteristics
4.7.12.1
Reset Sequence
4.7.12.1.1
Cards with internal reset
The sequence of reset for this kind of SIM Cards is as follows (see Figure 85 ):
• After power up, the clock signal is enabled on SIMx_CLKy(time T0)
• After 200 clock cycles, RX must be high.
• The card must send a response on RX acknowledging the reset between 400 and 40000 clock cycles after T0.
SIMx_SVENy
SIMx_CLKy
SIMx_DATAy_RX_TX response
1
T0
2
400 clock cycles <
1
< 200 clock cycles
2 < 40000 clock cycles
Figure 85. Internal-Reset Card Reset Sequence
4.7.12.1.2
Cards with Active Low Reset
The sequence of reset for this kind of card is as follows (see
):
• After power-up, the clock signal is enabled on SIMx_CLKy (time T0)
• After 200 clock cycles, SIMx_DATAy_RX_TX must be high.
• SIMx_RSTy must remain Low for at least 40000 clock cycles after T0 (no response is to be received on RX during those 40000 clock cycles)
• SIMx_RSTy is set High (time T1)
• SIMx_RSTy must remain High for at least 40000 clock cycles after T1 and a response must be received on SIMx_DATAy_RX_TX between 400 and 40000 clock cycles after T1.
126 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
SIMx_SVENy
SIMx_RSTy
SIMx_CLKy
SIMx_DATAy_RX_TX response
1
2
T0
3 3
T1
400 clock cycles <
400000 clock cycles <
Figure 86. Active-Low-Reset Cards Reset Sequence
3
1
< 200 clock cycles
2 < 40000 clock cycles
4.7.12.2
Power Down Sequence
Power down sequence for SIM interface is as follows:
• SIMx_SIMPDy port detects the removal of the SIM Card
• SIMx_RSTy goes Low
• SIMx_CLKy goes Low
• SIMx_DATAy_RX_TX goes Low
• SIMx_SVENy goes Low
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
127
Electrical Characteristics
Each of these steps is done in one CKIL period (usually 32 kHz). Power-down can be started because of a SIM Card removal detection or launched by the processor.
Figure 87 and Table 98 shows the usual
timing requirements for this sequence, with Fckil = CKIL frequency value.
SI10
SIMx_SIMPDy
SIMx_RSTy
SI7
SIMx_CLKy
SI8
SIMx_DATAy_RX_TX
SI9
SIMx_SVENy
Figure 87. SmartCard Interface Power Down AC Timing
Table 98. Timing Requirements for Power Down Sequence
ID Parameter
SI7 SIM reset to SIM clock stop
SI8 SIM reset to SIM TX data low
SI9 SIM reset to SIM voltage enable low
SI10 SIM presence detect to SIM reset low
Symbol
S rst2clk
S rst2dat
S rst2ven
S pd2rst
Min
0.9
×
1/Fckil
1.8
×
1/Fckil
2.7
×
1/Fckil
0.9
×
1/Fckil
Max
1.1
×
1/Fckil
2.2
×
1/Fckil
3.3
×
1/Fckil
1.1
×
1/Fckil
Unit ns ns ns ns
128 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.7.13
SCAN JTAG Controller (SJC) Timing Parameters
Figure 88 depicts the SJC test clock input timing. Figure 89
depicts the SJC boundary scan timing.
parameters are listed in
SJ1
TCK
(Input)
VIH
SJ2
VM
SJ2
VM
VIL
SJ3
SJ3
Figure 88. Test Clock Input Timing Diagram
TCK
(Input)
Data
Inputs
VIL
VIH
SJ4
Input Data Valid
SJ5
SJ6
Data
Outputs
Output Data Valid
SJ7
Data
Outputs
SJ6
Data
Outputs
Output Data Valid
Figure 89. Boundary Scan (JTAG) Timing Diagram
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
129
Electrical Characteristics
TCK
(Input)
VIL
TDI
TMS
(Input)
TDO
(Output)
TDO
(Output)
TDO
(Output)
SJ10
SJ11
SJ8
Input Data Valid
VIH
SJ9
Output Data Valid
SJ10
Output Data Valid
Figure 90. Test Access Port Timing Diagram
130
ID
SJ4
SJ5
SJ6
SJ7
SJ8
SJ0
SJ1
SJ2
SJ3
TRST
(Input)
TCK
(Input)
SJ13
SJ12
Figure 91. TRST Timing Diagram
Table 99. JTAG Timing
Parameter
TCK frequency of operation 1/(3•T
DC
)
1
TCK cycle time in crystal mode
TCK clock pulse width measured at V
M
2
TCK rise and fall times
Boundary scan input data set-up time
Boundary scan input data hold time
TCK low to output data valid
TCK low to output high impedance
TMS, TDI data set-up time
1,2
All Frequencies
Min
5
24
—
—
5
0.001
45
22.5
—
Max
—
—
40
40
—
22
—
—
3
Unit ns ns ns ns ns
MHz ns ns ns i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 99. JTAG Timing (continued)
ID Parameter
1,2
SJ9 TMS, TDI data hold time
SJ10 TCK low to TDO data valid
SJ11 TCK low to TDO high impedance
SJ12 TRST assert time
SJ13 TRST set-up time to TCK low
1
2
T
DC
= target frequency of SJC
V
M
= mid-point voltage
All Frequencies
Min
25
—
—
100
40
Max
—
44
44
—
—
Unit
4.7.14
SPDIF Timing Parameters
shows the timing parameters for the Sony/Philips Digital Interconnect Format (SPDIF).
Table 100. SPDIF Timing
All Frequencies
Characteristics Symbol Unit
Min Max
SPDIFOUT output (load = 50 pF)
• Skew
• Transition rising
• Transition falling
SPDIFOUT output (load = 30 pF)
• Skew
• Transition rising
• Transition falling
—
— —
—
—
—
—
—
1.5
24.2
31.3
1.5
13.6
18.0
ns ns ns ns ns ns ns
4.7.15
SSI Timing Parameters
This section describes the timing parameters of the SSI module. The connectivity of the serial synchronous interfaces is summarized in
Table 101. AUDMUX Port Allocation
Port
AUDMUX port 1
AUDMUX port 2
AUDMUX port 3
AUDMUX port 4
AUDMUX port 5
Signal Nomenclature
SSI 1
SSI 2
AUD3
AUD4
AUD5
Type and Access
Internal
Internal
External—AUD3 I/O
External—EIM or CSPI1 I/O via IOMUX
External—EIM or SD1 I/O via IOMUX
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
131
Electrical Characteristics
Port
AUDMUX port 6
AUDMUX port 7
Table 101. AUDMUX Port Allocation (continued)
Signal Nomenclature
AUD6
SSI 3
Type and Access
External—EIM or DISP2 via IOMUX
Internal
NOTE
• The terms WL and BL used in the timing diagrams and tables refer to
Word Length (WL) and Bit Length (BL).
• The SSI timing diagrams use generic signal names wherein the names used in the i.MX51 Multimedia Applications Processor Reference
Manual (MCIMX51RM) are channel specific signal names. For example, a channel clock referenced in the IOMUXC chapter as
AUD3_TXC appears in the timing diagram as TXC.
4.7.15.1
SSI Transmitter Timing with Internal Clock
depicts the SSI transmitter internal clock timing and
lists the timing parameters for the SSI transmitter internal clock.
.
SS1
SS5 SS3
SS2 SS4
TXC
(Output)
SS6 SS8
TXFS (bl)
(Output)
SS10 SS12
TXFS (wl)
(Output)
SS14
SS15
SS16
SS17
SS18
TXD
(Output)
SS43
SS42
SS19
RXD
(Input)
Note: SRXD input in synchronous mode only
Figure 92. SSI Transmitter Internal Clock Timing Diagram
132 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
ID
SS12
SS14
SS15
SS16
SS17
SS18
SS19
SS1
SS2
SS3
SS4
SS5
SS6
SS8
SS10
SS42
SS43
SS52
Electrical Characteristics
Table 102. SSI Transmitter Timing with Internal Clock
Parameter Min
(Tx/Rx) CK clock period
(Tx/Rx) CK clock high period
(Tx/Rx) CK clock rise time
(Tx/Rx) CK clock low period
(Tx/Rx) CK clock fall time
(Tx) CK high to FS (bl) high
(Tx) CK high to FS (bl) low
(Tx) CK high to FS (wl) high
(Tx) CK high to FS (wl) low
(Tx/Rx) Internal FS rise time
(Tx/Rx) Internal FS fall time
(Tx) CK high to STXD valid from high impedance
(Tx) CK high to STXD high/low
(Tx) CK high to STXD high impedance
STXD rise/fall time
Internal Clock Operation
Synchronous Internal Clock Operation
SRXD setup before (Tx) CK falling
SRXD hold after (Tx) CK falling
Loading
30
0.0
—
—
—
—
—
—
—
—
—
—
—
—
81.4
36.0
—
36.0
Max
—
—
25.0
NOTE
• All the timings for the SSI are given for a non-inverted serial clock polarity (TSCKP/RSCKP = 0) and a non-inverted frame sync
(TFSI/RFSI = 0). If the polarity of the clock and/or the frame sync have been inverted, all the timing remains valid by inverting the clock signal
STCK/SRCK and/or the frame sync STFS/SRFS shown in the tables and in the figures.
• All timings are on Audiomux Pads when SSI is being used for data transfer.
• The terms WL and BL refer to Word Length (WL) and Bit Length (BL).
• ”Tx” and “Rx” refer to the Transmit and Receive sections of the SSI.
• For internal Frame Sync operation using external clock, the FS timing is same as that of Tx Data (for example, during AC97 mode of operation).
15.0
6.0
6.0
15.0
15.0
15.0
6.0
6.0
15.0
15.0
15.0
—
—
6.0
—
Unit ns ns pF ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
133
Electrical Characteristics
4.7.15.2
SSI Receiver Timing with Internal Clock
depicts the SSI receiver internal clock timing and
lists the timing parameters for the
SSI receiver internal clock.
SS1
SS2
SS5
SS4
SS3
TXC
(Output)
SS7 SS9
TXFS (bl)
(Output)
TXFS (wl)
(Output)
RXD
(Input)
SS11
SS20
SS21
SS48
SS47 SS51
SS50
SS49
RXC
(Output)
ID
SS1
SS2
SS3
SS4
SS5
SS7
SS9
SS11
SS13
SS20
SS21
Figure 93. SSI Receiver Internal Clock Timing Diagram
Table 103. SSI Receiver Timing with Internal Clock
Min Parameter
Internal Clock Operation
(Tx/Rx) CK clock period
(Tx/Rx) CK clock high period
(Tx/Rx) CK clock rise time
(Tx/Rx) CK clock low period
(Tx/Rx) CK clock fall time
(Rx) CK high to FS (bl) high
(Rx) CK high to FS (bl) low
(Rx) CK high to FS (wl) high
(Rx) CK high to FS (wl) low
SRXD setup time before (Rx) CK low
SRXD hold time after (Rx) CK low
—
—
—
—
81.4
36.0
—
36.0
—
30
0.0
SS13
Max
6.0
15.0
15.0
15.0
—
—
6.0
—
15.0
—
—
Unit ns ns ns ns ns ns ns ns ns ns ns
134 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
ID
SS47
SS48
SS49
SS50
SS51
Electrical Characteristics
Table 103. SSI Receiver Timing with Internal Clock (continued)
Parameter Min
Oversampling Clock Operation
Oversampling clock period
Oversampling clock high period
Oversampling clock rise time
Oversampling clock low period
Oversampling clock fall time
15.04
6.0
—
6.0
—
Max
—
—
3.0
—
3.0
Unit ns ns ns ns ns
NOTE
• All the timings for the SSI are given for a non-inverted serial clock polarity (TSCKP/RSCKP = 0) and a non-inverted frame sync
(TFSI/RFSI = 0). If the polarity of the clock and/or the frame sync have been inverted, all the timing remains valid by inverting the clock signal
STCK/SRCK and/or the frame sync STFS/SRFS shown in the tables and in the figures.
• All timings are on Audiomux Pads when SSI is being used for data transfer.
• “Tx” and “Rx” refer to the Transmit and Receive sections of the SSI.
• The terms WL and BL refer to Word Length (WL) and Bit Length (BL).
• For internal Frame Sync operation using external clock, the FS timing is same as that of Tx Data (for example, during AC97 mode of operation).
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
135
Electrical Characteristics
4.7.15.3
SSI Transmitter Timing with External Clock
depicts the SSI transmitter external clock timing and
lists the timing parameters for the SSI transmitter external clock.
SS22
SS23 SS25
SS26 SS24
TXC
(Input)
SS27 SS29
TXFS (bl)
(Input)
TXFS (wl)
(Input)
TXD
(Output)
SS31
SS37 SS38
SS39
SS33
SS45
SS44
RXD
(Input)
Note: SRXD Input in Synchronous mode only
SS46
Figure 94. SSI Transmitter External Clock Timing Diagram
Table 104. SSI Transmitter Timing with External Clock
Parameter Min ID
External Clock Operation
SS22 (Tx/Rx) CK clock period
SS23 (Tx/Rx) CK clock high period
SS24 (Tx/Rx) CK clock rise time
SS25 (Tx/Rx) CK clock low period
SS26 (Tx/Rx) CK clock fall time
SS27 (Tx) CK high to FS (bl) high
SS29 (Tx) CK high to FS (bl) low
SS31 (Tx) CK high to FS (wl) high
SS33 (Tx) CK high to FS (wl) low
SS37 (Tx) CK high to STXD valid from high impedance
SS38 (Tx) CK high to STXD high/low
81.4
36.0
—
36.0
—
–10.0
10.0
–10.0
10.0
—
—
Max
6.0
15.0
—
15.0
—
—
6.0
—
—
15.0
30
Unit ns ns ns ns ns ns ns ns ns ns ns
136 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 104. SSI Transmitter Timing with External Clock (continued)
ID Parameter Min
SS39 (Tx) CK high to STXD high impedance
Synchronous External Clock Operation
—
SS44 SRXD setup before (Tx) CK falling
SS45 SRXD hold after (Tx) CK falling
SS46 SRXD rise/fall time
10.0
2.0
—
Max
15.0
—
—
6.0
Unit ns ns ns ns
NOTE
• All the timings for the SSI are given for a non-inverted serial clock polarity (TSCKP/RSCKP = 0) and a non-inverted frame sync
(TFSI/RFSI = 0). If the polarity of the clock and/or the frame sync have been inverted, all the timing remains valid by inverting the clock signal
STCK/SRCK and/or the frame sync STFS/SRFS shown in the tables and in the figures.
• All timings are on Audiomux Pads when SSI is being used for data transfer.
• “Tx” and “Rx” refer to the Transmit and Receive sections of the SSI.
• The terms WL and BL refer to Word Length (WL) and Bit Length (BL).
• For internal Frame Sync operation using external clock, the FS timing is same as that of Tx Data (for example, during AC97 mode of operation).
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
137
Electrical Characteristics
4.7.15.4
SSI Receiver Timing with External Clock
depicts the SSI receiver external clock timing and
Table 105 lists the timing parameters for the
SSI receiver external clock.
SS22
SS23
SS26
SS25
SS24
TXC
(Input)
SS28
TXFS (bl)
(Input)
TXFS (wl)
(Input)
RXD
(Input)
SS30
SS32
SS35
SS40
SS41
SS36
SS34
ID
SS22
SS23
SS24
SS25
SS26
SS28
SS30
SS32
SS34
SS35
SS36
SS40
SS41
Figure 95. SSI Receiver External Clock Timing Diagram
Table 105. SSI Receiver Timing with External Clock
Min Parameter
External Clock Operation
(Tx/Rx) CK clock period
(Tx/Rx) CK clock high period
(Tx/Rx) CK clock rise time
(Tx/Rx) CK clock low period
(Tx/Rx) CK clock fall time
(Rx) CK high to FS (bl) high
(Rx) CK high to FS (bl) low
(Rx) CK high to FS (wl) high
(Rx) CK high to FS (wl) low
(Tx/Rx) External FS rise time
(Tx/Rx) External FS fall time
SRXD setup time before (Rx) CK low
SRXD hold time after (Rx) CK low
—
–10
10
–10
81.4
36
—
36
10
—
—
10
2
Max
6.0
15.0
—
15.0
—
—
6.0
—
—
6.0
6.0
—
—
Unit ns ns ns ns ns ns ns ns ns ns ns ns ns
138 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
NOTE
• All the timings for the SSI are given for a non-inverted serial clock polarity (TSCKP/RSCKP = 0) and a non-inverted frame sync
(TFSI/RFSI = 0). If the polarity of the clock and/or the frame sync have been inverted, all the timing remains valid by inverting the clock signal
STCK/SRCK and/or the frame sync STFS/SRFS shown in the tables and in the figures.
• All timings are on Audiomux Pads when SSI is being used for data transfer.
• “Tx” and “Rx” refer to the Transmit and Receive sections of the SSI.
• The terms WL and BL refer to Word Length (WL) and Bit Length (BL).
• For internal Frame Sync operation using external clock, the FS timing is same as that of Tx Data (for example, during AC97 mode of operation).
4.7.16
UART
shows the UART I/O configuration based on which mode is enabled.
Table 106. UART I/O Configuration vs. Mode
Port
RTS
CTS
DTR
DSR
DCD
RI
TXD_MUX
RXD_MUX
DTE Mode
Direction
Output
Input
Output
Input
Input
Input
Input
Output
Description
RTS from DTE to DCE
CTS from DCE to DTE
DTR from DTE to DCE
DSR from DCE to DTE
DCD from DCE to DTE
RING from DCE to DTE
Serial data from DCE to DTE
Serial data from DTE to DCE
DCE Mode
Direction
Input
Output
Input
Output
Output
Output
Output
Input
Description
RTS from DTE to DCE
CTS from DCE to DTE
DTR from DTE to DCE
DSR from DCE to DTE
DCD from DCE to DTE
RING from DCE to DTE
Serial data from DCE to DTE
Serial data from DTE to DCE
4.7.16.1
UART Electrical
This section describes the electrical information of the UART module.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
139
Electrical Characteristics
4.7.16.1.1
UART RS-232 Serial Mode Timing
UART Transmitter
depicts the transmit timing of UART in RS-232 serial mode, with 8 data bit/1 stop bit format.
lists the UART RS-232 serial mode transmit timing characteristics.
Figure 96. UART RS-232 Serial Mode Transmit Timing Diagram
Table 107. UART RS-232 Serial Mode Transmit Timing Diagram
ID Parameter Symbol Min Max Units
UA1 Transmit Bit Time t
Tbit
1/F baud_rate
1
-T ref_clk
2
1/F baud_rate
+T ref_clk
1
2
1/F baud_rate
: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.
T ref_clk
: The period of UART reference clock ref_clk (ipg_perclk after RFDIV divider).
—
UART Receiver
depicts the RS-232 serial mode receive timing, with 8 data bit/1 stop bit format.
serial mode receive timing characteristics.
Figure 97. UART RS-232 Serial Mode Receive Timing Diagram
Table 108. UART RS-232 Serial Mode Transmit Timing Diagram
ID Parameter Symbol Min Max Units
1
2
UA1 Receive Bit Time
1 t
Rbit
1/F baud_rate
2
-1/(16
×F baud_rate
) 1/F baud_rate
+1/(16
×F baud_rate
) —
The UART receiver can tolerate 1/(16
×Fbaud_rate) tolerance in each bit. But accumulation tolerance in one frame must not exceed 3/(16
×Fbaud_rate).
F baud_rate
: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.
4.7.16.1.2
UART IrDA Mode Timing
The following subsections give the UART transmit and receive timings in IrDA mode.
140 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
UART IrDA Mode Transmitter
depicts the UART IrDA mode transmit timing, with 8 data bit/1 stop bit format.
the transmit timing characteristics.
Figure 98. UART IrDA Mode Transmit Timing Diagram
Table 109. IrDA Mode Transmit Timing Parameters
ID Parameter Symbol Min Max
UA3 Transmit Bit Time in
IrDA mode t
TIRbit
1/F baud_rate
1
-T ref_clk
2
1/F baud_rate
+T ref_clk
UA4 Transmit IR Pulse
Duration t
TIRpulse
(3/16)
×(1F baud_rate
)-T ref_clk
(3/16)
×(1F baud_rate
)+T ref_clk
1
2
F baud_rate
: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.
Tref_clk: The period of UART reference clock ref_clk (ipg_perclk after RFDIV divider).
Units
—
—
UART IrDA Mode Receiver
the receive timing characteristics.
Figure 99. UART IrDA Mode Receive Timing Diagram
Table 110. IrDA Mode Receive Timing Parameters
ID Parameter Symbol Min Max Units
UA5 Receive Bit Time
IrDA mode
1
in t
RIRbit
1/F baud_rate
2
-
1/(16
×F baud_rate
)
1/F baud_rate
+
1/(16
×F baud_rate
)
(5/16)
×(1/F baud_rate
)
—
UA6 Receive IR Pulse
Duration t
RIRpulse
1.41 us —
1
The UART receiver can tolerate 1/(16
×F not exceed 3/(16
×F baud_rate
).
baud_rate
) tolerance in each bit. But accumulation tolerance in one frame must
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
141
Electrical Characteristics
2
Fbaud_rate: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.
4.7.17
USBOH3 Parameters
This section describes the electrical parameters of the USB OTG port and USB HOST ports. For on-chip
USB PHY parameters see
Section 4.7.19, “USB PHY Parameters .”
4.7.17.1
USB Serial Interface
In order to support four serial different interfaces, the USB serial transceiver can be configured to operate in one of four modes:
• DAT_SE0 bidirectional, 3-wire mode
• DAT_SE0 unidirectional, 6-wire mode
• VP_VM bidirectional, 4-wire mode
• VP_VM unidirectional, 6-wire mode
The USB controller does not support ULPI Serial mode. Only the legacy serial mode is supported.
shows the serial mode signal map for 6-pin Full speed/Low speed (FsLs) serial mode.
shows the serial mode signal map for 3-pin FsLs serial mode.
Table 111. Serial Mode Signal Map for 6-pin FsLs Serial Mode
Signal tx_enable tx_dat tx_se0 int rx_dp rx_dm rx_rcv
Reserved
Maps to data(0) data(1) data(2) data(3) data(4) data(5) data(6) data(7)
Direction
In
In
In
Out
Out
Out
Out
Out
Description
Active high transmit enable
Transmit differential data on D+/D–
Transmit single-ended zero on D+/D–
Active high interrupt indication
Must be asserted whenever any unmasked interrupt occurs
Single-ended receive data from D+
Single-ended receive data from D–
Differential receive data from D+/D–
Reserved The PHY must drive this signal low
Signal tx_enable dat se0 int
Maps to data(0) data(1) data(2) data(3)
Table 112. Serial Mode Signal Map for 3-pin FsLs Serial Mode
Direction
In
I/O
I/O
Out
Description
Active high transmit enable
Transmit differential data on D+/D– when tx_enable is high
Receive differential data on D+/D– when tx_enable is low
Transmit single-ended zero on D+/D– when tx_enable is high
Receive single-ended zero on D+/D– when tx_enable is low
Active high interrupt indication
Must be asserted whenever any unmasked interrupt occurs
142 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.7.17.1.1
USB DAT_SE0 Bi-Directional Mode
Table 113 shows the signal definitions in DAT_SE0 bi-directional mode and Figure 100 shows the USB
transmit waveform in DAT_SE0 bi-directional mode.
Table 113. Signal Definitions—DAT_SE0 Bi-Directional Mode
Name
USB_TXOE_B
USB_DAT_VP
USB_SE0_VM
Direction
Out
Out
In
Out
In
Signal Description
Transmit enable, active low
TX data when USB_TXOE_B is low
Differential RX data when USB_TXOE_B is high
SE0 drive when USB_TXOE_B is low
SE0 RX indicator when USB_TXOE_B is high
Transmit
USB_TXOE_B
US3
USB_DAT_VP
USB_SE0_VM
US1
US4
US2
Figure 100. USB Transmit Waveform in DAT_SE0 Bi-Directional Mode
shows the USB receive waveform in DAT_SE0 bi-directional mode and
shows the definitions of USB receive waveform in DAT_SE0 bi-directional mode.
Receive
USB_TXOE_B
USB_DAT_VP
USB_SE0_VM
US7 US8
USB_SE0_VM
Figure 101. USB Receive Waveform in DAT_SE0 Bi-Directional Mode
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
143
Electrical Characteristics
ID
Table 114. Definitions of USB Receive Waveform in DAT_SE0 Bi-Directional Mode
Parameter
US1 TX Rise/Fall Time
US2 TX Rise/Fall Time
US3 TX Rise/Fall Time
US4 TX Duty Cycle
US7 RX Rise/Fall Time
US8 RX Rise/Fall Time
Signal Name
USB_DAT_VP
USB_SE0_VM
USB_TXOE_B
USB_DAT_VP
USB_DAT_VP
USB_SE0_VM
Direction
Out
Out
Out
Out
In
In
Min
—
—
—
49.0
—
—
Max
5.0
5.0
5.0
51.0
3.0
3.0
Unit ns ns ns
% ns ns
Conditions/
Reference Signal
50 pF
50 pF
50 pF
—
35 pF
35 pF
4.7.17.1.2
USB DAT_SE0 Unidirectional Mode
shows the signal definitions in DAT_SE0 unidirectional mode
Table 115. Signal Definitions—DAT_SE0 Unidirectional Mode
Name
USB_TXOE_B
USB_DAT_VP
USB_SE0_VM
USB_VP1
USB_VM1
USB_RCV
Direction
Out
Out
Out
In
In
In
Signal Description
Transmit enable, active low
TX data when USB_TXOE_B is low
SE0 drive when USB_TXOE_B is low
Buffered data on DP when USB_TXOE_B is high
Buffered data on DM when USB_TXOE_B is high
Differential RX data when USB_TXOE_B is high
and
Figure 103 shows the USB transmit/receive waveform in DAT_SE0 uni-directional mode
respectively.
US11
Transmit
USB_TXOE_B
USB_DAT_VP
USB_SE0_VM
US9
US12
US10
Figure 102. USB Transmit Waveform in DAT_SE0 Uni-directional Mode
144 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Receive
USB_TXOE_B
USB_DAT_VP
USB_RCV
US16
US15/US17
USB_SE0_VM
Figure 103. USB Receive Waveform in DAT_SE0 Uni-directional Mode
shows the USB port timing specification in DAT_SE0 uni-directional mode.
Table 116. USB Port Timing Specification in DAT_SE0 Uni-Directional Mode
ID Parameter
US9 TX Rise/Fall Time
US10 TX Rise/Fall Time
US11 TX Rise/Fall Time
US12 TX Duty Cycle
US15 RX Rise/Fall Time
US16 RX Rise/Fall Time
US17 RX Rise/Fall Time
Signal Name
USB_DAT_VP
USB_SE0_VM
USB_TXOE_B
USB_DAT_VP
USB_VP1
USB_VM1
USB_RCV
Signal
Source
In
In
In
Out
Out
Out
Out
Min
—
—
—
—
—
—
49.0
Max
5.0
5.0
5.0
51.0
3.0
3.0
3.0
Unit ns ns ns ns ns ns
%
Condition/
Reference Signal
50 pF
50 pF
50 pF
—
35 pF
35 pF
35 pF
4.7.17.1.3
USB VP_VM Bi-Directional Mode
shows the signal definitions in VP_VM bi-directional mode.
and
shows the USB transmit/receive waveform in VP_VM bi-directional mode respectively.
Table 117. Signal Definitions—VP_VM Bi-Directional Mode
Name
USB_TXOE_B
USB_DAT_VP
USB_SE0_VM
USB_RCV
Direction
Out
Out (Tx)
In (Rx)
Out (Tx)
In (Rx)
In
Signal Description
Transmit enable, active low
TX VP data when USB_TXOE_B is low
RX VP data when USB_TXOE_B is high
TX VM data when USB_TXOE_B low
RX VM data when USB_TXOE_B high
Differential RX data
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
145
Electrical Characteristics
Transmit
USB_TXOE_B
USB_DAT_VP
USB_SE0_VM
US20
US18
US21 US19
Receive
USB_DAT_VP
US22 US22
Figure 104. USB Transmit Waveform in VP_VM Bi-Directional Mode
US26
USB_SE0_VM
US28 US27
USB_RCV
US29
Figure 105. USB Receive Waveform in VP_VM Bi-Directional Mode
shows the USB port timing specification in VP_VM bi-directional mode.
Table 118. USB Port Timing Specification in VP_VM Bi-directional Mode
ID Parameter
US18 TX Rise/Fall Time
US19 TX Rise/Fall Time
US20 TX Rise/Fall Time
US21 TX Duty Cycle
US22 TX Overlap
Signal Name
USB_DAT_VP
USB_SE0_VM
USB_TXOE_B
USB_DAT_VP
USB_SE0_VM
Direction Min Max Unit
Out
Out
Out
Out
Out
—
—
—
49.0
–3.0
5.0
5.0
5.0
51.0
3.0
ns ns ns
% ns
Condition/Reference Signal
50 pF
50 pF
50 pF
—
USB_DAT_VP
146 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
Table 118. USB Port Timing Specification in VP_VM Bi-directional Mode (continued)
ID Parameter
US26 RX Rise/Fall Time
US27 RX Rise/Fall Time
US28 RX Skew
US29 RX Skew
Signal Name
USB_DAT_VP
USB_SE0_VM
USB_DAT_VP
USB_RCV
Direction Min Max Unit
In
In
In
In
—
—
–4.0
–6.0
3.0
3.0
4.0
2.0
ns ns ns ns
Condition/Reference Signal
35 pF
35 pF
USB_SE0_VM
USB_DAT_VP
4.7.17.1.4
USB VP_VM Uni-Directional Mode
Table 119 shows the signal definitions in VP_VM uni-directional mode. Figure 106 and
shows the USB transmit/receive waveform in VP_VM uni-directional mode respectively.
Table 119. USB Signal Definitions—VP_VM Uni-Directional Mode
Name
USB_TXOE_B
USB_DAT_VP
USB_SE0_VM
USB_VP1
USB_VM1
USB_RCV
Direction
Out
Out
Out
In
In
In
Signal Description
Transmit enable, active low
TX VP data when USB_TXOE_B is low
TX VM data when USB_TXOE_B is low
RX VP data when USB_TXOE_B is high
RX VM data when USB_TXOE_B is high
Differential RX data
Transmit
US32
USB_TXOE_B
USB_DAT_VP
USB_SE0_VM
US30
US33 US31
US34 US34
Figure 106. USB Transmit Waveform in VP_VM Unidirectional Mode
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
147
Electrical Characteristics
Receive
USB_TXOE_B
USB_VP1
US38
USB_VM1
USB_RCV
US40
US39
US41
Figure 107. USB Receive Waveform in VP_VM Uni-directional Mode
shows the USB port timing specification in VP_VM uni-directional mode.
Table 120. USB Timing Specification in VP_VM Unidirectional Mode
ID Parameter
US30 TX Rise/Fall Time
US31 TX Rise/Fall Time
US32 TX Rise/Fall Time
US33 TX Duty Cycle
US34 TX Overlap
US38 RX Rise/Fall Time
US39 RX Rise/Fall Time
US40 RX Skew
US41 RX Skew
Signal
USB_DAT_VP
USB_SE0_VM
USB_TXOE_B
USB_DAT_VP
USB_SE0_VM
USB_VP1
USB_VM1
USB_VP1
USB_RCV
Direction Min Max Unit
Out
In
In
In
In
Out
Out
Out
Out
—
—
—
49.0
–3.0
—
—
–6.0
5.0
5.0
5.0
51.0
3.0
3.0
3.0
–4.0
4.0
2.0
ns ns ns
% ns ns ns ns ns
Conditions / Reference Signal
50 pF
50 pF
50 pF
—
USB_DAT_VP
35 pF
35 pF
USB_VM1
USB_VP1
148 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Electrical Characteristics
4.7.18
USB Parallel Interface Timing
Electrical and timing specifications of Parallel Interface are presented in the subsequent sections.
shows the signal definitions in parallel mode.
shows the USB transmit/receive waveform in parallel mode.
shows the USB timing specification for ULPI parallel mode.
Table 121. Signal Definitions—Parallel Interface (Normal ULPI)
Name
USB_Clk
USB_Data[7:0]
USB_Dir
USB_Stp
USB_Nxt
Direction
In
I/O
In
Out
In
Signal Description
Interface clock. All interface signals are synchronous to Clock.
Bi-directional data bus, driven low by the link during idle. Bus ownership is determined by Dir.
Direction. Control the direction of the Data bus.
Stop. The link asserts this signal for 1 clock cycle to stop the data stream currently on the bus.
Next. The PHY asserts this signal to throttle the data.
USB_Clk
USB_Dir/Nxt
US15
US15
USB_Data
USB_Stp
US16
US16
US17 US17
ID
Figure 108. USB Transmit/Receive Waveform in Parallel Mode
Table 122. USB Timing Specification for ULPI Parallel Mode
Parameter Min
US15 Setup Time (Dir, Nxt in, Data in)
US16 Hold Time (Dir, Nxt in, Data in)
US17 Output delay Time (Stp out, Data out) for H3 routed to DISP2 I/O
1 and H1
US17 Output delay Time (Stp out, Data out) for H2
1
H3 routed to NANDF I/O is recommended for Full and Low-Speed use only.
—
6
0
—
Max
—
—
9
11
Unit ns ns ns
Conditions/
Reference Signal
10 pF
10 pF
10 pF ns 10 pF
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
149
Electrical Characteristics
4.7.19
USB PHY Parameters
This section describes the USB PHY parameters.
4.7.19.1
USB PHY AC Parameters
lists the AC timing parameters for USB PHY.
Table 123. USB PHY AC Timing Parameters
Parameter trise tfall
Jitter
Conditions
1.5 Mbps
12 Mbps
480 Mbps
1.5 Mbps
12 Mbps
480 Mbps
1.5 Mbps
12 Mbps
480 Mbps
Min
75
4
0.5
75
4
0.5
—
Typ
—
—
—
Max
300
20
300
20
10
1
0.2
4.7.19.2
USB PHY Additional Electrical Parameters
lists the parameters for additional electrical characteristics for USB PHY.
Table 124. Additional Electrical Characteristics for USB PHY
Parameter
Vcm DC
(dc level measured at receiver connector)
Crossover Voltage
Power supply ripple noise
(analog 3.3 V)
Power supply ripple noise
(analog 2.5 V)
Power supply ripple noise
(Digital 1.2)
Conditions
HS Mode
LS/FS Mode
LS Mode
FS Mode
<160 MHz
<1.2 MHz
>1.2 MHz
All conditions
Min
–0.05
0.8
1.3
1.3
–50
–10
–50
–50
Typ
—
—
0
0
0
0
4.7.19.3
USB PHY System Clocking (SYSCLK)
lists the USB PHY system clocking parameters.
Table 125. USB PHY System Clocking Parameters
Parameter
Clock deviation
Rise/fall time
Conditions
—
—
Min
–150
—
Typ
—
—
Max
150
200
Max
0.5
2.5
2
2
50
10
50
50
Unit ns ns ns
Unit ppm ps
Unit
V
V mV mV mV
150 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Parameter
Jitter (peak-peak)
Jitter (peak-peak)
Duty-cycle
Package Information and Contact Assignments
Table 125. USB PHY System Clocking Parameters (continued)
Conditions
<1.2 MHz
>1.2 MHz
—
Min
0
0
40
Typ
—
—
—
Max
50
100
60
Unit ps ps
%
4.7.19.4
USB PHY Voltage Thresholds
lists the USB PHY voltage thresholds.
Table 126. VBUS Comparators Thresholds
Parameter Conditions
A-Device Session Valid
B-Device Session Valid
—
—
B-Device Session End —
VBUS Valid Comparator Threshold
1
—
1
For VBUS maximum rating, see
Min
0.8
0.8
0.2
4.4
Typ
1.4
1.4
0.45
4.6
Max
2.0
4.0
0.8
4.75
Unit
V
V
V
V
5 Package Information and Contact Assignments
This section includes the contact assignment information and mechanical package drawing.
5.1
19 x 19 mm Package Information
This section contains the outline drawing, signal assignment map, ground/power/reference ID (by ball grid location) for the 19
× 19 mm, 0.8 mm pitch package.
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
151
Package Information and Contact Assignments
5.1.1
BGA—Case 2017, 19 x 19 mm, 0.8 mm Pitch
shows the top view, bottom view, and side view of the 19
×19 mm package.
152
Figure 109. 19 x 19 mm Package: Case 2017-01—0.8 mm Pitch i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Package Information and Contact Assignments
5.1.1.1
19 x 19 mm Package Drawing Notes
5
4
3
2
1
The following notes apply to
All dimensions in millimeters.
Dimensioning and tolerancing per ASME Y14.5M-1994.
Maximum solder ball diameter measured parallel to Datum A.
Datum A, the seating plane, is determined by the spherical crowns of the solder balls.
Parallelism measurement shall exclude any effect of mark on top surface of package.
5.1.2
19 x 19 mm Signal Assignments, Power Rails, and I/O
shows the device connection list and Table 128
displays an alpha-sorted list of the signal assignments including associated power supplies.
5.1.2.1
19 x 19 mm Ground, Power, Sense, and Reference Contact Assignments
shows the device connection list for ground, power, sense, and reference contact signals alpha-sorted by name.
Table 127. 19 x 19 mm Ground, Power, Sense, and Reference Contact Assignments
Contact Name Contact Assignment
AHVDDRGB
AHVSSRGB
GND
GND_ANA_PLL_A
GND_ANA_PLL_B
GND_DIG_PLL_A
GND_DIG_PLL_B
NGND_OSC
NGND_TV_BACK
NGND_USBPHY
NVCC_EMI
Y18, AA18
Y19, AA19
A1 , A23, G5, H9, J8, J9, J10, J12, J13, J14, K8, K9, K10, K11, K12, K13, K14, L8, L9, L10, L11,L12,
L13, L14, M9, M10, M11, M12, M13, M14, M15, N8, N9, N10, N11, N12, N13, N14, N15, N16, P8,
P9, P10, P11, P12, P13, P14, P15, R8, R9, R10, R11,R12, R13, R14, R15, R16, T5, T16, AC1,
AC21, AC23
U7
U17
T7
V18
V17
T15
L16
U8, U9, U10, U11, U12, V7
NVCC_EMI_DRAM H6, J6, K6, L6, M6, N6, P6, R6, T6
NVCC_HS10 M16
NVCC_HS4_1
NVCC_HS4_2
M18
N18
NVCC_HS6
NVCC_I2C
M17
T14
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
153
Package Information and Contact Assignments
Table 127. 19 x 19 mm Ground, Power, Sense, and Reference Contact Assignments (continued)
Contact Name Contact Assignment
NVCC_IPU2
NVCC_IPU4
NVCC_IPU5
NVCC_IPU6
NVCC_IPU7
NVCC_IPU8
NVCC_IPU9
NVCC_NANDF_A
NVCC_NANDF_B
NVCC_NANDF_C
NVCC_OSC
NVCC_PER3
NVCC_PER5
NVCC_PER8
NVCC_PER9
NVCC_PER10
G15
H16
H10
H11
G9
G10
W17
U18
T18
G16
H17
J17
K17
P18
R18
E6, F5
NVCC_PER11
NVCC_PER12
NVCC_PER13
NVCC_PER14
NVCC_PER15
NVCC_PER17
H15
G14
NVCC_SRTC_POW U14
NVCC_TV_BACK U16
G11
G12
G13
U13
NVCC_USBPHY
RREFEXT
SGND
SVCC
SVDDGP
TVDAC_DHVDD
VBUS
VCC
VDD_ANA_PLL_A
L17
K19
J11
H14
F13
V16
K20
H13, J15, J16, K15, K16, L7, L15, M7, N7, N17, P7, P17, R17, T8, T9, T10, T11, T12, T17
V6
154 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Package Information and Contact Assignments
Table 127. 19 x 19 mm Ground, Power, Sense, and Reference Contact Assignments (continued)
Contact Name
VDD_ANA_PLL_B
VDD_DIG_PLL_A
VDD_DIG_PLL_B
VDD_FUSE
VDDA
VDDA33
VDDGP
VREFOUT
VREF
VREG
Contact Assignment
W19
U6
W18
R7
G8, H8, H12, M8, P16, T13
L18
F6, F7, F8, F9, F10, F11, F12, G6, G7, H7, J7, K7
U15
R5
K21
AUD3_BB_CK
AUD3_BB_FS
AUD3_BB_RXD
AUD3_BB_TXD
BOOT_MODE0
BOOT_MODE1
CKIH1
CKIH2
CKIL
CLK_SS
COMP
2
CSI1_D10
CSI1_D11
CSI1_D12
CSI1_D13
CSI1_D14
5.1.2.2
19 x 19 mm, Signal Assignments, Power Rails, and I/O
displays an alpha-sorted list of the signal assignments including power rails.
Contact Name
Table 128. 19 x 19 mm Signal Assignments, Power Rails, and I/O
Contact
Assignment
C8
A9
Y17
R22
R23
P22
P23
M20
B9
E9
AB21
AB22
V19
AA20
Y16
AA21
Power Rail
NVCC_PER9
NVCC_PER9
NVCC_PER9
NVCC_PER9
NVCC_PER3
NVCC_PER3
NVCC_PER3
NVCC_PER3
NVCC_SRTC_POW
NVCC_PER3
AHVDDRGB
NVCC_HS10
NVCC_HS10
NVCC_HS10
NVCC_HS10
NVCC_HS10
GPIO
GPIO
GPIO
GPIO
LVIO
LVIO
Analog
Analog
GPIO
LVIO
Analog
HSGPIO
HSGPIO
HSGPIO
HSGPIO
HSGPIO
I/O Buffer Type
Direction after
Reset
1
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Configuraton after Reset
Keeper
Keeper
Keeper
Keeper
100 k
Ω pull-up
100 k
Ω pull-up
Analog
Analog
Standard CMOS
100 k
Ω pull-up
Analog
Keeper
Keeper
Keeper
Keeper
Keeper
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
155
Package Information and Contact Assignments
Table 128. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)
Contact Name
CSI2_D18
CSI2_D19
CSI2_HSYNC
CSI2_PIXCLK
CSI2_VSYNC
CSPI1_MISO
CSPI1_MOSI
CSPI1_RDY
CSPI1_SCLK
CSPI1_SS0
CSPI1_SS1
DI_GP1
DI_GP2
DI_GP3
DI_GP4
CSI1_D15
CSI1_D16
CSI1_D17
CSI1_D18
CSI1_D19
CSI1_D8
CSI1_D9
CSI1_HSYNC
CSI1_MCLK
CSI1_PIXCLK
CSI1_VSYNC
CSI2_D12
CSI2_D13
CSI2_D14
CSI2_D15
CSI2_D16
CSI2_D17
NVCC_PER9
NVCC_PER9
NVCC_PER8
NVCC_PER8
NVCC_PER8
NVCC_PER10
NVCC_PER10
NVCC_PER10
NVCC_PER10
NVCC_PER10
NVCC_PER10
NVCC_IPU6
NVCC_IPU6
NVCC_IPU7
NVCC_IPU7
NVCC_HS10
NVCC_HS10
NVCC_HS10
NVCC_HS10
NVCC_HS10
NVCC_PER8
NVCC_PER8
NVCC_PER8
NVCC_PER8
NVCC_PER8
NVCC_PER8
NVCC_PER9
NVCC_PER9
NVCC_HS4_1
NVCC_HS4_1
NVCC_HS4_1
NVCC_HS4_1
Contact
Assignment
A10
E10
B10
H21
J19
H22
J22
F19
C10
D10
C9
D9
A8
C18
E19
C7
L20
L21
L22
L23
B20
F18
G18
B8
M23
E18
A21
A20
M21
N22
N23
M22
Power Rail I/O Buffer Type
Direction after
Reset
1
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
HSGPIO
HSGPIO
HSGPIO
HSGPIO
HSGPIO
HSGPIO
HSGPIO
HSGPIO
HSGPIO
GPIO
GPIO
GPIO
Configuraton after Reset
1
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
100 k
Ω pull-up
100 k
Ω pull-up
Keeper
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
Keeper
Keeper
100 k
Ω pull-up
100 k
Ω pull-up
156 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Package Information and Contact Assignments
Table 128. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)
Contact Name
DI1_D0_CS
DI1_D1_CS
DI1_DISP_CLK
DI1_PIN11
DI1_PIN12
DI1_PIN13
DI1_PIN15
DI1_PIN2
DI1_PIN3
DI2_DISP_CLK
DI2_PIN2
DI2_PIN3
DI2_PIN4
DISP1_DAT0
DISP1_DAT1
DISP1_DAT10
3
DISP1_DAT2
DISP1_DAT3
DISP1_DAT4
NVCC_IPU4
NVCC_IPU4
NVCC_IPU4
NVCC_IPU4
NVCC_IPU5
NVCC_IPU5
NVCC_IPU5
NVCC_IPU5
NVCC_HS6
NVCC_IPU5
NVCC_IPU5
NVCC_IPU5
NVCC_IPU5
NVCC_HS6
NVCC_HS6
NVCC_IPU2
NVCC_IPU2
NVCC_IPU6
NVCC_IPU2
NVCC_IPU2
NVCC_IPU2
NVCC_IPU6
NVCC_IPU6
NVCC_IPU6
NVCC_IPU7
NVCC_IPU7
NVCC_IPU7
NVCC_IPU7
NVCC_HS6
NVCC_HS6
NVCC_IPU4
NVCC_IPU4
Contact
Assignment
U22
F23
H19
F22
G21
U23
T22
E23
F21
G20
H18
E21
F20
E22
G19
H23
N20
N21
D22
D23
G22
J21
J20
K18
U21
AB23
J18
Y22
AA22
T20
H20
G23
Power Rail I/O Buffer Type
Direction after
Reset
1
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Output
Output
Output
Output
Input
Input
Input
Input
Input
Output
Output
Output
Output
Output
Output
Output
Output
HSGPIO
GPIO
GPIO
GPIO
GPIO
HSGPIO
HSGPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
HSGPIO
HSGPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
Configuraton after Reset
1
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
High
High
High
High
Keeper
Keeper
Keeper
Keeper
Keeper
High
High
Low
High
High
High
High
High
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
157
Package Information and Contact Assignments
Table 128. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)
Contact Name
DISP2_DAT6
DISP2_DAT7
DISP2_DAT8
DISP2_DAT9
DISPB2_SER_CLK
DISPB2_SER_DIN
DISPB2_SER_DIO
DISPB2_SER_RS
DN
DP
DRAM_A0
DRAM_A1
DRAM_A10
DRAM_A11
DRAM_A12
DISP1_DAT5
DISP1_DAT6
DISP1_DAT7
DISP1_DAT8
DISP1_DAT9
DISP2_DAT0
DISP2_DAT1
DISP2_DAT10
DISP2_DAT11
DISP2_DAT12
DISP2_DAT13
DISP2_DAT14
DISP2_DAT15
DISP2_DAT2
DISP2_DAT3
DISP2_DAT4
DISP2_DAT5
NVCC_IPU8
NVCC_IPU8
NVCC_IPU9
NVCC_IPU9
NVCC_IPU2
NVCC_IPU2
NVCC_IPU2
NVCC_IPU2
VDDA33
VDDA33
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_HS6
NVCC_IPU4
NVCC_IPU4
NVCC_IPU4
NVCC_IPU4
NVCC_IPU8
NVCC_IPU8
NVCC_IPU9
NVCC_IPU9
NVCC_IPU9
NVCC_IPU9
NVCC_IPU9
NVCC_IPU9
NVCC_HS4_2
NVCC_HS4_2
NVCC_HS4_2
NVCC_HS4_2
Contact
Assignment
K22
K23
AB1
AA2
V2
U4
U2
N19
W23
P19
R20
AC22
U19
V21
W21
R19
Y23
T19
AA23
T21
P20
P21
V22
V23
E20
R21
M19
W22
T23
C22
C23
D21
Power Rail I/O Buffer Type
Direction after
Reset
1
Output
Output
Output
Output
Output
Output
Output
Input
Input
Input
Input
Output
Input
Input
Output
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Analog
Analog
DDR2
DDR2
DDR2
DDR2
DDR2
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
HSGPIO
HSGPIO
HSGPIO
HSGPIO
HSGPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
Configuraton after Reset
1
Keeper
Keeper
Keeper
Keeper
High
100 k
Ω pull-up
100 k
Ω pull-up
High
–
–
High
High
High
High
High
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
158 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Package Information and Contact Assignments
Contact Name
DRAM_D12
DRAM_D13
DRAM_D14
DRAM_D15
DRAM_D16
DRAM_D17
DRAM_D18
DRAM_D19
DRAM_D2
DRAM_D20
DRAM_D21
DRAM_D22
DRAM_D23
DRAM_D24
DRAM_D25
DRAM_A13
DRAM_A14
DRAM_A2
DRAM_A3
DRAM_A4
DRAM_A5
DRAM_A6
DRAM_A7
DRAM_A8
DRAM_A9
DRAM_CAS
DRAM_CS0
DRAM_CS1
DRAM_D0
DRAM_D1
DRAM_D10
DRAM_D11
Table 128. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
Contact
Assignment
J4
K5
H1
R2
K3
K4
J3
L3
L2
L1
K1
M1
M5
L5
L4
Y3
T1
R3
M3
M4
W2
V3
V4
Y4
W4
Y2
W3
Y1
U1
T2
AA3
V5
Power Rail I/O Buffer Type
Direction after
Reset
1
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
Configuraton after Reset
1
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
159
Package Information and Contact Assignments
Table 128. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)
Contact Name
DRAM_RAS
DRAM_SDCKE0
DRAM_SDCKE1
DRAM_SDCLK
DRAM_SDCLK_B
DRAM_SDQS0
DRAM_SDQS0_B
DRAM_SDQS1
DRAM_SDQS1_B
DRAM_SDQS2
DRAM_SDQS2_B
DRAM_SDQS3
DRAM_SDQS3_B
DRAM_SDWE
EIM_A16
DRAM_D26
DRAM_D27
DRAM_D28
DRAM_D29
DRAM_D3
DRAM_D30
DRAM_D31
DRAM_D4
DRAM_D5
DRAM_D6
DRAM_D7
DRAM_D8
DRAM_D9
DRAM_DQM0
DRAM_DQM1
DRAM_DQM2
DRAM_DQM3
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
Contact
Assignment
N3
J1
J2
H3
H4
U5
AA9
T4
P2
P1
N4
W1
AA1
W5
T3
N1
P3
M2
K2
H5
P5
P4
N5
N2
R1
G3
G4
R4
H2
J5
G1
G2
Power Rail I/O Buffer Type
Direction after
Reset
1
Output
Output
Output
Output
Output
Output
Input
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
DDR2
DDR2
DDR2
DDR2CLK
DDR2CLK
DDR2CLK
DDR2CLK
DDR2CLK
DDR2CLK
DDR2CLK
DDR2CLK
DDR2CLK
DDR2CLK
DDR2
GPIO
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
DDR2
Configuraton after Reset
1
High
High
High
High
High
High
High
High
High
High
High
High
High
High
100 k
Ω pull-up
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
High
160 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Package Information and Contact Assignments
Contact Name
EIM_CS4
EIM_CS5
EIM_D16
EIM_D17
EIM_D18
EIM_D19
EIM_D20
EIM_D21
EIM_D22
EIM_D23
EIM_D24
EIM_D25
EIM_D26
EIM_D27
EIM_D28
EIM_A17
EIM_A18
EIM_A19
EIM_A20
EIM_A21
EIM_A22
EIM_A23
EIM_A24
EIM_A25
EIM_A26
EIM_A27
EIM_BCLK
EIM_CRE
EIM_CS0
EIM_CS1
EIM_CS2
EIM_CS3
Table 128. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
Contact
Assignment
AC11
V8
AA10
Y9
AB10
W8
AC10
AA6
AA5
AC12
W10
AA11
Y10
AB11
W9
AB2
W6
Y6
Y7
AC3
AB6
AC4
AB5
AA4
AC7
AB7
AC6
AC5
AB9
AC8
AA8
AB8
Power Rail I/O Buffer Type
Direction after
Reset
1
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Output
Output
Output
Input
Input
Input
Input
Input
Input
Input
Output
Input
Input
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Configuraton after Reset
1
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
High
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
Keeper
Keeper
High
High
High
Keeper
Keeper
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
161
Package Information and Contact Assignments
Table 128. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)
Contact Name
EIM_DA8
EIM_DA9
EIM_DTACK
EIM_EB0
EIM_EB1
EIM_EB2
EIM_EB3
EIM_LBA
EIM_OE
EIM_RW
EIM_SDBA0
EIM_SDBA1
EIM_SDBA2
EIM_SDODT0
EIM_SDODT1
EIM_D29
EIM_D30
EIM_D31
EIM_DA0
EIM_DA1
EIM_DA10
EIM_DA11
EIM_DA12
EIM_DA13
EIM_DA14
EIM_DA15
EIM_DA2
EIM_DA3
EIM_DA4
EIM_DA5
EIM_DA6
EIM_DA7
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI_DRAM
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
NVCC_EMI
Contact
Assignment
AA7
AB3
V1
U3
F1
F3
F2
AB13
Y12
Y5
V12
W12
V10
V9
AC2
W11
AB12
Y11
AA14
AB14
AC14
Y13
AA13
W13
Y8
AC9
W7
AC15
V13
AC13
V11
AA12
Power Rail I/O Buffer Type
Direction after
Reset
1
Output
Output
Output
Output
Output
Output
Output
Input
Input
Input
Output
Output
Input
Input
Output
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
GPIO
GPIO
DDR2
DDR2
DDR2
DDR2
DDR2
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
Configuraton after Reset
1
Keeper
Keeper
100 k
Ω pull-up
High
High
Keeper
Keeper
High
High
High
High
High
High
High
High
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
162 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Package Information and Contact Assignments
Contact
Assignment
C19
B23
C21
C20
W15
A22
D18
B22
D19
AB4
AB20
W20
Y20
J23
D5
B21
D20
AB16
L19
AC19
AB19
AC18
AB18
AC17
AB17
AB15
JTAG_MOD
JTAG_TCK
JTAG_TDI
JTAG_TDO
JTAG_TMS
Table 128. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)
Contact Name
EIM_WAIT
EXTAL
FASTR_ANA
FASTR_DIG
GPIO_NAND
GPIO1_0
GPIO1_1
GPIO1_2
GPIO1_3
GPIO1_4
GPIO1_5
GPIO1_6
GPIO1_7
GPIO1_8
GPIO1_9
I2C1_CLK
I2C1_DAT
ID
IOB
IOB_BACK
IOG
IOR_BACK
JTAG_DE_B
V14
V15
Y14
AA15
AC16
Power Rail
NVCC_EMI
NVCC_OSC
NVCC_PER3
NVCC_PER3
NVCC_USBPHY
NVCC_NANDF_A
NVCC_PER5
NVCC_PER5
NVCC_PER5
NVCC_PER5
NVCC_PER5
NVCC_PER5
NVCC_PER5
NVCC_PER5
NVCC_PER5
NVCC_PER5
NVCC_I2C
NVCC_I2C
NVCC_USBPHY
AHVDDRGB
—
AHVDDRGB
—
AHVDDRGB
—
NVCC_PER14
NVCC_PER14
NVCC_PER14
NVCC_PER14
NVCC_PER14
NVCC_PER14
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
I2CIO
GPIO
Analog
—
—
Analog
UHVIO
GPIO
GPIO
I2CIO
Analog
Analog
Analog
Analog
Analog
Analog
Analog
GPIO
I/O Buffer Type
GPIO
GPIO
GPIO
GPIO
GPIO
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Output
Input
Input
Input
Direction after
Reset
1
Input
Input
Output
Output
Output
Output
Output
Output
Input/Open-drain output
Input
Input
Input
3-state output
Input
—
—
—
—
—
—
47 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-down
47 k
Ω pull-up
Keeper
47 k
Ω pull-up
Configuraton after Reset
1
100 k
Ω pull-up
—
—
—
—
100 k
Ω pull-up
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
47 k
Ω pull-up
47 k
Ω pull-up
Pull-up
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
163
Package Information and Contact Assignments
Table 128. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)
Contact Name
NANDF_CS4
NANDF_CS5
NANDF_CS6
NANDF_CS7
NANDF_D0
NANDF_D1
NANDF_D10
NANDF_D11
NANDF_D12
NANDF_D13
NANDF_D14
NANDF_D15
NANDF_D2
NANDF_D3
NANDF_D4
JTAG_TRSTB
KEY_COL0
KEY_COL1
KEY_COL2
KEY_COL3
4
KEY_ROW0
KEY_ROW1
KEY_ROW2
KEY_ROW3
NANDF_ALE
NANDF_CLE
NANDF_CS0
NANDF_CS1
NANDF_CS2
NANDF_CS3
NVCC_NANDF_A
NVCC_NANDF_A
NVCC_NANDF_B
NVCC_NANDF_B
NVCC_NANDF_C
NVCC_NANDF_C
NVCC_NANDF_B
NVCC_NANDF_B
NVCC_NANDF_B
NVCC_NANDF_B
NVCC_NANDF_B
NVCC_NANDF_B
NVCC_NANDF_C
NVCC_NANDF_C
NVCC_NANDF_C
NVCC_PER14
NVCC_PER13
NVCC_PER13
NVCC_PER13
NVCC_PER13
NVCC_PER13
NVCC_PER13
NVCC_PER13
NVCC_PER13
NVCC_PER13
NVCC_PER13
NVCC_NANDF_A
NVCC_NANDF_A
NVCC_NANDF_A
NVCC_NANDF_A
NVCC_NANDF_A
NVCC_NANDF_A
Contact
Assignment
A6
D8
B7
C5
A3
B4
D6
A7
E8
B5
D7
B2
A2
E5
C4
F4
C3
C2
E4
B1
B16
F15
C15
E3
B17
F16
C16
D14
W14
E15
A16
D15
Power Rail I/O Buffer Type
Direction after
Reset
1
Input
Input
Input
Input
Input
Input
Input
Output
Output
Output
Output
Input
Input
Input
Input
Input
Input
Input
Output
Output
Output
Output
Output
Output
Input
Input
Input
Input
Output
Output
Output
Input
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
GPIO
GPIO
GPIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Low
Low
Low
Low
Keeper
Keeper
Keeper
Keeper
Configuraton after Reset
1
47 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
High
Low
Low
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
High
High
High
High
High
High
164 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Package Information and Contact Assignments
Table 128. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)
Contact Name
PMIC_STBY_REQ
POR_B
RESET_IN_B
SD1_CLK
SD1_CMD
SD1_DATA0
SD1_DATA1
SD1_DATA2
SD1_DATA3
SD2_CLK
SD2_CMD
SD2_DATA0
SD2_DATA1
SD2_DATA2
SD2_DATA3
NANDF_D5
NANDF_D6
NANDF_D7
NANDF_D8
NANDF_D9
NANDF_RB0
NANDF_RB1
NANDF_RB2
NANDF_RB3
NANDF_RDY_INT
NANDF_RE_B
NANDF_WE_B
NANDF_WP_B
OWIRE_LINE
PMIC_INT_REQ
PMIC_ON_REQ
PMIC_RDY
NVCC_NANDF_C
NVCC_NANDF_C
NVCC_NANDF_B
NVCC_NANDF_B
NVCC_NANDF_B
NVCC_NANDF_A
NVCC_NANDF_A
NVCC_NANDF_A
NVCC_NANDF_A
NVCC_NANDF_B
NVCC_NANDF_A
NVCC_NANDF_A
NVCC_NANDF_A
NVCC_PER12
NVCC_SRTC_POW
NVCC_SRTC_POW
NVCC_SRTC_POW
NVCC_SRTC_POW
NVCC_PER3
NVCC_PER3
NVCC_PER15
NVCC_PER15
NVCC_PER15
NVCC_PER15
NVCC_PER15
NVCC_PER15
NVCC_PER17
NVCC_PER17
NVCC_PER17
NVCC_PER17
NVCC_PER17
NVCC_PER17
Contact
Assignment
A19
B18
G17
E17
B19
D17
C17
E16
D16
A18
F17
Y15
U20
Y21
A17
D1
E14
AA16
W16
AA17
C1
B3
E2
E1
E7
D2
D4
D3
A5
B6
C6
A4
Power Rail
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
GPIO
LVIO
LVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
GPIO
GPIO
GPIO
GPIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
UHVIO
I/O Buffer Type
Direction after
Reset
1
Configuraton after Reset
1
Keeper
Keeper
Keeper
Keeper
Keeper
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
—
—
—
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
—
47 k
Ω pull-up
47 k
Ω pull-up
47 k
Ω pull-up
47 k
Ω pull-up
360 k
Ω pull-down
—
47 k
Ω pull-up
47 k
Ω pull-up
47 k
Ω pull-up
47 k
Ω pull-up
360 k
Ω pull-down
Input
Output
Input
Input
Input
Input
Input
Input
Input
Input
Output
Input
Input
Input
Input
Input
Input
Output
Output
Output
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
165
Package Information and Contact Assignments
Table 128. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)
Contact Name
Contact
Assignment
Power Rail I/O Buffer Type
Direction after
Reset
1
Configuraton after Reset
1
STR
TEST_MODE
UART1_CTS
UART1_RTS
UART1_RXD
UART1_TXD
UART2_RXD
UART2_TXD
UART3_RXD
UART3_TXD
USBH1_CLK
USBH1_DATA0
USBH1_DATA1
USBH1_DATA2
USBH1_DATA3
USBH1_DATA4
USBH1_DATA5
A15
V20
B14
D13
E13
A13
A14
C14
F14
B15
D11
E12
A11
B12
C12
D12
A12
NVCC_PER12
NVCC_PER3
NVCC_PER12
NVCC_PER12
NVCC_PER12
NVCC_PER12
NVCC_PER12
NVCC_PER12
NVCC_PER12
NVCC_PER12
NVCC_PER11
NVCC_PER11
NVCC_PER11
NVCC_PER11
NVCC_PER11
NVCC_PER11
NVCC_PER11
—
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
GPIO
—
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
—
100 k
Ω pull-down
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
100 k
Ω pull-up
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
USBH1_DATA6
USBH1_DATA7
USBH1_DIR
USBH1_NXT
B13
C13
B11
C11
NVCC_PER11
NVCC_PER11
NVCC_PER11
NVCC_PER11
GPIO
GPIO
GPIO
GPIO
Input
Input
Input
Input
Keeper
Keeper
Keeper
Keeper
USBH1_STP E11 NVCC_PER11 GPIO Input Keeper
AC20 NVCC_OSC Analog Output —
2
3
1
4
The state immediately after reset and before ROM firmware or software has executed.
See
for more information.
During power-on reset this port acts as input for fuse override signal. See Table 129 on page 167
for more information.
166 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Package Information and Contact Assignments
DISP1_DAT10
DISP1_DAT11
DISP1_DAT12
DISP1_DAT13
DISP1_DAT14
DISP1_DAT15
DISP1_DAT16
DISP1_DAT17
DISP1_DAT18
DISP1_DAT19
DISP1_DAT20
DISP1_DAT21
DISP1_DAT22
DISP1_DAT23
DISP1_DAT6
DISP1_DAT7
DISP1_DAT8
DISP1_DAT9
EIM_A16
EIM_A17
EIM_A18
EIM_A19
EIM_A20
EIM_A21
KEY_COL3
5.1.2.3
Fuse Override Considerations
lists the contacts that can be overridden with fuse settings.
Table 129. Fuse Override Contacts
Contact Name
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Output
Direction
After Reset
Configuration
After Reset
Signal Configuration
1
External Termination for Fuse Override
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
Keeper
High
BT_SPARE_SIZE
BT_LPB_FREQ[2]
BT_MLC_SEL
BT_MEM_CTL[0]
BT_MEM_CTL[1]
BT_BUS_WIDTH
BT_PAGE_SIZE[0]
BT_PAGE_SIZE[1]
BT_WEIM_MUXED[0]
BT_WEIM_MUXED[1]
BT_MEM_TYPE[0]
BT_MEM_TYPE[1]
BT_LPB_FREQ[0]
BT_LPB_FREQ[1]
BT_USB_SRC
BT_EEPROM_CFG
BT_SRC[0]
BT_SRC[1]
2
100 k
Ω pull-up OSC_FREQ_SEL[0]
100 k
Ω pull-up OSC_FREQ_SEL[1]
100 k
Ω pull-up BT_LPB[0]
100 k
Ω pull-up BT_LPB[1]
100 k
Ω pull-up BT_UART_SRC[0]
100 k
Ω pull-up BT_UART_SRC[1]
Output for diagnostic signal
INT_BOOT during power-on reset
—
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-up or pull-down
4.7 k
Ω pull-down or none for high level 3
4.7 k
Ω pull-down or none for high level 2
4.7 k
Ω pull-down or none for high level 2
4.7 k
Ω pull-down or none for high level 2
4.7 k
Ω pull-down or none for high level 2
4.7 k
Ω pull-down or none for high level 2
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
167
Package Information and Contact Assignments
Table 129. Fuse Override Contacts (continued)
Contact Name
Direction
After Reset
Configuration
After Reset
Signal Configuration
1
External Termination for Fuse Override
KEY_COL4 Output Low Output for diagnostic signal
ANY_PU_RST during power-on reset
—
KEY_COL5 Output Low Output for diagnostic signal
JTAG_ACT during power-on reset
—
1
2
3
Signal Configuration as Fuse Override Input at Power Up. These are special I/O lines that control the boot up configuration during product development. In production, the boot configuration is controlled by fuses.
External USB PHY selection is not functional.
Consider using an external 68 k
Ω pull-up if system constraints indicate that the on-chip 100 kΩ pull-up is too weak.
168 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Package Information and Contact Assignments
5.2
19 x 19 mm, 0.8 Pitch Ball Map
shows the 19
× 19 mm, 0.8 pitch ball map.
Table 130. 19
× 19 mm, 0.8 Pitch Ball Map
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
169
Package Information and Contact Assignments
Table 130. 19 × 19 mm, 0.8 Pitch Ball Map (continued)
170 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Package Information and Contact Assignments
Table 130. 19 × 19 mm, 0.8 Pitch Ball Map (continued)
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
171
Package Information and Contact Assignments
Table 130. 19 × 19 mm, 0.8 Pitch Ball Map (continued)
172 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
Revision History
6 Revision History
provides a revision history for this data sheet.
2
Table 131. i.MX51 Data Sheet Document Revision History
Rev.
Number
Date Substantive Change(s)
Rev. 6 10/2012 • In
Table 25, "I/O Leakage Current," on page 29
, updated supply rail names for SD1 and SD2 to
NVCC_PER15 and NVCC_PER17, respectively.
• Updated
Section 4.6.7.3, “General WEIM Timing-Synchronous Mode.”
• Updated
Section 4.6.7.4, “Examples of WEIM Synchronous Accesses.”
• Updated
Section 4.6.7.5, “General WEIM Timing-Asynchronous Mode.”
Rev. 5 03/2012 • In
Table 4, "JTAG Controller Interface Summary," on page 13 , changed On-Chip Termination column
value for JTAG_MOD from “100 k
Ω pull-down” to “100 kΩ pull-up.”
• In
Section 3.7, “USB-OTG IOMUX Pin Configuration,”
removed the third sentence from the first
paragraph and added a note after Table 9 .
• In
Section 4.3.4, “Ultra-High Voltage I/O (UHVIO) DC Parameters,”
added clarification about UHVIO I/O cell HVE bit functionality after
.
• In
Section 4.6.9, “DDR2 SDRAM Specific Parameters
: ”
—Updated
Table 58, "DDR2 SDRAM Timing Parameter Table," on page 67
—Added a note after
—Updated
Figure 36, "DDR2 SDRAM Write Cycle Timing Diagram," on page 69
—Updated
Table 60, "DDR2 SDRAM Write Cycle Parameter Table," on page 69
—Added a note after
—Updated
Figure 37, "DDR2 SDRAM DQ versus DQS and SDCLK Read Cycle Timing Diagram," on page 71
—Updated
Table 63, "DDR2 SDRAM Read Cycle Parameter Table," on page 71
—Added a note after
• In
Section 4.7.8.2, “Electrical Characteristics,”
changed signal name in the second sentence of the first paragraph from “SENSB_MCLK” to “SENSB_PIX_CLK.”
• In
Table 128, "19 x 19 mm Signal Assignments, Power Rails, and I/O," on page 155 , changed
Configuraton after Reset column value for contacts, DI1_D0_CS, DI1_D1_CS, DI1_PIN11, and
DI1_PIN12, from “Low” to “High.”
• In
Table 128, "19 x 19 mm Signal Assignments, Power Rails, and I/O," on page 155 , changed
Configuraton after Reset column value for contact, JTAG_MOD, from “100 k
Ω pull-down” to “100 kΩ pull-up.”
• In
Table 128, "19 x 19 mm Signal Assignments, Power Rails, and I/O," on page 155
, changed Power Rail column value for contacts, UART1_CTS, UART1_RTS, UART1_RXD, UART1_TXD, UART2_RXD,
UART2_TXD, UART3_RXD, and UART3_TXD, from “NVVCC_PER12” to “NVCC_PER12.”
• In
Table 129, "Fuse Override Contacts," on page 167
:
—Added a footnote for contact, DISP1_DAT6
—Removed information about contact, EIM_A23, because the signal configuration it corresponds to,
BT_HPN_EN, is not in use.
• Corrected cross-references throughout the document.
Rev. 4
.
• Updated
Table 52, "WEIM Interface Pinout in Various Configurations," on page 53 .
Freescale Semiconductor i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
173
Revision History
Table 131. i.MX51 Data Sheet Document Revision History (continued)
Rev.
Number
Date Substantive Change(s)
Rev. 3 06/2010 • Updated Max column of
Table 15, "Fuse Supply Current," on page 19 . Deleted eFuse Read Current row
from the same table.
• Updated Symbol, Test Conditions, and Max columns of Table 18, "GPIO/HSGPIO DC Electrical
.
• Updated Max and Unit columns of Table 19, "DDR2 I/O DC Electrical Parameters," on page 24 .
• Updated Test Conditions, Max, and Unit columns of
Table 20, "LVIO DC Electrical Characteristics," on page 24
• Updated Symbol, Test Conditions, Max, and Unit columns of
Table 21, "UHVIO DC Electrical
.
• Updated Max and Unit columns of Table 22, "I2C Standard/Fast/High-Speed Mode Electrical
Parameters for Low/Medium Drive Strength," on page 27
.
• Added a new table Table 25, "I/O Leakage Current," on page 29
.
Rev. 2 05/2010 • Changed the VREFOUT column in
Table 3, "Special Signal Considerations," on page 11
.
• Added
Section 3, “IOMUX Configuration for Boot Media”
.
• Updated
Figure 2, "Power-Up Sequence," on page 22 .
• Added a note in
Section 4.2.1, “Power-Up Sequence”
.
• Updated
Section 4.2.1, “Power-Up Sequence .
”
• Changed the Input current (47 k
Ω Pull-up) column in
Table 21, "UHVIO DC Electrical Characteristics," on page 25 to Input current (75 kO Pull-up).
• Added new table for parameters for DDR2 Pad output buffer Impedance. See
Output Buffer Impedance HVE = 0," on page 30
.
• Added new section under Section 4.5, “I/O AC Parameters”
. See
• Updated
Table 47, "CAMP Electrical Parameters (CKIH1, CKIH2)," on page 46 . In the VIH (for square
wave input) parameter, the minimum frequency was changed to NVCC_PER3 - 0.25V and the maximum frequency was changed to NVCC_PER3.
• Added a note in
Section 4.6.6, “NAND Flash Controller (NFC) Parameters ” after
.
• Updated Asymmetric Mode Min, Symmetric Mode Min, and Max columns of
• Removed Conditions parameters of the Full scale output voltage row in
• Updated
Section 4.7.11, “P-ATA Timing Parameters”
. Replaced ATA/ATAPI-6 specification with
ATA/ATAPI-5 specification.
• In
Clock Operation sections for the ID SS42, minimum frequency was changed from 10.0 to 30.
• In
Table 103, "SSI Receiver Timing with Internal Clock," on page 134 , under the Internal Clock
Operation section for ID SS20, minimum frequency was changed from 10.0 to 30.
• In
Table 104, "SSI Transmitter Timing with External Clock," on page 136 , under the External Clock
Operation section for ID SS38, maximum frequency was changed from 15.0 to 30.
• Added a new section Section 4.7.16.1, “UART Electrical” , under Section 4.7.16, “UART”
.
• In
Table 118, "USB Port Timing Specification in VP_VM Bi-directional Mode," on page 146 , for IDs SS28
and SS29, direction was changed from out to in.
• In
Table 120, "USB Timing Specification in VP_VM Unidirectional Mode," on page 148 , for IDs US40 and
US41, direction was changed from out to in and the reference signal was changed to USB_VM1 and
USB_VP1 respectively.
• In
Table 122, "USB Timing Specification for ULPI Parallel Mode," on page 149
, added an extra row for
ID17.
• Updated Signal and Direction columns in
Table 120, "USB Timing Specification in VP_VM Unidirectional
.
• Updated Signal names in
Table 118, "USB Port Timing Specification in VP_VM Bi-directional Mode," on page 146 .
Rev. 1 10/2009 Initial public release.
174 i.MX51A Automotive and Infotainment Applications Processors, Rev. 6
Freescale Semiconductor
How to Reach Us:
Home Page: freescale.com
Web Support: freescale.com/support
Information in this document is provided solely to enable system and software implementers to use Freescale products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits based on the information in this document.
Freescale reserves the right to make changes without further notice to any products herein. Freescale makes no warranty, representation, or guarantee regarding the suitability of its products for any particular purpose, nor does Freescale assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be provided in Freescale data sheets and/or specifications can and do vary in different applications, and actual performance may vary over time. All operating parameters, including “typicals,” must be validated for each customer application by customer’s technical experts. Freescale does not convey any license under its patent rights nor the rights of others. Freescale sells products pursuant to standard terms and conditions of sale, which can be found at the following address: freescale.com/SalesTermsandConditions.
Freescale and the Freescale logo are trademarks of Freescale Semiconductor, Inc. Reg.
U.S. Pat. & Tm. Off. All other product or service names are the property of their respective owners. ARM is the registered trademark of ARM Limited. ARM Cortex
TM
-A8 is the trademark of ARM Limited.
© 2012 Freescale Semiconductor, Inc. All rights reserved.
Document Number: IMX51AEC
Rev. 6
09/2012
Atsisiųsti
Reklama