STMicroelectronics M95256-DF Datasheet
Mainos
Mainos
SO8N
(150 mil width)
TSSOP8
(169 mil width)
UFDFPN8 (DFN8)
(2 x 3 mm)
WLSCP8
(1.289 x 1.376 mm)
Product status link
M95256-DF
M95256-R
M95256-W
M95256-W M95256-R M95256-DF
Datasheet
256-Kbit serial SPI bus EEPROM with high-speed clock
Features
• Compatible with the serial peripheral interface (SPI) bus
• Memory array
– 256-Kbit (32 Kbytes) of EEPROM
– Page size: 64 bytes
– Additional write lockable page (Identification page)
• Write time
– Byte Write within 5 ms
– Page Write within 5 ms
• Write protect
– quarter array
– half array
– whole memory array
• High-speed clock: 20 MHz
• Single supply voltage:
– 2.5 V to 5.5 V for M95256-W
– 1.8 V to 5.5 V for M95256-R
– 1.7 V to 5.5 V for M95256-DF
• Operating temperature range: from -40 °C up to +85 °C
• Enhanced ESD protection
• More than 4 million Write cycles
• More than 200-year data retention
• Packages
– SO8N (ECOPACK2)
– TSSOP8 (ECOPACK2)
– UFDFPN8 (ECOPACK2)
– WLCSP8 (ECOPACK2)
DS4712 - Rev 22 - September 2021
For further information contact your local STMicroelectronics sales office.
www.st.com
1
M95256-W M95256-R M95256-DF
Description
Description
The M95256 devices are electrically erasable programmable memories (EEPROMs) organized as 32768 x 8 bits, accessed through the SPI bus.
The M95256-W can operate with a supply voltage from 2.5 V to 5.5 V, the M95256-R can operate with a supply voltage from 1.8 V to 5.5 V and the M95256-DF can operate with a supply voltage from 1.7 V to 5.5 V, over an ambient temperature range of -40 °C / +85 °C.
The M95256-DF, -DR or -DW (hereinafter referred to as M95256-Dx) offer an additional page, named the
Identification page (64 bytes). The Identification page can be used to store sensitive application parameters that can be (later) permanently locked in read-only mode.
Figure 1. Logic diagram
V
CC
W
HOLD
D
C
S
M95xxx Q
V
SS
The SPI bus signals are C, D and Q, as shown in
and
. The device is selected when Chip select
(S) is driven low. Communications with the device can be interrupted when the HOLD is driven low.
Q
S
C
D
W
HOLD
V
CC
V
SS
Signal name
Table 1. Signal names
Function
Serial clock
Serial data input
Serial data output
Chip select
Write protect
Hold
Supply voltage
Ground -
-
Input
Input
Output
Input
Input
Input
Direction
DS4712 - Rev 22 page 2/51
DS4712 - Rev 22
M95256-W M95256-R M95256-DF
Description
Figure 2. 8-pin package connections (top view)
S
Q
W
V
SS
1
2
3
4
M95xxx
8
7
6
5
V
CC
HOLD
C
D
1.
See Section 10 Package information for package dimensions, and how to identify pin 1.
1 2
Figure 3. WLCSP connections
3 3 2 1
A
B
C
D
E
HOLD
V
CC
C
S
D
Q
V
SS
W
Q
V
SS
W
S
D
HOLD
V
CC
C
A
B
C
D
E
Position
1
2
3
Marking side
(top view)
A
HOLD
-
Q
Table 2. Signals versus bump position
S
-
B
-
C
V
CC
-
V
SS
Bump side
(bottom view)
D
-
D
-
-
W
E
C page 3/51
2
M95256-W M95256-R M95256-DF
Block diagram
Block diagram
The memory is organized as shown in the following figure.
Figure 4. Block diagram
/S
DATA REGISTER
+
ECC
SENSE AMPLIFIERS
PAGE LATCHES
Q
ARRAY
W
I/O
STATUS
REGISTER D
C
CONTROL
LOGIC
CUSTOM AREA (1)
HV GENERATOR
+
SEQUENCER
HOLD
X DECODER
ADDRESS
REGISTER
1. = Identification page
MS67262
DS4712 - Rev 22 page 4/51
3.7
3.8
3
3.1
3.2
3.3
3.4
3.5
3.6
M95256-W M95256-R M95256-DF
Signal description
Signal description
During all operations, V
CC
must be held stable and within the specified valid range: V
CC
(min) to V
CC
(max).
All of the input and output signals must be held high or low (according to voltages of V
IH
specified in Section 9 DC and AC parameters ). These signals are described next.
, V
OH
, V
IL
or V
OL
, as
Serial data output (Q)
This output signal is used to transfer data serially out of the device. Data is shifted out on the falling edge of Serial clock (C).
Serial data input (D)
This input signal is used to transfer data serially into the device. It receives instructions, addresses, and the data to be written. Values are latched on the rising edge of Serial clock (C).
Serial clock (C)
This input signal provides the timing of the serial interface. Instructions, addresses, or data present at Serial data input (D) are latched on the rising edge of Serial clock (C). Data on Serial data output (Q) change from the falling edge of Serial clock (C).
Chip select (S)
When this input signal is high, the device is deselected and Serial data output (Q) is at high impedance. The device is in the Standby power mode, unless an internal Write cycle is in progress. Driving Chip select (S) low selects the device, placing it in the Active power mode.
After power-up, a falling edge on Chip select (S) is required prior to the start of any instruction.
Hold (HOLD)
The Hold (HOLD) signal is used to pause any serial communications with the device without deselecting the device.
During the Hold condition, the Serial data output (Q) is high impedance, and Serial data input (D) and Serial clock
(C) are Don’t care.
To start the Hold condition, the device must be selected, with Chip select (S) driven low.
Write protect (W)
The main purpose of this input signal is to freeze the size of the area of memory that is protected against Write instructions (as specified by the values in the BP1 and BP0 bits of the Status register).
This pin must be driven either high or low, and must be stable during all Write instructions.
V
CC supply voltage
V
CC
is the supply voltage.
V
SS
ground
V
SS
is the reference for all signals, including the V
CC
supply voltage.
DS4712 - Rev 22 page 5/51
4
M95256-W M95256-R M95256-DF
Connecting to the SPI bus
Connecting to the SPI bus
All instructions, addresses and input data bytes are shifted in to the device, most significant bit first. The Serial data input (D) is sampled on the first rising edge of the Serial clock (C) after Chip select (S) goes low.
All output data bytes are shifted out of the device, most significant bit first. The Serial data output (Q) is latched on the first falling edge of the Serial clock (C) after the instruction (such as the Read from Memory array and Read
Status register instructions) have been clocked into the device.
Figure 5. Bus master and memory devices on the SPI bus
V
CC
SPI interface with
(CPOL, CPHA) =
(0, 0) or 1, 1)
SDO
SDI
SCK
SPI bus master
C Q D V
CC
C Q D V
CC
C Q D V
CC
CS3 CS2 CS1
R
SPI memory device
S W HOLD
R
SPI memory device
S W HOLD
R
SPI memory device
S W HOLD
(1) (1) (1) (1) (1) (1)
V
SS
1. The Write protect (W) and Hold (HOLD) signals should be driven, high or low as appropriate.
MS19755V3
shows an example of three memory devices connected to an SPI bus master. Only one memory device is selected at a given time, so only one memory device drives the Serial data output (Q) line at that time. The other memory devices are in high impedance state. The pull-up resistor R ensures that a device is not selected if the Bus master leaves the S line in the high impedance state.
In applications where the bus master can enter a state where the whole input/output SPI bus is high-impedance at a given time (for example, if the bus master is reset during the transmission of an instruction), it is advised to connect the clock line (C) to an external pull-down resistor so that, if all inputs/outputs become high-impedance, the C line is pulled low (while the S line is pulled high). This ensures that S and C do not become high at the same time, and so, that the t
SHCH
requirement is met. The typical value of R is 100 kΩ.
DS4712 - Rev 22 page 6/51
4.1
M95256-W M95256-R M95256-DF
SPI modes
SPI modes
These devices can be driven by a microcontroller with its SPI peripheral running in either of the following two modes:
• CPOL = 0, CPHA = 0
• CPOL = 1, CPHA = 1
•
•
For these two modes, input data is latched in on the rising edge of Serial clock (C), and output data is available from the falling edge of Serial clock (C).
The difference between the two modes, as shown in
, is the clock polarity when the bus master is in
Stand-by mode and not transferring data:
C remains at 0 for (CPOL = 0, CPHA = 0)
C remains at 1 for (CPOL = 1, CPHA = 1)
Figure 6. SPI modes supported
CPOL
0
CPHA
0 C
1 1 C
D
Q
MSB
MSB
DS4712 - Rev 22 page 7/51
5
5.1
5.1.1
5.1.2
5.1.3
5.1.4
M95256-W M95256-R M95256-DF
Operating features
Operating features
Supply voltage (V
CC
)
Operating supply voltage (V
CC
)
Prior to selecting the memory and issuing instructions to it, a valid and stable V
CC
voltage within the specified
[V
CC
(min), V
CC
(max)] range must be applied (see Operating conditions in Section 9 DC and AC parameters
).
This voltage must remain stable and valid until the end of the transmission of the instruction and, for a Write instruction, until the completion of the internal write cycle (t
W
). In order to secure a stable DC supply voltage, it is recommended to decouple the V
CC
line with a suitable capacitor (usually in the range between 10 and 100 nF) close to the V
CC
/ V
SS
device pins.
•
Device reset
In order to prevent erroneous instruction decoding and inadvertent Write operations during power ‑ up, a power ‑ on ‑ reset (POR) circuit is included. At power-up, the device does not respond to any instruction until
VCC reaches the POR threshold voltage. This threshold is lower than the minimum V
CC
operating voltage (see
Operating conditions in
Section 9 DC and AC parameters ).
•
•
At power-up, when V
CC
passes over the POR threshold, the device is reset and is in the following state: in Standby power mode, deselected,
Status register values:
– the Write enable latch (WEL) bit is reset to 0
– the Write in progress (WIP) bit is reset to 0
– the SRWD, BP1 and BP0 bits remain unchanged (non-volatile bits).
It is important to note that the device must not be accessed until V
CC
reaches a valid and stable level within the specified [V
CC
(min), V
CC
(max)] range, as defined under Operating conditions in
Section 9 DC and AC parameters
.
Power-up conditions
When the power supply is turned on, V
CC
rises continuously from V
SS
to V
CC
. During this time, the Chip select (S) line is not allowed to float but should follow the V
CC
voltage. It is therefore recommended to connect the S line to
V
CC
via a suitable pull-up resistor (see
Figure 5. Bus master and memory devices on the SPI bus ).
In addition, the Chip select (S) input offers a built-in safety feature, as the S input is edge-sensitive as well as level-sensitive: after power-up, the device does not become selected until a falling edge has first been detected on Chip select (S). This ensures that Chip select (S) must have been high, prior to going low to start the first operation.
The V
CC
voltage has to rise continuously from 0 V up to the minimum V
Section 9 DC and AC parameters .
CC
operating voltage defined in
•
•
Power-down
During power-down (continuous decrease of the V
CC
supply voltage below the minimum V
CC
operating voltage
defined in Section 9 DC and AC parameters ), the device must be:
deselected (Chip select S must be allowed to follow the voltage applied on V
CC
) in Standby power mode (there must not be any internal write cycle in progress)
DS4712 - Rev 22 page 8/51
5.2
5.3
5.4
M95256-W M95256-R M95256-DF
Active power and Standby power modes
Active power and Standby power modes
When Chip select (S) is low, the device is selected, and in the Active power mode. The device consumes I
CC
.
When Chip select (S) is high, the device is deselected. If a Write cycle is not currently in progress, the device then goes into the Standby power mode, and the device consumption drops to I
CC1
, as specified in DC characteristics
(see
Section 9 DC and AC parameters ).
Hold condition
The Hold (HOLD) signal is used to pause any serial communications with the device without resetting the clocking sequence.
To enter the Hold condition, the device must be selected, with Chip select (S) low.
During the Hold condition, the Serial data output (Q) is high impedance, and the Serial data input (D) and the
Serial clock (C) are Don’t care.
Normally, the device is kept selected for the whole duration of the Hold condition. Deselecting the device while it is in the Hold condition has the effect of resetting the state of the device: this mechanism can be used, if required, to reset the ongoing processes.
This resets the internal logic, except the WEL and WIP bits of the Status register.
In the specific case where the device has moved in a Write command (Inst + Address + data bytes, each data byte being exactly 8 bits), deselecting the device also triggers the Write cycle of this decoded command.
Figure 7. Hold condition activation
C
HOLD
Hold condition
Hold condition
The Hold condition starts when the Hold (HOLD) signal is driven low when Serial clock (C) is already low (as shown in
).
also shows what happens if the rising and falling edges are not timed to coincide with Serial clock (C) being low.
Status register
The Status register contains a number of status and control bits that can be read or set (as appropriate) by
register bits.
DS4712 - Rev 22 page 9/51
5.5
M95256-W M95256-R M95256-DF
Data protection and protocol control
Data protection and protocol control
The device features the following data protection mechanisms:
• Before accepting the execution of the Write and Write Status register instructions, the device checks whether the number of clock pulses comprised in the instructions is a multiple of eight.
•
•
•
All instructions that modify data must be preceded by a Write enable (WREN) instruction to set the Write enable latch (WEL) bit.
The Block protect (BP1, BP0) bits in the Status register are used to configure part of the memory as read ‑ only.
The Write protect (W) signal is used (in conjunction with the SRWD bit) to protect the Block protect (BP1,
BP0) bits in the Status register.
For any instruction to be accepted, and executed, Chip select (S) must be driven high after the rising edge of
Serial clock (C) for the last bit of the instruction, and before the next rising edge of Serial clock (C).
Two points to note in the previous sentence:
• The “last bit of the instruction” can be the eighth bit of the instruction code, or the eighth bit of a data byte, depending on the instruction (except for Read Status register (RDSR) and Read (READ) instructions).
• The “next rising edge of Serial clock (C)” might (or might not) be the next bus transaction for some other device on the SPI bus.
Status register bits
BP1
0
0
1
1
BP0
0
1
0
1
Table 3. Write-protected block size
Protected block
None
Upper quarter
Upper half
Whole memory
Protected array addresses
None
6000h - 7FFFh
4000h - 7FFFh
0000h - 7FFFh
DS4712 - Rev 22 page 10/51
M95256-W M95256-R M95256-DF
Instructions
6
Instructions
Each command is composed of bytes (MSBit transmitted first), initiated with the instruction byte, as summarized
If an invalid instruction is sent (one not contained in
), the device automatically enters in a Wait state until deselected.
Table 4. Instruction set
Instruction
WREN
WRDI
RDSR
WRSR
READ
WRITE
RDID
LID
Write enable
Write disable
Read Status register
Write Status register
Read from Memory array
Write to Memory array
Read Identification page
Write Identification page
Description
Reads the Identification page lock status
Locks the Identification page in read-only mode
1. Instruction available only for the M95256-D device.
Instruction format
0000 0110
0000 0100
0000 0101
0000 0001
0000 0011
0000 0010
1000 0011
1000 0010
1000 0011
1000 0010
For read and write commands to memory array and Identification page the address is defined by two bytes as explained in the following table.
Instruction
READ or WRITE
RDID or WRID
RDLS or LID
Note: b15 x b14
A14
0
0
0
0
Table 5. Significant bits within the address bytes b13
MSB address byte b12 b11 b10 b9 b8 b7 b6 b5
LSB address byte b4 b3 b2
A13 A12 A11 A10 A9 A8 A7 A6 A5 A4 b1 b0
A3 A2 A1 A0
0
0
A: Significant address bit.
x: bit is Don’t care.
0
0
0
0
0
1
0
0
0
0
0
0
0 A5 A4 A3 A2 A1 A0
0 0 0 0 0 0 0
DS4712 - Rev 22 page 11/51
6.1
M95256-W M95256-R M95256-DF
Write enable (WREN)
Write enable (WREN)
The Write enable latch (WEL) bit must be set prior to each WRITE and WRSR instruction. The only way to do this is to send a Write enable instruction to the device.
instruction byte are shifted in, on Serial data input (D). The device then enters a wait state. It waits for the device to be deselected by Chip select (S) being driven high.
Figure 8. Write enable (WREN) sequence
S
0 1 2 3 4 5 6 7
C
Instruction
D
High impedance
Q
MS41478V1
DS4712 - Rev 22 page 12/51
6.2
M95256-W M95256-R M95256-DF
Write disable (WRDI)
Write disable (WRDI)
One way of resetting the Write enable latch (WEL) bit is to send a Write disable instruction to the device.
instruction byte are shifted in, on Serial data input (D).
•
•
The device then enters a wait state. It waits for a the device to be deselected, by Chip select (S) being driven high.
The Write enable latch (WEL) bit, in fact, becomes reset by any of the following events:
• Power-up
WRDI instruction execution
WRSR instruction completion
• WRITE instruction completion.
Figure 9. Write disable (WRDI) sequence
S
0 1 2 3 4 5 6 7
C
Instruction
D
High Impedance
Q
DS4712 - Rev 22 page 13/51
6.3
6.3.1
6.3.2
6.3.3
M95256-W M95256-R M95256-DF
Read Status register (RDSR)
Read Status register (RDSR)
The Read Status register (RDSR) instruction is used to read the Status register. The Status register may be read at any time, even while a Write or Write Status register cycle is in progress. When one of these cycles is in progress, it is recommended to check the Write in progress (WIP) bit before sending a new instruction to the device. It is also possible to read the Status register continuously, as shown in
Figure 10. Read Status register (RDSR) sequence
S
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
C
Instruction
D
Q
High impedance
Status Register Out Status Register Out
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
MSB MSB
7
MS47548V1
The status and control bits of the Status register are detailed in the following subsections.
WIP bit
The Write in progress (WIP) bit indicates whether the memory is busy with a Write or Write Status Register cycle.
When set to 1, such a cycle is in progress, when reset to 0, no such cycle is in progress.
•
WEL bit
•
•
The Write enable latch (WEL) bit indicates the status of the internal Write enable latch. When set to 1, the internal
Write enable latch is set. When set to 0, the internal Write enable latch is reset, and no Write or Write Status
Register instruction is accepted.
The WEL bit is returned to its reset state by the following events:
• Power-up
Write Disable (WRDI) instruction completion
Write Status Register (WRSR) instruction completion
Write (WRITE) instruction completion
BP1, BP0 bits
The Block protect (BP1, BP0) bits are non volatile. They define the size of the area to be software-protected against Write instructions. These bits are written with the Write Status register (WRSR) instruction. When one or both of the Block protect (BP1, BP0) bits is set to 1, the relevant memory area (as defined in
Table 3. Writeprotected block size
) becomes protected against Write (WRITE) instructions. The Block protect (BP1, BP0) bits can be written provided that the Hardware Protected mode has not been set.
DS4712 - Rev 22 page 14/51
6.3.4
M95256-W M95256-R M95256-DF
Read Status register (RDSR)
SRWD bit
The Status register Write Disable (SRWD) bit is operated in conjunction with the Write protect (W) signal. The
Status register Write Disable (SRWD) bit and Write protect (W) signal enable the device to be put in the Hardware
Protected mode (when the Status register Write Disable (SRWD) bit is set to 1, and Write protect (W) is driven low). In this mode, the non-volatile bits of the Status register (SRWD, BP1, BP0) become read-only bits and the
Write Status register (WRSR) instruction is no longer accepted for execution.
Table 6. Status register format b7
SRWD
Status register Write protect
0 0 0 BP1 BP0 WEL b0
WIP
Block protect bits
Write enable latch bit
Write in progress bit
DS4712 - Rev 22 page 15/51
6.4
M95256-W M95256-R M95256-DF
Write Status register (WRSR)
Write Status register (WRSR)
The Write Status register (WRSR) instruction is used to write new values to the Status register. Before it can be accepted, a Write enable (WREN) instruction must have been previously executed.
The Write Status register (WRSR) instruction is entered by driving Chip select (S) low, followed by the instruction code, the data byte on Serial Data input (D) and Chip select (S) driven high. Chip select (S) must be driven high after the rising edge of Serial clock (C) that latches in the eighth bit of the data byte, and before the next rising edge of Serial clock (C). Otherwise, the Write Status register (WRSR) instruction is not executed.
The following figure shows the instruction sequence.
Figure 11. Write Status register (WRSR) sequence
S
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
C
D
Instruction Status Register In
7 6 5 4 3 2 1 0
MSB
High impedance
Q
MS47556V1
Driving the Chip select (S) signal high at a byte boundary of the input data triggers the self-timed Write cycle that takes t
W
to complete (as specified in AC tables in Section 9 DC and AC parameters
).
While the Write Status register cycle is in progress, the Status register may still be read to check the value of the
Write in progress (WIP) bit: the WIP bit is 1 during the self-timed Write cycle t
W
, and 0 when the Write cycle is complete. The WEL bit (Write enable latch) is also reset at the end of the Write cycle t
W
.
The Write Status register (WRSR) instruction enables the user to change the values of the BP1, BP0 and SRWD bits:
•
•
The Block protect (BP1, BP0) bits define the size of the area that is to be treated as read-only, as defined in
.
The SRWD (Status register Write Disable) bit, in accordance with the signal read on the Write protect pin
(W), enables the user to set or reset the Write protection mode of the Status register itself, as defined in
. When in Write-protected mode, the Write Status register (WRSR) instruction is not executed.
The contents of the SRWD and BP1, BP0 bits are updated after the completion of the WRSR instruction, including the t
W
Write cycle.
The Write Status register (WRSR) instruction has no effect on the b6, b5, b4, b1, b0 bits in the Status register.
Bits b6, b5, b4 are always read as 0.
DS4712 - Rev 22 page 16/51
DS4712 - Rev 22
M95256-W M95256-R M95256-DF
Write Status register (WRSR)
Table 7. Protection modes
W signal
1
0
1
0
SRWD bit
0
0
1
1
Mode
Softwareprotected
(SPM)
Hardwareprotected
(HPM)
Write protection of the Status register
Memory content
Protected
Status register is writable (if the WREN instruction has set the WEL bit).
The values in the BP1 and BP0 bits can be changed.
Status register is Hardware write-protected.
The values in the BP1 and BP0 bits cannot be changed.
Writeprotected
Writeprotected
Ready to accept
Write instructions
Ready to accept
Write instructions
1. As defined by the values in the Block protect (BP1, BP0) bits of the Status register. See
.
The protection features of the device are summarized in Table 7
.
When the Status register Write Disable (SRWD) bit in the Status register is 0 (its initial delivery state), it is possible to write to the Status register (provided that the WEL bit has previously been set by a WREN instruction), regardless of the logic level applied on the Write protect (W) input pin.
When the Status register Write Disable (SRWD) bit in the Status register is set to 1, two cases should be considered, depending on the state of the Write protect (W) input pin:
• If Write protect (W) is driven high, it is possible to write to the Status register (provided that the WEL bit has previously been set by a WREN instruction).
• If Write protect (W) is driven low, it is not possible to write to the Status register even if the WEL bit has previously been set by a WREN instruction. (Attempts to write to the Status register are rejected, and are not accepted for execution). As a consequence, all the data bytes in the memory area, which are Softwareprotected (SPM) by the Block protect (BP1, BP0) bits in the Status register, are also hardware-protected against data modification.
Regardless of the order of the two events, the Hardware-protected mode (HPM) can be entered by:
• either setting the SRWD bit after driving the Write protect (W) input pin low,
• or driving the Write protect (W) input pin low after setting the SRWD bit.
Once the Hardware-protected mode (HPM) has been entered, the only way of exiting it is to pull high the Write protect (W) input pin.
If the Write protect (W) input pin is permanently tied high, the Hardware-protected mode (HPM) can never be activated, and only the Software-protected mode (SPM), using the Block protect (BP1, BP0) bits in the Status register, can be used.
page 17/51
6.5
Note:
M95256-W M95256-R M95256-DF
Read from Memory array (READ)
Read from Memory array (READ)
, to send this instruction to the device, Chip select (S) is first driven low. The bits of the instruction byte and address bytes are then shifted in, on Serial data input (D). The address is loaded into an internal address register, and the byte of data at that address is shifted out, on Serial data output (Q).
Figure 12. Read from Memory array (READ) sequence
S
0 1 2 3 4 5 6 7 8 9 10 20 21 22 23 24 25 26 27 28 29 30 31
C
Instruction 16-Bit Address
D
Q
High Impedance
15 14 13
MSB
3 2 1 0
7 6 5 4 3
MSB
Data Out 1
2 1 0 7
Data Out 2
Depending on the memory size, as shown in Table 5. Significant bits within the address bytes
, the most significant address bits are Don’t care.
If Chip select (S) continues to be driven low, the internal address register is incremented automatically, and the byte of data at the new address is shifted out.
When the highest address is reached, the address counter rolls over to zero, allowing the Read cycle to be continued indefinitely. The whole memory can, therefore, be read with a single READ instruction.
The Read cycle is terminated by driving Chip select (S) high. The rising edge of the Chip select (S) signal can occur at any time during the cycle.
The instruction is not accepted, and is not executed, if a Write cycle is currently in progress.
DS4712 - Rev 22 page 18/51
6.6
Note:
Note:
M95256-W M95256-R M95256-DF
Write to Memory array (WRITE)
Write to Memory array (WRITE)
, to send this instruction to the device, Chip select (S) is first driven low. The bits of the instruction byte, address byte, and at least one data byte are then shifted in, on Serial data input (D).
The instruction is terminated by driving Chip select (S) high at a byte boundary of the input data. The self ‑ timed
Write cycle, triggered by the Chip select (S) rising edge, continues for a period t
W
(as specified in AC
reset to 0.
Figure 13. Byte Write (WRITE) sequence
S
0 1 2 3 4 5 6 7 8 9 10 20 21 22 23 24 25 26 27 28 29 30 31
C
D
Instruction 16-bit address
15 14 13 3 2 1 0
Data byte
7 6 5 4 3 2 1 0
High impedance
Q
•
•
Depending on the memory size, as shown in Table 5. Significant bits within the address bytes
, the most significant address bits are Don’t care.
In the case of
Figure 13 , Chip select (S) is driven high after the eighth bit of the data byte has been latched
in, indicating that the instruction is being used to write a single byte. However, if Chip select (S) continues to be driven low (as shown in
Figure 14 ), the next byte of input data is shifted in, so that more than a single byte,
starting from the given address towards the end of the same page, can be written in a single internal Write cycle.
Each time a new data byte is shifted in, the least significant bits of the internal address counter are incremented.
If more bytes are sent than will fit up to the end of the page, a condition known as “roll-over” occurs. In case of roll-over, the bytes exceeding the page size are overwritten from location 0 of the same page.
The instruction is not accepted, and is not executed, under the following conditions:
• if the Write enable latch (WEL) bit has not been set to 1 (by executing a Write enable instruction just before),
• if a Write cycle is already in progress, if the device has not been deselected, by driving high Chip select (S), at a byte boundary (after the eighth bit, b0, of the last data byte that has been latched in), if the addressed page is in the region protected by the Block protect (BP1 and BP0) bits.
The self-timed write cycle t
W
is internally executed as a sequence of two consecutive events: [Erase addressed byte(s)], followed by [Program addressed byte(s)]. An erased bit is read as “0” and a programmed bit is read as
“1”.
DS4712 - Rev 22 page 19/51
DS4712 - Rev 22
M95256-W M95256-R M95256-DF
Write to Memory array (WRITE)
Figure 14. Page Write (WRITE) sequence
S
C
0 1 2 3 4 5 6 7 8 9 10 20 21 22 23 24 25 26 27 28 29 30 31
Instruction 16-Bit Address Data Byte 1
15 14 13 3 2 1 0 7 6 5 4 3 2 1 0
D
S
C
D
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
Data Byte 2 Data Byte 3 Data Byte N
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 6 5 4 3 2 1 0
1.
significant address bits are Don’t care.
page 20/51
6.6.1
M95256-W M95256-R M95256-DF
Write to Memory array (WRITE)
Cycling with Error Correction Code (ECC x 4)
The M95256 devices offer an error correction code (ECC) logic. The ECC is an internal logic function transparent for the SPI communication protocol.
The ECC logic is implemented on each group of four EEPROM bytes (A group of four bytes is located at addresses [4*N, 4*N+1, 4*N+2, 4*N+3], where N is an integer. Inside a group, if a single bit out of the four bytes happens to be erroneous during a Read operation, the ECC detects this bit and replaces it with the correct value.
The read reliability is therefore much improved.
Even if the ECC function is performed on groups of four bytes, a single byte can be written/cycled independently.
In this case, the ECC function also writes/cycles the three other bytes located in the same group. As a consequence, the maximum cycling budget is defined at group level and the cycling can be distributed over the four bytes of the group: the sum of the cycles seen by byte0, byte1, byte2 and byte3 of the same group must remain below the maximum value defined in
Table 13. Cycling performance by groups of four bytes
.
DS4712 - Rev 22 page 21/51
6.7
M95256-W M95256-R M95256-DF
Read Identification page (available only in M95256-D devices)
Read Identification page (available only in M95256-D devices)
The Identification page (64 bytes) is an additional page that can be written and (later) permanently locked in
Read-only mode.
This page is read with the Read Identification page instruction (see Table 4. Instruction set
). The Chip select signal (S) is first driven low, the bits of the instruction byte and address bytes are then shifted in, on Serial data input (D). Address bit A10 must be 0, upper address bits are Don't care, and the data byte pointed to by the lower address bits [A5:A0] is shifted out on Serial data output (Q). If Chip select (S) continues to be low, the internal address register is automatically incremented, and the byte of data at the new address is shifted out.
The number of bytes to read in the ID page must not exceed the page boundary, otherwise unexpected data are read (for instance when reading the ID page from location 24d, the number of bytes must be lower than or equal to 40d, as the ID page boundary is 64 bytes).
The read cycle is terminated by driving Chip select (S) high. The rising edge of the Chip select (S) signal can occur at any time during the cycle. The first byte addressed can be any byte within any page.
The instruction is not accepted, and is not executed, if a write cycle is currently in progress.
Figure 15. Read Identification page sequence
S
C
0 1 2 3 4 5 6 7 8 9 10 20 21 22 23 24 25 26 27 28 29 30 31
Instruction 16-bit address
D
Q
High impedance
15
MSB
14 13 3 2 1 0
Data Out 1
7 6 5 4 3
MSB
2 1 0
Data Out 2
7
DS4712 - Rev 22 page 22/51
6.8
M95256-W M95256-R M95256-DF
Write Identification page (available only in M95256-D devices)
Write Identification page (available only in M95256-D devices)
The Identification page (64 bytes) is an additional page that can be written and (later) permanently locked in
Read-only mode.
). The Chip select signal (S) is first driven low. The bits of the instruction byte, address bytes, and at least one data byte are then shifted in on Serial data input (D). Address bit A10 must be 0, upper address bits are Don't care, the lower address bits [A5:A0] define the byte address within the Identification page. The instruction sequence is shown in
Figure 16. Write Identification page sequence
S
0 1 2 3 4 5 6 7 8 9 10 20 21 22 23 24 25 26 27 28 29 30 31
C
Instruction 16-bit address Data byte
D
15 14 13 3 2 1 0 7 6 5 4 3 2 1 0
High impedance
Q
DS4712 - Rev 22 page 23/51
6.9
M95256-W M95256-R M95256-DF
Read Lock status (available only in M95256-D devices)
Read Lock status (available only in M95256-D devices)
The Read Lock status instruction (see Table 4. Instruction set
) is used to check whether the Identification page is locked or not in Read-only mode. The Read Lock status sequence is defined with the Chip select (S) first driven low. The bits of the instruction byte and address bytes are then shifted in on Serial data input (D). Address bit A10 must be 1, all other address bits are Don't care. The Lock bit is the LSB (least significant bit) of the byte read on
Serial data output (Q). It is at “1” when the lock is active and at “0” when the lock is not active. If Chip select (S) continues to be driven low, the same data byte is shifted out. The read cycle is terminated by driving Chip select
(S) high.
The following figure shows the instruction sequence.
Figure 17. Read Lock status sequence
S
0 1 2 3 4 5 6 7 8 9 10 20 21 22 23 24 25 26 27 28 29 30 31
C
Instruction 16-bit address
D
Q
High impedance
15 14 13
MSB
3 2 1 0
7 6 5 4 3
MSB
Data Out 1
2 1 0
Data Out 2
7
DS4712 - Rev 22 page 24/51
6.10
M95256-W M95256-R M95256-DF
Lock ID (available only in M95256-D devices)
Lock ID (available only in M95256-D devices)
The Lock ID instruction permanently locks the Identification page in read-only mode. Before this instruction can be accepted, a Write enable (WREN) instruction must have been executed.
The Lock ID instruction is issued by driving Chip select (S) low, sending the instruction code, the address and a data byte on Serial data input (D), and driving Chip select (S) high. In the address sent, A10 must be equal to 1, all other address bits are Don't Care. The data byte sent must be equal to the binary value xxxx xx1x, where x =
Don't care.
Chip select (S) must be driven high after the rising edge of Serial clock (C) that latches in the eighth bit of the data byte, and before the next rising edge of Serial clock (C). Otherwise, the Lock ID instruction is not executed.
•
•
Driving Chip select (S) high at a byte boundary of the input data triggers the self-timed write cycle whose duration is t
W
(as specified in AC characteristics in
Section 9 DC and AC parameters
). The instruction sequence is shown
.
The instruction is discarded, and is not executed, under the following conditions:
• If a Write cycle is already in progress
If Block protect bits (BP1,BP0) = (1,1)
If a rising edge on Chip select (S) happens outside of a byte boundary.
• If the Write enable latch (WEL) bit has not been set to 1 (by executing a Write enable instruction just before)
Figure 18. Lock ID sequence
S
0 1 2 3 4 5 6 7 8 9 10 20 21 22 23 24 25 26 27 28 29 30 31
C
Instruction 16-bit address Data byte
D
15 14 13 3 2 1 0 7 6 5 4 3 2 1 0
High impedance
Q
DS4712 - Rev 22 page 25/51
M95256-W M95256-R M95256-DF
Power-up and delivery state
7
Power-up and delivery state
7.1
7.2
•
•
•
•
Power-up state
After power-up, the device is in the following state:
• Standby power mode
Deselected (after power-up, a falling edge is required on Chip select (S) before any instructions can be started)
Not in the Hold condition
The Write enable latch (WEL) is reset to 0
Write in progress (WIP) is reset to 0
The SRWD, BP1 and BP0 bits of the Status register are unchanged from the previous power-down (they are non-volatile bits).
Initial delivery state
The device is delivered with the memory array and Identification page bits set to all 1s (each byte = FFh). The
Status register Write Disable (SRWD) and Block protect (BP1 and BP0) bits are initialized to 0.
DS4712 - Rev 22 page 26/51
8
M95256-W M95256-R M95256-DF
Maximum ratings
Maximum ratings
Stressing the device outside the ratings listed in
may cause permanent damage to the device. These are stress ratings only, and operation of the device at these, or any other conditions outside those indicated in the operating sections of this specification, is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Table 8. Absolute maximum ratings
Symbol
T
AMB
T
STG
T
LEAD
V
O
V
I
V
CC
I
OL
I
OH
V
ESD
Ambient operating temperature
Storage temperature
Parameter
Lead temperature during soldering
Output voltage
Input voltage
Supply voltage
DC output current (Q = 0)
DC output current (Q = 1)
Electrostatic discharge voltage (human body model)
Min.
–40
–65
–0.50
-
-
-
Max.
130
150
–0.50
–0.50
V
CC
+ 0.6
6.5
6.5
5
5
4000
Unit
°C
V mA
V
1. Compliant with JEDEC standard J-STD-020 (for small-body, Sn-Pb or Pb free assembly), the ST ECOPACK 7191395 specification, and the European directive on Restrictions on Hazardous Substances (RoHS directive 2011/65/EU of July
2011).
2. Positive and negative pulses applied on different combinations of pin connections, according to AEC-Q100-002 (compliant with ANSI/ESDA/JEDEC JS-001-2012, C1 = 100 pF, R1 = 1500 Ω, R2 = 500 Ω).
DS4712 - Rev 22 page 27/51
9
M95256-W M95256-R M95256-DF
DC and AC parameters
DC and AC parameters
This section summarizes the operating conditions and the DC/AC characteristics.
Symbol
V
CC
T
A
Table 9. Operating conditions (M95256-W, device grade 6)
Parameter
Supply voltage
Ambient operating temperature
Min.
2.5
–40
Symbol
V
CC
T
A
Max.
5.5
85
Table 10. Operating conditions (M95256-R, device grade 6)
Parameter
Supply voltage
Ambient operating temperature
Min.
1.8
-40
Max.
5.5
85
Symbol
V
CC
T
A
Table 11. Operating conditions (M95256-DF, device grade 6)
Parameter
Supply voltage
Ambient operating temperature
Min.
1.7
–40
Max.
5.5
85
Symbol
C
L
-
-
-
Table 12. AC measurement conditions
Parameter
Load capacitance
Input rise and fall times
Input pulse voltages
Input and output timing reference voltages
Min.
-
Max.
100
25
0.2 V
CC
to 0.8 V
CC
0.3 V
CC
to 0.7 V
CC
Input Levels
0.8 ₓ V
CC
Figure 19. AC measurement I/O waveform
Input and Output
Timing Reference Levels
0.7 ₓ V
CC
0.3 ₓ V
CC
0.2 ₓ V
CC
Unit
V
°C
Unit
V
°C
Unit
V
°C
Unit pF ns
V
V
DS4712 - Rev 22 page 28/51
DS4712 - Rev 22
M95256-W M95256-R M95256-DF
DC and AC parameters
Table 13. Cycling performance by groups of four bytes
Symbol
N cycle
Parameter
Test condition
T
A
≤ 25 °C, V
CC(min)
< V
CC
< V
CC(max)
T
A
= 85 °C, V
CC(min)
< V
CC
< V
CC(max)
Min.
-
-
Max.
4,000,000
1,200,000
Unit
1. The Write cycle endurance is defined for groups of four data bytes located at addresses [4*N, 4*N+1, 4*N+2, 4*N+3], where
N is an integer. The Write cycle endurance is evaluated by characterization and qualification.
2. A Write cycle is executed when either a Page write, a Byte write, a WRSR, a WRID or an LID instruction is decoded. When using the Byte write, the Page write or the WRID instruction, refer also to
Section 6.6.1 Cycling with Error Correction Code
Table 14. Memory cell data retention
Data retention
Parameter
T
A
= 55 °C
Test condition Min.
-
Max.
200
1. The data retention behaviour is checked in production, while the 200-year limit is evaluated by characterization and qualification results.
Unit
Year
Table 15. Capacitance
Symbol
C
OUT
C
IN
Parameter
Output capacitance (Q)
Input capacitance (D)
Input capacitance (other pins)
V
OUT
= 0 V
V
IN
= 0 V
V
IN
= 0 V
1. Evaluated By Characterization at T
A
= 25 °C and frequency of 5 MHz – Not tested in production.
Min.
-
-
-
Max.
8
8
6
Unit pF pF pF page 29/51
DS4712 - Rev 22
M95256-W M95256-R M95256-DF
DC and AC parameters
Table 16. DC characteristics (M95256-W, device grade 6)
Symbol
I
I
I
I
LI
I
LO
CC
CC0
CC1
Parameter
Input leakage current
Output leakage current
Supply current (Read)
Supply current (Write)
Supply current
(Standby Power mode)
Test conditions
V
IN
= V
SS
or V
CC
S = V
CC
, Q = V
SS
or V
CC
V
CC
= 2.5 V, C = 0.1 V
CC
/ 0.9 V
CC at 10 MHz, Q = open
V
CC
= 5.5 V, C = 0.1 V
CC
/ 0.9 V
CC at 20 MHz, Q = open
-
During t
W
, S = V
CC
,
2.5 V ≤ V
CC
≤ 5.5 V
S = V
CC
, V
CC
= 2.5 V,
V
IN
= V
SS
or V
CC
S = V
CC
, V
CC
= 5.5 V,
V
IN
= V
SS
or V
CC
V
IL
V
V
V
IH
OL
OH
Input low voltage
Input high voltage
Output low voltage
Output high voltage
-
V
CC
= 2.5 V and I
OL
= 1.5 mA or
V
CC
= 5 V and I
OL
= 2 mA
V
CC
= 2.5 V and I
OH
= –0.4 mA or
V
CC
= 5 V and I
OH
= –2 mA
1. Evaluated By Characterization - Not tested in production.
Min.
-
-
–0.45
0.7 V
CC
-
-
-
-
-
-
0.8 V
CC
Max.
± 2
± 2
2
5
5
2
3
0.3 V
CC
V
CC
+1
0.4
-
Unit
µA
µA mA mA mA
µA
V
µA
V
V
V
Table 17. DC characteristics (M95256-R, device grade 6)
Symbol
I
I
V
V
I
LI
LO
CC
I
CC0
I
CC1
V
IL
V
IH
OL
OH
Parameter
Input leakage current
Output leakage current
Supply current (Read)
Supply current (Write)
Supply current (Standby Power mode)
Input low voltage
Input high voltage
Output low voltage
Output high voltage
I
I
V
IN
= V
SS
or V
CC
S = V
CC
, Q = V
SS
or V
CC
V
CC
= 1.8 V, C = 0.1 V
CC
/ 0.9 V
CC at 5 MHz, Q = open
V
CC
V
CC
= 1.8 V, S = V
CC
OL
OH
Test conditions
= 1.8 V , during t
W
1.8 V ≤ V
1.8 V ≤ V
CC
CC
< 2.5 V
< 2.5 V
= 0.15 mA, V
CC
= –0.1 mA, V
CC
, S = V
, V
IN
CC
= V
SS
or
= 1.8 V
= 1.8 V
V
CC
Min
-
-
-
-
-
-
0.8 V
CC
Max
1. If the application uses the M95256-R with 2.5 V < V
CC
< 5.5 V and - 40 °C < T
A
< + 85 °C, refer to
Table 16. DC characteristics (M95256-W, device grade 6) instead of the above table.
2. Evaluated By Characterization - Not tested in production.
± 2
± 2
2
3
1
– 0.45
0.25 V
CC
0.75 V
CC
V
CC
0.3
-
+1
Unit
µA
µA mA mA
µA
V
V
V
V page 30/51
M95256-W M95256-R M95256-DF
DC and AC parameters
Table 18. DC characteristics (M95256-DF, device grade 6)
Symbol
I
I
LI
I
LO
CC
Parameter
Input leakage current
Output leakage current
Supply current (Read)
Test conditions
V
IN
= V
SS
or V
CC
S = V
CC
, Q = V
SS
or V
CC
V
CC
= 1.7 V, C = 0.1 V
CC
/ 0.9 V
CC
, at 5 MHz, Q = open
Min.
-
-
-
I
CC0
I
CC1
V
IL
V
IH
V
OL
V
OH
Supply current (Write)
Supply current (Standby)
Input low voltage
Input high voltage
Output low voltage
Output high voltage
V
CC
= 1.7 V, during t
W
, S = V
V
CC
= 1.7 V, S = V
CC
, V
IN
= V
SS
or V
CC
1.7 V ≤ V
CC
< 2.5 V
1.7 V ≤ V
CC
< 2.5 V
I
OL
= 0.15 mA, V
CC
= 1.7 V
I
OH
= –0.1 mA, V
CC
= 1.7 V
CC
1. If the application uses the M95256-DF devices at 2.5 V ≤ V
CC
≤ 5.5 V and –40 °C ≤ T
A
≤ +85 °C, refer to
Table 16. DC characteristics (M95256-W, device grade 6) , rather than to the above table.
2. Evaluated By Characterization - Not tested in production.
-
-
– 0.45
0.75 V
CC
-
0.8 V
CC
Max.
± 2
± 2
2
3
1
0.25 V
CC
V
CC
+1
0.3
-
Unit
µA
µA mA mA
µA
V
V
V
V
DS4712 - Rev 22 page 31/51
DS4712 - Rev 22
M95256-W M95256-R M95256-DF
DC and AC parameters
Table 19. AC characteristics t
CLHH t
SHQZ
t
CLQV t
CLQX t
QLQH
t
QHQL
t
HHQV t
HLQZ
t
W t
CL
t
CLCH
t
CHCL
t
DVCH t
CHDX t
HHCH t
HLCH t
CLHL f
C t
SLCH t
SHCH t
SHSL t
CHSH t
CHSL t
CH
Symbol Alt.
Test conditions specified either in
or in
Parameter
1.7 V ≤ V
CC
< 2.5 V 2.5 V ≤ V
CC
< 4.5 V V
CC
≥ 4.5V
Min.
Max.
Min.
Max.
Min. Max.
Unit f
SCK
Clock frequency t
CSS1
S active setup time t
CSS2
S not active setup time
-
60
60
5
-
-
-
30
30
10
-
-
-
15
15
20
-
-
MHz ns ns t
CS t
CSH
S deselect time
S active hold time
S not active hold time
Clock high time
90
60
60
80 -
-
-
40
30
30
40 -
-
-
20
15
15
20 -
-
-
ns ns ns ns t
CLH t
CLL t
RC
Clock low time
Clock rise time
80
-
-
2
40
-
-
2
20
-
-
2 ns
µs t
FC t
DSU t
DH
-
-
Clock fall time
Data in setup time
Data in hold time
Clock low hold time after HOLD not active
Clock low hold time after HOLD active
Clock low setup time before HOLD active
-
20
20
60
60
0
2
-
-
-
-
-
-
10
10
30
30
0
2
-
-
-
-
-
-
5
10
15
15
0
2
-
-
-
-
-
µs ns ns ns ns ns
Clock low setup time before HOLD not active 0 0 0 ns t t t t
DIS t
V t
HO
RO t
FO t
LZ
HZ
WC
Output disable time
Clock low to output valid
Output hold time
Output rise time
Output fall time
HOLD high to output valid
HOLD low to output High-Z
Write time
-
-
0
-
-
-
-
-
80
80
-
20
20
80
80
5
-
-
0
-
-
-
-
-
40
40
-
20
20
40
40
5
-
-
0
-
-
-
-
-
20
20
-
10
10
20
20
5 ns ns ns ns ns ns ns ms
1. t
CH
+ t
CL
must never be less than the shortest possible clock period, 1 / f
C
(max).
2. Evaluated By Characterization - Not tested in production.
page 32/51
DS4712 - Rev 22
S
C
Q t
CLQV t
CLQX
D
ADDR
LSB IN
S
C t
CHSL
D
Q t
SLCH t
DVCH
MSB IN t
CHCL t
CHDX
High impedance
M95256-W M95256-R M95256-DF
DC and AC parameters
Figure 20. Serial input timing t
SHSL t
CH t
CL t
CHSH
LSB IN t
CLCH t
SHCH
Figure 21. Hold timing
S t
HLCH
C t
CLHL t
HLQZ t
HHCH t
CLHH t
HHQV
Q
HOLD t
CLCH
Figure 22. Serial output timing t
CH t
CHCL t
CL t
QLQH t
QHQL t
SHSL t
SHQZ page 33/51
10
10.1
M95256-W M95256-R M95256-DF
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages, depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product status are available at: www.st.com. ECOPACK is an ST trademark.
SO8N package information
SO8N is an 8-lead, 4.9 x 6 mm, plastic small outline, 150 mils body width, package.
Figure 23. SO8N – Outline h x 45˚
A2 A c ccc b e
D
0.25 mm
GAUGE PLANE k
8
E1 E
1
A1
L
L1
1.
Drawing is not to scale.
DS4712 - Rev 22 page 34/51
DS4712 - Rev 22
M95256-W M95256-R M95256-DF
SO8N package information
Table 20. SO8N – Mechanical data
Symbol c
D
E
E1 e
A
A1
A2 b h k
L
L1 ccc
Min.
-
0.100
1.250
0.280
0.170
4.800
5.800
3.800
-
0.250
0°
0.400
-
millimeters
Typ.
-
4.900
6.000
3.900
1.270
-
-
-
-
-
-
-
1.040
-
Max.
1.750
0.250
-
0.480
0.230
5.000
6.200
4.000
-
0.500
8°
1.270
-
0.100
Min.
-
0.0039
0.0492
0.0110
0.0067
0.1890
0.2283
0.1496
-
0.0098
0°
0.0157
-
-
1. Values in inches are converted from mm and rounded to four decimal digits.
Figure 24. SO8N - Recommended footprint
0.6 (x8) inches
Typ.
-
0.1929
0.2362
0.1535
0.0500
-
-
-
-
-
-
-
0.0409
-
Max.
0.0689
0.0098
-
0.0189
0.0091
0.1969
0.2441
0.1575
-
0.0197
8°
0.0500
-
0.0039
1.
Dimensions are expressed in millimeters.
1.27
page 35/51
10.2
M95256-W M95256-R M95256-DF
TSSOP8 package information
TSSOP8 package information
TSSOP8 is an 8-lead thin shrink small outline, 3 x 6.4 mm, 0.65 mm pitch, package.
Figure 25. TSSOP8 – Outline
D
8 5
E1 E
1 4
α
A1
CP
A A2 b e
1.
Drawing is not to scale.
Table 21. TSSOP8 – Mechanical data
Symbol
D e
E
E1
L
L1
α
A
A1
A2 b c
CP
Min.
-
0.050
0.800
0.190
0.090
-
2.900
-
6.200
4.300
0.450
-
0° millimeters
Typ.
-
-
1.000
-
-
-
3.000
0.650
6.400
4.400
0.600
1.000
-
Max.
1.200
0.150
1.050
0.300
0.200
0.100
3.100
-
6.600
4.500
0.750
-
8°
Min.
-
0.0020
0.0315
0.0075
0.0035
-
0.1142
-
0.2441
0.1693
0.0177
-
0°
1. Values in inches are converted from mm and rounded to four decimal digits.
L1
L inches
Typ.
-
-
0.0394
-
-
-
0.1181
0.0256
0.2520
0.1732
0.0236
0.0394
c
Max.
0.0472
0.0059
0.0413
0.0118
0.0079
0.0039
0.1220
-
0.2598
0.1772
0.0295
-
8°
DS4712 - Rev 22 page 36/51
DS4712 - Rev 22
M95256-W M95256-R M95256-DF
TSSOP8 package information
Figure 26. TSSOP8 – Recommended footprint
2.3
1.0
7.0
0.65
1.
Dimensions are expressed in millimeters.
0.35
page 37/51
10.3
M95256-W M95256-R M95256-DF
UFDFPN8 (DFN8) package information
UFDFPN8 (DFN8) package information
UFDFPN8 is an 8-lead, 2 × 3 mm, 0.55 mm thickness ultra thin profile fine pitch dual flat package.
Figure 27. UFDFPN8 - Outline
N
D A B
Pin #1
ID marking
E ccc C
A
A1 eee C
Seating plane
Side view
A3
C
2x aaa C
1 2
Top view
L3
Pin #1
ID marking
1 2
D2 e b
2x aaa C
L1
E2
K
L
ND-1 x e
Bottom view
See Detail “A”
L L3
Datum A e/2 e
Detail “A”
Even terminal
L1
Terminal tip
1.
Maximum package warpage is 0.05 mm.
2.
Exposed copper is not systematic and can appear partially or totally according to the cross section.
3.
Drawing is not to scale.
4.
The central pad (the area E2 by D2 in the above illustration) must be either connected to V
SS
or left floating
(not connected) in the end application.
DS4712 - Rev 22 page 38/51
DS4712 - Rev 22
M95256-W M95256-R M95256-DF
UFDFPN8 (DFN8) package information
Table 22. UFDFPN8 - Mechanical data
Symbol
A
A1
K
L
L1
L3 aaa b
D
D2
E
E2 e bbb ccc ddd
Min
0.450
0.000
0.200
1.900
1.200
2.900
1.200
-
0.300
0.300
-
0.300
-
-
-
-
millimeters
Typ
0.550
0.020
0.250
2.000
-
3.000
-
0.500
-
-
-
-
-
-
-
-
-
Max
0.600
0.050
0.300
2.100
1.600
3.100
1.600
-
-
0.500
0.150
-
0.150
0.100
0.100
0.050
0.080
Min
0.0177
0.0000
0.0079
0.0748
0.0472
0.1142
0.0472
-
0.0118
0.0118
-
0.0118
-
-
-
-
-
Typ
0.0217
0.0008
-
-
-
-
-
0.0098
0.0787
-
0.1181
-
0.0197
-
-
-
-
1. Values in inches are converted from mm and rounded to four decimal digits.
2. Dimension b applies to plated terminal and is measured between 0.15 and 0.30 mm from the terminal tip.
3. Applied for exposed die paddle and terminals. Exclude embedding part of exposed die paddle from measuring.
Max
0.0236
0.0020
0.0118
0.0827
0.0630
0.1220
0.0630
-
-
0.0197
0.0059
-
0.0059
0.0039
0.0039
0.0020
0.0031
Figure 28. UFDFPN8 - Recommended footprint
1.400
0.500
0.300
0.600
1.200
1.300
1.
Dimensions are expressed in millimetres.
page 39/51
10.4
M95256-W M95256-R M95256-DF
WLCSP8 (CS) package information
WLCSP8 (CS) package information
This WLCSP is a 8-bump, 1.289 x 1.376 mm, 0.4 mm pitch wafer level chip scale package.
Figure 29. WLCSP8 - Outline bbb Z
D
X Y
E
Reference
Wafer back side
(4X) aaa
A2
A
Side view
Detail A e2 e
F e3
H
G
Orientation
Bump side e1
Bump eee Z
A1
Ø
Ø ccc M ddd M
Z
Z b
X Y
Detail A
Rotated 90 °
Z
Seating plane
1.
Drawing is not to scale
2.
Primary datum Z and seating plane are defined by the spherical crowns of the bump.
3.
Bump position designation per JESD 95-1, SPP-010.
DS4712 - Rev 22 page 40/51
DS4712 - Rev 22
M95256-W M95256-R M95256-DF
WLCSP8 (CS) package information
Table 23. WLCSP8 - Mechanical data
Symbol
F
G
H e2 e3 aaa bbb ccc ddd eee
A
A1
A2
D
E e e1
Min
0.500
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
millimeters
Typ
0.540
0.190
0.350
0.342
0.245
0.245
0.110
0.110
0.270
1.289
1.376
0.800
0.693
0.400
0.400
0.110
0.060
0.060
Max
0.580
-
-
-
1.309
-
-
-
1.396
-
-
-
-
-
-
-
-
-
Min
0.0197
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
1. Values in inches are converted from mm and rounded to four decimal digits.
2. Dimension is measured at the maximum bump diameter parallel to primary datum Z.
Figure 30. WLCSP8 - Recommended footprint
0.800
0.400
inches
Typ
0.0213
0.0075
0.0138
0.0106
0.0507
0.0542
0.0315
0.0273
0.0157
0.0157
0.0135
0.0096
0.0096
0.0043
0.0043
0.0043
0.0024
0.0024
Max
0.0228
-
-
-
-
-
-
-
-
0.0515
0.0550
-
-
-
-
-
-
-
0.400
0.693
8 bumps x Ø 0.270
1.
Dimensions are expressed in millimeters.
page 41/51
11
Note:
M95256-W M95256-R M95256-DF
Ordering information
Ordering information
Table 24. Ordering information scheme
Example:
Device type
M95 = SPI serial access EEPROM
Device function
256 = 256 Kbit
Device family
Blank = Without Identification page
D = With additional Identification page
Operating voltage
W = V
CC
= 2.5 to 5.5 V
R = V
CC
= 1.8 to 5.5 V
F = V
CC
= 1.7 to 5.5 V
Package
MN = SO8N (150 mil width)
DW = TSSOP8 (169 mil width)
MC = UFDFPN8 (DFN8)
CS = WLCSP8
Device grade
6 = Industrial temperature range, –40 to 85 °C
Device tested with standard test flow
Option
M95 blank = tube packing
T = Tape and reel packing
Plating technology
G or P = RoHS compliant and halogen-free (ECOPACK2)
Process
/K = Manufacturing technology code
256 -D W MN 6 T P \K
1. All packages are ECOPACK2 (RoHS-compliant and free of brominated, chlorinated and antimony-oxide flame retardants).
2. These process letters appear on the device package (marking) and on the shipment box. Please contact your nearest ST
Sales Office for further information
Parts marked as “ES”, “E” or accompanied by an Engineering Sample notification letter, are not yet qualified and therefore not approved for use in production. ST is not responsible for any consequences resulting from such use. In no event will ST be liable for the customer using any of these engineering samples in production. ST
Quality has to be contacted prior to any decision to use these Engineering samples to run qualification activity.
DS4712 - Rev 22 page 42/51
M95256-W M95256-R M95256-DF
Revision history
Table 25. Document revision history
Date
17 ‑ Nov ‑ 1999
07 ‑ Feb-2000
22 ‑ Feb-2000
15-Mar-2000
29-Jan-2001
12-Jun-2001
08-Feb-2002
09-Aug-2002
24-Feb-2003
26-Jun-2003
21-Nov-2003
17-Mar-2004
21-Oct-2004
13-Apr-2006
15-Oct-2007
Revision
2.1
2.2
2.3
2.4
2.5
2.6
2.7
2.8
2.9
2.10
3.0
4.0
5.0
6
7
Changes
New -V voltage range added (including the tables for DC characteristics, AC characteristics, and ordering information).
New -V voltage range extended to M95256 (including AC characteristics, and ordering information).
t
CLCH
and t
CHCL
, for the M95xxx-V, changed from 1ms to 100ns
-V voltage range changed to 2.7-3.6V
Lead Soldering Temperature in the Absolute Maximum Ratings table amended
Illustrations and Package Mechanical data updated
Correction to header of Table 12B
TSSOP14 Illustrations and Package Mechanical data updated
Document promoted from Preliminary Data to Full Data Sheet
Announcement made of planned upgrade to 10 MHz clock for the 5V, –40 to 85°C, range.
M95128 split off to its own datasheet. Data added for new and forthcoming products, including availability of the
SO8 narrow package.
Omission of SO8 narrow package mechanical data remedied
-V voltage range removed
Table of contents, and Pb-free options added. -S voltage range extended to -R. V
IL
(min) improved to –0.45V
Absolute Maximum Ratings for V
IO
(min) and V
CC
(min) changed. Soldering temperature information clarified for
RoHS compliant devices. Device grade information clarified
M95128 datasheet merged back in. Product List summary table added. AEC-Q100-002 compliance. Device Grade information clarified. tHHQX corrected to tHHQV. 10MHz product becomes standard
M95128 part numbers removed from document. PDIP8 package removed.
Delivery state paragraph added.
Section 3.8: Operating supply voltage (VCC) added and information removed below Section 4: Operating features.
Power up state removed below Section 6: Delivery state.
Figure 18: SPI modes supported modified and Note 2 added.
Note 1 added to Table 8.
I
CC1
specified over the whole V whole V
CC
range in Table 14.
CC
range and I
CC0
added in Table 14, Table 15 and Table 16. I
CC
specified over the
Table 17: AC Characteristics (M95256, Device Grade 6) added.
t
CHHL
and t
CHHH
replaced by t
CLHL
and t
CLHH
, respectively.
Figure 21: Hold timing modified. Process added to Table 25: Ordering information scheme. Note 1 added to
Table 25.
Note 1 removed from Table 20: AC characteristics (M95256-DR, M95256-R device grade 6).
T
A
added to Table 7: Absolute maximum ratings.
Order of sections modified.
M95256-DF with device grade 6 temperature range removed.
Section 3.7: VSS ground added, Section 3.8: Operating supply voltage (VCC) modified. Small text changes.
Section 5.4: Write Status Register (WRSR), Section 5.5: Read from Memory Array (READ) and Section 6: Delivery state updated.
Note 2 below Figure 17: Bus master and memory devices on the SPI bus removed, replaced by explanatory paragraph.
T
LEAD
added to Table 7: Absolute maximum ratings.
DS4712 - Rev 22 page 43/51
M95256-W M95256-R M95256-DF
Date
27-Mar-2008
15-Jul-2008
Revision Changes
Test conditions modified for I
CC0
and I
CC1 grade 3).
, and V
IH
min modified in Table 17: AC characteristics (M95256, device t
W
modified and “preliminary data” note removed in Table 20: AC characteristics (M95256-DR, M95256-R device grade 6).
Blank option removed below Plating technology, process A modified and process V removed in Table 25: Ordering information scheme.
Table 26: Available M95256x products (package, voltage range, temperature grade) added.
SO8N and SO8W package specifications updated (see Section 10: Package mechanical data). Package mechanical data: inches calculated from mm and rounded to 3 decimal digits.
8
9
Section 3.8: Operating supply voltage (VCC) modified. Small text changes. Frequency corrected on page 1.
VIL and VIH modified in Table 16: DC characteristics (M95256-R, M95256-DR, device grade 6).
AB Process added to Table 25: Ordering information scheme.
WLCSP package added (see Figure 3: WLCSP connections (top view, marking side, with balls on the underside) and Section 10: Package mechanical data).
24-Jun-2010
07-Sep-2010
12-Nov-2010
22-Mar-2011
10
11
12
13
Updated Section 3.8: Operating supply voltage (VCC)
Updated Section 4.3: Data protection and protocol control
Updated Section 5.4: Write Status Register (WRSR)
Added note in Section 5.6: Write to Memory Array (WRITE)
Updated Table 7: Absolute maximum ratings
Added Table 20: AC characteristics (M95256-DR, M95256-R device grade 6)
Updated Table 20: AC characteristics (M95256-DR, M95256-R device grade 6)
Updated Section 1: Description.
Updated Section 5.7: Read Identification Page (available only in M95256-DR devices).
Updated Section 5.8: Write Identification Page.
Updated Section 5.9: Read Lock Status (available only in M95256-DR devices).
Updated Features.
Updated Section 5.8: Write Identification Page.
Added Figure 25: TSSOP8 – 8 lead thin shrink small outline, package outline.
Added Table 23: UFDFPN8 (MLP8) – 8-lead ultra thin fine pitch dual flat package no lead 2 × 3 mm, package mechanical data.
Updated Section 11: Part numbering.
Updated Table 26: Available M95256x products (package, voltage range, temperature grade).
Updated Figure 25, Figure 26.
•
•
Deleted:
SO8 (MW) picture under Features
SO8 (MW) mechanical dimensions
•
•
•
•
Updated:
UFDFPN8 (MB) with UFDFPN8 (MB, MC) picture under Features
Section 5.6.1: ECC (error correction code) and Write cycling
Section 7: Connecting to the SPI bus
Table 7: Absolute maximum ratings
Process letter K substituted with only concerned products (M95256-D and M95256 in MLP8 package MC).9
DS4712 - Rev 22 page 44/51
M95256-W M95256-R M95256-DF
Date
20-May-2011
19-Jul-2011
Revision Changes
•
•
•
•
•
•
•
•
Rephrased “test condition” text in:
Table 14: DC characteristics (M95256, device grade 3)
Table 20: DC characteristics (current M95080-W products)
Table 16: DC characteristics (M95256-W, device grade 3)
Table 23: DC characteristics (current and new M95080-R and M95080-DR products)
Table 18: AC characteristics (M95256, device grade 3)
Table 31: AC characteristics, M95080-W, device grade 6 table 20: AC characteristics (M95256-W, device grade 3)
Table 36: AC characteristics (M95080-R, M95080-DR device grade 6)
•
•
Added:
Caution under Figure 3: WLCSP connections (top view, marking side, with balls on the underside)
MC = UFDFPN8 package in Section 11: Part numbering
14
15
•
Updated:
UFDFPN8 offered in only one package version
•
Added:
Table 15: Memory cell characteristics
MC package added (UFDFPN8)
23-Nov-2011
17-Jan-2012
21-Jun-2012
24-Jul-2012
09-Apr-2013
16
17
18
19
20
•
•
•
•
•
Updated:
Footnote 3 below Table 7: Absolute maximum ratings
Footnotes 1, 2, 4, 5 below Table 15: DC characteristics (M95256-W, device grade 6)
Footnotes 1, 2, 3, 5 below Table 17: DC characteristics (M95256-R, M95256-DR, device grade 6)
Table 19: AC characteristics, M95256-W, device grade 6 headings, TQLQH and TQHQL values. One footnote removed and one added
Table 21: AC characteristics (M95256-DR, M95256-R device grade 6), new columns for new pairs of products.
Footnote 2 edited.
Updated Figure 25: UFDFPN8 (MLP8) - 8-lead ultra thin fine pitch dual flat no lead, package outline.
•
•
Datasheet split into:
M95256-125 datasheet for automotive products (range 3)
M95256-W, M95256-R, M95256-DR, M95256-DF (this datasheet) for standard products (range 6).
•
Added:
1.7 V device (M95256-DF)
•
•
•
•
Updated:
Figure 15: Block diagram
Table 58: M95080-DFCS6TP/K, WLCSP 8-bump wafer-level chip scale package mechanical data and Figure
42: M95080-DFCS6TP/K, WLCSP 8-bump wafer-level chip scale package outline
Cycling and data retention values (Table 19 and Table 20)
Deleted:
UFDFPN8 package rev MB
•
•
•
Updated:
WLCSP package reference from “CT” to “CS”
Figure 3: WLCSP connections (top view, marking side, with bumps on the underside)
Figure 42: M95080-DFCS6TP/K, WLCSP 8-bump wafer-level chip scale package outline.
Document reformatted.
•
•
•
Updated:
Package figure on cover page
Section 7.2: Initial delivery state
Note (1) in Table 7: Absolute maximum ratings
Deleted former footnote 1 in Table 17: DC characteristics (M95256-DF, device grade 6).
Replaced “ball” by “bump” in the entire document.
DS4712 - Rev 22 page 45/51
M95256-W M95256-R M95256-DF
Date
06-Mar-2017
28-Sep-2021
Revision
21
22
Changes
Removed obsolete product M95256-DR.
Updated Features, Section 1: Description and Section 6: Instructions.
Updated Figure 1: Logic diagram, Figure 3: WLCSP connections (top view, marking side, with bumps on the underside), Figure 4: Block diagram, Figure 6: SPI modes supported, Figure 8: Write Enable (WREN) sequence and
Figure 9: Write Disable (WRDI) sequence.
Updated Table 1: Signal names, tables in Section 6: Instructions and Table 11: AC measurement conditions.
Updated footnote 2 of Table 7: Absolute maximum ratings and added footnote 6 to Table 15: DC characteristics
(M95256-W, device grade 6).
Updated Section 10: Package information and its subsections.
•
Added:
Table 2. Signals versus bump position
•
•
•
•
•
•
•
•
Updated:
Section 4 Connecting to the SPI bus
Figure 5. Bus master and memory devices on the SPI bus
Figure 16. Write Identification page sequence
Section 11 Ordering information
•
•
Deleted:
Table 19. AC characteristics (M95256-W, device grade 6)
Table 20. AC characteristics (M95256-R, device grade 6)
DS4712 - Rev 22 page 46/51
M95256-W M95256-R M95256-DF
Contents
Contents
DS4712 - Rev 22 page 47/51
M95256-W M95256-R M95256-DF
Contents
DS4712 - Rev 22 page 48/51
M95256-W M95256-R M95256-DF
List of tables
List of tables
DS4712 - Rev 22 page 49/51
M95256-W M95256-R M95256-DF
List of figures
List of figures
DS4712 - Rev 22 page 50/51
M95256-W M95256-R M95256-DF
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DS4712 - Rev 22 page 51/51
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