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25
Measuring Pulse Width
This chapter describes how you can use a counter to measure pulse width.
There are several reasons you may need to determine pulse width. For example, to determine the duration of an event, set your application to measure the width of a pulse that occurs during that event. Another example is determining the interval between two events. In this case, you measure the pulse width between the two events. An example of when you might use this type of application is determining the time interval between two boxes on a conveyor belt or the time it takes one box to be processed through an operation. The event is an edge every time a box goes by a point, which prompts a digital signal to change in value.
Measuring a Pulse Width
You can measure an unknown pulse width by counting the number of pulses of a faster known frequency that occur during the pulse to be measured. Connect the pulse you want to measure to the GATE input pin and a signal of known frequency to the SOURCE (CLK) input pin, as
shown in Figure 25-1. The pulse of unknown width (T
pw
) gates the counter configured to count a timebase clock of known period (T s equals the timebase period times the count, or: T pw
= T s
). The pulse width
×
count. The
SOURCE (CLK) input can be an external or internal signal.
GATE OUT
T pw frequency source
SOURCE
(CLK)
Count Register
T s
Figure 25-1. Counting Input Signals to Determine Pulse Width
An internal signal is based upon the type of counter chip on your
DAQ device. With TIO-ASIC devices, you can choose internal timebases of 20 MHz, 100 kHz, and a device-specific maximum timebase. With
DAQ-STC devices, you have a choice between internal timebases of
© National Instruments Corporation 25-1
LabVIEW Data Acquisition Basics Manual
Chapter 25 Measuring Pulse Width
20 MHz and 100 kHz. With Am9513 devices, you can choose internal timebases of 1 MHz, 100 kHz, 10 kHz, 1 kHz, and 100 Hz. With 8253/54 devices, the internal timebase is either 2 MHz or 1 MHz, depending on which device you have.
Figure 25-2 shows how to physically connect the counter on your device to
measure pulse width.
your device counter source out gate
Figure 25-2. Physical Connections for Determining Pulse Width
Determining Pulse Width
How you determine a pulse width depends upon which counter chip is on your DAQ device. If you are uncertain of which counter chip your
DAQ device has, refer to your hardware documentation.
TIO-ASIC, DAQ-STC
Figure 25-3 shows the diagram of the Measure Pulse-Easy (DAQ-STC) VI
located in labview\examples\daq\counter\DAQ-STC.llb
, which uses the Easy VI, Measure Pulse Width or Period.
Figure 25-3. Diagram of Measure Pulse Width (DAQ-STC) VI
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Chapter 25 Measuring Pulse Width
The Measure Pulse Width or Period VI counts the number of cycles of the specified timebase, depending on your choice from the type of
measurement menu located on the front panel of the VI.
The type of measurement menu choices for this VI are shown in
Figure 25-4. Menu Choices for Type of Measurement for the Measure Pulse Width or Period (DAQ-STC) VI
Use the first two menu choices when you want to measure the width of a single pulse. In these cases, the GATE of the counter must start out in the opposite phase of the pulse you want to measure. For example, if you choose measure high pulse width of a single pulse, the GATE must start out low when you run the VI. If you attempt to measure a single high pulse, and the GATE is already high (such as in the middle of a pulse train) when you run the VI, an error will occur.
Use the last two menu choices when you want to measure the width of a single pulse within a train of multiple pulses. In these cases, it is the previous GATE transition that arms the counter to measure the next pulse.
For example, if you choose measure one high pulse width of multiple
pulses, the first high-to-low GATE transition from one pulse would arm the counter to measure the very next pulse.
The timebase you choose determines how long a pulse you can measure with the 24-bit counter. For example, the 100 kHz timebase allows you to measure a pulse up to 2 24
×
10
µ s = 167 seconds long. The 20 MHz timebase allows you to measure a pulse up to 838 ms long. For a complete description of this example, refer to the information found in
Windows»Show VI Info.
© National Instruments Corporation 25-3
LabVIEW Data Acquisition Basics Manual
Chapter 25 Measuring Pulse Width
Am9513
Figure 25-5 shows the diagram of the Measure Pulse-Easy (9513) VI
located in labview\examples\daq\counter\Am9513.llb
, which uses the Easy VI, Measure Pulse Width or Period.
Figure 25-5. Diagram of Measure Pulse Width (9513) VI
The Measure Pulse Width or Period VI counts the number of cycles of the specified timebase, depending on your choice from the type of measurement menu located on the front panel of the VI. The type of
measurement menu choices for this VI are shown in Figure 25-6.
Figure 25-6. Menu Choices for Type of Measurement for the
Measure Pulse Width or Period (9513) VI
Either menu choice can be used to measure the width of a single pulse, or to measure a pulse within a train of multiple pulses. However, the pulse must occur after the counter starts. Because the counter uses high-level gating, it might be difficult to measure a pulse within a fast pulse train. If the counter is started in the middle of a pulse, it measures the remaining width of that pulse.
The timebase you choose determines how long a pulse you can measure with the 16-bit counter. For example, the 100 Hz timebase allows you to measure a pulse up to 2 16
×
10ms = 655 seconds long. The 1 MHz timebase allows you to measure a pulse up to 65 ms long. Because a faster timebase yields a more accurate pulse width measurement, it is best to use the fastest timebase possible without the counter reaching terminal count (TC).
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8253/54
Chapter 25 Measuring Pulse Width
The valid? output of the example VI indicates whether the counter measured the pulse without overflowing (reaching TC). However, valid? does not tell you whether a whole pulse was measured when measuring a pulse within a pulse train. For a complete description of this example, refer to the information found in Windows»Show VI Info.
Figure 25-7 shows the diagram of the Measure Short Pulse Width
(8253) VI located in labview\examples\daq\counter\8253.llb
.
Figure 25-7. Diagram of Measure Short Pulse Width (8253) VI
This VI counts the number of cycles of the internal timebase of Counter 0 to measure a high pulse width. You can measure a single pulse or a pulse within a train of multiple pulses. However, the pulse must occur after the counter starts. This means it may be difficult to measure a pulse within a fast pulse train because the counter uses high-level gating. To measure a low pulse width, insert a 7404 inverter chip between your pulse source and the GATE input of counter 0.
On the example diagram, the first call to ICTR Control VI sets up counting mode 4, which tells the counter to count down while the gate input is high. The Get Timebase (8253) VI is used to get the timebase of your
DAQ device. A DAQ device with an 8253/54 counter has an internal timebase of either 1 MHz or 2 MHz, depending on the device. Inside the
© National Instruments Corporation 25-5
LabVIEW Data Acquisition Basics Manual
Chapter 25 Measuring Pulse Width
While Loop, ICTR Control VI is called to continually read the count register until one of four conditions are met:
• The count register value has decreased but is no longer changing.
It is finished measuring the pulse.
• The count register value is greater than the previously read value.
An overflow has occurred.
• An error has occurred.
• Your chosen time limit has been reached.
After the While Loop, the final count is subtracted from the originally loaded count of 65535 and multiplied by the timebase period to yield the pulse width. Finally, the last ICTR Control VI resets the counter. Notice that this VI uses only Counter 0. If Counter 0 has an internal timebase of
2 MHz, the maximum pulse width you can measure is 2 16
×
0.5
µ s = 32 ms.
For a complete description of this example, refer to the information found in Windows»Show VI Info.
Controlling Your Pulse Width Measurement
How you control your pulse width measurement depends upon which counter chip is on your DAQ device. If you are uncertain of which counter chip you DAQ device has, refer to your hardware documentation.
TIO-ASIC, DAQ-STC, or Am9513
Figure 25-8 shows one approach to measuring pulse width using the
Intermediate VIs Pulse Width or Period Meas Config, Counter Start,
Counter Read, and Counter Stop. You can use these VIs to control when the measurement of the pulse widths begins and ends. The Pulse Width or
Period Config VI configures a counter to count the number of cycles of a known internal timebase. The Counter Start VI begins the measurement.
The Counter Read VI determines if the measurement is complete and displays the count value. After the While Loop is stopped, the Counter
Stop VI stops the counter operation. Finally, the General Error Handler VI notifies you of any errors.
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Chapter 25 Measuring Pulse Width
Figure 25-8. Measuring Pulse Width with Intermediate VIs
Buffered Pulse and Period Measurement
With the TIO-ASIC and DAQ-STC chips, LabVIEW provides a buffer for counter operations. You would typically use buffered counter operations
when you have a gate signal to trigger a counter several times. Figure 25-9
shows the diagram of the Meas Buffered Pulse-Period (DAQ-STC) VI located in labview\examples\daq\counter\DAQ-STC.llb
.
You also can refer to examples located in labview\examples\ daq\counter\NI-TIO.llb
.
© National Instruments Corporation
Figure 25-9. Diagram of Meas Buffered Pulse-Period (DAQ-STC) VI
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LabVIEW Data Acquisition Basics Manual
Chapter 25 Measuring Pulse Width
With this example, you can perform four types of buffered measurements:
• Buffered period measurement—Measures a number of periods in a pulse train.
• Buffered semi-period measurement—Measures a number of high and low pulses in a pulse train.
• Buffered pulse width measurement—Measures a number of high or low pulses in a pulse train.
• Buffered counting—Each rising edge loads the current count into a finite buffer.
This example uses a single buffer. The block diagram uses the following
Advanced VIs: CTR Group Config, CTR Buffer Config, CTR Mode
Config, CTR Control, and CTR Buffer Read. CTR Group Config takes the counter and device and sets up a taskID. CTR Buffer Config sets up a finite buffer whose size is determined by the value you enter in counts per
buffer. CTR Mode Config determines what type of counting operation to perform based on your choices for gate parameters and config mode.
CTR Control starts the counting operation, but does not return until the counting has completed. CTR Buffer Read reads the buffer of data and returns the values to buffered counts. The buffered times are determined by dividing the counts by your chosen timebase. For a complete description of this example, refer to the information found in
Windows»Show VI Info.
Note Continuous buffered operations are supported by the new Advanced Counter VIs in
NI-DAQ 6.5 and higher.
Note If you are using NI-DAQ 6.5 or higher, National Instruments recommends you use the new Advanced Counter VIs, such as Counter Group Config, Counter Get Attribute,
Counter Set Attribute, Counter Buffer Read, and Counter Control. For more information, refer to the LabVIEW Online Reference.
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Chapter 25 Measuring Pulse Width
Increasing Your Measurable Width Range
The maximum counting range of a counter and the chosen internal timebase determine how long of a pulse width can be measured. The internal timebase acts as the SOURCE. When measuring the pulse width of a signal, you count the number of source edges that occur during the pulse being measured. The counted number of SOURCE edges cannot exceed the counting range of the counter. Slower internal timebases allow you to measure longer pulse widths, but faster timebases give you a more accurate pulse width measurement. If you need a slower timebase than is available
on your counter as shown in Table 25-1, set up an additional counter for
pulse train generation and use the OUT of that counter as the SOURCE of the counter measuring pulse width.
Table 25-1. Internal Counter Timebases and Their Corresponding Maximum
Pulse Width, Period, or Time Measurements
Counter Type
TIO-ASIC
DAQ-STC
Am9513
Internal
Timebases
Maximum*
(depends on device)
20 MHz
100 kHz
20 MHz
100 kHz
1 MHz
100 kHz
10 kHz
1 kHz
100 Hz
Maximum Measurement
—
214.748 s
11 h 55 m 49.67 s
838 ms
167 s
65 ms
655 ms
6.5 s
65 s
655 s
8253/54 2 MHz**
1 MHz**
32 ms
65 ms
* You can obtain this timebase by calling the Counter Get Attribute VI.
** A DAQ device with an 8253/54 counter has one of these internal timebases available on counter 0, but not both.
© National Instruments Corporation 25-9
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Table of contents
- 1 Data Acquisition BasicsManual
- 2 Support
- 2 Worldwide Technical Support and Product Information
- 2 National Instruments Corporate Headquarters
- 2 Worldwide Offices
- 3 Important Information
- 3 Warranty
- 3 Copyright
- 3 Trademarks
- 3 WARNING REGARDING MEDICAL AND CLINICAL USE OF NATIONAL INSTRUMENTS PRODUCTS
- 4 Contents
- 19 About This Manual
- 19 Conventions Used in This Manual
- 21 LabVIEW Data Types
- 22 Related Documentation
- 23 Part I Before You Get Started
- 24 Chapter 1 How To Use This Book
- 28 Chapter 2 Installing and Configuring Your Data Acquisition Hardware
- 31 LabVIEW Data Acquisition Hardware Support
- 41 Installing and Configuring Your NationalInstrumentsDevice
- 41 Installing and Configuring Your DAQ Device Using NI-DAQ 5.x, 6.x
- 41 Configuring Your DAQ Device Using NI-DAQ 4.8.x on the Macintosh
- 43 Installing and Configuring Your SCXI Chassis
- 43 Hardware Configuration
- 45 NI-DAQ 5.x, 6.x Software Configuration
- 45 NI-DAQ 4.8.x for Macintosh Software Configuration
- 48 Configuring Your Channels in NI-DAQ 5.x, 6.x
- 49 Chapter 3 Basic LabVIEW Data Acquisition Concepts
- 49 Location of Common DAQ Examples
- 51 Locating the Data Acquisition VIs in LabVIEW
- 52 DAQ VI Organization
- 52 Easy VIs
- 53 Intermediate VIs
- 53 Utility VIs
- 53 Advanced VIs
- 53 VI Parameter Conventions
- 54 Default and Current Value Conventions
- 55 Common DAQ VI Parameters
- 56 Error Handling
- 56 Channel, Port, and Counter Addressing
- 57 Channel Name Addressing
- 58 Channel Number Addressing
- 59 Limit Settings
- 62 Data Organization for Analog Applications
- 65 Chapter 4 Where You Should Go Next
- 67 Questions You Should Answer
- 70 Part II Catching the Wave with Analog Input
- 71 Chapter 5 Things You Should Know about Analog Input
- 71 Defining Your Signal
- 72 What Is Your Signal Referenced To?
- 72 Grounded Signal Sources
- 73 Floating Signal Sources
- 74 Choosing Your Measurement System
- 74 Resolution
- 75 Device Range
- 76 Signal Limit Settings
- 77 Considerations for Selecting Analog Input Settings
- 79 Differential Measurement System
- 81 Referenced Single-Ended Measurement System
- 82 Nonreferenced Single-Ended Measurement System
- 83 Channel Addressing with the AMUX-64T
- 84 The AMUX-64T Scanning Order
- 87 Important Terms You Should Know
- 88 Chapter 6 One-Stop Single-Point Acquisition
- 88 Single-Channel, Single-Point Analog Input
- 90 Multiple-Channel Single-Point Analog Input
- 93 Using Analog Input/Output Control Loops
- 93 Using Software-Timed Analog I/O Control Loops
- 94 Using Hardware-Timed Analog I/O Control Loops
- 96 Improving Control Loop Performance
- 98 Chapter 7 Buffering Your Way through Waveform Acquisition
- 98 Can You Wait for Your Data?
- 99 Acquiring a Single Waveform
- 100 Acquiring Multiple Waveforms
- 102 Simple-Buffered Analog Input Examples
- 102 Simple-Buffered Analog Input with Graphing
- 103 Simple-Buffered Analog Input with Multiple Starts
- 105 Simple-Buffered Analog Input with a Write to Spreadsheet File
- 105 Triggered Analog Input
- 105 Do You Need to Access Your Data during Acquisition?
- 107 Continuously Acquiring Data from Multiple Channels
- 108 Asynchronous Continuous Acquisition Using DAQ Occurrences
- 110 CircularBuffered Analog Input Examples
- 110 Basic CircularBuffered Analog Input
- 111 Other CircularBuffered Analog Input Examples
- 111 Simultaneous Buffered Waveform Acquisition andWaveform Generation
- 112 Chapter 8 Controlling Your Acquisition with Triggers
- 112 Hardware Triggering
- 113 Digital Triggering
- 115 Digital Triggering Examples
- 116 Digital Triggering Examples
- 119 Analog Triggering Examples
- 120 Software Triggering
- 123 Conditional Retrieval Examples
- 124 Chapter 9 Letting an Outside Source Control Your Acquisition Rate
- 126 Externally Controlling Your Channel Clock
- 129 Externally Controlling Your Scan Clock
- 132 Externally Controlling the Scan and Channel Clocks
- 133 Part III Making Waves with Analog Output
- 134 Chapter 10 Things You Should Know about Analog Output
- 134 Single-Point Output
- 134 Buffered Analog Output
- 136 Chapter 11 One-Stop Single-Point Generation
- 136 Single-Immediate Updates
- 138 Multiple-Immediate Updates
- 139 Chapter 12 Buffering Your Way through Waveform Generation
- 139 Buffered Analog Output
- 141 Changing the Waveform during Generation—CircularBufferedOutput
- 143 Eliminating Errors from Your CircularBufferedApplication
- 144 Buffered Analog Output Examples
- 145 Chapter 13 Letting an Outside Source Control Your Update Rate
- 145 Externally Controlling Your Update Clock
- 147 Supplying an External Test Clock from Your DAQ Device
- 148 Chapter 14 Simultaneous Buffered Waveform Acquisition and Generation
- 148 Using ESeries MIO Boards
- 148 Software Triggered
- 150 Hardware Triggered
- 151 Using Legacy MIO Boards
- 151 Software Triggered
- 152 Hardware Triggered
- 153 Using Lab/1200 Boards
- 154 Part IV Getting Square with Digital I/O
- 155 Chapter 15 Things You Should Know about Digital I/O
- 156 Types of Digital Acquisition/Generation
- 157 Chapter 16 When You Need It Now— Immediate Digital I/O
- 160 Chapter 17 Shaking Hands with a Digital Partner
- 162 Sending Out Multiple Digital Values
- 164 Nonbuffered Handshaking
- 165 Buffered Handshaking
- 166 Simple Buffered Examples
- 168 Circular-Buffered Examples
- 170 Part V SCXI—Getting Your Signals in Great Condition
- 171 Chapter 18 Things You Should Know about SCXI
- 171 What Is Signal Conditioning?
- 174 Amplification
- 175 Isolation
- 175 Filtering
- 175 Transducer Excitation
- 176 Linearization
- 177 Chapter 19 Hardware and Software Setup for Your SCXI System
- 181 SCXI Operating Modes
- 181 Multiplexed Mode for Analog Input Modules
- 182 Multiplexed Mode for the SCXI1200 (Windows)
- 182 Multiplexed Mode for Analog Output Modules
- 182 Multiplexed Mode for Digital and Relay Modules
- 182 Parallel Mode for Analog Input Modules
- 183 Parallel Mode for the SCXI-1200 (Windows)
- 183 Parallel Mode for Digital Modules
- 184 SCXI Software Installation and Configuration
- 185 Chapter 20 Special Programming Considerations for SCXI
- 185 SCXI Channel Addressing
- 187 SCXI Gains
- 189 SCXI Settling Time
- 190 Chapter 21 Common SCXI Applications
- 191 Analog Input Applications for MeasuringTemperatureand Pressure
- 191 Measuring Temperature with Thermocouples
- 192 Temperature Sensors for Cold-JunctionCompensation
- 194 Amplifier Offset
- 195 VI Examples
- 199 Measuring Temperature with RTDs
- 202 Measuring Pressure with Strain Gauges
- 206 Analog Output Application Example
- 207 Digital Input Application Example
- 208 Digital Output Application Example
- 210 Multi-Chassis Applications
- 212 Chapter 22 SCXI Calibration—Increasing Signal Measurement Precision
- 212 EEPROM—Your System’s Holding Tank for CalibrationConstants
- 214 Calibrating SCXI Modules
- 215 SCXI Calibration Methods for Signal Acquisition
- 216 One-Point Calibration
- 217 Two-Point Calibration
- 218 Calibrating SCXI Modules for Signal Generation
- 220 Part VI Counting Your Way to High-Precision Timing
- 221 Chapter 23 Things You Should Know about Counters
- 222 Knowing the Parts of Your Counter
- 224 Knowing Your Counter Chip
- 225 TIO-ASIC
- 225 DAQ-STC
- 225 Am9513
- 225 8253/54
- 227 Chapter 24 Generating a Square Pulse or Pulse Trains
- 227 Generating a Square Pulse
- 229 TIO-ASIC, DAQ-STC, and Am9513
- 230 8253/54
- 230 Generating a Single Square Pulse
- 231 TIO-ASIC, DAQ-STC, Am9513
- 233 8253/54
- 236 Generating a Pulse Train
- 236 Generating a Continuous Pulse Train
- 237 TIO-ASIC, DAQ-STC, Am9513
- 239 8253/54
- 240 Generating a Finite Pulse Train
- 241 TIO-ASIC, DAQ-STC, Am9513
- 243 DAQ-STC
- 244 8253/54
- 247 Counting Operations When All Your Counters Are Used
- 249 Knowing the Accuracy of Your Counters
- 249 8253/54
- 250 Stopping Counter Generations
- 250 DAQ-STC, Am9513
- 250 8253/54
- 251 Chapter 25 Measuring Pulse Width
- 251 Measuring a Pulse Width
- 252 Determining Pulse Width
- 252 TIO-ASIC, DAQ-STC
- 254 Am9513
- 255 8253/54
- 256 Controlling Your Pulse Width Measurement
- 256 TIO-ASIC, DAQ-STC, or Am9513
- 257 Buffered Pulse and Period Measurement
- 259 Increasing Your Measurable Width Range
- 260 Chapter 26 Measuring Frequency and Period
- 260 Knowing How and When to Measure FrequencyandPeriod
- 261 TIO-ASIC, DAQ-STC, Am9513
- 261 8253/54
- 262 Connecting Counters to Measure Frequency and Period
- 262 TIO-ASIC, DAQ-STC, Am9513
- 263 Measuring the Frequency and Period ofHighFrequencySignals
- 263 TIO-ASIC, DAQ-STC
- 264 Am9513
- 265 TIO-ASIC, DAQ-STC, Am9513
- 266 8253/54
- 267 Measuring the Period and FrequencyofLowFrequencySignals
- 267 TIO-ASIC, DAQ-STC
- 268 Am9513
- 269 TIO-ASIC, DAQ-STC, Am9513
- 269 8253/54
- 270 Chapter 27 Counting Signal Highs and Lows
- 270 Connecting Counters to Count Events and Time
- 271 Am9513
- 272 Counting Events
- 272 TIO-ASIC, DAQ-STC
- 274 Am9513
- 276 8253/54
- 277 Counting Elapsed Time
- 277 TIO-ASIC, DAQ-STC
- 279 Am9513
- 281 8253/54
- 282 Chapter 28 Dividing Frequencies
- 283 TIO-ASIC, DAQ-STC, Am9513
- 284 8253/54
- 285 Part VII Debugging Your Data Acquisition Application
- 286 Chapter 29 Debugging Techniques
- 286 Hardware Connection Errors
- 286 Software Configuration Errors
- 287 VI Construction Errors
- 287 Error Handling
- 288 Single-Stepping through a VI
- 288 Execution Highlighting
- 289 Using the Probe Tool
- 289 Setting Breakpoints and Showing Advanced DAQ VIs
- 290 Appendix A LabVIEW Data Acquisition Common Questions
- 293 Appendix B Technical Support Resources
- 295 Glossary
- 295 Numbers/Symbols
- 295 A
- 296 B
- 297 C
- 298 D
- 300 E-G
- 301 H-I
- 302 K-L
- 303 M
- 304 N-O
- 305 P
- 306 R-S
- 308 T
- 309 U-V
- 310 W
- 311 Index
- 311 Numbers
- 311 A
- 315 B-C
- 318 D
- 320 E
- 321 F
- 322 G-H
- 323 I
- 324 L-M
- 325 N
- 326 O-P
- 327 Q-S
- 330 T
- 331 U-W
- 13 Figures
- 29 Figure 2-1. Installing and Configuring DAQ Devices
- 30 Figure 2-2. How NI-DAQ Relates to Your System and DAQ Devices
- 42 Figure 2-3. NI-DAQ Device Window Listing
- 42 Figure 2-4. Accessing the Device Configuration Window in NI-DAQ
- 43 Figure 2-5. Device Configuration and I/O Connector Windows in NI-DAQ
- 45 Figure 2-6. Accessing the NI DAQ SCXI Configuration Window
- 46 Figure 2-7. SCXI Configuration Window in NI-DAQ
- 51 Figure 3-1. Accessing the Data Acquisition Palette
- 51 Figure 3-2. Data Acquisition VIs Palette
- 52 Figure 3-3. Analog Input VI Palette Organization
- 54 Figure 3-4. LabVIEW Help Window Conventions
- 56 Figure 3-5. LabVIEW Error In Input and Error Out Output Error Clusters
- 57 Figure 3-6. Channel String Controls
- 59 Figure 3-7. Channel String Array Controls
- 60 Figure 3-8. Limit Settings, Case 1
- 61 Figure 3-9. Limit Settings, Case 2
- 62 Figure 3-10. Example of a Basic 2D Array
- 62 Figure 3-11. 2D Array in Row Major Order
- 63 Figure 3-12. 2D Array in Column Major Order
- 63 Figure 3-13. Extracting a Single Channel from a Column Major 2D Array
- 64 Figure 3-14. Analog Output Buffer 2D Array
- 71 Figure 5-1. Types of Analog Signals
- 72 Figure 5-2. Grounded Signal Sources
- 73 Figure 5-3. Floating Signal Sources
- 74 Figure 5-4. The Effects of Resolution on ADC Precision
- 75 Figure 5-5. The Effects of Range on ADC Precision
- 76 Figure 5-6. The Effects of Limit Settings on ADC Precision
- 79 Figure 5-7. 8-Channel Differential Measurement System
- 80 Figure 5-8. Common-Mode Voltage
- 81 Figure 5-9. 16-Channel RSE Measurement System
- 82 Figure 5-10. 16-Channel NRSE Measurement System
- 88 Figure 6-1. AI Sample Channel VI
- 89 Figure 6-2. Acquiring Data Using the Acquire 1 Point from 1 Channel VI
- 90 Figure 6-3. Acquiring a Voltage from Multiple Channels with the AI Sample Channels VI
- 91 Figure 6-4. The AI Single Scan VI Help Diagram
- 91 Figure 6-5. Using the Intermediate VIs for a Basic Non-Buffered Application
- 92 Figure 6-6. The Cont Acq&Chart (Immediate) VI Block Diagram
- 94 Figure 6-7. Software-Timed Analog I/O
- 95 Figure 6-8. Analog IO Control Loop (HW-Timed) VI Block Diagram
- 99 Figure 7-1. How Buffers Work
- 100 Figure 7-2. The AI Acquire Waveform VI
- 100 Figure 7-3. The AI Acquire Waveforms VI
- 101 Figure 7-4. Using the Intermediate VIs to Acquire Multiple Waveforms
- 102 Figure 7-5. Simple Buffered Analog Input Example
- 103 Figure 7-6. Simple Buffered Analog Input with Graphing
- 104 Figure 7-7. Taking a Specified Number of Samples with the Intermediate VIs
- 105 Figure 7-8. Writing to a Spreadsheet File after Acquisition
- 106 Figure 7-9. How a Circular Buffer Works
- 108 Figure 7-10. Continuously Acquiring Data with the Intermediate VIs
- 109 Figure 7-11. Continuous Acq&Chart (Async Occurrence) VI
- 110 Figure 7-12. Basic Circular-Buffered Analog Input Using the Intermediate VIs
- 113 Figure 8-1. Diagram of a Digital Trigger
- 114 Figure 8-2. Digital Triggering with Your DAQ Device
- 115 Figure 8-3. Block Diagram of the Acquire N Scans Digital Trig VI
- 116 Figure 8-4. Block Diagram of a VI Acquiring Data On with Digital Trigger A
- 117 Figure 8-5. Diagram of an Analog Trigger
- 118 Figure 8-6. Analog Triggering with Your DAQ Device
- 119 Figure 8-7. Block Diagram of the Acquire N Scans Analog Hardware Trig VI
- 121 Figure 8-8. Timeline of Conditional Retrieval
- 122 Figure 8-9. The AI Read VI Conditional Retrieval Cluster
- 123 Figure 8-10. Block Diagram of the Acquire N Scans Analog Software Trig VI
- 124 Figure 9-1. Channel and Scan Intervals Using the Channel Clock
- 125 Figure 9-2. Round-Robin Scanning Using the Channel Clock
- 126 Figure 9-3. Example of a TTL Signal
- 127 Figure 9-4. Getting Started Analog Input Example VI
- 128 Figure 9-5. Setting the Clock Source Code for External Conversion Pulses for E Series Devices
- 129 Figure 9-6. Block Diagram of a VI Acquiring Data On with an External Scan Clock
- 131 Figure 9-7. Externally Controlling Your Scan Clock with the Getting Started Analog Input Example VI
- 132 Figure 9-8. Controlling the Scan and Channel Clock Simultaneously
- 136 Figure 11-1. Single Immediate Update Using the AO Update Channels VI
- 137 Figure 11-2. Single Immediate Update Using the AO Update Channel VI
- 137 Figure 11-3. Single Immediate Update Using Intermediate VI
- 138 Figure 11-4. Multiple Immediate Updates Using Intermediate VI
- 139 Figure 12-1. Waveform Generation Using the AO Generate Waveforms VI
- 140 Figure 12-2. Waveform Generation Using the AO Waveform Gen VI
- 141 Figure 12-3. Waveform Generation Using Intermediate VIs
- 142 Figure 12-4. Circular Buffered Waveform Generation Using the AO Continuous Gen VI
- 143 Figure 12-5. Circular Buffered Waveform Generation Using Intermediate VIs
- 144 Figure 12-6. Display and Output Acq’d File (Scaled) VI
- 146 Figure 13-1. Generate N Updates-ExtUpdateClk VI
- 149 Figure 14-1. Simultaneous Input/Output Using the Simul AI/AO Buffered (E-series MIO) VI
- 150 Figure 14-2. Simultaneous Input/Output Using the Simul AI/AO Buffered Trigger (E-series MIO) VI
- 151 Figure 14-3. Simultaneous Input/Output Using the Simul AI/AO Buffered (Legacy MIO) VI
- 152 Figure 14-4. Simultaneous Input/Output Using the Simul AI/AO Buffered Trigger (Legacy MIO) VI
- 155 Figure 15-1. Digital Ports and Lines
- 158 Figure 16-1. The Easy Digital VIs
- 162 Figure 17-1. Connecting Signal Lines for Digital Input
- 163 Figure 17-2. Connecting Digital Signal Lines for Digital Output
- 164 Figure 17-3. Nonbuffered Handshaking Using the DIO Single Read/Write VI
- 165 Figure 17-4. Nonbuffered Handshaking Using the DIO Single Read/Write VI
- 166 Figure 17-5. Buffered Output Using the DIO-32 Devices
- 167 Figure 17-6. Buffered Output Using DAQ Devices (Other Than DIO-32 Series Devices)
- 167 Figure 17-7. Buffered Input Using DIO-32 Devices
- 168 Figure 17-8. Buffered Input Using DAQ Devices (Other than DIO-32 Devices)
- 169 Figure 17-9. Digital Handshaking Using a Circular Buffer
- 173 Figure 18-1. Common Types of Transducers/Signals and Signal Conditioning
- 174 Figure 18-2. Amplifying Signals near the Source to Increase Signal-to-Noise Ratio (SNR)
- 178 Figure 19-1. SCXI System
- 179 Figure 19-2. Components of an SCXI System
- 180 Figure 19-3. SCXI Chassis
- 195 Figure 21-1. Continuous Transducer Measurement VI
- 196 Figure 21-2. Measuring a Single Module with the Acquire and Average VI
- 197 Figure 21-3. Measuring Temperature Sensors Using the Acquire and Average VI
- 198 Figure 21-4. Continuously Acquiring Data Using Intermediate VIs
- 201 Figure 21-5. Measuring Temperature Using Information from the DAQ Channel Wizard
- 202 Figure 21-6. Measuring Temperature Using the Convert RTD Reading VI
- 203 Figure 21-7. Half-Bridge Strain Gauge
- 204 Figure 21-8. Measuring Pressure Using Information from the DAQ Channel Wizard
- 205 Figure 21-9. Convert Strain Gauge Reading VI
- 206 Figure 21-10. SCXI-1124 Update Channels VI
- 207 Figure 21-11. Inputting Digital Signals through an SCXI Chassis Using Easy Digital VIs
- 208 Figure 21-12. Outputting Digital Signals through an SCXI Chassis Using Easy Digital VIs
- 224 Figure 23-1. Counter Gating Modes
- 226 Figure 23-2. Wiring a 7404 Chip to Invert a TTL Signal
- 228 Figure 24-1. Pulse Duty Cycles
- 229 Figure 24-2. Positive and Negative Pulse Polarity
- 229 Figure 24-3. Pulses Created with Positive Polarity and Toggled Output
- 230 Figure 24-4. Phases of a Single Negative Polarity Pulse
- 231 Figure 24-5. Physical Connections for Generating a Square Pulse
- 232 Figure 24-6. Diagram of Delayed Pulse-Easy (DAQ-STC) VI
- 233 Figure 24-7. Diagram of Delayed Pulse-Int (DAQ-STC) VI
- 233 Figure 24-8. External Connections Diagram from the Front Panel of Delayed Pulse (8253) VI
- 234 Figure 24-9. Frame 0 of Delayed Pulse (8253) VI
- 235 Figure 24-10. Frame 1 of Delayed Pulse (8253) VI
- 236 Figure 24-11. Frame 2 of Delayed Pulse (8253) VI
- 237 Figure 24-12. Physical Connections for Generating a Continuous Pulse Train
- 237 Figure 24-13. Diagram of Cont Pulse Train-Easy (DAQ-STC) VI
- 238 Figure 24-14. Diagram of Cont Pulse Train-Int (DAQ-STC) VI
- 239 Figure 24-15. External Connections Diagram from the Front Panel of Cont Pulse Train (8253) VI
- 240 Figure 24-16. Diagram of Cont Pulse Train (8253) VI
- 240 Figure 24-17. Physical Connections for Generating a Finite Pulse Train
- 241 Figure 24-18. Diagram of Finite Pulse Train-Easy (DAQ-STC) VI
- 242 Figure 24-19. Diagram of Finite Pulse Train-Int (DAQ-STC) VI
- 243 Figure 24-20. External Connections Diagram from the Front Panel of Finite Pulse Train Adv (DAQ-ST...
- 244 Figure 24-21. Diagram of Finite Pulse Train-Adv (DAQ-STC) VI
- 244 Figure 24-22. External Connections Diagram from the Front Panel of Finite Pulse Train (8253) VI
- 245 Figure 24-23. Frame 0 of Finite Pulse Train (8253) VI
- 246 Figure 24-24. Frame 1 of Finite Pulse Train (8253) VI
- 247 Figure 24-25. Frame 2 of Finite Pulse Train (8253) VI
- 248 Figure 24-26. CTR Control VI Front Panel and Block Diagram
- 249 Figure 24-27. Uncertainty of One Timebase Period
- 250 Figure 24-28. Using the Generate Delayed Pulse and Stopping the Counting Operation
- 250 Figure 24-29. Stopping a Generated Pulse Train
- 251 Figure 25-1. Counting Input Signals to Determine Pulse Width
- 252 Figure 25-2. Physical Connections for Determining Pulse Width
- 252 Figure 25-3. Diagram of Measure Pulse Width (DAQ-STC) VI
- 253 Figure 25-4. Menu Choices for Type of Measurement for the Measure Pulse Width or Period (DAQ-STC) VI
- 254 Figure 25-5. Diagram of Measure Pulse Width (9513) VI
- 254 Figure 25-6. Menu Choices for Type of Measurement for the Measure Pulse Width or Period (9513) VI
- 255 Figure 25-7. Diagram of Measure Short Pulse Width (8253) VI
- 257 Figure 25-8. Measuring Pulse Width with Intermediate VIs
- 257 Figure 25-9. Diagram of Meas Buffered Pulse-Period (DAQ-STC) VI
- 260 Figure 26-1. Measuring Square Wave Frequency
- 261 Figure 26-2. Measuring a Square Wave Period
- 262 Figure 26-3. External Connections for Frequency Measurement
- 262 Figure 26-4. External Connections for Period Measurement
- 263 Figure 26-5. Diagram of Measure Frequency-Easy (DAQ-STC) VI
- 264 Figure 26-6. Diagram of Measure Frequency-Easy (9513) VI
- 265 Figure 26-7. Frequency Measurement Example Using Intermediate VIs
- 266 Figure 26-8. Diagram of Measure Frequency > 1 kHz (8253) VI
- 267 Figure 26-9. Diagram of Measure Period-Easy (DAQ-STC) VI
- 268 Figure 26-10. Diagram of Measure Period-Easy (9513) VI
- 269 Figure 26-11. Measuring Period Using Intermediate Counter VIs
- 270 Figure 27-1. External Connections for Counting Events
- 270 Figure 27-2. External Connections for Counting Elapsed Time
- 271 Figure 27-3. External Connections to Cascade Counters for Counting Events
- 272 Figure 27-4. External Connections to Cascade Counters for Counting Elapsed Time
- 272 Figure 27-5. Diagram of Count Events-Easy (DAQ-STC) VI
- 273 Figure 27-6. Diagram of Count Events-Int (DAQ-STC) VI
- 274 Figure 27-7. Diagram of Count Events-Easy (9513) VI
- 275 Figure 27-8. Diagram of Count Events-Int (9513) VI
- 276 Figure 27-9. Diagram of Count Events (8253) VI
- 277 Figure 27-10. Diagram of Count Time-Easy (DAQ-STC) VI
- 278 Figure 27-11. Diagram of Count Time-Int (DAQ-STC) VI
- 279 Figure 27-12. Diagram of Count Time-Easy (9315) VI
- 280 Figure 27-13. Diagram of Count Time-Int (9513) VI
- 281 Figure 27-14. Diagram of Count Time (8253) VI
- 282 Figure 28-1. Wiring Your Counters for Frequency Division
- 283 Figure 28-2. Programming a Single Divider for Frequency Division
- 287 Figure 29-1. Error Checking Using the General Error Handler VI
- 288 Figure 29-2. Error Checking Using the Simple Error Handler VI
- 18 Tables
- 31 Table 2-1. LabVIEW DAQ Hardware Support with NI-DAQ
- 78 Table 5-1. Measurement Precision for Various Device Ranges and Limit Settings (12-bit A/D Converter)
- 83 Table 5-2. Analog Input Channel Range
- 85 Table 5-3. Scanning Order for Each DAQ Device Input Channel with One or Two AMUX 64Ts
- 86 Table 5-4. Scanning Order for Each DAQ Device Input Channel with Four AMUX 64Ts
- 130 Table 9-1. External Scan Clock Input Pins
- 146 Table 13-1. External Update Clock Input Pins
- 171 Table 18-1. Phenomena and Transducers
- 188 Table 20-1. SCXI-1100 Channel Arrays, Input Limits Arrays, and Gains
- 259 Table 25-1. Internal Counter Timebases and Their Corresponding Maximum Pulse Width, Period, or Ti...
- 271 Table 27-1. Adjacent Counters for Counter Chips