STMicroelectronics LIS3MDL magnetometer Application note

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AN4602

Application note

LIS3MDL: three-axis digital output magnetometer

Introduction

This document is intended to guide in the usage of and to provide useful details related to ST’s

LIS3MDL 3-axis digital magnetometer.

The LIS3MDL is a three-axis high-performance magnetic sensor with a 16-bit resolution and a full scale of ±4/±8/±12/±16 gauss (user-selectable).

Sensor low-power consumption combined with power saving operating modes enables targeting handheld portable applications such as cell phones and tablets.

The ultra-small size and weight of its small, thin, plastic, land grid array package (LGA-12 2x2x1) make it an ideal choice for any application where reduced package size and weight are required, helping to optimize placement on the board.

Thermal stability of the device is guaranteed, internally compensating sensitivity drift over temperature variations using an advanced embedded algorithm.

To support integration in smart applications, the device may be configured to generate interrupt signals using thresholds programmable by the end user on the fly.

External communication is managed by a digital I

C/SPI serial interface standard output.

The device is guaranteed to operate over an extended temperature range from -40 °C to +85 °C.

ST software support available for the LIS3MDL includes drivers, a tilt-compensated electronic compass, dynamic magnetometer calibration, 6-axis virtual gyro and complete 9-axis sensor fusion.

December 2014 DocID027014 Rev 1 1/23

www.st.com

Contents

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1 Registers .......................................................................................... 5

2 General configuration ..................................................................... 7

Full scale ........................................................................................... 7

Operating modes ............................................................................... 7

2.2.1

Output data rate .................................................................................. 8

Measurement mode .......................................................................... 8

2.3.1

Turn-on time ..................................................................................... 10

2.3.2

Switching modes .............................................................................. 10

Current consumption ....................................................................... 11

3 Reading output data ...................................................................... 12

3.1

3.2

3.3

Startup sequence ............................................................................ 12

Reading magnetometer data ........................................................... 12

3.2.1

Using the data-ready (DRDY) signal ................................................ 12

3.2.2

Using the STATUS_REG register .................................................... 13

3.2.3

Using the block data update (BDU) feature ..................................... 14

3.2.4

FAST_READ option .......................................................................... 14

Understanding magnetic data ......................................................... 14

3.3.1

Big-little endian selection .................................................................. 14

4 Interrupt generation ...................................................................... 16

4.1

4.2

4.3

Interrupt configuration ..................................................................... 16

Interrupt threshold ........................................................................... 17

Interrupt source register .................................................................. 17

5 Self-test .......................................................................................... 19

6 Temperature sensor and temperature compensation ................ 20

7 Offset management ....................................................................... 21

8 Revision history ............................................................................ 22

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List of tables

List of tables

Table 1: Registers ....................................................................................................................................... 5

Table 2: Full-scale selection ....................................................................................................................... 7

Table 3: X/Y axes operating mode selection .............................................................................................. 7

Table 4: Z-axis operating mode selection ................................................................................................... 8

Table 5: Noise in operating modes (average per axis) ............................................................................... 8

Table 6: Data rate configuration ................................................................................................................. 8

Table 7: System modes .............................................................................................................................. 9

Table 8: Turn-on time................................................................................................................................ 10

Table 9: TON for operating modes ........................................................................................................... 10

Table 10: Current consumption (µA) ........................................................................................................ 11

Table 11: Output data registers content vs. magnetic values (FS = 4 G) ................................................ 15

Table 12: INT_CFG (30h) register ............................................................................................................ 16

Table 13: INT_CFG description ................................................................................................................ 16

Table 14: INT_THS_H (33h) register ........................................................................................................ 17

Table 15: INT_THS_L (32h) register ........................................................................................................ 17

Table 16: INT_SRC description ................................................................................................................ 17

Table 17: Self-test limits (FS = 12 gauss) ................................................................................................. 19

Table 18: Document revision history ........................................................................................................ 22

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List of figures

List of figures

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Figure 1: Sampling timing in continuous mode ........................................................................................... 9

Figure 2: Turn-on time .............................................................................................................................. 10

Figure 3: Startup sequence ...................................................................................................................... 12

Figure 4: DRDY flow ................................................................................................................................. 13

Figure 5: Interrupt mechanism .................................................................................................................. 18

Figure 6: Self-test sequence ..................................................................................................................... 19

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1 Registers

Register name

OFFSET_X_REG_L_M

OFFSET_X_REG_H_M

OFFSET_Y_REG_L_M

OFFSET_Y_REG_H_M

OFFSET_Z_REG_L_M

OFFSET_Z_REG_H_M

WHO_AM_I

CTRL_REG1

CTRL_REG2

CTRL_REG3

CTRL_REG4

CTRL_REG5

STATUS_REG

OUT_X_L

OUT_X_H

OUT_Y_L

OUT_Y_H

OUT_Z_L

OUT_Z_H

TEMP_OUT_L

TEMP_OUT_H

INT_CFG

Address

0Ah

0Fh

20h

21h

22h

23h

24h

27h

05h

06h

07h

08h

09h

28h

29h

2Ah

2Bh

2Ch

2Dh

2Eh

2Fh

30h

Bit7

XOFF7

XOFF15

YOFF7

YOFF15

ZOFF7

ZOFF15

TEMP_EN

FAST_READ

ZYXOR

XD7

XD15

YD7

YD15

ZD7

ZD15

TMPO7

XIEN

Bit6

XOFF6

XOFF14

YOFF6

YOFF14

ZOFF6

ZOFF14

OM1

FS1

BDU

ZOR

XD6

XD14

YD6

YD14

ZD6

ZD14

TMPO6

YIEN

Table 1: Registers

Bit5 Bit4

XOFF5

XOFF13

YOFF5

YOFF13

ZOFF5

ZOFF13

OM0

FS0

YOR

XD5

XD13

YD5

YD13

ZD5

ZD13

TMPO5

ZIEN

XOFF4

XOFF12

YOFF4

YOFF12

ZOFF4

ZOFF12

DO2

XOR

XD4

XD12

YD4

YD12

ZD4

ZD12

TMPO4

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Registers

Bit3

XOFF3

XOFF11

YOFF3

YOFF11

ZOFF3

ZOFF11

DO1

REBOOT

OMZ1

ZYXDA

XD3

XD11

YD3

YD11

ZD3

ZD11

TMPO3

Bit2

XOFF2

XOFF10

XOFF2

YOFF10

ZOFF2

ZOFF10

DO0

SOFT_RST

SIM

OMZ0

ZDA

XD2

XD10

YD2

YD10

ZD2

ZD10

TMPO2

IEA

Bit1

XOFF1

XOFF9

YOFF1

YOFF9

ZOFF1

ZOFF9

FAST_ODR

MD1

BLE

YDA

XD1

XD9

YD1

YD9

ZD1

ZD9

TMPO1

LIR

Bit0

XOFF0

XOFF8

YOFF0

YOFF8

ZOFF0

ZOFF8

MD0

XDA

XD0

XD8

YD0

YD8

ZD0

ZD8

TMPO0

IEN

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Registers

Register name

INT_SRC

INT_THS_L

INT_THS_H

Address

31h

32h

33h

Bit7

PTH_X

THSL7

THSH7

Bit6

PTH_Y

THSL6

THSH6

Bit5

PTH_Z

THSL5

THSH

Bit4

NTH_X

THSL4

THSH4

Bit3

NTH_Y

THSL3

THSH3

Bit2

NTH_Z

THSL2

THSH2

Bit1

MROI

THSL1

THSH1

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Bit0

INT

THSL0

THSH0

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2

2.1

2.2

General configuration

General configuration

Various features of the LIS3MDL can be configured by using CTRL_REG1, CTRL_REG2,

CTRL_REG3 and CTRL_REG4.

•

Output data rate (ODR)

−

•

Operating modes

−

•

Full-scale

−

•

Measurement mode

−

Mode register (CTRL_REG3): bits MD1, MD0

Full scale

The LIS3MDL provides a selectable full scale to adjust the input dynamic range of the device to the amplitude of the magnetic field to be measured.

Full-scale configuration is selected by setting bits FS1, FS0 (register CTRL_REG2).

FS1

Table 2: Full-scale selection

FS0 Full-scale [G] Gain@16-bit (LSB/G)

±4

±8

±12

±16

6842

3421

2281

1711

Operating modes

The LIS3DML allows four possible operating modes: low-power, medium-performance, high -performance and ultra-high-performance.

Operating modes on the X/Y axes can be chosen independently from the operating mode on the Z-axis:

•

X/Y axes operating mode can be selected by setting bits OM1, OM0 (register

CTRL_REG1)

•

Z-axis operating mode by using bits OMZ1, OMZ0 (register CTRL_REG4)

Table 3: X/Y axes operating mode selection

Operating mode OM1 OM0

Low-power

Medium-performance

High-performance

Ultra-high-performance

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General configuration

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Table 4: Z-axis operating mode selection

Operating mode OMZ1 OMZ0

Low-power

Medium-performance

High-performance

Ultra-high-performance

The output noise is strictly related to the operating mode. The noise level sets the minimum detectable field. In the following table noise is given for different operating modes.

Table 5: Noise in operating modes (average per axis)

Operating mode RMS noise [mgauss]

Ultra-high-performance 3.5

High-performance 4.0

Medium-performance

Low-power

4.6

5.3

2.2.1 Output data rate

A higher ODR can be selected by configuring bit 1 of CTRL_REG1.

DO2 DO1

Table 6: Data rate configuration

DO0 FODR ODR [Hz]

1000

560

300

155

0.625

1.25

2.5

UHP

2.3 Measurement mode

The system goes to idle mode:

• automatically at the end of startup procedure

• automatically, if single-measurement mode has been selected at the end of the measurement process

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General configuration

Idle mode can also be forced by the user, setting the MD1 bit equal to 1 (mode register

CTRL_REG3) . In idle mode (current consumption around 1 uA) the system is waiting for

startup configuration commands. (Refer also to

Section 2.4: "Current consumption"

, and

Section 3: "Reading output data"

). Single/Continuous measurement mode can be selected

by configuring bits MD1, MD0 of mode register (CTRL_REG3).

MD1

Table 7: System modes

MD0 Mode

Continuous-measurement mode

Single-measurement mode

Idle mode

During single-measurement mode, the device performs a single measurement and writes the measured data in the data output register. After the measurement has been completed and the output data registers are updated, the device is reset to idle mode: the Mode register is consequently changed to idle mode (bit MD1 = 1).

During continuous-measurement mode, the device continuously performs measurements and writes measured data in the data output registers. In order to reduce average power consumption, the device is configured in a state similar to idle mode (called TOFF) between two consecutive measurements.

In TOFF mode average power consumption is reduced to a few µA by switching off the main blocks.

Figure 1: Sampling timing in continuous mode

In the figure above we can see that the duty cycle is equal to TON/(TON + TOFF) =

TON*ODR (where ODR=1/(TON + TOFF). Therefore the average power consumption is

strictly dependent on the selected ODR (see

Table 10: "Current consumption (µA)"

Moreover, please note that different TON durations correspond to different operating modes which correspond to different duty cycles, therefore current consumption depends

on both OM and ODR (see

Section 2.4: "Current consumption"

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General configuration

2.3.1 Turn-on time

Turn-on time is the interval between the wakeup command and data availability.

Figure 2: Turn-on time

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2.3.2

10/23

The following table gives the turn-on time for each operating mode.

Table 8: Turn-on time

Operating mode Startup time [ms]

Low-power

Medium-performance

High-performance

Ultra-high-performance

1.2

1.91

3.48

6.65

Switching modes

If the LIS3MDL device has been configured in continuous measurement, it is possible to change OM and/or ODR without switching to idle mode.

In this case (see

Table 9: "TON for operating modes"

) the system will reach the new

configuration after a time interval given by the sum of the TON related to the old configuration and the TON related to the new configuration. For instance if we move from

MP to UHP, the system will reach the new configuration after 1.65 ms + 6.4 ms = 8.05 ms .

All the performed measurements are valid and no data has to be deleted.

The following table gives TON duration for different OMs.

Table 9: TON for operating modes

Operating mode TON [ms]

UHP

0.9

1.65

3.23

6.4

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2.4

General configuration

Current consumption

The following tables summarize typical consumption for the different ODR allowed in each operating mode. Fast ODR consumption is summarized in the last four rows.

ODR (Hz)

Table 10: Current consumption (µA)

LP MP HP UHP

0.625

1.25

2.5

155

300

560

1000

150

1500

145

290

1720

145

285

565

1870

145

270

565

1125

1950

When the system is in idle mode (bit MD1 of CTRL_REG3 equal to 1) current consumption is around 1 µA .

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Reading output data

3

3.1

Reading output data

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Startup sequence

After “Power-on reset rising” all the configuration/calibration parameters are loaded from

FTP memory, then a single measure is performed and valid data are written in the output registers. At this stage the system goes to idle mode waiting for further commands through the I

C/SPI interface. Please note that during the startup sequence, the DRDY pin is set to low.

The startup sequence can be summarized in the following figure.

Figure 3: Startup sequence

3.2

3.2.1

A typical wakeup sequence is summarized as follows:

1. Write 40h in CTRL_REG2. Sets full scale ±12 Hz.

2. Write FCh in CTRL_REG1. Sets UHP mode on the X/Y axes, ODR at 80 Hz and activates temperature sensor.

3. Write 0Ch in CTRL_REG4. Sets UHP mode on the Z-axis.

4. Write 00h in CTRL_REG3. Sets continuous-measurement mode.

Reading magnetometer data

Data can be read in two ways: accessing directly the DRDY pin (pin 8) or reading bit 3 of

STATUS_REG.

Using the data-ready (DRDY) signal

Pin 8 (DRDY) represents the content of the XYZDA bit of the STATUS_REG register. The data-ready signal rises to 1 when a new set of data has been generated and is available for reading. As soon as the first “High part” of the output data is read, DRDY goes low.

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Figure 4: DRDY flow

Reading output data

3.2.2

Summarizing the read from the DRDY pin:

1. Read the DRDY pin

2. If DRDY = 0, then go to step 1

3. Read OUT_X_L

4. Read OUT_X_H

5. Read OUT_Y_L

6. Read OUT_Y_H

7. Read OUT_Z_L

8. Read OUT_Z_H

9. Data processing

10. Go to step 1

Using the STATUS_REG register

Directly polling the STATUS_REG register allows checking bit 7 (overrun). If bit 7 is set to

1, the reading rate is not adequate compared to the data production rate. If one or more magnetometer samples have been overwritten by new data because of an excessively slow reading rate, the ZYXOR bit of the STATUS_REG register is set to 1.

Reading from the STATUS_REG can be summarized as follows:

1. Read STATUS_REG

2. If STATUS_REG(3) = 0, then go to step 1

3. If STATUS_REG(7) = 1, some data have been overwritten

4. Read OUT_X_L

5. Read OUT_X_H

6. Read OUT_Y_L

7. Read OUT_Y_H

8. Read OUT_Z_L

9. Read OUT_Z_H

10. Data processing

11. Go to step 1

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Reading output data

3.2.3 Using the block data update (BDU) feature

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If the reading of the magnetic data cannot be synchronized with the XYZDA bit in the

STATUS_REG register, it is strongly recommended to set the BDU (block data update) bit to 1 in CTRL_REG5 register.

This feature avoids the reading of values (most significant and least significant parts of the magnetic data) related to different samples. In particular, when the BDU is activated, the data registers related to each channel always contain the most recent magnetic data produced by the device, but, in case the reading of a given pair (i.e. OUT_X_H and

OUT_X_L, OUT_Y_H and OUT_Y_L, OUT_Z_H and OUT_Z_L) is initiated, the refresh for that pair is blocked until both MSB and LSB parts of the data are read.

BDU only guarantees that OUT_X(Y, Z)_L and OUT_X(Y,Z)_H have been sampled at the same moment. For example, if the reading speed is too low, it may read X and Y sampled at T1 and Z sampled at T2.

3.2.4 FAST_READ option

Reading of output data occurs through the I

2 the I

C Interface. To accelerate the reading process

C interface can be configured to allow reading of multiple bytes: data stored in all the data output registers will be transferred in the same transaction. At this point, if we are interested in H values only, it is not efficient to read L values.

By activating the FAST_READ option we allow the transfer of the high part of the output data only and we can disregard the low part of the output data.

For details concerning the I

C interface, please refer to section 5.1 of the LIS3MDL datasheet.

The FAST_READ option can be selected by setting bit7 of CTRL_REG5 equal to 1..

3.3

3.3.1

Understanding magnetic data

The magnetic data are sent to the OUT_X_H, OUT_X_L, OUT_Y_H, OUT_Y_L, OUT_Z_H, and OUT_Z_L registers. These registers contain, respectively, the most significant part and the least significant part of the magnetic signals acting on the X, Y, and Z axes.

Complete data for the X (Y, Z) channel is given by the concatenation OUT_X_H &

OUT_X_L (OUT_Y_H & OUT_Y_L, OUT_Z_H & OUT_Z_L) and it is expressed as a two’s complement number.

Magnetic data are represented as 16-bit numbers and are left-justified.

Big-little endian selection

The LIS3MDL allows swapping the content of the lower and the upper part of the data registers (i.e. OUT_X_H with OUT_X_L), to be compliant with both little-endian and bigendian data representations.

“Little Endian” means that the low-order byte of the number is stored in memory at the lowest address, and the high-order byte at the highest address. (The little end comes first).

This mode corresponds to bit BLE (in CTRL_REG4 register) reset to 0 (default configuration).

On the contrary, “Big Endian” means that the high-order byte of the number is stored in memory at the lowest address, and the low-order byte at the highest address.

In the following table some examples showing the use of bit BLE are given.

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Reading output data

Table 11: Output data registers content vs. magnetic values (FS = 4 G)

BLE = 0 BLE = 1

Data values [G]

29h 28h 29h 28h

0.5

-0.5

-1.0

-2.0

-4.0

6Ah

35h

1Ah

0Dh

00h

F2h

E5h

CAh

95h

E8h

74h

BAh

5Dh

00h

A3h

46h

8Ch

18h

E8h

74h

BAh

5Dh

00h

A3h

46h

8Ch

18h

6Ah

35h

1Ah

0Dh

00h

F2h

E5h

CAh

95h

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Interrupt generation

4

4.1

Interrupt generation

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The LIS3MDL interrupt signal can be configured in a very flexible way, allowing to recognize when magnetic data exceeds a threshold value. This signal can be driven on the

INT pin

(pin 7).

The registers involved in the interrupt generation behavior are INT_CFG, INT_THS_L,

INT_THS_H and INT_SRC.

Registers INT_THS_L and INT_THS_H are used to enter the threshold value used for interrupt generation. Register INT_CFG allows interrupt generation on a single axis, two axes, or for all the three axes. Finally the INT_SRC register allows understanding where the interrupt signal occurred.

Interrupt configuration

XIEN YIEN

Table 12: INT_CFG (30h) register

ZIEN 0 0 IEA

XIEN

LIR IEN

Table 13: INT_CFG description

Enable interrupt generation on X-axis. Default value: 0

(0: disable interrupt request; 1: enable interrupt request on measured rate value higher than preset threshold)

YIEN

ZIEN

Enable interrupt generation on Y-axis. Default value: 0

(0: disable interrupt request; 1: enable interrupt request on measured rate value higher than preset threshold)

Enable interrupt generation on Z-axis. Default value: 0

(0: disable interrupt request; 1: enable interrupt request on measured rate value higher than preset threshold)

IEA

LIR

Control the polarity on INT when an interrupt occurs. Default value: 0

(0: low; 1: high)

Latch interrupt request. Default value: 0

(0: interrupt request latched; 1: interrupt request not latched)

Once latched, the INT pin remains in the same state until INT_SRC (31h) is read.

IEN

Interrupt enable on INT pin. Default value: 0

(0: disabled; 1: enabled)

The LIR bit allows deciding if the interrupt request must be latched or not. If the LIR bit is

‘1’, the interrupt signal goes high when the interrupt condition is satisfied and returns to low immediately if the interrupt condition cannot be verified. Otherwise, if the LIR bit is ‘0’, when an interrupt condition is applied, the interrupt signal remains high (even if the condition returns to a non-interrupt status) until a read of the INT_SRC register is performed.

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4.2

4.3

Interrupt generation

Interrupt threshold

The threshold registers INT_THS_L and INT_THS_H define the magnetic data values used by the interrupt generation circuitry.

Defined threshold values are the same for all three axes.

In case the interrupt mechanism has been enabled for more than one axis, please note that this mechanism acts like a logical OR.

The threshold has to be expressed in absolute value; it is converted to LSB and has to be written in the INT_THS register (unsigned code). The device detects both positive and negative thresholds.

As previously seen, LSB depends on the full scale, refer to

Table 2: "Full-scale selection"

(sensitivity vs. FS table).

Table 14: INT_THS_H (33h) register

ITHRH7 ITHRH6 ITHRH5 ITHRH4 ITHRH3 ITHRH2 ITHRH1 ITHRH0

ITHRL7 ITHRL6

Table 15: INT_THS_L (32h) register

ITHRL5 ITHRL4 ITHRL3 ITHRL2 ITHRL1 ITHRL0

Interrupt source register

As already stated, the INT_SRC register indicates the cause that generated the interrupt.

The MROI bit switches on when an overflow data is detected.

Table 16: INT_SRC description

Value on X-axis exceeds the threshold on the positive side.

PTH_X

PTH_Y

Default value: 0.

Value on Y-axis exceeds the threshold on the positive side.

Default value: 0.

Value on Z-axis exceeds the threshold on the positive side.

PTH_Z

Default value: 0.

Value on X-axis exceeds the threshold on the negative side.

NTH_X

Default value: 0.

Value on Y-axis exceeds the threshold on the negative side.

NTH_Y

Default value: 0.

Value on Z-axis exceeds the threshold on the negative side.

NTH_Z

MROI

Default value: 0.

Internal measurement range overflow on magnetic value.

Default value: 0.

INT This bit signals when interrupt event occurs.

Pin 7 (INT) is directly linked to the INT bit (INT_SRC register) which indicates that an interrupt event occurred.

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Interrupt generation

The following graph shows one view of the interrupt mechanism.

Figure 5: Interrupt mechanism

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5 Self-test

In order to test the sensor the LIS3MDL device provides a self-test feature.

This test is enabled by setting bit 0 to ‘1’ in the CTRL_REG1 (20h) register.

The self-test procedure is indicated in the following figure.

Figure 6: Self-test sequence

Self-test

The following table provides the self-test limits.

Axis

Table 17: Self-test limits (FS = 12 gauss)

ST min [gauss] ST max [gauss]

X-axis

Y-axis

Z-axis

1.0

0.1

3.0

1.0

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Temperature sensor and temperature compensation

6

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Temperature sensor and temperature compensation

The LIS3MDL is provided with an internal temperature sensor that is suitable for delta temperature measurement. Temperature data are generated with a frequency equal to the

ODR and are stored inside the TEMP_OUT_L/TEMP_OUT_H registers: these values are

16-bit, 2’s complement.

The nominal sensitivity is 8 LSB/°C and 0 output means T=25 °C.

The temperature sensor can be enabled/disabled by setting the TEMP_EN bit

(CTRL_REG1 register) equal to 1 or 0, respectively.

The sensitivity of the magnetic sensor changes when the temperature changes. A temperature compensation digital block is introduced to compensate for the effect of temperature.

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7

Offset management

Offset management

The LIS3MDL provides six registers dedicated to erase possible offset in the output data.

Typical usage of these registers is to compensate for hard-iron effects:

OFFSET_X_REG_L_M (05h) ;

OFFSET_X_REG_H_M (06h) ;

OFFSET_Y_REG_L_M (07h) ;

OFFSET_Y_REG_H_M (08h) ;

OFFSET_Z_REG_L_M (09h) ;

OFFSET_Z_REG_H_M (0Ah) ;

Offset values have to be written in the registers as 16-bit, 2’s complement (the sensitivity

value is the same used for the magnetic data, please refer to

Table 2: "Full-scale selection"

The content of the OFFSET register is subtracted from the output of the device:

OUT = OUT(measured) - OFFSET

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Revision history

8 Revision history

Date Revision

Table 18: Document revision history

Changes

17-Dec-2014 1 Initial release

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DocID027014 Rev 1 23/23

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Publicitate

AN4602

Application note

LIS3MDL: three-axis digital output magnetometer

Contents

List of tables

List of figures

1 Registers

2

General configuration

2.2.1 Output data rate

2.3.1 Turn-on time

2.3.2

Switching modes

3

Reading output data

3.2.1

Using the data-ready (DRDY) signal

3.2.2

Using the STATUS_REG register

3.2.3 Using the block data update (BDU) feature

3.2.4 FAST_READ option

3.3.1

Big-little endian selection

4

Interrupt generation

5 Self-test

6

Temperature sensor and temperature compensation

7

Offset management

8 Revision history

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