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M48T35
M48T35Y, M48T35Y
256 Kbit (32Kb x 8) TIMEKEEPER
®
SRAM
INTEGRATED ULTRA LOW POWER SRAM,
REAL TIME CLOCK, POWER-FAIL CONTROL
CIRCUIT and BATTERY
BYTEWIDE
RAM-LIKE CLOCK ACCESS
BCD CODED YEAR, MONTH, DAY, DATE,
HOURS, MINUTES and SECONDS
FREQUENCY TEST OUTPUT for REAL TIME
CLOCK
AUTOMATIC POWER-FAIL CHIP DESELECT and
WRITE PROTECTION
WRITE PROTECT VOLTAGES
(V
PFD
= Power-fail Deselect Voltage):
– M48T35: 4.5V
≤
V
PFD
≤
4.75V
– M48T35Y: 4.2V
≤
V
PFD
≤
4.5V
– M48T35V: 2.7V
≤
V
PFD
≤
3.0V
SELF-CONTAINED BATTERY and CRYSTAL in the CAPHAT DIP PACKAGE
PACKAGING INCLUDES a 28-LEAD SOIC and SNAPHAT
®
TOP
(to be Ordered Separately)
SOIC PACKAGE PROVIDES DIRECT
CONNECTION for a SNAPHAT TOP
CONTAINS the BATTERY and CRYSTAL
PIN and FUNCTION COMPATIBLE with
JEDEC STANDARD 32K x 8 SRAMs
DESCRIPTION
The M48T35/35Y/35V TIMEKEEPER
®
RAM is a
32 Kbit x 8 non-volatile static RAM and real time clock. The monolithic chip is available in two special packages to provide a highly integrated battery backed-up memory and real time clock solution.
Table 1. Signal Names
A0-A14
DQ0-DQ7
E
G
W
V
CC
V
SS
Address Inputs
Data Inputs / Outputs
Chip Enable
Output Enable
Write Enable
Supply Voltage
Ground
July 1998
SNAPHAT (SH)
Battery/Crystal
28
1
SOH28 (MH)
28
Figure 1. Logic Diagram
A0-A14
15
W
E
G
VCC
M48T35
M48T35Y
M48T35V
VSS
1
PCDIP28 (PC)
Battery/Crystal
CAPHAT
8
DQ0-DQ7
AI01620C
1/17
M48T35, M48T35Y, M48T35V
Figure 2A. DIP Pin Connections
DQ0
DQ1
DQ2
VSS
A4
A3
A2
A1
A0
A14
A12
A7
A6
A5
11
12
13
14
6
7
8
9
10
3
4
1
2
5
M48T35
M48T35Y
18
17
16
15
22
21
20
19
28
27
26
25
24
23
AI01621B
G
A10
E
DQ7
DQ6
DQ5
DQ4
DQ3
VCC
W
A13
A8
A9
A11
Figure 2B. SOIC Pin Connections
A14
A12
A7
A6
DQ0
DQ1
DQ2
VSS
A5
A4
A3
A2
A1
A0
9
10
11
12
13
14
6
7
8
4
5
1
2
3
M48T35Y
M48T35V
24
23
22
21
20
19
18
17
16
15
28
27
26
25
AI01622C
E
DQ7
DQ6
DQ5
DQ4
DQ3
VCC
W
A13
A8
A9
A11
G
A10
Table 2. Absolute Maximum Ratings
(1)
Symbol
T
A
T
STG
T
SLD
(2)
V
IO
V
CC
I
O
P
D
Parameter
Ambient Operating Temperature
Storage Temperature (V
CC
Input or Output Voltages
Supply Voltage
Output Current
Power Dissipation
Off, Oscillator Off)
Lead Solder Temperature for 10 seconds
Value
0 to 70
–40 to 85
260
–0.3 to 7
–0.3 to 7
20
1
Unit
°
C
°
C
°
C
V
V mA
W
Notes: 1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to the absolute maximum rating conditions for extended periods of time may affect reliability.
2. Soldering temperature not to exceed 260
°
C for 10 seconds (total thermal budget not to exceed 150
°
C for longer than 30 seconds).
CAUTION: Negative undershoots below –0.3 volts are not allowed on any pin while in the Battery Back-up mode.
CAUTION: Do NOT wave solder SOIC to avoid damaging SNAPHAT sockets.
DESCRIPTION (cont’d)
The M48T35/35Y/35V is a non-volatile pin and function equivalent to any JEDEC standard 32K x8
SRAM. It also easily fits into many ROM, EPROM, and EEPROM sockets, providing the non-volatility of PROMs without any requirement for special write timing or limitations on the number of writes that can be performed.
The 28 pin 600mil DIP CAPHAT
houses the
M48T35/35Y/35V silicon with a quartz crystal and a long life lithium button cell in a single package.
The 28 pin 330mil SOIC provides sockets with gold plated contacts at both ends for direct connection to a separate SNAPHAT housing containing the battery and crystal. The unique design allows the
SNAPHAT battery package to be mounted on top of the SOIC package after the completion of the surface mount process. Insertion of the SNAPHAT housing after reflow prevents potential battery and crystal damage due to the high temperatures required for device surface-mounting. The SNAPHAT housing is keyed to prevent reverse insertion.
2/17
M48T35, M48T35Y, M48T35V
Table 3. Operating Modes
(1)
Mode
Deselect
Write
Read
V
CC
4.75V to 5.5V
or
4.5V to 5.5V
or
3.0V to 3.6V
E
V
IH
V
V
IL
IL
G
X
X
V
IL
Read V
IL
V
IH
Deselect
Deselect
V
SO
to V
PFD
(min)
(2)
≤
V
SO
X
X
Notes: 1. X = V
IH
or V
IL
; V
SO
= Battery Back-up Switchover Voltage.
2. See Table 7 for details.
X
X
Figure 3. Block Diagram
V
IH
X
X
W
X
V
IL
V
IH
DQ0-DQ7
High Z
D
IN
D
OUT
High Z
High Z
High Z
Power
Standby
Active
Active
Active
CMOS Standby
Battery Back-up Mode
32,768 Hz
CRYSTAL
OSCILLATOR AND
CLOCK CHAIN
POWER
LITHIUM
CELL
VOLTAGE SENSE
AND
SWITCHING
CIRCUITRY
VPFD
8 x 8 BiPORT
SRAM ARRAY
32,760 x 8
SRAM ARRAY
A0-A14
DQ0-DQ7
E
W
G
VCC VSS
AI01623
The SOIC and battery/crystal packages are shipped separately in plastic anti-static tubes or in
Tape & Reel form.
For the 28 lead SOIC, the battery/crystal package
( i.e. SNA PHAT ) p art num ber is "M 4T28-
BR12SH1".
As Figure 3 shows, the static memory array and the q ua r t z c o nt r ol led c loc k o sc i lla t or of t h e
M48T35/35Y/35V are integrated on one silicon chip. The two circuits are interconnected at the upper eight memory locations to provide user accessible BYTEWIDE
clock information in the bytes with addresses 7FF8h-7FFFh.
The clock locations contain the year, month, date, day, hour, minute, and second in 24 hour BCD format. Corrections for 28, 29 (leap year), 30, and
31 day months are made automatically. Byte
7FF8h is the clock control register. This byte controls user access to the clock information and also stores the clock calibration setting.
3/17
M48T35, M48T35Y, M48T35V
Table 4. AC Measurement Conditions
Input Rise and Fall Times
Input Pulse Voltages
≤
5ns
0 to 3V
Input and Output Timing Ref. Voltages 1.5V
Note that Output Hi-Z is defined as the point where data is no longer driven.
Figure 4. AC Testing Load Circuit
DEVICE
UNDER
TEST
645
Ω
CL = 100pF
(or 5pF)
1.75V
CL includes JIG capacitance
AI02586
DESCRIPTION (cont’d)
The eight clock bytes are not the actual clock counters themselves; they are memory locations consisting of BiPORT
read/write memory cells.
The M48T35/35Y/35V includes a clock control circuit which updates the clock bytes with current information once per second. The information can be accessed by the user in the same manner as any other location in the static memory array.
The M48T35/35Y/35V also has its own Power-fail
Detect circuit. The control circuitry constantly monitors the single 5V supply for an out of tolerance condition. When V
CC
is out of tolerance, the circuit write protects the SRAM, providing a high degree of data security in the midst of unpredictable system operation brought on by low V
CC
. As V
CC
falls below approximately 3V, the control circuitry connects the battery which maintains data and clock operation until valid power returns.
READ MODE
The M48T35/35Y/35V is in the Read Mode whenever W (Write Enable) is high and E (Chip Enable) is low. The unique address specified by the 15
Address Inputs defines which one of the 32,768 bytes of data is to be accessed. Valid data will be available at the Data I/O pins within Address Access time (t
AVQV
) after the last address input signal is stable, providing that the E and G access times are also satisfied.
If the E and G access times are not met, valid data will be available after the latter of the Chip Enable
Access time (t
ELQV
) or Output Enable Access time
(t
GLQV
).
The state of the eight three-state Data I/O signals is controlled by E and G. If the outputs are activated before t
AVQV
, the data lines will be driven to an indeterminate state until t
AVQV
. If the Address Inputs are changed while E and G remain active, output data will remain valid for Output Data Hold time (t
AXQX
) but will go indeterminate until the next
Address Access.
WRITE MODE
The M48T35/35Y/35V is in the Write Mode whenever W and E are low. The start of a write is referenced from the latter occurring falling edge of
W or E. A write is terminated by the earlier rising edge of W or E. The addresses must be held valid throughout the cycle. E or W must return high for a minimum of t
EHAX
from Chip Enable or t
WHAX
from
Write Enable prior to the initiation of another read or write cycle. Data-in must be valid t
DVWH
prior to the end of write and remain valid for t
WHDX
afterward. G should be kept high during write cycles to avoid bus contention; although, if the output bus has been activated by a low on E and G, a low on
W will disable the outputs t
WLQZ
after W falls.
4/17
M48T35, M48T35Y, M48T35V
Table 5. Capacitance
(1, 2)
(T
A
= 25
°
C, f = 1 MHz )
Symbol Parameter Test Condition
C
IN
C
IO
(3)
Input Capacitance
Input / Output Capacitance
Notes: 1. Effective capacitance measured with power supply at 5V.
2. Sampled only, not 100% tested.
3. Outputs deselected
V
IN
= 0V
V
OUT
= 0V
Table 6A. DC Characteristics
(T
A
= 0 to 70
°
C; V
CC
= 4.75V to 5.5V or 4.5V to 5.5V)
Symbol
I
LI
(1)
I
LO
(1)
I
CC
I
CC1
I
CC2
V
IL
(2)
V
IH
Parameter
Input Leakage Current
Output Leakage Current
Supply Current
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
Input Low Voltage
Input High Voltage
Test Condition
0V
≤
V
IN
≤
V
CC
0V
≤
V
OUT
≤
V
CC
Outputs open
E = V
E = V
CC
IH
– 0.2V
V
OL
Output Low Voltage I
OL
= 2.1mA
V
OH
Output High Voltage I
OH
= –1mA
Notes: 1. Outputs Deselected.
2. Negative spikes of –1V allowed for up to 10ns once per Cycle.
Min Max
10
10
Unit
pF pF
Min
–0.3
2.2
2.4
Max
±
1
±
5
50
3
3
0.8
V
CC
+ 0.3
0.4
Unit
µ
A
µ
A mA mA mA
V
V
V
V
Table 6B. DC Characteristics
(T
A
= 0 to 70
°
C; V
CC
= 3.0V to 3.6V)
Symbol
I
LI
(1)
I
LO
(1)
Parameter
Input Leakage Current
Output Leakage Current
Test Condition
0V
≤
V
IN
≤
V
CC
0V
≤
V
OUT
≤
V
CC
I
CC
I
CC1
I
CC2
V
IL
(2)
V
IH
V
OL
Supply Current
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
Input Low Voltage
Input High Voltage
Output Low Voltage
Outputs open
E = V
E = V
CC
IH
– 0.2V
I
OL
= 2.1mA
V
OH
Output High Voltage I
OH
= –1mA
Notes: 1. Outputs Deselected.
2. Negative spikes of –1V allowed for up to 10ns once per Cycle.
Min
–0.3
2.2
2.4
Max
±
1
±
5
30
2
2
0.8
V
CC
+ 0.3
0.4
Unit
µ
A
µ
A mA mA mA
V
V
V
V
5/17
M48T35, M48T35Y, M48T35V
Table 7. Power Down/Up Trip Points DC Characteristics
(1)
(T
A
= 0 to 70
°
C)
Symbol Parameter Min
V
PFD
V
PFD
V
PFD
V
SO
Power-fail Deselect Voltage (M48T35)
Power-fail Deselect Voltage (M48T35Y)
Power-fail Deselect Voltage (M48T35V)
Battery Back-up Switchover Voltage (M48T35/35Y)
4.5
4.2
2.7
V
SO
Battery Back-up Switchover Voltage (M48T35V) t
DR
(2, 3)
Expected Data Retention Time
Notes: 1. All voltages referenced to V
SS
.
2. At 25°C.
3. CAPHAT only, SNAPHAT t
DR
= 7yrs (typ).
10
Typ
4.6
4.35
2.9
3.0
VPFD –
100mV
Max
4.75
4.5
3.0
Table 8. Power Down/Up Mode AC Characteristics
(T
A
= 0 to 70
°
C)
Symbol Parameter
t t t
PD
F
(1)
FB
(2) t t
R
RB
E or W at V
V
V
V
V
PFD
PFD
PFD
SO
(max) to V
(min) to V
(min) to V
to V
PFD
IH
before Power Down
PFD
SO
PFD
V
(max) V
(min) V
(min) V
CC
CC
CC
CC
Fall Time
Fall Time
Rise Time
Rise Time
Min
0
300
10
10
1
Max Unit
µ s
µ s
µ s
µ s
µ s t
REC
V
PFD
(max) to Inputs Recognized 40 200
Notes: 1. V
PFD
(max) to V
PFD
(min) fall time of less than t
F
may result in deselection/write protection not occurring until 200
µ s after
V
CC
passes V
PFD
(min).
2. V
PFD
(min) to V
SO
fall time of less than t
FB
may cause corruption of RAM data.
ms
Unit
V
V
V
V
V
YEARS
Figure 5. Power Down/Up Mode AC Waveforms
VCC
VPFD (max)
VPFD (min)
VSO
INPUTS tF tPD
RECOGNIZED tFB
OUTPUTS VALID
(PER CONTROL INPUT) tDR tRB
DON'T CARE
HIGH-Z tR tREC
RECOGNIZED
VALID
(PER CONTROL INPUT)
AI01168B
6/17
M48T35, M48T35Y, M48T35V
Table 9. Read Mode AC Characteristics
(T
A
= 0 to 70
°
C; V
CC
= 4.75V to 5.5V or 4.5V to 5.5V or 3.0V to 3.6V)
M48T35 / M48T35Y
Symbol Parameter
-70
Min Max
t
AVAV t
AVQV
(1)
Read Cycle Time
Address Valid to Output Valid t
ELQV
(1) t
GLQV
(1) t
ELQX
(2) t
GLQX
(2)
Chip Enable Low to Output Valid
Output Enable Low to Output Valid
Chip Enable Low to Output Transition
Output Enable Low to Output Transition t
EHQZ
(2) t
GHQZ
(2)
Chip Enable High to Output Hi-Z
Output Enable High to Output Hi-Z t
AXQX
(1)
Address Transition to Output Transition
Notes: 1. C
L
= 100pF (see Figure 4).
2. C
L
= 5pF (see Figure 4).
70
5
5
10
70
70
35
25
25
M48T35V
-100
Min Max
100
100
100
50
10
5
50
40
10
Unit
ns ns ns ns ns ns ns ns ns
Figure 6. Read Mode AC Waveforms
A0-A14
E
G
DQ0-DQ7 tAVQV tELQV tELQX tGLQV tGLQX tAVAV
VALID
VALID tGHQZ tAXQX tEHQZ
AI00925
Note: Write Enable (W) = High
7/17
M48T35, M48T35Y, M48T35V
Table 10. Write Mode AC Characteristics
(T
A
= 0 to 70
°
C; V
CC
= 4.75V to 5.5V or 4.5V to 5.5V or 3.0V to 3.6V)
M48T35 / M48T35Y
Symbol Parameter
Min
-70
Max
M48T35V
-100
Min Max
t
AVAV t
AVWL t
AVEL t
WLWH t
ELEH t
WHAX t
EHAX t
DVWH t
DVEH
Write Cycle Time
Address Valid to Write Enable Low
Address Valid to Chip Enable Low
Write Enable Pulse Width
Chip Enable Low to Chip Enable High
Write Enable High to Address Transition
Chip Enable High to Address Transition
Input Valid to Write Enable High
Input Valid to Chip Enable High
70
0
0
50
55
0
0
30
30
80
80
10
10
50
50 t
WHDX t
EHDX t
WLQZ
(1, 2) t
AVWH
Write Enable High to Input Transition
Chip Enable High to Input Transition
Write Enable Low to Output Hi-Z
Address Valid to Write Enable High
5
5
60
25
5
5
80 t
AVEH t
WHQX
(1, 2)
Address Valid to Chip Enable High
Write Enable High to Output Transition
60
5
Notes: 1. C
L
= 5pF (see Figure 4).
2. If E goes low simultaneously with W going low, the outputs remain in the high impedance state.
80
10
100
0
0
50
Unit
DATA RETENTION MODE
With valid V
CC
applied, the M48T35/35Y/35V operates as a conventional BYTEWIDE static RAM.
Should the supply voltage decay, the RAM will automatically power-fail deselect, write protecting itself when V
CC
f alls within the V
PFD
(max),
V
PFD
(min) window. All outputs become high impedance, and all inputs are treated as "don’t care."
Note: A power failure during a write cycle may corrupt data at the currently addressed location, but does not jeopardize the rest of the RAM’s content. At voltages below V
PFD
(min), the user can be assured the memory will be in a write protected state, provided the V
CC
fall time is not less than t
F
.
The M48T35/35Y/35V may respond to transient noise spikes on V
CC
that reach into the deselect window during the time the device is sampling V
CC
.
Therefore, decoupling of the power supply lines is recommended.
When V
CC
drops below V
SO
, the control circuit switches power to the internal battery which preserves data and powers the clock. The internal bu t t o n c e l l wi l l m a in t a i n da t a in t he
M48T35/35Y/35V for an accumulated period of at least 7 years when V
CC
is less than V
SO
. As system power returns and V
CC
rises above V
SO
, the battery is disconnected, and the power supply is switched to external V
CC
. Write protection continues until
V
CC
reaches V
PFD
(min) plus t
REC
(min). E should be kept high as V
CC
rises past V
PFD
(min) to prevent inadvertent write cycles prior to processor stabilization. Normal RAM operation can resume t
REC after V
CC
exceeds V
PFD
(max).
For more information on Battery Storage Life refer to the Application Note AN1012.
ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns
8/17
M48T35, M48T35Y, M48T35V
Figure 7. Write Enable Controlled, Write AC Waveforms
A0-A14
E
W
DQ0-DQ7 tAVAV
VALID tAVWH tAVEL tWHAX tAVWL tWLQZ tWLWH tWHDX
DATA INPUT tDVWH tWHQX
AI00926
Figure 8. Chip Enable Controlled, Write AC Waveforms
A0-A14
E
W
DQ0-DQ7 tAVEL tAVWL tAVAV
VALID tAVEH tELEH tEHAX
DATA INPUT tDVEH tEHDX
AI00927
9/17
M48T35, M48T35Y, M48T35V
CLOCK OPERATIONS
Reading the Clock
Updates to the TIMEKEEPER registers should be halted before clock data is read to prevent reading data in transition. Because the BiPORT TIME-
KEEPER cells in the RAM array are only data registers, and not the actual clock counters, updating the registers can be halted without disturbing the clock itself.
Updating is halted when a ’1’ is written to the READ bit, D6 in the Control Register 7FF8h. As long as a
’1’ remains in that position, updating is halted.
After a halt is issued, the registers reflect the count; that is, the day, date, and the time that were current at the moment the halt command was issued.
All of the TIMEKEEPER registers are updated simultaneously. A halt will not interrupt an update in progress. Updating is within a second after the bit is reset to a ’0’.
Setting the Clock
Bit D7 of the Control Register 7FF8h is the WRITE bit. Setting the WRITE bit to a ’1’, like the READ bit, halts updates to the TIMEKEEPER registers. The user can then load them with the correct day, date, and time data in 24 hour BCD format (see Table
11). Resetting the WRITE bit to a ’0’ then transfers the values of all time registers 7FF9h-7FFFh to the actual TIMEKEEPER counters and allows normal operation to resume. The FT bit and the bits marked as ’0’ in Table 11 must be written to ’0’ to allow for normal TIMEKEEPER and RAM operation. After the WRITE bit is reset, the next clock update will occur in approximately one second.
See the Application Note AN923 "TIMEKEEPER rolling into the 21st century" on the ST Web site for information on Century Rollover.
Stopping and Starting the Oscillator
The oscillator may be stopped at any time. If the device is going to spend a significant amount of time on the shelf, the oscillator can be turned off to minimize current drain on the battery. The STOP bit is the MSB of the seconds register. Setting it to a ’1’ stops the oscillator. The M48T35/35Y/35V is shipped from STMicroelectronics with the STOP bit s et t o a ’ 1 ’. W h en r e s e t t o a ’ 0’, t he
M48T35/35Y/35V oscillator starts within 1 second.
Calibrating the Clock
The M48T35/35Y/35V is driven by a quartz controlled oscillator with a nominal frequency of 32,768
Hz. The devices are tested not to exceed 35 ppm
(parts per million) oscillator frequency error at
25
°
C, which equates to about
±
1.53 minutes per month. With the calibration bits properly set, the accuracy of each M48T35/35Y/35V improves to better than
±
4 ppm at 25
°
C.
Table 11. Register Map
Address
Data
Function/Range
BCD Format
D7 D6 D5 D4 D3 D2 D1 D0
7FFFh
7FFEh 0
0
0
10 Years
0
0
10 M.
10 Date
Year
Month
Year
Month
00-99
01-12
7FFDh
7FFCh
Date Date
Century/Day
01-31
0-1/01-07 0
0
FT
0
CEB CB
10 Hours
0
Hours
Day
7FFBh
7FFAh
Hour
Minutes
00-23
00-59 0
ST
10 Minutes
10 Seconds
Minutes
Seconds 7FF9h Seconds 00-59
7FF8h W R S Calibration Control
Keys: S = SIGN Bit
FT = FREQUENCY TEST Bit (Must be set to ’0’ upon power, for normal clock operation)
R = READ Bit
W = WRITE Bit
ST = STOP Bit
CEB= CENTURY ENABLE Bit
CB = CENTURY Bit
0 = Must be set to ’0’
Note: When CEB is set to ’1’, CB will toggle from ’0’ to ’1’ or from ’1’ to ’0’ at the turn of the century (dependent upon the initial value set).
When CEB is set to ’0’, CB will not toggle.
The WRITE Bit does not need to be set to write to CEB and CE.
10/17
M48T35, M48T35Y, M48T35V
The oscillation rate of any crystal changes with temperature (see Figure 10). Most clock chips compensate for crystal frequency and temperature shift error with cumbersome trim capacitors. The
M48T35/35Y/35V design, however, employs periodic counter correction. The calibration circuit adds or subtracts counts from the oscillator divider circuit at the divide by 256 stage, as shown in Figure 9.
The number of times pulses are blanked (subtracted, negative calibration) or split (added, positive calibration) depends upon the value loaded into the five Calibration bits found in the Control
Register. Adding counts speeds the clock up, subtracting counts slows the clock down.
The Calibration byte occupies the five lower order bits (D4-D0) in the Control Register 7FF8h. These bits can be set to represent any value between 0 and 31 in binary form. Bit D5 is a Sign bit; ’1’ indicates positive calibration, ’0’ indicates negative calibration. Calibration occurs within a 64 minute cycle. The first 62 minutes in the cycle may, once per minute, have one second either shortened by
128 or lengthened by 256 oscillator cycles. If a binary ’1’ is loaded into the register, only the first 2 minutes in the 64 minute cycle will be modified; if a binary 6 is loaded, the first 12 will be affected, and so on.
Therefore, each calibration step has the effect of adding 512 or subtracting 256 oscillator cycles for every 125,829,120 actual oscillator cycles; that is,
+4.068 or -2.034 ppm of adjustment per calibration step in the calibration register. Assuming that the oscillator is in fact running at exactly 32,768 Hz, each of the 31 increments in the Calibration byte would represent +10.7 or - 5.35 seconds per month which corresponds to a total range of +5.5 or - 2.75
minutes per month.
Figure 9. Clock Calibration
Two methods are available for ascertaining how much calibration a given M48T35/35Y/35V may require. The first involves simply setting the clock, letting it run for a month and comparing it to a known accurate reference (like WWV broadcasts).
While that may seem crude, it allows the designer to give the end user the ability to calibrate his clock as his environment may require, even after the final product is packaged in a non-user serviceable enclosure.
All the designer has to do is provide a simple utility that accesses the Calibration byte.
The second approach is better suited to a manufacturing environment, and involves the use of some test equipment. When the Frequency Test
(FT) bit, the seventh-most significant bit in the Day
Register is set to a ’1’, and D7 of the Seconds
Register is a ’0’ (Oscillator Running), DQ0 will toggle at 512Hz during a read of the Seconds
Register. Any deviation from 512 Hz indicates the degree and direction of oscillator frequency shift at the test temperature. For example, a reading of
512.01024 Hz would indicate a +20 PPM oscillator frequency error, requiring a -10 (WR001010) to be loaded into the Calibration Byte for correction. Note that setting or changing the Calibration Byte does not affect the Frequency test output frequency.
The FT bit MUST be reset to ’0’ in order to read the seconds register. A valid read mode (G and E enabled, W disabled) must be set in order to see the 512Hz signal on DQ6. The FT bit is automatically Reset on power-up.
For more information on calibration, see the Application Note AN934 "TIMEKEEPER Calibration".
NORMAL
POSITIVE
CALIBRATION
NEGATIVE
CALIBRATION
AI00594B
11/17
M48T35, M48T35Y, M48T35V
Figure 10. Crystal Accuracy Across Temperature
ppm
20
0
-20
-40
-60
-80
∆
F = -0.038
F ppm
C
2
(T - T
0
)
2 ±
10%
T
0
= 25
°
C
-100
0 5 10 15 20 25 30 35 40 45 50 55 60 65 70
AI02124
°
C
Figure 11. Supply Voltage Protection
VCC
0.1
µ
F
VCC
DEVICE
VSS
AI02169
POWER ON DEFAULTS
Upon application of power to the device, the following register bits are set to a ’0’ state: FT, W, R.
POWER SUPPLY DECOUPLING and UNDER-
SHOOT PROTECTION
I
CC
transients, including those produced by output switching, can produce voltage fluctuations, resulting in spikes on the V
CC
bus. These transients can be reduced if capacitors are used to store energy, which stabilizes the V
CC
bus. The energy stored in the bypass capacitors will be released as low going spikes are generated or energy will be absorbed when overshoots occur. A ceramic bypass capacitor value of 0.1
µ
F (as shown in Figure 11) is recommended in order to provide the needed filtering.
In addition to transients that are caused by normal
SRAM operation, power cycling can generate negative voltage spikes on V
CC
that drive it to values below V
SS
by as much as one Volt. These negative spikes can cause data corruption in the
SRAM while in battery backup mode. To protect from these voltage spikes, it is recommeded to connect a schottky diode from V
CC
to V
SS
(cathode connected to V
CC
, anode to V
SS
). Schottky diode
1N5817 is recommended for through hole and
MBRS120T3 is recommended for surface mount.
12/17
ORDERING INFORMATION SCHEME
Example: M48T35Y -70 MH 1 TR
M48T35, M48T35Y, M48T35V
Supply Voltage and Write
Protect Voltage
35
(1)
V
CC
= 4.75V to 5.5V
V
PFD
= 4.5V to 4.75V
35Y V
CC
= 4.5V to 5.5V
V
PFD
= 4.2V to 4.5V
35V V
CC
= 3.0V to 3.6V
V
PFD
= 2.7V to 3.0V
Speed Package
-70 70ns
(M48T35/Y)
-10 100ns
(M48T35V)
PC PCDIP28
MH
(2)
SOH28
Temp.Range
1 0 to 70
°
C
Shipping Method for SOIC
blank Tubes
TR Tape & Reel
Notes: 1. The M48T35 part is offered with the PCDIP28 (i.e. CAPHAT) package only.
2. The SOIC package (SOH28) requires the battery/crystal package (SNAPHAT) which is ordered separately under the part number
"M4T28-BR12SH1" in plastic tube or "M4T28-BR12SH1TR" in Tape & Reel form.
Caution: Do not place the SNAPHAT battery/crystal package "M4T28-BR12SH1" in conductive foam since this will drain the lithium button-cell battery.
For a list of available options (Speed, Package, etc...) or for further information on any aspect of this device, please contact the STMicroelectronics Sales Office nearest to you.
13/17
Symb
C
D
E e1 e3 eA
L
N
A
A1
A2
B
B1
M48T35, M48T35Y, M48T35V
PCDIP28 - 28 pin Plastic DIP, battery CAPHAT
Typ mm
Min
8.89
0.38
8.38
0.38
1.14
0.20
39.37
17.83
2.29
29.72
15.24
3.05
28
Max
9.65
0.76
8.89
0.53
1.78
0.31
39.88
18.34
2.79
36.32
16.00
3.81
Typ inches
Min
0.350
0.015
0.330
0.015
0.045
0.008
1.550
0.702
0.090
1.170
0.600
0.120
28
Max
0.380
0.030
0.350
0.021
0.070
0.012
1.570
0.722
0.110
1.430
0.630
0.150
Drawing is not to scale.
14/17
B1
N
1 e3
B
D
A2 A
A1 e1
L
E eA
C
PCDIP
M48T35, M48T35Y, M48T35V
Symb
D
E e eB
H
L
α
N
CP
A
A1
A2
B
C
SOH28 - 28 lead Plastic Small Outline, battery SNAPHAT
Typ mm
Min Typ inches
Min
1.27
0.05
2.34
0.36
0.15
17.71
8.23
–
3.20
11.51
0.41
0
°
28
Max
3.05
0.36
2.69
0.51
0.32
18.49
8.89
–
3.61
12.70
1.27
8
°
0.10
0.050
0.002
0.092
0.014
0.006
0.697
0.324
–
0.126
0.453
0.016
0
°
28
Max
0.120
0.014
0.106
0.020
0.012
0.728
0.350
–
0.142
0.500
0.050
8
°
0.004
B e
N
D
A2
CP
E H
1
SOH
Drawing is not to scale.
A eB
A1
α
L
C
15/17
M48T35, M48T35Y, M48T35V
Symb
D
E eA eB
L
A
A1
A2
A3
B
SH - SNAPHAT Housing for 28 lead Plastic Small Outline
Typ mm
Min Typ inches
Min
6.73
6.48
0.46
21.21
14.22
15.55
3.20
2.03
Max
9.78
7.24
6.99
0.38
0.56
21.84
14.99
15.95
3.61
2.29
0.265
0.255
0.018
0.835
0.560
0.612
0.126
0.080
Max
0.385
0.285
0.275
0.015
0.022
0.860
0.590
0.628
0.142
0.090
Drawing is not to scale.
16/17 eA
D
A1
A
B eB
A3
A2
L
E
SH
M48T35, M48T35Y, M48T35V
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics
© 1998 STMicroelectronics - All Rights Reserved
® TIMEKEEPER and SNAPHAT are registered trademarks of STMicroelectronics
CAPHAT, BYTEWIDE and BiPORT are trademarks of STMicroelectronics
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - Canada - China - France - Germany - Italy - Japan - Korea - Malaysia - Malta - Mexico - Morocco - The Netherlands -
Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A.
17/17
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