13.38.2 Device Attribute Data Structure. Hitachi IC25N080ATMR04, IC25N040ATMR04-0 - Travelstar 40GB Laptop Hard Drive 9.5mm 2.5 Inch Notebook HDD, IC25N080ATMR04-0 - 3E034 - Dell 80GB Laptop Hard Drive, Travelstar 80GN, IC25N020ATMR04, 08K0910, IC25N040ATMR04, IC25N060ATMR04, IC25N030ATMR04

13.38.2 Device Attribute Data Structure

The following defines the 512 bytes that make up the Attribute Value information. This data structure is accessed by the host in its entirety using the S.M.A.R.T. Read Attribute Values subcommand. All multibyte fields shown in these data structures follow the ATA/ATAPI-5 specification for byte ordering, namely, that the least significant byte occupies the lowest numbered byte address location in the field.

Table 113: Device Attribute Data Structure

Description

Data Structure Revision Number

1st Device Attribute

30th Device Attribute

Off-line data collection status

Self-test execution status

Total time in seconds to complete off-line data collection activity

Current segment pointer

Off-line data collection capability

S.M.A.R.T. capability

S.M.A.R.T. device error logging capability

Self-test failure check point

Short self-test completion time in minutes

Extended self-test completion time in minutes

Reserved

Vendor specific

Data structure checksum

Byte

2

12

12

1

1

2

1

1

1

12

2

1

1

1

125

1

512

Offset

00h

02h

15Eh

16Ah

16Bh

16Ch

16Eh

16Fh

170h

172h

173h

174h

175h

176h

182h

1FFh

Format binary

(*1)

(*1)

(*1)

(*1)

(*1)

(*1)

(*1)

(*1)

(*1)

(*1)

(*1)

(*1)

(*1)

Value

0010h

(*2)

(*2)

(*2)

(*2)

(*2)

(*2)

1Bh

0003h

01h

(*2)

(*2)

(*2)

(*3)

(*3)

(*2)

(*1) – See following definitions

(*2) – This value varies due to actual operating condition.

(*3) – Filled with 00h.

13.38.2.1 Data Structure Revision Number

The Data Structure Revision Number identifies which version of this data structure is implemented by the device.

This revision number will be set to 0005h. This revision number identifies both the Attribute Value and Attribute

Threshold Data structures.

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13.38.2.2 Individual Attribute Data Structure

The following defines the 12 bytes that make up the information for each Attribute entry in the Device Attribute

Data Structure.

Description

Attribute ID Number (01h to FFh)

Status Flags

Bit 0 Pre-Failure/Advisory

Bit 1 On-line Collection

Bit 2-5 Reserved (may be either 0 or 1)

Bit 6-15 Reserved (all 0)

Attribute Value (valid values from 01h to FEh)

00h invalid for attribute value -not to be used

01h minimum value

64h initial value for all attributes prior to any data collection

FDh maximum value

FEh value is not valid

FFh invalid for attribute value-not to be used

Reserved (may not be 0)

Reserved (may not be 0)

Reserved (00h)

Total Bytes

Byte

1

2

1

1

6

1

12

Offset

00h

01h

03h

04h

05h

0Bh

Value binary bit flags binary binary binary binary

Attribute ID Numbers: Any nonzero value in the Attribute ID Number indicates an active attribute. The device supports following Attribute ID Numbers. The names marked with (*) indicate that the corresponding Attribute

Values can be either collected on-line or off-line.

ID

9

10

12

191

192

193

194

196

197

198

199

7

8

4

5

2

3

0

1

Attribute Name

Indicates that this entry in the data structure is not used

Raw Read Error Rate (*)

Throughput Performance (*)

Spin Up Time

Start/Stop Count

Reallocated Sector Count

Seek Error Rate

Seek Time Performance (*)

Power-On Hours Count

Spin Retry Count

Device Power Cycle Count

Gsense Error Rate

Power Off Retract Count

Load/Unload Cycle Count

Device Temperature

Reallocation Event Count

Current Pending Sector Count

Off-Line Scan Uncorrectable Sector Count

Ultra DMA CRC Error Count

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Table 114: Status Flag definitions

Bit Flag Name

0 Pre-Failure/

Advisory bit

Definition

If bit = 0, an Attribute Value less than or equal to its corresponding Attribute Threshold indicates an Advisory condition where the usage or age of the device has exceeded its intended design life period.

If bit = 1, an Attribute Value less than or equal to its corresponding Attribute Threshold indicates a Pre-Failure condition where imminent loss of data is being predicted.

1 On-Line Collective bit

If bit = 0, the Attribute Value is updated only during

Off-Line testing.

2-5

6-15

Reserved bits

Reserved bits

If bit = 1, the Attribute Value is updated during On-

Line testing or during both On-Line and Off-Line testing.

May either be 0 or 1

Always 0

Normalized values: The device will perform conversion of the raw Attribute Values to transform them into normalized values which the host can then compare with the Threshold values. A Threshold is the excursion limit for a normalized Attribute Value. In normalizing the raw data, the device will perform any necessary statistical validity checks to ensure that an instantaneous raw value is not improperly reflected in the normalized Attribute Value (i.e., one read error in the first 10 reads being interpreted as exceeding the read error rate threshold when the subsequent

1 billion reads all execute without error). The end points for the normalized values for all Attributes will be 1 (01h) at the low end and 100 (64h) at the high end for the device. For Performance and Error Rate Attributes, values greater than 100 are also possible. The maximum value possible is 253 (FDh).

13.38.2.3 Off-Line Data Collection Status

The value of this byte defines the current status of the off-line activities of the device. Bit 7 indicates an Automatic

Off-line Data Collection Status.

Bit 7 Automatic Off-line Data Collection Status

0 Automatic Off-line Data Collection is disabled.

1 Automatic Off-line Data Collection is enabled.

Bits 0–6 represent a hexadecimal status value reported by the device.

Value Definition

0 Off-line data collection never started.

2 All segments completed without errors. In this case the current segment pointer is equal to the total segments required.

4 Off-line data collection is suspended by the interrupting command.

5 Off-line data collecting is aborted by the interrupting command.

6 Off-line data collection is aborted with a fatal error.

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13.38.2.4 Self-test execution status

Bit

0-3

4-7

Definition

Percent Self-test remaining. An approximation of the percent of the self-test routine remaining until completion given in ten percent increments. Valid values are 0 through 9.

Current Self-test execution status.

0 The self-test routine completed without error or has never been run.

1 The self-test routine was aborted by the host.

2 The self-test routine was interrupted by the host with a hard or soft reset.

3 The device was unable to complete the self-test routine due to a fatal error or unknown test error.

4 The self-test routine was completed with an unknown element failure.

5 The self-test routine was completed with an electrical element failure.

6 The self-test routine was completed with a servo element failure.

7 The self-test routine was completed with a read element failure.

15 The self-test routine is in progress.

13.38.2.5 Total time in seconds to complete off-line data collection activity

This field tells the host how many seconds the device requires to complete the off-line data collection activity.

13.38.2.6 Current segment pointer

This byte is a counter indicating the next segment to execute as an off-line data collection activity. Because the number of segments is 1, 01h is always returned in this field.

13.38.2.7 Off-line data collection capability

Bit

0

Definition

Execute Off-line Immediate implemented bit

0 S.M.A.R.T. Execute Off-line Immediate subcommand is not implemented

1 S.M.A.R.T. Execute Off-line Immediate subcommand is implemented

1 Enable/disable Automatic Off-line implemented bit

0 S.M.A.R.T. Enable/disable Automatic Off-line subcommand is not implemented

2

1 S.M.A.R.T. Enable/disable Automatic Off-line subcommand is implemented

Abort/restart off-line by host bit

0 The device will suspend off-line data collection activity after an interrupting command and resume it after a vendor specific event

1 The device will abort off-line data collection activity upon receipt of a new command

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3 Off-line Read Scanning implemented bit

0 The device does not support Off-line Read Scanning

1 The device supports Off-line Read Scanning

4 Self-test implemented bit

0 Self-test routing is not implemented

1 Self-test routine is implemented

5-7 Reserved (0)

13.38.2.8 S.M.A.R.T. Capability

This word of bit flags describes the S.M.A.R.T. capabilities of the device. The device will return 03h indicating that the device will save its Attribute Values prior to going into a power saving mode and supports the S.M.A.R.T.

ENABLE/DISABLE ATTRIBUTE AUTOSAVE command.

Bit Definition

0 Pre-power mode attribute saving capability. If bit = 1, the device will save its Attribute Values prior to going into a power saving mode (Standby or Sleep mode).

1 Attribute auto save capability. If bit = 1, the device supports the S.M.A.R.T. ENABLE/ DISABLE

ATTRIBUTE AUTOSAVE command.

2-15 Reserved (0)

13.38.2.9 Error logging capability

Bit Definition

7-1 Reserved (0)

0 The Error Logging support bit. If bit = 1, the device supports the Error Logging

13.38.2.10 Self-test failure check point

This byte indicates the section of self-test where the device detected a failure.

13.38.2.11 Self-test completion time

These bytes are the minimum time in minutes to complete the self-test.

13.38.2.12 Data Structure Checksum

The Data Structure Checksum is the 2's compliment of the result of a simple 8-bit addition of the first 511 bytes in the data structure.

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