Index. NI LabVIEW Data Acquisition Basics

Index

A

ACK (Acknowledge) line, 15-2

ACK (Acknowledge Input) line, 15-2

Acquire & Proc N Scans-Trig example VI,

8-6, 8-10

Acquire & Process N Scans VI, 7-11

Acquire and Average VI, 19-6 to 19-7

Acquire N-multi-ATrig example VI, 8-10

Acquire N-multi-DTrig example VI, 8-6

Acquire N-multi-Start example VI, 7-7

Acquire N Scans-ATrig example VI, 8-7 to

8-8, 8-10, 8-12 to 8-13

Acquire N Scans-DTrig example VI, 8-3 to

8-4, 8-6

Acquire N Scans example VI, 7-6

Acquire N Scans-SWTrig example VI, 8-13 acquisition rate. See external control of acquisition rate.

ADC limit settings effects (figure), 5-6 measurement precision for various device ranges and limit settings (table), 5-8 range effects (figure), 5-5 resolution, 5-3 to 5-4 effects on precision (figure), 5-4 adjacent counters for counter chips (table),

25-2 to 25-3

Advanced VIs. See also VIs.

analog output SCXI example, 19-14 to 19-15 external control of channel clock, 9-4 non-buffered handshaking, 15-5 overview, 3-6 simple buffered handshaking, 15-7 to 15-9

AI Acquire Waveform VI simple-buffered analog input with multiple starts, 7-7 to 7-9 single-waveform acquisition, 7-2 to 7-3

AI Acquire Waveforms VI multiple-waveform acquisition, 7-3 simple-buffered analog input with graphing, 7-6 to 7-7

AI Clear VI continuous acquisition from multiple channels, 7-12 to 7-13 hardware-timed analog I/O control loops, 6-9 multiple-waveform acquisition, 7-5

SCXI temperature measurement, 19-6 to 19-7 simple-buffered analog input with multiple starts, 7-7 to 7-9

AI Clock Config VI external control of channel clock, 9-4 external conversion pulses, 9-4 scan clock control, 9-6 to 9-7

AI Config VI basic circular-buffered analog input,

7-13 to 7-14 basic non-buffered application, 6-4 hardware-timed analog I/O control loops, 6-8 interchannel delay, 9-2 multiple-channel single-point analog input, 6-5 multiple-waveform acquisition, 7-5 one-point calibration, 20-5 simple-buffered analog input with multiple starts, 7-7 to 7-9

AI Continuous Scan VI, 7-11 to 7-12

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National Instruments Corporation Index -1 LabVIEW Data Acquisition Basics Manual

This document was created with FrameMaker 4.0.4

Index

AI Read One Scan VI, 6-7

AI Read VI advantages and disadvantages of reading backlog, A-1 basic circular-buffered analog input, 7-13 to 7-14 conditional retrieval cluster, 8-11 to 8-12 continuous acquisition from multiple channels, 7-12 to 7-13 controlling startup times (note), 7-8 multiple-waveform acquisition, 7-5 one-point calibration, 20-5 scan clock control, 9-7


AI Sample Channel VI multiple-channel single-point analog input, 6-3 single-channel single-point analog input,

6-1 to 6-2

AI Single Scan VI basic non-buffered application, 6-4 hardware-timed analog I/O control loops,

6-8 to 6-9 improving control loop performance, 6-9 to 6-10 multiple-channel single-point analog input, 6-4 one-point calibration, 20-5 software-timed analog I/O control loops, 6-6

AI Start VI basic circular-buffered analog input, 7-13 to 7-14 continuous acquisition from multiple channels, 7-12 to 7-13 hardware-timed analog I/O control loops, 6-9 multiple-waveform acquisition, 7-5 one-point calibration, 20-5

LabVIEW Data Acquisition Basics Manual Index -20 scan clock control, 9-6 to 9-7


AI Waveform Scan VI analog triggering examples, 8-7 to 8-8 conditional retrieval examples, 8-12 to 8-14 multiple-waveform acquisition, 7-4 amplification increasing signal-to-noise ratio

(figure), 16-4 methods for minimizing noise

(note), 16-4 amplifier offset, reading, 19-4 to 19-5

AMUX-64T devices addressing with MIO boards, A-1 analog input channel range (figure), 5-13 channel addressing with AMUX-64T,

5-12 to 5-13 scanning order for DAQ devices, 5-13 to 5-17 four AMUX-64Ts (table), 5-16 one or two AMUX-64Ts

(table), 5-15 specifying number for AMUX-64T device (table), 5-17 analog input

AMUX-64T external multiplexer device, 5-12 to 5-17 analog input/output control loops. See analog input/output control loops.

channel clock control, 9-3 to 9-5, 9-8 circular-buffered analog input examples,

7-13 to 7-15 continuous acquisition from multiple channels, 7-11 to 7-13 defining signals, 5-1 to 5-3 digital triggering, 8-2 to 8-6 external control of acquisition rate, 9-1 to 9-3

 National Instruments Corporation

Index hardware triggering, 8-1 to 8-10 measurement systems, 5-3 to 5-6 memory allocation errors (Windows), A-3 to A-4 multiple-channel single point analog input, 6-2 to 6-5 multiple waveform acquisition, 7-3 to 7-5 scan clock control, 9-5 to 9-8

SCXI application for measuring temperature (example), 19-2 to 19-5 selecting input settings, 5-6 to 5-12 calculating code width, 5-6 to 5-7 considerations for selecting, 5-6 to 5-12 differential measurement system, 5-9 to 5-10 measurement precision for various device ranges and limit settings

(table), 5-8 nonreferenced single-ended measurement system, 5-11 to 5-12 referenced single-ended measurement system, 5-10 to 5-11 signals. See analog input signals.

single-buffered analog input examples,

7-6 to 7-10 single-channel single point analog input,

6-1 to 6- to 6-2 single waveform acquisition, 7-2 to 7-3 software triggering, 8-10 to 8-14 terminology, 5-17 to 5-18 triggering, 8-6 to 8-10 analog input/output control loops, 6-6 to 6-10 hardware-timed control loops, 6-7 to 6-9 improving performance, 6-9 to 6-10 overview, 6-6 software-timed control loops, 6-6 to 6-7 analog input SCXI modules multiplexed mode, 17-4 parallel mode, 17-5



National Instruments Corporation Index -21 analog input signals choosing a measurement system, 5-3 to 5-6 choosing between analog and digital signals, 4-3 defining signals, 5-1 to 5-2 device voltage range, 5-4 to 5-5 floating signal sources, 5-3 grounded signal sources, 5-2 referenced and non-referenced, 5-2 resolution of ADC, 5-3 to 5-4 signal voltage range (limit settings), 5-5 to 5-6 types of analog signals (figure), 5-1 analog input with LabVIEW. See

AMUX-64T devices.

Analog IO Control Loop VI, 6-6 to 6-7

Analog IO Control Loop (hw timed) VI, 6-8 analog multiplexers (AMUX), 5-9. See also

AMUX-64T devices.

analog output buffered analog output overview, 10-1 to 10-2 waveform generation, 12-1 to 12-3 circular-buffered output, 12-3 to 12-5 multiple-immediate updates, 11-2 to 11-3

SCXI analog output application example, 19-14 to 19-15 single-immediate updates, 11-1 to 11-2 single-point output, 10-1 analog output SCXI modules, 17-4 analog-to-digital converter (ADC). See ADC.

analog triggering description, 8-6 to 8-7 examples, 8-7 to 8-10 anlogin DAQ example file, 3-1 anlog_io.llb DAQ example file, 3-1 anlogout.llb DAQ example file, 3-2

AO Clear VI circular-buffered output, 12-4 to 12-5 waveform generation, 12-3

LabVIEW Data Acquisition Basics Manual

Index

AO Config VI analog output SCXI example, 19-14 circular-buffered output, 12-4 to 12-5 waveform generation, 12-3

AO Continuous Gen VI, 12-3 to 12-4

AO Generate Waveforms VI, 12-1 to 12-2

AO Group Config VI, 19-14

AO Hardware Config VI, 19-14

AO Single Update VI analog output SCXI example, 19-15 calibrating SCXI modules for signal generation, 20-8

AO Start VI circular-buffered output, 12-4 to 12-5 waveform generation, 12-3

AO Update Channels VI, 11-1

AO Wait VI, 12-3

AO Waveform Gen VI, 12-2

AO Write One Update VI, 6-7 multiple-immediate updates, 11-2 to 11-3 single-immediate updates, 11-1 to 11-2

AO Write VI circular-buffered output, 12-4 to 12-5 waveform generation, 12-3 arrays transposing, 7-7 two-dimensional (2D) arrays, 3-13 to 3-16

AUTOEXEC.BAT file, 2-10

B

base address switch settings (note), 2-5 breakpoints, setting, 27-4 buffered analog input, 7-1 to 7-15 buffer overflow problems with Macintosh systems, A-5 circular-buffered analog input continuous acquisition from multiple channels, 7-11 to 7-13 determining adequate buffer capacity, A-1 examples basic circular-buffered analog input, 7-13 to 7-14

LabVIEW Data Acquisition Basics Manual Index -22

Cont Acq to File

(scaled).vi, 7-15

Cont Acq to Spreadsheet

File.vi, 7-15

Cont Acq&Chart

(buffered).vi, 7-14

Cont Acq&Graph

(buffered).vi, 7-15 overview, 7-10 to 7-11 how buffers work, 7-2 simple-buffered analog input data buffer overview, 7-1 to 7-2 examples displaying waveforms on graphs, 7-6 to 7-7 sampling with multiple starts,

7-7 to 7-9 writing to spreadsheet file, 77-9 multiple-waveform acquisition, 7-3 to 7-5 single-waveform acquisition, 7-2 to 7-3 waiting to analyze data, 7-1 to 7-2 buffered analog output choosing between single-point or multiple-point generation, 4-4 circular-buffered output, 12-3 to 12-5 eliminating errors, 12-5 overview, 10-1 to 10-2 waveform generation, 12-1 to 12-3 buffered handshaking, 15-6 to 15-10 circular buffered examples, 15-9 to 15-10 simple buffered examples, 15-7 to 15-9 bulletin board support, B-1

C

calibration. See SCXI calibration.

cascading counters, 24-3, 25-2 channel addressing

AMUX-64T devices, 5-12 to 5-13

SCXI modules, 18-1 to 18-2


Index

VI channel, port, and counter addressing,

3-9 to 3-11 channel clock, 9-3 to 9-5 channel and scan intervals using channel clock (figure), 9-2 considerations for specific boards

(notes), 9-5 controlling externally, 9-3 to 9-5 rate parameter, 5-17 setting channel clock rate, 9-3 simultaneous control of scan and channel clocks, 9-8

TTL signal (example), 9-3 circular-buffered analog input continuous acquisition from multiple channels, 7-11 to 7-13 examples basic circular-buffered analog input,

7-13 to 7-14

Cont Acq to File (scaled).vi, 7-15

Cont Acq to Spreadsheet File.vi, 7-15

Cont Acq&Chart (buffered).vi, 7-14

Cont Acq&Graph (buffered).vi, 7-15 how circular buffers work (figure), 7-10 overview, 7-10 to 7-11 circular-buffered analog output changing waveform during generation,

12-3 to 12-5 eliminating errors, 12-5 circular buffered digital I/O examples, 15-9 to 15-10 code width, calculating, 5-6 to 5-7 cold junction compensation, 19-3 to 19-4 column major order, 3-14 to 3-16 common-mode voltage definition, 5-10 illustration, 5-10 common questions about LabVIEW data acquisition, A-1 to A-5 conditional retrieval, 8-10. See also software triggering.

configuration. See installation and configuration.

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National Instruments Corporation Index -23

Cont Acq to File (scaled).vi, 7-15

Cont Acq to Spreadsheet File.vi, 7-15

Cont Acq&Chart (buffered).vi, 7-14

Cont Acq&Graph (buffered).vi, 7-15

Cont Acquire&Chart (immediate).vi, 6-4 to 6-5 continuous acquisition from multiple channels, 7-11 to 7-13

Continuous Generation example VI, 12-4

Continuous Pulse Generator Config VI,

22-6, 22-8 control loops. See analog input/output control loops.

Convert RTD Reading VI, 19-10 to 19-11

Convert Strain Gauge Reading VI, 19-13 to 19-14

Convert Thermocouple Reading VI, 19-6 to 19-7

Count Events or Time VI, 25-3 to 25-5 counter addressing for VIs, 3-9 to 3-11

Counter Read VI, 25-6 to 25-7 controlling pulse width measurement, 23-3 measuring frequency and period high frequency signals, 24-6 low frequency signals, 24-4 to 24-5

Counter Start VI, 25-6 to 25-7 controlling pulse width measurement, 23-3 dividing frequencies, 26-1 to 26-2 finite pulse train generation, 22-8 measuring frequency and period high frequency signals, 24-6 low frequency signals, 24-4 to 24-5 single square pulse generation, 22-4

Counter Stop VI controlling pulse width measurement, 23-3 counting external events, 25-6 to 25-7 dividing frequencies, 26-1 to 26-2 measuring frequency and period high frequency signals, 24-6 low frequency signals, 24-4 to 24-5


Index stopping counter generations, 22-9 counter.llb DAQ example file, 3-2 counters accuracy of counters, 22-8 to 22-9 basic functions, 21-1 to 21-4 capabilities, 21-1 choosing between counting methods, 4-5 choosing between digital or counter interfacing, 4-3 to 4-4 counter chips used in National

Instruments devices, 21-4 counting signal highs and lows, 25-1 to 25-3 dividing frequencies, 26-2 to 26-3 events or elapsed time counting, 25-1 to 25-5 frequency and period measurement, 24-1 to 24-7 connecting counters for measuring,

24-2 to 24-3 high frequency signals, 24-5 to 24-7 how and when to measure, 24-1 to 24-2 low frequency signals, 24-4 to 24-5 gaining more control over counting operations, 25-6 to 25-7 gating levels (figure), 21-3 pulse train generation, 22-5 to 22-8 continuous pulse train, 22-5 to 22-7 finite pulse train, 22-7 to 22-8 pulse width measurement, 23-1 to 23-4 controlling pulse width measurement, 23-3 determining pulse width, 23-2 to 23-3 increasing measurable width range, 23-4 square pulse generation, 22-1 to 22-5 single square pulse generation, 22-3 to 22-5 square wave generation with no counters available, 21-5 stopping counter generations, 22-9 to 22-30

LabVIEW Data Acquisition Basics Manual Index -24 timebase uncertainty, 22-8 to 22-9

CTR Control VI enabling and disabling FOUT signal, 21-5 measuring frequency and period, 24-6

CTR Mode Config VI, 21-3 current setting for VIs, 3-7 current value conventions for VIs, 3-7 customer communication, xxi , B-1 to B-2

D

daisy chaining SCXI chassis, 19-18 to 19-19

DAQ examples list of example files, 3-1 to 3-2 locations, 3-1 to 3-2

DAQ hardware. See hardware.

DAQ VIs. See VIs.

daqconf utility (UNIX), 2-19 to 2-20 daqconf.cfg file, 2-20 data acquisition. See also analog input.

analog input/output control loops, 6-6 to 6-10 basic LabVIEW data acquisition concepts, 3-1 to 3-16. See also VIs.

data organization for analog applications, 3-13 to 3-16 limit settings, 3-11 to 3-13 location of common DAQ examples, 3-1 to 3-2 buffered. See buffered analog input.

common questions about LabVIEW data acquisition, A-1 to A-5 important terms, 5-17 multiple-channel single-point, 6-2 to 6-5 single-channel single-point, 6-1 to 6-2 triggered. See triggered data acquisition.

data acquisition hardware. See hardware.

Data Acquisition palette, 3-4 data organization for analog applications,

3-13 to 3-16 column major order, 3-14 to 3-16


Index row major order, 3-14 two-dimensional (2D) arrays, 3-13 to 3-16 data types for LabVIEW, xx debugging VIs, 27-1 to 27-4 error handling, 27-2 to 27-3 execution highlighting, 27-3 to 27-4 hardware connection errors, 27-1 setting breakpoints and showing advanced

DAQ VIs, 27-4 single-stepping through VIs, 27-3 software configuration errors, 27-1 to 27-2 using Probe tool, 27-4

VI construction errors, 27-2 to 27-4 default input for VIs, 3-7 default setting for VIs, 3-7

Delayed Pulse Generator Config VI finite pulse train generation, 22-8 measuring frequency and period, 24-6 single square pulse generation, 22-4 delays for improving control loop performance, 6-9 to 6-10 device voltage range, 5-4 to 5-5 considerations for selecting analog input settings, 5-6 to 5-8 description, 5-4 to 5-5 effect on ADC precision (figure), 5-5 measurement precision for various device ranges and limit settings (table), 5-8 differential measurement system, 5-9 to 5-10 channel differential system (figure), 5-9 common mode voltage (figure), 5-10 when to use, 5-10 digital and relay SCXI modules, 17-5

Digital Buffered Handshaking VI, 15-7

Digital Clock Config VI, 15-7 to 15-8 digital DAQ example file, 3-2 digital I/O buffered handshaking, 15-6 to 15-10 choosing between digital or counter interfacing, 4-3 to 4-4 choosing between non-latched or latched digital I/O, 4-5



National Instruments Corporation Index -25 handshaking (latched) digital I/O, 15-1 to 15-2 immediate (non-latched) digital I/O,

14-1 to 14-3 non-buffered handshaking, 15-5 to 15-6 overview, 13-1 to 13-2

SCXI application examples digital input, 19-15 to 19-16 digital output, 19-16 to 19-18 sending out multiple digital values, 15-2 to 15-5

Digital Mode Config VI, 15-8 digital ports and lines, 13-1 digital SCXI modules, 17-6 digital triggering definition, 8-2 description, 8-2 to 8-3 examples, 8-3 to 8-6

DIO Buffer Control VI, 15-7 to 15-9

DIO Clear VI, 15-7

DIO Config VI, 15-8

DIO Group Config VI, 15-5

DIO Port Config VI digital input application example, 19-16 immediate digital I/O, 14-2

DIO Single Read/Write VI, 15-5 to 15-6

DIO Start VI, 15-7 to 15-8

DIO Wait VI, 15-7

Divide Config VI, 26-1 to 26-2 dividing frequencies. See frequency division.

DMA jumper settings (note), 2-5 documentation conventions used in manual, xviii xx flowchart for finding information, 4-2 how to use this book, 1-1 to 1-3 organization of manual, xvii xviii related documentation, xxi down counter, 26-1

Down Counter VI, 26-1 to 26-2


Index

E

e-mail support, B-2

Easy VIs. See also VIs.

addressing OUT and IN pins on DIO-32F board, A-2 continuous pulse train generation, 22-6 counting events or elapsed time, 25-3 to 25-5 digital input application, 19-15 digital output application, 19-16 to 19-18 finite pulse train generation, 22-7 grouping two or more ports, A-2 immediate digital I/O, 14-1 to 14-2 limitations, 6-3 measuring frequency and period high frequency signals, 24-5 to 24-6 low frequency signals, 24-4 multiple-channel single-point analog input, 6-3 multiple-immediate updates, 11-2 to 11-3 multiple-waveform acquisition, 7-3 overview, 3-5 single-channel single-point analog input,

6-1 to 6-2 single-immediate updates, 11-1 to 11-2 single square pulse generation, 22-4 single-waveform acquisition, 7-2 to 7-3 strain gauge application, 19-13 waveform generation, 12-1 to 12-2 edges of signals, 21-2

EEPROM for storing calibration constants,

20-1 to 20-3 default load area, 20-2 factory area, 20-2 user area, 20-2 to 20-3 elapsed time counting. See events or elapsed time counting.

electronic support services, B-1 to B-2

Error Handler VIs, 27-2 error handling debugging VIs, 27-2 to 27-3

VIs, 3-8 to 3-9

Event or Time Counter Config VI

LabVIEW Data Acquisition Basics Manual Index -26 counting external events, 25-6 to 25-7 measuring frequency and period, 24-6 events or elapsed time counting, 25-1 to 25-5 adjacent counters for counter chips

(table), 25-2 to 25-3 cascading counters, 25-2 connecting counters to device

(figure), 25-1 counting events or elapsed time, 25-3 to 25-5 gaining more control over counting operations, 25-6 to 25-7 overview, 25-1 to 25-3 execution highlighting, 27-3 to 27-4 external control of acquisition rate, 9-1 to 9-8 channel and scan intervals using channel clock (figure), 9-2 channel clock control, 9-3 to 9-5 choosing between triggering and external clock control, 4-4 description, 9-1 to 9-3 round-robin scanning (figure), 9-2 scan clock control, 9-5 to 9-8 simultaneous control of scan and channel clocks, 9-8 external conversion pulses, 9-4 to 9-5

F

faxback support, B-2 filtering, 16-5 floating signal sources, 5-3

FOUT output, 21-5, 23-4

FREQ_OUT output, 21-5, 23-4 frequency and period measurement, 24-1 to 24-7 cascading counters, 24-3 connecting counters for measuring, 24-2 to 24-3 equation for obtaining measurements, 24-2 high frequency signals, 24-5 to 24-7 how and when to measure, 24-1 to 24-2 low frequency signals, 24-4 to 24-5


Index physical connections for period measurement high frequency signals (figure), 24-3 low frequency signals (figure), 24-3 square wave period measurement

(figure), 24-2 frequency division, 26-1 to 26-3

FTP support, B-1

Function Generator VI, 12-5

Functions palette illustration, 3-3 locating VIs, 3-2 to 3-4

G

gain, definition, 3-13 gains (SCXI) description, 18-2 to 18-4

SCXI-1100 channel arrays, input limits array, and gains (table), 18-4

GATE input, 21-2 to 21-3 gating levels (figure), 21-3

GATE input pin, 21-2

General Error Handler VI, 27-2 to 27-3

Generate Continuous Sinewave VI, 12-3

Generate Delayed Pulse VI single square pulse generation, 22-4 stopping counter generations, 22-9

Generate N Updates example VI, 12-2

Generate Pulse Train VI continuous pulse train generation, 22-6 finite pulse train generation, 22-7 to 22-8 stopping counter generations, 22-9 to 22-10

Get DAQ Device Information VI, 2-1

Getting Started Analog Input example VI channel clock control, 9-3 to 9-4 reading amplifier offset, 19-4 to 19-5 reading channels from different SCXI chassis, 19-19 scan clock control, 9-6 to 9-7 temperature sensor, 19-3

Getting Started Counters VI, 25-3

Getting Started Digital I/O VI, 14-1 to 14-2



National Instruments Corporation Index -27 graphing simple-buffered analog input

(example), 7-6 to 7-7 grounded signal sources, 5-2

H

handshaking (latched) digital I/O, 15-1 to 15-10 buffered handshaking, 15-6 to 15-10 circular buffered examples, 15-9 to 15-10 simple buffered examples, 15-7 to 15-9 connecting signal lines digital input (figure), 15-3 digital output (figure), 15-4

DAQ devices supporting digital handshaking, 15-1 grouping ports for DIO-32F devices

(note), 15-4 non-buffered handshaking, 15-5 to 15-6 overview, 15-1 to 15-2 sending out multiple digital values, 15-2 to 15-5 hardware. See also installation and configuration.

debugging connection errors, 27-1

LabVIEW data acquisition hardware support

Macintosh systems (table), 2-5

Windows environment (table), 2-4 relationship between LabVIEW,

NI-DAQ, and DAQ hardware

(figure), 2-3 hardware-timed analog input/output control loops, 6-7 to 6-9 hardware triggering, 8-1 to 8-10 analog description, 8-6 to 8-7 examples, 8-7 to 8-10 digital description, 8-2 to 8-3 examples, 8-3 to 8-6 overview, 8-1


Index

How to Count VI, 25-3

How to Generate Pulses and Pulse Trains VI dividing frequencies, 26-1 generating pulse train, 22-5 to 22-6 generating single square pulse, 22-3

How to Measure Frequency and period

VI, 24-3

I

IBF (Input Buffer Full) line, 15-2 immediate digital I/O, 14-1 to 14-3 immediate updates multiple, 11-2 to 11-3 single, 11-1 to 11-2 initialization of data acquisition boards, A-3

Input Buffer Full (IBF) line, 15-2 input range, and input setting selection, 5-6 to 5-8 installation and configuration debugging software configuration errors,

27-1 to 27-2 installing and configuring DAQ devices

(figure), 2-2

LabVIEW data acquisition hardware support


Windows environment (table), 2-4

Macintosh systems, 2-16 to 2-18

National Instruments devices, 2-5 relationship between LabVIEW,


(figure), 2-3

SCXI chassis hardware configuration, 2-20 to 2-21 software configuration


Windows environment, 2-21 to 2-25

UNIX operating systems, 2-18 to 2-20

Windows environment changing I/O page lock limit, 2-14 to 2-15

EISA bus computers, 2-9

LabVIEW Data Acquisition Basics Manual Index -28 inserting PCMCIA cards (note), 2-5

ISA and PCMCIA bus computers,

2-6 to 2-9

LabVIEW for Windows NT, 2-14 to 2-15 multiple DAQ devices (note), 2-5

Plug and Play (switchless) DAQ devices, 2-10

Plug and Play software, 2-10 to 2-11 user privilege level, 2-15

WDAQCONF utility, 2-11 to 2-14

Intermediate VIs. See also VIs.

advantages, 6-4 to 6-5 circular-buffered output, 12-3 to 12-5 continuous acquisition from multiple channels, 7-11 to 7-13 continuous pulse train generation, 22-6 to 22-7 controlling pulse width measurement, 23-3 counting events or elapsed time, 25-6 to 25-7 dividing frequencies, 26-1 to 26-2 finite pulse train generation, 22-7 to 22-8 measuring frequency and period high frequency signals, 24-6 low frequency signals, 24-4 to 24-5 multiple-channel single-point analog input, 6-3 multiple-waveform acquisition, 7-4 to 7-5 non-buffered handshaking, 15-5 to 15-6 overview, 3-5 to 3-6

SCXI temperature measurement examples, 19-6 to 19-9 simple buffered handshaking, 15-7 single-immediate updates, 11-1 to 11-2 single square pulse generation, 22-4 to 22-5 strain gauge application, 19-13 waveform generation, 12-2 to 12-3 interval scanning, 5-17

I/O page lock limit, changing, 2-14 to 2-15


IRQ jumper settings (note), 2-5

ISA bus computers, configuring, 2-6 to 2-9 isolation of transducer signals, 16-4

J

jumper settings, 2-5, 2-13

L

LabVIEW software basic LABVIEW data acquisition concepts, 3-1 to 3-16. See also VIs.

data organization for analog applications, 3-13 to 3-16 location of common DAQ examples,

3-1 to 3-2 common questions about LabVIEW, A-1 to A-5 data acquisition hardware support


Windows environment (table), 2-4 data types, xx relationship between LabVIEW,


(figure), 2-3

Windows NT considerations, 2-14 to 2-15 changing I/O page lock limit, 2-14 to 2-15 user privilege level, 2-15 latched digital I/O. See handshaking (latched) digital I/O.

limit settings, 5-5 to 5-6 considerations for selecting analog input settings, 5-6 to 5-8 description, 5-5 to 5-6 effect on ADC precision (figure), 5-6 measurement precision for various device ranges and limit settings (table), 5-8

SCXI gains, 18-2 to 18-4

VI limit settings, 3-11 to 3-13 linearizing voltage levels, 16-5

Index

M

Macintosh systems configuring DAQ devices, 2-16 to 2-18

NI-DAQ drivers, 2-3 questions and answers, A-5

SCXI chassis hardware configuration, 2-20 to 2-21 software configuration, 2-25 to 2-27 manual. See documentation.

maximum sampling rate per channel, 7-5

Measure Frequency VI, 24-5 to 24-6

Measure Pulse Width or Period VI determining pulse width, 23-2 to 23-3 measuring frequency and period, 24-4 measurement system choosing, 5-3 to 5-6 differential measurement system, 5-9 to 5-10 nonreferenced single-ended measurement system, 5-11 to 5-12 referenced single-ended measurement system, 5-10 to 5-11 memory allocation errors (Windows), A-3 to A-4

Microsoft Windows. See Windows environment.

multiple-channel single-point analog input,

6-2 to 6-5 multiple-immediate updates, 11-2 to 11-3 multiple-waveform acquisition choosing between single-point and multi-point acquisition, 4-4 procedure for acquiring, 7-3 to 7-5 multiplexed mode (SCXI) analog input modules, 17-4 analog output modules, 17-4 channel addressing, 18-1 to 18-2 digital and relay modules, 17-5

SCXI-1200 (Windows), 17-4

My Single Scan Processing VI, 6-5




Index

N

NI-DAQ file for Macintosh, 2-3

NI-DAQ software deciding which driver version to use, A-4 installing in UNIX, 2-19

Macintosh device drivers, 2-3 relationship between LabVIEW,


(figure), 2-3 user privilege level in Windows NT, 2-15 versions of NI-DAQ drivers (note), 2-1

Windows device drivers, 2-3

Windows NT device drivers, 2-3

NI-PNP.EXE utility, 2-10

NI-PNP.INI file, 2-10

NIDAQ.DLL file, 2-3

NIDAQNT.DLL file, 2-3 nivisrd.386 device, A-4 non-buffered handshaking, 15-5 to 15-6 non-referenced signal sources, 5-2 nonlatched digital I/O, 14-1 to 14-3 nonreferenced single-ended (NRSE) measurement system, 5-11 to 5-12

16-channel NRSE system (figure), 5-11 when to use, 5-12

Nyquist frequency, 5-2

Nyquist Theorem, 5-2

O

OBF (Output Buffer Full) line, 15-2 one-point calibration, 20-4 to 20-6 one-shots, 22-6

OUT output pin, 21-2

OUT signal, 21-3 to 21-4

Output Buffer Full (OBF) line, 15-2

P

parallel mode (SCXI) analog input modules, 17-5 channel addressing, 18-1 to 18-2

LabVIEW Data Acquisition Basics Manual Index -30 digital modules (Macintosh and

Windows), 17-6

SCXI-1200 (Windows), 17-6 parameters for VIs common DAQ VI parameters, 3-7 to 3-8 conventions, 3-6 to 3-7 pattern generation, 15-2

PCMCIA bus computers, configuring, 2-6 to 2-9

PCMCIA cards, inserting with computer running (note), 2-5 period measurement. See frequency and period measurement.

Plug and Play (switchless) DAQ devices, configuring, 2-10

Plug and Play software for configuring devices, 2-10 to 2-11 polling for analog input, 6-10 ports digital ports and lines, 13-1 grouping ports without handshaking, A-2 problems accessing ports 2 or higher

(Windows), A-3

VI port addressing, 3-9 to 3-11 pressure measurement with strain gauges

(example), 19-11 to 19-14

Probe tool, 27-4

Pulse Generator Config VI, 24-6 pulse train generation, 22-5 to 22-8 continuous pulse train, 22-5 to 22-7 duty cycles, 22-2 to 22-3 finite pulse train, 22-7 to 22-8 illustration, 22-2 physical connections for generating continuous pulse train (figure), 22-5 finite pulse train (figure), 22-7 terminology related to, 22-2 pulse width measurement, 23-1 to 23-4 controlling pulse width measurement, 23-3 counting input signals (figure), 23-1 determining pulse width, 23-2 to 23-3


Index increasing measurable width range, 23-4 measuring pulse width, 23-1 to 23-2 overview, 23-1 physical connections for determining pulse width (figure), 23-2

Pulse Width or Period Meas Config VI controlling pulse width measurement, 23-3 measuring frequency and period, 24-4 to 24-5 pulsed counter signal generation, 22-1

Q

questions about using DAQ devices, 4-3 to 4-5

LabVIEW data acquisition common questions, A-1 to A-5

R

range of device voltage, 5-4 to 5-5 considerations for selecting analog input settings, 5-6 to 5-8 description, 5-4 to 5-5 effect on ADC precision (figure), 5-5 measurement precision for various device ranges and limit settings (table), 5-8

Read from Digital Line VI, 14-2

Read from Digital Port VI, 14-2 referenced signal sources, 5-2 referenced single-ended (RSE) measurement system, 5-10 to 5-11

16-channel RSE system (figure), 5-11 relay SCXI modules, 17-5

REQ (Request) line, 15-2

Resistance-Temperature Detectors (RTDs),

19-9 to 19-11 resolution of ADC, 5-3 to 5-4 effects on ADC precision (figure), 5-4 round-robin scanning (figure), 9-2 row major order, 3-14

RSE. See referenced single-ended (RSE) measurement system.



National Instruments Corporation Index -31

RTDs for measuring temperature, 19-9 to 19-11 run_me.llb DAQ example file, 3-2

S

SC-2042 RTD device, 19-10

Scale Constant Tuner VIs, 20-7

Scaling Constant Tuner VI, 19-7 scan clock, 9-5 to 9-8 channel and scan intervals using channel clock (figure), 9-2 devices without scan clocks (note), 9-6 input pins (table), 9-6 lack of external scan clock support in

NB-MIO-16X board, 9-7

MIO device ScanClock output

(note), 9-6 scan-clock orientation of LabVIEW, 9-2 simultaneous control of scan and channel clocks, 9-8 scans channel clock rate parameter, 5-17 definition, 5-17 interval scanning, 5-17 maximum scan rate, calculating, 7-5 number of samples parameter, 5-17 number of scans to acquire parameter, 5-17 round-robin scanning (figure), 9-2 scan rate parameter, 5-17

SCXI-112x Thermocouple example VI, 19-9

SCXI-116x Digital Output VI, 19-18

SCXI-1100 One-Point Calibration example, 20-5

SCXI-1100 Two-point calibration example, 20-6

SCXI 1124 Update Channels VI, 19-14

SCXI-1162/1162HV Digital Input VI, 19-16

SCXI-1200 module multiplexed mode (Windows), 17-4 parallel mode (Windows), 17-6

SCXI application examples, 19-1 to 19-19 analog input application for measuring


Index temperature, 19-2 to 19-5 analog output application, 19-14 to 19-15 digital input application, 19-15 to 19-16 digital output application, 19-16 to 19-18 multi-chassis applications, 19-18 to 19-19 overview, 19-1 to 19-2 pressure measurement with strain gauges,

19-11 to 19-14 temperature measurement applications amplifier offset, 19-4 to 19-5 sensors for cold-junction compensation, 19-3 to 19-4 using RTDs, 19-9 to 19-11 using thermocouples, 19-2 to 19-5

VI examples, 19-5 to 19-9

SCXI Cal Constants VI automatic calculation of calibration constants, 20-3 calibrating SCXI modules for signal generation, 20-8 loading saved calibration constants,

20-7, 20-8 one-point calibration, 20-5 overwriting default constants in

EEPROM, 20-2 two-point calibration, 20-6 to 20-7

SCXI calibration, 20-1 to 20-8

EEPROM for storing calibration constants, 20-1 to 20-3 default load area, 20-2 factory area, 20-2 user area, 20-2 to 20-3 one-point calibration, 20-4 to 20-6 reasons for calibrating, 20-3 to 20-4 signal acquisition, 20-3 to 20-7 signal generation, 20-7 to 20-8 two-point calibration, 20-6 to 20-7

SCXI modules components chassis (figure), 17-3 illustration, 17-2 overview, 17-2 hardware configurations

LabVIEW Data Acquisition Basics Manual Index -32 illustration, 17-1 overview, 17-1

Windows or Macintosh systems,

2-20 to 2-21 software configuration


Windows environment, 2-21 to 2-25 when to use, 4-3

SCXI operating modes, 17-3 to 17-6 multiplexed mode analog input modules, 17-4 analog output modules, 17-4 channel addressing, 18-1 to 18-2 digital and relay modules, 17-5

SCXI-1200 (Windows), 17-4 parallel mode analog input modules, 17-5 channel addressing, 18-1 to 18-2 digital modules (Macintosh and

Windows), 17-6

SCXI-1200 (Windows), 17-6

SCXI programming considerations, 18-1 to 18-5 channel addressing, 18-1 to 18-2 gains, 18-2 to 18-4

SCXI-1100 channel arrays, input limits array, and gains

(table), 18-4 settling time, 18-5

SCXI Temperature Monitor VI, 19-8

SCXI Voltage example, 19-5 settling time (SCXI), 18-5

SETUP program, for ISA bus computers, 2-9 signal conditioning amplification, 16-3 to 16-4 common transducers (table), 16-1 to 16-2 common types of signal conditioning, 16-2 conditioning for common types of transducers/signals (figure), 16-3 definition, 16-2 filtering, 16-5


Index isolation, 16-4 linearization, 16-5 transducer excitation, 16-5 signal divider, 26-1 signal edges, 21-2 signal voltage range. See limit settings.

signals. See also analog input signals.

choosing between analog and digital signal analysis, 4-3 simple-buffered analog input data buffer overview, 7-1 to 7-2 examples displaying waveforms on graphs, 7-6 to 7-7 sampling with multiple starts, 7-7 to 7-9 writing to spreadsheet file, 77-9 multiple-waveform acquisition, 7-3 to 7-5 single-waveform acquisition, 7-2 to 7-3 waiting to analyze data, 7-1 to 7-2

Simple Error Handler VI analog output SCXI example, 19-15 debugging VIs, 27-2 to 27-3 multiple-channel single-point analog input, 6-5 single-channel single-point analog input choosing between single-point and multi-point acquisition, 4-4 description, 6-1 to 6-2 single-ended measurement system nonreferenced, 5-11 to 5-12 referenced, 5-10 to 5-11 single-immediate updates, 11-1 to 11-2 single-point analog output choosing between single-point or multiple-point generation, 4-4 overview, 10-1 single-stepping through VIs, 27-3 single-waveform acquisition, 7-2 to 7-3 software configuration errors, debugging, 27-1 to 27-2 software-timed analog input/output control loops, 6-6 to 6-7

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National Instruments Corporation Index -33 software timing, 10-1 software triggering description, 8-10 to 8-12 examples, 8-12 to 8-14 timeline of conditional retrieval

(figure), 8-11

SOURCE input increasing measurable width range, 23-4 measuring pulse width, 23-1 to 23-2

SOURCE input pin, 21-2 spreadsheet files

Cont Acq to Spreadsheet File.vi, 7-15 simple buffered-analog input example, 7-9 square pulse generation, 22-1 to 22-5 overview, 22-1 to 22-3 single square pulse generation, 22-3 to 22-5

Generate Delayed Pulse VI, 22-4 physical connections (figure), 22-4 using Intermediate VIs, 22-4 to 22-5

STB (Strobe Input) line, 15-2 strain gauges for measuring pressure

(example), 19-11 to 19-14

Strobe Input (STB) line, 15-2

T

technical support, B-1 to B-2 telephone and fax support, B-2 temperature measurement applications

(SCXI) amplifier offset, 19-4 to 19-5 sensors for cold-junction compensation,

19-3 to 19-4 using RTDs, 19-9 to 19-11 using thermocouples, 19-2 to 19-5

VI examples, 19-5 to 19-9 terminal count (TC), 21-4 thermocouples for measuring temperature

(example), 19-2 to 19-5 timebase period uncertainty, 22-8 to 22-9 toggled counter signal generation, 22-1


Index transducers common transducers (table), 16-1 to 16-2 excitation, 16-5 linearization, 16-5 signal conditioning for common types of transducers/signals (figure), 16-3 transposing arrays, 7-7 triggered data acquisition, 8-1 to 8-14 analog triggering description, 8-6 to 8-7 examples, 8-7 to 8-10 choosing between triggering and external clock control, 4-4 deciding which digital trigger setting to use, A-2 digital triggering description, 8-2 to 8-3 examples, 8-3 to 8-6 hardware triggering, 8-1 to 8-10 overview, 8-1 software triggering description, 8-10 to 8-12 examples, 8-12 to 8-14 triggering, definition, 8-1 triggers, definition, 8-1 two-dimensional (2D) arrays, 3-13 to 3-16 two-point calibration, 20-6 to 20-7

U

UNIX operating system installation and configuration of DAQ devices

DAQ device configuration, 2-19 to 2-20

NI-DAQ software, 2-19 overview, 2-18 to 2-19 user privilege level, Windows NT, 2-15

Utility VIs, 3-6. See also VIs.

LabVIEW Data Acquisition Basics Manual Index -34

V

VIs. See also specific VIs.

Advanced VIs, 3-6 channel, port, and counter addressing,

3-9 to 3-11 common DAQ VI parameters, 3-7 to 3-8 crashing VIs in Windows, A-3 data organization for analog applications, 3-13 to 3-16 debugging, 27-1 to 27-4 default and current value conventions, 3-7

Easy VIs, 3-5 error handling, 3-8 to 3-9 finding VIs in LabVIEW, 3-2 to 3-4

Intermediate VIs, 3-5 to 3-6 limit settings, 3-11 to 3-13 organization, 3-4 to 3-5 parameter conventions, 3-6 to 3-7

SCXI examples, 19-5 to 19-9

Utility VIs, 3-6

W

Wait Until Next ms Multiple VI improving control loop performance, 6-10 multiple-channel single-point analog input, 6-5 software-timed analog I/O control loops, 6-6

Wait (ms) VI, 6-10, 22-9 waveform generation. See buffered analog output.

WDAQCONF utility configuring DAQ devices

EISA bus computers, 2-9


2-6 to 2-9 testing and configuring in Windows,

2-11 to 2-14 icon in Windows (figure), 2-6 locating in Windows (figure), 2-6


Index

WDAQCONF.CFG file, 2-6

Wheatstone bridge, 19-12

Windows environment installation and configuration

EISA bus computers, 2-9 inserting PCMCIA cards (note), 2-5


2-6 to 2-9 multiple DAQ devices (note), 2-5

Plug and Play (switchless) DAQ devices, 2-10

Plug and Play software, 2-10 to 2-11

SCXI hardware, 2-20 to 2-21

SCXI software, 2-21 to 2-25 using WDAQCONF, 2-11 to 2-14

NI-DAQ drivers, 2-3 questions and answers, A-3 to A-4

Windows 95 users (note), 2-1

Windows NT environment

LabVIEW considerations, 2-14 to 2-15 changing I/O page lock limit, 2-14 to 2-15 user privilege level, 2-15

NI-DAQ drivers, 2-3

Write N Updates example VI multiple-immediate updates, 11-2 to 11-3 single-immediate updates, 11-1 to 11-2

Write to Digital Line VI, 14-2

Write to Digital Port VI digital output application, 19-16 to 19-17 immediate digital I/O, 14-2

Write to Spreadsheet File VI, 7-9

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Index. NI LabVIEW Data Acquisition Basics

A

B

C

D

E

F

G

H

I

J

L

M

N

O

P

Q

R

S

T

U

V

W

Related manuals

Table of contents

Index. NI LabVIEW Data Acquisition Basics

A

B

C

D

E

F

G

H

I

J

L

M

N

O

P

Q

R

S

T

U

V

W

Related manuals

NI

LabVIEW Data Acquisition Basics

NI

LabVIEW Data Acquisition Basics

NI

LabVIEW Data Acquisition Basics

NI

Measure Data Acquisition

National Instruments

E Series

NI

SCXI-1200

National Instruments

32100

NI

PC-OPDIO-16

Table of contents