Editing rack data. Metrohm 900 Touch Control

11.6 Sample racks ￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭

Creating a new sample rack

Own sample racks can be simply and conveniently created by copying an existing sample rack. Proceed as follows:

1 Copy the existing rack

￭

￭

In the dialog Edit device / Sample racks , select a sample rack which is to be used as a template.

Tap on [Copy] .

The Sample rack / Copy dialog is displayed.

2 Enter the rack name and rack code

￭

￭

In the field New rack name , enter a name for the new rack.

In the field New rack code , 110000 is suggested. As a rule, this rack code is used for special racks. Apply this code or enter a new rack code and confirm with [OK] .

The new sample rack appears in the list of available racks.

11.6.1 Editing rack data

Sample rack list: Rack ▶ Edit

You can edit the data of the selected rack in the dialog Sample rack /

Edit rack data .

Beaker radius samples

Actual radius of the sample vessels at the general sample positions of the rack.

This beaker radius may not be less than the minimum beaker radius defined in the tower properties

(see "Min. beaker radius," page 94) . If the

102 ￭￭￭￭￭￭￭￭ 900 Touch Control

￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭ 11 Device manager lift is to be moved to the work position, then these two values will be compared with one another.

Input range

Selection

Default value

1.0 to 100.0 mm off off off

No check takes place.

Beaker sensor

Each time a sample position is to be moved to with the MOVE command, the beaker sensor checks whether a vessel is present. In the MOVE command, you define the action that takes place if the beaker sensor does not detect a vessel at the position being moved to.

Selection

Default value

Tower | Robotic arm | off off

Robotic arm

A Swing Head with beaker sensor must be mounted. In addition, a suitable work position must be defined for the lift, so that the robotic arm touches the sample vessel. The work position is moved to for the purpose of beaker detection.

off

No check takes place.

1. Calibration pos.

Position of the first calibration solution for automatic calibration with a

Sample Processor (see "Definition of the calibration positions", page 498) .

Input range

Selection

Default value

1 to "highest rack position"

It is imperative that the remaining buffers/standards be placed on the rack positions directly following.

Special beaker 1…n | off off

Special beaker 1…n

If a special beaker is selected as the first calibration position, then the number of buffers/standards used for calibration will determine the number of special beakers to be defined. Any rack position can be defined as a special beaker. It is, however, preferable to set them at high rack positions in order to be able to begin sample series at rack position 1. The special beakers are moved to in ascending order.

Rack offset

The rack offset is a production-related tolerance value between the upper and lower sections of the rack. This value is determined when the rack is adjusted and is displayed here. It can be changed if necessary.

900 Touch Control ￭￭￭￭￭￭￭￭ 103

11.6 Sample racks ￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭

Input range

Default value

–10.00 to 10.00 °

0.00 °

[Adjust rack]

Adjust the rack (see chapter 11.6.2, page 108) .

[Lift pos. tower 1]/[Lift pos. tower 2]

Define rack specific lift positions

(see "Lift positions Tower 1/2", page

104) .

[Special beakers]

Define rack positions as special beakers

(see "Editing special beakers", page 105)

.

Lift positions Tower 1/2

Sample rack list: Rack ▶ Edit ▶ Lift pos. tower 1 / Lift pos. tower 2

Work position

You can define rack-specific lift positions in the dialog Edit rack data /

Lift positions tower 1/2 . These then apply for all rack positions except those that have been defined as special beakers.

These positions can be moved to directly under manual control and with the LIFT command. Only lift positions within the maximum stroke path can be entered. This is defined in the device properties of the tower.

NOTICE

These lift positions can also be assigned directly in manual control after

moving to the desired lift height (see chapter 28.7.1, page 270)

.

At this lift position the electrodes, stirrer and buret tips are optimally positioned for work.

104 ￭￭￭￭￭￭￭￭ 900 Touch Control

￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭

Rinse position

Shift position

Special position

Input range

11 Device manager

0 to 'maximum stroke path' mm

A lift position of 0 mm corresponds to the "home position", i.e. the lift is located at the upper stop position. The maximum stroke path is defined in the properties of the tower

(see "Maximum stroke path", page 94)

.

Lift position used for rinsing.

Input range

Default value

0 to 'Maximum stroke path' mm

0 mm

A lift position of 0 mm corresponds to the "home position", i.e. the lift is located at the upper stop position. The maximum stroke path is defined in the properties of the tower

(see "Maximum stroke path", page 94) .

The lift is raised to this position with each rotational movement of the rack whenever it is located at a lower lift position.

Input range 0 to 'maximum stroke path' mm

A lift position of 0 mm corresponds to the "home position", i.e. the lift is located at the upper stop position. The maximum stroke path is defined in the properties of the tower

(see "Maximum stroke path", page 94) .

For sample positions, you can define an additional lift position for special applications.

Input range 0 to 'maximum stroke path' mm

A lift position of 0 mm corresponds to the "home position", i.e. the lift is located at the upper stop position. The maximum stroke path is defined in the properties of the tower

(see "Maximum stroke path", page 94) .

Editing special beakers

Sample rack list: Rack ▶ Edit ▶ Special beakers

900 Touch Control ￭￭￭￭￭￭￭￭ 105

11.6 Sample racks ￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭

[Edit]

A maximum of 16 rack positions can be defined as special beakers for each sample rack. The dialog Edit rack data / Special beakers shows a list of all special beakers with their assigned rack positions.

Edit the data of the selected special beaker, see the following.

Rack position

You can edit the data of the selected special beaker in the dialog Special beaker / Edit .

Number of rack position for selected special beaker. Any rack position can be defined as a special beaker. It is, however, preferable to set them at high rack positions in order to be able to begin sample series at rack position 1. Rack positions defined as special beakers can no longer be used as sample positions.

Input range 0 to 'maximum number of rack positions'

106 ￭￭￭￭￭￭￭￭ 900 Touch Control

￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭ 11 Device manager

Work pos. tower 1/2

Work position for the selected special beaker. One specific work position can be defined for tower 1 and tower 2.

Input range 0 to 'maximum stroke path' mm

A lift position of 0 mm corresponds to the "home position", i.e. the lift is located at the upper stop position. The maximum stroke path is defined in the properties of the tower

(see "Maximum stroke path", page 94)

.

Beaker radius

Actual radius of the selected special beaker.

This beaker radius may not be less than the minimum beaker radius defined in the tower properties

(see "Min. beaker radius," page 94)

. If the lift is to be moved to the work position, then these two values will be compared with one another.

Input range

Selection

Default value off

No check takes place.

1.0 to 100.0 mm off off

Beaker sensor

Each time this special beaker is to be moved to with the MOVE command, the beaker sensor checks whether a vessel is present. In the MOVE command, you define the action that takes place if the beaker sensor does not detect a vessel at the position being moved to.

Selection

Default value

Tower | Robotic arm | off off

Robotic arm

A Swing Head with beaker sensor must be mounted. In addition, a suitable work position must be defined for the lift, so that the robotic arm touches the sample vessel. The work position is moved to for the purpose of beaker detection.

off

No check takes place.

900 Touch Control ￭￭￭￭￭￭￭￭ 107